STANDARDISERINGEN 1 SVERIGE ‘SYEDISH INSTITUTE FOR STANDARDS anatigganis on ‘SVENSK MATERIAL. & MEKANSTANDARD, SMS. SVENSKSTANDARD SS-ENISO 4287 es sive oa 1998-09-04, 1 4 (33) ‘© nasenAiner evens STANDARD An UPPHOVSRATTSLIGT SKYDDAT. SS HAR COPYRIGHT PA SVENSK STANDARD. EFTERTAYOX UTAN TL STAND AR FORBAUDET. Geometrical Product Specifica- tions (GPS) — Surface texture: Profile method — Terms, det ions and surface texture parameters (ISO 4287:1997) ‘The European Standard EN ISO 4287:1998 has the status of a Swedish Standard. This document contains the official English version of EN ISO 4287:1998 with a Swedish translation. ‘Swedish Standards corresponding to documents referred to in this Standard are listed in "Catalogue of Swedish Standards”, issued by SIS. The Cata- logue lists, with reference number and year of ‘Swedish approval, International and European Standards approved as Swedish Standards as well as other Swedish Standards. los 17.080; 17.040.70, Geometriska produktspecifika- tioner (GPS) -Ytstruktur: Profil- metod — Termer, definitioner och parametrar fér ytstruktur (ISO 4287:1997) Europastandarden EN ISO 4287:1998 giller som svensk standard. Detta dokument innehaller den officiella engelska versionen av EN ISO 4287:1998, med svensk Sversittning. ‘Motsvarigheten och aktualiteten i svensk standard till de publikationer som omnémns i denna stan- dard framgar av "Katalog over svensk standard”, som ges ut av SIS. I katalogen redovisas interna- tionella och europeiska standarder som faststallts som svenska standarder och dvriga gillande svenska standarder, ‘Standarder Kan bostllas hos SIS som éven lamnar al: ‘manna upplysningar om svensk och utlandsk standard Postaaress SiS, Box 6456, 119 82 STOCKHOLM Telefon: 08 - 610.20 00, Telotax 08-9077 67 Uppiysningar om sakinnehallt i standardon lémnas av SMS. Telofor: 08 - 459 56 00. Telefax 08 - 667 8 42 E post: nfo ems standard.se Prisgrupp R ‘Tryokti november 1998EUROPEAN STANDARD EN ISO 4287 NORME EUROPEENNE EUROPAISCHE NORM August 1998 los 17.040; 17.040.70 Descriptor: geometrical product specifications, surface properties, surface condition, roughness, surface waviness, texture profiles, Vocabulary English version Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters (ISO 4287:1997) Spécification géométrique des produits Geometrische Produktspezifikationen (GPS) — Etat de surface: Méthode du profil (GPS) ~ Oberfléchenbeschaffenheit: Termes, definitions et paramatres d'état de ‘Tastschnittverfahren — Benennungen, surface (ISO 4287:1997) Definiionen und Kenngré8en der Oberfiichenbeschaffenheit (ISO 4287:1997) This European Standard was approved by CEN on 26 January 1998. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date isis and bibliographical references conceming such national standards may be obtained on application to the Central Secretariat or to any CEN member. ‘The European Standards exist in three official versions (English, French, German). Aversion in any other language made by translation under the responsibilty of a CEN member into its own language and notified to the Central Secretariat has the same status as the official versions. CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Nonway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CEN European Committee for Standardization Comité Européen de Normalisation Europaisches Komitee flr Normung Central Secretariat: rue de Stassart 36, 8-1050 BRUSSELS ©1998 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members Ref. No. EN ISO 4287:1998 EPage 2 EN ISO 4287:1998 Contents Foreword Introduction .. 1 Seope 2 Normative references 8 Terms and definitions .... 3.1 General terms ... 32 Geometrical parameters terms .. 4 Surface profile parameter definitions 4.1 Amplitude parameters (peak and valley) .. 4.2 Amplitude parameters (average of ordinates) 43 Spacing parameters . 4.4 Hybrid parameters : 4.5 Curves and related parameters Annexes A Text equivalents 22 B Flowchart for surface assessment 23 © Comparison of basic terms and parameter symbols between ISO 4287-1:1984 and ISO 4287:1997 .. D__ Relation to the GPS matrix model E Bibliography 28Page 3 EN ISO 4287-1998, Foreword ‘The text of the International Standard from Technical Committee ISO/IC 213 "Dimensional and geometrical product specifications and verification” of the In- ternational Organization for Standardization (ISO) has been taken over as an European Standard by ‘Technical Committee CEN/TC 290, "Dimensional and geometrical product specification and verification’, the secretariat of which is held byDIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by February 1999, and conflicting national standards shall be withdrawn at the latest by February 1999, According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Swit, zerland and the United Kingdom. Endorsement notice The text of the International Standard ISO 9073-2:1995 has been approved by CEN as a European Standard without any modification, ‘NOTE: Normative references to International Standards are listed in annex ZA (normative). Introduction ‘This International Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences chain link 2 to the chains of standards on surface texture. For more detailed information on the relationship of this International Standard to other standards and the GPS matrix model, see annex F. Historically, the roughness profile and its parameters have been the only parts of surface texture characterization that have been well defined, A default relationship between Xe and Afis under consideration,Page/Sida 4 ENISO 4287:1998 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters 1 Scope This international Standard specifies terms, definitions ‘and parameters for the determination of surface tex. ture (roughness, waviness and primary profile) by profiling methods. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are Subject to revision, and parties to agreements based on this International Standard are encouraged to in- vestigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standards. 1SO 3274:1896, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal Characteristics of contact (stylus) instruments. 'SO 4288:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and Procedures for the assessment of surface texture. 1SO 11862:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Metro- logical characterization of phase correct filters. Geometriska produktspecifikatio- ner (GPS) —Ytstruktur: Profil- metod — Termer, definitioner och parametrar fér ytstruktur (ISO 4287:1997) 1 Omfattning Denna internationella standard specificerar termer, definitioner och parametrar for bestimmandet av ytstruktur (ytjamnhet, viigighet och priméir profil) ‘med hjalp av profilmatande metoder. 2 Bindande referenser I standarden hinvisas till fljande standarder, vilka innehaller krav som tiven utgor krav i denna internationella standard. Vid tiden for faststallelse giillde de utgavor som anges. Standarder revideras ibland och parter som gor upp avtal baserade pa denna internationella standard uppmanas att un- derséka méjligheterna att tillmpa de senaste u givorna av nedan angivna standarder. IEC- och 18O-medlemmar tillhandahiller férteckningar éver giillande internationella standarder. 180 3274:1996, Geometriska produktspecifikatio- ner (GPS) ~ Yistruktur ~ Profilmetod ~ Nominella egenskaper hos slpndlsinstrument ISO 4288:1996, Geometriska produktspecifikatio- ner (GPS) ~ Yistruktur ~ Profilmetod ~ Regler fer och forfaranden vid méitning av ytidmnhet TSO 11562:1996, Geometriska _produktspecifika: tioner (GPS) ~ Ytstruktur ~ Profilmetod ~ Metrolo isha egenskaper hos faskorrekta filter3 Terms and definitions 3.1. General terms 3.1.1 profile filter filter which separates profiles into longwave and shortwave components [ISO 11562] NOTE— There are three filters used in instruments for ‘measuring roughness, waviness and primary profiles (see figure 1). They all have the same transmission cheracter- istics, defined in ISO 11562, but different cutoff wave- lengths. filter filter which defines the intersection between the foughness and the even shorter wave components resent in a surface (see figure 1) BAZ Ac profile filter fiter which defines the intersection between the roughness and waviness components (see figure 1) 3.1.1.3 2f profile filter filter which defines the intersection between the waviness and the even longer wave components present in a surface (see figure 1) Page/Sida 5 EN ISO 4287:1998 3 Termer och definitioner 3.1 Allm&nna termer 8.11 profilfilter filter som separerar profilers langvagiga- och kort- vagiga komponenter [ISO 11562), ANM ~ Det finns tre filter som anviinds av matinstru- menten vid mitning av ytjamnhets-, vigighets- och pri- marprofiler (se figur 1). De har alla samma transmis- sionskarakteristik, som definieras i ISO 11562, men skillnaden ligger i att olika gransvaghingder anvands. BALA profilfilter 2s filter som definierar avgriinsningen mellan yt- jamnheten och komponenter i ytan med innu kor- tare vaglingder (se figur 1) B12 profilfilter Ae filter som dofinicrar avgrinsningen mellan yt- Jammhets- och vagighetskomponenter (se figur 1) BLL3 profilfilter Af filter vilket definierar avgréinsningen mellan vé- gigheten och de komponenter i ytan som har énnu lingre vaglingder (se figur 1) Yijimahotsprot Roughness profie so] Vagighetsprof Waviness profile as af Vaglings Wavelength Figur 1 ~ Transmissionsband for yljamnhets- och vagighetsprofler Figure 1 — Transmission characteristic of roughness and waviness profilesPage/Sida 6 ENISO 4287:1998 3.1.2 coordinate system that coordinate system in which surface texture parameters are defined NOTE— tis usual to use a rectengular coordinate sys- tom in which the axes form a righthanded Cartesian set, the X-axis being the direction of tracing colinear with the ‘mean line, the Y-axis also nominally lying on the real sur- face, and the Z-axis being in an outward direction (from the ‘material to the surrounding medium). This convention is ‘adopted throughout the rest ofthis International Standard, 313 real surface surface limiting the body and separating it from the surrounding medium 3.1.4 surface profile profile that results from the intersection of the real surface by a specified plane See figure 2 NOTE — In practice, it is usual to choose a plane with a ‘normal that nominally les parallel to the real surface and in a suitable direction. B12 Koordinatsystem det koordinatsystem i vilket man definierar para- metrar for ytstraktur ANM - Det ar vanligt att anviinda ett rektangulirt ko- ordinatsystem i vilket axeln formar ett kartesiskt hoger- system, med X-axeln liggande i matriktningen kolinjart ‘med medellinjen, Y-axeln sven nominellt liggande pi den verkliga ytan och Z-axeln riktad utat (frin materialet ‘mot omgivningen). Denna Konvention ar inférd i denna internationella standard. 31 verklig yta ‘yta som begréinsar en kropp och utgér dess gréins mot omgivningen Bd ym skapas i snittet mellan den verkliga ytan och ett specificerat plan Se figur 2. ANM ~ I praktiken ar det vanligast att valja ett snitt- plan vars normal ligger parallellt med den verkliga ytan ‘och jen passande riktning. Yeprot Surface profile Figur2 ~ Ytprofl Figure 2 ~ Surface profile | | |3. primary profil See ISO 3274, NOTE — The primary profile is the basis for evaluation of the primary profile parameters. 3.1.6 roughness profile profile derived from the primary profile by suppressing ‘the longwave component using the profile filter Ac; this profile is intentionally modified See figure 1 NOTES 1 The transmission band for roughness profiles is defined by the As and Ac profile filters (see ISO 11662:1996, 2.6 and 3.2) 2 The roughness profile is the basis for evaluation of the ‘roughness profile parameters. 3. The defeultreletionship between Ac and As is given in 180 3274:1996, 44 3.1.7 waviness profile profile derived by subsequent application of the profile filter Af and the profile fitter Ac to the primary profile, suppressing the longwave component using the pro- file titer 2f, and suppressing the shortwave com- ponent using the profile filter Ac; this profile is inten- tionally modified NOTES 1. Tho nominal form should first be removed from the total profile by bestfit least-squares methods, before applying the Af profile filter for separating the waviness profile. For Circular nominal form, itis recommended that the radius ‘should also be included in the least-squares optimization ‘and not held fixed to the nominal value. This procedure for ‘separating the waviness profile defines the ideal waviness ‘operator. 2. The transmission band for waviness profiles is defined by the Ac and af profi fiters (see ISO 1162:1996, 2.6 and 3.2) 3. The waviness profile is the basis for evaluation of the waviness profile parameters. Page/Sida 7 EN ISO 4287:1998 primérprofil Se ISO 8274. ANM ~ Primarprofilen utgir basen fr att berikna pri- ‘mirprofilbaserade parametrar, BL ytjamnhetsprofil profil harledd ur primarprofilen genom att under- ‘trycka de lingvagiga komponenterna med hjalp av profilfltret 2c. Denna profil ar avsiktligen modifierad Se figur 1 ANM 1 Transmissionsbandet for ytiimnhetsprofiler definie- ras av profililtren is och i.c (se ISO 11562:1996, avenitt 2.6 och 3.2). 2 Yijimnhetsprofilen utgir basen fir att beriikna yt- Jimnhetsparamotrar. 3 Det firbestimda firhAllandet mellan 2e och Ae finns angivet i ISO 3274:1996, avant 4.4 B17 vagighetsprofil profil harledd ur primérprofilen genom att anvain- da profilfilter Af och profilfilter Ac. Vagighetsprofi- len erhalls genom att undertrycka de langvagiga komponenterna med hjailp av profilfiltret Af och de kortvagiga komponenterna med hjalp av profilfilt- ret Ac, Denna profil ar avsiktligen modifierad ANM 1 Den nominella formen skall forst avlagsnas fram den totala profilen genom basta anpassning med minsta kvadratmetoden innan profilftret Af anviinds fr att separera vagighetsprofilen. For en nominellt cirkular form rekommenderas alt ven radien mediages vid op- timoringon med minsta kvadratmotodon istillet for att ansattas till det nominella viirdet, Denna metod att se- parera fram vigighetsprofilen definierar den ideala vi- ighetsoperatorn. 2 ‘Transmissionsbandet fbr vigighetsprofiler definioras av profilfiltren Ae och RE (se ISO 11562:1996, avsnitt 2.6 och 3.2). 3. Vagighetsprofilen utgor basen for att utvardera vagighetsparametrarPage/Sida 8 EN ISO 4287:1998 ‘mean line for the roughness profile line corresponding to the longwave profile component Suppressed by the profile filter 4c (See ISO 11562:1996, 3.2) 3.1.8.2 mean line for the waviness profile line corresponding to the longwave profile component suppressed by the profile filter Af (See ISO 11562:1996, 3.2) 3.1.8.3 ‘mean line for the primary profile line determined by fitting a least-squares line of nom- inal form through the primary profile 3.1.9 ‘sampling fength Ip, Ir, bw length in the direction of the X-axis used for identify- ing the irregularities characterizing the profile under evaluation NOTE— The sampling length for the roughness tr and waviness profiles fw is numerically equal to the character- istic wavelength of the profile filters Zc and Af, respactively The sampling length for primary profi, Ip, is equal to the evaluation length, 3.1.10 evaluation length hn length in the direction of the X-axis used for assessing the profile under evaluation Notes 1 The evaluation length may contain one or more sampling lengths. 2. For default evaluation lengths, see ISO 4288:1996, 4.4 180 4288 does not give defeut evaluation length for Weparameters 34.8 Medellinjer 3.1.8.4 medellinje for ytjimnhetsprofilen linje motsvarande den Lingvagiga profilkomponen- ten undertryekt av profilfilret ie (Se ISO 11562:1996, avsnitt 3.2) 318.2 medellinje for vagighetsprofilen linje motsvarande den langvagiga profilkomponen- ten undertryckt av profilfiltret Af (Se ISO 11562:1996, avsnitt 3.2) 3.183 medellinje for primarprofilen linje bestdimd genom anpassning av en minsta- kvadratlinje med nominell form genom primirpro- filen 3.1.9 referensliingd. Ip, tr; tw langd i X-axelns riktning anvaind fir identifiering av ojdimnheterna vilka karaktariserar profilen som skall utviirderas ANM - Referenslingderna fér ytiémnhetsprafilen, Ir, och vagighetsprofilen, lu, ar numeriskt lika med de karakta- ristiska vaglingderna for 2e- respektive ifiltren, Refe- rensliingden for primérprofilen, ip, ar lika med utviirde- ringslngden, 8.1.10 utviirderingsliingd In Iingd i Xriktningen anvind for att bestiimma profilen som skall utvarderas ANM. 1 Ubvarderingslangelen kan bestd ay en eller flera refe- renslingder 2 Angéende férvalda utvirderingslingder, se ISO 4268:1996, avsnitt 4.4, ISO 4288 anger inte firvalda ut- virderingslangder for W-parametrar.| | 3.2 Geometrical parameter terms 3.2.1 P-parameter parameter calculated from the primary profile 3.22 R-parameter parameter calculated from the roughness profile 3.2.3 W-parameter ‘parameter calculated from the waviness profile NOTE — The parameters defined in clause 4 can be calcu lated from any profile. The first capital letter in the par- ‘ameter symbol designates the type of the profile evaluated. For example, Ra is calculated from the roughness profile and Pris calculated from the primary profile. 3.2. Profile peak an outwardly directed {from material to surrounding medium) portion of the assessed profile connecting two adjacents points of the intersection of the profile with the X-axis 3.2.5 Profile valley an inwardly directed (from surrounding medium to material) portion of the assessed profile connecting two adjacent points of the intersection of the as- sessed profile with the X-axis 3.2.6 height andor spacing discrimination minimum height and minimum spacing of profile peaks and profile valleys of the assessed profile which should be taken into account NOTE— The minimum height of the profile peaks and valleys are usually specified as @ percentage of Pe, Re, We 0° another amplitude parameter, and the minimum spacing as 2 percentage of the sampling lenath. Page/Sida 9 EN ISO 4287:1998 3.2 Termer fér geometriska parametrar B21 P-parameter parameter berdknad ur primarprofilen 3.2.2 R-parameter parameter berdknad ur ytjamnhetsprofilen 328 W-parameter parameter beriknad ur vigighetsprofilen ANM ~ Parametrama som definieras i avenitt 4 kan beréknas ur samtliga profltyper. Den forsta versalen iparametersymbolen betecknar vilken profiltyp som ubvirderats. Ra ar exempelvis beriknad ur ytjamnhets- profilen medan Pt ar beralmad ur primirprofilen. 8.24 profiltopp en utdtriktad (fran materialet mot omgivningen) del av en profil som férbinder tvé nirliggande skarningspunkter mellan profilen och X-axeln 32.5 profildal on inatriktad (fran omgivningen mot material) del ay en profil som forbinder tva, narliggande skir- ningspunkter mellan profilen och X-axeln 3.2.6 hijd och/eller ingdupplisning minsta héjd och minsta delning mellan en profils, dalar eller toppar som skall beaktas ANM - Den minsta hajden hos profilens toppar och dalar uttrycks vanligtvis i procent av Pz, Rz, We eller en annan amplitudparameter och den minsta delningen uttrycks vanligtvis i procent av referenslingden.Page/Sida 10 EN ISO 4287:1998, 3.27 Profile element profile peak and the adjacent profile valley See figure 3 NOTE— The positive or nogative portion of the assessed profile at the beginning or end of the sampling length Should always be considered as a protile peak or es a profile valley. When determining @ number of profile elements, over several successive sampling lengths, the peaks and valleys of the assessed profile at the beginning or end of each sampling length are taken into account once only at the beginning of each sampling length 3.2.8 ordinate value 2) height of the assessed profile at any position x NOTE— The height is regarded as negative if the ordinate lies below the X-axis, and positive otherwise, 8.2.7 profilelement profiltopp och den angrinsande profildalen Se figur 3 ANM — Den positiva eller negativa delen av den utvairde- rade profilen i birjan eller i slutet av en referenslangd skall alltid raknas som en profiltopp eller som en profil- dal. Nar man raknar ett antal profilelement over ett antal referenslingder skall toppar och dalar pa den ut- virderade profilen i slutet eller bérjan av en referens- langd endast medtagas en gang och da i birjan av re- spektive referenslangd, 28 héjdkoordinat Zoe) hijd pa den utvarderade profilen i varje x-position ANM — Hajden betrakias som nogativ om den ligger under x-axeln och filjaktligen positiv ver X-axeln, Medetinie Mean ine Figur 3 ~ Profilelement Figure 3 ~ Profile elementi / } 1 j | 3.29 local slope = ox slope of the assessed profile at a position x; See figure 4. Notes 11 The numerical value of the focal slope, and thus the par- ameters Pag, Rdg and Wag, depends critically on the ordi- nate spacing AX. 2. A formula for estimating the local slope is 1 ae a. e (eg — Sted + 482143 = 485:-9 #98222 ~ 21-3) ‘The above formula should be used for the sample spacing stipulated in ISO 3274 for the fier used, where z; is the height of the ith profile point and AX is’ the spacing be- tween adjacent profile points. 3.2.10 profile peak height 2p distance between the X-axis and the highest point of ‘the profile peak See figure 3, PagelSida 11 ENISO 4287:1998 3.2.9 lokal lutning az ax den utvirderade profilens lutning i en position x, Se figur 4. ANM. 1 Det numeriska virdet fr den lokala Tutningen och fbljaktligen parametervrdena Pag, Rdg och Wg ar i hig grad bervendie av avsténdet mellan profilpunkter AX. 2 Den lokala lutningen berdknas enligtféljande formel da Fee pag ena Mena MB ein 45214 +921-9~ 203) eh $5 21g) 4521.4 ) Formeln ovan skall anviindas for det samplade avstindet faststallt i ISO 3274 for det filter som anvants, dar z, ir hhgjden hos den i-te profilpunkten och AX dr avstdndet mellan angrinsande profilpunkter. 3.2.10 profilens topphajd 2p avstindet mellan X-axeln och profiltoppens hégsta punkt Se figur 3. Figur 4 — Lokal lutning Figure 4 ~ Local slopePage/Sida 12 EN ISO 4287-1998 3.2.11 Profile valley depth 2 distance between the X-axis and the lowest point of the profile valley See figure 3. element height ‘Sum of the height of the peak and depth of the valley of a profile element See figure 3. Profile element width Xs length of the X-axis segment intersecting with the profile element See figure 3. ngth of profile at the level « Mite) ‘sum of the section lengths obtained, intersecting with ‘the profile element by a line parallel to the X-axis at @ given level, © See figure 5. 3.211 profilens daldjup aw avstdnd mellan X-axeln och profildalens légsta punkt Se figur 3. 3.212 profilelementets hojd a summan av profilelementets topphéjd och daldjup Se figur 3. 3.2.18 profilelementets bredd Xs Vangd pa X-axelsegmentet som skar profilelementet Se figur 3. 3.214 profilens materiallingd vid niva ¢ MIC) Summan av de snittlingder som erhalls da profil- clementen skairs av genom en linje parallell med X- axeln vid en given niva,¢ Se figur 5, Reterenatingd Samping fength | PMC) = Py + My Figur 5 - Materiallangd Figure 5 ~ Material ength4 Surface profile parameter definitions 4.1. Amplitude parameters (peak and valley) 444 maximum profile peak height Pp, Rp, Wp largest profile peak height Zp within a sampling length See figure 6. Feforenstingd Sampling length Page/Sida 13 EN ISO 4287:1998 4 Definitioner av ytprofilens parametrar 4.1 Amplitudparametrar (topp och dal) ALL profilens maximala topphojd Pp, Rp, Wp profilens stdrsta topphojd Zp inom en referenslingd Se figur 6, Figur 6 ~ Profilens maximala topphéjd (exempel pa en yijdmnhetsprof Figure 6 — Maximum profile peak height (axample of a roughness profilo)Page/Sida 14 ENISO 4287:1998 412 412 maximum profile valley depth profilens maximala daldjup Pv, Ry, Wy Pa Ry Wo largest profile valley depth Zv within a sampling length profilens stirsta daldjup Zu inom en referenslaingd See figure 7. Se figur 7. = Pelerenslingd ‘Sampling fength Figur 7 ~ Profilens maximala daldjup (exempel pa en ytiémnhetsproti) Figure 7 — Maximum profie vallay depth (example of a roughness profie)' | | | | | j 413 maximum height of profil Pe, Re, We sum of height of the largest profile peak height Zp and the largest profile valley depth Zv within @ sampling length See figure 8. NOTE — In ISO 4287-1:1984, the Rz symbol was used to indicate the “ten point height of irregularities”. In some countries there are surface roughness measuring instru- ments in use which measure the former Re parameter ‘Therefore, care must be taken when using existing techni. cal documents and drawings because differences between ‘esuits obtained with cifferent types of instruments are not always negligibly small 414 mean height of profile elements Pe, Re, We mean value of the profile element heights Zr within a sampling length See figure 9. NOTE— The parameters Pe, Re, We require height and spacing discrimination. if not otherwise specified, the de- fault height discrimination shall be 10 % of Pe, Re, We, spectively, and the default spacing discrimination shall be 1% of the sampling length, Both conditions shall be met Page/Sida 15 EN ISO 4287:1998 41.3 maximal profilhdjd Pe, Rz, Wz summan av hijden pa profilens stdrsta topphojd Zp och profilens stérsta daldjup Zo inom en referens- langd Se figur 8. ANM - I ISO 4287-1:1984 anviindes symbolen Re fr att ange “oregelbundenheternas tiopunktahjd”. I vissa liin- der finns ytjémnhetsmatare vilka mater enligt den tidi- gare Re-parametern. Darfir skall forsiktighet anviindas vid anvandandet av oxisterande tekniska dokument eftersom skilinaderna i matresultat vid anvindande av olika matinstrament inte alltid ar férsumbara, ALA profilelementens medelhijjd Po, Re, We medelvirdet av profilelementhéjderna Zt inom en referenslingd Po, Re,We= $24, Se figur 9. ANM — Parametrama Po, Re, We fordrarstrskljande i hij och avatand. Om detta inte framgar pa annat st 4 skall det forbestimaa srsiljandet 1 hid vara 10% av Ps, Re respektive We, och det firvalda sfrsijandet i avatdnd skall vara 1% av referenslingden. Bida dessa villkor kall uppfyllas a ke Fferonstingd Sampling lena - Figur 8 - Maximal profihdjd (exempel pa en ytiémnhetsprofl) Figure 8 ~ Maximum height of profile (example of a roughness profile)Page/Sida 16 ENISO 4287:1998 418 total height of profi Pt, Ri, We sum of the height of the largest profile peak height Zp and the largest profile valley depth Zy within the ‘evaluation length NOTES 1 Since Pi, Rr and Wr are defined over the evaluation length rather than the sampling length, the following will always be true for any profile: Pes Pe Re Re; We We 2. In the defauit case Peis equal to Pr. n this case the use Of Pris recommended. 42. Amplitude parameters (average of ordinates) 424 arithmetical mean deviation of the assessed Profil Pa, Ra, Wa arithmetic mean of the absolute ordinate values Zix) within a sampling length 1 Pa, Ra, We ‘fest with I= Ip, ror bw according to the case. ALS profilens totalhajd Pt, Rt, We summan av hdjden pa profilens stérsta topphéjd Zp och profilens stérsta daldjup Zv inom utvairde- ringslingden ANM 1 - Eftorsom Pt, Rt och We ir definierade over utvanderingslangden i stillet for referenslingsen giller foljande alti for vaxje profil: Piz Pos Rt> Re; Wea We ANM 2 ~ I det firvalda fallet ar Ps lika med Pt. I detta fall rekommenderas att Pt anvands, 4.2 Amplitudparametrar (medelvarden av or- dinater) 421 profilens aritmetiska medelavvikelse Pa, Ra, Wa aritmetiskt medelvarde av héjdkoordinaternas absolutbelopp Z(x) inom en referenskingd. 1 Pa, Ra, Wa=> Jeo med / = Ip, Ir ellor lw enligt aktuell fall. Reteronstangd _Samping length ___.| Figur 9 ~ Proflelementens hojd (exempel pa en ytiamnhetsprofi) Figure 9 — Height of profile elements (example of a roughness profile)422 root moan square deviation of the assessed Profi Pa, Ra, Wa foot mean square value of the ordinate values Zlx) within a sampling length 4.2.3 skewness of the assessed profile Pk, Rsk, Wok Quotient of the mean cube value of the ordinate values Z{x) and the cube of Pg, Rq or Wg respectively, within a sampling length st ato ae ie} NoTES 1 The above equation defines Rsk; Pak and Wsk are defined in a similar manner. 2. Psk, Rok and Wisk are measures of the asymmetry of the Probability density function of the ordinate values. 3 These parameters are strongly influenced by isolated peaks or isolated valleys, of the assessed profile Phu, Ru, Whi quotient of the mean quartic value of the ordinate values Zlx) and the fourth power of Pq, Rg or W4 re- spectively within a sampling length fa apes] NoTEs 1. The above equetion defines Riu; Phu and Whu are de- fined in a similar manner. 2 Plu, Rhu and Whe are measures of the sharpness of the probability density function of the ordinate values. 3 These parameters are strongly influenced by isolated oaks or isolated valleys, PagelSida 17 EN ISO 4287:1998 4.2.2 profilens kvadratiska medelytavvikelse Po, Ra, Wa kvadratiskt medelvarde av héjdkoordinaterna Z(x) inom en referenslingd fh am 2 Pata Wan 7 f (de med 1 =p, r eller lw enligt aktuellt fall. 42.3 profilens skevhet Psk, Rsk, Wok kvot av medelvardet av hojdkoordinaterna Z(x) i kubik och respektive Pg, Rq eller Wq i kubik inom, en referenslingd , i Rel Rg . + fa ot te ANM 1 Ekvationen ovan definierar Rsk; Psk och Wok definie- ras pi motevarande sat. 2. Pok, Rok och Wk ar matt pA asymmetrin hos héjdko- ordinaternas frekvensfrdelningskurva. 3. Dessa parametrar ar paverkas i hég grad av enstaka toppar eller enstaka dalar. 424 profilens kurtosis Phu, Ru, Wha vot av medelvardet av hojdkoordinaterna upphéjt till fyra och respektive Pg, Rg respektive Wa upp- hj till fyra inom en referenslingd a ] Rhu= | * fot oae A Ra ANM 1. Ekvationen ovan definierar Rku; Phu och Wu defini- eras pa motsvarande sat 2 Phu, Rku och Whu ar matt pa toppigheten hos hajd- ‘koordinaternas frekvensftrdelningskurva, 8 Dessa parametrar paverkas i hég grad av enstaka toppar eller enstaka dalar.Page/Sida 18 EN ISO 4287:1998 4.3, Spacing parameters 43.1 ‘mean width of the profile oloments PSm, RSm, WSm mean value of the profile element widths Xs within a sampling length Pin tm Sn = LS x, See figure 10. NOTE— The parameters PSm, RSm, WSm require height ‘and spacing discrimination. f not otherwise specified, the default height discrimination shall be 10 % of Pz, Re, We re- ‘spectively, and the default spacing discrimination shall be 1% of the sampling length. Both conditions shall be met 44. Hybrid parameters 444 root mean square slope of the assessed pro- fil Pq, Rg, WAq oot mean square value of the ordinate slopes dZ/ax, ‘within the sampling length 4.3 Delningsparametrar 43.1 profilelementens medelbredd PSm, RSm, WSm medelviirdet av profilelementens bredd Xs inom en referenskingd PSm, RSm,WSm=+S° Xs, mo Se figur 10. ANM ~ Parametrarna PSm, RSm, WSm fordrar sitrskil- Jande i héjd och avstnd. Om detta inte framgér p& an- nat sitt skall det forvalda sarskiljandet i hij vara 10 % ay Pz, Re respektive We och det firvalda sirskiljandet i avstnd skall vara 1% av referenslingden, Bada dessa villkor skall uppfyllas, 4.4 Hybridparametrar 4A profilens kvadratiska medellutning Pq, Rdg, Wag kvadratiskt medelvirde av hijdkoordinaternas lutningar dZ/AX, inom referenslingden Reforensléngd Sanyaing length Figur 10 ~ Profilelementens bredd Figure 10 — Width of profil elements4.5 Curves and related parameters NOTE — Alt curves and related parameters are defined ‘over the evaluation length rather than the sampling lenath, 8s this provides more stable curves and related paremeters 45.1 material ratio of the profile Prec), Rear), Wr) ratio of the material length of the profile elements ‘Milc) at a given level c to the evaluation length Pmr(c), Rmr(c), Wmr(c) eae 4.6.2 material ratio curve of the profile (Abbott Firestone curve) ‘curve representing the material ratio of the profile as @ function of level See figure 11. NOTE— This curve can be interpreted as the sample ‘cumulative probability function of the ordinate values Zin. within an evaluation length, Uwarderngstangd Evaluation length Page/Sida 19 EN ISO 4287:1998, 45 Kurvor och relaterade parametrar ANM ~ Alla kurvor och relaterade parametrar ar defini erade for on utvirderingslingd och inte en referenslangd efiersom detia medfr stabilare kurvor och relaterade parametrar. Pmr(o), Rrr(e), Wmr(e) forbéllandet mellan materiallngden for profilele- menten Mi(c) vid en given niva c och utviirde- ringslingden Mc) Pmr(o), Rmr(e), Wmr()= 15.2 profilens materialandelskurva (Abbott Firestone-kurva) ‘kurva representerande profilens materialandel som funktion av nivan Se figur 11, ANM ~ Denna kurva utgér den ackumulerade summan ay héjdkoordinaternas Z(x) fordelningsfunktion inom en. ubvarderingslingd, Medline G Mean ine mete. % Figur 11 — Materialandelskurva Figure 11 — Material ratio curvePage/Sida 20 EN'ISO 4287:1998 45.3 Profile section height difference Pc, RBs, Woe vertical distance between two section levels of given material rat bc = C(Rruri)~ C(Rer2}(Renr< Renr2) NOTE —The above equation defines Rée; Pée and WE aro defined in a similar manner. relative material ratio Pmr, Rene, Wear material ratio determined at a profile section level R&c, related to a reference CO Pm, Renr, Wmr = Pr, Rr, Wr (C1) where C1 = CO Rb (or Po oF Woe) ©O = ClP mr, Rmx, Winr0) See figure 12. 45.8 profilens snitthéjdsskilInad Pe, Ro, We vertikalt avstand mellan tva snittlinjer for given materialandel R& = CRmr1) - CRmr2)Rmrl < Rmr2) ANM ~ Ekvationen ovan definierar Ra; P& och Wee definieras pA motsvarande sit. ABA relativ materialandel Pm, Rr, Wr materialandel beraknad vid en snittlinje Ré& rela- tivt referens CO Pmr, Rr, Wmr = Pmr, Rrar, Wmr (CD) dae Cl = CO-Ré& (eller Pa eller We) O1Pmr0, Rmr0, Wmr0) Se figur 12, | - | =| ct lo eeao ees co men a0 ero 607 @0 | 90 100 Figur 12 - Shitthdjdsskilinad Figure 12 Profile section level separationi { | 1 i | | i t 45.5 profile height amplitude curve sample probability density function of the ordinate Z(s) within the evaluation length See figure 13, NOTE — For profile height amplitude curve parameters, 500 4.2 Page/Sida 21 EN ISO 4287:1998 45.5 profilens amplitudfordelningskurva héjdkoordinaternas Z(x) frekvensférdelningsfunk- tion inom referenslingden Se figur 13 ANM ~ Parametrar fr profilens amplitudfirdelnings- Jkurva, se avenitt 4.2. Medelinje ‘Mean tne Unvtrdoringsianga valuation length | Amptudrdelring “Amplitude density — Figur 13 — Profilens amplitudsfordoiningskurva Figure 13 — Profile height amplitude distribution curvePage/Sida 22 EN ISO 4287:1998 ‘Annex A (normative) Text equivalents In order to facilitate alphanumeric notation by means of computers, the following text equivalents are recommended: Bilaga A (tillhér standarden) Ekvivalenta beteckningar For att underlatta ett alfanumeriskt betecknings- slit medelst datorer, rekommenderas fuljande ek- vivalenta beteckningar: Parameter | Bkvivalenta beteckningar Parameter Text equivalent Pag Paq Rdg Rdg Wag Wag Pe Pac | Re Rae We Wae ie Ts 7 Te a iFPage/Sida 23 EN ISO 4287:1998 i 5 4 Annex B Bilaga B (informative) (fér information) Flowchart for surface assessment Fiédesschema for ytmatning ate i =| anpacening | i | oubutscaing | | i aa Ve for Proiegistering { TH rotginess FIA mnt ("| Prete ecorng i algorithm: ' Primagprofil Protifiter eee ; Primary profile Proto titer Characters nctions od W v Paramatar fr Vigionets- fmnbels, vigghets: Proter oe \ | Patgosim tr ton prinpoti Profs tor Waviness wagighet ‘Parameters of rough i i, roe Manse rea, weve am | Primary profiles vr. fr : [| primarpeott Primary profile ‘algorih Figur 8.41 Figure 8.1Page/Sida 24 EN ISO 4287:1998 Annex C Bilaga C (informative) (for information) Comparison of basic terms Jamforelse mellan symboler for and parameter symbols between grundlaggande termer och parametrar 1S 4287-1:1984 and ISO 4287:1997 ISO 4287-1:1984 och ISO 4287:1997 ‘Tabell C.1 - Grundliggande termer Table C.1 - Basie terms “Avenitt 1 1997 Parameter, 1997 ars utgiva 1984 ars utgiva| 1997 drs utgiva ars utgava Basic terms, 1997 edition 1984 edition | 1997 edition Clause in 1997 edition 319 |Referensliingd 7 Tp lay Ir Sampling length 3.110 |Uivarderingslingd 7 Tn Evaluation length 328 |Hojdkoordinat (rdinata) y Ze) Ordinate value 329 (Lokal lutning ~ aaax Local slope 32.10 | Profilens topphijd % tp Profile peak height 32.11 |Profilens daldjup x Profile valley depth 32.12 |Profilelementets hojd ~ Zi Profile element height 32.13 |Profilelementets bredd _ Xe Profile element width 3214 |Profilens materialiingd vid nivae Th 7) Material length of profile at the level ¢ 1) Referenslangderna fbr de tre olika profilerna benamns ip (primérprofi), li (vagigheteprofi), Ir (ytiémnhetsprofi. 1) The sampling lengths forthe three different profiles are named: [p (primary profile), lw (waviness profile), fr (roughness profile).PagelSida 25 EN ISO 4287:1998 ‘Tabell C.2 - Parametrar for ytstruktur Table C.2- Parameters of surface texture i Bovllnad inom Avsnitt i . | Determined within Sn eae 1984 drs | 1997 ars - give Parametrar, 1997 drs utgiva wpplags | upplaga [oie referee i om Parameters, 1997 edition feos eor at 5 eae tion | edition | evaluation | sampling | 1997 edition length | length” in i FProflens maximala topphejd = i 41-1 | Maximum profile height R Rp x i Profilens maximala daldjup a t 41.2 | Maximum profile valley depth a ze Maximal proto > E 413 | Maximum height ofthe profile = Bs : Profilelementens medelhijd - i 414 | Mean height ofthe profile g rs : { i F | Proilens totalheja 5 i 415 | otal height ofthe profile - oa ‘ i : Profilons artmetiska medelawvikelse s i 421 \~rithmetical mean deviation of the assessed profile | ™ | Ra : B (Profilens kvadratiska medelavikelse 2 \ so |Root mean square deviation of the assessed profile Ra 7 i 3 [Prslilons skevhet a i 423 | Shewness of the assessed profile eo - i Profilens kurtosis 5 424 | urtosis ofthe asseosed profile oe cs Profilelamentens medalbredd > 43.1 | Mean width ofthe profile elements | BS Es Profilens kvadratiska medeliutning > 447 | Root mean square slope ofthe assessed profile \ Raq’ x Profilens materialandel > 451 | Material rato ofthe profile Sed 7 Profilons anftihejdssldlinad > 453 | Profle section height difference = ae BS Relativ materialandel > 454 | Relative material ratio | Rmr es PFiopankishejd (ej langre 1S0-parameter) - __|Ten point height (deleted as an ISO parameter) . - 1) Denna referensllingd ar Ir lu och Ip Tir vespallive R-, W- och Poparametrar Ip ar Lika med In 2) Parametrar vilka dr definierade for tre profiler; primirprailer, vigighetsprofiler och ytjamnhetsprofiler. Endast para- retrar for ytjamnhetsprofloma ar angivna i tabellen, Som exempel, de tre parametrama slrvs Pa (primarprofi), Wa (eAgighetsprofi) och Ra (ytjamnhetsprofil. 1) This sampling length is I, fw and Ip for R-, W- and P-parameters respectively; Ip is equal to in. 2) Parameters which are defined for three profiles: primary profiles, waviness profile and roughness profiles. Only the roughness profile parameter is indicated in the table. As an example, the three parameters are written Pa (primary pro- file), Wa (waviness profile) and Ra (roughness profile).Page/Sida 26 EN ISO 4287:1998 Annex D (informative) Relationship to the GPS matrix model For full details about the GPS matrix model, see ISO/TR 14638, D.1. Information about this International Standard and its use 1S0 4287 is @ major rewrite and reorganization of 1SO 4267-1:1984 that, together with ISO 11862 and 10 3274, additionally defines the waviness profile, the primary profile and their parameters in a consist ent manner. D.2_ Position in the GPS matrix model This International Standard is a general GPS standard ‘that influences chain link 2 of the chains of standards ‘on roughness profile, waviness profile and primary Profile in the general GPS matrix, as graphically ilus- tated in figure D.1. D.3 Related International Standards ‘The related International Standards are those of the chains of standards indicated in figure 0.1 Bilaga D (f6r information) Férhallande till GPS-matrisen For detaljorad beskrivning av GPS-matrisen, se ISO/TR 14638 D.1_ Information om denna internationella standard och dess tillampning 1SO 4287 utgir en stérre omskrivning och omredi- gering av ISO 4287-1:1984 som tillsammans med ISO 11562 och ISO 3274 ytterligare definierar va- gighetsprofilen, primrprofilen och deras para- metrar pd ett konsekvent sat. D2 Position i GPS-matrisen Denna internationella standard ar en generell GPS-standard, vilken piverkar kedjeliink 2 i stan- dardkedjorna som behandlar ytjimnhetsprofil, vagighetsprofil och primirprofil i den generella GPS-matrisen, vilket illustreras i figur D.1. D3. Tillhérande internationella standarder Tillhrande standarder ar de i standardkedjan som anges i figur D1.PagelSida 27 EN ISO 4287:1998 Grundliiggande Gps standarder Fundamental GPS standards GLOBALA GPS-STANDARDER, Global GPS standards GENERELL GPS-MATRIS General GPS matrix Nummer pa kedjeliink (Chain link number 1 [Storlek \Size lAvstnd | [Distance IRadie |Radius [Vinkel [Angle [Form for linje oberoende av referens Form of line independent of datum {Form fir linje beroonde av referens {Form of line dependent on datum [Form fir yta oberoende av referens [Form of surface independent of datum |Form fr yta beroonde av referens [Form of surface dependent of datum [Orientering |Orientation Lage \Location Cirkuldirt kast (Circular run-out ITotalkast \Total run-out lReferenser |Datums [Ytjamnhetsprofil [Roughness profile “agighetsprofil Waviness profile [Priméprofi |Primary profile lYtdefekter |Surface imperfections [Reger lzdges Figur D4 Figure D.1Page/Sida 28 EN ISO 4287:1998, Annex E (informative) Bibliography [1] ISO/TR 14638:1995, Geometrical Product Specif- cation (GPS) — Masterplan. [2] VIM:1993, international vocabulary of basic and general terms in metrology. BIPM, IEC, IFC, ISO, IUPAC, IUPAP, OIML. Bitaga E (6r information) Litteraturforteckning [1] ISOPTR 14638:1995, Geometriska produkt- specifikationer (GPS) - Huvudplan [2] VIM - International vocabulary of basic and general terms in metrology. BIPM, IEC, IFCC, ISO, TUPAC, IUPAP, OIML-1rerercnsoeneininnnier eae sssailnes assem | Page 30 EN ISO 4287:1998 Annex ZA (normative) Normative references to international publications with their relevant European publications This Buropean Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies. Publication Year Title EN Year 180 4288 1996 Geometrical product specifica- EN ISO 4288 1997 tions (GPS) - Surface texture: Profile method ~ Rules and procedures for the assessment of surface texture 180 11562 1996 Geometrical product specifica- ENISO ‘1997 tions (GPS) - Surface texture: 11562 Profile method ~ Metrological characteristics of phase correct filter