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Scanning Electron Microscopy: David Muller 2008
Scanning Electron Microscopy: David Muller 2008
Valence Excitations 10
6
Si L edge 10
5
O-K edge 10
4
0
David Muller 2008
100
500
600
700
BS2
SE2
SE1
R= Depth Penetration A= Atomic Weight (g/mole) E= Beam Energy (KV) Z= Atomic number = density (g/cm )2
.16 m .99 m
.01 m (100A)
35 A
3.1 m
5 kV 15 kV
25 kV
Better control of where SE, BSE and x-rays are produced at lower beam voltages
Iron
Silver
Carbon
David Muller 2008
Pear to apple-shaped
Secondary Electrons
specimen
SE1- at point of primary interaction SE2- away from initial interaction point SE3- by BSE outside of sample BSE1- at point of primary interaction BSE2- away from initial interaction point
Lateral Distribution of SE
SE1
SE2B
BS1
BS2A
BS2B
One Primary Electron In Can Create Several SEs Out at Low Accelerating Voltages
100 Angstroms
SE out = PE in
SE # of electrons collected
BSE
SE out = PE in
As-received samples are all coated with a carbon contamination layer Overall scaling factor is from the different backscattering responses of the substrate
David Muller 2008
Charge Neutralization
Electron Yield = # SE out / # Inc e- in
1.4 1.2
The floating end of the via chain is bright because of trapped negative charge causes secondary electrons to be repelled. The remainder of the chain is neutral, and thus darker.
(http://www.acceleratedanalysis.com/hepvc.html)
David Muller 2008
Light guide
TLD
E.T. SED
Specimen
David Muller 2008
SE
Specimen
BSE
+300 V SE-detector
B A C
Previous image turned upside down. We need to know where the detector is to tell bumps from pits!
2nd e- Intensity
The E-Beam line profile of the specimen Where do you measure One Micron ?
1KV
A 1 KV bean has minimal beam penetration and can give an image that is closer to reality.
5KV
A 5KV beam penetrates deep into the specimen which gives the appearance of the peaks being closer together
Line Profiles on the Same Sample Can Change with Accelerating Voltages
.99 m .92 m
1KV .85 m
2KV .74 m
3KV
Secondary Electrons
specimen
SE 80
.2
AU AL C 5 15 25
Accelerating Voltage in KV
David Muller 2008
Z Dependence of BSE
From Scanning Electron Microscopy and X-Ray Microanalysis, Goldstein et al, 3rd ed. Chap 3
From Scanning Electron Microscopy and X-Ray Microanalysis, Goldstein et al, 3rd ed. Chap 3
-150 V SE-detector
B A C
From http://www.jeol.com/sem_gde/bkscat.html
Electron wave fields within a crystal for incident electron directions close to the Bragg angle qB. The vertical lines are the position of the Bragg reflecting atomic planes. From H. Niedrig, Electron backscattering from thin films, Journal of Applied Physics -- April 1982 -- Volume 53, Issue 4, pp. R15-R49
Electron Backscatter Diffraction Pattern of Germanium. Right automatic indexing software matches the high symmetry zone axes and spacing between them to identify the crystal type and orientation. (University of Queensland, http://www.uq.edu.au/nanoworld/xl30_anl.html)
David Muller 2008
(From http://www.edax.com/technology/EBSD/OIM/intro6.html)
Pattern IQ = 224
http://www.edax.com/TSL/support/EBSD_Sample_Prep.html