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Role of Bisomth and Silicon On SGI PDF
Role of Bisomth and Silicon On SGI PDF
176 to 185
#2010 The Japan Institute of Metals
1.
Introduction
Eect of Silicon and Bismuth on Solidication Structure of Thin Wall Spheroidal Graphite Cast Iron
Table 1
C
177
Si
Mn
Cr
Cu
Zn
Pig iron
4.22
0.099
0.027
0.029
0.015
0.032
Electrolytic iron
0.02
<0:005
0.0001
<0:001
0.009
0.002
0.001
0.002
Fe-Si alloy
0.028
75.93
0.022
0.010
2.
0.55
0.67
0.67
0.66
0.79
0.79
0.79
0.97
0.97
0.97
0.61
0.64
0.045 4.45
0.92
0.94
Measuring point
150
Mg
Bi
R
R thermocouple
thermocouple
50
50
50
50
0.56
0.53
Mn
10
Si
250
Si/C
200
CE
No.
75 75
200
CE=C+Si/3+P/3
Experimental Procedure
350
Fig. 1
the same CE values. It is known that the Si/C mass ratio has
a correlation with the tensile strength and hardness.14,15)
Specimens No. 5 and No. 6 shown in Table 2 were used
for experiment B. In experiment B, the carbon content was
set to 3.4 mass% (constant), the Si content was set to 2.2 and
3.2 mass%; the CE was 4.1 (hypoeutectic composition) and
4.4 (hypereutectic composition).
Melt was poured into the CO2 mold shown in Fig. 1 at
1673 K to obtain the stepped specimens plates with 2, 3, 5 and
10 mm thicknesses (50 mm width 150 mm length). In
experiment B, R thermocouples were inserted in the center
of the cavity and the thermal analysis of the melt was carried
out. To obtain a high heat sensitivity, the tip of the
thermocouple was exposed.
The microstructure in the center part of the specimen
(in the vicinity of the tip of the thermocouple) was observed.
The graphite spheroidization ratio, the graphite particle
diameter, the graphite nodule count and area fractions of the
graphite, ferrite and pearlite were measured by an image
analyzer. To obtain the mean values of these parameters, 10
optical micrographs were used for the measurement. These
values of the specimens generating chill were excluded.
Graphite particles with a diameter less than 1 mm were also
178
eutectic solidication of the melt and eutectoid transformation process by the addition of Bi were examined. The
measurement points in the thermal analysis are shown in
Fig. 2.
TP
3.
TEU
TES
TEE
TEM
ET
TEDS
TEDE
Thickness
t/mm
10
Specimen
No.1-1
(a)
(b)
(c)
(d)
Chill
3.75 mass%C
2.10 mass%Si
Si/C =0.56
No.2-1
(e)
(f)
(g)
(h)
(i)
(j)
(k)
(l)
(m)
(n)
(o)
(p)
3.63 mass%C
2.45 mass%Si
Si/C =0.67
No.3-1
3.54 mass%C
2.81 mass%Si
Si/C =0.79
No.4-1
3.31 mass%C
3.21 mass%Si
Si/C =0.97
Fig. 3
100 m
Microstructure of specimens without Bi (0 mass%Bi) and various C and Si contents at CE4.4 (Nital etched).
Eect of Silicon and Bismuth on Solidication Structure of Thin Wall Spheroidal Graphite Cast Iron
Thickness
t/mm
179
10
Specimen
No.1-3
(a)
(b)
(c)
(d)
(e)
(f)
(g)
(h)
(i)
(j)
(k)
(l)
(m)
(n)
(o)
(p)
3.76 mass%C
2.06 mass%Si
Si/C =0.55
No.2-3
3.62 mass%C
2.38 mass%Si
Si/C =0.66
No.3-3
3.52 mass%C
2.78 mass%Si
Si/C =0.79
No.4-3
3.33 mass%C
3.22 mass%Si
Si/C =0.97
100 m
Fig. 4 Microstructure of specimens with 0.01 mass%Bi and various C and Si contents at CE4.4 (Nital etched).
180
25
15
10
0.67
0.79
0.97
0.53
0.55
0.67
0.79
0.97
0.66
0.79
0.97
5
6 8 10
4
Thickness, t /mm
8 10
6
4
Thickness, t /mm
8 10
6
4
Thickness, t /mm
12
Relationship between the graphite particle diameter and the thickness of the specimens containing various amounts of Bi, C and Si.
800
(a) 0mass% Bi
600
(b) 0.005mass%Bi
Si/C
(c) 0.01mass% Bi
Si/C
Si/C
0.56
0.53
0.55
0.67
0.79
0.67
0.66
0.79
0.79
0.97
0.97
0.97
400
200
4
8 10
6
Thickness, t/mm
4
8 10
6
Thickness, t/mm
4
8 10
6
Thickness, t/mm
12
Relationship between the graphite nodule count and the thickness of the specimens containing various amounts of Bi, C and Si.
(a) t =3mm
0mass%Bi
(b) t =3mm
0.01mass%Bi
60
Area fraction (%)
Si/C
Si/C
Si/C
100
80
(c)
( 0.01mass%Bi
20
0
Fig. 5
(b) 0.005mass%Bi
(a) 0mass%Bi
40
Graphite
20
Ferrite
3.2
Perlite
0
(c) t =10mm 0mass%Bi
80
(d) t =10mm
0.01mass%Bi
60
40
20
0
0.5 0.6 0.7 0.8 0.9
Si/C
Fig. 7 Eect of Bi content and Si/C mass ratio on area fraction of graphite,
ferrite and pearlite (thickness (t); 3 and 10 mm).
Eect of Silicon and Bismuth on Solidication Structure of Thin Wall Spheroidal Graphite Cast Iron
181
100 m
Fig. 8 Microstructure of specimens No. 5 and No. 6 (thickness (t) = 10 mm) (Nital etched).
Table 3 The graphite spheroidization rate, the graphite particle diameter, the graphite nodule count and the area fraction of the matrix
structure of the specimens No. 5 and No. 6.
No. 5 (CE 4.1)
Specimen
No. 5-1
No. 5-2
No. 6-1
No. 6-2
0 mass%Bi
0.01 mass%Bi
0 mass%Bi
0.01 mass%Bi
Thickness mm
10
10
10
10
82.3
81.5
80.2
80.1
81.4
82.8
82.4
81.8
80.3
82.3
81.1
80.4
15.2
18.4
13.8
16.7
10.0
12.1
13.6
16.5
9.2
10.4
12.1
13.8
344
187
426
227
1025
883
482
298
1179
1028
639
346
Graphite
10.6
11.6
11.6
10.4
12.2
12.3
11.1
11.4
12.4
11.5
10.7
10.2
Pearlite
57.8
54.1
53.9
52.9
19.5
10.3
11.2
10.6
18.9
10.9
9.4
8.9
Ferrite
31.6
34.3
34.5
36.7
68.3
77.4
77.7
78.0
68.7
77.6
79.9
80.9
Area fraction %
Temperature, Tem /K
1600
1500
1400
1300
TP
eutectic
TES
TEM
TEE
TES
(a) No.5
(CE 4.1, Si/C 0.6)
eutectic
(b) No.6
(CE 4.4, Si/C 0.9)
TEM
Bi 0mass%
Bi 0.01mass%
TEE
Bi 0mass%
Bi 0.01mass%
TEU
TEU
1200
TEDS
TEDS
TEDE
1100
TEDE
1000
eutectoid
eutectoid
900
800
0
100
200
300 400
Time, T/s
Fig. 9
500
600
100
200
300 400
Time, T/s
500
600
182
Temperature, Tem /K
1440
(b)
1420
1400
1380
1360
Bi,mass%
1340
1320
TES
TEE
Bi,mass%
0.01
0.01
10
20
30
Cooling rate, K/s
40 0
TES
TEE
10
20
30
Cooling rate, K/s
40
Fig. 10 Eect of Bi content and cooling rate on temperature of eutectic start (TES) and end of eutectic solidication (TEE).
Table 4 The average cooling rate (K/s) to temperature of the eutectic start
vs. specimen thickness.
Specimen
No. 5
No. 6
Bi content
mass%
Thickness
2 mm
3 mm
5 mm
10 mm
35.2
10.7
5.0
2.0
0.01
37.8
15.9
5.1
2.1
37.5
17.9
9.6
4.7
0.01
40.0
18.8
11.7
5.7
Eect of Silicon and Bismuth on Solidication Structure of Thin Wall Spheroidal Graphite Cast Iron
183
0 mass%Bi
0 mass%Bi
0.01 mass%Bi
0.01 mass%Bi
80
60
40
20
0
0
4
6
8 10
Thickness, t/mm
12 0
4
6
8 10
Thickness, t/mm
12
Temperature, Tem /K
1200
(a) No.5 (CE 4.1, Si/C 0.6)
1150
1100
1050
1000
950
900
Bi,mass% TEDS
850
800
0
TEDE
Bi,mass%
0 Bi
0 Bi
0.01Bi
0.01Bi
10
Thickness, t/mm
12 0
TEDS
TEDE
10 12
Thickness, t/mm
Fig. 12 Eect of Bi content and thickness of specimen on the temperature of eutectoid start (TEDS) and end of eutectoid transformation
(TEDE).
184
SEI
Bi
Fig. 13 Secondary electron image and X-ray images of C and Bi in the spheroidal graphite in the specimen containing Bi. (specimen
No. 5-2)
SEI
Bi
Mg
Si
La
Ce
Fig. 14 Secondary electron image and X-ray images of Bi, S, Mg, Si, O, La and Ce in a compound in the center of the spheroidal graphite
shown in Fig. 13.
2
3
Conclusions
Eect of Silicon and Bismuth on Solidication Structure of Thin Wall Spheroidal Graphite Cast Iron
185