X-ray diffraction

Tutorial

1. What is the frequency (s-1) and energy per quantum (in eV) of x-ray beam of
wavelength 0.71 (MoK) and 1.54 (CuK)?

2. Calculate the short wavelength limit of continuous spectrum emitted and the
maximum energy per quantum of radiation for an X-ray tube operated at 50 kV.

3. Lead screen for the protection of personnel in X-ray laboratories are usually 1
mm thick. Calculate the transmission factor of such a screen for Cu K and Mo
K and the short wavelength radiation from a tube operated at 30 kV.

4. What voltage must be applied to a Mo-target tube in order that the emitted X-rays
excite K fluorescent radiation from a piece of copper placed in the X-ray beam.
What is the wavelength of the fluorescent radiation.

5. Filters for Co K radiation are usually made of Fe 2O3 powder rather than Fe foil. If
a filter contains 5 mg Fe2O3 / cm2, what is the transmission factor for the Co K
line? What is the intensity ratio of Co K to Co K in the filtered beam?

6. Draw the primitive cell for FCC and BCC structures and calculate their volumes.

7. Data obtained from diffraction patterns of 2 metallic samples using CuK ( =

0.1542 nm) are shown in Tables A & B. Determine the crystal structure and lattice
parameters.
8. Diffraction data obtained from 2 unknown samples using Cu-K radiation
(=0.1542 nm) are given in Tables A & B. identify the samples using the Hanawalt
method, assuming that they are single phase materials.

9. X-ray diffraction pattern (see Fig. below) using Cu-K radiation and the relevant
intensity data are shown below. Identify the sample using the Hanawalt method.

10. A diffraction pattern obtained from Si using Cu K- radiation clearly shows peak
splitting (K1 and K2); relevant information is given below. The peaks
correspond to (440), (531), (620) and (533) planes. Compute the lattice
parameter using the extrapolation method.
11. The diffraction pattern from a mixed powder sample containing Si and Cu,
analysed with Cu-K radiation ( = 0.1542 nm) shows 4 well separated peaks.
Information on the ihe integrated intensities of these peaks are given in Table A.
The peaks are attributed to (111) and (220) planes of Si and (111) and (200)
planes of Cu. Calculate the Concentrations of Cu and Si in the material.

Mass absorption coefficients and densities