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PRESENTATION REPORT

12
th
July 2014
Submitted by:
Rohit kumar
(Executive trainee)
OUTLINE
TPM STUDY (Eliminating Equipment Losses)
PROCESS FLOW DIAGRAM OF CHIPS PLANT
REACTIONS INVOLVED IN CHIPS PLANT
TPM STUDY
SIX BIG LOSSES
1.Breakdown losses
2.Set up and adjustment losses
3.Idling and minor stoppage losses
4.Speed losses
5.Quality defects and rework
6.Startup/yield losses
Measuring equipment effectiveness

Overall equipment effectiveness =

Availability * Performance rate* Quality rate

1)Breakdown
losses
2)Set up &
adjustment
losses
3)others
1)Quality defects
&rework losses
2)Start up losses
1)Idling & minor
stoppage losses
2)Reduced speed
losses
Availability (operating rate)
Availability(operating rate)=
loading time downtime
loading time
Loading time: It is the daily time available for operation minus all forms of
scheduled stops such as breaks in production schedule stoppage for routine
maintenance, morning meetings and so on.
Downtime : it is total time taken for unscheduled stoppages such as breakdowns ,
retooling , and adjustments.
Operating time: loading time - downtime
X 100
Performance Rate
Based on the operating speed rate and net operating time.
Operating speed rate tells how fast a machine is running compared to its designed
speed in cycle time or strokes.
Operating speed rate = ideal cycle time
actual cycle time
Net operating time = output actual cycle time
loading time downtime
Output- is number of processed items per day.
Actual cycle time per item in minute.
Operation time in minute
Performance rate= net operating time x operating speed rate



X 100
x
X 100
OVERALL EQUIPMENT EFFECTIVENESS
Rate of quality: It is amount of products that are of our desired
quality e.g. 98% is the rate of quality products.



OVERALL EQUIPMENT EFFECTIVENESS=
AVAILABILITY * PERFORMANCE RATE * QUALITY RATE

PROCESS FLOW DIAGRAM OF CHIPS
PLANT
P
T
A


S
I
L
O

MEG
PASTE
TANK
UPR -1
UPR-2
UPR-3
DISTILLATION
COLUMN
c
o
n
d
e
n
s
e
r

M
E
G

M
E
G

condenser
Recycled
MEG
Column
MEG
REACTIONS INVOLVED

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