Standard Flaw Probes - Overview

GE Inspection Technologies
Bill Dunlap, Global Product Manager - Probes
September 2004
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Typical Probe Construction

Monolithic Probe

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Piezocomposite Probe

Properties of Probes
The thickness and acoustic velocity of the piezoelectric
element determine the frequency of the probe.
A better acoustic match to test material or coupling medium
allows energy to couple into the load more efficiently. Echo
signals will be correspondingly larger in amplitude and
shorter in duration.
Common ceramic (element) types include Lead Zirconate
Titanate (PZT), Lead Metaniobate (LM), and Piezocomposite.
FACE LAYER is selected to maximize energy transfer out
of the transducer into the coupling medium.
BACKING (damping) shortens pulse length by absorbing
energy from the ceramic; therefore it must match the acoustic
impedance of the ceramic.
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Three Series Different Performance

Gamma Series
> Best combination of sensitivity and
resolution
> Medium Bandwidth, 30% to 50%
> Waveform 3 to 4 cycles typical
Applications
> General purpose, most commonly
used probes
> Suitable for most applications
requiring both sensitivity and
resolution

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Three Series Different Performance

Alpha Series
> Very highly damped
> Lower sensitivity
> Broadband, 50% to 100%
> Short pulse 1 to 2 cycles
Applications
> Applications where resolution is
primary concern
> Thickness measurement
> Near-surface flaw detection
> Delamination in layered materials,
e.g. composites
> Flaws in thin materials
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Three Series Different Performance

Benchmark Series
> Piezocomposite - newer technology
> Best penetration (depth range)
> High signal to noise ratio
> Very high sensitivity
> Usually better resolution than
Gamma
> Best match to plastics and liquids
Applications
> Angle beam inspection of welds
> Inspection of plastics
> Inspection of composites
> General immersion applications
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Contact Probes, Hard Face RHP, XLC

Features and Benefits
> RHP: hard ceramic face
> XLC: super hard carbide face
> Best match to metals
> Element sizes (mm): 13, 19, 25
> Comfortable grip
> Gamma or Alpha Series
> BNC connector, CR and CS
Applications
> General purpose for larger parts
with simple geometry
> Manual inspection of plate, large
forgings, billets, castings, etc.
> Delaminations
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RHP: Rugged High Performance

XLC: Extended Life Contact

Contact Probes, Hard Face F

Features and Benefits
> Hard ceramic face
> Best match to metals
> Element sizes (mm): 6, 10, 13
> Gamma, Alpha, or Benchmark
> Knurled housing Gamma, Alpha
> Plastic grip Benchmark
> Microdot connector
Applications
> General purpose for manual flaw
detection and thickness gauging
> Curved parts pipe and tube,
tanks, bars, small forgings, etc.
> Delaminations
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F: Fingertip

Contact Probes, Delay Line DFR

Features and Benefits
> Alpha series, highly damped
> Improves near surface resolution
for manual contact inspection
> Long life replaceable delay line
> May be contoured for curved parts
> Element sizes (mm): 3, 6, 13
> Microdot connector
Applications
> Thickness measurement
> Detection of near surface flaws
> Composite materials
> Bond line inspection
> Tubing and other curved parts
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DFR: Delay Fingertip Removable

Contact Probes, Delay Line K-Pen

Features and Benefits
> High resolution pencil probe
> 7.5 MHz and 20 MHz
> Very small contact area
> Interchangeable delay lines
> 1.7mm and 2.3mm tip diameters
> Straight, 90, and 45 models
> Straight has removable handle
> Microdot connector
Applications
> Measure thickness on tightly
curved surfaces
> Turbine blades
> Wall thickness inside pit or small
indentation
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Contact Probes, Delay Line ZIP Probes

Features and Benefits
> Highly damped, low frequency
> Delay line matched to composites
and plastics
> Very high near surface resolution
> High penetration (low frequency)
> Three models:
450 KHz, 25mm element
1.5 MHz, 13mm element
2.25 MHz, 10mm element

> Microdot and BNC connectors

Applications
> Composite testing
> Flaw detection and thickness of
plastic materials
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ZIP: Zero Interface Probe

ZIP = Zero Interface Probe

With uncoupled probe,
delay tip echo is
displayed.
Composite

When coupled, delay tip

echo amplitude drops
significantly. Displayed
echo is backwall from 0.76
inch composite sample.

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Composite

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Thin Section Measurement

Acoustic matching
allows thin sections to be
measured at low
frequency.

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ZIP Probe Benefits

Low frequency (0.45 to 2.25 MHz) for
maximum penetration
Highly damped for high resolution and sharp
A-scan image
Acoustically matched to minimize or eliminate
dead zone from delay tip

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Contact Probes, Protective Face PFC

Features and Benefits
> Gamma series, general purpose
> Use 1 probe with 3 different
protective faces:
Membrane
Nylon wear cap
High temperature delay line

> BNC connector, CR and CS

Applications
> General purpose for larger parts
with simple geometry
> Plates, billets, bars, forgings
> Inspection at high temperature
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PFC: Protective Face Combination

Contact Probes, Protective Face PM

Features and Benefits
> Gamma series, general purpose
> Soft membrane improves coupling
to rough, uneven or curved surfaces
> BNC connector, CR and CS
Applications
> General purpose for larger parts
uneven surfaces
> Plates, billets, bars, forgings
Recommendation
> B..S and MB..S from Kln are
superior for most applications
requiring membrane probes
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PM: Protective Membrane

Angle Beam Probes SWS

Features and Benefits
>Refracted shear (transverse) wave
>Gamma or Benchmark series
>Sizes (mm): 13, 13x25, 19x25, 25
>Interchangeable wedges for steel, 45,
60, 70 and 90 shear wave
>Custom wedges available:
Contoured, longitudinal wave, high
temperature to 200C, other metals

>BNC connector
Applications
>General weld inspection, larger objects
>Pipes, tanks, axles, forgings, castings,
bridges, structures, etc.
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SWS: Shear Wave Standard

Angle Beam Probes MSW-QC

Features and Benefits
>Refracted shear (transverse) wave
>Gamma, Benchmark, or Alpha series
>Element diameters (mm): 6, 10, 13
>Interchangeable wedges for steel, 45, 60, 70
and 90 shear wave
>Custom wedges available:
Contoured, longitudinal wave, other metals
>Quick change wedge design
>Microdot connector
Applications
>General weld inspection, smaller or thinner MSW-QC: Miniature Shear Wave
Quick Change
objects
>Tubes, pipes, tanks, pumps, valve housings,
turbine blades, etc.
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Angle Beam Probes ABFP

Features and Benefits
>Refracted shear wave, integral wedge
>Gamma series
>Element sizes (mm): 5x5, 6x6
>Microdot connector
Applications
>Tubes, pipes, tanks, pumps, valve
housings, turbine blades, etc.
>Pipe seam welds
>Aluminum airframe
Recommendation
>Use MWB or MWK from Kln where
possible
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ABFP: Angle Beam

Fingertip Potted

Angle Beam Probes SMSWS

Features and Benefits
>Refracted shear (transverse) wave
>Gamma series
>Very small, 3mm element diameter
>Interchangeable wedges for steel, 45,
60, 70 and 90 shear wave
>Custom wedges available:
Contoured, longitudinal wave, other metals

>Miniature microdot connector

Applications
>Angle beam testing of very small or
very thin parts
>Tubes, thin wall containers, turbine
blades, etc.
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SMSWS: Sub-Miniature
Shear Wave
Straight

Dual Element Probes ADP, RC

Features and Benefits
>Separate transmit and receive elements
improves near surface resolution
>Small, fingertip size; element diameters
6mm, 10mm and 13mm
>Couples well on rough or curved surface
>Reduces noise due to scattering
>Can be contoured for curved parts
>ADP has potted cable
>RC has 4-pin LEMO connector
Applications
>Wall thickness, corrosion, erosion
>Small, near surface flaw detection
>Small parts, e.g., screws, bolts, pins, etc.
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ADP: Advanced Dual Potted

RC: Replaceable Cable

Dual Element Probes High Temperature

Features and Benefits
>HT400A can be used with flaw detectors
for inspection of hot materials up to
500C, intermittent contact
>KBA560V can be used with flaw
detectors for inspection of hot materials
up to 400C, intermittent contact
Applications
>General thickness, corrosion and erosion
on hot parts
>Near surface flaw detection on hot parts

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HT400A
KBA560V

Dual Element Probes DU, DU-F

Features and Benefits
>Separate transmit and receive elements
improves near surface resolution
>Reduces noise due to scattering
>Can be contoured for curved parts
>DU replaceable delays - long service life
>DU-F fixed delays and piezocomposite
elements - maximum sensitivity
>Microdot connectors
Applications
>Railroad wheels
>Core flaws in shafts, bars, billets, etc.
>Corrosion, erosion
>Coarse grain materials
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DU

DU-F

Immersion Probes ISS, IS

Features and Benefits
>Acoustically matched for best efficiency
in water
>Gamma, Alpha, or Benchmark Series
>Element sizes (mm): 6, 10, 13, 19, 25
>Can be focused to a point (spherical) or
to a line (cylindrical)
>Waterproof UHF connector
Applications
>Parts with irregular geometry
>Automated scanning
>On-line thickness measurement
>High speed flaw detection in pipe, tube,
plate, bar, etc.
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ISS: Immersion Straight Slim

IS: Immersion Straight

Immersion Probes IPS, IR

Features and Benefits
>Gamma or Alpha Series
>Element sizes (mm): 6 (IPS, IR); 10, 13
(IR only)
>Can be focused to a point (spherical) or
to a line (cylindrical)
>IR has Waterproof UHF connector
>IPS has non-waterproof microdot
Applications
IPS: Immersion Pencil Straight
IR: Immersion Right Angle
>Parts with irregular geometry
>Automated scanning
>On-line thickness measurement
>High speed flaw detection in pipe, tube,
plate, bar, etc.
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Two Types of Focused Probes

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Advantages of Focusing

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Advantages of Focusing

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Advantages of Focusing

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Advantages of Focusing

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Focal length in steel is that in water

due to higher velocity.

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Focusing
Single-element transducers are often focused to narrow the
beamwidth for better lateral resolution in the focal zone
(poorer resolution beyond).
This is accomplished using a lens which curves the
wavefront.

Converging
Region
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Diverging
Region

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Nearfield / Farfield
The sound field cannot be focused beyond the Nearfield
distance.
Longer focus requires higher frequency or larger element
to extend the nearfield.
2

D
N =
4
Farfield

Nearfield
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Practical Limits on Focal Length

1. You cannot focus longer
than the near field point of
the probe.
2. You cannot focus shorter
than the mechanical limit
for lens curvature.

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Probes For Every (?) Application

Contact
Angle Beam

Dual - thin sections...

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Immersion
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