Ident-Nr. 48 001 This Issue 06, 11/2007 applies to the following software versions: USM 35X V.01.00.7x with Data Logger option: V.01.01.7x USM 35X DAC V.01.10.7x with Data Logger option: V.01.11.7x USM 35X S V.01.20.7x with Data Logger option: V.01.21.7x Subject to change without notice. First operation level Second operation level Third operation level BASE Changing the operation level: Selecting the function group: Selecting the function: H Notes: As a standard feature, the function group REF can be changed over to the function group AWS. With the USM 35X DAC, there is also the additional function group DAC/ JDAC; with the USM 35X S, the function groups DAC/JDAC and DGS are available. The character > after a function indicates a double assignment. * DAC/ JDAC * DGS AWS or or PULS RECV aGAT bGAT CAL REF* TRIG MEM DATA MEAS MSEL LCD CFG1 CFG2 Status symbols Symbol Description * Display memory is enabled (freeze), display is stored. ! Data transfer active, printing or remote control Batterie charge indicator (status of remaining charge in steps of 10 %) F TOF is set to flank. P TOF is set to peak. J TOF is set to jflank. T T-CORR (transfer correction) function is active R Reference echo has been recorded A ATT-OBJ/ATT-REF function (sound attenuation is active) LED Symbol Description A Gate alarm R Function REJECT is active D Function DUAL (pulser-receiver separation) is active Key functions Key Function Switching the unit on and off Step size for gain setting Storage (freezing) of screen display Enlarged echo display over the entire screen Printing or transferring data Recording measured values, saving data Changing the operation level Selecting the function group Selecting the function USM 35X Issue 06, 11/2007 0-1 Contents 1 Introduction ........................................ 1-1 1.1 Safety information .................................... 1-2 Batteries...................................................... 1-2 Software ...................................................... 1-2 Defects/errors and exceptional stresses ..... 1-3 1.2 Important information on ultrasonic testing ...................................... 1-3 Preconditions for testing with ultrasonic test equipment ............................................ 1-3 Operator training.......................................... 1-4 Technical test requirements ........................ 1-4 Limits of testing........................................... 1-5 Ultrasonic wall thickness measurement ...... 1-5 Effect of the test objects material ............... 1-5 Effect of temperature variations ................... 1-6 Measurement of remaining wall thickness .... 1-6 Ultrasonic evaluation of flaws ...................... 1-6 Flaw boundary method ................................ 1-6 Echo display comparison method ............... 1-7 1.3 The USM 35X family ................................. 1-8 The different instrument versions ................. 1-8 Special features........................................... 1-9 1.4 How to use this manual ......................... 1-10 1.5 Layout and presentation in this manual ..................................................... 1-11 Attention and Note symbols ...................... 1-11 Listings ..................................................... 1-11 Operating steps......................................... 1-11 2 Standard package and accessories ........................................ 2-1 2.1 Standard package .................................... 2-3 2.2 Recommended accessories..................... 2-5 0-2 Issue 06, 11/2007 USM 35X Contents 3 Initial start-up...................................... 3-1 3.1 Power supply ............................................ 3-2 Operation using the power supply unit ........ 3-2 Operation using batteries ............................ 3-3 Charging the batteries ................................. 3-5 3.2 Connecting a probe.................................. 3-7 3.3 Starting the USM 35X ............................... 3-8 Switching on................................................ 3-8 Basic initialization ....................................... 3-8 Information lines in the startup screen......... 3-8 4 Principles of operation ...................... 4-1 4.1 Operators controls ................................... 4-2 4.2 Screen display .......................................... 4-3 Functions on the display ............................. 4-4 Other displays ............................................. 4-5 4.3 Keys and rotary knobs.............................. 4-6 Function keys ............................................. 4-6 On/Off key ................................................... 4-6 Special keys................................................ 4-7 Rotary knobs ............................................... 4-8 4.4 Operational concept ................................. 4-8 Setting the functions ................................... 4-9 Alternative operation without rotary knobs ........................................................ 4-10 4.5 Important basic settings ......................... 4-12 Selecting the language .............................. 4-12 Selecting units .......................................... 4-13 Setting the date......................................... 4-14 Setting the time......................................... 4-15 4.6 Basic settings of the display .................. 4-16 Selecting the color scheme....................... 4-16 Setting the lighting .................................... 4-16 USM 35X Issue 06, 11/2007 0-3 Contents 5 Operation ............................................ 5-1 5.1 Overview of the functions ........................ 5-2 Function groups first operating level ............ 5-3 Function groups second operating level ...... 5-3 Function groups third operating level ........... 5-4 5.2 Setting the gain ........................................ 5-5 Defining the dB incrementation for gain ....... 5-5 5.3 Adjusting the display range (function group BASE) .............................. 5-6 RANGE (Display range) .............................. 5-6 MTLVEL (Sound velocity) ............................ 5-7 D-DELAY (Display starting point) ................ 5-7 P-DELAY (Probe delay) ............................... 5-8 5.4 Adjusting the pulser (function group PULS) .............................. 5-9 DAMPING (Probe matching) ....................... 5-9 POWER (Intensity) ................................... 5-10 DUAL (Pulser-receiver separation) ............. 5-10 PRF-MOD (Pulse repetition frequency) ..... 5-11 5.5 Adjusting the receiver (function group RECV) ............................ 5-11 FINE G (Fine adjustment of gain) .............. 5-12 dBSTEP .................................................... 5-12 REJECT .................................................... 5-12 FREQU (Frequency range) ........................ 5-13 RECTIFY (Rectification) ............................ 5-13 5.6 Setting the gates (function groups aGAT and bGAT) ........ 5-14 Tasks of the gates ..................................... 5-14 aLOGIC/bLOGIC (Evaluation logic of the gates) ................... 5-15 aSTART/bSTART (Starting points of the gates) ..................... 5-16 aWIDTH/bWIDTH (Width of the gates) ...... 5-16 aTHRSH/bTHRSH (Response and measurement threshold of the gates) ........ 5-16 0-4 Issue 06, 11/2007 USM 35X Contents 5.7 Calibrating the USM 35X........................ 5-17 Calibrating the display range ..................... 5-17 Choosing the measuring point ................... 5-17 Calibration with straight- and angle-beam probes .................................... 5-18 Calibration with dual-element (TR) probes ....................................................... 5-21 5.8 Measuring................................................ 5-23 General notes............................................ 5-23 5.9 Measurement of dB difference (function group REF) ............................... 5-25 Recording a reference echo....................... 5-26 Deleting a reference echo.......................... 5-26 Echo comparison ...................................... 5-27 5.10Classification of welds (function group AWS) ............................. 5-28 Rating of welds according to AWS ............ 5-28 5.11 Calculation of flaw position (function group TRIG) ............................. 5-31 ANGLE (Angle of incidence) ...................... 5-32 X-VALUE (X-value of the probe) ................. 5-32 COLOR ..................................................... 5-33 THICKNE (Material thickness) ................... 5-33 DIAMET (Outside diameter of the test object) ....................................................... 5-33 5.12Data saving (function group MEM) ............................. 5-34 Storing a data set ...................................... 5-35 Deleting a data set .................................... 5-35 Deleting all data set .................................. 5-36 Recalling a stored data set ....................... 5-36 5.13Dataset management (function group DATA) ............................ 5-38 TESTINF (Storing additional information) .... 5-39 PREVIEW (Dataset preview) ..................... 5-41 DIR (Dataset directory) .............................. 5-42 SETTING (Function list) ............................ 5-42 USM 35X Issue 06, 11/2007 0-5 Contents 5.14Configuring the USM 35X for a test application .............................................. 5-43 TOF (Selecting the measuring point) ......... 5-44 S-DISP (Zoomed display of reading) .......... 5-46 MAGNIFY (Gate spreading) ...................... 5-48 A-Scan (Setting the A-scan) ...................... 5-48 Configuring the measurement line ............. 5-49 Setting the display .................................... 5-50 FILLED (Echo display mode) .................... 5-51 VGA .......................................................... 5-51 SCHEME .................................................. 5-51 LIGHT (LCD backlight) ............................... 5-52 SCALE (Configuring the measurement line) ........................................................... 5-52 5.15General configuration ............................ 5-53 DIALOG (Selecting the language) ............. 5-53 UNIT (Selecting units of measurement) ..... 5-54 BAUD-R (Baud rate for transmission) ........ 5-55 PRINTER (Printer for test report) ............... 5-55 COPYMOD (Assignment of the key) ... 5-55 TIME/DATE (Setting the time and date) .... 5-56 ANAMOD .................................................. 5-57 HORN........................................................ 5-58 EVAMOD (Echo evaluation) ...................... 5-58 5.16Other functions with special keys ......... 5-59 Freeze ....................................................... 5-59 Zooming the echo display ......................... 5-59 The key ................................................ 5-59 5.17Status symbols and LEDs ....................... 5-60 Status symbols ......................................... 5-60 LEDs ......................................................... 5-60 5.18Distance-amplitude curve (only USM 35X DAC and USM 35S) ....... 5-61 DACMOD (Activating DAC/TCG) ............... 5-62 DACECHO (Recording reference curve) .... 5-63 T-CORR (Sensitivity correction) ................. 5-64 OFFSET (Distance of multiple DAC) ......... 5-65 Echo evaluation with DAC ......................... 5-65 0-6 Issue 06, 11/2007 USM 35X Contents 5.19Distance-amplitude curve according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) .......................................... 5-67 DACMOD (Activating DAC according to JIS) ............................................................ 5-68 DACECHO (Recording reference curve) .... 5-69 BOLDLI (Choice of a registration curve) ..... 5-71 T-CORR (Sensitivity correction) ................. 5-71 OFFSET (Distance of multiple DAC) ......... 5-72 Echo evaluation with DAC ......................... 5-72 5.20Evaluation according to the DGS method (only USM 35X S) ...................... 5-74 Measuring with DGS ................................. 5-74 Validity of the DGS method ....................... 5-76 Selecting the DGS mode .......................... 5-78 Default settings for the DGS measurement ............................................ 5-78 Recording the reference echo and displaying the DGS curve .......................... 5-80 Evaluation of reflectors .............................. 5-81 Transfer correction..................................... 5-83 Sound attenuation ..................................... 5-83 Locks, error messages ............................. 5-86 6 Documentation .................................. 6-1 6.1 Printing data ............................................. 6-2 Preparing the printer .................................... 6-2 Preparing the USM 35X ............................... 6-2 Printing........................................................ 6-3 6.2 Documentation with UltraDOC ................ 6-4 7 Maintenance and care ....................... 7-1 7.1 Care of the instrument ............................. 7-2 7.2 Care of the batteries................................. 7-3 Care of the batteries .................................... 7-3 Charging the batteries ................................. 7-3 How to handle alkaline batteries.................. 7-4 USM 35X Issue 06, 11/2007 0-7 Contents 7.3 Maintenance ............................................. 7-5 7.4 Recycling ................................................... 7-6 General view of the device ........................... 7-6 Materials for separate disposal ................... 7-8 Further materials and components ............ 7-10 Recycling data of master device................ 7-12 8 Interfaces and peripherals ................ 8-1 8.1 Interfaces ................................................... 8-2 8.2 I/O interface .............................................. 8-4 Contact assignment of the LEMO-1-B socket ......................................................... 8-5 8.3 RS 232 interface........................................ 8-6 Contact assignment of the Sub-D socket .... 8-6 8.4 RGB interface............................................ 8-7 8.5 Data exchange.......................................... 8-7 Connecting a printer or a PC ....................... 8-7 Activation of serial communication .............. 8-8 Printing data ................................................ 8-8 8.6 Remote control ......................................... 8-9 Syntax and timing ..................................... 8-11 Functions and remote control codes ......... 8-17 Other remote control codes....................... 8-24 Control codes for the rotary knobs/ function keys ............................................. 8-26 9 Appendix ............................................ 9-1 9.1 Function directory .................................... 9-2 9.2 EC declaration of conformity................... 9-7 9.3 Manufacturer/Service addresses ............ 9-8 9.4 Spare parts list ........................................ 9-10 0-8 Issue 06, 11/2007 USM 35X Contents 10 Changes ........................................... 10-1 11 Index ................................................. 11-1 USM 35X Issue 06, 11/2007 1-1 Introduction 1 1-2 Issue 06, 11/2007 USM 35X Introduction Safety information 1.1 Safety information The USM 35X has been designed and tested according to DIN EN 61 010 Part 1, 2001, Safety requirements for electrical measuring, control and lab equipment, and was technically in perfectly safe and faultless condition when leaving the manufacturing works. In order to maintain this condition and to ensure a safe operation, you should urgently read the following safety information before putting the instrument into operation. A Attention: The USM 35X is an instrument for materials testing. Any use for medical applications or other purposes is not allowed! The USM 35X may only be used in industrial envi- ronments! The USM 35X is waterproof according to IP 66. The USM 35X can be operated with batteries or a power supply unit. The power supply unit has the electrical safety class II. Batteries For the battery operation of the USM 35X, we recom- mend the use of a lithium-ion battery. The operation using alkaline batteries, NiMH or NiCad cells is likewise possible. You should only use the products recom- mended by us for the battery operation. You can charge the lithium-ion battery within the instru- ment itself or in an external battery charger. If you want to use NiMH or NiCad cells, you have to charge them in an external battery charger. As soon as you connect the power supply unit to the USM 35X, the battery power supply is interrupted. If a lithium-ion battery is inserted, the charging process starts automatically when you connect the instrument to the mains supply. Please refer to chapter 3.1 on power supply, and to chapter 7 on how to handle batteries. Software According to the current state of the art, software is never completely free from errors. Before using any software-controlled test equipment, please make sure USM 35X Issue 06, 11/2007 1-3 Introduction Safety information that the required functions operate perfectly in the in- tended combination. If you have any questions about the use of your test equipment, please contact your nearest representative of GE Inspection Technologies. Defects/errors and exceptional stresses If you have reason to believe that a safe operation of your USM 35X is no longer possible, you have to dis- connect the instrument and secure it against uninten- tional reconnection. Remove the batteries if necessary. A safe operation is e.g. no longer possible if the instrument shows visible damages, if the instrument no longer operates perfectly, after prolonged storage under adverse conditions (e.g. exceptional temperatures and/or especially high air humidity, or corrosive environmental conditions), after being subjected to heavy stresses during trans- portation. 1.2 Important information on ultrasonic testing Please read the following information before using your USM 35X. It is important that you understand and ob- serve this information to avoid any operator errors that might lead to false test results. This could result in per- sonal injuries or damages to property. Preconditions for testing with ultrasonic test equipment This operating manual contains essential information on how to operate your test equipment. In addition, there are a number of factors which affect the test results. A description of these factors would go beyond the scope of an operating manual. The following list therefore only mentions the three most important conditions for a safe and reliable ultrasonic inspection: the operator training the knowledge of special technical test requirements and limits the choice of appropriate test equipment. 1-4 Issue 06, 11/2007 USM 35X Introduction Important information on ultrasonic testing Operator training The operation of an ultrasonic test device requires a proper training in ultrasonic test methods. A proper training comprises for example adequate knowledge of: the theory of sound propagation the effects of sound velocity in the test material the behavior of the sound wave at interfaces be- tween different materials the propagation of the sound beam the influence of sound attenuation in the test object and the influence of surface quality of the test ob- ject. Lack of such knowledge could lead to false test results with unforeseeable consequences. You can contact for example NDT societies or organizations in your country (DGZfP in Germany; ASNT in the USA), or also GE Inspection Technologies, for information concerning existing possibilities for the training of ultrasonic in- spectors as well as on the qualifications and certifi- cates that can finally be obtained. Technical test requirements Every ultrasonic test is subject to specific technical test requirements. The most important ones are: the definition of the scope of inspection the choice of the appropriate test method the consideration of material properties the determination of limits for recording and evaluation. It is the task of those with overall responsibility for test- ing to ensure that the inspector is fully informed about these requirements. The best basis for such information is experience with identical test objects. It is also es- sential that the relevant test specifications be clearly and completely understood by the inspector. GE Inspection Technologies regularly holds specialized training courses in the field of ultrasonic testing. The scheduled dates for these courses will be given to you on request. USM 35X Issue 06, 11/2007 1-5 Introduction Important information on ultrasonic testing Limits of testing The information obtained from ultrasonic tests only re- fers to those parts of the test object which are covered by the sound beam of the probe used. Any conclusions from the tested parts to be applied to the untested parts of the test object should be made with extreme caution. Such conclusions are generally only possible in cases where extensive experience and proven methods of statistical data acquisition are available. The sound beam can be completely reflected from boundary surfaces within the test object so that flaws and reflection points lying deeper remain undetected. It is therefore important to make sure that all areas to be tested in the test object are covered by the sound beam. Ultrasonic wall thickness measurement All ultrasonic wall thickness measurements are based on a time-of-flight measurement. Accurate measure- ment results require a constant sound velocity in the test object. In test objects made of steel, even with varying alloying constituents, this condition is mostly fulfilled. The variation in sound velocity is so slight that it is only of importance for high-precision measure- ments. In other materials, e.g. nonferrous metals or plastics, the sound velocity variations may be even larger and thus affect the measuring accuracy. Effect of the test objects material If the test objects material is not homogeneous, the sound may propagate at different sound velocities in different parts of the test objects. An average sound velocity should then be taken into account for the range calibration. This is achieved by means of a reference block whose sound velocity corresponds to the average sound velocity of the test object. If substantial sound velocity variations are to be ex- pected, then the instrument calibration should be read- justed to the actual sound velocity values at shorter time intervals. Failure to do so may lead to false thick- ness readings. 1-6 Issue 06, 11/2007 USM 35X Introduction Important information on ultrasonic testing Effect of temperature variations The sound velocity within the test object also varies as a function of the materials temperature. This can cause appreciable errors in measurements if the instrument has been calibrated on a cold reference block and is then used on a warm or hot test object. Such measure- ment errors can be avoided either by warming the refer- ence block to the same temperature before calibrating, or by using a correction factor obtained from tables. Measurement of remaining wall thickness The measurement of the remaining wall thickness on plant components, e.g. pipes, tanks and reaction ves- sels of all types which are corroded or eroded from the inside, requires a perfectly suitable gauge and special care in handling the probe. The inspectors should always be informed about the corresponding nominal wall thicknesses and the likely amount of wall thickness losses. Ultrasonic evaluation of flaws In present-day test practice, there are basically two different methods of flaw evaluation: If the diameter of the sound beam is smaller than the extent of the flaw, then the beam can be used to ex- plore the boundaries of the flaw and thus determine its area. If, however, the diameter of the sound beam is larger than the size of the flaw, the maximum echo response from the flaw must be compared with the maximum echo response from an artificial flaw provided for com- parison purposes. Flaw boundary method The smaller the diameter of the probes sound beam, the more accurately the boundaries (and therefore the flaw area) can be determined by the flaw boundary method. If, however, the sound beam is relatively broad, the flaw area determined can substantially differ from the actual flaw area. Care should therefore be taken to select a probe which will give a sufficiently narrow beam at the position of the flaw. USM 35X Issue 06, 11/2007 1-7 Introduction Important information on ultrasonic testing Echo display comparison method The echo from a small, natural flaw is usually smaller than the echo from an artificial comparison flaw, e.g. circular disc flaw of the same size. This is due, for in- stance, to the roughness of the surface of a natural flaw, or to the fact that the beam does not impinge on it at right angles. If this fact is not taken into account when evaluating natural flaws, there is a danger of underestimating their magnitude. In the case of very jagged or fissured flaws, e.g. shrink holes in castings, it may be that the sound scattering occurring at the boundary surface of the flaw is so strong that no echo at all is produced. In such cases, a different evaluation method should be chosen, e.g. use of the backwall echo attenuation in the evaluation. The distance sensitivity of the flaw echo plays an im- portant part when testing large components. Attention should be paid here to choosing artificial comparison flaws which are as far as possible governed by the same distance laws as the natural flaws to be evalu- ated. The ultrasonic wave is attenuated in any material. This sound attenuation is very low, e.g. in parts made of fine-grained steel, likewise in many small parts made of other materials. However, if the sound wave travels larger distances through the material, a high cumulative sound attenuation can result even with small attenua- tion coefficients. There is then a danger that echoes from natural flaws appear too small. For this reason, an estimate must always be made of the effects of attenu- ation on the evaluation result and taken into account if applicable. If the test object has a rough surface, part of the inci- dent sound energy will be scattered at its surface and is not available for the test. The larger this initial scat- tering, the smaller the flaw echoes appear, and the more errors occur in the evaluation result. It is therefore important to take the effect of the test objects surfaces on the height of the echo into account (transfer correction). 1-8 Issue 06, 11/2007 USM 35X Introduction The USM 35X family 1.3 The USM 35X family The USM 35X is a lightweight and compact ultrasonic flaw detector especially suitable for locating and evaluating material defects, measuring wall thicknesses, saving and documenting test results. With its frequency range from 0.5 to 20 MHz and a maximum calibration range of 10 m (steel), the USM35X is designed for use on large workpieces and in high- resolution measurements. The different instrument versions The USM 35X is available in several versions which are desgined for different applications: USM 35X Standard version for universal ultrasonic test applica- tions. USM 35X DAC The multiple DAC curves and time-corrected gain enable a field-oriented echo amplitude evaluation according to almost all international test specifica- tions. USM 35X S DGS evaluation mode in addition to multiple DAC curves and TCG. DGS curves are stored for all narrow-band single- element probes; amplitude evaluation is carried out either in dB above DAC curve or equivalent reflector size (ERS). Data Logger option This option is available for all USM 35X versions and is used for the recording and documentation of thick- ness readings. USM 35X Issue 06, 11/2007 1-9 Introduction The USM 35X family Special features low weight (2.2 kg including lithium-ion battery) and compact size waterproof instrument case with protection class IP 66 long operating time (> 12 hours) by means of lithium- ion battery with internal and external charging possi- bility handy equipped with a non-slip, ratcheting prop-up stand, also used as handle rotary knobs for direct adjustment of gain as well as for changing the currently selected function two independant gates for accurate wall thickness measurements from the workpiece surface up to the first echo, or between two backwall echoes, including measurement on coated workpieces with a resolution of 0.01 mm (up to 100 mm), referred to steel magnify gate: spreading of the gate range over the entire screen width 5.7", 1/4 VGA-TFT color display to display the digi- tized signals (320 240 pixels, 115 86 mm ) VGA interface for the connection of an external monitor color display of gates for an easier distinction easily recognizable reflection geometry when using angle-beam probes by the variation of A-scan or background color at every deflection point data memory: 800 data sets, including alphanumeric description, documentation possibility via a printer increased calibration range: up to 9999 mm (steel), depending on the frequency range semiautomatic two point calibration pulse repetition frequency variable in ten steps to avoid phantom echoes when testing large workpieces choice of frequency range for the connected probe signal display mode: full-wave rectification, positive half-wave or negative halv-wave and radio frequency display of 4 readings plus 1 reading zoomed in the A-scan, user-configurable 1-10 Issue 06, 11/2007 USM 35X Introduction How to use this manual 1.4 How to use this manual The present operating manual applies to all instrument versions of the USM 35X. Differences in the functions or setting values are always marked. Before operating the USM 35X for the first time, it is absolutely necessary that you read the chapters 1, 3 and 4 of this manual. They will inform you about the necessary preparations of the instrument, give you a description of all keys and screen displays, and explain the operating principle. In doing this, you will avoid any errors or failures of the instrument and be able to use the full range of instru- ment functions. You will find the latest changes to this operating manual in chapter 10 Changes. It describes corrections that have become necessary at short notice and have not yet been included in the general manual. If no correc- tions have become necessary, this chapter is empty. The specifications/Technical Specifications according to EN 12668-1 for the USM 35X family can be found in the attachment at the end of this operating manual. The Data Logger option, which can be applied to all USM 35X versions, is described in a chapter of its own at the end of the operating manual. All functions refer- ring to the Data Logger and the tolerance monitor are described here. At the same time, the standard operat- ing manual applies to all other functions. USM 35X Issue 06, 11/2007 1-11 Introduction Layout and presentation in this manual 1.5 Layout and presentation in this manual To make it easier for you to use this manual, all operat- ing steps, notes, etc., are always presented in the same way. This will help you find individual pieces of information quickly. Attention and Note symbols A Attention: The Attention symbol indicates peculiarities and spe- cial aspects in the operation which could affect the accuracy of the results. H Note: Note contains e.g. references to other chapters or spe- cial recommendations for a function. Listings Listings are presented in the following form: Variant A Variant B ... Operating steps Operating steps appear as shown in the following ex- ample: Loosen the two screws at the bottom. Remove the cover. ... 1-12 Issue 06, 11/2007 USM 35X USM 35X Issue 06, 11/2007 2-1 Standard package and accessories 2 2-2 Issue 06, 11/2007 USM 35X Standard package and accessories This chapter informs you about the standard package and the accessories available for the USM 35X. It describes accessories included in the standard package, recommended accessories. USM 35X Issue 06, 11/2007 2-3 Standard package and accessories 2.1 Standard package Product code Description Order number Ultrasonic testing kit consisting of: USM 35X Compact Ultrasonic Flaw Detector, basic version with LEMO-1-TRIAX connectors 36 060 or with BNC connectors 36 061 or USM 35X DAC Compact Ultrasonic Flaw Detector, DAC version with LEMO-1-TRIAX connectors 36 062 or with BNC connectors 36 063 or USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG and DGS evaluation with LEMO-1-TRIAX connectors 36 064 or with BNC connectors 36 065 Standard package 2-4 Issue 06, 11/2007 USM 35X Standard package and accessories Standard package Product code Description Order number UM 30 Transport case 35 654 AC power supply/battery charger 102 163 Operating manual in English 48 001 USM 35X Issue 06, 11/2007 2-5 Standard package and accessories Recommended accessories 2.2 Recommended accessories Product code Description Order number Operating manual in German 48 002 Operating manual in French 48 003 Operating manual in Spanish 48 004 Operating manual in Japanese 48 005 Operating manual in Chinese 48 006 LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208 DR36 Battery charger for external charging of the Li-Ion battery 35 297 NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810 Energy 16 Desk rapid charger for external charging of NiMH or NiCd cells 101 729 UM 32 Protection bag including neck strap 35 655 UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291 2-6 Issue 06, 11/2007 USM 35X Standard package and accessories Product code Description Order number UD 31 PC cable, 9-pin (PC), 9-pin (instrument) 34 943 UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495 UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944 Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121 Serial-to-parallel printer cable (Patton Model 2029) 101 761 USB-RS Adapter cable RS232 USB 35 838 UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268 UM 31 VGA adapter for connection of an external monitor 35 653 UM 28 D Option: Data Logger (retrofittable to all versions) 35 800 UM 200 W UltraDOC data communication software for USM 35 024 U 100 W UltraDOC 33 829 PZ-USM Calibration certificate according to EN 12668-1 35 263 Epson LX Matrix printer for mains operation, single sheet and continuous stationary 17 995 Seiko DPU Thermal printer for mains and battery operation 17 993 Recommended accessories USM 35X Issue 06, 11/2007 3-1 Initial start-up 3 3-2 Issue 06, 11/2007 USM 35X Initial start-up Connecting the instrument Connect the USM 35X to the mains socket-outlet using the corresponding power supply unit. The plug recep- tacle is at the top left of the USM 35X. Push the Lemo plug of the power supply unit into the plug receptacle until it snaps into place with a clearly audible click. Power supply 3.1 Power supply The USM 35X can be operated with an external power pack adaptor or with batteries. You can connect the USM 35X to the mains supply system even if it carries batteries. A discharged battery is charged in this case, viz. parallel to the instrument operation. Operation using the power supply unit Mains connection The power supply unit is delivered with two different power cables for Euro and USA standard.
USM 35X Issue 06, 11/2007 3-3
Initial start-up Power supply When pulling off the Lemo plug, withdraw the metal bushing on the plug first in order to release the lock. The power supply unit is automatically set to any nomi- nal voltage between 90 VAC and 240 VAC. Operation using batteries Use either a lithium-ion battery or 6 standard C-cells (NiCad, NiMH, or alkaline cells) for the battery opera- tion. We recommend the use of a lithium-ion battery. It has a higher capacity and consequently ensures a longer operating time of the instrument. Inserting batteries The battery compartment is situated at the instrument back; the lid is fastened with 2 attachment screws. Press the two attachment screws of the battery compartment downward in order to loosen them. Lift the lid off upward. To the right in the open battery compartment, you will see two springs and several connection pins. Insert the battery into the battery compartment. To do this, first press the right side of the battery against the springs of the battery compartment. Make sure that the socket on the right side of the battery is connected with the connection pins in the battery compartment. 3-4 Issue 06, 11/2007 USM 35X Initial start-up or Insert the batteries into the battery compartment and check the right polarity. Close the battery compartment and fasten the attachment screws. Checking the battery charge of lithium-ion batteries The lithium-ion battery is equipped with a battery charge indicator. The battery charge indicator is situated at the front right of the battery. Four LEDs indicate the charge level of battery. Check the battery charge before insert- ing the battery into the instrument. The number of LEDs that are on has the following meaning: 4 LEDs battery charge 100 ... 76 % 3 LEDs battery charge 75 ... 51 % 2 LEDs battery charge 50 ... 26 % 1 LED battery charge 25 ... 10 % 1 LED flashing battery charge < 10 % Power supply USM 35X Issue 06, 11/2007 3-5 Initial start-up Press the button PUSH at the front side of the battery. Four LEDs indicate the charge level of battery. H Note: You can also check the battery charge even if the battery is located in the battery compartment of the instrument. Analog battery charge indicator The USM35X is equipped with an analog battery charge indicator which enables you to estimate the remaining battery life. In the measurement line to the very right a battery symbol displays the corresponding charging level.The battery symbol indicates the charge in steps of 10 %. H Note: If the battery charge indicator displays a low battery charge, you should urgently close your test job and exchange the battery. You should take a second battery or replacement batteries with you if you cannot connect the instrument to mains. Power supply Charging the batteries You can charge the lithium-ion battery either directly in the instrument or by means of an external battery charger. You always need an external battery charger to charge standard C-cells. Internal charging Requirement: Lithium-ion battery, order number 102 208 Power supply/charger unit, order number 102 163 If a battery is located in the instrument, the charging process is started automatically when you connect the plug-in power supply unit. You can carry out ultrasonic inspections and charge a battery at the same time. The charging time is 10 hours with a simultaneous ultra- sonic inspection. If the instrument is not being used for ultrasonic inspections, the charging time is 8 hours. This charging time applies to ambient temperatures from 25 to 30 C. Please take into consideration that the batteries are not charged to their full capacity at higher temperatures. The LED display on the plug-in power supply unit indi- cates the status of the charging process. 3-6 Issue 06, 11/2007 USM 35X Initial start-up green LED yellow LED red LED Status off flashing off no battery detected off flashing dark/bright flashing bright/dark charging at low power off on off quick charging phase 1 flashing dark/bright flashing bright/dark off quick charging phase 2 on off off battery charged off off flashing bright/dark temperature error, auto-reversible off off on csharging error, permanent Power supply External charging Lithium-ion batteries can be charged by means of an external battery charger. We recommend the battery charger with the order number 35 297. To charge single NiCad or NiMH cells, you need the external desktop battery charger with the order number 101 729. USM 35X Issue 06, 11/2007 3-7 Initial start-up 3.2 Connecting a probe To prepare the USM 35X for operation, you have to con- nect a probe to it. Any Krautkramer probe can be used for the USM 35X, provided the appropriate cable is avail- able and the operating frequency is within an adequate range. The USM 35X is available with the probe connectors LEMO-1-TRIAX or BNC. The probe is connected to the sockets at the top right on the instrument casing. Both connector sockets are equally suitable (connected in parallel) for connecting probes equipped with only one ultrasonic element (ultra- sonic transducer) so that it does not matter which one of the two sockets is used. When connecting a dual-element (TR) probe (having one transmitter element and one receiver element), or two probes (of which one is transmitting and the other one receiving), attention should be paid to connecting the transmitter element to the right-hand socket (trans- mitter, marked with black circle at the rear of the instru- ment case) and the receiver element to the left-hand socket (receiver, marked with red circle). A Attention: If this is not taken into account, the consequence would be a mismatching which may lead to consider- able power losses or even to echo waveform distor- tions. Receiver Transmitter Connecting a probe 3-8 Issue 06, 11/2007 USM 35X Initial start-up 3.3 Starting the USM 35X Switching on To start the USM 35X, press the switch-on key . The start display of the USM 35X appears; here you will also see the current software version of the instrument. The instrument carries out a self-check and then switches over to stand-by mode. The settings of all function values and the basic set- tings (language and units) are the same as before switching-on of the instrument. Basic initialization In case the instrument can no longer be operated, or you need to make a basic initialization (factory setting), you have two options. To keep the saved data: Press the and the key simultaneously. The instrument boots with the default setting, but all stored datasets will remain unchanged (warm start). To delete the saved data: A Attention: All saved data are deleted. Press the and the key simultaneously. The instrument is reset to factory setting (cold start). In the start-up screen the message Basic Initialization appears, and the unit will bei initialized and reset to its basic setup (dialog language: English, for more details on how to select the language, please refer to chapter 4). Information lines in the startup screen You can enter two lines (each with up to 39 characters) for information purposes in the startup screen. For this use the remote function (codes I1 and I2, refer to chapter 8). Starting the USM 35X USM 35X Issue 06, 11/2007 4-1 Principles of operation 4 4-2 Issue 06, 11/2007 USM 35X Principles of operation Operators controls Keys for selecting a function Rotary knob for direct setting of the current function Rotary knob for direct gain setting Special keys for special instrument functions Keys for selecting a function group On/Off key 4.1 Operators controls LED A: Gate alarm R: Rejection D: Dual on Key for changing the operation level USM 35X Issue 06, 11/2007 4-3 Principles of operation Screen display 4.2 Screen display The USM 35X has a digital screen for the display of A-scan in the normal mode A-scan in the zoom mode The zoom mode is activated using the key . H Note: The screen display always shows the gain and the ad- justed dB step value. All other functions are locked in zoom mode. 4-4 Issue 06, 11/2007 USM 35X Principles of operation Screen display Functions on the display The names of the five function groups are displayed at the bottom of the screen. The currently selected func- tion group is highlighted. Indicated at the right of the display, next to the A-scan, are the functions of the corresponding function group. The display of the functions disappears in the zoom mode. USM 35X Issue 06, 11/2007 4-5 Principles of operation Screen display Amplitude height Gate A (%) Sound path Gate A Amplitude height Gate B (%) Sound path Gate B Status indicator: TOF = Flank Other displays The measurement line below the screen display shows values of settings, measured values, and status indica- tions. As an alternative, a scale can be shown here, giving an overview of the echo positions. H Note: Every measurement value can also be shown in an en- larged display at the top right corner of the A-scan (set- ting in the function group MEAS, function S-DISP). H Note: You can configure the four positions of the measure- ment line for set and measured values as required (func- tion group MSEL). Please refer to chapter 5.14, section Configuring the measurement line on this subject. Example of a measurement line 4-6 Issue 06, 11/2007 USM 35X Principles of operation Keys and rotary knobs 4.3 Keys and rotary knobs Function keys For changing between operation levels (below), For selection of the function groups (below) and For selection of the functions (right). On/Off key For turning the device on or off. USM 35X Issue 06, 11/2007 4-7 Principles of operation Keys and rotary knobs Special keys To directly activate individual instrument functions: To choose the increment for the gain setting To freeze the A-scan To display a zoomed A-scan To transfer the data To record measured values and to save the data 4-8 Issue 06, 11/2007 USM 35X Principles of operation Rotary knobs The USM 35X is equipped with two rotary knobs. The left-hand rotary knob enables you to directly set the gain; the right-hand rotary knob serves for setting the currently selected function. The two rotary knobs enable both step-by-step and accelerated settings. You can define a setting step by step by slightly operating the rotary knob which will snap into place at the next setting. To accelerate the setting, operate the rotary knob continuously, i.e. at a constant speed. This enables you to quickly bridge great differences between the settings. H Note: As an alternative, you can operate the USM35X via a special menu line without using the rotary knobs.A de- scription can be found on page 4-10. Keys and rotary knobs 4.4 Operational concept The USM 35X is an easy-to-use instrument. It has three operating levels, and you can change between them by pressing the key. You will recognize your currently active operating level by the number on the separation line between the first and the second function group. If the instrument is equipped with the Data Logger option, a fourth operating level is added to the existing ones. Each operating level contains five function groups. First operating level Second operating level Third operating level USM 35X Issue 06, 11/2007 4-9 Principles of operation Setting the functions Shown below the A-scan are five function groups that you can directly select using the corresponding key. The selected function group is highlighted and the corre- sponding four functions are displayed next to the A-scan on the right. You can likewise directly select the individual functions using the corresponding keys. Functions with double assignments Some functions have double assignments. You will rec- ognize the functions with double assignments by an arrow (icon >) after the function name. Toggle between the two functions by repeatedly press- ing the corresponding key . Coarse and fine adjustment of functions You can choose between coarse and fine adjustment for some functions. You can toggle between these two adjustment modes by pressing the corresponding key several times. The fine adjustment is identified by an asterisk preceding the function value. The following functions offer a choice between coarse and fine adjustment: Function Function group RANGE BASE MTLVEL BASE D-DELAY BASE aSTART aGAT aWIDTH aGAT bSTART bGAT bWIDTH bGAT cSTART cGAT cWIDTH cGAT S-REF1 CAL S-REF2 CAL ANGLE TRIG THICKNE TRIG DIAMET TRIG For more details on the adjustment possibilities, please read from page 5-5 onward. Operational concept 4-10 Issue 06, 11/2007 USM 35X Principles of operation Alternative operation without rotary knobs The operation mode of the USM35X without rotary knobs is intended for all applications where the ultra- sonic instrument is used with a dustproof or watertight cover, e.g. in contaminated areas of nuclear power plants or in dusty environments. Browse through the menus using the key to select the required menu. Press the key and keep it pressed for one second to switch to the operation mode without rotary knobs. The instrument still displays the last chosen menu but changes the menu key assignment to the following menu line: Key functions dB reduces the instrument gain by the selected step dB+ increases the instrument gain by the selected step H Note: The key remains active, i.e. you can select another dB step size if required. Val reduces the value of the currently chosen function, e.g. RANGE Val+ increases the value of the currently chosen function Press the key next to one the four functions to select it for editing. With another press of the respective key you can choose between coarse and fine setting if applicable for this function. Keep the Val or Val+ key pressed to activate an accelerated setting. Hence the values are changed in larger steps. Operational concept USM 35X Issue 06, 11/2007 4-11 Principles of operation Operational concept If you need to select another function menu, keep the key pressed to return to the normal operation (menu display). Select the required function group and keep the key pressed for another second to reactivate the operation mode without functions knobs. H Note: The rotary knobs also work if the instrument is operated with keys only. When a parameter menu is displayed, e.g. DGSMEN or TESTINF, you can only change the functions in the selected column using Val and Val+ in key operation mode. In the following example only the left column can be edited: A single key press on the key offers the selection of another parameter column. If you keep the key pressed once again, you can change the functions of the selected column instead. 4-12 Issue 06, 11/2007 USM 35X Principles of operation 4.5 Important basic settings Selecting the language Select the language in which the function names should be displayed on the screen in the function DIALOG (Function group CFG1). The following languages are available: German English (default setting) French Italian Spanish Portuguese Dutch Swedish Slovenian Romanian Finnish Czech Danish Hungarian Croatian Russian Slovakian Norwegian Polish Japanese Chinese Serbian If necessary, go to the third operating level. In the function group CFG1 select the function DIALOG. Important basic settings USM 35X Issue 06, 11/2007 4-13 Principles of operation H Note: Double assignment of the function DIALOG/UNIT (icon >). Toggle between the two functions by repeat- edly pressing the corresponding key . Select the required language by means of the right- hand rotary knob. Selecting units In the function UNIT (function group CFG1) you can choose your favorite units between mm or inch. If necessary, go to the third operating level. In the function group CFG1 select the function UNIT. H Note: Double assignment of the function DIALOG/UNIT (icon >). Toggle between the two functions by repeat- edly pressing the corresponding key . Set the required unit by means of the right-hand rotary knob. A Attention: Select your units immediately when you start working with the USM 35X because if you change the unit, all the current settings are deleted, and the basic setup is loaded again. Important basic settings 4-14 Issue 06, 11/2007 USM 35X Principles of operation In order not to delete anything by accident, a safety prompt is displayed in the measurement line. If you are sure that you want to change the unit, press the key belonging to the function UNIT one more time. The unit is now changed, the current data are deleted. If you want to abort the process, press any other key. The previous setting is kept in that case. Setting the date The date is saved together with the test results. You can set it in the function DATE (function group CFG2). A Attention: Please take into account that the USM 35X only indi- cates the year with two digits. You should always make sure that you use correctly set values of date. Test results may otherwise be falsi- fied. Important basic settings If necessary, change to the third operation level. Select the function DATE in the function group CFG2. H Note: Double assignment of the function DATE/TIME (icon >). Toggle between the two functions by repeatedly press- ing the corresponding key . Use the left-hand rotary knob to select the value that you want to vary, e.g. the day. Use the right-hand rotary knob to vary the selected value. USM 35X Issue 06, 11/2007 4-15 Principles of operation Setting the time The function TIME (function group CFG2) serves for setting the current hour of time. It is saved together with the test results. A Attention: For a correct documentation you should always make sure that you are using the correct time settings. Dont forget to manually set the time when changing from winter to summer time. If necessary, change to the third operation level. Select the function TIME in the function group CFG2. H Note: Double assignment of the function DATE/TIME (icon >). Toggle between the two functions by repeatedly press- ing the corresponding key . Use the left-hand rotary knob to select the value that you want to vary, e.g. the hour. Use the right-hand rotary knob to vary the selected value. Important basic settings 4-16 Issue 06, 11/2007 USM 35X Principles of operation 4.6 Basic settings of the display The equipment of the USM 35X includes a high-resolu- tion color display. You can optimize the display settings to your individual viewing habits and to the operational environment. Selecting the color scheme You can use the function SCHEME (function group LCD) to choose one of four color schemes. The color scheme determines the color of all displays and that of the background. You cannot vary the colors of gates because they are fixed as follows: Gate A red Gate B green Gate C blue H Note: All color schemes are suitable for indoor use. For out- door use, we recommend the color schemes 3 and 4. If necessary, change to the third operation level. Select the function SCHEME in the function group LCD. Use the right-hand rotary knob to choose the required color scheme. Setting the lighting Use the function LIGHT (function group LCD) to set the display lighting. You can choose between the default lighting max. and a lighting in the economy mode min.. H Note: The economy mode reduces the current consumption and consequently increases the operating time in bat- tery operation. If necessary, change to the third operation level. Select the function LIGHT in the function group LCD. Use the right-hand rotary knob to set the required lighting. Basic settings of the display USM 35X Issue 06, 11/2007 5-1 Operation 5 5-2 Issue 06, 11/2007 USM 35X Operation Overview of the functions 5.1 Overview of the functions The functions of the USM 35X are combined to form function groups on three operating levels. If the instrument has the option Data Logger, there is an additional fourth operation level. Press the key to change between the operating levels. Press the key to select the function group shown above it. Press the key to select the function shown next to it. The setting of the selected function is carried out via the right-hand rotary knob. The gain function is always directly available via the left- hand rotary knob. You can carry out important functions (switch on/off, dB-step, freeze, zoom and report printout) by pressing the special keys (ref. chapter 4). You will also find an overview of the function groups and their functions on the fold-out page. Each operating level contains five function groups. You will recognize your currently active operating level by the number on the separation line between the first and the second function group. First operating level Second operating level Third operating level H Note: If the instrument is equipped with the Data Logger op- tion, a fourth operating level is added. For this, refer to the corresponding chapter Option Data Logger. USM 35X Issue 06, 11/2007 5-3 Operation Overview of the functions Function groups first operating level BASE The functions that you find here are re- quired for the basic adjustment of the screen displays. PULS Combined in this group are the functions that serve for the adjustment of pulser. RECV Combined in this group are the functions that serve for the adjustment of receiver. aGAT All functions for setting the gate A can be found in this group. bGAT All functions for setting the gate B can be found in this group. Function groups second operating level CAL This function group makes functions for the semiautomatic calibration available to you. REF This function group serves for measuring the dB difference between a reference echo and the reflector echo. or AWS This is where you will find all functions for the classification of flaws in welds accord- ing to the AWS D1.1 specification. or DAC This is the function group where you can set the functions for the DAC (only USM 35X DAC and USM 35X S). or JDAC The DAC functions in this function group are modified to allow for a flaw evaluation according to JIS (Japanese Industrial Stan- dard) Z3060-2002 (only USM35X DAC and USM 35X S). 5-4 Issue 06, 11/2007 USM 35X Operation or DGS This function group serves for the ampli- tude evaluation according to the DGS method (only USM 35X S). TRIG Combined in this group are the functions required for angle beaming using angle- beam probes for the display of a (reduced) projection distance and depth position of a reflector (for plane-parallel and circular curved test components). MEM These functions serve for storing, loading and deleting of data sets. DATA The functions of this group serve for the dataset management and documentation. Function groups third operating level MEAS In this group, you can define the measuring point, select a parameter for the zoomed measured-value display in the A-scan as well as for the setting of the Magnify func- tion, and you can select different settings for the A-scan. MSEL This is where you configure your measure- ment line. You can choose one display for each of the four positions. LCD This is the function group where you can set the LCD contrast and backlight as well as the echo display mode on the screen. CFG1 Functions for the configuration: unit, dialog language, printer driver and assignment of the key CFG2 Other functions for configuration: time and date, alarm horn; plus the changeover between the evaluation modes Overview of the functions USM 35X Issue 06, 11/2007 5-5 Operation Setting the gain 5.2 Setting the gain This function, operated via the left-hand rotary knob, enables you to quickly and directly set the gain. You can use the gain to adjust the required sensitivity in order to control the echo amplitudes. Turn the left-hand rotary knob to set the gain. The current gain is indicated in the top left corner of the screen. Defining the dB incrementation for gain You can use the key to select a certain incremen- tation for setting the gain. You have a choice between 6 steps: 0.0 dB (locked) 0.5 dB 1.0 dB 2.0 dB 6.0 dB 6.5 20.0 dB H Note: The setting 0.0 dB locks the gain in this way preventing any accidental change of setting. You can determine the step size of the sixth step using the function dBSTEP in the function group RECV. Press to change between the six steps. The corresponding step size setting is indicated below the current gain on the screen. 5-6 Issue 06, 11/2007 USM 35X Operation 5.3 Adjusting the display range (function group BASE) The function group BASE enables you to make the ba- sic adjustment of the display range. The display on the screen must be adjusted for the material to be tested (function MTLVEL) and for the probe used (function P- DELAY). If required, go to the first operating level. Select the function group BASE. Adjusting the display range (function group BASE) H Note: In order to accurately adjust the material velocity and the probe delay, please read the section Calibrating the USM 35X, chapter 5.7, beforehand. RANGE (Display range) You can adjust the range for your measurement in RANGE. Coarse adjustment: from 0.5 mm ... 1400 (9999) mm in even steps Fine adjustment: up to 9.99 mm in steps of 0.01 mm/ up to 9.999" in steps of 0.001" up to 99.9 mm in steps of 0.1 mm/ up to 99.99" in steps of 0.01" up to 999 mm in steps of 1 mm/ from 100" in steps of 0.1" from 1000 mm in steps of 10 mm H Note: The adjustment range for the display range depends on the frequency range setting (function FREQU in function group RECV). USM 35X Issue 06, 11/2007 5-7 Operation Adjusting the display range (function group BASE) Frequency range Adjustment range (c = 5920 m/s) 0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390" 0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390" 0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50" 2 to 20 MHz 0.5 to 1420 mm/0.02" to 50" Select the function RANGE. If required, toggle between coarse and fine adjust- ment. Adjust the required value by means of the right-hand rotary knob. MTLVEL (Sound velocity) Use MTLVEL to set the sound velocity within the test object. You can use sound velocities between 1000 and 15000 m/s. Coarse adjustment, in steps as follows (m/s): 15000 9000 5000 2000 14000 8000 4000 1600 13000 7000 3250 1450 12000 6320 3130 1000 11000 6000 3000 10000 5920 2730 Fine adjustment 1000 ... 15000 in steps of 1 m/s A Attention: Always ensure that the function MTLVEL is correctly set. The USM 35X calculates all range and distance indications on the basis of the value adjusted here. Select the function MTLVEL. If required, toggle between coarse and fine adjust- ment. Adjust the required value by means of the right-hand rotary knob. D-DELAY (Display starting point) Here you can choose whether to display the adjusted range (for example 250 mm) starting from the surface of the test object, or in a section of the test object starting at a later point. This allows you to shift the complete screen display and consequently also the display zero. If the display should for example start from the surface of 5-8 Issue 06, 11/2007 USM 35X Operation Adjusting the display range (function group BASE) the test object, the value in D-DELAY must be set to 0. Coarse adjustment 10 mm ... 1024 mm/0.3" ... 40" in even steps Fine adjustment up to 99.9 mm/9.999" in steps of 0.01 mm/0.001" up to 1024 mm/10" in steps of 0.1 mm/0.001" Select the function D-DELAY. If required, toggle between coarse and fine adjust- ment. Adjust the value for the display starting point by means of the right-hand rotary knob. P-DELAY (Probe delay) Every probe has a delay line between the transducer element and the coupling face. This means that the initial pulse must first pass through this delay line be- fore the sound wave can enter the test object. You can compensate for this influence of the delay line in the function P-DELAY. H Note: If the value for P-DELAY is not known, read the section Calibrating the USM 35X, chapter 5.7, in order to deter- mine this value. Select the function P-DELAY. Adjust the value for the probe delay by means of the right-hand rotary knob. USM 35X Issue 06, 11/2007 5-9 Operation 5.4 Adjusting the pulser (function group PULS) You will find all functions for the adjustment of the puls- er in the function group PULS. If required, go to the first operating level. Select the function group PULS. DAMPING (Probe matching) This function serves for matching the probe. You can use it to adjust the damping of the probes oscillating circuit and to consequently change the height, width and resolution of the echo display. low This setting has a lower damping effect and produces higher and broader echoes. high This setting reduces the echo height but mostly also produces narrow echoes with higher resolution. Select the function DAMPING. Set the required value by means of the right-hand rotary knob. Adjusting the pulser (function group PULS) 5-10 Issue 06, 11/2007 USM 35X Operation Adjusting the pulser (function group PULS) POWER (Intensity) Use the function POWER to set the pulser voltage. You can choose between two settings: high high voltage low low voltage The setting high is recommended for all inspections in which maximum sensitivity is important, e.g. for the detection of small flaws. Choose the setting low for broadband probes or if narrow echoes are required (bet- ter lateral resolution). Select the function POWER. Use the right-hand rotary knob to choose the required setting. DUAL (Pulser-receiver separation) You can use the function DUAL to activate the pulser- receiver separation. off Single-element operation; the probe connection sockets are connected in parallel. on Dual mode for the use with dual-element (TR) probes; the left-hand socket (red) is connected with the amplifier input whereas the initial pulse is available at the right-hand socket (black). through Through-transmission mode for the use with two separate probes; the receiver is connected with left (red), the pulser is connected with right (black). Select the function DUAL. Use the right-hand rotary knob to choose the required setting. If the DUAL function is active, the LED D (dual) is on. USM 35X Issue 06, 11/2007 5-11 Operation Adjusting the pulser (function group PULS) PRF-MOD (Pulse repetition frequency) The pulse repetition frequency indicates the number of times an initial pulse is triggered per second. You can determine whether you need the highest possible PRF value, or whether you are satisfied with a low value. You have 10 steps available for the setting; step 1 means the lowest PRF value. The larger your workpiece, the smaller PRF values are needed in order to avoid phantom echoes. In the case of smaller PRF values, however, the A-scan update rate becomes lower; for this reason, high values are required if a workpiece should be scanned fast. The best way to determine the suitable PRF value is by experimenting: start from the highest step and reduce the value until there are no more phantom echoes. Select the function PRF-MOD. Adjust the required value by means of the right-hand rotary knob. 5.5 Adjusting the receiver (function group RECV) You will find all functions for the adjustment of the puls- er in the function group RECV. If required, go to the first operating level. Select the function group RECV. H Note: Double assignment of the function FINE G/dBSTEP (icon >). Toggle between the two functions by repeated- ly pressing the corresponding key . 5-12 Issue 06, 11/2007 USM 35X Operation FINE G (Fine adjustment of gain) This function serves for the fine adjustment of the cur- rent gain value. The fine adjustment is possible over a range of 11 steps within the range of 0.5 dB to +0.5 dB. The displayed gain value will not change. Adjustment range: 5 ... +5 (0.5 dB ... +0.5 dB) Select the function FINE G. Use the right-hand rotary knob to adjust the value for the fine gain. dBSTEP Use this function to set a step size for the gain variation by means of the key . The value set here is subse- quently available to you as the sixth step for the step- wise gain variation. You have a free choice of the value within the setting range. Setting range: 6.5 ... 20 dB Select the function dBSTEP. Set the value for the gain by means of the right-hand rotary knob. REJECT The function REJECT allows you to suppress unwanted echo indications, for example structural noise from your test object. The % screen height setting indicates the minimum height that the echoes should attain in order for them to be displayed on the screen at all. The Reject setting cannot be higher than the lowest threshold setting (minus 1 %) of any gate. A Attention: You should handle this function with great caution, as it may of course happen that you suppress echoes from flaws as well. Many test specifications expressly forbid using the reject function. Select the function REJECT. Set the required percentage value by means of the right-hand rotary knob. The LED R is therefore lit with active REJECT function. Adjusting the receiver (function group RECV) USM 35X Issue 06, 11/2007 5-13 Operation Adjusting the receiver (function group RECV) FREQU (Frequency range) In this function, you can adjust the operating frequency according to the frequency of your probe. You have a choice between ten frequency ranges: 0.2 ... 1 MHz 0.5 ... 4 MHz 0.8 ... 8 MHz 2 ... 20 MHz 1 MHz narrow band filter 2 MHz narrow band filter 2,25 MHz narrow band filter 4 MHz narrow band filter 5 MHz narrow band filter 10 MHz narrow band filter Select the function FREQU. Adjust the required value by means of the right-hand rotary knob. RECTIFY (Rectification) You can select the rectification mode of the echo puls- es according to your application in the function RECTI- FY. You have the following options to choose from: full-w (= full-wave) All half-waves are displayed above the baseline. pos hw (= positive half-wave) Only positive half-waves are displayed. neg hw (= negative half-wave) Only negative half-waves are displayed. rf (= radio frequency) Only applies to the display range up to 50 mm (steel). Select the function RECTIFY. Use the right-hand rotary knob to adjust the required setting. 5-14 Issue 06, 11/2007 USM 35X Operation Setting the gates (function groups aGAT and bGAT) 5.6 Setting the gates (function groups aGAT and bGAT) All functions for setting the (dual) gate are arranged in the function group aGAT and bGAT. If required, go to the first operating level. Select the function group aGAT or bGAT. H Note: If you have an instrument equipped with the Data Logger option at your disposal, youll be additionally able to use the C gate including all corresponding functions. Tasks of the gates It monitors the range of the test object where you expect to detect a flaw. If an echo exceeds or falls below the gate, an alarm signal is output via the LED A. The gates A and B are independant of one another. Gate A can also have the function of an echo-start gate. The gate chooses the echo for the digital time-of- flight or amplitude measurement. The measured value is indicated in the measurement line. H Note: Error alarms can be triggered unter certain circumstanc- es. These are caused by intermediate conditions in instrument operation occuring when the instrument is USM 35X Issue 06, 11/2007 5-15 Operation used, i.e. when function parameters are changed. Pos- sible alarms occuring during instrument operation (setting of functions) are to be ignored. Display of gates To make the assignment easier, the gates are displayed in different colors. You cannot vary the colors of gates because they are fixed as follows: Gate A red Gate B green Gate C blue aLOGIC/bLOGIC (Evaluation logic of the gates) This function allows you to choose the method for trig- gering the gate alarm. The alarm is output to the LED A on the front panel of the USM 35X. There are four set- ting options available: Setting the gates (function groups aGAT and bGAT) off Evaluation logic off The alarm and measurement capability are switched off. The gate is not visible. pos Coincidence The alarm (LED A) is on if the preset response threshold of the gate is exceeded within the dis- played range. neg Anticoincidence The alarm (LED A) is on if the preset response threshold of the gate is not reached within the displayed range. a trig Triggering by interface echo When using gate A as echo-start gate (setting of the evaluation logic for gate B) Select the function aLOGIC or bLOGIC. Set the required alarm logic by means of the right- hand rotary knob. H Note: The alarm and measurement function of the gates is only active within the display range. 5-16 Issue 06, 11/2007 USM 35X Operation aSTART/bSTART (Starting points of the gates) You can fix the starting point of the gates A or B within the adjustment range of 0 ... 9999 mm/250". Select the function aSTART or bSTART. Uuse the right-hand rotary knob to adjust the required setting. aWIDTH/bWIDTH (Width of the gates) You can determine the gate width within the range of 0.2 ... 9999 mm/0.008 ... 250". Select the function aWIDTH or bWIDTH. Use the right-hand rotary knob to adjust the required value. aTHRSH/bTHRSH (Response and mea- surement threshold of the gates) You can determine the threshold value of the gates within the range of 10 to 90 % screen height for triggering the LED alarm if this value is exceeded or not reached, de- pending on the setting of the aLOGIC/bLOGIC function. In the RF mode, the threshold can be additionally set from 90 % to 10 %. Select the function aTHRSH or bTHRSH. Set the required value using the right-hand rotary knob. Setting the gates (function groups aGAT and bGAT) USM 35X Issue 06, 11/2007 5-17 Operation Calibrating the USM 35X 5.7 Calibrating the USM 35X Calibrating the display range Before working with the USM 35X, you have to calibrate the instrument: you have to adjust the material velocity and display range and allow for the probe delay depend- ing on the material and dimensions of the test object. To ensure a safe and proper operation of the USM 35X, it is necessary that the operator be adequately trained in the field of ultrasonic testing technology. Below you will find some examples of common calibra- tion methods for certain test tasks. In addition, the USM 35X has a semiautomatic calibration function which is described as Case B: With unknown material velocity. Choosing the measuring point The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the choice of the measuring point which can be set either to flank, to jflank or to peak in the USM 35X. In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either speci- fied, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes. A Attention: In any case, the setting of the measuring point must always be identical for the calibration and for the subse- quent test application. Otherwise measurement errors might occur. 5-18 Issue 06, 11/2007 USM 35X Operation Calibrating the USM 35X Calibration with straight- and angle-beam probes Case A: With known material velocity Calibration process Set the known material velocity in MTLVEL (function group BASE). Couple the probe to the calibration block. Set the required display range in RANGE (function group BASE). The calibration echo must be dis- played on the screen. Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line. After this, change the adjustment of the function P-DELAY (function group BASE) until the correct sound path for the selected calibration echo is indicated in the measurement line. Example: You are carrying out the calibration for the calibration range of 100 mm/5" via the function group BASE using the calibration block V1 (thickness 25 mm/1") which is laid flatwise. Set RANGE to 100 mm/5". Set the known material velocity of 5920 m/s (233 "/ms) in MTLVEL. Set the gate so that it is positioned on the first calibration echo (from 25 mm/1"). Read the sound path in the measurement line. If this value is not equal to 25 mm/1", change the adjust- ment for the function P-DELAY until it is at 25 mm/1". This completes the calibration of the USM 35X to the material velocity of 5920 m/s (233 "/ms) with a calibra- tion range of 100 mm/5" for the probe used. USM 35X Issue 06, 11/2007 5-19 Operation Calibrating the USM 35X Case B: With unknown material velocity Use the semiautomatic calibration function of the USM 35X via the function group CAL for this calibration case. The distances between 2 calibration echoes must be entered as default data. The USM 35X will then carry out a plausibility check, calculate the material velocity and the probe delay, and automatically set the parame- ters. Calibration process Set the required display range in RANGE (function group BASE). The two calibraion echoes selected must be displayed on the screen. Set the range so that the second calibration echo is located on the right edge of the screen. Select the function group CAL. Enter the distances of the two calibation echoes in S-REF1 and S-REF2. Position the gate (function aSTART) on the first calibration echo. Press to record the first calibration echo. The recording of the first calibration echo is confirmed by the message Echo is recorded, and the func- tion CAL indicates the value 1. Move the gate to the second calibration echo. Press to record the second calibration echo. 5-20 Issue 06, 11/2007 USM 35X Operation Calibrating the USM 35X The correct calibration is confirmed by the message Calibration is done. The USM 35X will now automatically determine the sound velocity and the probe delay and set the corre- sponding functions accordingly. The value of the func- tion CAL jumps back to 0. H Note: If the instrument is not able to carry out any valid cali- bration on the basis of the input values and the echoes recorded, a corresponding error message is displayed. In that case, please check the values of your calibration lines and repeat the process of recording the calibration echoes. Example Enter the distances (thicknesses) of the two calibra- tion lines S-REF1 (20 mm) and S-REF2 (40 mm). Position the gate on the first calibration echo. Press to record the first calibration echo. USM 35X Issue 06, 11/2007 5-21 Operation Calibrating the USM 35X Position the gate on the second calibration echo: Press . The second echo is stored, the calibration is carried out, and the CAL function is reset to 0. The valid cali- bration is briefly confirmed and carried out. If you select the function group BASE, you can read the material velocity and probe delay. Calibration with dual-element (TR) probes Dual-element (TR) probes are especially used for wall thickness measurement. The following peculiarities must be taken into account when using these probes: Echo flank Most dual-element (TR) probes have a roof angle (trans- ducer elements with inclined orientation toward the test surface). This causes mode conversions both at beam index (sound entry into the material) and at the reflec- tion from the backwall, which can result in very jagged echoes. V-path error Dual-element (TR) probes produce a v-shaped sound path from the pulser via the reflection from the backwall to the receiver element. This so-called V-path error affects the measuring accuracy. You should therefore choose two wall thicknesses that cover the expected thickness measurement range for the calibration. In this way, the V-path error can be corrected to the greatest possible extent. 5-22 Issue 06, 11/2007 USM 35X Operation Calibrating the USM 35X Higher material velocity Due to the V-path error, a higher material velocity than that of the test material is given during calibration, espe- cially with small thicknesses. This is typical of dual- element (TR) probes and serves for compensation of the V-path error. With small wall thicknesses, the above-described effect leads to an echo amplitude drop which has to be espe- cially taken into account with thicknesses less than 2 mm/0.08". A stepped reference block having different wall thick- nesses is required for calibration. The wall thicknesses must be selected so that they cover the expected read- ings. Calibration process: We recommend to use the semiautomatic calibration function for the calibration with T/R probes. Set the required test range. Increase the probe delay (P-DELAY) until the two calibration lines are displayed within the range. Set the pulser and receiver functions according to the probe used and the test application. Set the function TOF (function group MEAS) to flank. Vary the gain so that the highest echo reaches approximately the full screen height. Set the gate threshold to the required height for measuring the sound paths at the echo flanks. Select the function group CAL. Enter the distances of the two calibration echoes in S-REF1 and S-REF2. Position the gate (function aSTART) on the first calibration echo. Press to record the first calibration echo. Couple the probe to the calibration block containing the second calibration line, and set the height so that its about as high as the first calibration echo. Move the gate to the second calibration echo. USM 35X Issue 06, 11/2007 5-23 Operation Calibrating the USM 35X Press to record the second calibration echo. The correct calibration is confirmed by the message Calibration is done. The material velocity and probe delay are set. The value of the CAL function goes back to 0. If necessary, check the calibration on one or several known calibration lines, e.g. using the stepped reference block VW. H Note: Always keep in mind that the measured value is deter- mined at the intersection point of gate and echo flank when the function TOF was set to flank. A correct set- ting of the echo height and gate threshold is therefore decisive for accurate calibration and measurement! Calibrations or measurements in the peak mode are mostly not possible when using dual-element (TR) probes. As the echoes are often very broad and jagged, a clear echo peak cannot always be found in these cases. 5.8 Measuring General notes Please pay attention to the following notes when mea- suring with the USM 35X. Condition for measurements is the correct instrument calibration (sound velocity, probe delay). All amplitude measurements are carried out at the highest or the first signal in the gate. All distance measurements are carried out at the intersection point of gate and the first echo flank (TOF = flank or jflank), or at the peak of the highest echo (TOF = peak). If the echo amplitudes do not succeed 5 % screen height all sound path and amplitude measurements will be suppressed. Thus, rapidly changing random measurements caused by the instruments back- ground noise are avoided. 5-24 Issue 06, 11/2007 USM 35X Operation Measuring The following example shows the dependency of dis- tance measurement on the echo waveform, i.e. on the height of the gate threshold and thus on the selection of the intersection point at the signal. H Note: The point of amplitude measurement is marked with a small upward triangle on the corresponding gate bar. The point of distance measurement is marked with a small downward triangle. Gate threshold at 20 % measured sound path: 24.44 mm Gate threshold at 80 % measured sound path: 24.91 mm USM 35X Issue 06, 11/2007 5-25 Operation 5.9 Measurement of dB difference (function group REF) You can evaluate reflector echoes by means of refer- ence echoes. The function group REF makes all func- tions for the echo comparison between a reflector echo and a reference echo available to you. If required, go to the second operating level. Select the function group REF. Measurement of dB difference (function group REF) H Note: Depending on the setting in the function EVAMOD (function group CFG2), one of the function groups AWS, DAC, JDAC, or DGS may also be displayed at this point. Please also refer to chapter 5.15 General configu- ration. You will find the following function: REFECHO Storing or deleting the reference echo REFMOD Activating the measurement of dB difference aSTART Positioning the A gate The functions are described in the order in which you need them during your work. 5-26 Issue 06, 11/2007 USM 35X Operation Recording a reference echo Before using the measurement of dB difference, you have to first record a reference echo. A Attention: When recording a reference echo, an already stored reference echo is overwritten after a corresponding warning. Peak the reference echo according to the test specification. Position the A gate over the reference echo using the function aSTART. Select the function REFECHO. Turn the right-hand rotary knob upward in order to store the echo in gate A as a reference echo. If necessary, confirm the warning message in order to overwrite a stored reference echo. The reference echo is now recorded. An inverted R is shown in the measurement line. Deleting a reference echo You can delete stored reference echoes. Select the function REFECHO. Turn the right-hand rotary knob downward in order to delete the reference echo. If necessary, confirm the warning message in order to delete the stored reference echo. Measurement of dB difference (function group REF) USM 35X Issue 06, 11/2007 5-27 Operation Echo comparison You can compare the echo of any reflector of your choice with the reference echo. The displayed result is the dB difference of the two echoes. H Note: The dB difference is independent of any possible gain variation. Choose Ha dB or Hb dB as measured value. Position the A gate over the echo. Select the function REFMOD. Activate the function by means of the right-hand rotary knob. The dB difference between the reference echo and the reflector echo is now displayed as the measured value. Measurement of dB difference(function group REF) 5-28 Issue 06, 11/2007 USM 35X Operation 5.10 Classification of welds (function group AWS) You can rate flaws in welds according to the specifica- tion AWS D1.1. You will find the corresponding func- tions in the function group AWS. If necessary, change to the second operation level. Select the function group AWS. Classification of welds (function group AWS) H Note: Double assignment of the function INDICA/aSTART. Press the corresponding key repeatedly to toggle between the functions. H Note: Depending on the setting in the function EVAMOD (function group CFG2), one of the function groups REF, DAC, JDAC, or DGS may also be displayed at this point. Please also refer to chapter 5.15 General configu- ration. Rating of welds according to AWS The rating of flaws in welds according to the AWS spec- ifications is based on an evaluation of the signal ampli- tude. In this process, the echo amplitude of the flaw echo is compared with the echo amplitude of a known reference reflector. In addition, the sound attenuation in the workpiece is also taken into consideration. The result is a dB value which is called flaw rating. The flaw rating D is calculated according to the formula: USM 35X Issue 06, 11/2007 5-29 Operation D = A B C with: A = Indication (in dB) Absolute instrument gain with which the maximum flaw echo is at 50 % (5 %) echo height B = Reference (in dB) Absolute instrument gain with which the maximum reference echo (1.5 mm side-drilled hole from the reference block 1) is at 50 % (5 %) echo height C = Attenuation (in dB) This value is calculated according to the formula C = 0.079 dB/mm (s 25.4 mm). With s = sound path of the flaw echo. The sound attenuation correction is automatically calculated and displayed by the instrument. For sound paths smaller than or equal to 25.4 mm (1 inch), the value is set to zero. D = D 1.1 Rating (in dB) This is the result of the evaluation according to AWS. The evaluation is carried out in the USM 35X accord- ing to the formula indicated above. Classification of welds (function group AWS) H Notes: Make sure that all instrument options for the special test are calibrated before starting with the rating accord- ing to AWS. Pay attention to peaking an echo with an amplitude between 45 % and 55 % screen height. A rating is not possible with other amplitudes. Apply couplant, and couple the probe to the refer- ence block 1. Peak the echo from the 1.5 mm side- drilled hole. Select the function aSTART, and set up the A gate on the reference echo. Vary the gain so that the reference echo is displayed at 50 % screen height. Choose the function REFRNCE, and confirm the choice in order to save the reference gain. 5-30 Issue 06, 11/2007 USM 35X Operation Couple the probe to the test object in order to evalu- ate a flaw echo. Select the function aSTART, and set up the A gate on the flaw echo. Vary the gain so that the flaw echo is displayed at 50 % screen height. Go to the function group AWS. Save the current gain using the function INDICA. The current gain is saved. The USM 35X will automatical- ly determine the values of the AWS variables C and D. You can then evaluate the rating D using the corresponding requirements from AWS. Classification of welds (function group AWS) USM 35X Issue 06, 11/2007 5-31 Operation 5.11 Calculation of flaw position (function group TRIG) In the function group TRIG you will find the functions for setting the flaw position calculation when using angle- beam probes. If required, go to the second operating level. Select the function group TRIG. Calculation of flaw position (function group TRIG) H Note: Double assignment of the function X-VALU/COLOR. Toggle between the two functions by repeatedly press- ing the corresponding key . The functions in the group TRIG enable to automatically calculate the (reduced) projection distance and the real depth of the flaw in addition to the sound path S, and to digitally display them in the measurement line. Projection distance PD: distance of probe index (sound exit point) from the position of the flaw, projected on the surface Reduced projection distance rPD: distance of the probes leading face from the position of the flaw, projected on the surface Depth d: Distance between flaw position and surface 5-32 Issue 06, 11/2007 USM 35X Operation When using angle-beam probes, the instrument can additionally calculate the sound path section or so- called leg L up to the next reflection point. This sound path section or leg can be displayed as the measured value La, Lb, or Lc. Calculation of flaw position (function group TRIG) ANGLE (Angle of incidence) The ANGLE function enables you to adjust the angle of incidence of your probe for the material used. This value is required for the automatic calculation of the flaw posi- tion. Adjustment range: 0 ... 90 Select the ANGLE function. Use the right-hand rotary knob to select the required setting. X-VALUE (X-value of the probe) The function X-VALUE enables you to set the X-value (distance between the probes leading face and probe index/sound exit point) of the probe used. This value is required for the automatic calculation of the reduced projection distance. Adjustment range: 0 ... 100 mm/0 ... 40" Select the function X-VALUE. Use the right-hand rotary knob to set the required value. USM 35X Issue 06, 11/2007 5-33 Operation Calculation of flaw position (function group TRIG) COLOR To make the orientation easier, the instrument is able to display the different sound path sections or legs in dif- ferent ways. You can choose between two display modes: 1 The A-scan is shown in another color in every leg. Leg 1 in magenta Leg 2 in blue Leg 3 in magenta 2 The legs are shown as background shadings. off No legs are displayed. Select the function COLOR. Use the right-hand rotary knob to set the required mode. THICKNE (Material thickness) Use the THICKNE function to set the materials wall thickness. This value is required for the automatic cal- culation of the real depth. Adjustment range: 1 ... 1000 mm/0.05 ... 400" Select the THICKNE function. Use the right-hand rotary knob to set the required value. DIAMET (Outside diameter of the test object) You will need the DIAMET function for tests on circular curved surfaces, for example when testing longitudinally welded tubes. In order to make the USM 35X carry out the corresponding correction of (reduced) projection distance and depth, you should enter the outside diam- eter of your test object in this function. If you plan to carry out the flaw position calculation for plane-parallel (flat) test objects, the DIAMET function should be set to flat. Adjustment range: 10 ... 2000 mm/0.4 ... 800" flat Select the DIAMET function. Use the right-hand rotary knob to set the required value. 5-34 Issue 06, 11/2007 USM 35X Operation 5.12 Data saving (function group MEM) You will find all functions for storing, recalling and delet- ing complete data sets in the function group MEM. If required, go to the second operating level. Select the function group MEM. Data saving (function group MEM) A data set contains all instrument settings as well as the A-scan. This means that whenever you recall a stored data set, your instrument is again set up exactly the same as it was at the moment when the data set was stored. This makes each one of your tests repro- ducible. You will find the following functions: SET-# selecting number of a data set RECALL recalling a stored data set STORE storing a data set DELETE deleting a data set The functions are described in the order in which you need them during your work. USM 35X Issue 06, 11/2007 5-35 Operation Storing a data set You can save your current setup to a data set. Select the function SET-#. Use the right-hand rotary knob to set the number where you would want to store the current data set (1 to 800). Select the function STORE. Use the right-hand rotary knob to set it to on. The USM 35X stores the current data set. When the storage process is completed, the function STORE is automatically reset to off. H Note: The asterisk (*) before a selected data set number indi- cates that this data set is already occupied. It is not possible to overwrite an occupied data set; select an- other data set which is still empty, or delete the occu- pied data set. To avoid loss of data e.g. in case of a software update you should save the data sets to a PC. All active entries in the information table (TESTINF) are automatically allocated to the data set being stored (see chapter 5.13 Dataset management). Deleting a data set An occupied data set is marked with an asterisk (*) before the data set number. You can delete these data sets if you no longer need them. Select the function SET-#. Use the right-hand rotary knob to set the number of the data set that you want to delete. Select the function DELETE. Use the right-hand rotary knob to set it to on. The measurement line will then prompt: Delete data set? Confirm by pressing the corresponding key one more time (all other keys would abort the process). The data set is now deleted; the asterisk preceding the data set number is no longer there. The function DELETE is automatically reset to off. Data saving (function group MEM) 5-36 Issue 06, 11/2007 USM 35X Operation Deleting all data set You can delete all data sets if you no longer need them. Select the function DELETE. H Note: Double assignment of the function DELETE/DELALL. Press the corresponding key repeatedly to toggle between the functions. Data saving (function group MEM) Use the right-hand rotary knob to set it to on. The measurement line will then prompt: Delete all data sets? Confirm by pressing the corresponding key one more time (all other keys would abort the process). All data sets are now deleted. The function DELETE is automatically reset to off. Recalling a stored data set You can recall a stored data set; your instrument will then be provided with all the test-relevant technical fea- tures that existed at the moment of the setup. A frozen display of the stored A-scan appears. A Attention: If a saved data set is loaded, the current instrument setup is lost. If necessary, save the current instrument setup to a new data set before loading a saved data set. Select the function SET-#. USM 35X Issue 06, 11/2007 5-37 Operation Use the right-hand rotary knob to set the number of the data set that you want to recall. Select the function RECALL. Use the right-hand rotary knob to set it to on. The measurement line will then prompt: Recall data set? Confirm by pressing the corresponding key one more time (all other keys would abort the process). The data set is now loaded and the current setup is overwritten. When the loading process is completed, the function RECALL is automatically reset to off. H Note: The gate for surveying the echo can be moved in the recalled A-scan. However, as the evaluation is made in the frozen A-scan, the measurement resolution is only 0.5 % of the adjusted calibration range. Data saving (function group MEM) 5-38 Issue 06, 11/2007 USM 35X Operation 5.13 Dataset management (function group DATA) The USM 35X offers comprehensive functions for an easy dataset management. If required, go to the second operating level. Select the function group DATA. The functions in the function group DATA enable you to easily manage the data sets stored in the USM 35X. The following functions are available: TESTINF You can save a lot of additional information for every data set, e.g. data on the test object, on the flaw detected, or comments. PREVIEW In this dataset preview you will see the A-scan, the dataset name and the storage date of each data set. DIR This function enables you to display a list of all stored data sets, including the corre- sponding dataset names. SETTING This is where you will see a list of func- tions including all settings of the current data set. Dataset management (function group DATA) USM 35X Issue 06, 11/2007 5-39 Operation TESTINF (Storing additional information) For every data set, you can store additional information which will support you in the easy management of the data sets. You have 9 fields at your disposal for this purpose. You can enter a maximum of 24 alphanumeric charac- ters in the following fields: DATNAME Dataset name OBJECT Object description FLAWIND Flaw indication OPERAT Name of the person carrying out the test SURFACE Surface quality COMMENT Comments You can enter numerical values in these fields: FLAWLEN Flaw length X-POS x-position coordinate Y-POS y-position coordinate You can save the current settings together with the edited additional information at a new and still empty dataset number (analogously to function STORE in the function group MEM), subsequently enter and save additional information for an already stored data set, overwrite the already saved additional information of a data set. Use the right-hand rotary knob to select and acitvate the function TESTINF. The table will now show the additional information saved for the currently selected data set. Use (INFO 3) and to select the field SET-#. Use the right-hand rotary knob to view the additional information for other data sets and to edit this infor- mation if required. Dataset management (function group DATA) 5-40 Issue 06, 11/2007 USM 35X Operation H Note: All stored data are displayed for data sets which are already occupied. An occupied data set is marked with an asterisk (*) before the data set number. If you have selected an empty data set, the field data of the previ- ously displayed data set are automatically transferred. However, the data in the numerical fields FLAWLEN, X-POS and Y-POS are deleted. This means that you only have to edit the variable fields in test applications which include continuous saving of results. All alpha- numerical field data are automatically transferred but can also be edited if necessary. Editing additional information You can edit all items with additional information. A Attention: As long as the field data edited in this table have not been saved, the previous entries remain valid. Please keep this in mind, e.g. before selecting a new dataset number: all changes in the current data set are lost! Select the required field. Use the left-hand rotary knob to mark the required character position. Use the right-hand rotary knob to select the charac- ter for this position. You only need the right-hand rotary knob to enter the numerical values in FLAWLEN, X-POS and Y-POS. H Note: You cannot edit the field SET-#. The number of the cur- rent data set is displayed here. Dataset management (function group DATA) USM 35X Issue 06, 11/2007 5-41 Operation Storing additional information A Attention: If you have edited already existing additional informa- tion, all previous additional information is overwritten when the data are stored. Select the field STO-INF. Use the right-hand rotary knob to set this function on. The currently displayed data of the fields are now stored. The function STO-INF is automatically reset to off at the end of data storage. If necessary, press one of the keys , or to go back to the A-scan without storing the data. H Note: In the case of previously empty data sets, all instrument settings and the current A-scan are stored simulta- neously with the edited field data. Only the edited field data are stored for the previously occupied data sets. Previously stored instrument settings and A-scans are kept. PREVIEW (Dataset preview) This function enables you to view the A-scans of all stored data sets. Select the PREVIEW function. Use the right-hand rotary knob to set the function to on. The A-scan and the name of the first data set are displayed. Viewing other data sets: Select the SET-# function. Use the right-hand rotary knob to select the number of the required data set. Select the RECALL function. Use the right-hand rotary knob to set the function to on. The selected data set is displayed. If necessary, confirm the message using the corre- sponding key . If necessary, press one of the keys , or to go back to the currently active A-scan. Dataset management (function group DATA) 5-42 Issue 06, 11/2007 USM 35X Operation DIR (Dataset directory) This function enables you to get an overview of all stored data sets, including their names and numbers. Select the DIR function. Use the right-hand rotary knob to set the function to on. The directory list of the stored data sets is displayed (dataset numbers and names). The display shows 12 data sets at a time. Occupied data sets are marked with an asterisk (*). Turn the right-hand rotary knob to have other data sets displayed. The list always advances by one line each. If necessary, press one of the keys , or to go back to the currently active A-scan. Dataset management (function group DATA) SETTING (Function list) This function provides you with an overview of all set functions of the current data set. Select the SETTING function. Use the right-hand rotary knob to set the function to on. The list of the currently set functions is displayed. Turn the right-hand rotary knob to have other lines displayed. The list is advanced by one line each. If necessary, press one of the keys , or to go back to the currently active A-scan. USM 35X Issue 06, 11/2007 5-43 Operation 5.14 Configuring the USM 35X for a test application Besides the default settings for the instrument opera- tion, you have to configure the USM 35X for calibration and test tasks. You will find the corresponding functions in the function groups MEAS, MSEL and LCD. In addition, you have to check the current time and date, and set them if required, so that they are correctly stored together with the test results. Please look up the function groups CFG1 and CFG2 for more functions for the general instrument setup (please refer to chapter 5.15 General configuration). If required, go to the third operating level. Select the function group MEAS. Configuring the USM 35X for a test application 5-44 Issue 06, 11/2007 USM 35X Operation TOF (Selecting the measuring point) The sound path measurement in the calibration process or in the subsequent echo evaluation process depends on the selected measuring point which can be adjusted either to flank, to peak or to jflank in the USM 35X. The point of amplitude measurement is marked by a small upward triangle on the corresponding gate bar. The point of distance measurement is marked by a small downward triangle. H Note: While DAC, TCG or JISDAC is active you can change the TOF mode from peak to flank. When adjusted to flank or jflank the sound path mea- surement is made at the point of intersection of the monitor gate with the rising flank of the first echo in the gate. measured soundpath: 19,44 mm amplitude: 94 % A Attention: The highest echo in the gate does not have to be the echo for which the sound path has been measured. This may lead to false echo evaluation! Configuring the USM 35X for a test application USM 35X Issue 06, 11/2007 5-45 Operation In order to identify the points of measurement and to avoid misinterpretation two indicators were introduced per gate: The first triangle pointing downwards indicates the position of the measured sound path (distance), whereas the triangle pointing upwards marks the posi- tion of the measured amplitude. In TOF mode peak the sound path and amplitude mea- surement is made at the maximum of the highest echo in the gate. measured soundpath: 19,65 mm amplitude: 95 % In TOF mode jflank the sound path measurement is made at the point of intersection of the monitor gate with the rising flank of the first echo in the gate. The amplitude is measured at the maximum of the first echo in the gate even if there are further signals with higher amplitudes in the gate. measured soundpath: 19,44 mm amplitude: 33 % Configuring the USM 35X for a test application 5-46 Issue 06, 11/2007 USM 35X Operation In principle, the peak measurement should be preferred because the measured distances do not depend on the echo height in that case. However, there are application cases in which the flank measurement is either specified, or it must be applied for technical reasons, e.g. in many tests using dual-element (TR) probes. A Attention: In any case, the adjustment of the measuring point for calibration and for the subsequent test use must al- ways be identical. Otherwise measurement errors may occur. Select the TOF function. Use the right-hand rotary knob to select the required setting. S-DISP (Zoomed display of reading) You can have a selected reading zoomed in the A-scan display. The following readings can be selected for the zoomed display (in the second column the indication of the readings in the measurement line): Sa Sa Sound path for gate A Sb Sb Sound path for gate B Sb-a ba Difference of single measurements for sound path gate B gate A Ha % Ha Echo height gate A in % screen height Hb % Hb Echo height gate B in % screen height Ha dB ha Echo height gate A in dB Hb dB hb Echo height gate B in dB R-start Rs Range start R-end Re Range end La La Number of legs in gate A Lb Lb Number of legs in gate B Lc Lc Number of legs in gate C Only for flaw position calculation: Da Da Depth for gate A Configuring the USM 35X for a test application USM 35X Issue 06, 11/2007 5-47 Operation Db Db Depth for gate B Pa Pa Projection distance for gate A Pb Pb Projection distance for gate B Ra Ra Reduced projection distance for gate A Rb Rb Reduced projection distance for gate B Only for DGS: ERS ER Equivalent reflector size Gt dB Gt DGS test sensitivity GrdB Gr DGS reference gain (= instrument gain for the reference echo on 80 % screen height) Only for DGS and DAC: Ha %crv Ca Echo height gate A in % referred to curve Hb %crv Cb Echo height gate B in % referred to curve DGS-Crv Dc Diameter of the DGS curve class cl Flaw class according to JIS Z3060-2002 DAC dB db dB-value by which the DAC gain has been changed related to the reference gain (= instrument gain for the DAC echo on 80 % screen height) Configuring the USM 35X for a test application General: Alarm Al Choice of gates for alarm triggering: gate A, B or A+B H Note: If you use the Data Logger option, values for the C gate as well as a few special values for the Data Logger are added to the existing ones, see chapter Option Data Logger. Select the function S-DISP. Use the right-hand rotary knob to select the required value for the zoomed display. H Note: You can likewise configure all readings to be displayed below the A-scan at the four corresponding positions. Please refer to Configuring the measurement line. 5-48 Issue 06, 11/2007 USM 35X Operation MAGNIFY (Gate spreading) The setting of the MAGNIFY function causes a spreading of the gate over the entire display width. You can choose the gate to be used for the magnify function. Select the function MAGNIFY. Use the right-hand rotary knob to set the function to aGATE or bGATE if you want to spread the range of gate A or B over the entire display range. A-Scan (Setting the A-scan) This function offers you several options for setting your A-scan. stndard Normal A-scan setting. The key effects a static freeze. compare (A-scan comparison) You can compare a current echo display with a stored one. The display last stored using either from the current application or from a stored data set is displayed in the background as a dotted line. H Note: Read chapter 5.12 to learn how to load a saved data set. As a restored data set is displayed with a frozen A-scan, press the key first. envelop (echo dynamics) The echo envelope is shown as a dotted line addition- ally to the A-scan. peak b (maximum display) You can use this function to record and document (as well as to save if required) the peaked, maximum echo display. With the B gate active, the A-scan with the highest echo amplitude (recording of maximum display) is shown as a dotted line additionally to the live A-scan when peaking an echo display (in B gate). This A-scan becomes the statically frozen A-scan by pressing the key, and it can then be evaluated accordingly. Configuring the USM 35X for a test application USM 35X Issue 06, 11/2007 5-49 Operation afreeze/bfreeze (automatic freeze) Whenever you select this function, an echo display connected with the A or B gate will automatically switch over to A-scan freeze (automatic freeze). This setting is especially well suited e.g. for high-tempera- ture measurements, for measurements involving diffi- cult coupling conditions, or for spot weld testing. H Note: If you are using a Data Logger option, you also have the function cfreeze (for C gate) at your disposal. Select the function A-SCAN. Use the right-hand rotary knob to choose the required setting. Pay attention to the additional information referring to the corresponding setting options (see preceeding page). Configuring the measurement line The configuration of your measurement line is carried out in the function group MSEL, this means that you can choose the reading for one of the four possible posi- tions of the measurement line for direct measured-value display during the test. If required, go to the third operating level. Select the function group MSEL. Functions of the function group MSEL: MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4 Measured values at positions 1 to 4 Configuring the USM 35X for a test application 5-50 Issue 06, 11/2007 USM 35X Operation All measured values which have also been described for the zoomed display of the function S-DISP are availabe to you at each position. H Note: As an alternative, you can display a scale in the mea- surement line (ref. function SCALE). Select the function MEAS-P1 to MEAS-P4. Use the right-hand rotary knob to set the required measured value for each position in the correspond- ing function. Configuring the USM 35X for a test application Setting the display In the function group LCD, you will find setting options for the display screen itself and for the echo display. If required, go to the third operating level. Select the function group LCD. H Note: Double assignment of the function FILLED/VGA. Toggle between the two functions by repeatedly pressing the corresponding key . USM 35X Issue 06, 11/2007 5-51 Operation FILLED (Echo display mode) The function FILLED toggles between the filled and the normal echo display mode. The filled echo display mode improves the echo perceptibility due to the strong con- trast, especially in cases where workpieces are scanned more quickly. H Note: If the function COLOR is active, the filled area is also displayed in different colors. Select the function FILLED. Use the right-hand rotary knob to set the function to on or off. VGA You can switch the VGA output on and off. H Note: You should only switch the VGA output on if you aim to transfer the display contents to an external instrument. If the VGA output is switched off, the current consump- tion is reduced and the operating time is extended in battery operation. Select the function VGA. Use the right-hand rotary knob to set the function to on or off. SCHEME You have a choice between four color schemes. The color scheme determines the color of all displays and that of the background. You cannot vary the colors of gates because they are fixed as follows: Gate A red Gate B green Gate C blue Configuring the USM 35X for a test application 5-52 Issue 06, 11/2007 USM 35X Operation H Note: All color schemes are suitable for indoor use. For out- door use, we recommend the color schemes 3 and 4. Select the function SCHEME. Use the right-hand rotary knob to choose the required color scheme. LIGHT (LCD backlight) You can choose between a lighting in the economy mode min. and a brighter lighting max. for the display lighting. The economy mode is the default setting. H Note: The economy mode reduces the current consumption and consequently increases the operating time in bat- tery operation. Select the function LIGHT. Use the right-hand rotary knob to set the required lighting. SCALE (Configuring the measurement line) As an alternative to the measured values, the USM35X enables to display a scale in the measurement line. The scale gives you an overview of the position of echoes. You have a choice between a dimensionless ten-division scale and a scale showing the real position of the ech- oes. The following settings are possible: measval Display of measured values snd-pth Display of sound path scale div. Display of a dimensionless scale Select the function SCALE. Use the right-hand rotary knob to set the required display mode. Configuring the USM 35X for a test application USM 35X Issue 06, 11/2007 5-53 Operation 5.15 General configuration More functions for the basic configuration of the USM35X may be found in the function groups CFG1 and CFG2. If required, go to the third operating level. Select the function group CFG1 or CFG2. Functions of CFG1 CFG2: Dialog language Date Unit Time Baud rate Analog output Printer selection Horn Assignment of the key Evaluation mode H Note: Double assignment of the functions DIALOG/UNIT and DATE/TIME. Toggle between the two functions by re- peatedly pressing the corresponding key . DIALOG (Selecting the language) In this function you can select the language for displaying the function names on the screen and for the test report. The following languages are available: German English (default setting) French Italian Spanish General configuration 5-54 Issue 06, 11/2007 USM 35X Operation Portuguese Dutch Swedish Slovenian Romanian Finnish Czech Danish Hungarian Croatian Russian Slovakian Norwegian Polish Japanese Chinese Serbian Select the function DIALOG. Use the right-hand rotary knob to select the required language. General configuration UNIT (Selecting units of measurement) You can choose the required units between mm or inch in the function UNIT. A Attention: You should always make your decision on the units immediately when starting to work with the USM 35X. If you change the unit, all current settings are deleted, and the basic setup is loaded. Select the function UNIT. Use the right-hand rotary knob to select the required unit. To avoid any accidental deleting of values, the measurement line will display a safety prompt: Change unit? If you are sure that you want to change the unit of measurement, press the corresponding key of the function UNIT. Any other key would abort the process. The unit of measurement is now changed; the current data are deleted. USM 35X Issue 06, 11/2007 5-55 Operation BAUD-R (Baud rate for transmission) In this function you can select the baud rate for the serial port transmission. You have a choice between 300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and 57600 Baud. Select the function BAUD-R. Use the right-hand rotary knob to select the required baud rate. PRINTER (Printer for test report) In this function you can select the connected printer for printing out your test report. You have a choice between the following printer types: Epson HP LaserJet HP DeskJet Seiko DPU 41x Seiko DPU 3445 HP LaserJet 1200 series HP DeskJet 1200 series General configuration H Note: For more details on the how to print out a test report, please refer to chapter 6 Documentation. Select the function PRINTER. Use the right-hand rotary knob to select the required printer. COPYMOD (Assignment of the key) When the key is pressed, data are output to the RS232 interface and transferred to a printer or a PC. You can use the function COPYMOD to choose the data to be transferred when the key is pressed. You have the following setting options: hardcpy Hardcopy of the screen contents report Test report with A-scan, all relevant settings for the inspection and space for hand-written remarks meas P5 The magnified value given at the right upper corner of the A-scan 5-56 Issue 06, 11/2007 USM 35X Operation meas P1 The measured value given at position 1 in the measurement line pardump All instrument functions with the current settings PCX Screen contents as a PCX-format file. To transfer the data to the PC, you will need a terminal program. store The current instrument setting is stored to the selected (free) data set, and the data set number (DAT-#) is automatically increased. datalog (only with Data Logger option) The selected job is printed out as a report including all measured values. off The key is deactivated. special as setting hardcpy. After printout of the screen contents no form feed, every press on the key prints out the next hardcopy on the same page (three or four hardcopies depending on the printer). H Note: Please also refer to chapter 6 Documentation. Select the function COPYMOD. Use the right-hand rotary knob to set the required assignment for the key. TIME/DATE (Setting the time and date) You have to check the current date and time and, if required, set them so that these data are correctly saved together with the test results. General configuration USM 35X Issue 06, 11/2007 5-57 Operation H Note: Double assignment of the function DATE/TIME (icon >). Toggle between the two functions by repeatedly press- ing the corresponding key . A Attention: For a correct documentation always make sure that you are using correctly set time and date values. Be aware that the USM35X displays the year as a two digit num- ber! Select the function TIME. Use the left-hand rotary knob to highlight the value that you want to change, e.g. the hour. Use the right-hand rotary knob to change the high- lighted value. Select the function DATE. Use the left-hand rotary knob to highlight the value that you want to change, e.g. the day. Use the right-hand rotary knob to change the high- lighted value. General configuration ANAMOD You can output results of measurements at the analog output for external further processing. Use the function ANAMOD to configure the analog output in case there is no echo in the evaluation gate and the analog voltage has been selected for the sound path at the output. You have the following setting options: lo volt The analog output supplies 0 volt. hi volt The analog output supplies 5 volts. Select the function ANAMOD. Use the right-hand rotary knob to choose the required value. 5-58 Issue 06, 11/2007 USM 35X Operation HORN In this function, you can decide whether or not an acoustic alarm should be given in addition to the visual alarm (LED A). Select the function HORN. Use the left-hand rotary knob to set the horn to on or off. H Note: Error alarms can be triggered unter certain circumstanc- es. These are caused by intermediate conditions in instrument operation occuring when the instrument is used, i.e. when function parameters are changed. Pos- sible alarms occuring during instrument operation (setting of functions) are to be ignored. General configuration EVAMOD (Echo evaluation) This is where you can choose a method for the evalua- tion of the measured reflector echo. Depending on the instrument version used, you have various methods to choose from. REF (default setting) Evaluation using the measurement of dB difference, available for all instrument versions AWS Rating of welds according to AWS D1.1 DAC (only USM 35X DAC and USM 35X S) Evaluation using the Distance-Amplitude Curve JISDAC (only USM 35X DAC and USM 35X S) Evaluation using the Distance-Amplitude Curve according to JIS Z3060-2002 DGS (only USM 35X S) Evaluation using the DGS method Select the function EVAMOD. Use the right-hand rotary knob to choose the required method. USM 35X Issue 06, 11/2007 5-59 Operation 5.16 Other functions with special keys H Note: You will find a description of the key (setting of the dB incrementation for gain) on page 5-5; the key, which you will need for printing out your test report, is described in chapter 6 Documentation. Freeze The key enables you to store (freeze) the displayed image on the screen. Gate parameters may still be changed in order to evaluate any signal being displayed in the frozen screen. The measurement resolution is only 0.5 % of the displayed range. Press if you want to store (freeze) a current display. Press again in order to return to normal mode. Other functions with special keys Zooming the echo display If you press the key , the echo display is zoomed (zoom function) and is superimposed on the function group. The functions are not accessible in this mode, except for the gain. It can still be set by means of the left-hand rotary knob. H Note: You cannot switch on the zoom function with gate widths smaller than 0.5 mm/0.02" (5920 m/s). Press the button in order to change to the zoom mode. Press the button one more time in order to return to the normal mode. The key You can use this key to save measured values and A- scans. In addition, it serves for recording echoes, for example as a reference echo. Press the key in order to save a measured value or to record an echo. 5-60 Issue 06, 11/2007 USM 35X Operation 5.17 Status symbols and LEDs Status symbols can be displayed in the line below the screen display to inform about certain settings and con- ditions of the USM 35X. The LEDs above the display give you further information. Status symbols Symbol Description * Display memory is enabled (freeze), display is stored. ! Data transfer active, (printing or remote control). Batterie charge indicator (status of remaining charge in steps of 10 %) F Function TOF is set to flank. P Function TOF is set to peak. J Function TOF is set to jflank. T Function T-CORR is active. R Reference echo has been recorded (DGS). A Function ATT-OBJ/ATT-REF (sound attenuation) is active. Staus symbols and LEDs H Note: If you are using the Data Logger option, youll find more status symbols, see chapter Option Data Logger. LEDs Symbol Description A Gate alarm. R Function REJECT is active. D Function DUAL (pulser-receiver separation) is active. H Note: Error alarms can be triggered unter certain circumstanc- es. These are caused by intermediate conditions in in- strument operation occuring when the instrumet is used, i.e. when function parameters are changed. Possible alarms occuring during instrument operation (setting of functions) are to be ignored. USM 35X Issue 06, 11/2007 5-61 Operation Distance-amplitude curve (only USM 35X DAC and USM 35S) 5.18 Distance-amplitude curve (only USM 35X DAC and USM 35S) H Note: The DAC function is available as a fixed function in the second operating level on the USM 35X DAC. With the USM 35X S, the DAC function can be additionally switched over to DGS evaluation mode. Due to the angle of the sound beam spread and to the sound attenuation in the material the echo height of reflectors of equal size depends on the distance to the probe. A distance-amplitude curve, which is recorded with de- fined reference reflectors, graphically displays these influences. If you use a reference block having artificial flaws when recording a DAC you will be able to apply these echo amplitudes for the evaluation of discontinuities without any further correction. The reference block should be made of the same material as the test object. You will find the functions for the distance-amplitude curve in the function group DAC. If required, select the setting DAC in the function group EVAMOD first. If required, go to the third operating level. Select the function group CFG2. Switch the function EVA-MOD over to the setting DAC. Go to the second operating level. Select the function group DAC. 5-62 Issue 06, 11/2007 USM 35X Operation H Note: Double assignment of the function T-CORR/OFFSET. Toggle between the two functions by repeatedly press- ing the corresponding key . DACMOD (Activating DAC/TCG) You can use this function to activate the DAC. The fol- lowing settings are available: off No DAC is active. DAC The already saved distance-amplitude curve is displayed on the screen, or a new DAC is recorded. TCG An existing DAC (at least 2 reference points) is displayed as a horizontal TCG line. H Note: No reference echoes can be recorded with DACMODE = TCG. TCG can only be activated if the reference echoes recorded are situated within a dynam- ic range of 40 dB. Otherwise an error message is out- put. If the TCG setting should be nevertheless be used in this case, then the DAC must be reduced (by delet- ing the last reference points) until TCG can be switched on. Select the function DACMOD. Use the right-hand rotary knob to select the DAC setting. If there is a DAC stored, it will now be active. Select the TCG setting. The TCG function is activated so that the DAC becomes a horizontal recording threshold. This means: all reference echoes recorded are brought (lifted or lowered) to the same echo height. Use the right-hand rotary knob to select the setting off in order to deactivate the DAC again. Distance-amplitude curve (only USM 35X DAC and USM 35S) USM 35X Issue 06, 11/2007 5-63 Operation Distance-amplitude curve (only USM 35X DAC and USM 35S) DACECHO (Recording reference curve) A Attention: Before starting to record a reference curve, the instru- ment must be correctly calibrated (ref. section 5.7 Calibrating the USM 35X). The moment a new curve is recorded, a possibly al- ready existing curve must be deleted. If necessary, make sure that the old curve has been stored in a free data set before starting to record a new curve! Select the function DACMOD. Use the right-hand rotary knob to set the function to DAC. The function DACECHO is set to 0 since there is no previously recorded echo. Couple the probe to the reference block, and peak the first reference echo. Use the left-hand rotary knob to bring the echo to an amplitude between 70 % and 100 % screen height. Select the function aSTART, and then move the gate so that the selected echo is the highest of the echo sequence within the gate range. Press to record the first reference echo. The instrument gain will automatically change until the DAC echo in gate A reaches 80 % screen height (+/0,3 dB). The function DACECHO is set to 1 to indicate that the first reference echo has been successfully recorded. Simultaneously the status symbol R appears (= reference echo stored). Peak the next reference echo, and repeat the record- ing process for other curve points. The number in the function DACECHO is increased by 1 with each recording. H Note: If the message Echo is not valid appears, the refer- ence point could not be recorded. Check the gate posi- tion as well as the height of the reference echo and repeat the recording. As soon as you have recorded at least two curve refer- ence points. Your DAC is already active (please see previous section). You can record a maximum of 10 curve reference points. 5-64 Issue 06, 11/2007 USM 35X Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S) Deleting reference points or the complete DAC You can delete the reference point which was recorded last in each case, or the complete DAC. Select the function DACECHO. Turn the right-hand rotary knob downward (counter- clockwise). The message Do you want to delete the DAC echo? appears in the measurement line. Press the key in order to delete the last echo, or press another key in order to cancel the process of deleting. In this way, you can record one or several new reference points. In order to delete the complete DAC, turn the right- hand rotary knob upward (clockwise). The message Do you want to delete all DAC echoes? appears in the measurement line. Press the key in order to delete all echoes, or press another key in order to cancel the process of deleting. T-CORR (Sensitivity correction) This function enables you to compensate for the trans- fer losses in the material under test. This correction is necessary if test object and reference block have differ- ent surface qualities. You have to find out the adjustment value for the com- pensation of transfer losses by experiments. The gain is varied accordingly in this connection, the curve line remains the same. Select the function T-CORR. Use the right-hand rotary knob to select the required setting. USM 35X Issue 06, 11/2007 5-65 Operation OFFSET (Distance of multiple DAC) You can activate a multiple DAC and at the same time determine the distance from the registration curve. The default setting 6.0 dB generates four other curves at 12 dB, 6 dB, +6 dB, and +12 dB from the registration curve. The setting 0 generates only the registration curve. Any setting different from 0 generates four other curves at a set distance from the original curve. For a better distinction in multiple DACs the registration curve is displayed as a bold line. Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB Select the function OFFSET. Use the right-hand rotary knob to select the required setting. Distance-amplitude curve (only USM 35X DAC and USM 35S) Echo evaluation with DAC In order to be able to evaluate a flaw indication by means of the DAC, certain conditions must be met: The distance-amplitude curve must already be recorded. It only applies to the same probe that was used when recording the curve. Not even another probe of the same type must be used! The DAC only apply to the material corresponding to the material of the reference block. All functions affecting the echo amplitude must be set the same way as they were when the curve was recorded. This applies in particular to the following functions: POWER, FREQU, RECTIFY, MTLVEL and REJECT. 5-66 Issue 06, 11/2007 USM 35X Operation Change of probe delay in DAC/TCG mode In general changing the delay line automatically influ- ences the shape of the sound beam, and this would theoretically require a new DAC recording. However, a small change of the probe delay, which typically occurs with normal wear during inspection, has no significant influence on the programmed distance law. A Attention: A recorded DAC will no longer be valid, in case you change the probe delay to a larger value, e.g. by adding an additional delay line to the probe after the DAC has been recorded without the delay line in place. The same applies for immersion testing: the DAC re- cording must be performed when the final water delay is set. Otherwise false echo evaluation may result! Distance-amplitude curve (only USM 35X DAC and USM 35S) Change of TOF mode in DAC/TCG Echo amplitude evaluation in general is related to the echo peak of the respective signal. Therefore the peak mode is recommended. This guarantees that the read- ings of the amplitude and the TOF (sound path, surface distance, depth) always belong to the echo of interest (= the highest echo in the gate). In flank mode the TOF reads the first echo in the gate, but the amplitude will be measured at the highest peak in the gate which possibly might belong to another sig- nal. For a better identification of the TOF and amplitude measurement the instrument's SW has been improved and indicates the TOF measurement point with the gate cursor , and the amplitude with the second gate cur- sor . USM 35X Issue 06, 11/2007 5-67 Operation Distance-amplitude curve (only USM 35X DAC and USM 35S) A Attention: Switching to flank mode when DAC/TCG is active may lead to the following effects: Sound path readings may be affected by an error due to the fact that the instrument had previously been calibrated in peak mode. In case more than one echo is in the gate, TOF (e.g. sound path) and amplitude reading may no longer belong to the same echo. 5.19 Distance-amplitude curve according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) H Note: The JISDAC function for echo evaluation with the dictance-amplitude curve and additional classification according to JIS Z3060-2002 is available in the USM35X DAC and USM35X S. You will find the functions for the distance-amplitude curve according to JIS Z3060-2002 in the function group JDAC. If required, select the setting JDAC in the func- tion group EVAMOD first. If required, go to the third operating level. Select the function group CFG2. Switch the function EVAMOD over to the setting JDAC. Go to the second operating level. 5-68 Issue 06, 11/2007 USM 35X Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) Select the function group JDAC. H Note: Double assignment of the functions DACMOD/BOLDLI and T-CORR/OFFSET. Toggle between the two functions by repeatedly pressing the corresponding key . DACMOD (Activating DAC according to JIS) You can use this function to activate the DAC. The fol- lowing settings are available: off No DAC is active. DAC DAC according to JIS with 6 curves. The first 4 curves are identified with the letters L, M, H and U dedicated to these curves, and therefore move with any gain change. In JISDAC also the echo evaluation in classes can be performed. The flaw class depends on the position of the echo peak within the first 4 curves: class I: amplitude < curve L class II: curve L < amplitude < curve M class III: curve M < amplitude < curve H (registra- tion level) class IV: amplitude > curve H Select the function DACMOD. USM 35X Issue 06, 11/2007 5-69 Operation Use the right-hand rotary knob to select the DAC setting. If there is a DAC stored, it will now be active. Select the TCG setting. The TCG function is activated so that the DAC becomes a horizontal recording threshold. This means: all reference echoes recorded are brought (lifted or lowered) to the same echo height. Use the right-hand rotary knob to select the setting off in order to deactivate the DAC again. DACECHO (Recording reference curve) A Attention: Before starting to record a reference curve, the instru- ment must be correctly calibrated (ref. section 5.7 Calibrating the USM 35X). The moment a new curve is recorded, a possibly al- ready existing curve must be deleted. If necessary, make sure that the old curve has been stored in a free data set before starting to record a new curve! Select the function DACMOD. Use the right-hand rotary knob to set the function to DAC. The function DACECHO is set to 0 since there is no previously recorded echo. DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) 5-70 Issue 06, 11/2007 USM 35X Operation Couple the probe to the reference block, and peak the first reference echo. Use the left-hand rotary knob to bring the echo to an amplitude between 70 % and 100 % screen height. Select the function aSTART, and then move the gate so that the selected echo is the highest of the echo sequence within the gate range. Press to record the first reference echo. The instrument gain will automatically change until the DAC echo in gate A reaches 80 % screen height (+/ 0,3 dB). The function DACECHO is set to 1 to indicate that the first reference echo has been successfully recorded. Simultaneously the status symbol R appears (= reference echo stored). H Note: The dB-value by which the gain has been changed relat- ed to the reference gain can be displayed using the new parameter DAC dB. The function DACECHO displays the number 1. Peak the next reference echo, and repeat the record- ing process for other curve points. The number in the function DACECHO is increased by 1 with each recording. H Note: If the message Echo is not valid appears, the refer- ence point could not be recorded. Check the gate posi- tion as well as the height of the reference echo and repeat the recording. DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) USM 35X Issue 06, 11/2007 5-71 Operation Deleting reference points or the complete DAC You can delete the reference point which was recorded last in each case, or the complete DAC. Select the function DACECHO. Turn the right-hand rotary knob downward (counter- clockwise). The message Do you want to delete the DAC echo? appears in the measurement line. Press the key in order to delete the last echo, or press another key in order to cancel the process of deleting. In order to delete the complete DAC, turn the right- hand rotary knob upward (clockwise). The message Do you want to delete all DAC echoes? appears in the measurement line. Press the key in order to delete all echoes, or press another key in order to cancel the process of deleting. In this way, you can record one or several new reference points. DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) BOLDLI (Choice of a registration curve) One of the four curves marked with a character (L, M, H, U) can be selected as the registration curve. This registration curve will then be displayed as a bold line and an echo amplitude evaluation (dB-to-curve) will be made for this curve. Select the function BOLDLI. Use the right-hand rotary knob to select the required setting. T-CORR (Sensitivity correction) This function enables you to compensate for the trans- fer losses in the material under test. This correction is necessary if test object and reference block have differ- ent surface qualities. You have to find out the adjustment value for the com- pensation of transfer losses by experiments. The gain is varied accordingly in this connection, the curve line remains the same. 5-72 Issue 06, 11/2007 USM 35X Operation Select the function T-CORR. Use the right-hand rotary knob to select the required setting. OFFSET (Distance of multiple DAC) You can activate a multiple DAC and at the same time determine the distance from the registration curve. The default setting 6.0 dB generates four other curves at 12 dB, 6 dB, +6 dB, and +12 dB from the registration curve, and additionally two other curves at +18 dB and +24 dB. The setting 0 generates only the registration curve and the two fixed curves. Any setting different from 0 generates four other curves at a set distance from the original curve. For a better distinction in multi- ple DACs the registration curve is displayed as a bold line. Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB Select the function OFFSET. Use the right-hand rotary knob to select the required setting. Echo evaluation with DAC In order to be able to evaluate a flaw indication by means of the DAC, certain conditions must be met: The distance-amplitude curve must already be recorded. It only applies to the same probe that was used when recording the curve. Not even another probe of the same type must be used! The DAC only apply to the material corresponding to the material of the reference block. All functions affecting the echo amplitude must be set the same way as they were when the curve was recorded. This applies in particular to the following functions: POWER, FREQU, RECTIFY, MTLVEL and REJECT. DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) USM 35X Issue 06, 11/2007 5-73 Operation Change of probe delay in DAC mode In general changing the delay line automatically influ- ences the shape of the sound beam, and this would theoretically require a new DAC recording. However, a small change of the probe delay, which typically occurs with normal wear during inspection, has no significant influence on the programmed distance law. A Attention: A recorded DAC will no longer be valid, in case you change the probe delay to a larger value, e.g. by adding an additional delay line to the probe after the DAC has been recorded without the delay line in place. The same applies for immersion testing: the DAC re- cording must be performed when the final water delay is set. Otherwise false echo evaluation may result! Change of TOF mode in DAC/TCG Echo amplitude evaluation in general is related to the echo peak of the respective signal. Therefore the peak mode is recommended. This guarantees that the read- ings of the amplitude and the TOF (sound path, surface distance, depth) always belong to the echo of interest (= the highest echo in the gate). In flank mode the TOF reads the first echo in the gate, but the amplitude will be measured at the highest peak in the gate which possibly might belong to another sig- nal. For a better identification of the TOF and amplitude measurement the instrument's SW has been improved and indicates the TOF measurement point with the gate cursor , and the amplitude with the second gate cur- sor . DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) 5-74 Issue 06, 11/2007 USM 35X Operation A Attention: Switching to flank mode when DAC/TCG is active may lead to the following effects: Sound path readings may be affected by an error due to the fact that the instrument had previously been calibrated in peak mode. In case more than one echo is in the gate, TOF (e.g. sound path) and amplitude reading may no longer belong to the same echo. 5.20 Evaluation according to the DGS method (only USM 35X S) With the USM 35X S, you can use both the DAC and the DGS method of amplitude evaluation. Measuring with DGS Using the DGS function (Distance Gain Size), you can compare the reflecting power of a natural flaw in the test object with that of a theoretical flaw (circular disk- shaped equivalent reflector) at the same depth. A Attention: You are comparing the reflecting power of a natural flaw with that of a theoretical flaw. No definite conclusions may be drawn on the natural flaw (roughness, inclined position, etc.). The so-called DGS diagram forms the basis for this comparison of the reflecting power. This diagram con- sists of a set of curves showing the correlation of three influencing variables: DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S) USM 35X Issue 06, 11/2007 5-75 Operation Distance D between the probe and circular disk- shaped equivalent reflector Difference in gain G between various large circular disk-shaped equivalent reflectors and an infinitely large backwall Size S of the circular disk-shaped equivalent reflec- tor. The influencing variable S always remains con- stant for one curve of the set of curves The advantage of the DGS method lies in the fact that you can carry out reproducible evaluations of small dis- continuities. The reproducibility is most of all important, for example, whenever you aim to carry out an accep- tance test. Apart from the influencing variables already mentioned, there are other factors determining the curve shape: sound attenuation transfer losses amplitude correction value probe. The following probe parameters affect the curve shape: element or crystal diameter frequency delay length delay velocity You can adjust these parameters on the USM 35X S in such a way that you can use the DGS method with many different probes and on different materials. H Note: Before setting the DGS function, the instrument must first be calibrated because all functions affecting the DGS evaluation mode (MTLVEL, P-DELAY, DAMPING, POWER, FINE G, FREQU, RECTIFY) can no longer be changed after the reference echo has been recorded. For T/R probes, MTLVEL can only be set from 5350 to 6500 m/s. Please also refer to chapter 5.7 Calibrating the USM 35X on this subject. Evaluation according to the DGS method (only USM 35X S) 5-76 Issue 06, 11/2007 USM 35X Operation Validity of the DGS method Echo amplitude evaluations according to the DGS method are only reliable and reproducible in cases when: On materials having non-negligible attenuation losses, the compensation coefficients will have to be defined. In this case, it is necessary to calibrate the equipment on test blocks containing test reflectors of known size at different distances to make a correct compensation for the attenuation losses on the actual test object. After matching the results of the test reflectors to the diagram or built-in curves this setting is valid for all flaw sizes and for all distances covered by the DGS curves. The reference echo is received from the test object if possible. If this is not possible, it should be ensured that the reference block is made of the same material as the test object. The evaluation is carried out using the same probe which was also used for recording the reference echo. Another probe of the same type can be used after recording a new reference echo. Evaluation according to the DGS method (only USM 35X S) Echo amplitudes for reflector distances smaller than half of the probes near-field length are subject to heavy variation for physical reasons due to interfer- ence phenomena effecting the area. Thus, evaluation results may fluctuate more as the usually permissi- ble 2 dB. An evaluation according to the DGS method is possible but not recommended for this cases. Change of probe delay in DGS mode In general changing the delay line automatically influ- ences the shape of the sound beam, and this would theoretically require a new DGS setup. However, a small change of the probe delay, which typically occurs with normal wear during inspection, has no significant influence on the programmed distance law. A Attention: An existing DGS setup will no longer be valid, in case you change the probe delay to a larger value, e.g. by adding an additional delay line to the probe after the DGS reference echo has been recorded without the delay line in place. USM 35X Issue 06, 11/2007 5-77 Operation The same applies for immersion testing: the DGS setup must be performed when the final water delay is set. Otherwise false echo evaluation may result! Change of TOF mode in active DGS Echo amplitude evaluation in general is related to the echo peak of the respective signal. Therefore the peak mode is recommended. This guarantees that the read- ings of the amplitude and the TOF (sound path, surface distance, depth) always belong to the echo of interest (= the highest echo in the gate). In flank mode the TOF reads the first echo in the gate, but the amplitude will be measured at the highest peak in the gate which possibly might belong to another sig- nal. For a better identification of the TOF and amplitude measurement the instrument's SW has been improved and indicates the TOF measurement point with the gate cursor , and the amplitude with the second gate cur- sor . A Attention: Switching to flank mode when DGS is active may lead to the following effects: Sound path readings may be affected by an error due to the fact that the instrument had previously been calibrated in peak mode. In case more than one echo is in the gate, TOF (e.g. sound path) and amplitude reading may no longer belong to the same echo. Evaluation according to the DGS method (only USM 35X S) 5-78 Issue 06, 11/2007 USM 35X Operation Selecting the DGS mode If required, go to the third operating level. Select the function group CFG2. Switch the function EVA-MOD over to the setting DGS. Go to the second operating level. Select the function group DGS. Double assignment of functions: The following functions are double assigned. Toggle between the two functions by repeatedly pressing the corresponding key . DGSMEN> DGSMEN> Calling the DGS menu Switching on/off the DGS evaluation mode T-CORR> OFFSET> Setting the transfer Activating the multi-curve correction display mode Default settings for the DGS measurement In the next step, the DGS menu is called enabling to select the corresponding probe and to set the other DGS parameters: Select the function DGSMEN. Use the right-hand rotary knob to call the DGS menu. Define your settings: Evaluation according to the DGS method (only USM 35X S) USM 35X Issue 06, 11/2007 5-79 Operation PROBE-#: probe number Fixed-programmed probes with all settings (PRB- NAME, DEL-VEL, D eff and PRBFREQ cannot be changed in the case of these probes); PROBE-# = 0 is user-programmable with reference to all parameters. PRBNAME: probe name The name belongs to the selected probe number and cannot be changed; the individual probe name can be entered only with PROBE-# = 0. DGS-CRV: registration curve for DGS evaluation This enables you to select the circular disk-shaped equivalent reflector diameter to be used for displaying the DGS curve and used as recording threshold for echo evaluations. DEL-VEL: delay material velocity of the probe Predefined with programmed probes. D eff: effective element diameter of the probe used Predefined with programmed probes. Evaluation according to the DGS method (only USM 35X S) PRBFREQ: probe frequency Frequency of the transducer; predefined with pro- grammed probes. REFECHO: type of the reference reflector used BW backwall SDH side drilled hole FBH flat bottom hole REFSIZE: size of the reference reflector ATT-REF: sound attenuation in the reference block ATT-OBJ: sound attenuation in the test object AMPLCOR: value for the amplitude correction. This is required whenever you are using an angle probe and the quadrant echo from the calibration standards K1 or K2 as a reference reflector. To return to the A-scan, press one of the following keys: , or . 5-80 Issue 06, 11/2007 USM 35X Operation Example In this example, the probe MB 4 S is selected. Reference reflector = backwall, the 3 mm circular disc is to be displayed as curve. The sound attenuation corrections ATT-REF and ATT-OBJ and the amplitude correction AMPLCOR (for angle probes and calibration standard K1/K2) remain at 0. Evaluation according to the DGS method (only USM 35X S) Recording the reference echo and displaying the DGS curve To be able to display the required DGS curve, you have to first record the reference echo. You have to start by optimizing the echo of the reference reflector, in this case the backwall echo from the test object. Continue by positioning the gate on the reference echo. Select the function DGS-REF, and use the right-hand rotary knob to switch the function on. The message: Do you want to change the DGS reference echo? appears. USM 35X Issue 06, 11/2007 5-81 Operation Evaluation according to the DGS method (only USM 35X S) If required, confirm by pressing again. After the successful recording of the reference echo, a highlighted R will be displayed in the measurement line. Set the function DGSMOD> to on, to switch on DGS curve. Taking the general DGS diagram as a basis, the instru- ment calculates the required test sensitivity for display- ing the 3 mm curve with its maximum at 80 % screen height, and sets this value. The current gain is set to 0 during this. In the case of subsequent gain variations, the curve is automatically adapted. Evaluation of reflectors Every echo situated within the gate can be immediately evaluated: The measurement line has been configured in such a way that the sound path S, the echo height in dB referred to the DGS curve, the equivalent reflector size (ERS) of the flaw echo and the calibration range are displayed. The measured value to be zoomed in the A-scan is cho- sen by means of the function S-DISP in the function group MEAS. ERS was chosen in the above example. (Also refer to Configuring the measurement line, p. 5-49.) 5-82 Issue 06, 11/2007 USM 35X Operation Evaluation according to the DGS method (only USM 35X S) S-DISP = Ha%, i.e. echo height evaluation as a per- centage. At the same time, the multiple-curve display mode is also active with a curve distance of OFFSET = 6 dB. S-DISP = Ha%Crv, the evaluation result is now the value exceeding the curve in %. S-DISP = Gt is a special case: the value displayed is the DGS test sensitivity with which the maximum of the specified curve is at 80 %. This value serves for the purpose of checking and docu- menting. USM 35X Issue 06, 11/2007 5-83 Operation Transfer correction The transfer correction is activated by means of the function T-CORR. The test sensitivity is varied by this value without recalculating the curve. This means that the test sensitivity is increased by 6 dB in the example in order to compensate for a possi- bly existing surface roughness. The echo is conse- quently drawn higher by 6 dB on the left, i.e. evaluated with ERS 3.2. Status indicator in the measurement line: a highlighted T. Sound attenuation If necessary, the DGS curve can take the components effective sound attenuation (ATT-OBJ) into account. With the value set here, the curve shape is recalculated so that the effect of sound attenuation is now taken into consideration when evaluating reflectors. The DGS curve now includes the effect of sound attenu- ation. An active sound attenuation correction is indicat- ed in the measurement line by a highlighted A. The sound attenuation in the reference block can only be set prior to recording the reference echo. Therefore, an error message is displayed here if an attempt is Evaluation according to the DGS method (only USM 35X S) 5-84 Issue 06, 11/2007 USM 35X Operation made to change the value because, in fact, a valid refer- ence echo already exists. In addition, a different reference reflector type has been used in the DGS menu below: instead of a backwall, a circular disk (flat-bottom hole) having a diameter of 3 mm has been set in this case. In this case, of course, the reference echo has to be received from a 3 mm cir- cular disk. After switching on the DGS curve, the reference echo must therefore clearly touch the 3 mm curve. A side-drilled hole can also be used as a further refer- ence reflector with some limitations. It must have a diameter corresponding to at least 1.5 times the wave- length used, and the distance must be 1.5 times the near-field length. The USM 35X S will check these con- ditions if you aim to use a side-drilled hole as reference reflector, and will issue an error message if required. The table on the next page indicates these minimum data for the existing probes in steel. Conditions for the use of side-drilled holes as reference reflectors in steel. For other materials, the values must be converted accordingly. Evaluation according to the DGS method (only USM 35X S) USM 35X Issue 06, 11/2007 5-85 Operation Probe Wavelength Minimum Diameter Near Field Length Minimum Distance in steel side-drilled hole in steel in steel [mm] [mm] [mm] [mm] B 1 S 6.0 9.0 23 35 B 2 S 3.0 4.5 45 68 B 4 S 1.5 2.3 90 135 MB 2 S 3.0 4.5 8 12 MB 4 S 1.5 2.3 15 23 MB 5 S 1.2 1.8 20 30 MWB ...-2 1.6 2.4 15 23 MWB ...-4 0.8 1.2 30 45 SWB ...-2 1.6 2.4 39 59 SWB ...-5 0.7 1.1 98 147 WB ...-1 3.3 5.0 45 68 WB ...-2 1.6 2.4 90 135 Evaluation according to the DGS method (only USM 35X S) 5-86 Issue 06, 11/2007 USM 35X Operation Probe Wavelength Focal length in steel in steel [mm] [mm] MSEB 2 3.0 8 2 MSEB 4 1.5 10 2 MSEB 4 0 1.5 18 4 MSEB 5 1.2 10 2 SEB 1 5.9 20 4 SEB 2 KF 5 3.0 6 2 SEB 4 KF 8 1.5 6 2 SEB 2 3.0 15 3 SEB 4 1.5 12 2 H Note: The DGS curves of dual element probes are not derived from the general DGS-diagram, but have been individual- ly measured for steel (MAT-VEL = 5920 m/s) and are now stored in the instrument. You can only carry out a DGS evaluation with one of the available dual element probes, if the material velocity is in between 5330 m/s and 6500 m/s. Locks, error messages As long as a valid reference echo is stored, no functions can be changed which could cause an incorrect DGS evaluation. If an attempt is made to change such a func- tion, the corresponding error message will appear, e.g. FREQUEN blocked by DGS-REF = on The DGS evaluation must likewise be switched off and the reference echo deleted in the case of selecting a new probe, e.g. for a new test application. Evaluation according to the DGS method (only USM 35X S) USM 35X Issue 06, 11/2007 6-1 Documentation 6 6-2 Issue 06, 11/2007 USM 35X Documentation Printing data 6.1 Printing data Direct printing of the following data via the RS 232 interface is possible using the USM 35X: test report containing the A-scan and the adjustment data A-scan single reading (position 1 of the measurement line) function list (including all current settings) Data Logger (if the version is available) To do this, you need a printer with serial interface RS 232 a printer cable (please see chapter 2) Preparing the printer The transfer parameter settings for the serial port are: Baud rate 0 (no transmission), 300, 600, 1200, 2400, 4800, 9600 (default), 19200, 38400, and 57600 Word length 8 data bits (fixed) Parity none (fixed) Stop bits 2 (fixed) In order to ensure a perfect communication, set the printer to the parameters of the USM 35X. Preparing the USM 35X You decide on the type of printout by assigning the key. If necessary, go to the third operating level. Select the function group CFG1. Select the function PRINTER, and then use the right- hand rotary knob to select the correct printer driver. USM 35X Issue 06, 11/2007 6-3 Documentation Printing data Use to select the function COPYMOD, and then use the right-hand rotary knob to select the setting: hardcpy, report, meas P5 (enlarged value in A-scan), meas P1 (measured value at position 1), pardump (function list), datalog (Data Logger job including measured values), special (several A-scans on one page). H Note: The setting PCX generates a PCX-format file which you can transfer to a PC by means of a suitable program capable of receiving and storing data. Printing If you have connected, prepared and activated the printer, just press the key. The report is printed out. If you have selected the setting special, press the key again for each A-scan that you want to print out. 6-4 Issue 06, 11/2007 USM 35X Documentation 6.2 Documentation with UltraDOC The special application program UltraDOC from GE Inspection Technologies enables you to remote-control the USM 35X and to include instrument settings in ASCII format or screen contents in PCX or IMG format in your test report. All data can be further processed using commerical word processing or DTP programs. You will receive information about the reliable use of the program in a detailed operating manual. Documentation with UltraDOC USM 35X Issue 06, 11/2007 7-1 Maintenance and care 7 7-2 Issue 06, 11/2007 USM 35X Maintenance and care Care of the instrument 7.1 Care of the instrument Clean the instrument and its accessories using a moist cloth. Only use the following recommended instrument cleaners: water, a mild household cleaner or alcohol (no methyl alcohol). A Attention: Do not use any methyl alcohol, solvents, or dye pen- etrant cleaners! The plastic parts can be damaged or embrittled by this. USM 35X Issue 06, 11/2007 7-3 Maintenance and care Care of the batteries 7.2 Care of the batteries Care of the batteries Capacity and life of batteries mainly depend on the correct handling. Please therefore observe the tips be- low. You should charge the batteries in the following cases: before the initial startup after a storage time of 3 months or longer after frequent partial discharge Charging the batteries You can charge the lithium-ion battery either directly in the instrument or by means of the external battery charger DR36 (order number 35 297) recommended by us. You always need an external battery charger to charge standard C-cells. In this regard, please pay at- tention to the information on the operation of the battery charger. A Attention: You should only use the batteries recommended by us and the corresponding battery charger. An improper handling of the batteries and of the battery charger may cause explosion hazard. Charging of partially discharged NiCd batteries If batteries are only partially discharged (less than 50 % of operating time), the full capacity is not reached by normal charging. Start by fully discharging the batteries. You can use the discharging function of the charger for this. For more details, please read the notes on the operation of the battery charger. The batteries are automatically charged after that. Charging of exhausted NiCd batteries If batteries are exhausted, e.g. after a prolonged stor- age time in empty state, they often reach their full ca- pacity only after repeated discharge/charge cycles. 7-4 Issue 06, 11/2007 USM 35X Maintenance and care Care of the batteries The charger identifies defective batteries. In that case, replace the batteries by a new set. Otherwise there is the danger that individual cells have different capacities so that you will no longer obtain the normal operating time with the instrument in battery operation. How to handle alkaline batteries Please remove the batteries from the instrument if it has not been operated for a longer time. A Attention: Leaking batteries may cause severe damages to the instrument! You should always only use leak-proof batteries and remove them from the instrument after turning it off. H Note: Used batteries are special waste and have to be disposed of according to legal requirements! In the interest of environmental protection, we recom- mend that you only use rechargeable batteries. USM 35X Issue 06, 11/2007 7-5 Maintenance and care 7.3 Maintenance The USM 35X requires basically no maintenance. A Attention: Repair work may only be carried out by members of authorized Service staff of GE Inspection Technologies. Maintenance 7-6 Issue 06, 11/2007 USM 35X Maintenance and care 7.4 Recycling General view of the device In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal of the components. 8 9 1 3 5 4 2 7 6 Recycling USM 35X Issue 06, 11/2007 7-7 Maintenance and care No. Recycling/material code Description 1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. In order to open the compartment the quick acting closures have to be actuated. 2 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 0.5 mg) of Mercury (Hg) 3 >PC< / Brass Upper equipment cover Polycarbonat >PC< with pressed in brass thread insert. 4 Stainless steel Handle complete 5 Aluminium Rotary control button 6 >PC< Holder for handle 7 Stainless steel Ratchet disk 8 >PC< Housing lower part 9 Aluminium Div. mounting brackets Recycling 7-8 Issue 06, 11/2007 USM 35X Maintenance and care Materials for separate disposal In the following you find guidelines and notes for removing materials/components, which must be removed and treated separately. 1 4 3 2 Recycling USM 35X Issue 06, 11/2007 7-9 Maintenance and care No. Recycling/material code Description 1 In order to remove the LCD-Display the upper housing has to be withdrawn first. After loosing 6 screws on the bottom side and one further in battery- compartment, the complete upper housing can be taken away. 2 In order to open the compartment at the bottom of the equipment, the quick acting closures have to be actuated. 3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening the battery cover. 4 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 0.5 mg) of Mercury (Hg). Recycling 7-10 Issue 06, 11/2007 USM 35X Maintenance and care Further materials and components In the following you find notes for dismantling materials/components, which can disturb several recycling pro- cesses, and materials/components for which benefits can normally be achieved. 3 1 2 5 4 Recycling USM 35X Issue 06, 11/2007 7-11 Maintenance and care No. Recycling/material code Description 1 >PC< / Brass Upper equipment cover Polycarbonat >PC< with pressed in brass thread insert. 2 Circuit boards Circuit board in lower housing, under it battery-PCB 3 Aluminium Two rotary control buttons 4 Stainless steel Handle, rubber tube can be removed 5 >PC< Lower housing and battery-cover Recycling 7-12 Issue 06, 11/2007 USM 35X Maintenance and care Recycling data of master device Recycling/material code Weight Description approx. (kg) Materials/components, which must be removed and treated separately: LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts (0 0.5 mg) of Mercury (Hg) Lithium-ion battery 0.49 Located inside the battery compartment subtotal 0.71 Materials/components, which can disturb certain recycling processes: >PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed in brass thread insert. Circuit boards 0.33 Under LC display unit subtotal 0.49 Materials/components, through which benefits can normally be achieved: Stainless steel 0.18 Handle, ratchet disk, Aluminium 0.15 Rotary control button, mounting sheets, >PC< 0.42 Lower housing, holder for handle, battery-cover Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing subtotal 0.80 Recycling USM 35X Issue 06, 11/2007 7-13 Maintenance and care Recycling/material code Weight Description approx. (kg) Composite materials*: Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel subtotal 0.20 Total 2.20 Mounting material, cables, 0.16 clamps, screws ... Total weight (incl. battery) 2.36 Special notes: none * Materials/components, which cannot be separated into mono materials by destructive mechanical processes Recycling 7-14 Issue 06, 11/2007 USM 35X USM 35X Issue 06, 11/2007 8-1 Interfaces and peripherals 8 8-2 Issue 06, 11/2007 USM 35X Interfaces and Peripherals 8.1 Interfaces The USM 35X presents different interfaces for the con- nection of external units and for the data exchange. All interfaces are located at the instrument front. The fol- lowing figure gives an overview of the position of inter- faces. Interfaces USM 35X Issue 06, 11/2007 8-3 Interfaces and Peripherals Interfaces 1 BNC or LEMO-1-TRIAX socket for the connection of the transmitter probe (black ring) 2 BNC or LEMO-1-TRIAX socket for the connection of the receiver probe (red ring) 3 RS 232 serial interface, 9-way Sub-D socket 4 I/O analog interface, 8-way LEMO-1-B socket 5 RGB-OUT VGA interface, 10-way LEMO-1-B socket 6 12V DC Mains connection socket, 4-way LEMO-0-B socket 8-4 Issue 06, 11/2007 USM 35X Interfaces and Peripherals 8.2 I/O interface The USM 35X has an 8-way I/O interface (LEMO-1-B socket) for different input and output signals: SAP output (transmitter trigger pulse) Alarm output (TTL): switching delay approx. 50 ms, hold time approx. 500 ms. TDR input (test data release) Analog output H Note: You are able to externally process the alarm condition with the alarm output, e.g. for sorting and other control purposes. Error alarms can be triggered under certain circumstances. These are caused by intermediate con- ditions in instrument operation occuring when the in- strument is used, i.e. when function parameters are changed. Possible alarms occuring during instru- ment operation (setting of functions) are to be ig- nored. I/O interface View of the 8-way LEMO-1-B socket USM 35X Issue 06, 11/2007 8-5 Interfaces and Peripherals Contact assignment of the LEMO-1-B socket Contact Description Signal direction Level Colour (UM 25*) 1 SAP output TTL white 2 alarm A output TTL grey 3 alarm B output TTL yellow 4 unassigned pink 5 unassigned black 6 TDR input TTL active high blue 7 Analog output, amplitude or time of flight output 0 5 V green (selectable via remote-control code, see chapter 8.4 Remote Control) 8 GND ground brown *UM 25: analog cable (35 268) I/O interface 8-6 Issue 06, 11/2007 USM 35X Interfaces and Peripherals 8.3 RS 232 interface The USM 35X has a RS 232 interface for remote con- trol and documentation (report printout). Contact assignment of the Sub-D socket Contact Designation Signal direction Level 1 unassigned 2 RXD input RS 232 3 TXD output RS 232 4 DTR output RS 232 5 ground RS 232 6 DSR input RS 232 7 RTS output RS 232 8 CTS input RS 232 9 unassigned H Note: Switch off the instrument before connecting a cable to the RS 232 socket or before withdrawing any plugs. RS 232 interface View of the 9-way Sub-D socket USM 35X Issue 06, 11/2007 8-7 Interfaces and Peripherals 8.4 RGB interface The RGB interface serves for the output of the VGA signal. You can use this interface to connect the USM 35X with a monitor or with a VGA projector (beamer). The current display contents are then trans- ferred to the external unit and can be further used accordingly. The interface is a 10-way socket type Lemo-0-B. The standard contact assignment makes it suitable for all VGA output units. Use the VGA adapter UM 31 (order number 35 653) in order to connect a VGA output unit. H Note: Before you are able to use the RGB interface, you have to activate the function VGA in the function group LCD first. 8.5 Data exchange The USM 35X is equipped with the serial interface RS 232 for bi-directional data communication with a PC. When you connect the instrument with a PC you can: remote control the instrument via the PC, transfer A-scans for documentation, transfer instrument settings in ASCII format, transfer reports from stored datasets, transfers Datalogger jobs in ASCII format (option) read and write datasets in binary format. Connecting a printer or a PC You can connect the USM 35X to a printer or a PC using the special Krautkramer cables: PC: UD 20 (25-way) or UD 31 (9-way) Printer: UD 31 (Seiko DPU) or UD 32 (Epson) Please refer to chapter 2. RGB interface 8-8 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Activation of serial communication After connecting the instrument to the PC you must run a software that opens the serial port. This can ei- ther be a commercial terminal program (e.g. Microsoft Hyper Terminal) or a customised program like UltraDOC. Make sure that the serial communication parameters on the PC are identical to those of the instrument. The data transmission parameters are as follows: Baud rate: 0 (no transmission), 300, 600, 1200, 2400, 4800, 9600 (default), 19200, 38400, and 57600 Word length: 8 data bits (fixed) Parity: none (fixed) Stop bits: 2 (fixed) The baud rate can be set in the function BAUD-R in the menu CFG1 from the third operating level. The settings on the USM 35X apply to most of the printers and PCs. To ensure a perfect communication, please check the settings of the connected peripherals and adjust them to the parameters of the USM35X. Printing data The USM 35X enables a direct printout of data, for example a report including the echo display and the instrument settings. To do this, select the printer driver in the function PRINTER (function group CFG1) and just press the key after having initialized and activated the printer. The data selected by you in the function COPYMOD (function group CFG1) are printed. For more details on this, please refer to chapter 6. Data exchange USM 35X Issue 06, 11/2007 8-9 Interfaces and Peripherals 8.6 Remote control You can use a connected PC for the remote control of the USM 35X. The data transfer is carried out by means of a remote control program and the corresponding remote control commands. These commands represent instructions referring to the individual functions of the USM 35X. The Windows program HyperTerminal can for example be used as remote control program. After the remote control program has been started and the program interface has been configured, the com- mands are input via the keyboard of the computer. In this connection, please observe the following differen- tiation: Interrogation of a value or state of a USM 35X function using the command structure: <ESC> <COMMAND> <RETURN> The USM 35X transmits the value of the current setting. Remote control Entry of a new value or state of a function using the command structure: <ESC> <COMMAND> <SPACE> <VALUE> <RE TURN> All values are entered or transmitted by the USM 35X without a comma or a point. The resolution of the func- tion should therefore be observed with all values. The resolution of a function applies to the entire value range of that function. A resolution of 0.01 means: The USM 35X transmits the value of a function multi- plied by the factor of 100. The entry of a value must be done multiplied by the factor of 100. Examples Setting of the display delay to 72.39 mm: <ESC>dd 7239 <RETURN> Setting of the display width to 72.3 mm: <ESC>dw 7230 <RETURN> 8-10 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Setting of the display width to 192 mm: <ESC>dw 19200 <RETURN> A resolution of 0.1 means: The USM 35X transmits the value of a function multi- plied by the factor of 10. The entry of a value must be done multiplied by the factor of 10. Example: Setting of the gain to 51.5 dB <ESC>db 515 <RETURN> A resolution of 1 means: The USM 35X transmits the value of a function without multiplication. The entry of a value must be done with- out any multiplication. Example: Setting the response threshold of gate a to 41 %: <ESC>at 41 <RETURN> Remote control USM 35X Issue 06, 11/2007 8-11 Interfaces and Peripherals Remote control Syntax and timing The syntax and timing of the communication with the instrument is as follows: With: ESC = escape (ASCII CHR 27) * = star (ASCII CHR 42) AB = remote code of an instrument function CR = carriage return (ASCII CHR 13) |_| = Space (ASCII CHR 32) n Bytes = function value of function AB ETX = end of text (ASCII CHR 3) LF = line feed (ASCII CHR 10) 8-12 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Transmission timing As soon as the instrument has received the ESC command, is will return the * which then will be displayed on PC screen. Then you key in the wanted remote code according to the given table. The instrument echoes your entries. Finally you hit the [CR]-key on your keyboard or send the CR-command (closing the remote command). The instrument will now return a blank, then the related function value which may consist of several Bytes, then the end of text character, and finally the carriage return and the line feed character. Remote control USM 35X Issue 06, 11/2007 8-13 Interfaces and Peripherals Remote control Example: Request RANGE value from the USM 35X Remote code of the range function is DW (display width). Please note that numerical function values are always returned as integer values with the given maxi- mum resolution, here DW = 5000 means 50.00 mm. Example: Request reading at position 2 in the measurement line Remote code of measurement position 2 is E2 (evalu- ation 2). E2 = 10.81 means 10.81 mm (here sound path of the echo in gate A had been displayed). Please note that all readings are shown in that applicable decimal format where the decimal separator is a dot. 8-14 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Changing a function value Key in [ESC] DW [Space] 2000 [CR] in order to set the range to 20.00 mm: Please note that you must key in the function value as an integer with the maximum given resolution, here 2000 for the range of 20 mm. Alphanumerical entries Key in [ESC] DN [Space] Weld inspection B 45/2 [CR] in order to enter the dataset name (DATNAME) Weld inspection B 45/2. All alphanumerical entries may have a maximum length of 24 characters. In case the string length exceeds 24 characters, it will auto- matically be cut to 24 characters. With the other alpahnumerical fields in the TESTINF table you may easily describe the dataset. Remote control USM 35X Issue 06, 11/2007 8-15 Interfaces and Peripherals Remote control Transfer of datasets A total of 800 datasets (complete instrument setup including A-scan) can be stored in the instrument. The stored datasets including the actual setting (dataset # 0) can be transferred to the PC in compressed binary format for archiving purposes. If required, the datasets may be downloaded back to the insturment for re-use or echo comparison. This bi-directional dataset trans- fer is part of the software UltraDOC. Actual dataset (# 0) from the instrument to the PC: v 1 ... v n describes the software version of the USM, bytes b 1 ... b n contain the instrument setting including A-scan. In order to store this information you must write the transferred bytes v 1 ... v n , CR, LF, b 1 ... b n into a file. 8-16 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Dataset file from the PC to the instruments dataset #1: *) at this time the instruments waits for the reception of the bytes v 1 ... v n CR LF b 1 ... b n . The instrument now checks whether received dataset is compatible with the current software version of the instrument, and whether the dataset is valid (correct checksum). Remote control USM 35X Issue 06, 11/2007 8-17 Interfaces and Peripherals Functions and remote control codes Presettings are in bold-face type. You will find a brief description of all functions in chapter 9.1 Function directory. If not otherwise stated, all values refer to steel, C = 5920 m/s. The functions marked with * are only available in the USM 35X DAC and USM 35X S (DAC evaluation), the functions marked with ** are only available in the USM 35X S (DGS evaluation). Functions which are only availabe in connection with the Data Logger option are marked with *** (please also refer to the section Remote control in chapter Option Data Logger on this subject). Read only functions are marked with R . Remote control Function Code Range/Default Resolution aLOGIC AM 0 = off 1 1 = pos 2 = neg AMPLCOR** AC -25 to +25 dB / 0 0.1 ANAMODE AQ 0 = 0 volt 1 = 5 volts ANGLE PA 0 - 90 / 0 0.1 A-SCAN AS 0 = stndard 1 1 = compare 2 = envelop 3 = peak b 4 = afreeze 5 = bfreeze 6 = cfreeze*** aSTART AD 0 - 9999 mm / 35 0.01 0 - 250" / 1.500 0.001 aTHRSH AT 10 - 90 % / 40 1 -90 - -10 % additionally with rf ATTEN R BC 0 - 1101 dB 0.1 8-18 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Function Code Range/Default Resolution ATT-OBJ** AO 0 - 100 dB/m / 0 0.1 ATT-REF** AR 0 - 100 dB/m / 0 0.1 aWIDTH AW 0.1 - 9999 mm / 40 0.01 0.004 - 250" / 1.500 0.001 BAUD-R BR 0 = 0 1= 300 2 = 600 3 = 1200 4 = 2400 5 = 4800 6 = 9600 7 = 19200 8 = 38400 9 = 57600 bLOGIC 2L 0 = off 1 1 = pos 2 = neg 3 = a trig Function Code Range/Default Resolution BOLDLI DV 0 = off 1 = L 2 = M 3 = H 4 = U 5 = T 6 = a bSTART 2D 0 - 9999 mm / 85 0.01 0 - 250" / 3.500 0.001 bTHRSH 2T 10 - 90 % / 30 1 -90 - -10 % additionally with rf bWIDTH 2W 0.1 - 9999 mm / 40 0.01 0.004 - 250" / 1.500 0.001 CAL CA read only COLOR CH 0 = off 1 = 1 2 = 2 COMMENT CO alphanumerical input Remote control USM 35X Issue 06, 11/2007 8-19 Interfaces and Peripherals Function Code Range/Default Resolution COPYMOD CM 0 = hardcpy 1 1 = report 2 = meas P1 3 = pardump 4 = PCX 5 = store 6 = datalog*** 7 = off 8 = special DACECHO* TE 0 - 10 / 0 1 DACMOD* TM 0 = off 1 1 = DAC 2 = TCG DAMPING PG 0 = low 1 1 = high DATE DE numerical input e.g. 26-01-99 DATNAME DN alphanumerical input DBSTEP ST 6.5 ... 20 dB 0.1 Function Code Range/Default Resolution D eff** XD 3 - 35 mm / 9.7 0.01 0.120 - 1.400" / 0.380 0.001 (only for probe-# 0) D-DELAY DD -10 - 1024 mm / 0 0.01 -0.3 - 40" / 0 0.001 DELALL EX 0 = off 1 = on DELETE EA 0 = off 1 1 = on DEL-VEL** VV 1000 - 15000 m/s / 2730 1 (only for probe-# 0) DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01 0.02 - 1.400 / 0.1 0.001 DGSMENU T5 0 = off 1 = on DGSMOD** DS 0 = off 1 1 = on DGS-REF** DR 0 = off 1 1 = on Remote control 8-20 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Function Code Range/Default Resolution DIALOG DG 0 = German 1 1 = English 2 = French 3 = Italian 4 = Spanish 5 = Portuguese 6 = Dutch 7 = Swedish 8 = Slovenian 9 = Romanian 10 = Finnish 11 = Czech 12 = Danish 13 = Hungarian 14 = Croatian 15 = Russian 16 = Slovakian 17 = Norwegian 18 = Polish 19 = Japanese 20 = Chinese 21 = Serbian DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01 800.01" = flat DIR T3 0 = off 1 = on Function Code Range/Default Resolution DUAL DM 0 = off 1 1 = on EVAMOD EM 0 = DAC 1 1 = DGS 2 = REF 5 = JISDAC FILLED FI 0 = off 1 1 = on FINE G FG 5 - +5 / 0 1 FLAWIND FB alphanumerical input FLAWLEN FL 0 - 999 mm / 0 0.01 0 - 40" / 0 0.001 FREQU FR 0 = 0.5 - 4 MHz 1 1 = 2 - 20 MHz 2 = 0.8 - 8 MHz 3 = 0.2 - 1 MHz 4 = 1 MHz narrow band filter 5 = 2 MHz narrow band filter 6 = 2.25 MHz narrow band filter 7 = 4 MHz narrow band filter 8 = 5 MHz narrow band filter 9 = 10 MHz narrow band filter Remote control USM 35X Issue 06, 11/2007 8-21 Interfaces and Peripherals Function Code Range/Default Resolution GAIN DB 0 - 110 dB / 30 0.1 HORN HO 0 = off 1 1 = on INDICA R BA -1101 - 1101 dB 0.1 LIGHT LT 0 = off 1 1 = on MAGNIFY MA 0 = off 1 1 = aGAT 2 = bGAT MEAS-P1 M1 Setting range see S-DISP 1 MEAS-P2 M2 MEAS-P3 M3 MEAS-P4 M4 MTLVEL SV 1000 - 15000 m/s / 5920 1 40 - 600 "/ms / 233 0.1 OBJECT OB alphanumerical input OFFSET* TO 0 - 14 dB / 0 0.5 OPERAT PE alphanumerical input Remote control Function Code Range/Default Resolution P-DELAY PD 0 - 199.99 s / 0 0.01 POWER PI 0 = low 1 1 = high PRBFREQ** XF 0.5 - 10.0 MHz 0.04 PRBNAME** PN alphanumerical input PREVIEW T2 0 = off 1 = on PRF-MOD PF 10 steps: 0 = step 1 1 1 = step 2 2 = step 3 3 = step 4 4 = step 5 5 = step 6 6 = step 7 7 = step 8 8 = step 9 9 = step 10 PRINTER PR 0 = Epson 1 1 = HP Laserjet 2 = HP Deskjet 3 = DPU-41x 4 = HP Laserjet 1200 series 5 = HP Deskjet 1200 series 6 = DPU-345 8-22 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Function Code Range/Default Resolution PROBE-#** PB 0 = variable / alphanumerical input 1 = B1-S 2 = B2-S 3 = B4-s 4 = MB2-S 5 = MB4-S 6 = MB5-S 7 = MWB45-2 8 = MWB60-2 9 = MWB70-2 10 = MWB45-4 11 = MWB60-4 12 = MWB70-4 13 = SWB45-2 14 = SWB60-2 15 = SWB70-2 16 = SWB45-5 17 = SWB60-5 18 = SWB70-5 19 = WB45-1 20 = WB60-1 21 = WB70-1 22 = WB45-2 23 = WB60-2 24 = WB70-2 25 = MSEB-2 26 = MSEB-4 27 = MSEB-4 0 28 = SEB-1 29 = SEB-2 KF5 30 = SEB-4 KF8 31 = SEB-2 32 = SEB-4 RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz: 0.5 - 9999 mm / 250 0.01 0.02 - 390" / 10 0.001 2 - 20 / 0.8 - 8 MHz: 0.5 - 1420 mm / 250 0.01 0.02 - 56" / 10 0.001 RATING R BD -1101 - 1101 db 0.1 Function Code Range/Default Resolution RECALL RD 0 = off 1 1 = on RECTIFY RF 0 = full-w 1 1= pos hw 2 = neg hw 3 = rf REFECHO RC 0 = no ref. 1 = ref. stored REFECHO** RE 0 = BW 1 1 = SDH 2 = FDH REFMODE RO 0 = off 1 = on REFRNCE R BB 0 - 1101 dB 0.1 REFSIZE** RS 0.5 - 10 mm / 3 0.01 REJECT RJ 0 - 80 % / 0 1 SCALE SE 0 = measval 1 = snd-pth. 2 = div. Remote control USM 35X Issue 06, 11/2007 8-23 Interfaces and Peripherals Function Code Range/Default Resolution SCHEME CS 0 = green/black 1 = orange/black 2 = black/white 3 = black/yellow S-DISP VS 0=off 1=Sa 1 2=Sb 3=Sc*** 4=Sc-a*** 5=Sc-b*** 6=Sb-a*** 7=Ha % 8=Hb % 9=Hc %*** 10=Ha dB 11=Hb dB 12=Hc dB*** 13=R-start 14=R-end 15=Da 16=Db 17=Dc*** 18=Pa 19=Pb 20=Pc*** 21=Ra 22=Rb 23=Rc*** 24=ERS 25=Gt dB 26=Ha %crv 27=Hb %crv 28=Hc %crv*** 29=Alarm 30=DGS-Crv 31=freeJob*** 32=freeLoc*** 33=freeAsc*** 34=freeLoJ 35=lastLoc 36=La 37=Lb 38=Lc 39=Gatewid 40=Defdpth 41=class 42=DAC dB 43=LOC-# 44=Gr dB Function Code Range/Default Resolution SETTING T4 0 = off 1 = on SET-# ND 1 - 800 / 1 1 S-REF1 R1 0 - 5000 mm / 50 0.01 0 - 200" / 2.0 0.001 S-REF2 R2 0 - 5000 mm / 100 0.01 0 - 200" / 4.0 0.001 STO-INF SC 0 = off 1 1 = on STORE SD 0 = off 1 1 = on SURFACE SU alphanumerical input T-CORR * DC -24 - +24 dB / 0 0.5 TESTINF T1 0 = off 1 = on THICKNE TH 1 - 9999 mm / 25 0.01 0.05 - 400" / 1 0.001 Remote control 8-24 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Function Code Range/Default Resolution TIME TI numerical input, e.g. 12:30:00 TOF AF 0 = flank 1 1 = peak 2 = jflank UNIT UN 0 = mm 1 1 = inch VGA VG 0 = off 1 = on X-POS XP 0 - 999 mm / 0 0.01 0 - 40" / 0 0.001 X-VALUE XV 0 - 100 mm / 0 0.01 0 - 40" / 0 0.001 Y-POS YP 0 - 999 mm / 0 0.01 0 - 40" / 0 0.001 Other remote control codes Code Function/description < Select the next left sided menu > Select the next right sided menu AG dB-Difference from the reference gain (ref. echo at 80 %) to the registration gain (maximum of selected DGS curve at 80 %), read only AP Analog output setting 0 = amplitude 1 = time of flight DA A-scan amplitudes transferred as binary data DV Send the DAC points in tics and dB, DAC, read only E1 Read value form measurement line (position 1) E2 Read value form measurement line (position 2) E3 Read value form measurement line (position 3) E4 Read value form measurement line (position 4) E5 Read value displayed in the A-scan EL Send the contents of the LCD as binary data stream, read only Remote control USM 35X Issue 06, 11/2007 8-25 Interfaces and Peripherals Code Function/description EV Read alarm LED status: 0 = no alarm 1 = alarm in A 2 = alarm in B 3 = alarm in A+B HD Editable header data from report transferred as ASCII-format data I1 Set information line in the startup screen I2 Set information line in the startup screen (up to 39 characters) ID Read instrument software version RG Reference gain (reference echo at 80 %), read only SL Scroll home: selection of the first function in every function group and of the left function group in every function group line. TF Freeze on/off: 0 = off 1 = on Code Function/description TZ Zoom on/off: 0 = off 1 = on UD Send data set as binary data UR Read data set as binary data Remote control 8-26 Issue 06, 11/2007 USM 35X Interfaces and Peripherals Control codes for the rotary knobs/ function keys Function Key Code Range Left-hand G+ increment rotary knob/ G- decrement gain Right-hand K+ increment rotary knob K- decrement dB-STEP P 0 = 0.0 1 = 0.5 2 = 1.0 3 = 2.0 4 = 6.0 5 = 6.5 20 FREEZE F off / on ZOOM Z off / on COPY C off / on Function Key Code Range ENTER R off / on level 10 1st/2nd operation level Remote control USM 35X Issue 06, 11/2007 8-27 Interfaces and Peripherals Function Key Code BASE 5 PULS 6 RECV 7 aGAT 8 bGAT 9 CAL 5 REF/DAC/ 6 DGS/JDAC TRIG 7 MEM 8 DATA 9 Function Key Code MEAS 5 MSEL 6 LCD 7 CFG1 8 CFG2 9 Function Key Code first 1 second 2 third 3 fourth 4 Remote control 8-28 Issue 06, 11/2007 USM 35X Interfaces and Peripherals A Attention: In rare cases concerning remote control sequences, reading measurement values directly after changing a function value in the USM 35X, there could be errors as long as the instrument has not ended setting the value. In such cases, additional commands must be inserted into the remote control sequence before the measure- ment values are read. Example: If you create a remote control sequence, by which the sound path of an echo is read after freezing the A- scan, the command chain would be as follows: Command Answer Description <ESC>F<RETURN> A-scan freeze <ESC>E3<RETURN> 50,74 Read sound path <ESC>F<RETURN> Disable A-scan freeze ... In the interests of security, insert additional read com- mands before reading the sound path, e.g.: Command Answer Description ... <ESC>F<RETURN> A-scan freeze <ESC>DB<RETURN> 580 Read dB setting <ESC>DB<RETURN> 580 Read dB setting <ESC>DB<RETURN> 580 Read dB setting <ESC>DB<RETURN> 580 Read dB setting <ESC>E3<RETURN> 50,74 Read sound path <ESC>F<RETURN> Disable A-scan freeze ... With these measures you ensure that sufficient time has passed in order to completely execute the previ- ous command (display freeze) before transferring the sound path. Finally, check your remote control se- quence to see that the measurement values can be correctly read, and add further read commands if nec- essary. Remote control USM 35X Issue 06, 11/2007 9-1 Appendix 9 9-2 Issue 06, 11/2007 USM 35X Appendix Function directory 9.1 Function directory The functions marked with * are only available on the USM 35X DAC / USM 35X S (DAC evaluation mode), those market with ** are exclusively available on the USM35X S (DGS evaluation mode). Function Function group Description aLOGIC aGAT Evaluation logic of the gate A AMPLCOR** DGS Amplitude correction ANAMOD CFG2 Setting of the analog output ANGLE TRIG Entry of the angle for calculating the (reduced) projection distance (angle-beam probes) A-SCAN MEAS Settings of the A-scan aSTART aGAT Starting point of the gate A aTHRSH aGAT Threshold of the gate A ATTEN DGS Sound attenuation in the test piece Function Function group Description ATT-REF** DGS Sound attenuation in the reference block ATT-OBJ** DGS Sound attenuation in the test object aWIDTH aGAT Width of the gate A BAUD-R CFG1 Baud rate for serial port transmission bLOGIC bGAT Evaluation logic in the gate B BOLDLI JDAC Selection and emphasizing of registration curve bSTART bGAT Starting point of the gate B bTHRSH bGAT Starting point of the gate B bWIDTH bGAT Width of the gate B CAL CAL Semiautomatic calibration COLOR TRIG Marking of legs COMMENT DATA Comment USM 35X Issue 06, 11/2007 9-3 Appendix Function directory Function Function group Description COPYMOD CFG1 Assignment of the key DACECHO* DAC/JDAC Recording of a reference echo for the DAC DACMODE* DAC/JDAC Activating/Deactivating the DAC DAMPING PULS Damping of the probes oscillating circuit DATE CFG2 Current date dBSTEP RECV User-programmable gain step D-DELAY BASE Setting of the display start D eff** DGS Effective element diameter of the probe used DELALL MEM Deleting all stored data sets DELETE MEM Deleting a stored data set DEL-VEL** DGS Material velocity for probe delay Function Function group Description DGS-CRV** DGS Recording curve for DGS evaluation mode DGSMENU** DGS Activating/Deactivating the DGS menu table for selecting the probe and further DGS settings DGSMODE** DGS Activating/Deactivating DGS evaluation mode DGS-REF** DGS Recording of DGS reference echo DIALOG CFG1 Selecting the language DIAMET TRIG Change between plane-parallel and circular curved test components DIR DATA Dataset directory DUAL PULS Separation of pulser and receiver EVAMOD CFG2 Switchover REF DAC DGS JDAC 9-4 Issue 06, 11/2007 USM 35X Appendix Function directory Function Function group Description FILLED LCD Selecting the echo display mode (filled or normal) FINE G RECV Fine adjustment of gain within a range of approx. 4 dB in 40 steps FLAWLEN DATA Flawlength FREQU RECV Selecting the frequency range for the connected probe GAIN left-hand Setting of the gain rotary knob HORN CFG2 Switching the acoustic alarm signal on/off INDICA AWS Flaw gain in dB for AWS evaluation LIGHT LCD Choice of lightning for the display MAGNIFY MEAS Gate spreading Function Function group Description MEAS-P1 MSEL Selection of measured values MEAS-P2 at four positions of the MEAS-P3 measurment line MEAS-P4 MTLVEL BASE Setting of the material sound velocity OBJECT DATA Object description OFFSET* DAC/JDAC Offset for multiple DAC OPERAT DATA Name of the operator P-DELAY BASE Compensating for the probe delay line POWER PULS Setting the power of the initial pulse PRBFREQ** DGS Probe frequency PRBNAME** DGS Probe name PREVIEW DATA Dataset preview with A-scan USM 35X Issue 06, 11/2007 9-5 Appendix Function directory Function Function group Description PRF-MOD PULS Setting the pulse repetition frequency PROBE-#** DGS Probe number PRINTER CFG1 Selecting the printer for the test report RANGE BASE Setting of the range in which the measurement is made. RATING AWS Flaw rating as dB value RECALL MEM Retrieving a stored data set RECTIFY RECV Selection of rectification REFECHO REF For storing a reference echo for the measurement of dB difference REFECHO** DGS Type of the reference reflextor used REFMOD REF Activation of echo comparison Function Function group Description REFRNCE AWS Reference gain in dB for AWS evaluation REFSIZE** DGS Size of the reference reflector REJECT RECV Suppression of unwanted or spurious echo indications SCALE LCD Choice of display mode for the measurement line SCHEME LCD Choice of a color scheme for the screen display S-DISP MEAS Zoomed display of a selected parameter SET-# MEM Number of the data set SETTING DATA Display of a function list S-REF1 CAL Reference echo 1 for calibration S-REF2 Reference echo 2 for calibration STO-INF DATA Saving the current additional information 9-6 Issue 06, 11/2007 USM 35X Appendix Function Function group Description STORE MEM Saving the data set SURFACE DATA Condition of surface T-CORR* DAC/AVG/ Sensitivity correction, e.g. to JDAC compensate for transfer losses TESTINF DATA Saving additional information THICKNE TRIG Entry of workpiece thickness for calculation of real flaw depth TIME CFG2 Current time TOF MEAS Selection of the measuring point for the gate UNIT CFG1 Selecting the unit of measurement mm or inch VGA LCD Activating/Deactivating the VGA output X-POS DATA X-position coordinate Function directory Function Function group Description X-VALUE TRIG Entry of the distance between probe index (sound exit point) and leading face of the angle-beam probe Y-POS DATA Y-position coordinate USM 35X Issue 06, 11/2007 9-7 Appendix 9.2 EC declaration of conformity We declare that the USM 35X conforms to the following European directives: 89/336EEC (Electromagnetic compatibility) The conformity of the above-mentioned product with the regulations of the directive 89/336EEC is proven by the observance of the standard specifications EN 55 011:1998 Class A, Group 2 and EN 61 000-6-2:2005 EN 61 000-6-4:2001 The conformity of the above-mentioned product with the regulations of the directive 73/23/EEC, amended by the directive 93/68/EEC, is proven by the observance of the standard specification EN 61 010-1:2001 EC declaration of conformity 9-8 Issue 06, 11/2007 USM 35X Appendix 9.3 Manufacturer/ Service addresses The USM 35X is manufactured by: GE Inspection Technologies GmbH Robert-Bosch-Str. 3 50354 Hrth GERMANY Phone +49 (0) 22 33 - 601 111 Fax +49 (0) 22 33 - 601 402 The USM 35X is manufactured according to state-of-the- art methods using high-quality components. Thorough in-process inspections or intermediate tests and a quality management system certified to DIN EN ISO 9001 ensure an optimum quality of conformance of the instrument. Should you nevertheless detect an error on your instrument, switch the instrument off and remove the batteries. Inform your local GE Inspection Technologies Service indicating the error and describing it. Manufacturer/Service addresses Keep the shipping container for any repairs possibly required which cannot be made on the spot. If there is anything special that you would like to know about the use, handling, operation and specifications of the instruments, please contact your nearest GE Inspection Technologies representative or directly: GE Inspection Technologies GmbH Service-Center Robert-Bosch-Str. 3 50354 Hrth GERMANY or: Postfach 1363 50330 Hrth GERMANY Phone +49 (0) 22 33 - 601 111 Fax +49 (0) 22 33 - 601 402 USM 35X Issue 06, 11/2007 9-9 Appendix France GE Inspection Technologies Scs SAC Sans Souci 68, Chemin des Ormeaux 69760 Limonest FRANCE Phone +33 47 - 217 92 20 Fax +33 47 - 847 56 98 Great Britain GE Inspection Technologies 892 Charter Avenue Canley Coventry CV4 8AF GREAT BRITAIN Phone +44 845 - 130 - 3925 Fax +44 845 - 130 - 5775 USA GE Inspection Technologies, LP 50 Industrial Park Road Lewistown, PA 17044 USA Phone +1 717 - 242 03 27 Fax +1 717 - 242 26 06 Manufacturer/Service addresses 9-10 Issue 06, 11/2007 USM 35X Appendix 5 33 24 25 34 32 23 31 4 35 Spare parts list 9.4 Spare parts list USM 35X Issue 06, 11/2007 9-11 Appendix Spare parts list 10 2 53 3 11 6 30 38 54 37 50 12 9-12 Issue 06, 11/2007 USM 35X Appendix Spare parts list 1 51 26 28 52 29 21 27 20 7 36 8 22 9 USM 35X Issue 06, 11/2007 9-13 Appendix Spare parts list P o s . # D e s c r i p t i o n I d . - N o . R e m a r k 1 1 H o u s i n g
u p p e r
p a r t ,
w i t h
s e a l i n g 3 6 1 6 3 - 3 . 1 3 0 2 1 H o u s i n g
l o w e r
p a r t ,
p a r t l y
m o u n t e d 3 6 1 6 4 - 3 . 1 3 0 ( c o n t a i n s
P o s .
1 1 ,
6
a n d
3 0 ) 3 1 B a t t e r y
c o v e r ,
c o m p l e t e 3 6 1 6 5 - 3 . 1 9 0 4 1 C o n n e c t o r - C o v e r ,
c o m p l e t e 3 6 1 6 6 - 3 . 1 1 0 5 1 M e m b r a n e
k e y p a d 3 5 5 9 3 - 3 . 1 2 0 6 2 C o n t a c t
s p r i n g ,
c o m p l e t e 3 5 6 3 2 - 3 . 1 6 0 7 1 F l e x i b l e
c a b l e
L C D 3 5 6 3 5 - 3 . 1 8 0 8 1 C a b l e
5
p i n
I n v e r t e r 3 5 4 5 1 - 3 . 1 8 0 9 1 C a b l e
2
p i n
L C D 3 5 6 3 6 - 3 . 1 8 0
1 0 1 P C B
a s s e m b l y
U S M
3 5
X 3 6 1 6 0 - 3 . 2 2 0 - 1 P C B
a s s e m b l y
U S M
3 2
X
B + F 3 6 1 6 1 - 3 . 2 2 0 - 1 P C B
a s s e m b l y
U S M
3 2
X
L 3 6 1 6 2 - 3 . 2 2 0 1 1 1 P C B
a s s e m b l y
U S M
3 5
X
B a t 3 6 1 2 8 - 3 . 2 2 0 1 2 2 C a b l e
L e m o
-
M i c r o C o a x 3 6 0 7 0 - 3 . 1 8 0 - 2 B N C - C o n n e c t o r 0 6 6 5 0 - 7 . 1 3 0 2 0 4 S p a c e r
( 2 3
m m ) 1 0 3 1 3 8 - 6 . 0 2 0 2 1 2 S p a c e r
( 1 4
m m ) 1 0 2 0 4 3 - 6 . 0 2 0 2 2 2 S p a c e r
( 8
m m ) 1 0 2 0 4 4 - 6 . 0 2 0 2 3 2 S p a c e r
s l e e v e 3 4 8 0 9 - 6 . 0 2 0 2 4 2 R o t a t a b l e
k n o b 3 6 0 5 9 - 6 . 6 3 0 2 5 1 H a n d l e 3 5 2 5 3 - 6 . 5 4 0 2 6 1 M o u n t i n g
b r a c k e t 3 5 6 1 2 - 6 . 6 0 0 2 7 1 M o u n t i n g
b r a c k e t
L C D 3 5 6 2 1 - 6 . 6 0 0 2 8 1 M o u n t i n g
b r a c k e t
L C D
i n v e r t e r 3 5 6 2 2 - 6 . 6 0 0 2 9 1 C o v e r 3 5 6 3 1 - 6 . 6 0 0 3 0 2 C o n t a c t
p l a t e 3 5 6 3 3 - 6 . 6 0 0 3 1 2 R a t c h e t
d i s k 3 4 7 9 6 - 6 . 6 0 0 3 2 2 H o l d e r
f o r
h a n d l e 3 5 3 0 1 - 6 . 6 4 0 - 1 6 P r e s s u r e
d e v i c e s 1 8 6 7 2 - 7 . 8 2 0 3 3 1 S e a l i n g
( K e y
p a d ) 3 4 9 9 4 - 6 . 6 4 0
3 4 2 C l a m p ,
l o w e r 3 4 8 8 2 - 6 . 6 4 0 3 5 2 C l a m p ,
u p p e r 3 5 6 2 9 - 6 . 6 4 0 3 6 1 I s o l a t i o n
f o i l 3 5 6 3 4 - 6 . 6 5 0 3 7 2 S e a l i n g
s c r e w 3 6 0 7 1 - 6 . 0 7 0 3 8 2 R o t a r y
p o s i t i o n
t r a n s d u c e r 3 6 0 5 6 - 6 . 5 3 0 5 0 2 L o c k i n g
s c r e w 1 2 3 2 6 - 7 . 1 3 9 5 1 1 L C D - D i s p l a y 1 0 0 8 7 4 - 7 . 2 3 2 5 2 1 C o n v e r t e r 1 0 1 0 6 7 - 7 . 2 3 2 5 3 4 R u b b e r
f o o t 1 4 5 2 0 - 7 . 8 2 0 5 4 2 B l a n k i n g
c a p
,
L e m o 1 0 3 1 2 0 - 7 . 1 3 7 - 2 B l a n k i n g
c a p
,
B N C 1 8 9 0 6 - 7 . 1 3 9 H a n d l e
( M o d i f i c a t i o n - S e t
c o m p l e t e ) 3 5 2 5 8 - 2 . 3 8 0 0 8 . M a r c h . 0 5
/
A n t 9-14 Issue 06, 11/2007 USM 35X USM 35X Issue 06, 11/2007 10-1 Changes 10 10-2 Issue 06, 11/2007 USM 35X Changes This chapter contains information about changes and additions made at short notice and not yet included in the operating manual. If none exist, the chapter remains blank. USM 35X Issue 06, 11/2007 11-1 Index 11 11-2 Issue 06, 11/2007 USM 35X Index A a trig Triggering by an interface echo ........................... 5-15 A-Scan Setting the A-scan .............................................. 5-48 A-scan Setting ................................................................ 5-48 Accessories ............................................................. 2-5 Acoustic alarm ....................................................... 5-58 Activating DAC according to JIS ............................. 5-68 Activating DAC/TCG ............................................... 5-62 Additional information Storing................................................................. 5-39 Additions ................................................................ 10-2 Addresses ................................................................ 9-8 Adjustment range Function directory ................................................. 9-2 Adustment Coarse and fine ..................................................... 4-9 aGAT (function group) ............................................. 5-14 Alkaline batteries ...................................................... 7-4 aLOGIC Evaluation logic gate A........................................ 5-15 Alphanumerical entries ........................................... 8-14 Analog output ................................................. 5-57, 8-5 ANAMOD................................................................ 5-57 ANGLE (Angle of incidence) ................................... 5-32 Anticoincidence ...................................................... 5-15 aSTART .................................................................. 5-25 Starting point of gate A........................................ 5-16 aTHRSH Threshold of gate A ............................................. 5-16 aWIDTH Width of gate A ................................................... 5-16 USM 35X Issue 06, 11/2007 11-3 Index B Backlight ................................................................ 5-52 BASE (function group) .............................................. 5-6 Basic initialization .................................................... 3-8 Basic settings ........................................................ 4-12 Batteries ................................................................... 1-2 Care ...................................................................... 7-3 Charging the NiCd batteries .................................. 7-3 Baud rate for transmission...................................... 5-55 BAUD-R (Baud rate for transmission) ..................... 5-55 bGAT (function group) ............................................. 5-14 bLOGIC Evaluation logic gate B ....................................... 5-15 BOLDLI (Choice of a registration curve) .................. 5-71 bSTART Starting point of gate B ....................................... 5-16 bTHRSH Threshold of gate B ............................................. 5-16 bWIDTH Width of gate B ................................................... 5-16 C CAL Semiautomatic calibration......................... 5-19, 5-22 CAL (function group) ............................................... 5-19 Calibration .............................................................. 5-17 Dual-element (TR) probes ................................... 5-21 Straight-beam probes .......................................... 5-18 With unknown materials...................................... 5-19 CFG1 (function group) ............................................ 5-53 CFG2 (function group) ............................................ 5-53 Changes ................................................................. 10-1 Changing a function value ....................................... 8-14 11-4 Issue 06, 11/2007 USM 35X Index Codes Codes for function keys ...................................... 8-26 Function codes ................................................... 8-17 Remote control ..................................................... 8-9 Coincidence ............................................................ 5-15 COLOR................................................................... 5-33 Configuration........................................................... 5-53 For test applications ........................................... 5-43 Configuring the measurement line .......................... 5-52 Connecting a probe................................................... 3-7 Controls .................................................................... 4-2 COPY key Assignment ......................................................... 5-55 COPYMOD....................................................... 6-3, 8-8 Assignment of the COPY key ............................. 5-55 D D-DELAY (Display starting point) .............................. 5-7 DAC (function group) .............................................. 5-61 DACECHO Recording reference curve ................................... 5-69 DACECHO (Recording reference curve) .................. 5-63 DACMOD Activating DAC according to JIS ......................... 5-68 DACMOD (Activating DAC) ................. 5-61, 5-68, 5-78 DACMOD (Activating DAC/TCG) ............................ 5-62 DAMPING (Probe matching) ..................................... 5-9 DATA (function group) ............................................. 5-38 Data exchange ......................................................... 8-7 Data saving ............................................................. 5-34 Data set Deleting............................................................... 5-35 Deleting all .......................................................... 5-36 Management ....................................................... 5-38 Recalling ............................................................. 5-36 Storing................................................................. 5-35 Dataset Directory ............................................................. 5-42 Preview ............................................................... 5-41 USM 35X Issue 06, 11/2007 11-5 Index DATE Setting the gate .................................................. 5-56 dBSTEP ................................................................. 5-12 Defects ..................................................................... 1-3 Deleting a reference echo ....................................... 5-27 Depth ...................................................................... 5-31 DGS evaluation (USM 35S) .................................... 5-74 DIALOG Selecting the language ....................................... 4-12 DIALOG (Selecting the language) ........................... 5-53 DIAMET (Outside diameter of the test object) ........ 5-33 Diameter of the test object ..................................... 5-33 DIR Directory of stored data sets ............................... 5-38 DIR (Dataset directory) ........................................... 5-42 Display ..................................................................... 4-3 Display range............................................................ 5-6 Display starting point ................................................ 5-7 Distance-amplitude curve........................................ 5-61 according to JIS Z3060-2002 ............................... 5-67 Double assignment of functions ...................... 4-9, 5-78 DUAL Pulser-receiver separation ................................... 5-10 E EC declaration .......................................................... 9-7 Echo display ........................................................... 5-51 Enlarged echo display......................................... 5-59 Zoom mode ........................................................... 4-3 Echo evaluation ...................................................... 5-58 Echo-start gate ............................................. 5-14, 5-15 Enlarged display Measurement value ............................................... 4-5 Errors........................................................................ 1-3 Evaluation logic of the gates ................................... 5-15 EVAMOD (Echo evaluation) .................................... 5-58 11-6 Issue 06, 11/2007 USM 35X Index F FILLED Echo display ....................................................... 5-51 FINE G (Fine adjustment of gain) ................. 5-11, 5-12 Flaw evaluation ......................................................... 1-6 Flaw position calculation ........................................ 5-31 Freeze function ....................................................... 5-59 FREQU (Frequency range) ..................................... 5-13 Frequency range..................................................... 5-13 Function directory ..................................................... 9-2 Function groups ........................................ 4-4, 4-8, 5-3 Functions.................................................................. 4-4 Function directory ................................................. 9-2 Overview................................................................ 5-2 Setting the functions ............................................. 4-9 Special keys ....................................................... 5-59 G Gain .......................................................................... 5-5 Fine adjustment .................................................. 5-12 Incrementation ...................................................... 5-5 Gate setting ............................................................ 5-14 Gate spreading ....................................................... 5-48 Gates...................................................................... 5-14 Starting point ....................................................... 5-16 Width .................................................................. 5-16 H HORN Acoustic alarm.................................................... 5-58 I Instrument Care of the instrument ........................................... 7-2 Instrument versions................................................... 1-8 USM 35X Issue 06, 11/2007 11-7 Index Intefaces RS 232 interface ................................................... 8-6 Intensity .................................................................. 5-10 Interface echo ......................................................... 5-15 Interfaces I/O interface .......................................................... 8-4 J JDAC (function group) ............................................. 5-67 K Keys ......................................................................... 4-6 Special keys ....................................................... 5-59 L Language ...................................................... 4-12, 5-53 LCD Color scheme...................................................... 4-16 LCD (function group) ............................................... 5-50 Lemo socket ............................................................. 8-5 LIGHT LCD backlight ..................................................... 5-52 Limits........................................................................ 1-5 Line........................................................................... 4-5 M MAGNIFY Gate spreading ................................................... 5-48 Maintenance ............................................................. 7-5 Manufacturer ............................................................. 9-8 Material thickness .................................................. 5-33 MEAS-P1 to P4 ........................................................ 4-5 Measurement line ........................................... 4-5, 5-46 Configuration ....................................................... 5-49 Measuring ............................................................... 5-23 Measuring point ...................................................... 5-17 11-8 Issue 06, 11/2007 USM 35X Index MEM (function group) ............................................. 5-34 MSEL (function group) ............................................ 5-49 MTLVEL (Sound velocity) .......................................... 5-7 Multiple DAC ................................................ 5-65, 5-72 N Narrow band filter .................................................... 5-13 O OFFSET Distance of multiple DAC .......................... 5-65, 5-72 OFFSET (Distance of multiple DAC) ............ 5-65, 5-72 Operating levels Overview................................................................ 5-2 Operator training ....................................................... 1-4 Operator's controls ................................................... 4-2 P P-DELAY (Probe delay) ............................................ 5-8 POWER (Intensity) ................................................. 5-10 Power supply ............................................................ 3-2 PREVIEW Dataset preview................................................... 5-38 PREVIEW (Dataset preview) .................................. 5-41 PRF-MOD Pulse repetition frequency................................... 5-11 Printer Preparing .............................................................. 6-2 Selecting the printer driver ................................... 5-55 PRINTER (Printer for test report) ............................ 5-55 Printer connection .................................................... 8-7 Printing ..................................................................... 8-8 Printing data ............................................................. 6-2 Probe connection...................................................... 3-7 Probe delay .............................................................. 5-8 USM 35X Issue 06, 11/2007 11-9 Index Probe matching ........................................................ 5-9 Projection distance ................................................. 5-31 PULS (function group) .............................................. 5-9 Pulse repetition frequency ...................................... 5-11 Pulser adjustment .................................................... 5-9 Pulser-receiver separation ...................................... 5-10 R RANGE (Display range) ............................................ 5-6 Recalling a data set ................................................ 5-36 Receiver adjustment ............................................... 5-11 RECORD (Recording reference curve) .......... 5-62, 5-69 Recording reference curve ............................ 5-63, 5-69 Rectification ............................................................ 5-13 RECTIFY (Rectification) .......................................... 5-13 RECV (function group) ............................................ 5-11 Recycling.................................................................. 7-6 Reduced projection distance .................................. 5-31 REFECHO.............................................................. 5-25 REFMOD................................................................ 5-25 Registration curve ................................................... 5-71 REJECT.................................................................. 5-12 Remote control ......................................................... 8-9 Reset ........................................................................ 3-8 Rotary knobs ............................................................ 4-6 S S-DISP ..................................................................... 4-5 S-DISP (Zoomed display of reading) ....................... 5-46 Safety information ..................................................... 1-2 SCALE ................................................................... 5-52 SCHEME ................................................................ 5-51 Screen ...................................................................... 4-3 11-10 Issue 06, 11/2007 USM 35X Index Selecting units of measurement ............................. 5-54 Semiautomatic calibration ............................ 5-19, 5-22 Sensitivity correction .................................... 5-64, 5-71 Serial communication activation ............................... 8-8 Service...................................................................... 9-8 SETTING Function list ........................................................ 5-42 setting Function list ........................................................ 5-38 Setting of gain .......................................................... 4-8 Sound attenuation (DGS) ........................................ 5-83 Sound velocity .......................................................... 5-7 Spare parts list ....................................................... 9-10 Standard package ..................................................... 2-3 Start-up ..................................................................... 3-8 Storing a data set ................................................... 5-35 Sub-D socket ............................................................ 8-6 SVEL1 (Fixed sound velocity) ................................ 5-47 Switching on/off ........................................................ 3-8 Symbols In this manual ..................................................... 1-11 LED..................................................................... 5-60 Status symbols ................................................... 5-60 Syntax .................................................................... 8-11 T T-CORR Sensitivity correction (DAC) ................................ 5-64 Sensitivity correction (JDAC) .............................. 5-71 Transfer correction (DGS) ................................... 5-83 TCG ........................................................................ 5-62 Registration curve ............................................... 5-71 Temperature .............................................................. 1-6 Test report ................................................................ 6-3 Test requirements ..................................................... 1-4 TESTINF Additional information for stored data sets .......... 5-38 TESTINF (Storing additional information) ................ 5-39 USM 35X Issue 06, 11/2007 11-11 Index THICKNE Material thickness............................................... 5-32 THICKNE (Material thickness) ................................ 5-33 Threshold of the gates ............................................ 5-16 TIME Setting the time .................................................. 5-56 TOF Selecting the measuring point ............................. 5-44 Transfer correction (DGS) ....................................... 5-83 Transfer of datasets ................................................ 8-15 Transmission timing ............................................... 8-12 TRIG (function group) .............................................. 5-31 U Ultrasonic testing...................................................... 1-3 UNIT Units of measurement ......................................... 5-54 Units ....................................................................... 4-13 V VGA ....................................................................... 5-51 W Wall thickness.......................................................... 1-6 Waste disposal ......................................................... 7-6 Width of the gates .................................................. 5-16 X X-position ................................................................ 5-40 X-VALUE Of the probe ........................................................ 5-32 Z Zoom mode............................................................... 4-3 Zoomed display of reading ...................................... 5-46 11-12 Issue 06, 11/2007 USM 35X