ttm institute of information technology

BANGALORE

VLSI Engineering Fundamentals

(Course# 200 !" #ui$ III
Note%

Ans&er 'our #uestions in sim(le and s)ort* #uestion (a(er s)ould su+mit along &it) t)e ans&er s)eet* ,rite 'our name on ans&er s)eet ONL-* All #uestions are .om(ulsor' and .arr' same grade*

* E/(lain t)e 0iller E11e.t and its rele2an.e in 0OSFE3 4arasiti. Ca(a.itan.e 2* ,it) t)e )el( o1 .ross se.tion o1 C0OS In2erter e/(lain t)e (rin.i(le o1 lat.) u(* E/(lain 2arious met)ods em(lo'ed to o2er.ome t)is (ro+lem*

3. Explain the principle involved in the following and its effect on ASIC Reliability A) Electro Migration ) !ot Electron Effect C) "hin #ate $xide %) ES% E) &ield '. (hat are Short Channel Effects) Explain each of the*.

ES" $+ ,-C.

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