Review on Paper 80 (BDD based fault modeling for reconfigurable Graphene

devices)
Habib-6317647702
2847 Montauk Hwy, Brookhaven, NY 11719
Recommendation:

Content is good & it meets some requirement. It provides a variety of sources. Some
careless errors due to lack of proofreading & editing. Technical writing of BDD, fault
definition & analysis should be precise.

If the authors can correct following reviews & follow-up the recommendation it is
an average paper (weak acceptance).

Section II. BACKGROUND

A. The description of RG device is not clear.

Table 1 lacks two value in component fault model column for Open U(bar) when S=1
& Open U when S=0. The table looks like to be copied from another source.

Section III. BDD based Fault Modeling for RG devices

A. Representing RG devices by BDD nodes

Figure 4(b) is not appropriately drawn.

C. Generating test based on the BDD fault model

Example 1: 3 paths defined based on Algorithm represented do not match.

D. Fault Collapsing

Fault dominance definition is not correct as f1 dominates f2 iff detecting set of f1
also includes detecting set of f2 but it is very likely all test vectors of f2 cant detect
f1.


Rating is 3 out of 5.