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DEFECTOMAT CP 2.

842
DEFECTOMAT EP 2.849

DEFECTOMAT CP - the successor to the legendary


DEFECTOMAT C incorporating the very latest microprocessor technology. The practically oriented compact test instrument matches a brought field of application for automatic flaw testing of semi finished
product industry, manufacturing and machining
wires, bars and tubes.
The P stands for Processor, Printed log and Printer.
The use of microprocessors, logging of the test results
and the printer interface are important innovations, but
they are, by far, certainly not the only innovations.

DEFECTOMAT CP is the answer to all standard testing tasks.


The new basic model EP completes the time-proven
DEFECTOMAT family and unites the advantages of a
low-cost, single-channel compact instrument with the
scope of performance of modern computer technology
- configurable, application-oriented functionality, high
level of operating convenience, problem-oriented signal and result evaluation.

Features
Signal processing:

Library:

Equipped as standard with one differential chan-

Tried-and-tested instrument settings can be saved

nel; additional absolute channel as an option.

High-pass filter as follow-up filter, i.e. it is adapted


automatically and continuously to the current test
speed and guarantees a uniformly good signalto-noise ratio, even if the test speed fluctuates.

The low-pass filter is set automatically. It can be

and recalled when required

Internal RAM for quick access to often used settings with a capacity for 24 settings

DEFECTOMAT CP:
unlimited storing possibilities via Remote Interface on an external computer

adjusted manually.
Display and operating concept:
Signal evaluation:

Discrimination between small and large flaws with


two independently settable trigger thresholds

Signal evaluation undependent from signal phase


(vector) with DEFECTOMAT EP/CP, phase selective evaluation (Y-component) alternatively with
DEFECTOMAT CP

DEFECTOMAT CP
TFT color display,
connection for exteral VGA display with optional
kit

DEFECTOMAT EP
High-resolution grey-scale monitor,
connection for exteral VGA display

Switchable evaluation methods for Pieces,

Clear basic display with all information relevant to

Cutting, Continuous and Wire.


In Pieces and Cutting evaluation modes, the
parts are assessed on the basis of the number of
small and large flaws. The limit values can be set.
In Continuous and Wire evaluation modes, the
material under test is subdivided into sections of
adjustable length. These are assessed either on
the basis of the number or on the basis of the density of small and large flaws or on the basis of
SEUs (Smallest Evaluation Unit); the evaluation
mode can be selected by means of a switch. An
overall assessment is formed for wires on the basis of the number of defective sections.

test operation: signal characteristic, event messages, selected operating parameters and test results.

Double logging of the test results, in the form of

Modern windowing and non-confusable operating


controls.

Fast and reliable selection of the optimum instrument setting:


The filters are set automatically.
The setting window offers precisely the parameters which you need
Gain and phase can be optimized effortlessly
with the aid of the signal memory and optical
setting aids.

long-term and short-term log, can be used for lot


and shift or for individual part and overall order

Dialog language either German, English, French,

Two-class marking, three-class sorting


Evaluation based on piece lenght to avoid ac-

Multi-position key-operated switch for preselect-

cepted pieces with over- or underlenght

Italian or Spanish
ing the operable scope of functions
Printer interface

A defect list, representing the class and the location of the defect on the testing material in longitudinal direction is included in DEFECTOMAT CP

For output of the screen contents as a hard copy,


for printing out the short-term or long-term log,

As an option for DEFECTOPMAT CP there is an

for synchronous output of fault messages in clear

evaluation procedure available, according to EN


1971 (European Norm), defining the EC-testing of
copper tubes

text and

for system printouts for servicing purposes.


Computer interface (DEFECTOMAT CP)

for transfer of instrument settings, control commands and test results

for integration in a comprehensive quality system

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Protokolldrucker
Report printer

Protokolldrucker
Report printer
Sortieren /Sorting

Markieren
Marking

Markieren
Marking

Vereinzelung
Separation

Einlaufrollgang
Entry roller conveyor

Prfspule
Test Coil

Prfspule
Test Coil

Auslaufrollgang
Sortiermulde
Exit roller conveyor Sorting trough

Sektion whlbarer Lnge


Section of selectable length

Fig. 3 Test sequence Continuous


Evaluation per section

Fig. 1 Test sequence Pieces


Evaluation per test piece

Protokolldrucker
Report printer

Protokolldrucker
Report printer

Sortieren /Sorting

Markieren
Marking

Markieren
Marking

Prfspule
Test Coil

Trennvorrichtung
Cutter

Fig. 2 Test sequence Cutting


Flaw events are buffered, evaluation after
cutting per cropped piece

DEFECTOMAT CP
010
Scale [n] (6..10000)
M0

M1

Host computer

Abwickeln
Uncoiling

Prfspule
Test Coil

Sektion whlbarer Lnge


Section of length

Aufwickeln
Coiling

Fig. 4 Test sequence Wire


Assessment per section, remaining section at
end of wire and overall evaluation of the wire

Protokolldrucker
Report printer

Schreiber
Recorder

10.0

STOP <> AUTOSTP <> START


XY.SIGN AL <>

NOTSYNC

1.00m/s

RUN>CLOSE

Fertigungsproze
Production process

Wirbelstrom-Prfspule
Eddy-current test coil

Markieren
Marking

Sortieren
Sorting

Fig. 5 Automated test sequence, documentation of the test results and a networked processor system
are features of contemporary quality assurance in production of semi-finished products.

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Application
Non-destructive testing of semi-finished products
made of ferrous materials, austenitic or non-ferrous
materials for surface flaws on the basis of the
eddy-current method (DIN 54 140). This test supersedes leakage testing of pipes and tubes for instance.

Special applications:

Testing sheets and strips with flat segment coils.


Testing shaped or molded parts with scanning
coils.
Flaw detection sensitivity:
The instrument is equipped with a differential channel which is operated with a differential coil and which
responds to changes in the conductivity of the test
material. It thus detects cavity and void-type flaws
transverse to the throughput direction and short longitudinal flaws with a high level of sensitivity. It supplies a front and tail signal in the case of longer longitudinal flaws which enter at a steep angle.
The optional absolute channel also indicates deep
longitudinal flaws over the entire length proportional
to the depth and is suitable for use as an unwelded
tube monitor on welding lines for instance. It also detects coarse material mix defects.

The main field of application is testing tubes, rods


and wires.
Cross section: round or profiled (e.g. hexagonal
roads)
Test sequence: The material under test passes
through the stationary sensor system in a continuous sequence.
Area tested: Continuous testing of the entire surface without omission with a through-type coil
matched to the diameter or to the section profile
or testing a longitudinal zone, e.g. the seam area
of longitudinally seam-welded tubes, with an
adapted segment coil or probe.
Testing hot wire made of non-ferrous materials
and ferrous materials above the Curie point.
Use on the finishing line or directly on the drawing, rolling or welding line.
The speed range of 1 m/min. to 120 m/s covers all
fields of application from slowly operating special-steel welding machines through to hot-wire
rolling lines.
Eddy Current

Excitation coi

Excitation coil

Magnetic field

r coil
Receivence
re
fe
dif

Magnetic field

Eddy Current

Typical coil shapes:


Through-type coil round
and segment coil

r coil
Receivelut
abso

Fig. 6 Principle of the eddy-current through-type coil


Characteristic flaw signals: differential channel and optional absolute channel

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Mechanical construction and mode of operation


Overview
The basic equipment complement of the tester consists of the test instrument, a sensor system with interchangeable coils and the coil cable.

Title

Separate instrument sheets are available for the sensor systems which can be used, and these instrument sheets have the following order numbers:

Part No.

Order No.

DEFECTOTEST Sensor systems M


- with magnetization

2.850 / 2.851 / 2.852

137 363 3

DEFECTOTEST Sensor systems P


- with permanent magnetization

2.855 / 2.856 / 2.857

138 134 2

DEFECTOTEST Sensor systems H


- without magnetization

2.859 / 2.860

137 365 0

DEFECTOTEST Sensor systems T


- for hot material

2.863

163 846 7

DEFECTOTEST Sensor systems S


- with segment coils

2.869 / 2.870

136 057 4

Non-FOERSTER sensor systems can be connected using an individually matched adapter box.
DEFECTOMAT CP/EP
Housing
Rugged metal housing for use under rough industrial
conditions. Enclosed design with heat-sink cooling
and rugged sealed keypad, enclosure IP 63. Compact 19" bench-top unit which can also be incorporated in a 19" equipment cabinet using a screw-on
mounting bracket.

The mains power supply panel, the monitor and the


hinge-out front keypad are located on the front side.
The memory card interface is situated behind the
door.

Signal evaluation

The rest of the evaluation process depends upon the


type of material and test: In the case of separate-item
(piece) testing and long material which is cropped af ter testing, the individual pieces are subdivided into
the result classes RO (flawless), R1 (defective class
1) and R2 (defective class 2). A part is defective R1
(or R2) if the number of flaws F1 (F2) has reached an
adjustable limit value F1 (F2). This assessment also
determines how the material is sorted.

switch-over is possible between assessment on


the basis of the number of flaws in the case
of separate items (pieces) and cropping and assessment on the basis of the flaw density or defective
SEUs. The flaw density is the quotient of flaw length
per section and section length. This assessment is
particularly suitable for applications in which high
flaw rates are anticipated, e.g. if it is intended to detect an increased surface roughness as F1 owing to
fluctuations relating to production conditions. By contrast, assessment on the basis of the number of flaws
is suitable for applications in which relatively low flaw
rates are anticipated, resp. on the basis of defective
SEUs.

In the case of continuous material and wire, sections


of adjustable lengths are assessed, where a

The figures and tables below show the various evaluation options by way of example.

Signal evaluation is performed in several stages: the


individual flaws are subdivided into flaw classes F1
and F2 on the basis of two trigger thresholds which
can be set mutually independently.

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1 Sektion
1 Section
10 KBE

rig.2

rig.2

rig.1

rig.1

Fig. 7 Piece or section in evaluation mode on the


basis of number of flaws
Example: 1 flaw F2, 1 flaw F1 (the large flaw
is not counted additionally as F1,
subtract method)

Fig. 8 Section in flaw density evaluation


The section length is subdivided into smallest evaluation units (SEU).
Example: 3 of 10 SEUs are defective F1
(the large flaw is counted as F1 too, normal
method), 1 SEU is defective F2.
F1 density = 30%,
F2 density = 10%.
Section and wire evaluation are analogous
to flaw number evaluation

Number of flaws

Set limit values

Assessment /
logging

Sorting
(3 troughs)

Sorting
(2 troughs)

Part1 (Figure 10)


F2 = 1
F1 = 1

F2 = 1
F1 = 2

R2

S2

S1

Part 2
F2 = 0
F1 = 3

R1

S1

S1

Part 3
F2 = 0
F1 = 1

R0

S0

S0

Table 1 Evaluation examples


Sorting is performed only in evaluation modes Pieces and Cutting

Number of defective sections

Set limit values

Quality number

Coil 1 R1 + R2 = 12

Q2 =10
Q1 = 5

Q2

Coil 2 R1 + R2 = 5

Q1

Coil 3 R1 + R2 = 4

Q0

Table 2 Evaluation examples


A quality number for the entire wire is also generated in evaluation mode wire.

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Logging
The instrument records both a short-term and a
long-term report. These reports contain the same
statistical evaluations but can be started mutually

independently. This permits batch and shift reports to


be kept simultaneously for instance.

Toptube Ltd.
Special products

P.O.Bo
Birmingham

DEFECTOMAT CP
V2.1

T E S T

WA 307 699 8
B 267 14 Z
40 x 25
ST507

Setting name

Setting B 267

300
56.0

Eval. Mode
Trig.1 %
Trig.2 %

|Y|
30
100

Froont mm
Tail mm
45
Coil

PI 625
>10%

Shift
Tester
Report No.

A
Testwell
1

125
100

50..80 LMD

Num.F1->R1
Num.F2->R2

StandardA
with retest at

5
1

Pieces

Length
m

F1

F2

123
98
24
1

73800
58800
14400
600

108
18
88
2

13
0
0
13

SUM
R0
R1
R2

2
Fig. 9

09.03.94 17:25

Order No.
Part No.
Dimensions
Material

Frequ kHz
Gain dB
Phase deg

R E P O R T

Example of a report printout for piece testing

1 You can freely define these texts. Example: Two-line company header and field with order data.
Using the external keyboard, you can both enter general fields of designations and enter the
current order data before each printout. If you do not have an external keyboard, you can have
the field designations entered at the works and you can enter the current order data by hand in
the printouts.
2 Parameter field as in the basic display on the screen
3 Result field as in the basic display on the screen
SUM = Number of tested pieces. R0, R1, R2 = Number of parts on the basis of result classes

SUM
RO
R1
R2

Sections
%

Length
m

F1

123 100%
98 80%
24 19%
1 1%

73800
58800
14400
600

108

F2

Sections

Wire

F1
%

F2
%

SUM 12 445500 10.8


Q0 10 371000
0
Q1
0
Q2
2 74500

1.3

13

SUM
RO
R1+2
R2

897
92%
8%
1%

Fig. 10 The result field, at left in Continuous with flaw number report and, at the right in Wire with flaw
density report. Q0, Q1, Q2 in the case of Wire= Number of wire on the basis of quality classes

2.842/49 - 2002/09

Screen and signal display


DEFECTOMAT EP
High-contrast, low reflection and low-glare 9" monitor
incorporating CRT with a resolution of 640 x 480 pixels (VGA) in grey-scale display.

its also move along with the signal.


Instruments with absolute channel display the differenti al and abs ol ute s i gnal s i n two
superimposed images.

DEFECTOMAT CP
TFT color display with VGA resolution

The parameter area shows selected parameters

The basic display is matched precisely to the information required in Test operating mode.

The result area shows the counts of the test re-

of the current instrument setting.

The event field contains a number of Event


lamps which signal important statuses and
events in the test sequence.

The signal area offers a real new feature: You


have your entire testing line in view!
The position of the sensor (D, Figure 11) is shown
at the left-hand edge of the screen. The signals
move to the right in synchronism with the pass of
the material under test from the sensor.
Marking guns (M) and, if applicable, the cutter as
well as the memory area of the signal are shown
in the correct position. In evaluation modes Continuous and Wire, markings for the section lim-

port, whereby you can switch over between display of the short-term report and display of the
long-term report.
All other information is displayed only if it is required.
This is carried out in the form of windows which are
displayed individually: Faults which occur open the
messages window which shows the cause in clear
text. The relevant input window is displayed at the
press of a key for data entry.

R1

S1

1.2 m/s
Frequ kHz
Gain dB
Phase grd

300
56.0
45

Eval.Mode
Trig.1 %
Trig.2 %

|Y|
30
100

Front mm
Tail mm

125
100

Coil 50...80 LMD


Num.F1->R1
Num.F2->R2

5
1

SUM
RO
R1
R2

12m
Pieces

Length
m

F1

F2

123
98
24
1

73800
58800
14400
600

108
18
88
2

13
0
0
13

Fig. 11 The standard display on instruments without absolute channel

2.842/49 - 2002/09

Front-panel keypad
Sealed keypad with menu, entry and special function
keys. Only a small number of operating controls is required thanks to the cleverly designed operating concept. These operating elements are clearly arranged
and have a clear, unequivocal function:

Each menu key calls a specific input window. Key


RUN closes an open window and returns you to
the basic menu.

The entry keys change parameter settings and


trigger functions. Precisely one function is assigned to each pair of keys in each input window,
e.g.:

Eval.Mode

V< > IYI


Input window

<

>

Pair of keys

Fig. 12 The front keypad


1 Entry keys, in pairs
2 Menu keys
3 COPY: Print screen contents
SPCL: Can be defined individually
(command or command sequence)

Operating structure

The operating method is based entirely on modern windowing techniques: Calling a specific input window with the appropriate menu key and
changing the parameter or triggering a function
with the related entry keys.

All operating functions are structured ergonomi-

SET

Gain dB
(0.0...71.9)

Eval.Mode

cally in line with user requirements:

The configuration window covers all parameters of the current instrument setting, subdivided into several pages on the basis of functional units. It is not generally required a great
deal after commissioning.
The setting window is available for adapting
the instrument setting to changing testing
tasks. It includes targeted selection from the
entire set of configuration parameters. You
can modify the works preselection individually
if you require.

56.5

V <> |Y|
Phase deg
(0...359)

45

Speed m/s
(12.0...15.0)
12.5
Sort. Test
S2 <> S1 <> S0 <> AUT
Mark. Test
OFF <> ON
RUN>CLOSE

Fig. 13 The setting window, standard assignment


on instruments without absolute channel

2.842/49 - 2002/09

All required functions can be operated with the

90

keys on the front keypad. In addition, the external


full-complement keyboard offers the option of
free text entries for designating instrument settings and for configuring the test log. It also provides qualified users with access to the instruments entire database.

The key-operated switch is used to preselect one


of five hierarchically structured interlock levels.
Each level enables a specific scope of functions
for operation.
Advantages:
Protection against unintentional modification
or deletion of data.
Targeted enabling of the scope of operating
functions depending upon qualification of the
operating staff.
Protection of the data against unauthorized
access.

Dialog language
One language is included in the scope of delivery,
either German, English, French, Italian or Spanish. Additional ones of these dialog languages are
available if required on additional Memory Cards
(1 Memory Card per language).

180

270

Fig. 14 The practically oriented operating concept


is rounded off by elegant details.
Example: Interactive setting of gain and
phase. Record comparison flaw, mark target position of the flaw signal with the adjustment arrow and press Accept - that is
all you need to do.
The instrument corrects the gain and
phase and immediately displays the stored
signal with the new setting.
1 = Trigger threshold 1
2 = Trigger threshold 2

Monitoring
Important instrument functions are monitored automatically. These include all internal supply voltages,
all sensor winders and various functions of the test
sequence. All fault signals and event signals and
messages are subdivided into seven categories on
the basis of urgency, from information on the test sequence through to malfunctions resulting from defects. Signals and messages as of a configurable category can trip an external alarm. An FIFO with capacity for 30 messages stores the clear-text messages
and outputs them on a connected printer.

Advantages:
Avoidance of incorrect settings, reliable reproduction of the instrument setting
Verifiable reproducibility of the test results determined
No need for extensive manual logging
Changes of instrument settings can be implemented within a very short time.

Internal Library

Individual software installation

Internal SRAM with buffer battery for storing maximal


24 instrument settings. This permits instrument settings to be optimized once for a specific testing task
and then reloaded for testing subsequent series.

Specific basic settings of the instrument can be


adapted to meet individual requirements. It is also
possible to define so-called option commands.
These are commands or sequences which are triggered automatically if a specific event occurs, e.g. if
the instrument is switched on or if the SPCL key is
pressed. These settings can be implemented at the
works if required. If you are appropriately qualified,
you yourself can enter these settings using the external keyboard.

All entries are clearly identifiable: You can enter a


clear-text designation on an external keyboard. The
time of archiving is entered as the identification automatically if no entry is made.

10

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Connections on the rear panel of the instrument:

X6
Video

Fig. 15 Instrument rear panel, connection terminals visible after detaching the cover

X1 Mains connection

115/ 230 V +10/-15 %, 50 - 60 Hz, 220 VA

X2 PRINTER

Socket DB 25 S, serial interface RS 232 C for text


and bitmap graphic printouts.

X3 REMOTE (with DEFECTOMAT CP)

Socket DB 25 S, serial interface RS 232 C for remote control of the instrument in asynchronous
full-duplex data transfer mode by a master control
computer. Universal mode of operation owing to
free read and write access to the instruments entire database.

X4 ANALOG

Socket DB 25 S for connection for a recorder, if applicable with interconnection of an external pulse
expander or for servicing purposes.

X5 TEST COIL

For connection of a test coil, 15-pin instrument


socket PT 02 A 14-15 S.

X6 VIDEO

For connection for a VGA monitor, in case of CP


with an optionally available monitor kit

Eingnge INPUTS

Control signals from the testing line


Terminal strip with strain relief and bus with
earthing contact
Ten inputs with optocouplers

Ausgnge OUTPUTS

Control signals to the testing line, flaw and fault signals for external monitoring
Terminal strip with strain relief and bus with
earthing contact
Ten outputs

2.842/49 - 2002/09

11

PCs and software for remote control


The DEFECTOMAT CP has a remote serial RS 232
C interface for linking to other computers. This interface offers the option of remotely controlling all functions on the DEFECTOMAT CP. Instrument settings

can be managed and all evaluation data can be retrieved. Ready-to-use systems with PCs and appropriate software are available for specific applications.

MEMORY CARD
The standard scope of delivery includes 1 Memory
Card with 256 KByte. It contains the installation
data set valid for the individual instrument, i.e. all
project-specific non-recurrent settings such as absolute channel yes/no, installation data for inputs
and outputs and so forth and all menu texts in the
selected dialog language.

Additional Memory Cards can be used for the following purposes:


Loading changing dialog languages e.g. output of
the test report in the language of the end user.
Saving the entire database as a backup for transfer to a standby instrument or for downloading after servicing work.

Options for the test instrument


ABSOLUTE CHANNEL
19" INSTRUMENT HOUSING, 12 HU1

Its use is reasonable for instance in the case of weld


seam testing for detecting long not welded sections
(see Figure 9). It contains a tracking of the zero compensation which is not effective during a transition of
the thresholds.

for accomodating the instrument, the external keyboard and the printer, see separate leaflet, Order-No.
145 001 8

Function modul EN 1971

ADAPTERS

For DEFECTOMAT CP , special defect evaluation


procedure acc. To European Norm EN 1971 for
EC-testing of copper tubes

for replacing a DEFECTOMAT C/E by the


DEFECTOMAT CP/EP. The inputs are plugs compatible to the DEFECTOMAT C, the output cables
are equipped with pin sleeves for clamping at the
DEFECTOMAT CP

KEYBOARD EXTERNAL
Keyboard AK 102 complete with 1 m connecting
cable
Full alphanumeric keyboard
Permits all functions as with the front keypad
Also enables text inputs for the designation of instrument settings and for designing the descriptive part of the test report
Allows, too, the access to the complete database
of the instrument for servicing and programming
work

ADAPTER DMAT CP Marking

Order No. 147 179 1


ADAPTER DMAT CP Test piece sensor
Order No. 147 180 5
ADAPTER DMAT CP Control
Order No. 147 181 3

Printer and printer accessories


MATRIX NEEDLE PRINTER (ESC/P)

DESKJET INK PRINTER (HPGL)

For direct connection with serial interface RS 232 C,


by periphery cable 2.5 m, (Order No. 119 150 0),
male plug, 25-pole on both sides

For connection by printer cable 2 m (Order No. 018


719 4), including an interface converter from RS 232
C to parallel interface (Centronics).

1 Height unit, 1 HU = 44.5 mm

12

2.842/49 - 2002/09

Components for the testing line


MARKING CABLE 10M

MOTION TRANSDUCER

Clamped at the instrument, plugged at the mark-

For generating displacement-proportional timing

ing gun

One cable is required per marking gun

pulses (1 pulse per mm) independent from the


test speed. Runner circumference 500 mm
PULSE WHEEL CABLE 10M

TEST PIECE SENSOR CABLE 10M

Clamped at the instrument, plugged at the test

Clamped at the instrument, plugged at the pulse


wheel

piece sensor

Cable contains lines for two light barriers


TEST PIECE SENSOR
Reflex light barrier with reflector for measuring the
test piece speed. The second light barrier required
for this purpose is the test piece sensor right or test
piece sensor left installed at the sensor. This second
one also serves for the connection of the test piece
sensor.

STAND

For holding the displacement transducer with


stepless height preadjustment
LIFT-OFF DEVICE

Pneumatic/electrical, for automatically placing


down and lifting the displacement transducer
onto and off the test piece. Must be controlled by
the external feeding conveyor controller.

Magnetizing power supply in the case of using a sensor system with magnetization
Magnetizing power supplies for powering the magne tization yokes contained in the sensor systems M are
available in two versions:
YOKE CURRENT BOX, Order No. 101 345 9

YOKE CABLE 10M

For permanent installation and permanent con-

With clamp terminals at the housing end and plug

nection by the customer

terminals at the yoke end.

Magnetization current switchable in six steps


Operation with pre-amplifier/impedance transformer 2.845.01-1004 and long test cable
There is no need for an external attenuator. The attenuator function is integrated into DEFECTOMAT
CP/EP

2.842/49 - 2002/09

(adjustable by jumper without/with pre-amplifier/impedance transformer).

13

Technical data
Sensor power supply
Test frequency

Excitation voltage
Sensors
which can be connected
Differential channel
Signal coupling

1, 3, 10, 30, 100, 300, 1000 and 3000 kHz or


3, 6, 10, 15, 20, 30, 60, 100 kHz
10 Vrms, output resistance 7.5 W
all FOERSTER coil types (LMD, HMD, HD and Segment),
probes, non-FOERSTER sensors can be connected via external
adapter box
Dynamic

High-pass filter, Low-pass filter

follow-up filter, filter severity adjustable, 25-stage

Gain

dynamic range from 0.0 to 71.9 dB in 0.1 dB steps

Phase setting

0 to 359, 1 increments

Evaluation mode

Instantaneous value evaluation of the vector or of the Y component, switchable

Trigger thresholds

2 thresholds, can be set between 10 and 100% in 5 % steps, additionally fixed 100% allround threshold in the case of Y-component evaluation

Absolute channel (option)


Test frequency

linked to the differential channel

Signal coupling

static

Gain

dynamic range from 0.0 to 54.0 dB in 0.5 dB steps

Zero compensation

automatic at the press of a button; automatic tracking of zero


compensation, which is not effective during a transition of the
thresholds. The complete function can be switched off.
vector evaluation

Evaluation mode
1 threshold, can be set between 10 and 100% in 5% steps
Trigger threshold
Display
Monitor

Signal displays

Signal evaluation
Evaluation methods
Statistics

14

8.4" TFT color display with DEFECTOMAT CP or


9" CTR raster-scan, grey-scale display with DEFECTOMAT EP
resolution 640 x 480 pixels, 25 lines of 80 characters per line in
Text mode,
motion-synchronous display in recorded mode and playback of a
stored length section in the impedance plain, switchable, scale of
motion-synchronous display can be set between 0.6 and 18000
m in steps of 1.2/ 1.8/ 3.0/ 4.5/ 6.0/ 9.0 per decade (the low scale
values are possible only at low test speeds); length of the impedance memory 0.1 to 12.0 m, adjustable
Pieces, Wire, Continuous and Cutting, switchable
in Pieces and Cutting modes, on the basis of number of flaws per
part, in Wire and Continuous mode, on the basis of number of flaws,
flaw density per section, or on the basis of SEUs per section

2.842/49 - 2002/09

Marking

2 marking classes

Sorting

3 sorting classes

Test speed

1 m/min to 120 m/s; up to 30 m/s with absolute channel

Interfaces

RS 232 C for printer


RS 232 C for master control computer control signals from and to
the testing line via terminals, analog output for external signal recording, input for external keyboard, VGA display connection

Housing
Dimensions
Enclosure
Colour

19", 4 HU, H x W x D = 187 x 437 x 501 mm


IP 63, complying with IEC 529/ DIN 40 050/52/53
RAL 7001

Mains connection

115/230 V +10/-15 %,
50 - 60 Hz, 220 VA

Mass

28 kg

Permitted ambient temperature

+5 to +40 C

Relative humidity

max. 85%, condensation not permitted

Ordering Instructions
Designation

Part-No.

Order-No.

2.842.82

1495356

2.842.01-1905
2.842.01-1001-27
2.842.01-1001-26
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1658670
1495909
1495712
1239970
1452738
1481525
1451189
1665405
1665413

2.842.83

1495364

2.842.01-1905
2.842.01-1001-25
2.842.01-1001-26
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1658670
1373870
1495712
1239970
1452738
1481525
1451189
1665405
1665413

STANDARD FUNCTIONAL SETS DEFECTOMAT CP

DEFECTOMAT CP, F=1-3000KHZ


consisting of:
BASIC INSTRUMENT DEFECTOMAT CP
HF-SECTION, F=1...3000KHZ
LF-SECTION
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

DEFECTOMAT CP, F=3-100KHZ


consisting of:
BASIC INSTRUMENT DEFECTOMAT CP
HF-SECTION, F=3...100KHZ
LF-SECTION
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

2.842/49 - 2003/06

15

Designation

Part-No.

Order-No.

DEFECTOMAT CP, F=1-3000KHZ, ABSOLUTKANAL


consisting of:
BASIC INSTRUMENT DEFECTOMAT CP
HF-SECTION, F=1...3000KHZ
LF-SECTION
ABSOLUTE CHANNEL
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

2.842.92

1650912

2.842.01-1905
2.842.01-1001-27
2.842.01-1001-26
2.842.01-1001-19
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1658670
1495909
1495712
1452720
1239970
1452738
1481525
1451189
1665405
1665413

2.842.93

1650920

2.842.01-1905
2.842.01-1001-25
2.842.01-1001-26
2.842.01-1001-19
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1658670
1373870
1495712
1452720
1239970
1452738
1481525
1451189
1665405
1665413

2.842.88

1650939

2.842.31-8001
2.842.01-1905
2.842.01-1001-25
2.842.01-1001-26
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1522760
1658670
1373870
1495712
1239970
1452738
1481525
1451189
1665405
1665413

DEFECTOMAT CP, F=3-100KHZ, ABSOLUTKANAL


consisting of:
BASIC INSTRUMENT DEFECTOMAT CP
HF-SECTION, F=3...100KHZ
LF-SECTION
ABSOLUTE CHANNEL
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

DEFECTOMAT CP, F=3-100KHZ, EN1971


consisting of:
FUNCTION MODULE EN-1971, UP-DATE V1.2
BASIC INSTRUMENT DEFECTOMAT CP
HF-SECTION, F=3...100KHZ
LF-SECTION
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

16

2.842/49 - 2002/09

Designation

Part-No.

Order-No.

DEFECTOMAT EP, F=3-100KHZ


consisting of:
BASIC INSTRUMENT DEFECTOMAT EP
HF-SECTION, F=3...100KHZ
LF-SECTION
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

2.849.83

1642030

2.849.01-1901
2.842.01-1001-25
2.842.01-1001-26
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1650815
1373870
1495712
1239970
1452738
1481525
1451189
1665405
1665413

DEFECTOMAT EP, F=3-100KHZ, ABSOLUTKANAL


consisting of:
BASIC INSTRUMENT DEFECTOMAT EP
HF-SECTION, F=3...100KHZ
LF-SECTION
ABSOLUTE CHANNEL
TEST LINE INTERFACE
CPU
GRAPHIC
OUTPUT MODULE, RELAIS
OPERATING INSTRUCTIONS GERMAN, DEFECTOMAT CP/EP
OPERATING INSTRUCTIONS ENGL., DEFECTOMAT CP/EP

2.849.93

1642057

2.849.01-1901
2.842.01-1001-25
2.842.01-1001-26
2.842.01-1001-19
2.842.01-1001-23
2.842.01-1001-18
2.842.01-1001-29
2.842.01-1001-17
2.842/2.849 DMCP2.0 UA06/DE
2.842/2.849 DMCP2.0 UA06/EN

1650815
1373870
1495712
1452720
1239970
1452738
1481525
1451189
1665405
1665413

STANDARD FUNCTIONAL SETS DEFECTOMAT EP

2.842/49 - 2002/09

17

Should you have any special problems please contact:


Division TS
Test systems for semi finished
products
Postfach 15 64
D-72705 Reutlingen
In Laisen 70
D-72766 Reutlingen
Phone +49 (0) 7121/140-270
Fax
+49 (0) 7121/140-459
e-mail ts@foerstergroup.de

or one of our agencies abroad


Information and illustration may
be subject to change

Order-No. 165 946 4


Edition
06/2003
Author
Haditsch

Division CT
Test systems for component testing
Joseph-von-Fraunhofer-Str. 15
D-44227 Dortmund
Phone +49 (0) 231/97 50 49-0
Fax
+49 (0) 231/97 50 49-8
e-mail ct@foerstergroup.de

N DI NG
!
R
E
T
S cturer
ER
FO an manumfaent with

OUTS

INSTITUT DR. FOERSTER


GmbH & Co. KG
Postfach 15 64
D-72705 Reutlingen
In Laisen 70
D-72766 Reutlingen
Phone +49 (0) 7121/140-0
Fax
+49 (0) 7121/140-488
www.foerstergroup.de

TA

DQS

-RE

G.N

O1

159

-01

uip
rm
t G e rent e q
firs
r
the dy cu
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ISO

900

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