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    This document summarizes several academic papers on topics related to pattern recognition, feature selection, welding defect characterization, machine knowledge representation, and EEG signal classification. Specifically, it mentions papers from 1973, 1975, 2008, and one from 1980. It also lists authors such as Josef Kittler, Peter C. Young, E. RasekaaSiemens AG, A.P. Vieira, E.P. de Moura, L.L. Gonçalves, J.M.A. Rebello, and Daniel Kayser. The final entry is an IEEE paper from Garrett, Peterson, Anderson, and Thaut on comparing linear, nonlinear, and feature selection methods for EEG signal classification.

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    This document summarizes several academic papers on topics related to pattern recognition, feature selection, welding defect characterization, machine knowledge representation, and EEG signal classification. Specifically, it mentions papers from 1973, 1975, 2008, and one from 1980. It also lists authors such as Josef Kittler, Peter C. Young, E. RasekaaSiemens AG, A.P. Vieira, E.P. de Moura, L.L. Gonçalves, J.M.A. Rebello, and Daniel Kayser. The final entry is an IEEE paper from Garrett, Peterson, Anderson, and Thaut on comparing linear, nonlinear, and feature selection methods for EEG signal classification.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as DOCX, PDF, TXT or read online from Scribd
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    9 views2 pages

    Needed Papers

    Uploaded by

    naveen6018
    This document summarizes several academic papers on topics related to pattern recognition, feature selection, welding defect characterization, machine knowledge representation, and EEG signal classification. Specifically, it mentions papers from 1973, 1975, 2008, and one from 1980. It also lists authors such as Josef Kittler, Peter C. Young, E. RasekaaSiemens AG, A.P. Vieira, E.P. de Moura, L.L. Gonçalves, J.M.A. Rebello, and Daniel Kayser. The final entry is an IEEE paper from Garrett, Peterson, Anderson, and Thaut on comparing linear, nonlinear, and feature selection methods for EEG signal classification.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as DOCX, PDF, TXT or read online from Scribd
    Flag for inappropriate content
    of 2

    IR05130343

    A new approach to feature selection based on the Karhunen-Loeve expansion


      Original Research Article
    Pattern Recognition, Volume 5, Issue 4, December 1973 , Pages 335-352
    Josef Kittler and Peter C. Young

    Mathematical methods of feature selection in pattern recognition


      Original Research Article
    International Journal of Man-Machine Studies, Volume 7, Issue 5, September 1975 , Pages 609-
    637
    Josef Kittler

    A contribution to the problem of feature selection with similarity functionals in pattern


    recognition.

    E. RasekaaSiemens AG, Dataprocessing Department, Munich, W. Germany

    Received 17 June 1970. 


    Available online 20 May 2003.

    Characterization of welding defects by fractal analysis of ultrasonic signals


      Original Research Article
    Chaos, Solitons & Fractals, Volume 38, Issue 3, November 2008 , Pages 748-754
    A.P. Vieira, E.P. de Moura, L.L. Gonçalves and J.M.A. Rebello

    Machine representation of knowledge for computer-assisted instruction


      Original Research Article
    Euromicro Newsletter, Volume 6, Issue 4, July 1980 , Pages 209-214
    Daniel Kayser

    IEEE PAPER

    Comparison of linear, nonlinear, and feature selection methods for EEG signal classification

    Garrett, D.c , Peterson, D.A.a , Anderson, C.W.a , Thaut, M.H.b

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