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MIL-STD-461E

Conducted Emission CE101 - 30 Hz to 10 kHz (Power and Interconnecting Leads) CE106 - 10 kHz to 40 GHz (Antenna Terminals)

CE102 - 10 kHz to 10 MHz (Power and Interconnecting Leads)

Conducted Susceptibility CS101 - 30 Hz to 150 kHz (Power Leads)

CS103 - 15 kHz to 10 GHz (antenna port, intermodulation) CS105 - 30 Hz to 20 GHz (antenna port, cross modulation) CS109 - 60 Hz to 20 GHz (structure current) CS114 - 10 kHz to 200 MHz (bulk cable injection)

CS104 - 30 Hz to 20 GHz (antenna port, rejection of undesired signals)

CS115 - transients, 2ns x 30ns (bulk cable injection, impulse excitation) CS116 - 10 kHz to 100 MHz (Damped sinusoidal transients, cables)

Radiated Emissions RE101 - 30 Hz to 100 kHz (magnetic Field) RE102 - 10 kHz to 18 GHz (electric Field) RE103 - 10 kHz to 40 GHz (spurious and harmonic outputs)

Radiated Susceptibility RS101 - 30 Hz to 100 kHz (magnetic field) RS103 - 2 MHz to 40 GHz (electric field) RS105 - Electromagnetic Pulse Field Transient ISO Failure Mode Severity Classification All classifications given below are for the total device/system functional status. The word function as used here concerns only the function performed by the electronic system.

Class A: all functions of a device or system perform as designed during and after exposure to interference.

Class B: all functions of a device/system perform as designed during exposure; however, one or more of them may go beyond the specified tolerance. All Memory functions shall remain class A. functions return automatically to within normal limits after exposure is removed.

Class C: one or more functions of a device or system do not perform as designed during exposure but return automatically to normal operation after exposure is removed.

Class D: one or more functions of a device or system do not perform as designed during exposure and do not return to normal operation until exposure is removed and the device or system is reset by a simple operator/use action.

Class E: one or more functions of a device or system do not perform as designed during and after exposure and cannot be returned to proper operation without repairing or replacing the device or system.

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