Aa MOSPEC
‘Switchmode Power Rectifiers
Designed for use in switching power supplies. inverters and
as freewheeling diodes. These state-of-the-art devices have
the following features:
* High Surge Capacity
* Low Power Loss, High efficiency
* Glass Passivated chip junctions
+ 150°C Operating Junction Temperature
* Low Stored Charge Majority Carrier Conduction
+ Low Forward Voltage High Current Capability
* Utrafast 50 & 75 Nanosecond Recovery Time
SF57 thru SF510
ULTRA FAST
RECTIFIERS.
5.0 AMPERES
‘500-1000 VOLTS.
* Plastic Material used Carries Underwriters Laboratory —a——
Flammability Classification 94V-O
MAXIMUM RATINGS Do-20180
(Characteristic ‘Symbol | SF57 | SF58 | SF59 | SF510| Unit _
Peak Repetitive Reverse Voltage Vent .
Working Peak Reverse Voltage 500 | 600 | 800 | 1000 | v Calle
DC Blocking Voltage
RMS Reverse Voltage 350 | 420 | s60 | 700 | v
[Average Rectitier Forward Current 5.0 A
Non-Repettive Peak Surge Current A
(Surge applied at rate load conditions 75
halfware, single phase,60Hz )
IM [MILLMETERS
(Operating and Storage Junction Ts Tag ec | | jPM re
Temperature Range ~65 to + 150 | Min [MAx.
— a | 800) 560
8 | 2540 —
c | 850) 950
ELECTRICAL CHARACTERISTICS o | tz) s20
[ Characteristic ‘Symbol | SF57 | SF58 | SF59 | SF510 | Unit
Maximum Instantaneous Forward Vv
Voltage cASE—
(i,=5.0 Amp, Te =25 °C) 1.50 1.78 ‘Transfer molded
Maximum Instantaneous Reverse WA Plastic
| 50 POLARITY—
*o Catnode indicated
= polarity band
Reverse Recovery Time ne
(p= 0.58, I=. by 50 18
Typical Junction Capacitance PF
(Reverse Voltage of 4 volt & f=1 MHz) 30 5SF57 Thru SF510
NSTANTBNEDUSFORUARD CURRENT rp)
INSTAWTAKECUS REVERSE CURRENT ut)
FIG-1 TYPICAL FORWARD CHARACTERISTICS
— sn
erat =
rt
FORWARD VOLTAGE (ae)
FIG-2 TYPICAL REVERSE CHARACTERISTICS
a a eT )
PERCENT CFPEAC REVERSE VOLTAGES)
yon ip
Aeprex Generate
‘ios
orcitoseope Tsp
‘ates
2.Rine Times fonemax input mpeanes =2004
16-3 FORWARD CURRENT DERATNG CURVE
FIG TYPICAL JUNCTION CAPACITANCE
15 PEAK FORWARD SURGE CURRENT
Fig-6 Reverse Recovery Time Characteristic and Test Circuit Diagram