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    Gate 2017 Ots 197 PDF

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    Shubham

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    re India's Best Institute for IES, GATE & PSUs All lndia ONLINE TEST SERIES Jr GATE - 2017 === Ff G& Es 135 ; cnet oka Deskton Laptop Tablet tos Android . 12+ 4 + 12+ 4 + @ + 30 Part Sylabus Tests _fullSylabus ots Part ylabus Tests fullSyllabus Tats _FulSylatus sts Part Syllabus Tests Basic Level Basic Level Advanced Level Advanced Level GATE MockTests Practice Tests —————— Total 6G Tests. ——_~ gOS CT] Admissions Open . 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Full Syllabus (GATE MockTest 4 6 100 Teo min | 1/3Marks Practice Test Series (30 Tests) Liane acrair ty bony My) pa Dees ed Electromagnetic Felds-Part 1 1 Practice Test-1 omutysGnatstan Dvegence cic hand poten de topaonine, | 16 25 45min | 1/3 Marks Electromagnetic Fields-Part2 2 PracticeTesta | Ssnwlonsoeme an Colosimo | 16 a5 | asmin | amare Power Systems- Part 1 Power systems Power generation concepts 2c ane dtransmssion concepts, ocean pertrmance of varsmasion ines ancl sees 6 shot 16 25 3 Practice Test-3 1/3 Marks Power Systems: Part 2 4 Practice Test-4 "Tatton methods vtape and requencycenoe ewe tarconecon, | 16 35 “Symmearcl components, metal andunsyrmetil at analy 45min | 1/3 Marks Power systems-Part3 5 Practice Test-5 Principles of over cuent ferent and distance protectin Chest 16 25 45min | 1/3 Marks estes Sytem abit conceps, aus ates ertron| 20-Aug-2016 Power Electronics-Part 1 ‘ Practice Test-6 ovals Grits smn pow eee ds 16 25 1/3 Marks Buck Boost converters Power Electronir-Part2 7 Practice Test-7 commutes yt based conver Bectenal eo Gc voage source 16 25 1/3 Marks i Power lectronics-Part3 8 Practica Tast-S ‘Single phase and three phase inverters, Sinusoidal pulse width modulation 16 25 Guin 103 Marks Electric ieuts-Part ° Practice Test-9 Network ph CL RV Node se Mash nal Tans eon 16 25 45min | 1/3Marks Electric Gircuite-Part2 10 Practice Test-10 Snail steady state ass Teves there Neto’ theorem, 16 25 45min | 1/3 Marks Supeposton theorem, Mixon power tater neon cuits-Part3 ride! eure ang volagesoutes,Twe-patt, 16 25 45min | 1/3 Marks u Pra Test-11 Signals and systems Part 1 2 Practice Test-12 “Premiers oewtineivanandcaignensrecenee, | 1S 25 45min | 1/3 Marks repestnaton of ontnuns pr sghas Signals and Systems-Part2 B Practice Test-13 Samping there, Applications of ouser Tantorm, 16 25 asmin | 1/3 Marks Electrical Machines Part 4 Practice Test-14 ean veut tesnregustion nd eficwney Tove phase transormers 16 25 connectors paral operston Aci tansarmer ecromechanel energy conversion pvc Electrical Machines: Part Lciachins spay ene errand not rataang and eversing eset 15 Practice Test-15 cpwatenana ier dwacersi sagen speeeonea feelers iicephue | 16 25 45min | 1/3 Marks ‘dicion maton rnc operon Ses peroranes aus peescharteit| elders quer ce stag ad pee coo! Electrical Machines- Part pasting pnp of inte pte induction metry, Syncvenour machines 16 Practice Test-16 ‘nde ane sent pele machines, pevfermance,epuaton ana paalel 16 25 45min | 1/3 Marks spraonel geet tring of srevonous maton deers bes 1/3 Marks 15-Sep-2016 ontrel Systems- Part v7 Practice Test-17 athematial madeing anavepresetatin of stems Feedback prep 16 25 45min | 1/3 Marks ‘rns function, Block lagrams ae Signal flew gaps control Systems- Part 2 18 Practice Test-18 “Traian and Steady tte ana near ie variant stems, Routh 16 25 1/3 Marks Control Systems-Part 3 19 Practice Test-19 oot tabi nap ag Lead ana Lea Lag compensators 16 25 1/3 Marks 210 conver Sate space made Slate anton matt a nd Electronic Measurements-Part 1 20 Practice Test-20 andgesandotentametets Messarenentotvorage, cures power energy | 16 25 45min | 1/3 Marks ahd power fate Electrical and Electronic Messurements- Part 2 21 Practice Test-21 Instrument tansfrmers, gt! votmeters and multimeter, Phase Tne 16 25 45min | 1/3 Marks ara Frequency measurement Oscloscopes Ear nas ‘Analog Electronies-Part 1 2 Practice Test-22 coaractenstis of des 81 MOSFET, simple dade crcutscbpping camping 16 25 45min | 1/3 Marks recifes Ampliflers: ang, Equlalen ec andreguenc response Analog Electronies-Part2 23 Practice Test-23 velltrs and feecbackmpliies: Operation amet Cha 16 25 1/3 Marks ‘sod appleadens Simple acverites, YEOs and Tine Digital Electronics-Part 1 24 Practice Test-24 Comboatna oie hive Demet Schmit toe 16 25 45min | 1/3 Marks 25 Practice Test-25 SeqealogecteustarpernnoscicarnDaaoineanenes | 16 25 45min | 1/3 Marks 10-Oct-2016 26 Practice Test-26 chitectre, Programming and interac 16 25 173 Marks 27 Practice Test-27 Engineering Mathematics: Part 1 16 25 45min | 1/3 Marks 28 Practice Test-28 Engineering Mathematics-Part2 16 25 45min | 1/3 Marks 29 Practice Test-29 16 25 1/3 Marks 30 Practice Test-30 General Aptitude-Part2 16 25 1/3 Marks GATE 2017 Online Test Series : Electronics & Communication Engineering One cra) or P booed ie ary br soy oe ein i mL) Ore) ees 1 BasicLevelTest-1 Networks = 50 30min | _V3Marks z BasicLevelTest-2 Conta ystems = 30 30min | 8 Marks 1-Aug-2016 2 BasicLevelTest-3 3 50 30min | _173 Marke 2 Basic Level Test Engineering Mathematice 3 50 20min | Marks 5 Basic Level Test Tlectromagnetics B 50 30min | _1a Marke < BasicLevel est ‘General Aptitude = 30 30min | _W3 Marks 16-Aug-2016 7 BasicLevel est 7 Signals & Systeme Ay 50 30min | _173 Marke 3 Basic Level est ‘analog Communication Syrteme 2 50 2 Basic Level Test Digital Communication Systems B 50 30min | _ Wa Marks 10 Basi Level est 10: Part Sylabu Digital Electrons B 30 30min | _W8 Marks 1-sep-2016 7" Basi Lavel Test= 11 Part Sabu ‘Analog Electronics Ay 50 30min | _W3 Marks 2 Microprocessors 3 50 20min | _WaMarks 5 Basic Level ert: Full Syllabus Fullyllabus Tet? s 709 Teomin | _Wa Marke 1 Basi Level est 14 Fall Sylabu FallSylabus eat s 180 Ts0min_ | _W3 Marks 16-Sep-2016 5 Bash Level Test 15: FllSylabus Full Syllabus Test 6 709 180 min | 13 Marke 6 Basic Level Tert-16:Fall Sylabu Fall ylabus esta e 709 ns 7 ‘Advance Level Test-1: Part Syllabus Networks a 50 30min | _ Wa Marks 1 ‘Advance Level Test 2 PartSylabur Control Systeme s 30 30min [_W3 Marks 1-oct-2016 ° ‘Advance Level Test 3: Part Syllabus 3 50 90min | _¥3 Marke 20 ‘Advance Level Test -47Part Syllabus Engineering Mathematice 2 50 30min | _W3 Marks 2 ‘vance Level Test-5:Part Syllabus Hlectromagnetics = 50 30min | Wa Marke 2B ‘Advance Level Test 6 Part Syllabus ‘General Aptitude s 30 somin | _1/3 Marks 16-oct-2016 2B ‘Advance Level Tet-7 | PartSylabus Signals & Systems Ay 50 30min | _¥/3 Marke 2 ‘Rdvance Level Test “8 Part Syllabus ‘analog Communication Syrteme 2 50 30min | _173 Marke 3B ‘Advance Level Test-9 Par Sylabu Digi Communication Stems = 50 S0min | _W Marks 26 "Advance Level Ter 107 Part Sylabur Digital Electronicr = 30 30min | _W3 Marks 41-Nov-2016 a ‘Advance Level Tet 17 Part Syllabus ‘Analog Electronier e 50 30min | _¥3 Marke 28 ‘Advance Level Test “12: Part Syllabus Microprocessors 2 30 30min | __W3 Marks 2 ‘ebvance Level Test-13 Full Sylabur Fulylabus Tests 700 Te0min |W Marke 3 ‘Advance Level Tet 147 Full yllabur Fall Syllabus Test 6 s 100 Ta0min_ | _13 Marks 16-Nov-2016 H ‘Advance Level Test -15 ull Syllabus Full Syllabus Test 7 6 100 veomin | _1/3 Marks 2 ‘Advance Level Test 16: Full ylabur Full Syllabus Test 6 100 80min | 1/3 Marks ere ieu lm Cr Ru ae wea ieee Rr Tee e UR rey 2 ater GATE MockTest-1 Full Slabus (GATE MockTest 6 100 180 min | 1/3 Mar 34 availability GATE Mock Test -2: Pull Syllabus GATE Mock Test 2 65 100 180 min 1/3 Marks 35 of GATE -2017, GATE Mock Test -3 : Full Syllabus: GATE Mock Test 3 6s 100 180 min 1/3 Marks 36 ‘Admit Card “GATE Mock Test -4: Full Syllabus GATE Mock Test 4 6 100 180 min 13 Marks Practice Test Series (30 Tests) Bee ey " ery array bce eo7 rs Ti a eran ty Cee CLT arr Nesork ison method sys Networktheorems: 1 Practice Test-1 _ipeporton Theveninand Noten, ax power taster Wye Dela 16 25 45min | 1/3 Marks 2 Practice Test-2 Nccwerk Thaery Part2 16 25 45min | 1/3 Marks Network Theory: Part 3 i Time domain analy of mae ined ets 3 Practice Test-3 Sluton of network equations ang Lpace anor, 6 25 1/3 Marks Network Theory: Part 4 4 Practice Test-4 Lrer2pornetonpanmecesarngpontmetantetinconssate | 16: 25 45min | 1/3 Marks Signals & Systems-Part 1 5 Practice Tests “ge ttneantrapes: ua zaouepcems | 6 as | 45min | 1/2 Marks 20-Aug-2016 - Signals & Systems-Part2 6 Practice Test-6 “Sumping theorem and apletins Continue signals: Fourie sees 16 25 1/3 Marks ‘ra Founervanrm eperentaton® Signals & Systems-Part3 i Discrete time sgnale-eete-trne Feuer into OTFT),OF FF.Z 7 Practica Test-7 Tranorm interpeation of cretetne signal bgt er design 16 25 13 Marks Flectronie Devices Part? Energy bands inst and extiseseon Cae wanspor: sion 8 Practice Test-8 ‘caren dt curent obity and ress Generation an ecombinaon 16 25 45min | 1/3 Marks phat hoe and sic Electronic Devices-Part2 9 Practice Test-9 {8 MOS apaetor MOSFET. Integrate cut fabrcation process xan 16 25 45min | 1/3 Marks ‘itn ion implantation, phology and wine CMOS proces ‘Analog Circuits-Part 1 0 Practice Test-10 ie ower aptas ipatanon droga aieespagcrits | 16 25 45min | 1/3 Marks Srl sgnl equivalent eeats of oder Analog Circuits -Part2 u Practice Test-11 1 biasing bas stabiy: small signa equvalentereuts of. singlestage | 16 25 45min | 1/3 Marks Analog Circuits Part 3 R Practice Test-12 FT blsng Smalsgnal euvaent rcs of ET. Sgle-stage FET 16 25 45min | 1/3 Marks ‘Anaeg Greats Port 8 Practice Test-13 oreeimarterCeckor aes | 16 25 | 45min | 1/3 Marks Digital Creutz Part 1 4 Practice Test-14 ‘nein tung totean dente naKamaigh ogc gates ether 16 25 ‘save CMOS implementations artnet eats code converte, wpe, decodes and PLAS 1/3 Marks Digital cireuits-Part2 18 Practice Test-15 ‘Slamachines va certers amp sede crete OC! nd DM, 16 25 45min | 1/3 Marks 15-Sep-2016 16 Practice Test-16 sit mioprocssor (05S) tecture, 16 25 45min | 1/3 Marks programming memory ara interlsng Control Systems Part 1 v7 Practice Test-17 Bui conta stem companent Feedbuck pine Tse function 16 25 45min | 1/3 Marks Control systems-Part2 18 Practice Test-18 eset and ent ay of tems 16 25 1/3 Marks tevin Rta ee Control Systems Part2 19 Practice Test-19 Lig end dg nd congestion repre Hyg bly 16 25 45min | 1/3 Marks Communications Part 20 Practice Test-20 randor rocesesassemeatn poset spect dey, popeis | 16 25 45min | 1/3Marks Communications Part 2 2 Practice Test-21 "Rosson ted vein spect of AM and speeder 16 25 45min | 1/3 Marks Communications Pats lfomaton ther envoy ma nrmaton and camel pay 2 Practice Test-22 theta Redan oor cone ion tring codes ang ed 16 2s 45min | 1/3 Marks syne ace of TOMA PDN and COMA . Communications -Purt4 23 Practice Test-23 amplitude, hase and frequency sit Keying (ASK PSK F58),ONM MAP and 16 25 1/3 Marks icon mcs Mace eseostn evening BX lectromagnetis-Part 1 Py Practice Test-24 crmsaniner | 16 25 45min | 1/3Marks Electromagnetics Part? Plane waves and prope rete ana efctn,polarzaten phate 25 Practice Test-25 ‘nd group viscty, propagation tveughvarous edi sin pth 16 25 45min | 1/3 Marks nating enpedancetanfomaten 5 parameter Sth chae 10-Oct-2016 Electromagnetics Part? 26 Practice Test-26 regen pein 16 25 1/3 Marks 27 Practice Test-27 Engineering Mathematics: Part 1 16 25 45min 1/3 Marks Cals Dire Equations Engineering Mathematics-Part 2 28 Practice Test-28 Vector Anas Let igen Coraen Anais 16 25 45min | 1/3 Marks ‘Nomercal ethos Pebabity and Sats 29 Practice Test-29 16 25 1/3 Marks 30 Practice Test-30 General Aptitude-Part2 16 25 1/3 Marks GATE 2017 Online Test Series : Computer Science Engineering Test Type Bed Cord Ques. Marks ane Peers es 1 Basic LevelTest-1:Part Syllabus yf Computation 2 50 30min | _V3Marks z Basic Level Test Par Syllabur Algorithms Ey 30 30min | 13 Marke 1-Aug-2016 3 asi Level Test=3 Part Syllabus Computer Organization and Architecare 3 50 30min | 13 Marke @ Sasi Level Test Part Syllabus Enginecring Mathematicr 2 50 30min | 173 Marke 5 Basic Level Tert-5 Part Sylabur Operating System B 30 30min | Wa Marke < Basic Level ert 6 Part Syllabus Genera Aptitude = 30 30min | Wa Marks 16-Aug-2016 7 Basi Level Test-7 Part Syllabus Databases a 30 as 7 Basic Level Test Part Syllabus gramming and Data Structures 3 50 30min | 13 Marke 7 Basic Level Tet-9 Part Syllabus Computer Networks B 30 30min | Va Marke 10 Basic Level Tet 10: Part Sylabur Distal Logie = 30 30min [_ Wa Marks 1-Sep-2016 " Basic Level Text: Part Sylabu ‘Compiler Design 3 30 30min | WA Marks a Basic Leva est 12:Part Syllabus Discrete Mathematice 3 50 30min | 1 Marks 7 Basic Level Tort 13: Full Syllabus Full yflabus ert @ 700 Te0min_ |W Marke # Basic Level Tests 14 Ful Sylabus s 780 Te0min_ | _V8 Marke 16-Sep-2016 5 Basi Lavel Test 15 Full Syabus e 700 180min_ | _173 Marke 6 asc Level Test Fall Sabu Fall Syllabus est e 100 780min_| 173 Marke 7 ‘ebvance Level Test-1 sat Sylabur of Computation B 50 30min | a Marks * "Advance Level Test 2 Part Sylabur ‘Algorithms = 30 30min | 1a Marks t-oct-2016 1° ‘Advance Level Test =: Part Syllabus Computer Organization and Architectare A 50 20min | _¥3 Marks 20 ‘Advance Level Test 4 Part Sylabus Engineering Mathematice 2 50 90min | 1/3 Marks 7 ‘Advance Level Test-5: Part Sylabur ‘Operating Sytem B 30 30min | 1/3 Marke Z ‘Advance evel Test “6: PartSylabur General Aptitude = 30 30min | 13 Marks 16-oct-2016 a ‘Advance Level Test-7 | Part Sylabus Databases a 30 ‘30min | 1/3 Marks 74 ‘Advance Level Test -@ Part Syllabus gramming and Data Structures 3 50 30min | 173 Marke 35 ‘vance Level Test-9 Part Sylabur Computer Networks B 30 30min | _ a Marks 26 "advance Level Test 107 Part Sylabur Digital Logie = 30 30min | _ Wa Marks 1-Nov-2016 27 ‘Advance Level Tet 11; Part Syllabus Compiler Design 3 30 90min | _¥3 Marks 28 ‘Advance Level Test -12: Part Sylabus Discrete Mathematics 3 50 30min | v8 Marks 2 ‘Advance Level Test-13 sFullSylabus Fulylabus Tests @ 700 Te0min_| 13 Marke 30 "Rdvance Level Test = 147 FullSylabur FallSylabus eat 6 S 780 Ta0min_ | _13 Marks Nov-2016 7H Advance Level Test ~15;Fullyabus Full Syllabus Test 7 6 100 va0min | _13Mares 2 "Advance Level Test 16: Full ylabus Fall Syllabus Test co 168 7a0min | 13 Marks eT e MC RU PA ieee RO eee UR rey 2 ater (GATE Mock Test-1:Ful Syllabus ‘GATE Mock Test] 5 100 v80min | 1/3 Marke 2 | availablity “GATE Meck Test-2 Ful Syllabus GATE MockTest2 e 180 V80min_| 173 Marke 35 | ofGare-2017 | GATE MockTert-3 Full Syllabus GATEMockText? e 700 Te0min_| 13 Marke 36 Admit Card GATE Mock Test - 4 : Full Syllabus ‘GATE Mock Test 4 65 100 13 Marks aCe ery pe Test Type Practice Test Series (30 Tests) bees i Digital Logic-Part 1 Timing Do ed 1 Practice Test-1 (Logie Function, Minimization, Combinational Circuit) 16 25 45min | 1/3 Marks Digital Logic-Part2 , 2 Practice Test-2 (Sequetil Cet Number Representation, Computer Artic) | 16 25 45min | 1/3 Marks ‘i Operating System Part 3 Practice Test-3 (Gases of 05, Proce Threae CPU Sehecling, File Sytem /OSystem)| 16 25 13 Marks Operating System-Part2 4 Practice Test-4 (Deacioc, Process synchronization, Concutency Conta) 16 25 45min | 1/3 Marks rating System - Part 5 Practice Test-5 Menon tare ne eal Memon) 16 25 45min | 1/3 Marks 20-Aug-2016 Computer Organization and Architecture - Part ‘ Practice Test-6 (introduction, Machine Inrructon, Addressing Modes, 16 25 45min | 1/3 Marks Memory Hierarchy, Secondary Memory) ‘ ‘Computer Organization and Architecture - Part 2 7 Practice Test-7 (AW & Data Path, Conta! Unt inputioutput instruction Ppeline) | 16 25 13 Marks Computer Network-Part? 8 Practice Test-8 (Physical Layer DLL, Applicaton Layer) 16 25 45min | 1/3 Marks Computer Network: Part2 ° Practice Test-9 (Networking Device, Wit PV5, Cryptography) 16 28 3 Marks 10 Practice Test-10 Sompuver Network: Fart 16 25 45 113 Marks ractice Test (Setwork Layer Transport aye min ar n Practice Test-11 (Fine Automata, Regular Language and their closure property 16 5 45min | 1/3 Marks ‘Theory of Computation Part 2 2 (PDA, Closure Property Turing Machine) 16 25 45min | 1/3 Marks ‘Theory of Computation- Part 3 B Practice Test-13 (Chomsky Werarehy Recuesbity, Countabiity, 16 25 1/3 Marks Decidaiity, complet Theory) Compiler Design -Partt “4 Practice Test-14 {iwroduction to compiler Parsing Runtime Environment) 16 25 U3 Marks Compiler Design-Part2 15 Practice Test-15 een tonic 16 25 113 Marks Databases. Part 16 Practice Test-16 {Relational Model Database Design & Normalization 16 25 45min | 1/3 Marks v7 Practice Test-17 Databases” Part? 16 25 45 113 Mark ractice Test {Relational Algebra, File Organization Indexing) min larks ‘ Databases Part " Practice Test-18 (SOL Transaction, Concurrency Contel Techniques) 16 25 13 Marks Algorithms Part 9 Practica Tast-19 (Meymptotc Analysis Recutence Relation Graph aed Algortwns) | 16 25 45min | 1% Marks Algorithme Part2 20 Practice Test-20 en a ue 16 25 45min | 1/3 Marks i Algorithm. Parts a Practice Test-21 (Dive & Conquer Technique, Miscellaneous Topics) 16 28 V3 Marks ramming and Data Structures-Part 1 2 Practice Test-22 Fae ne oat nent 16 25 45min | 1/3 Marks i jamming and Dats Structures-Part2 23 Practice Test-23 ae anae tinted te seeing) 16 25 45min | 1/3 Marks Programming and Data Structures Part 3 24 ean oat See 16 25 45min | 1/3 Marks Discrete Mathematics-Part 1 25 Practice Test-25 (Propostiona Logic Set Theory, and Functions Recurence Relation] 16 25 113 Marks 10-Oct-2016 Discrete Mathematics -Part2 26 Practice Test-26 {ombinatones, Graph Theory and Group Theory) 16 25 U3 Marks 27 Practice Test-27 Engineering Mathematics-Part1 16 25 45min | 1/3 Marks 28 Practice Test-28 Enginecring Mathematics: Part2 16 25 45min | 1/3 Marks 29 Practice Test-29 General Aptitude- Part 1 16 25 45min | 1/3 Marks 30 General Aptitude Part2 16 25 1/3 Marks GATE 2017 Online Test Series : |nstrumentation Engineering Percy ce reer aCicg Test Type assis OTe Timins Pd Le u Cra ie) 1 Basic Level Test-1: Part Sylabus Electrical Celts = 50 30min | _V3Marks 2 BasicLevelTest-2 Control ystems = 30 30min | 13 Marke 41-Aug-2016 2 Basic Level Test Sensors & Industrial Instrumentation = 30 30min | _13m ‘ BasicLevelTest-4 Engineering Mathematics = 50 30min | _¥3 Marke 5 BasicLevel Test Process Control a 50 30min | _¥8 Marks € Basic Level est ‘General Aptitude = 30 30min | _W3 Marks 16-Aug-2016 7 BasicLevelTest-7 Signals & Systeme 3 30 30min | 3m 7 Basic Level Test Measurements 3 50 30min | __¥3 Marke 7 BasicLevel ast Communieations a 50 30min | Wa Marke 0 (Level Test 107Part Syllabus Digital Electrons & Microprocesios = 30 30min | __W8 Marks 1-sep-2016 " Basie Level Test= 11: Part Sabu ‘Analog Electronics 3 30 30min | vm 2 asc Laval Test -12; ar yas ‘Optical instrumentation = 50 30min | _¥8 Marke nH Basic Level Tort: Full Syllabus FulsyllaburTeatt o 700 Taomin_| Wa Marks 1 Basic Level ext 14 Fall Sylabus Fal Syllabus Test s 180 Teomin_|_W3 Marks 5 Bash Level Test 15: Full yabus Full Syllabus Test 6 700 10min | aM 16 i Level Test 16: Fullyabur Fall ylabus esta 6 100 Ta0min_| Wa Marks 7 ‘vance Level Test 1: Par) ectrieal Creute a 50 30min | _Wa Marks 1 ‘Advance Level Test 2 PartSylabur Control ystems = 30 30min | _W3 Marks -oct-2016 ° ‘Advance Level Test -3: Part Sylabur Sensors & Industrial Instrumentation = 50 90min | _W3 Marke 20 ‘Advance Level Test “47 Part Syl Engineering Mathematice 3 50 30min | _¥3 Marks 7 ‘Advance Level Test-5:Part Syllabus Process Control B 30 s0min | _1/3 Marke 2 ‘Rdvance Level Test -6rPart Syllabus ‘General Aptitude = 30 30min | _W3 Marks 16-0ct-2016 2B ‘Advance Level Tet-7 sat Syllabus Signals & Systems 3 50 30min | 13 Marke 7 ‘Advance Level Test “8: Part Syl Measurements A 50 30min | _¥/3 Marke 35 ‘Advance Level Tet-9 Par) Communiations 3 50 30min | _W3 Marks 26 ‘advance Level Test 107 Part Sylabur Digital Electrons & Microprocessors = 30 30min | _W3 Marks 41-Nov-2016 7 ‘Advance Level Tet 17 Part Syabur ‘Analog Electronics 3 30 90min | _W3 Marke 28 ‘Advance Level Test 12: Part Syabur ‘Optical instrumentation 3 50 30min | _¥3 Marks 73 ‘ebvance Level Test-13 Full Sylabur Full ylabus Tests o 700 Te0min_|_13 Marks 30 "Advance Level Test 147 Full ylabur Falyllabus Teat6 s 180 Teomin_|_W3 Marks 16-Nov-2016 an ‘Advance Level Test 157 Full yllabus Full Syllabus Test7 6 100 Te min | 13 Marks 2 ‘Advance Level Test 16: Fllylabus Full Syllabus Test ss 108 Teoma | 13 Marks CeCe M rt Ri CL PPA ieee Cracow CMM lm ricd 2 ater GGATE Mock Test-1 Full Sabu GATE Mock Test? 6 100 veomin | V3Marks 34 | avatiaitny GATE Mock Tet 2 Full Si “GATE MockTert2 e 700 Taomin_| Wa Marks 35] ofGATE-2017 [GATE Mock Text-3 Fully “GATE MockTeHt? o 180 Ta0min_| Va Marks 36 Admit Car GATE Mock Test - 4: Full Syllabus GATE Mock Test 4 6s 100 180 min 13 Marks Practice Test Series (30 Tests) De es ee nea) pe ara ty Brom ny SLT) Electrical Circuits Part 1 supeestion Teva Neen nn owe 16 25 45min | 1/3 Marks Trance andrecerodty tears 1 Practice Test-1 Fectreal Greats: Park? 2 Practice Test-2 {ndreactvepower phasor anus impedance an arian 16 25 4smin | 1/3 Marks ‘eves and pal resonance lacur Sagrs enraton of base ‘here and sement trical Circuits: Part Worage and cunensoures Independent sependent ea and prctealviteatenships fesse ndvtor muta inductor and “apr Wartent analyse ALC crus with de xeon 3 Practice Test-3 16 25 45min | 1/3 Marks Electrical Circuits: Part 4 4 Practice Test-4 ne portand torpor newer, ring polninpedance and 16 25 45min | 1/3 Marks Signals & Systems Part 1 Contnuoustime signals Fourier seis and 5 Practice Test-5 eure transtrm representations Overetetin gna: 1" 2s 45min | 1/3Marks

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