surrot7 “The 80 4287-1997 Weiten Standera Search U conens | soe] User's Guide. The ISO 4287:1997 Written Standard Rotoronce Guide “Th scope of ramwot of 80 tandars to promi meade for goer evalua f urea oar ung fe Potters uns cy ovr rofies wih rg of soveroearncers the mutuals of ott ano wots bres cers yaar osuand roanes engor pence Norse eS WB sande ns soteanseed waysiese important in any reporting to speciy exactly how the analyss was set-up, “The 180.4287 writen standard is part ofa frame work of Geometrical Product Speciation (GPS) standards comprising 180 3274 Surface Texture: Profle method - Nominal characteristics of contact (ys) instruments 180.4287 Surface toxure: Rubs ard procedures for the assossment of surface texture ISO 4288 Surface texture: Profle method ~ Terms, dafinlions and surface texture parameters 180 11562 Surface texture: Potie method - Merrological characterise of phase correct filers 150 18610-21 Firaton ~ Linear profle titers: Gaussian Titers 180 7610-28 Filvaton- profile fiers ~ End effects 'SPIP™ helps te user to evaluate roughness of profles according to his tramework of standards, by providing relevant default Choices fr fier cut-offs and by provideg warnings and information nthe bottom ofthe Roughness Analysis pane, However, i Strongly recommended to stucy ine orginal witten standards. “The 180.4287 writen standard is available (for purchase) from ISO (wwio.org) and from various national standardization bodies, The standard has ako been elborated n various text books [97,38] an deserbed on various web pages such 23 NPL-Sotgauges [38] 4] The 180 4287 Primary, Wa ‘The Primary Profil is generated fram the raw profile as described in the general section fr profle roughness steps, In ordar to comply withthe ISO standard framework ts mandatory to subtract the nominalform ofthe faw profi and fo suppress short ‘wave lengths using a As ler according tothe nominal values ven in the ISO 3274 standard, see table below. jess and Roughness Profiles “The Roughness Profle is generated by applying a high pass Gaussian fiter according tothe ISO 11562:1996 standard, see Filters in Users Gude, and the new 180 19810-21 standard, mrimary \_|'S020562 Profile Filter ~~ ZL ~ ~~ { waviness Long waves “profile “This ter suppresses long wave lengths using the he cut-off wavelength specties inthe user interface. Hence, the Roughness Profle contains the shorter roughness components ofthe prole. In order to reduce distortions trom the fitering process atthe atpshwwwimagemet com WebHelpsDefaul.himAR oughnessAralysisRaughness!S04287 him 1