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PIEZOELECTRIC CERAMICS

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ELECTRO CERAMIC SOLUTIONS

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Morgan Electro Ceramics forms part of Morgan Technical Ceramics, a Division of The Morgan Crucible Company plc

www.morganelectroceramics.com www.morgantechnicalceramics.com
Copyright November 2007

INTRODUCTION

Morgan Electro Ceramics (MEC) has a comprehensive range of piezoelectric and dielectric materials from which many products are manufactured, including transducers, sensors, actuators and high voltage and RF capacitors. MEC has established an enviable reputation for providing value-added solutions through world-class research and development, innovative design and, perhaps most important of all, application engineering.
A subsidiary of The Morgan Crucible Company, MEC forms part of the Morgan Technical Ceramics Group. The Group includes Morgan Advanced Ceramics and from manufacturing locations in North America, Europe and Asia, supplies an extensive range of products, including ceramic components, braze alloys, ceramic/metal assemblies and engineering coatings. This brochure contains information about the range of piezoelectric materials produced by Morgan Electro Ceramics and gives an introduction to the properties that may well provide solutions to your design challenges. It does not address other materials, many of which are listed below, that are available from the Morgan Technical Ceramics Group of companies, as other literature exists for these. For detailed specifications of individual materials, please contact your local area sales person or visit www.morganelectroceramics.com. For more information on Morgan Advanced Ceramics visit www.morganadvancedceramics.com.

MATCHING YOUR REQUIREMENTS TO MORGANS CAPABILITIES APPLICATIONS ENGINEERING

It is our objective to help our customers as much as possible when designing Piezo components into their products. Applications engineering assistance is provided as a support facility across the product portfolio.

MATERIALS
Process control of raw materials and their fabrication into ceramic compounds ensures high quality and repeatability of properties. The control of the specially formulated ceramic materials are vital to the success of the product range and we continually strive to reduce variability in our processes.

TESTING AND CHARACTERISATION

Computer modelling techniques employed in the development of new designs requires input of the most accurate material property data available. Morgan focuses on test capabilities to provide this characterisation service to their customers.

COMPONENTS
First class manufacturing processes are employed to provide components engineered for top performance of electrical and mechanical properties. Quality systems to ISO 9001:2000 are in place to provide the structure for control, function and traceability through the manufacturing facilities.

THE MORGAN CRUCIBLE COMPANY PLC

The Morgan Crucible Company plc is the ultimate holding company of a group of subsidiary engaged in the manufacture and marketing of carbon and ceramic components for application in a wide range of industries and services. It is listed on the London Stock Exchange in the engineering sector and is part of the FTSE All-Share index. For more information visit www.morgancrucible.com.

ELECTRODES
Expertise has been developed in the deposition of many electrode material types on to ceramics with patterns, wrap-around and feed through configurations to custom designs. The ability to provide special electrodes can facilitate the manufacture of the devices into which the ceramic components are mounted.

MARKETS
Morgans electroceramics components, transducers and assemblies are applied in leading edge technologies such as: AEROSPACE AUTOMOTIVE ELECTRONICS DEFENCE MEDICAL ENERGY INDUSTRIAL

ASSEMBLIES, BIMORPHS AND TRANSDUCERS

Our customers have found that there are great advantages in working closely with us so that we can provide them with a full or sub-assembly. The transducers we manufacture to our own design are a complete, fully tested assembly ready for immediate fit into a system.

MULTILAYER TECHNOLOGY
Piezo Ceramic Multilayer Actuators (PCMA) operate at reduced drive voltage to deliver small accurate displacements rapidly and with low power consumption. This gives advantages over electromagnetic actuators in specific applications.

QUALITY
Morgan continues to develop new materials and value added assemblies to meet the rapidly expanding opportunities in these markets. Quality assurance is an intrinsic part of everything we do from the moment we receive your initial enquiry to final delivery and after-care. Our total quality ethos is implemented through an intensive Six Sigma continuous improvement programme. All Morgan Advanced Ceramics sites around the world have ISO 9000 accreditation. In addition, individual sites hold a variety of industry-specific quality standards. 1

TABLE OF CONTENT

NATURE OF PIEZOELECTRIC CERAMICS

1 2 3 5 6 7 8 9 10 12 13 16 19 20 22 23 25 27 28

Introduction Table of Contents The Nature of Piezoelectric Ceramics PZT Manufacturing Process Piezoelectric Applications Piezoelectric Ceramic Materials Piezoelectric Property Symbols and Notation Typical Symbols Employed in Describing Properties of Piezoelectric Materials Modes of Vibration, Displacement and Voltage Typical Temperature Properties for PZT Compositions Dynamic Behaviour of Piezoelectric Ceramics Useful Electromechanical Relationships Piezoelectric Sensor Acoustic Impedance Matching Shapes and Mechanical Tolerances Electrodes Transducers and Sensors PZT Flexure Elements: Bimorph Multilayer Actuators Table of Properties

PIEZOELECTRICITY
Piezoelectricity is a property exhibited by certain classes of crystalline materials. When mechanical pressure is applied to one of these materials, the crystalline structure produces a voltage proportional to the pressure. Conversely, when an electric field is applied to one of these materials, the crystalline structure changes shape, producing dimensional changes in the material. These materials are used as electromechanical transducers. Piezoelectric properties occur naturally in some crystalline materials and can be induced in other polycrystalline materials. Pierre and Jacques Curie discovered piezoelectricity in the 1880s.

A PZT ceramic may be regarded as a mass of minute crystallites randomly oriented. After it has been sintered, the ceramic material will be isotropic and will exhibit no piezoelectric effect because of this random orientation. The ceramic can be made piezoelectric in any chosen direction by a poling treatment, which involves exposing it to a strong electric field. When a field is removed, the dipoles remain locked in alignment, giving the ceramic material a remnant polarisation and permanent deformation (i.e. making it anisotropic), as well as making it permanently piezoelectric. This poling treatment is usually the final stage of PZT component manufacture. A PZT component will usually have metal electrodes deposited on its surface perpendicular to its poling axis (see Figure 2). When a voltage is applied between them, the body distorts along its poling axis. The random orientation of the crystallites, and the fact that only certain polarisation directions are allowed, means that it is not possible to get perfect dipole alignment within the field. A reasonable degree of alignment is, however, possible since there are several allowed directions within each crystal.

PIEZOELECTRIC CERAMICS
Quartz is a good example of a piezoelectric material. Ferroelectric crystals, e.g. tourmaline and Rochelle salt, also exhibit piezoelectricity. In addition to the crystals mentioned above, an important group of piezoelectric materials are the piezoelectric ceramics, of which PZT is an example. These are polycrystalline ferroelectric materials with the perovskite crystal structure, a tetragonal/rhombohedral structure very close to cubic. They have the general formula ABO3, (see Figure 1) in which A denotes a large divalent metal ion such as Pb, and B denotes a small tetravalent metal ion such as Zr or Ti. The PZT ceramics in this data handbook are solid solutions of Lead Titanate (PbTiO3), and Lead Zirconate (PbZrO3), modified by additives, a group of piezoceramics generally known as PZT. The PZT can be fashioned into components of almost any shape and size. As well as being strongly piezoelectric, PZT is hard, strong, chemically inert and completely unaffected by humid environments.

30 31 32 33 33 34 35 36 37 37 38 39 40

Navy I Type Piezoelectric Ceramics Navy II Type Piezoelectric Ceramics Navy III Type Piezoelectric Ceramics Navy V Type Piezoelectric Ceramics Navy VI Type Piezoelectric Ceramics Custom Piezoelectric Ceramics Custom Piezoelectric Ceramics Custom Piezoelectric Ceramics Single Crystal Materials Material Cross Reference Table Glossary of Terms Samples Ordering Data Checklist Technical Publications
Figure 1: The Piezoelectric crystal structure.

Figure 2: Electric dipoles in piezoelectric materials

PIEZOELECTRIC ACTIONS
In a ferroelectric crystal, each cell of the crystal lattice spontaneously polarises along one of a series of allowed directions. This spontaneous polarisation disappears at a critical temperature (the Curie point), above which the crystal becomes paraelectric. If the crystal is cooled through the Curie point in the presence of an external electric field, the dipoles tend to align in the allowed direction most nearly aligned with the field. If this crystal is then stressed, the lattice will distort, leading to a charge in the dipole moment of the crystal (piezoelectric effect). Within a certain stress range (which depends on the crystal concerned), this change in the dipole moment with stress is approximately linear and reversible.

Figure 3 illustrates the piezoelectric effect in a cylinder of PZT material. For clarity, the magnitude of the effect has been exaggerated. Figure 3a shows the cylinder under no-load conditions. If an external force produces compressive or tensile strain in the material, the resulting change in dipole moment causes a voltage to appear between the electrodes. If the cylinder is compressed, the voltage will have the same polarity as the poling voltage (see Figure 3b). If it is stretched, the voltage across the electrodes will have opposite polarity to the poling voltage (see Figure 3c). These are examples of generator action, the conversion of mechanical energy into electrical energy. Examples of Piezoelectric-induced generator action can be found in cigarette and gas lighters, accelerometers, hydrophones and microphones. If a voltage of opposite polarity to the poling voltage is applied to the electrodes, the cylinder will shorten (see Figure 3d). If the applied voltage has the same polarity as the poling voltage, the cylinder will lengthen (see Figure 3e). Finally, if an alternating voltage is applied to the electrodes, the cylinder will expand and contract at the same frequency as that of the applied voltage (see Figure 3f). These are examples of motor or actuator action, conversion of electrical energy into mechanical energy. PZT-induced motor action is found in transducers for ultrasonic cleaning equipment, ultrasonic atomisers, fuel injection systems and piezoelectric motors. 3

NATURE OF PIEZOELECTRIC CERAMICS

PZT MANUFACTURING PROCESS

AGEING RATES AND TIME STABILITY

Most of the properties of piezoelectric ceramics change gradually with time. The changes tend to be logarithmic with time after poling. The ageing rate of various properties depends on the ceramic composition, the geometry and on the way the ceramic is processed during manufacture. Because of ageing exact values of various properties such as dielectric constant, coupling, and piezoelectric constants may only be specified for a standard time after poling. The longer the time period after poling, the more stable the material becomes. Exposing the ceramic to one or more combination of the following conditions can accelerate the ageing process in any ceramic: High mechanical stress. Strong electric de-poling field. High temperatures approaching the Curie point. Material selection should be based on the conditions of a given application. Typical ageing rates of various material properties can be found on pages 30-37 of this handbook. EQUATION FOR AGEING RATE To predict value X at T days after poling: XT = Xt+ Xt .AR. (logT - log t) Where: XT is value of interest at T days after poling. Xt is value at poling date. AR is the Ageing Rate (Positive or Negative)

MEC manufactures electro-ceramics materials in a batch process that involves the following basic process stages (see figure 5 below):

PbO

TiO2

ZrO2

Dopants

Weigh Out Raw Material

Milling

Calcine Firing

<1000 C

Milling

Spray Drying

TEMPERATURE LIMITATIONS
Figure 3: The Piezoelectric effect on a cylindrical body of piezoelectric ceramics. For the sake of clarity, only one dipole is shown.

After poling, the material has a remnant polarisation (Pr) and a remnant stress (Sr) as shown in Figure 4.

As the operating temperature increases, piezoelectric performance of a material decreases, until complete and permanent depolarisation occurs at the materials Curie temperature. The Curie point is the absolute maximum exposure temperature for any piezoelectric ceramic. Each ceramic has its own Curie point. When the ceramic element is heated above the Curie point, all piezoelectric properties are lost. In practice, the operating temperature must be substantially below the Curie point. As a general rule it is not recommended to exceed half of the materials Curie temperature in degrees Centigrade. The materials temperature limitation decreases with greater continuous operation or exposure. At elevated temperatures, the ageing process accelerates, and the maximum safe stress level is reduced.

Forming

Dry press, isostatic press, Tape cast

Binder Burnout

<800 C

Sintering

<1200 C

VOLTAGE LIMITATIONS
A piezoelectric ceramic can be depolarised by a strong electric field with polarity opposite to the original poling voltage. The limit on the field strength is dependant on the type of material, the duration of the application, and the operating temperature. The typical operating limit is between 500V/mm for soft piezoelectric materials and 1000V/mm for hard piezoelectric materials during continuous application. In bimorph actuators it is possible to apply an electrical field up to 1.25kV/mm for a soft piezoelectric material. It should be noted that alternating fields can have the same effect during the half cycle, which is opposite to the poling direction.

Machining

Electroding

Silver, Nickel, Gold

Electrode Firing

MECHANICAL STRESS LIMITATIONS

High mechanical stress can depolarise a piezoelectric ceramic. The limit for the applied stress is dependent on the type of ceramic material, and duration of the applied stress. For dynamic stress (impact ignition) the limit is less severe; materials with higher energy output (high g constant) can be used. For impact applications, the material behaves quasi-statically (non-linear) for pulse durations of a few milliseconds or more. When the pulse duration approaches a microsecond, the piezoelectric effect becomes linear, due to the short application time compared to the relaxation time of the domains.

Poling

Final Test / Inspection

Figure 5: Typical piezoelectric ceramic manufacturing process

Figure 4: Typical hysteresis loop and associated lateral strain or contraction.

PIEZOELECTRIC APPLICATIONS

PIEZOELECTRONIC CERAMIC MATERIALS

MATERIALS AUTOMOTIVE PIEZOELECTRIC APPLICATIONS

Several types of piezoelectric ceramic materials are available. Each type is tailored towards the requirements of particular applications. This is achieved by changing the chemical composition of the ceramic to enhance specific properties. The ceramic materials are arranged in three groups. Hard Materials, Soft Materials and Custom Materials.
HIGH POWER HARD MATERIALS High power or hard ceramics can withstand high levels of electrical excitation and mechanical stress. These materials are suited for high voltage or high power generators and transducers. PZT400 SERIES (NAVY TYPE I) This material is ideally suited for ultrasonic cleaning, sonar, and other high power acoustic radiation applications. PZT400 Series is a Lead Zirconate Titanate material capable of producing large mechanical drive amplitudes while maintaining low mechanical and dielectric losses. In addition, it can be used under both constant and repetitive conditions. See page 30 for more specific material properties. PZT800 SERIES (NAVY TYPE III) This material is used in high power applications; even though its piezoelectric activity level is slightly lower than PZT400 Series. With an extremely low loss factor, PZT800 Series has the ultimate power handling capability. See page 32 for more specific material properties. HIGH SENSITIVITY SOFT MATERIALS High sensitivity or soft ceramics feature high sensitivity and permittivity, but under high drive conditions are susceptible to self-heating beyond their operating temperature range. These materials are used in various sensors, low-power motortype transducers, receivers, and low-power generators. PZT5A SERIES (NAVY TYPE II) This material is used as the receiver or generator element in hydrophones, accelerometers, and vibration sensors. PZT5A Series is a Lead Zirconate Titanate with a high sensitivity, permittivity, and time stability. See page 31 for more specific material properties. PZT5J1 (NAVY TYPE V) This material is used in fuses, hydrophones, and other applications that require a combination of high energy and high voltage output. PZT5J1 is a Lead Zirconate Titanate with a high permittivity and a high piezoelectric voltage constant. See page 33 for more specific material properties. PZT5H SERIES (NAVY TYPE VI) This material is used in sensitive receivers and applications requiring fine movement control. It has been used in a wide range of applications from hydrophones to ink jet printers. PZT5H Series provides extremely high permittivity, coupling, and piezoelectric constant. It has the lowest Curie temperature of the soft materials (or PZT500 Series family), which restricts its operating temperature range. It has lower time stability. See page 33 for more specific material properties.

PZT601 (HARD) This material was designed for transducer applications requiring reduced dielectric constant, high Qm, low dielectric losses and improved electromechanical coupling coefficients. See page 35 for more specific material properties. PZT508 (SOFT) This material has been developed to surpass the electrical performance of PZT5H Series materials while improving the temperatures characteristics by raising the Curie temperature to 220C. See page 34 for more specific material properties. PZT5K SERIES (SOFT) This material outperforms PZT5H Series and PZT508 while at the expense of Curie temperature. This material has very high d coefficients and permittivity. See page 36 for more specific material properties. PZT700 SERIES (SOFT) These materials have been developed for a number of property optimisations. The materials have a combination of property stability, good sensitivity and have found use in a variety of sensor applications. See page 35 for more specific material properties. PZT407 (HARD) This material was developed for its specific combination of permittivity, loss and d coefficient. The material in many aspects is similar to materials PZT400 Series, but falls outside the Navy I classification. See page 35 for more specific material properties. PT1 This material is a Lead Titanate. Unlike PZT it has low radial mode coupling coefficients, which therefore provides excellent hydrostatic properties and has the highest (figure of merit) for any Morgan Electro Ceramic materials. See page 35 for more specific material properties. PMN-PT28/30 This new single crystal piezoelectric material has been designed for use in transducer and actuator devices. It has been formulated to exhibit very large electromechanical coupling coefficients and also offers high dielectric constants and low dielectric losses. See page 37 for more specific material properties. Typical Dielectric and Piezoelectric Properties: Applications include high power sonar projectors, medical imaging, and actuators. The increased coupling and displacement results in improved bandwidth, sensitivity and source level in applications. TYPICAL APPLICATIONS Ultrasonic Cleaning Transducers Sonar Transducers Medical Therapy Ultrasonic welding Cosmetics Sensors Material testing Medical Diagnostics Actuators Low power generators Receivers Hydrophones Gyroscopes Accelerometers Ink jet printers Bimorphs SUITABLE MATERIAL PZT TYPE Hard Material High Qm High Tc Low tan

UNDERWATER PIEZOELECTRIC APPLICATIONS

PZT400 Series PZT800 Series

CUSTOM MATERIALS
Morgan Electro Ceramics manufacture a number of materials that do not fall within the Department of Defence (DOD) standards that are often used to define PZT materials.
PZT501 PZT506 (SOFT) These materials are all soft and fall between DOD Categories II and V. They range in Curie temperatures from 270C to 350C. All the materials have similar dielectric constants, but have been optimised for charge constants or coupling coefficients for specific applications. PZT502 is used as an alternative to PZT5A Series when higher sensitivity is required. PZT502 has high acoustic sensitivity, and high coupling, while maintaining a high permittivity. See page 34 for more specific material properties. PZT507 (SOFT) This material is an improved PZT5H Series, developed specifically for bimorph applications. See page 34 for more specific material properties.

Soft Material PZT5A Series PZT5J1 PZT5H Series PZT501 - PZT508 PZT5K1 PZT700 Series PZT5R Low Qm ( 80) d33>400 pC/N

Table 1: Classification of PZT materials by typical applications.

PIEZOELECTRIC PROPERTY SYMBOLS AND NOTATION

TYPICAL SYMBOLS EMPLOYED IN DESCRIBING PROPERTIES OF PIEZOELECTRIC MATERIALS

CERAMIC PROPERTY DEFINITIONS

The piezoelectric properties are described by a system of symbols and notations. Some of the piezoelectric property symbols are listed and defined in table 2. These symbols identify the property: compliance, electromechanical coupling, etc The table includes the MKS units used in measuring each property.
PROPERTY Electromechanical Coupling Coefficient k DEFINITION mechanical energy stored electrical energy supplied or electrical energy stored mechanical energy supplied Strain developed applied stress or short circuit change density applied stress open circuit field applied stress or strain developed applied charge density MKS UNITS

PIEZOELECTRIC EQUATIONS
To a good approximation, the interaction between the electrical and mechanical behaviour of the piezoelectric medium can be described by the following relationships:

Strictly speaking, these symbols are used to identify properties of materials only, and should not be used to describe characteristics of actual physical elements made of these materials. However, for convenience, some liberties have been taken in the explanations electric boundary conditions are identified by indicating locations and connections of electrodes.

Piezoelectric Constants d

Metre/Volt or Coulombs/Newton

Volt/Newton or Metre/Coulombs

Relative Dielectric Constant K

permittivity of material permittivity of space

WHERE: -1 E = field (V .m ) -2 T = Stress (N .m ) S = Strain (SI) -2 D = Dielectric displacment (C .m ) r = relative permittivity or dielectric constant -12 -1 0 = permittivity of free space (8.85x10 F .m ) T = permittivity under constant stress

Modulus of Elasticity Y stress strain Newton/Metre

Figure 7 below depicts the phenomenology arising from the mutual couplings among the electric, elastic, and thermal fields. The outer quantities are the thermodynamic intensive variables (generalised forces); the inner quantities are the extensive variables (generalised displacements).

Density mass volume Kg/Metre

Frequency Constant N Controlling Dimension x Resonant Frequency Hz.Metre

Table 2: Ceramic Property Definitions

DIRECTION DEPENDENCE
Poled piezoelectric ceramics are anisotropic and the direction of polarisation may be freely chosen, a method of identifying the axes of a component is necessary in order to specify its parameters. The direction of polarisation is conveniently taken as axis 3, with axes 1 and 2 perpendicular to this. The terms 4, 5 and 6 apply to shear strains associated with the 1, 2 and 3 directions (see figure 6 left).

Figure 6: Notation of axes

Figure 7: Couplings between electrical, mechanical, and thermal fields

MODES OF VIBRATION, DISPLACEMENT & VOLTAGE

MODES OF VIBRATION, DISPLACEMENT & VOLTAGE

SHAPE

AXES

POLARISATION DIRECTION

APPLIED FIELD VOLTAGE OUTPUT

MODE OF VIBRATION DISPLACEMENT APPLIED STRESS

FREQUENCY

CAPACITANCE

DISPLACEMENT (STATIC)

VOLTAGE (STATIC)

THIN DISC

PLATE

RING

TUBE

ROD

HEMISPHERE

SHEAR PLATES

NOTES: 1 - Equations valid for: (A) plate, disc, ring & shear plate where r, L and W>>thk 2 - All variables are metric; use MKS units 3 - Constants g31 and g33 and negative values which result in negative strain (contraction) and negative voltage (contraction) 4 - Each type of material has particular voltage, stress and temperature limitations.

10

11

TYPICAL TEMPERATURE PROPERTIES FOR PZT COMPOSITIONS

DYNAMIC BEHAVIOUR OF PIEZOELECTRIC CERAMICS

ELECTRICAL EQUIVALENT
The electrical equivalent (see Figure 8) provides the link between the physical property of the crystal and the area of application, the oscillator.

At the series resonance (1) the frequency is expressed in equation 6.

Between points A and B, only R1 is remaining, which means the circuit is purely resistive. At the parallel resonance (2) the frequency is expressed in equation 7.
% Capacitance Change % Frequency Change

The impedance between points A and B is at its maximum and is expressed in equation 8.
Figure 8: The electrical equivalent circuit for a PZT resonator.

Temperature ( C)

Temperature ( C)

The physical constants of the crystal determine the equivalent values of R1, C1, L1, and C0. R1 is a result of bulk losses, C1, is the motional capacitance, L1 is determined by the mass, and C0 is made up of the electrodes, the holder and the leads. When operated far off resonance, the structure is simply a capacitor C0 but at the precise resonant frequency the circuit becomes a capacitor and resistor in parallel. The reactance of the PZT approaches zero at the point of series resonance and reaches a maximum at the anti-resonant frequency fa (see Figure 9).

The measurements of fr and fa give the ratio expressed in equation 9.

Hence equation 10 follows:

% Coupling Coefficient Change

% d31 Change

The resonant frequency fr can be measured with either of the following two circuits: MEASURING METHOD USING CONSTANT VOLTAGE CIRCUIT The fr measuring circuit using a constant voltage source is shown in Figure 10. The oscillator and input resistors R1 and R2 are used to apply a constant voltage signal to the piezoelectric ceramic transducer. The current passing through the transducer is measured across output resistor R2. If the transducer's impedance is much greater than R2, the voltmeter reading is proportional to the transducer's admittance. The frequency where the voltmeter reading is maximized is the resonant frequency fr and the frequency where the reading is minimized is the anti-resonant frequency fa. Potentiometer P1 is used to determine the resonant resistance Zr , which is needed to calculate the mechanical quality factor Qm.

Temperature ( C)

Temperature ( C)

NOTE: ABOVE CURVES ARE REPRESENTATIVE DATA ONLY.

TESTING OF PZT COMPONENTS

Below is a list of the various electrical parameters which are normally measured to qualify PZT components. In the absence of a customer specification, Morgan Electro Ceramics will apply internal limits. Capacitance tan Coupling (Kp, Keff) Fr, Fa Zr, Za Insulation Resistance Other parameters as per customer request. 12

Figure 9: The reactance of the PZT resonator varies with frequency of operation near resonance.

An area typically chosen for operation of the oscillator is either near series resonance or at the more inductive area of parallel resonance.

Figure 10: Resonant frequency method using constant voltage.

13

DYNAMIC BEHAVIOUR OF PIEZOELECTRIC CERAMICS

DYNAMIC BEHAVIOUR OF PIEZOELECTRIC CERAMICS

MEASURING METHOD USING CONSTANT CURRENT CIRCUIT

The fr measuring circuit using a constant current source is shown in Figure 11. Resistor R3 regulates the current passing through the piezoelectric ceramic transducer. If R3 is much greater than the transducer's impedance, the voltmeter reading is proportional to the transducer's impedance. The frequency where the voltmeter reading is minimized is the resonant frequency fr, and the frequency where the reading is maximized is the anti-resonant frequency fa.

Under normal operating conditions, the value of this resistance is many times greater than the normal load resistance, ranging from several hundred megohms to many thousands of megohms. Generally, except at very low frequencies, the capacitances in the circuit have reactances very much lower than the circuit resistances. Under these conditions, the circuit reduces to the simple capacitive voltage divider circuit (see Figure 12b). It can be seen from this circuit that the shunt load capacitance CL of wiring, cable, and amplifier input does not bring about a relative loss of high frequency response as in the case of resistive or inductive sources shunted by capacitance loads, but instead reduces the output at all frequencies (except very low frequencies as discussed in the next paragraph). By the application of elementary network theory, the basic circuit can be reduced to the equivalent circuit of figure 12c, which is useful for analysing the low frequency response. From this it can be seen that when the combined reactance of the piezoelectric and circuit capacitances in parallel approaches the combined resistance, the low frequency response begins to fall off. This is analogous to the situation existing in conventional RC-coupled amplifiers. NON-RESONANT ELECTRICALLY DRIVEN DEVICES In the case of non-resonant piezoelectric devices, which are electrically driven, the electrical impedance of the device may, for most practical purposes, be considered to be purely capacitive. For all frequencies well below the first mechanical resonance of the device, the electromechanical relationships are such that the displacement of the piezoelectric element from its normal position, at any instant, is directly proportional to the electric charge applied at that instant. RESONANT DEVICES The electrical impedance of a piezoelectric device is, in reality, more complicated than the simple capacitor representation generally employed in discussing nonresonant devices. A more accurate representation would be a capacitor representing the static capacitance of the piezoelectric element, shunted by an impedance representing the mechanical vibrating system. In most non-resonant devices, the latter impedance may be approximated by a capacitor. Therefore, we have a capacitor in parallel with a capacitor, hence the single capacitor representation. In devices designed for operation at resonance, the impedance representing the mechanical system may become, at resonance, a resistance of relatively low value and this is shunted by the same static capacitance. The shunt static capacitance generally is undesirable, whether the device is designed for operation at resonance or for broadband, below resonance operation. In electrically driven devices, it shunts the driving amplifier or other signal source requiring that the source be capable of supplying extra current. In the case of mechanically driven devices, the static capacitance acts as a load on the active part of the transducer, reducing the electric output. In non-resonant devices, not much can be done about the shunt capacitance, except choose a piezoelectric material having maximum activity. In resonant devices, however, the static capacitance may be neutralised or matched by employing a shunt or series inductor chosen to resonate with the static capacitance at the operating frequency. This is illustrated in Figure 13.

POWER LIMITATIONS
The acoustic power handling capacity of a radiating transducer is limited by the following factors: 1. Dynamic mechanical strength of the ceramic 2. Reduction in efficiency due to dielectric losses 3. Reduction in efficiency due to mechanical losses 4. Depolarisation of the ceramic due to electric field 5. Depolarisation of the ceramic due to temperature rise 6. Instability resulting from the positive feedback between dielectric losses and internal heating (factor 2 and 5) In practice, power limitations are imposed by factors 2 and 5 and the feedback between them (factor 6), depending on the composition of the ceramic. Factors 1, 3 and 4 may be neglected. Factor 1 may be reduced through mechanical bias in sonar, ultrasonic, and other similar applications. Factor 3 may be generally disregarded, since mechanical losses are negligible compared to dielectric losses. In the case of factor 4, the electric field necessary to cause sufficient depolarisation will create extremely undesirable operating conditions with very high dielectric losses, resulting in low efficiency. A transducer may be efficiency-limited, temperature-limited, or dynamic-strength limited. Dynamic strength is significant only when a transducer is not mechanically biased and the ceramic has a high mechanical quality factor Qm. A low frequency, low duty transducer is efficiency-limited. A high frequency continuous duty transducer is temperature-limited. Temperature limited transducers are dependent on the efficiency of the heat removal from the ceramic. Between these two extremes, the specific limitation is dependent on the mechanical design of the transducer. An absolute value on the power limitation of the ceramic cannot be determined without knowledge of its operating conditions. The equations pertaining to the power handling capacities of the material may be readily derived from lumped equivalent circuits. It can be shown that the acoustic power density P per cubic metre is given by equation 11.

These equations may be simplified for the specific case of a matched transducer. Matching is the term applied to the process of adjusting the acoustic load so that it corresponds to the image impedance of the transducer, which is treated as a bandpass filter. In this case, an inductor equal to (see equation 15) is connected across the transducer.

The impedance of the driving electric generator is set equal to the image impedance in order to maximise the transducer bandwidth, where the generator resistance, RG and the mechanical load impedance, RT, are given in equation 16; the bandwidth is given by equation 17; and the acoustic power and efficiency are given by equation 18.

Figure 11: Resonant frequency method using constant current.

CIRCUIT CONSIDERATIONS
NON-RESONANT MECHANICALLY DRIVEN DEVICES For most practical design purposes, a non-resonant piezoelectric generator device, such as a microphone or accelerometer, together with the load on the device, may be represented by the equivalent circuit of figure 12a, where Ce represents the capacitance of the piezoelectric element, Rc is the shunt leakage resistance of the device, CL is the shunt load capacitance, represents the load resistance and eL represents the load potential.

It is assumed that the mechanical losses in the ceramic and the housing are negligible compared to dielectric losses. This tends to hold for materials with Qm > 100. The power per cubic meter dissipated in the ceramic by dielectric dissipation Pd is given by equation 12. Table 3 lists the relative power for PZT-400 and PZT-5A series at resonance for the same acoustic load for a given volume of material, assuming that the material is limited by the dielectric losses tan =0.04 The efficiency of the transducer considering only the internal losses of the material is approximated by equation 13.
MATERIAL MODE TEMPERATURE (C) 25 100 25 100 25 100 25 100 RELATIVE POWER 100 65 23 12.5 2.7 3.2 0.5 0.6

PZT-400 series Parallel PZT-400 series Parallel PZT-400 series Transverse PZT-400 series Transverse PZT-5A series PZT-5A series PZT-5A series PZT-5A series Parallel Parallel Transverse Transverse

Figure 12: Non-Resonant Mechanically Driven Device

The values of the shunt leakage resistance and the capacitance of the piezoelectric element are dependent on the dimensions of the element and, in the case of leakage resistance, also upon the dryness of the surface. 14

Figure 13: Resonant PZT device matched by inductor.

With high values of Q m power handling capacity of the material is limited at times by the dynamic tensile strength, even though a bias compressive stress as high as 80MPa is used with PZT-400 series. In this case, the acoustic power is given by equation 14.

Table 3: Relative power for PZT-400 and PZT-5A series.

15

USEFUL ELECTROMECHANICAL RELATIONSHIPS

USEFUL ELECTROMECHANICAL RELATIONSHIPS

STATIC AND QUASI-STATIC OPERATION

Under static or quasi-static (below resonance) conditions, the magnitude of the piezoelectric effect is given by piezoelectric d and g constants. For the case of the direct piezoelectric effect where the material develops an electric charge from an applied stress, the definitions for d for constant field and g for constant dielectric displacement should be used. For the converse effect where the material develops a strain from an applied electric field, the definitions for d and g for constant stress should be used. These d and g coefficients are related by equation 19 for plates and discs, and equation 20 for rods.

The mechanical losses can be determined from the mechanical quality or damping factor, Qm, from equation 32.
(Above second resonance)

This value, although related, should not be considered the overall efficiency of the electromechanical transduction, since it does not take into account electrical and mechanical dissipation or losses. When a transducer is not operating at resonance or if it is not properly tuned and matched, the efficiency can be quite low. A properly designed transducer can operate at well over 90% efficiency. The pressure P, which a ceramic driver can impart, is given approximately by equation 27.

Where CP is the low frequency capacitance and Zr is the minimum impendance at resonance. (Above third resonance)

Qm can also be determined approximately from the frequency response curve as follows.

(Discs and plates)

Where k1, k2, and k3 represent the coupling factors for the particular resonance. For a thin plate, k1 and k2 are k31 and k31 (length and width respectively), and k3 is kt (thickness). For a thin disc, k1 is kp (radial), k2 is kt (thickness), and there is no third resonance. For a rod, k1 is k33 (length), k2 is kp and there is no third resonance. In addition to fr and fa (series and parallel resonance frequencies), there is a frequency fm, at which the transducers electromechanical transduction is maximised. This frequency represents the maximum sensitivity for receivers or the maximum output for drivers. This frequency, the bandwidth, and the output are all dependent on the external resistive load, Rext. When k<<1, fm may be calculated using equation 37.

Where d is equal to d33 for thickness mode operation or d31 for radial or transverse E mode, E is the applied electric field, and Y11 is Youngs Modulus for that material. (Rods)

DYNAMIC OPERATION
The permittivity of the material is related to both the permittivity of free space and the dielectric constant of the material according to equation 21. Under dynamic conditions, the behaviour of the piezoelectric material is much more complex. It can be characterised in terms of an equivalent electrical circuit, which exhibits the conditions of parallel and series resonance frequencies. To approximate these frequencies, measure the frequency of the minimum impedance (fr) and maximum impedance (fa) for the component, since they differ by a very small amount (<0.1%). The coupling coefficient, K, can be derived from these frequencies. This derivation is somewhat complex as K is dependent on both the shape of the component and the mode of vibration. The most useful of these relationships are described in equation 28 for plates, equation 29 for discs, and equation 30 for rods.

Where k33 is the relative dielectric constant of the material and permittivity of free space (8.85x10-12 F/m).

is the

At frequencies far below the mechanical resonance frequency, the electromechanical coupling factor, k, can be calculated by equation 22 for plates, equation 23 for discs, equation 24 for rods, and equation 25 for shear plates.

The frequency difference f2 - f1 is the frequency bandwidth at about 3dB where the amplitude is 1/ 2 of its maximum value. Of these losses, the dielectric losses are usually the most significant. Therefore, it is recommended that materials with a low dissipation factor be used for high power applications, particularly since these losses increase with power. For high intensity transducers, the overall electro-acoustical efficiency is given approximately by equation 33. The maximum bandwidth, B, obtainable by electrical tuning, is approximately equal to the product of the coupling coefficient and the series or parallel resonance frequency as described in equation 38.

(Plates)

(Plates)

Where QA is the mechanical quality factor due to the acoustical load alone. (Discs) (Discs)

(Rods)

(Rods)

In addition to the coupling coefficient, the total efficiency of a transducer depends on the mechanical and dielectric losses.
Where S is the compliance of the material.

The dielectric losses, tan , are given by the dissipation factor, D.F as described ., in equation 31.

It should be noted that at high drive levels QE and Qm are not constants. They are usually lower than the low drive level values. The dielectric permittivity of the material, and therefore the dielectric constant and capacitance, decreases as the applied frequency (mechanical or electrical) exceeds each resonant frequency of the particular ceramic part. For static operation, well below the first resonance frequency, the dielectric permittivity is T 33 (free). For dynamic operation well above r all resonance frequencies of the ceramic part, the material behaves as if it was S clamped (strain = 0), and the electric permittivity is r 33 (clamped). Between each, the permittivity is the product of the static permittivity and a loss term based on the coupling of the resonance mode each resonance point the applied frequency has exceeded, as described in equation 34 (above first resonance), equation 35 (above second resonance), and equation 36 (above third resonance).

If the mechanical quality factor is high (Qm>Q), the external resistance Rext for a fairly flat frequency response can be approximated by equation 39 for parallel inductance, or equation 40 for series inductance.

(Parallel inductance)

The coupling factor is a useful expression relating the amount of energy that can be changed from the electrical form to the mechanical form, or vice versa, for the different operational modes. The coupling factor can be expressed as equation 26. 16

Where QE is the electrical damping.

(Above first resonance)

(Series inductance)

17

USEFUL ELECTROMECHANICAL RELATIONSHIPS

PIEZOELECTRIC SENSOR

Many of the calculated parameters before are interrelated. Thus, many useful relationships can be derived. A few of the most useful relationships are described in equations 41 through 53.

THE PIEZOELECTRIC SENSOR

Piezoelectric measuring systems are active electrical systems, which can measure mechanical quantities such as force, acceleration or pressure. That is, the crystals produce an electrical output only when they experience a change in load. For this reason, they cannot perform true static measurements. High impedance transducers such as piezoelectric sensors, hydrophones, and some accelerometers require an amplifier, which converts a transfer of charge into a change of voltage. Because of the high Direct Current (DC) output impedance of these devices, appropriate buffers are required. The basic circuit for an inverting charge sensitive amplifier is shown in Figure 14.

Drift is defined as an undesirable change in output signal over time, which is not a function of the measured variable. The longer the time constant is, the better the low-end frequency response and the longer the usable measuring time. This is expressed in equation 57 and 58.

(Rods)

(Rods)

(Rods)

Figure 15 below illustrates the typical frequency response of an accelerometer. Below the lower cutoff frequency it is considered as DC mode.
(Plates)
PZT400 SERIES >1.0 0.39 17 0.33 @25 0.045 C82.7 PZT5A SERIES 0.7 0.45 11 n/a 20.734.5 (b) 20.7 82.7 41.4 PZT800 SERIES >1.5 >1.0 10

HIGH SIGNAL PROPERTIES

AC depoling field AC field for tan = 0.04 @25C (a)

(Plates)

% increase of electric field

T r 33

at above

AC field for tan = 0.04 @100C

(Plates)

Maximum rated static compressive stress (maintained) PARALLEL to the polar axis % change of T 33 with stress r increase to rated maximum compressive stress at 25C

Figure 14: Simplified model of a charge amplifier.

@100C 41.4

Charge-emitting transducers produce an output charge, Q, and their output capacitance remains constant. This charge would normally produce an open-circuit output voltage at the transducer output equal to Q/C. However, the voltage across the transducer is held constant by the virtual ground of the op amp (R1 is usually small), the charge is transferred to capacitor C2 producing an output voltage expressed in equation 54.

Figure 15: Typical frequency response of an accelerometer.

~25% (c) ~ -3% (d)

~18% (c)

HYDROPHONES
Interfacing the outputs of highly capacitive transducers such as hydrophones, accelerometers, and condenser microphones to the outside world presents many design challenges. Previously, designers had to use costly hybrid amplifiers consisting of discrete low-noise JFETs in front of conventional operational amplifiers to achieve the low levels of voltage and current noise required by these applications. In sonar applications, a piezoceramic cylinder is commonly used as the active element in the hydrophone. A typical cylinder has a nominal capacitance of around 6,000pF with a series resistance of 10 . The output impedance is typically108 or 100M . Since the hydrophone signals of interest are inherently Alternating Current (AC) with wide dynamic range, noise is the overriding concern among sonar system designers. The noise floor of the hydrophone and the hydrophone preamplifier together limit the sensitivity of the system and therefore the overall usefulness of the hydrophone. Typical hydrophone bandwidths are in the 1kHz to 10kHz range. The AD743 /AD745, MAX4252 or LT1792 operational amplifiers respectively from Analog Devices, Maxim Integrated Products and Linear Technology, with their low noise figures and high input impedance are ideal for use as hydrophone amplifiers. Further reading and application notes can be found on the manufacturers web site. 19

(Hydrostatic charge constant & coefficient)

% change of d33 with stress increase to rated maximum compressive stress at 25C (b) Maximum rated compressive stress (maintained) PERPENDICULAR to the polar axis Maximum rated hydrostatic pressure Compressive strength Tensile strength, static (e) Tensile strength, dynamic (peak) (e)

~ 0.1% @20.7 15% (c) ~ -13% @34.5 6% (c) @25C 55.2 @100C 27.6 345 >517 75.8 24.1 13.8 13.8 138 >517 75.8 27.6 55.2 27.6 345 >517 75.8 34.5

In an actual application, the charge amplifier only responds to AC inputs. The upper and lower cutoff frequencies are given in equation 55.

(a) The value of tan at a given electrical field is a function of time after poling or after any major disturbance such as exposure to an elevated temperature. (b) After appropriate stabilising treatment. This consists of a temperature stabilisation plus a few minutes soak at the appropriate static stress. The temperature stabilisation is, however, more important than the stress soak. (c) In range to 70MPa (d) In range to 35MPa (e) These figures are dependant upon configuration and perfection of fabrication. The static tensile strength figures were obtained from bending tests on thin Bimorph structures, while the dynamic tensile strength figures were obtained from measurements of high amplitude resonant vibration rings. The latter tests are more sensitive to minor flaws.

TYPICAL FREQUENCY RESPONSE

Two of the more important considerations in the practical use of charge amplifiers are time constant and drift. The product of the feedback capacitor C2 and the feedback resistor R2 determines the time constant ( ) of a charge amplifier, defined in equation 56.

Table 4 High signal properties for PZT400, PZT800 and PZT5A series. In this table units of electrical field are in kV/mm and stress is in MPa. 18

ACOUSTIC IMPEDANCE MATCHING

ACOUSTIC IMPEDANCE MATCHING

Piezoelectric transducers require the use of impedance matching layers to partially mitigate the impedance mismatch between a media through which ultrasonic wave signal is propagated and the piezoelectric element. Several matching configurations have been studied, examples are single quarter wavelength ( /4) layers and variations of this configuration such as ( /8) and (n+1). /4, stacks of /4 layers, half-wavelength configurations ( /2), and a stack of very thin matching layers whose total acoustic thickness is ( /4). In any of these configurations, a key aspect for the successful design of matched transducers is the acoustic impedance of the outer layer. DESIGN OF QUARTER WAVELENGTH MATCHING LAYERS The impedance mismatch between a media and piezoelectric ceramics has two main consequences for the design of the piezoelectric transducers: Sensitivity is low Bandwidth is narrow A single matching layer can improve sensitivity, but the widening of the frequency bandwidth requires the use of two or more matching layers. There are two different procedures to determine the optimum acoustic impedance of the /4 matching layers. They lead to somewhat different results, and they are briefly reviewed here. The first one is based on the optimization of the energy transfer through the two interfaces involved in the problem: Piezoelectric element-Matching layer and Matching layer-Media of propagation (air, water, gas, etc), in which the piezoelectric element is considered an infinite layer. At a plane interface between media A and B, having acoustic impedances ZA and ZB, respectively, solution of reflection and transmission problems for normal incidence is given by equation 59 below and represented in figure 16.

The transmitted wave through a matching layer, from a piezoelectric element to a media, is the sum of the contribution of each of the multiple reverberations within the matching layer. At the resonant frequency of a quarter-wavelength matching layer, all terms in this summation have the same phase when the wave leaves the matching layer; a geometrical series is obtained. The series that represent the amplitude of the transmitted wave and its summation are given in equation 60.

In the second procedure, the finite thickness of the piezoelectric element is considered. A transmission line model (KLM) is used, and optimum bandwidth and maximum efficiency are imposed to determine both the number of /4 matching layers required and the acoustic impedance of each one. First, the number of matching layers is determined from Za, Zp, and the effective piezoelectric coupling coefficient of the ceramic (kt2). Then the impedance of each layer is determined. Two cases are analysed: For a single /4 matching layer, acoustic impedance is given as in equation 65.

EXAMPLE
A piezoelectric ceramic element has the following characteristics: Material: PZT501 Shape: Disc Diameter: 10mm Thickness: 1mm The radial resonant frequency of the piezoelectric transducer is:

Where t represents the ratio of transmitted to incident wave amplitude, and r represents the ratio of reflected to incident wave amplitude. From equation 60, they are given as equation 61:

In this example, the piezoelectric transducer must be interfaced to salt water with a double quarter-wavelength matching layer. For a double matching layer it is given by equation 66. Using equation 64, the acoustic impedance of the matching layers can be calculated.

Where Zm1, and Zm2 denote the acoustic impedance of the first and second matching layer, respectively. Acoustic impedance is given by equation 67.

From table 5, Aluminium 6262-T9 and PVDF seem to be adequate materials for the application as their acoustic impedance is close to calculated values. The wavelength in each material can be calculated from equation 68.

Subscripts 1 and 2 denote the two interfaces involved: Piezoelectric ceramicMatching layer, and Matching layer-Media of propagation. Z is the acoustic impedance, and subscripts p, m, and a, denote the piezoelectric ceramic, the matching layer, and the media of propagation respectively. Considering plane waves, the ratio of energy flux transmitted to the media of propagation to the energy flux incident on the matching layer ( t) is given in equation 62: Where is the density and c the acoustic velocity of the material. Wavelength is expressed in equation 68. Thus giving matching layer thicknesses of:

Where

is the wavelength, c is the sound velocity and f the frequency.

SOUND VELOCITY [m/s] 4430 5700 5400 6380 2300 3310 10000 3600 4600 1531 1500 1600 2060 1800 4200 4350 3800 4600 4600 ACOUSTIC IMPEDANCE [106xkg(m2s)] OR [MRay1] 36.7 47.2 47.6 17.41 4.2 7.31 32 38 33.2 1.569 1.560 2.1 2.78 2.0 29.6 33.71 28.5 34.5 35

MATERIAL

Where u is the particle velocity, and subscripts i, r, and t denotes incident, reflected, and transmitted waves respectively.

For maximum transmitted energy, given the values of Zp, Za, the value of Zm is given by the simplified equation 63.

The same result is obtained if the multiple reverberations inside the matching layer are ignored, and the amount of energy transmitted through each interface is maximised. However, considering multiple reverberations is of interest in order to account for the contribution of the attenuation. For an ideal quarterwavelength matching layer (no attenuation and acoustic impedance given by equation 63) working at its resonant frequency, there is no energy loss ( t=1); and in equation 63 can be generalised for a stack of n matching layers, the th impedance of the j layer is given as in equation 64.

Brass Inconel Monel Aluminium 6262-T9 PVDF Carbon (soft) Alumina oxide Silver Iron (cast) Salt water Polyurethane, RP-6400 Neoprene Hard PVC Rubber Butyl Zinc PZT500 series PZT5H series PZT400 series PZT800 series

Table 5: Materials acoustic characteristics Figure 16: Transducer with transmission and reflection paths

In general, the stronger influence of the attenuation in the matching layer is obtained for the single matching layer scheme.

Figure 17: Piezoelectric transducer with matching layers

20

21

SHAPES AND MECHANICAL TOLERANCES

ELECTRODES

DISC
FROM
DIAMETER THICKNESS

TO

1mm (0.04") 254mm (10") 0.08mm (0.003") 25mm (1")

SHAPES Custom shapes are available as well as the shapes shown to the left of this page. Parts can be made to the size ranges shown, but not in every combination of thickness and lateral dimensions. A separate list of standard sizes of parts available can be obtained on request. STANDARD MECHANICAL TOLERANCES T olerances on machined dimensions apply to most components. For large size parts, confirmation of the tolerances achievable will need to be agreed prior to placing an order. Components can be produced to tighter tolerances (e.g. Concentricity within 0.13mm (0.005") TIR and surface finish (Ra) within 1.6 m (62 in)). Care should be taken not to over-specify a tolerance as this can significantly increase costs. FREQUENCY TOLERANCES Better than 5% up to 2MHz Typ. 7% above 2MHz Closer tolerances are available on request TYPICAL SIZE RANGE Other sizes outside the range may be possible. Please contact the manufacturing site for more details. As "Fired" tolerances 0.3mm or 3% whichever is greater

SOLDERING TO SILVER ELECTRODES

Soldering electrical wires to the screen-printed silver electrodes make excellent and time-stable connections. Processes are tightly controlled during manufacture to do everything possible to supply parts with high quality electrodes. The thickness, solderability and bond strength of electrodes are routinely tested. The thickness of the screen-printed silver electrode is in the range of 3m up to 10m. Occasionally there can be problems with wetting the solder on the silver surface and soldering can then be difficult. This phenomenon is mainly caused by a reaction between sulphuric molecules in the atmosphere with the silver surface - with the formation of a silver sulphide layer on the surface of the part. The formation and thickness of this layer is influenced by several factors such as age, pH, humidity, etc. In order to overcome such problems, it is good practice to gently clean the surface of the electrodes on the part before soldering. A glass brush (RS 514-868) or steel wool is very useful for this operation. Figure 18 (left) shows various PZT components with fired on silver electrodes.
Figure 18: Various PZT components

It is therefore be recommended to solder parts in short-circuit conditions.

PLATE (SQUARE & RECTANGLE)

FROM
LENGTH WIDTH THICKNESS

TO

1mm (0.04") 150mm (5.9") 1mm (0.04") 150mm (5.9") 0.08mm (0.003") 25mm (1")

RING
FROM TO
OUTSIDE DIAMETER 1mm (0.04") 150mm (5.9") INNER DIAMETER 0.5mm (0.02") 140mm (5.5") THICKNESS 0.15mm (0.006") 25mm (1")

N.B: If a piezoelectric element is heated to its Curie point, the charges can be disordered and the element becomes completely depolarised. A safe operating temperature would normally be about half way the Curie point.

CONNECTION TO NICKEL ELECTRODES

Our Nickel electrodes vary depending upon the deposition method used: Chemically plated Electroless Nickel Evaporated Nickel For connection, we therefore recommend two different methods: EVAPORATED NICKEL Conductive epoxies are typically used to provide a consistent reliable electrical connection. ELECTROLESS NICKEL Materials used: 15W soldering iron, Flux (Superior 30 or equivalent), unleaded solder (if possible), glass brush, Q-Tip and Ethanol. Gold sputtered electrodes are also available. Procedure: Pre-heat the soldering iron then clean the electrode area using QTip with Ethanol, or a mild abrasive such as an eraser. Melt some solder on the tip of the soldering iron. Tin the lead with solder and then dip the thinned lead into the flux. Place lead on the electrode area and place the soldering iron with mild pressure on the lead until the solder flows onto the electrode. Hold the lead stationary for approximately 5 seconds to allow solder to solidify.

TUBE
FROM
OUTSIDE DIAMETER 1mm (0.04") INNER DIAMETER 0.5mm (0.02") LENGTH 1mm (0.04")

TO 150mm (5.9") 140mm (5.5") 150mm (5.9")

When soldering is performed it is important that the temperature does not exceed the Curie point of the material, since this will immediately depolarize the piezoelectric phase. For normal PZT types, use soldering temperatures between 240 and 300C. Furthermore, silver is soluble in the solder, and if the solder time is too long the electrode will completely dissolve in the solder. In order to increase the possible solder time, use a solder with silver content of 2-4%. Even if the possible soldering time is increased with this type of solder, the solder time must not exceed 2-4 seconds (see Figure 19).
Recommended soldering temperature - Time profile for PZTs

HEMISPHERE
FROM
OUTSIDE DIAMETER 6mm (0.24") WALL THICKNESS 1mm (0.04")

TO 150mm (5.9") 10mm (0.39")

FOCAL BOWL
FROM
DIAMETER THICKNESS

STANDARD MECHANICAL TOLERANCES

TO 150mm (5.9") 10mm (0.39") Outside Diameter Inner Diameter Length & Width Thickness Squareness (edge to face) 0.15mm 0.15mm 0.15mm 0.05mm Within 0.15 0.2mm TIR 0.980 TIR 0.006" 0.006" 0.006" 0.002"
Figure 19: Soldering profile for most PZTs on silver fired electrodes

KEY POINTS TO REMEMBER

1. Always keep the tip coated with a thin layer of solder. 2. Use fluxes that are as mild as possible but still provide a strong solder joint. 3. Keep temperature as low as possible while maintaining enough temperature to quickly solder a joint (2 to 3 seconds maximum for electronic soldering). 4. Match the tips size to the work. 5. Use a tip with the shortest reach possible for maximum efficiency. 6. Too high soldering temperatures and too large temperature gradient such as rapid heating or cooling may cause electrical failures and mechanical damages of the devices.
C = Constraint Point SR = Stress Relief Bend

6mm (0.24") 1mm (0.04")

TAPERED STAVE

Concentricity Surface Flatness (Lapped Parts)

12m (0.012mm) 0.0005"

Surface Flatness (Large Sliced Parts) 15m (0.015mm) 0.0006" Parallelism (Lapped Parts) 12m (0.012mm) 0.0005" 60m (0.06mm) 3m (0.003mm) 0.002" 0.0001"

Mechanical stressing of the joint after completion must be avoided or at worst kept to the minimum. The positioning of the wire when the connection is made should be as close as possible to the final position. Bending the wire at right angles to its original position will almost certainly break the joint due to the high peeling stress introduced. It should also be noted that the piezoceramic parts do not only have a high piezoelectric coefficient, but also a significant pyroelectric coefficient. This means that the increase in temperature introduced by the soldering process will generate an electrical charge. This charge can be released as a spark, which, even if completely harmless to humans, can be very unpleasant for the operator.

BARREL STAVE

Legend: Electrode PZT Ceramic

Parallelism (Large Sliced Parts) Surface Finish (Ra)

Figure 20: Different configurations for wire bonding to ceramics

22

23

ELECTRODES

TRANSDUCERS & SENSORS

LEAD FREE SOLDERING

Successful soldering results have been obtained using Multicore 96S fluxcored solder, which has been specially developed to provide a lead-free substitute for tin/lead cored solder wire in all hand soldering operations. Minor adjustments to soldering temperatures will be required, but the resultant solder joint will perform as well as tin/lead solder joints. There are numerous other suppliers of lead-free solders and each Morgan Electro Ceramics site has its own preference. Therefore, it is recommended to contact the specific site for more detailed information on solder recommendations. SOLDERING IRON TIP LIFE Lead-free solder alloys and their cored wire fluxes are both more aggressive to soldering iron tips than tin lead cored wire. As a result, tip life can be significantly shortened. The tip life will depend to a large extent on the soldering temperature used. As a general rule, a 10C increase in temperature will halve tip life. However, manufacturers are currently introducing tips designed for extended life under these conditions. Lead-free is less forgiving and the right tip for the job will go a long way in preventing defects. Choose a solder tip which has enough heat delivering capacity. Fine point tips cannot be used in all applications and in some cases a tip such as a chisel type is best suited to deliver sufficient heat to the parts to be soldered. Tip life will be reduced with lead-free solders and it is important to choose tips really designed for lead-free soldering. Many tips are only tinned with lead-free solder and the iron plating is no different than traditional soldering tips. High tin solders like to dissolve iron and this reduces tip life. TYPE OF SOLDERING IRON Soldering irons of various types are available. The main differences are in the heat output available and the accuracy of the temperature control. Older types of soldering iron use a method of temperature control that results in large variations in tip temperature. At worst this can result in the solder freezing at the lowest temperature and being too hot for some components at the highest temperature. Improved results can be achieved with lead-free solders if modern soldering irons with good tip temperature control are used. Modern irons are available with higher power ratings, which itself is beneficial, but an ability to maintain temperature and minimize fluctuation during soldering is more important as this will enable operators to use a lower tip temperature. HAND SOLDERING For operators used to working with tin-lead solders, hand soldering is often controlled by specifying the soldering iron's tip temperature. However, as lead-free alloys have much higher melting points than tinlead formulas, resulting in a significantly narrower process window, a more comprehensive set of parameters must be defined. The key in reducing operator issues and reduced wetting Figure 21: Typical Lead-free solder joint resides in the optimization of the soldering process. T avoid issues use a flux content of 2-3% by weight in the o solder wire, use a solder tip temperature of 270-320C. The main issues encountered with lead-free hand-soldering are cold solder joints, poor wetting and de-wetting. These can be avoided. 24

A step-by step process transition would be as follows: Ensure the tips are designed for lead-free Ensure the flux content in the wire is a least 2% wt/wt Use lead free tips with the longest life Ensure the parts are easily solderable with the chosen flux Avoid prolonged contact times Avoid needless reworking of the joint Avoid the use of additional liquid flux The picture bottom left illustrates a typical lead free solder joint. This joint was obtained using a temperature regulated soldering station with a lead free chisel tip. Different temperature settings on the solder tip were used to obtain this joint result. EPOXY BOND In heat sensitive applications it is often necessary to observe particular attention to the heat treatment process for the connection joint. Soft piezoelectric materials such as PZT5K1, PZT5H1 or of similar characteristics have a low Curie temperature, hence making it more susceptible to depolarisation. Silver conductive epoxies are a good alternative to Figure 22: Typical Silver conductive epoxy joint traditional soldering techniques. They typically come in the form of a two part composition; often requiring a mixing ratio of 1:1 which is more suitable in a production environment. To ensure a high strength bond is achieved, thoroughly clean the surface with acetone or equivalent cleaning agent, allowing it to dry before applying the epoxy. Consult the manufacturers technical datasheet if curing of the epoxy is required. ELECTRODE SPUTTERING MEC-Bedford offers in-house RF/DC sputtering of Gold/Nichrome, Nichrome, Silver, Aluminium and others upon request that can be supplied at varying film thicknesses from 100 to 20,000 with a film uniformity of 15%. Film characterisation includes: 1. Thickness measurement via X-Ray Fluorescence (XRF) and/or surface profilometer. 2. Resistivity measurement via four point probe and 3. Adhesion test. The sputtering is done in a class 1000 clean room environment and adapted for high volume production.

TRANSDUCERS & SENSORS

Morgan Electro Ceramics is a world leader in the field of electroceramics and manufactures a wide range of specialised piezoelectric transducers and sensors for mechanical, electrical and electronic applications. With design centres and manufacturing locations in Europe and the USA, Morgan specialises in designing and manufacturing complete solutions for OEM applications. Many of our customers find that Morgans complete Sensor and Transducer divisions offer a T Solution to their needs. Main markets served otal included medical, aerospace, industrial and defence. PRODUCTS: Ultrasonic Transducers Sensors CAPABILITIES: Transducer Manufacture Transducer Design Transducer Testing ULTRASONIC TRANSDUCERS Our ultrasonic transducers are designed using Morgans world leading piezo materials. These materials have extremely good electrical loss properties, high coupling and excellent mechanical properties, which enables us to design and manufacture some of the most efficient ultrasound generators available on the market. In addition to the custom designs, we have standard designs for the following applications. Ultrasonic Cleaning Ultrasonic Therapy Pre-stressed fibre wrapped tubes APPLICATION & MARKETS Medical Dental Descalers Ultrasonic scalpel Cell disruption Ultrasonic phacoemulsion Industrial Ultrasonic Cleaning Ultrasonic Welding Sonochemistry Degassing DESIGN We design our transducers using in house modelling software backed up with extensive test and measurement capabilities, which includes laser vibrometry for displacement measurement. Designing a drive circuit to match transducer characteristics is critical for good system performance. Morgans transducers are fully tested to ensure consistent electrical and mechanical characteristics to ensure good compatibility with our customers drive circuits.

DESIGN CAPABILITY: 3D Finite-Element Analysis software Proprietary computer modelling software Custom formulated PZT & shapes Single / multi-layer products Stack transducers Flexural mode transducers Bonded / encapsulated assemblies Bimorph actuators and sensors ULTRASONIC CLEANING Morgans range of ultrasonic cleaning transducers uses the latest high performance PZT material and are designed to operate in continuous mode in harsh environments. They have been proven in service over the last decade and are used by many of worlds leading manufacturers of ultrasonic cleaning systems in applications as diverse as cleaning semiconductors and engine parts. Standard transducers are available with either exposed contact for soldering leads or complete with flying leads. All of Morgans standard transducers are varnish treated to maximise the resistance to humidity and other atmospheric conditions. These transducers have a grit-blasted base to assist with adhesive bonding to tanks. In many types a thread is also provided to enable mounting top tanks with threaded studs. In addition to this, Morgan is able to design and manufacture custom transducers for specific frequencies and power ratings. This includes the ability to supply transducers for multi frequency operation. These designs are made with the help of Morgans bespoke design software and extensive testing facilities. TRANSDUCERS FOR ULTRASONIC THERAPY Used by physio and beauty therapists around the world, ultrasonic therapy is well proven in these fields. Morgan designs and manufactures transducers for massaging, treatment and therapy of skin and soft tissue. These transducers are generally custom designs with bespoke mechanical dimensions, wiring and frequencies to suit the OEM. Dual frequency transducers (typically 1 and 3 MHz) can also be designed. These transducers use Morgans high performance low loss PZT materials to ensure optimum efficiency and thus minimise self-heating. PRE-STRESSED FIBRE WRAPPED TUBES For the Sonar Industry Morgan supplies prestressed fibre wrapped PZT tubes. Fibre wrapping enable high energy projectors to be designed whilst minimising the risk of ceramic failure through excess tension. Small tubes (up to 100mm) are usually manufactured using a monolithic PZT ceramic tube. Larger tubes (up to 500mm) are constructed with multiple tapered PZT ceramic segments. Morgans high coupling and low loss materials are always the basis of a high efficiency tube. 25

TRANSDUCERS & SENSORS

PZT FLEXURE ELEMENTS: BIMORPH

SENSORS
Morgans range of custom designed sensors find applications in many markets in particular Medical, Industrial and Aerospace. Key applications include level, flow, vibration and dynamic pressure measurement. The sensing principals used in Morgan sensors are either acoustic (active) and/or piezoelectric (passive). SENSOR TYPES INCLUDE: Ultrasonic Sensors Accelerometers (passive) Blood pressure sensor Wheel balancing Impact Sensors Electronics form a key part of every sensor and MEC offer sensors comprising of the sensing element only or design incorporating a level of electronics integration. Electronics design and manufacture is done in co-operation with our partner companies which include APEX in the USA and others in Europe. ULTRASONIC SENSORS Ultrasound Sensors use either time of flight measurement, Doppler or acoustic transmission principles to measure a wide range of parameters. Morgans considerable expertise in key technologies for ultrasonic sensors is used to design custom sensors for OEM applications. Morgans Engineers have expert knowledge of the fundamentals such as acoustics, matching layers, damping and adhesive technology which are all key to good transducer design. A large portfolio of materials is used to design the optimum sensor in terms of acoustics, electro-mechanical properties and environmental resistance. ACCELEROMETERS Morgans stable and high sensitivity materials form an excellent basis of accelerometers. The piezo electric materials can be used in either compression or shear mode to form single or multi-axis accelerometers. Accelerometers can be housed in standard housing (e.g. transistor cans) or custom made packages. Morgans bimorph materials can also be used where increased sensitivity is required. ARTERIAL PRESSURE TRANSDUCER The Arterial Pressure Transducer (APT) is a piezoelectric transducer that provides fast, accurate blood pressure readings. Like all of Morgan Electro Ceramics ultrasonic transducers, it has been designed using our world leading piezo materials. IMPACT SENSORS Impact sensors use the piezo-electric effect to sense forces (dynamic) and rate of force application. Example applications of impact sensors are coin validation equipment and firmness testing (e.g. fruit). In designing these sensors great care is taken to ensure that the signal response is consistent in a variety of conditions, angle of impact, temperature etc. 26

WHEEL BALANCING SENSORS Morgans over-moulded sensors for wheel balancing can be found in many garage workshops around the world. Many OEM manufactures of wheel balancing equipment have found that Morgans design offers and excellent solution in terms of value for money, robustness and accuracy. These over-moulded sensors are available in a number of versions. Transducers are generally supplied with exposed (solderable) connectors. Upon request custom versions with either IDC or flying leads (with or without connector) can be manufactured.

PIEZOELECTRIC BIMORPHS
With a history in piezo bimorphs extending some 45 years to the pioneering days of the technology, MEC brings a wealth of experience in the development of customized high precision piezo bimorphs components resulting in real added-value for our customers. T oday you will find Morgan Electro Ceramics piezo bimorphs in a host of specialist application areas, including ultrasonic atomizers, transducers, printing technologies, pneumatic valves, textile machinery and many more. The bimorphs are available in a range of sizes from 6 to 74mm in length and 1 to 43mm in width, to reflect the variety of applications in which they can be used. SERIES & PARALLEL BIMORPHS: HIGH SENSITIVITY & COST EFFICIENT Examples of applications: Sensor systems (airbag) Printing technologies Ultrasonic atomizers Ultrasonic transducers Viscosity measurement systems Flow measurement systems CARBON-FIBRE OR METAL REINFORCED BIMORPHS:
HIGH FORCE/DEFLECTION RATIO AND EXTREMELY LONG LIFE-TIME Figure 25

In a series bimorph, PZT strips are connected to the voltage source in series (See figure 23), and in a parallel bimorph strips are individually connected to the voltage source (See figure 24). In the series bimorph, one of the PZT strips will always be subject to a voltage opposite to the polarising voltage, so there is always a danger of depolarisation. This is also true to the parallel bimorph configuration of figure 25, but if it is connected as shown in figure 26, both strips will be driven in the polarisation direction, thereby avoiding drift in characteristics caused by depolarisation.

TRANSDUCER & SENSOR MANUFACTURING

All of our transducer and sensor manufacturing facilities are ISO 9000:2000 certified and many are also certified to ISO 14001:2004. PROCESSES & CAPABILITIES INCLUDE: Prototype assemblies Small to large volume manufacture Custom assembly Clean room facilities available Wire bonding / pulse soldering Thermal cycling Humidity chamber Encapsulation (Thermoplast + Thermoset)

PRACTICAL DESIGN DATA FOR PZT500 SERIES FLEXURE ELEMENTS

Examples of applications: Pneumatic valves for industrial and automotive applications Valves in medical applications Insulin pumps Braille keys for the blind Energy harvesting in car-tyres Textile machinery Optical switches Many applications require displacements far greater than are possible with simple PZT transducers operating in the d33 or d31 modes. Moreover, the voltages required to produce these displacements are very high, and because they present a considerable mismatch to air, these elements are unsuitable for use as electro-acoustic transducers. A much more compliant structure operating in the d31 mode is the flexure element, the simplest form of which is the bilaminar cantilever or bimorph. This consists of two thin PZT strips bonded together. Bimorphs are usually mounted as a cantilever and usually operate in the d31 mode as shown on figure 23 & 24.

TRANSDUCER TESTING
The testing of electrical properties of resonating structures requires considerable expertise and sophisticated equipment. Facilities such as these are available throughout our design and production process.

Lt: Total length F: Force on tip W: Width L: Free length h: Total thickness z: Deflection of tip Field Strength: max 500V/mm

Figure 26: Flexure element (Bimorph)

PARAMETER DEFLECTION

PARALLEL BIMORPH

SERIES BIMORPH

UNIT m/V

BENDING

m/N

RESONANCE FREQUENCY

Hz

CHARGE OUTPUT

C/N

MEASUREMENT TOOLS USED INCLUDE: Impedance Analyser (4194A and 4294A) Laser Vibrometer Acoustic characterisation (tank test) / Echo Response Rigs Sound pressure measurement / Beam characterisation Shaker table, charge sensitivity measurement (accelerometers) Power meter Optical inspection including SEM and Vision CMM
Figure 24 Table 6: Summary of equations for bimorphs VOLTAGE OUTPUT V/N Figure 23 CAPACITANCE F

27

MULTILAYER ACTUATORS

MULTILAYER ACTUATORS

MULTILAYER FLEXURE MODE ACTUATORS

The use of very thin piezoelectric layers in flexure elements requires much lower driving voltages than classical bimorph actuators. Basically these elements can be built up three ways: Gluing a d31 actuator onto an inactive substrate, like a metal strip Combining a d31 actuator with an unpolarised PZT layer Combining layers of piezoelectric ceramic with an intricate electrode structure so that the layers expand or contract like a classical bimorph element. Figure 27: below illustrates a multilayer parallel bimorph element.

For the multilayer process the thickness is currently limited to about 2mm. Figure 29 below shows the structure of such an element.

Axial mode multilayer d33-mode actuators achieve higher displacements but also retain high blocking forces which are proportional to cross-sectional area as illustrated in the figure 32 underneath.

Figure 29: Axial mode multilayer actuator

Since the maximum strain is about 1X10-3 at 50V supply voltage, the absolute increase of its thickness will be about 2 m. For most practical applications it is necessary to stack several of these elements to form a so called multilayer stacked actuator as illustrated in the figure 30 below.
Figure 27: Multilayer parallel bimorph element

Figure 32: Blocking force of square stacks

TRANSVERSAL MODE (D31) ACTUATORS

Multilayer actuators (figure 33) can be produced with layer thicknesses as low as 20-40m. The manufacturing method is completely different from the classical process of sawing and electroding individual discs or plates. Because of the very thin layers of PZT, an electrical field strength of about 1kV/mm can easily be reached for a drive voltage as low as around 50V. The elongation per unit length or height is roughly the same as for of classical actuators. The difference is that the effect is reached for a much lower voltage. The performance of a transversal d31-mode type is shown in figure 34. Note that the element shortens for a drive voltage in the polarisation direction.
Bimorph Actuator Combination of 2 d31 actuators

Since the maximum strain is around 5x10-4 for 1kV/mm (as with discrete flexure elements), the general rule and formulas in this section also apply to multilayer elements. Figure 28 below shows the performance of a typical multilayer flexure mode actuator.

Poling direction

Figure 30: Various examples of stacked d33-mode actuators

Electrical field Displacment

Figure 33: Tranversal mode (D31) multilayer actuator

Figure 28: Deflection of flexure mode actuator as a function of applied voltage

AXIAL MODE MULTILAYER ACTUATORS (D33-MODE)

As with classical, axially-stacked actuators, the strain in the direction of polarisation is twice as large as it is in the transverse direction. However, to get a large absolute elongation, the dimension of the actuator in the direction of polarisation must be large as well. 28

Figure 31: Performance of a multilayer d33-mode actuator

Figure 34: Performance of a multilayer d31-mode actuator

29

NAVY 1 TYPE PIEZOELECTRIC CERAMICS

NAVY 1I TYPE PIEZOELECTRIC CERAMICS

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD Increase in T 33 @ 2KV/cm r Dielectric Loss @ 2KV/cm Increase in T 33 @ 4KV/cm r Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL
T

UNIT

PZT401 1
1470 0.002 1010 -

PZT402 1
1200 0.003 >1010 108.5 105.5

PZT403 1
1350 1475 0.003 -

PZT404 1
1450 0.004 -

PZT405 1
1450 0.003 -

PZT406 1
1325 0.0035 1010 -

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD T Increase in r 33 @ 2KV/cm Dielectric Loss @ 2KV/cm T Increase in r 33 @ 4KV/cm Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL
T

UNIT

PZT5A1 1
1875 0.02 1012 0.62 0.69 -0.34 0.67 0.45 409 -176 58 25.7 -11 3.6 2000 1370 1410 1465 930 1940 60 17.2 16.7 -5.2 9.4 15 -7.1 43.7 7750 370 -0.40 -1.60 0.20 -

PZT5A2 1
1700 1730 0.02 0.60 0.69 -0.34 0.71 374 -171 32 585 24.8 -11.4 2 38.2 64 1960 1400 1845 1880 890 75 18.8 16.4 9.4 14.4 5.3 6.1 10.6 6.9 374 250 -0.10 -0.90 -2.90 -

PZT5A3 1
1700 1730 0.02 0.60 0.69 -0.34 0.71 374 -171 32 585 24.8 -11.4 2 38.2 64 1960 1400 1845 1880 890 75 18.8 16.4 9.4 14.4 5.3 6.1 10.6 6.9 7700 365 250 0.00 -0.90 -2.90 +0.1 -

PZT5A4 1
1850 1650 0.017 5010 0.66 0.68 -0.37 0.72 460 -195 550 28 -13 37 1970 1400 2060 900 >600 100 80 18 16 45 0.35 7900 360 420 1.2 -0.10 -2.00 +0.1 >100 +0.1 -0.1

r 33 r 11

r 33 r 11

tan el el el

m m m

tan el el el

m m m %

% tan % tan

5.1 0.01 12.7 0.02

25 -

25 -

tan % tan k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 N5 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11 x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3 Tc C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

Charge Constants or Strain Constants

Voltage Constants or Stress Constants

Frequency Constants

k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

0.60 0.70 -0.35 0.67 315 -132 51 511 26.8 -12 2.8 143 2190 1636 1576 1800 1030 2080 600

0.56 0.71 -0.33 0.70 285 -122 41 495 24.8 -10.6 3.7 38 152 2180 1650 2060 2000 1040 500

0.58 0.60 -0.33 0.68 315 -135 45 26.4 -10.5 3.6 162 2120 1515 2000 990 600

0.60 -0.34 0.71 315 -135 45 24.6 -10.5 3.6 162 2110 1515 990 600

0.62 350 27.3 2160 -

0.61 -0.34 0.70 315 -130 27 -11 2200 2015 >600 80 750

Charge Constants or Strain Constants Voltage Constants or Stress Constants

Frequency Constants

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant N

15.6 12.7 -3.86 5.76 39.2 7.76 11.1 -5.44 7600

15.5 12.3 7.9 10.9 6.6 8.2 12.6 9.9 0.31 7600

16.8 13.3 11.8 5.9 7.5 8.5 0.31 7600

16.8 13.3 11.8 5.9 7.5 8.5 0.31 7600

7500

15 13 0.3 7800

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant Quality Factor Dielectric Loss Factor

Tc

E Q-1

C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

330 -

320 -

320 200 -

325 -

300 -

325 420 1.2 -

E Q-1 k C
T

k C
T

33

d33 Seconds

-1.70 -4.60 1.00 -

-1.70 -2.50 -3.40 +0.8

-2.10 -4.60 -3.40 +1.2

-2.10 -4.60 -3.40 +1.2

-2.50 -6.00 +1.5

f d33 T/33 (25oC) N Qm tan

33

minutes

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

30

31

NAVY 1I1 TYPE PIEZOELECTRIC CERAMICS

NAVY V & V1 TYPE PIEZOELECTRIC CERAMICS

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD T Increase in r 33 @ 2KV/cm Dielectric Loss @ 2KV/cm T Increase in r 33 @ 4KV/cm Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL

UNIT

PZT801 1
1000 0.004 1010 -

PZT802 1
1150 1290 0.003 1010 -

PZT804 1
1050 0.001 -

PZT805 1
1000 0.002 1010 -

PZT806 1
1250 0.003 1013 -

PZT807 1
1150 1190 0.0016 1012 -

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD T Increase in r 33 @ 2KV/cm Dielectric Loss @ 2KV/cm T Increase in r 33 @ 4KV/cm Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL

UNIT

PZT5J1 1
2600 0.02 -

PZT5H1 1
3400 0.018 -

PZT5H2 1
3400 0.025 >1011 1011 1010

r 33 r 11

r 33 r 11

tan el el el

m m m

tan el el el

m m m

% tan % tan

0.009

0.015

0.008

1.9 0.004 4.7 0.01

3.6 0.006

% tan % tan

Charge Constants or Strain Constants

Voltage Constants or Stress Constants

Frequency Constants

k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

0.51 0.55 -0.30 0.64 225 -97 31 330 25.4 -10.9 3.6 -28.9 112 2340 1700 2000 2070 1070 1000

0.54 0.55 -0.30 0.64 250 -97 31 300 24.6 -10.9 3.6 -28.9 112 2285 1700 2000 2070 1070 >517 75.8 1000

0.55 250 26.9 2245 -

0.53 -0.30 0.66 230 -100 27 -11 2350 2050 >600 80 1000

0.55 -0.31 0.71 0.45 280 -104 79 26.4 -10.9 8.3 2155 1660 1555 1780 1010 2060 1200

0.55 -0.29 0.69 0.47 260 -92.75 44.5 294 25.08 -10.11 4.86 28.82 2320 1080 2030 75 1200

Charge Constants or Strain Constants

Voltage Constants or Stress Constants

Frequency Constants

k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

0.60 0.63 -0.36 0.69 500 -220 60 670 21.7 -9.6 2.5 35 150 1980 1450 910 75

0.60 -0.35 0.72 0.50 620 -250 125 21.9 -8.7 4.4 1975 1375 1785 1430 920 1895 65

0.65 0.68 -0.39 0.75 593 -274 45 741 19.7 -9.1 1.5 26.8 68 1965 1420 1930 2000 890 65

x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant

13.5 11.5 8.5 10.1 7.4 8.7 11.8 9.9 7600

13.5 11.5 8.5 10.1 7.4 8.7 11.8 9.9 7500

7450

13 11 0.3 7800

14.7 11.7 -3.6 7.4 10.8 -4.8 30.7 7600

15.65 10.9 -3.3 -4.8 31.4 28.3 8.2 9.9 -4.2 7650

x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3

22.7 16.2 14.1 4.4 6.2 7.1 0.31 7400

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant N

21.9 17.7 -5.7 10.5 15.5 -7.6 48.5 7400

20.8 16.4 9 14.1 4.8 6.2 11.1 7.1 7450

Tc

E Q-1

C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

300 -

300 175 -

300 -

300 420 1.2 -

300 -

300 88.6 8.6

Tc

E Q-1

C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

250 140 -

200 -

195 110 -

k C
T

33

f d33 Seconds

-2.10 -4.00 0.90 -6.30 o 100 (at 25 C)

-1.50 -4.00 0.90 -6.30 o 100 (at 25 C)

-2.00 -4.50 1.00 -

-2.10 -4.10 1.10 -

-1.50 -3.50 0.75 -

k C
T

33

f d33 Seconds

-0.30 -1.10 -4.00 +0.2

-0.20 -1.50 0.30 -

-0.20 -0.60 -3.90 +0.3

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

32

33

CUSTOM PIEZOELECTRIC CERAMICS

CUSTOM PIEZOELECTRIC CERAMICS

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at approx 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD Increase in T 33 @ 2KV/cm r Dielectric Loss @ 2KV/cm Increase in T 33 @ 4KV/cm r Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL

UNIT

PZT501 1
2000 0.02 >1011 1011 1010 0.6 0.63 -0.34 0.66 405 -185 95 564 22.9 -10.5 1.9 36.4 181 1950 1420 890 75 16.4 14.4 6.1 6.9 0.31 7600 330 0.00 -0.90 0.10 -2.90 -

PZT502 1
1950 0.02 0.65 -0.35 450 -195 60 25 -11.5 2 120 1930 1400 78 80 16.1 14.1 6.2 7.1 0.31 7800 350 0.00 -3.60 0.20 -3.10 -

PZT503 1
2100 1800 0.02 5010 0.68 0.66 -0.38 0.75 500 -215 515 24 -10 33 1975 1450 1850 930 >600 80 75 18 15 39 0.3 7800 285 420 1.2 -0.50 -1.00 0.50 >300 -

PZT504 1
2000 0.015 5010 0.64 -0.37 0.74 450 -200 25 -12 2000 1900 >600 80 75 19 15 0.3 7800 270 420 1.2 -1.50 -2.00 0.50 >25 -

PZT505 1
2600 0.019 5010 0.72 610 -270 1900 60 16.5 7830 285 -

PZT506 1
2250 0.02 0.7 545 -225 1940 65 15.5 8000 300 -

PZT507 1
4400 3300 0.016 1010 0.75 -0.39 0.8 820 -360 20 -10 1925 1400 1800 >600 80 65 20 16 7800 165 420 1.2 -0.60 -1.00 0.30 >500 -3.00 -

PZT508

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at approx 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD Increase in T 33 @ 2KV/cm r Dielectric Loss @ 2KV/cm Increase in T 33 @ 4KV/cm r Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL

UNIT

PZT701 1
425 0.01 >1011 1011 1010 0.52 0.68 -0.3 0.67 153 -60 33 360 41 -16 9 50 297 2340 1750 2050 2100 1070 600 13.9 10.7 7.9 9.7 7.2 9.3 10.3 12.7 0.31 7700 350 210 0.00 0.06 -0.05 -

PZT702 1
1200 1700 0.005 0.48 -0.28 225 -100 25 21 -9.6 2260 1625 1040 500 10.9 10 9.2 10 0.31 7600 325 0.01 0.03 0.02 -

PZT703 1
1100 0.029 5010 0.63 0.68 0.37 0.73 340 -150 500 30 -10 33 2100 1500 920 >600 80 80 15 38 0.3 7800 270 420 1.2 -0.50 -0.50 0.50 >250 -

PZT407 1
1225 1400 0.0025 1010 0.64 0.70 0.38 0.74 325 -150 480 30 -12 39 2175 1620 2000 950 >600 80 1200 15 12 37 0.3 7900 315 420 1.2 -1.50 1.00 0.50 >7 10 -10

PT1 1
210 240 0.02 <0.020 0.36 <0.020 0.54 68 -3 62 70 37 -2 33 34 2046 2870 n/a 2145 1100 8.6 7.4 6.1 7.3 11.6 13.5 16.4 13.7 6900 255 130 -

PZT601 1
640 750 0.005 -

r 33 r 11

tan el el el

3900 0.02 0.71 0.72 0.41 -0.75 720 -315 90 750 18.5 -9 0.5 45 1950 1420 1880 55 22 16.4 8.8 13.9 4.9 6.1 11 7 7900 208 -

r 33 r 11

m m m %

tan el el el

m m m %

tan % tan k k15

k31

tan % tan k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 N5 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11 x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3 Tc C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

Charge Constants or Strain Constants Voltage Constants or Stress Constants

Frequency Constants

k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 N5 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

Charge Constants or Strain Constants Voltage Constants or Stress Constants

Frequency Constants

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

0.52 0.69 0.30 0.67 0.48 170 -64 310 37 -14 45 2450 1750 2150 1000 13.5 10 -3.1 -6.6 30.4 26 7.4 9 -4 26 7.4 9.8 13 11 0.31 7700 300 -

x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant Quality factor Dielectric Loss factor Tc

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant Quality factor Dielectric Loss factor

E Q-1 k C
T

C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

E Q-1 k C
33

33

N d33 T/3 (25oC) Qm tan

minute

N d33 T/3 (25oC) Qm tan

minute

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

34

35

CUSTOM PIEZOELECTRIC CERAMICS

SINGLE CRYSTAL MATERIALS

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Relative Permittivity Dielectric Loss Resistivity (at approx 25oC) Resistivity (at 100oC) Resistivity (at 200oC) ELECTRICAL - HIGH FIELD Increase in T 33 @ 2KV/cm r Dielectric Loss @ 2KV/cm Increase in T 33 @ 4KV/cm r Dielectric Loss @ 4KV/cm ELECTRO-MECHANICAL Coupling Factors

SYMBOL

UNIT

PZT5K1 1
6200 0.02 0.68 -0.40 0.75 870 -370 130 15.8 -6.8 2.2 286 1920 1380 65 20.4 16.4 8.9 14.7 4.9 6.4 8200 160 -0.50 -0.50 -

PZT5K2 1
6200 5200 0.02 0.70 -0.42 0.78 0.50 880 -401 78 16 -7.1 1.7 137 1880 68 23.2 16.6 9.1 13.7 4.3 6 10.9 7.3 8200 150 -

PZT5K4 1
7100 0.02 0.70 -0.42 0.78 0.49 950 -410 130 15.1 -6.5 2.1 273 1880 60 23.6 16.4 9.24 13.6 4.2 6.1 10.8 7.3 8200 137 -

PROPERTY
NO OF DAYS AFTER POLING
ELECTRICAL - LOW FIELD Relative Permittivity Coercive Field ELECTRO-MECHANICAL Coupling Factors Charge Constants or Strain Constants Voltage Constants or Stress Constants Frequency Constants MECHANICAL Compliances

SYMBOL

UNIT

PMN-PT28 1
4500-5500 3.0-3.3

PMN-PT30 1
5500-7000 2.5-2.8

r 33 r 11

r 33

tan el el el

EC k33 kt d33 d31 g33 g31 Nt SD33 YE33

kV/cm

m m m %

tan % tan k k15 k31 k33 kt d33 d31 dh d15 g33 g31 gh g15 dhgh N N1 N3 N5 Na N3t or N33 Ns Hoop or Nc Nt Qm SE33 SE11 SE12 SE13 SE55 SE66 SD33 SD11 SD12 S66 YE33 YE11 YD33 YD11 x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 10-12 m2/N x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 x 1010 N/m2 kg/m3 Tc C C J/kg K W/m K Gpa x 10-4 Relative change per time decade %

x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N Hz.m

0.88-0.90 >0.55 1100-1700 -850 >30 >17 0800-1900

0.90-0.94 >0.55 1700-2200 -950 >40 >15 1800-1900

Poissons Ratio Density

x 10-12 m2/N x 1010 N/m2 kg/m3

10-14 25-30 > 8.0

10-14 16-21 > 8.0

Charge Constants or Strain Constants Voltage Constants or Stress Constants

Frequency Constants

Compressive Strength Tensile Strength Quality Factor MECHANICAL Compliances

x 10-12 C/N x 10-12 C/N or m/V x 10-12 C/N x 10-12 C/N or m/V x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-3 Vm/N x 10-15 Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m Hz.m 106 Pa 106 Pa

THERMAL DATA Curie Temperature Trt Transition Temperature Approx. Operating Temp. Acoustic Impedance

Tc Trt ZA

C C C 106 kg/m2sec

143 95 5 90 28

155 85 5 80 28

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

MATERIAL CROSS REFERENCE TABLE

PREVIOUS MATERIAL
NAVY I PC4D PZT4 PZT4D PZT4D PZT4E PXE42 PC5 PZT5A PZT5A PXE59 PZT8 PZT8 PZT8L PZT8S PXE43 PC4 PC8 PZT5J PC5H PZT5H PZT5B PZT5R PXE5 PXE21 PXE50+ PXE55 PXE52 PZT5T PC5K n/a n/a PXE41 PT2 PZT7A PZT7D PXE71

CURRENT MATERIAL REFERENCE

PZT401 PZT402 PZT403 PZT404 PZT405 PZT406 PZT5A1 PZT5A2 PZT5A3 PZT5A4 PZT801 PZT802 PZT803 PZT804 PZT805 PZT806 PZT807 PZT5J1 PZT5H1 PZT5H2 PZT501 PZT502 PZT503 PZT504 PZT505 PZT506 PZT507 PZT508 PZT5K1 PZT5K2 PZT5K4 PZT407 PT1 PZT701 PZT702 PZT703

NAVY II

NAVY III

Poissons Ratio Density THERMAL DATA Curie Temperature Approx. Operating Temp. Specific Heat Thermal Conductivity Young's Modulus Internal Friction TIME STABILITY Coupling Factor Capacitance Permittivity Frequency Time Constant Quality factor Dielectric Loss factor

NAVY V NAVY VI CUSTOM

E Q-1 k C
T

N d33 T/3 (25oC) Qm tan

33

minute

Typical Values measured at 20C 1C are provided for design information only. Standard tolerances are approximately 20% of these values. Material properties are measured according to standard IEEE and DOD definitions and measuring techniques.

36

37

GLOSSARY OF TERMS

SAMPLES ORDERING DATA CHECKLIST

COMPLIANCE When you apply stress to any material, it responds by changing its dimension due to its elastic properties. The compliance witnessed in piezoelectric ceramics is different in an important way: it exhibits different compliance perpendicularly than it does along its parallel poling axis. For linear positioning applications, the most important compliance tensor elements are those in the E direction of the PZT extension: S33 for strain due to uniaxial stress along the E poling direction, and S11 for strain due to the perpendicular stress. Normally E E S33 is 25% greater than S11. As you might guess from the name, soft PZT is somewhat more compliant than hard PZT. CURIE TEMPERATURE (Tc) Curie temperature refers to the critical temperature at which crystals in the piezoelectric ceramic lose their spontaneous polarization and hence their piezoelectric property. It is defined as the temperature at which the dielectric constant is maximized when the temperature is increased. FREQUENCY CONSTANT (N) The velocity of sound that propagates through a piezoelectric ceramic has a specific value in each vibration mode when the resonance of other vibration modes is not in the vicinity. For a piezoelectric ceramic with a certain shape, the relationship of wavelength of a vibration with propagation length at the resonant point is given by equation (69). Because the sound velocity is constant, we obtain the following equations (70) and (71):

Whether you are experienced with piezoelectric materials, or not, use this checklist to organise your application data and material requirements. With this information, Morgan Electro Ceramics can help you select the most cost, quality, and design effective ceramic elements for your application. SE is an elasticity constant (compliance), and Youngs modulus is given as the inverse of compliance. For lengthwise vibrations, the Youngs modulus is given by equation 73: APPLICATION Briefly describe the device, its function and the transducer function within the device. If possible include a drawing, schematic or sketch. MATERIAL Refer to the material tables, and select the material(s) with the required characteristics. If you need assistance selecting the material, note the operating requirements of critical properties. Navy Type I: Navy Type II: Navy Type III: Navy Type V: Navy Type VI: Custom: Single Crystal: SIZE & SHAPE Refer to page 22, and review the shapes and formulae. Select the shape or shapes that satisfy the mounting and physical requirements of the application. Calculate the values of the critical properties for the selected materials, shapes, and sizes. Select the combination that satisfies the mechanical and piezoelectric requirements of the application. Tube Rod Disc Ring Plate Bar Bimorph Unimorph Actuator Transducer Special

Capacitance [pF@1kHz]: Resonant Frequency [kHz, MHz]: Vibration mode: Loss factor: d33 or d31 [pC/N]: f = (fa - fr) [kHz, MHz]: ELECTRODES Type: Silver Nickel Gold Other (describe) Placement or Configuration: Ends: ID-OD: Stripes: Wraparound: Shear plate: Polarity Markings: SPECIAL MATERIAL TESTING These tests are usually performed on lot control samples only. Note which tests, if any, should be performed on the test sample for this order. High field measurement at Capacitance Change Loss factor d33 Impedance Zr @Fr Density SPECIAL REQUIREMENTS: Serial Numbers: Other Requirements: QUANTITY Quantity required for samples: Potential quantity required for production: CONTACT DETAILS Company Name Address Town/City Postcode Individual Name Position Tel/Mobile Fax Email Web Address ATTACHMENTS List attachments such as drawings, sketches, schematics, and special notes and instructions. 39 kV/mm at 50/60Hz (for hard PZT only) % Maximum % Maximum pC/N Minimum [ ] [kg/m3]

DIELECTRIC CONSTANT The relative dielectric constant is defined as the ratio of the permittivity of the material to the permittivity of free space. This is generally measured well below the mechanical resonance. The dielectric constant is derived from the static capacitance measurements at 1 kHz using a standard impedance bridge.

MECHANICAL (Qm) This shows the sharpness of mechanical vibration at the resonant frequency. POISSONS RATIO ( ) This is defined as the ratio of the strain of polarization axis direction and the distortion of right angle direction to the polarization axis. REMANENT POLARIZATION (Pr) It is the net polarization remaining in a polycrystalline dielectric material after removal of an electric field. YOUNGS MODULUS (YE) When stress T is applied to an elastic body within the proportional elastic range, strain S is given by equation 72:

MECHANICAL CHARACTERISTICS Standard dimensions and tolerances are listed in page 22. Special dimensions and tolerances must be negotiated. All dimensions are in metric (mm). Length: Width: Thickness: Outside Diameter (OD): Inside Diameter (ID): Wall Thickness: Flatness: Other: ELECTRICAL CHARACTERISTICS These standard electrical measurements can be made on various Morgan Electro Ceramics parts. Minimum values and tolerances must be negotiated.

38

TECHNICAL PUBLICATIONS

For further information on piezoelectric ceramics, Morgan Electro Ceramics has available the following technical papers on our website: TP-23 TP-26 TP-42 TP-43 TP-46 TP-47 TP-50 TP-212 TP-214 TP-215 TP-217 TP-218 TP-219 TP-220 TP-221 TP-222 TP-223 TP-224 TP-225 TP-226 TP-228 TP-230 TP-232 TP-234 TP-235 TP-236 TP-237 TP-238 TP-240 TP-241 TP-242-1 TP-242-2 TP-242-3 TP-243 TP-244 TP-245 Measurement of piezoelectric coupling in odd ceramic shapes Two-channel cylindrical PZT ceramic transducer Piezoelectric ceramic I.F filters . Solid-state tuned circuits improve I.F amplifier reliability . A ceramic bandpass transformer and filter element An introduction to Morgan Electro Ceramics piezoelectric filters Design of piezoelectric ladder filters The electro-acoustic sensitivity of cylindrical ceramic tubes The stepped horn Speed of sound in seawater as a function of temperature, pressure and salinity A primer of ferroelectricity and piezoelectric ceramics Flexure mode piezoelectric transducer Piezoelectric high voltage generators Effects of high static stress on the piezoelectric properties of transducer materials Power capacities of piezoelectric ceramics in sonar type acoustics transducers On the meaning of g and d constant as applied to simple piezoelectric modes of vibration Useful relationships for ceramic bender Bimorphs On the meaning of piezoelectric coupling Power limitations of piezoelectric ceramics in radiating transducers Important properties of Morgan Electro Ceramics piezoelectric ceramics (PZT400, PZT5A, PZT5H, PZT800 Series) Behaviour of piezoelectric ceramics under various environmental and operation conditions of radiating sonar transducers Useful relationships for circular bender Bimorphs Properties of specialised ceramics of Morgan Electro Ceramics (PZT700, Series, PZT-6A1, PZT-6A2, PZT-6B) Procedures for measuring properties of piezoelectric ceramics The design of piezoelectric sandwich transducers Some considerations in the use of cylindrical ceramic elements in transducer design Some design considerations in the use of Bimorphs as motor transducers Piezoelectricity Piezoelectric and dielectric properties of lead Titanate Zirconate ceramics at low temperatures Thermal expansion and pyroelectricity in lead Titanate Zirconate and barium Titanate Stress sensitivity of piezoelectric ceramics: Part 1. Sensitivity to compressive stress parallel to the polar axis Stress sensitivity of piezoelectric ceramics: Part 2. Heat treatment Stress sensitivity of piezoelectric ceramics: Part 3. Sensitivity to compressive stress perpendicular to the polar axis Piezoelectric high voltage transformers General description of piezoelectric transformers Cantilever mounted PZT-5A Bimorphs

40