1. What is DFT? - It is a name for design techniques that add certain testability features to a microelectronic hardware product design.

-They ma e it easier to de!elop and apply manufacturing tests for the designed hardware. ". #ontrollability? $ow easy it is to control state of particular node from primary i%p. I%p has highest controllability.

&. 'bser!ability? how easy it is to obser!e beha!ior of particular node at primary o%p? . '%p has highest obser!ability.

(. stuc -at fault model? ) signal* or gate output* is stuc at a + or 1 !alue* independent of the inputs to the circuit

,. -urn-In ? --urn in is the process by which components of a system are e.ercised prior to being placed in ser!ice. It is used to detect infant mortality of the de!ice and such -urn / In is stress and not test. The intention is to detect those particular components that would fail as a result of infant mortality* that is* during the initial* high-failure rate portion of the bathtub cur!e of component reliability. If the burn in period is made sufficiently long 0and* perhaps* artificially stressful1* the system can then be trusted to be mostly free of further early failures once the burn in process is complete. 2. Final Test is a Test that is done after -urn / In and it eliminstaes assembly defects and defects acti!ated at burn / in. )lso it is used to classify the de!ices according to the performance. It is also used to test )# parametric screen includes pac age effects. 0#apaciti!e slowdown* Inducti!e supply bounce1 3. $ot electrons 4ffect? These high energy electrons can enter the o.ide* where they can be trapped* gi!ing rise to o.ide charging that can accumulate with time and degrade the de!ice performance by increasing 5T and affect ad!ersely the gate6s control on the drain current.

7. Defect 8e!el ? -It is fraction of bad parts among the parts that pass all tests and shipped. 9. :ield? - :ield is ratio of de!ices which passing test to total number of de!ices. 9. Fault co!erage? -Fault co!erage is fraction of all possible faults that are detected in testing a setup de!ices