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Vishay Semiconductors
formerly General Semiconductor
TO-226AA (TO-92)
0.181 (4.6) min. 0.492 (12.5) 0.181 (4.6) 0.142 (3.6)
Features
PNP Silicon Epitaxial Planar Transistor for switching and amplifier applications. As complementary type, the NPN transistor 2N3904 is recommended. On special request, this transistor is also manufactured in the pin configuration TO-18. This transistor is also available in the SOT-23 case with the type designation MMBT3906.
Mechanical Data
Case: TO-92 Plastic Package Weight: approx. 0.18g Packaging Codes/Options: E6/Bulk 5K per container, 20K/box E7/4K per Ammo mag., 20K/box
Bottom View
Unit V V V mA mW W C/W C C
Thermal Resistance Junction to Ambient Air Junction Temperature Storage Temperature Range
Note: (1) Valid provided that leads are kept at ambient temperature.
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2N3906
Vishay Semiconductors
formerly General Semiconductor
Electrical Characteristics (T
Parameter
Symbol
Test Condition -VCE = 1 V, -IC = 0.1 mA -VCE = 1 V, -IC = 1 mA -VCE = 1 V, -IC = 10 mA -VCE = 1 V, -IC = 50 mA -VCE = 1 V, -IC = 100 mA -VEB = 3 V, -VCE = 30 V -VEB = 3 V, -VCE = 30 V -IC = 10 mA, -IB = 1 mA -IC = 50 mA, -IB = 5 mA -IC = 10 mA, -IB = 1 mA -IC = 50 mA, -IB = 5 mA -IC = 1 mA, IB = 0 -IC = 10 A, IE = 0 -IE = 10 A, IC = 0 -VCE = 10 V, -IC = 1 mA, f = 1 kHz -VCE = 10 V, -IC = 1 mA, f = 1 kHz -VCE = 20 V, -IC = 10 mA f = 100 MHz -VCB = 5 V, f = 100 kHz -VEB = 0.5 V, f = 100 kHz -VCE = 10 V, -IC = 1 mA f = 1 kHz -VCE = 1 V, -IC = 1 mA f = 1 kHz
Typ
Unit
DC Current Gain
hFE
Collector-Emitter Cutoff Current Emitter-Base Cutoff Current Collector Saturation Voltage Base Saturation Voltage Collector-Emitter Breakdown Voltage Collector-Base Breakdown Voltage Emitter-Base Breakdown Voltage Input Impedance Voltage Feedback Ratio Current Gain-Bandwidth Product Collector-Base Capacitance Emitter-Base Capacitance Small Signal Current Gain Output Admittance
-ICEV -IEBV -VCEsat -VBEsat -V(BR)CEO -V(BR)CBO -V(BR)EBO hie hre fT CCBO CEBO hfe hoe
nA nA V V V V V k MHz pF pF S
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2N3906
Vishay Semiconductors
formerly General Semiconductor
Electrical Characteristics (T
Parameter Noise Figure Delay Time (see fig. 1) Rise Time (see fig. 1) Storage Time (see fig. 2) Fall Time (see fig. 2)
Symbol F td tr ts tf
Test Condition -VCE = 5 V, -IC = 100 A, RG = 1 k, f = 10...15000 Hz -IB1 = 1 mA, -IC = 10 mA -IB1 = 1 mA, -IC = 10 mA, IB1 = -IB2 = 1 mA, -IC = 10 mA IB1 = -IB2 = 1 mA, -IC = 10 mA
Min
Typ
Max 4 35 35 225 75
Unit dB ns ns ns ns
Fig. 1: Test circuit for delay and rise time * total shunt capacitance of test jig and connectors
Fig. 2: Test circuit for storage and fall time * total shunt capacitance of test jig and connectors
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