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1485B
IRF9Z34N
HEXFET Power MOSFET
l Advanced Process Technology
D
l Dynamic dv/dt Rating VDSS = -55V
l 175C Operating Temperature
l Fast Switching
RDS(on) = 0.10
l P-Channel G
l Fully Avalanche Rated
Description S
ID = -19A
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
Thermal Resistance
Parameter Typ. Max. Units
RJC Junction-to-Case 2.2
RCS Case-to-Sink, Flat, Greased Surface 0.50 C/W
RJA Junction-to-Ambient 62
8/25/97
IRF9Z34N
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -55 V VGS = 0V, ID = -250A
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient -0.05 V/C Reference to 25C, I D = -1mA
RDS(on) Static Drain-to-Source On-Resistance 0.10 VGS = -10V, ID = -10A
VGS(th) Gate Threshold Voltage -2.0 -4.0 V VDS = VGS , ID = -250A
gfs Forward Transconductance 4.2 S VDS = 25V, ID = -10A
-25 VDS = -55V, VGS = 0V
IDSS Drain-to-Source Leakage Current A
-250 VDS = -44V, VGS = 0V, T J = 150C
Gate-to-Source Forward Leakage 100 V GS = 20V
I GSS nA
Gate-to-Source Reverse Leakage -100 VGS = -20V
Qg Total Gate Charge 35 ID = -10A
Q gs Gate-to-Source Charge 7.9 nC VDS = -44V
Q gd Gate-to-Drain ("Miller") Charge 16 V GS = -10V, See Fig. 6 and 13
t d(on) Turn-On Delay Time 13 VDD = -28V
tr Rise Time 55 I D = -10A
ns
t d(off) Turn-Off Delay Time 30 RG = 13
tf Fall Time 41 RD = 2.6, See Fig. 10
Between lead, D
LD Internal Drain Inductance 4.5
6mm (0.25in.)
nH G
from package
LS Internal Source Inductance 7.5
and center of die contact S
-19
(Body Diode) showing the
A
ISM Pulsed Source Current integral reverse G
-68
(Body Diode) p-n junction diode. S
Notes:
Repetitive rating; pulse width limited by ISD -10A, di/dt -290A/s, VDD V(BR)DSS ,
max. junction temperature. ( See fig. 11 ) TJ 175C
Starting TJ = 25C, L = 3.6mH Pulse width 300s; duty cycle 2%.
RG = 25, IAS = -10A. (See Figure 12)
IRF9Z34N
100 100
VGS VGS
TOP - 15V TOP - 15V
- 10V - 10V
- 8.0V - 8.0V
- 7.0V
- 6.0V - 6.0V
- 5.5V - 5.5V
- 5.0V - 5.0V
BOTT OM - 4. 5V BOTT OM - 4. 5V
10 10
-4 .5V
-4 .5V
2 0 s PU LS E W ID TH 20 s PU LSE W ID TH
T c = 2 5C A TC = 1 75C
1 1 A
0.1 1 10 100 0.1 1 10 100
-VD S , Drain-to-Source Voltage (V) -VD S , Drain-to-Source V oltage (V )
100 2.0
I D = -1 7A
R D S (o n ) , D ra in -to -S o u rc e O n R e si sta n ce
-I D , D rain -to- S our ce C urr ent ( A )
1.5
T J = 2 5 C
T J = 1 7 5 C
(N o rm a li ze d )
10 1.0
0.5
V DS = -2 5 V
2 0 s P U L S E W ID T H VG S = -10 V
1 0.0
A A
4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
1200 20
V GS = 0 V, f = 1M H z I D = -10 A
C is s = C gs + C gd , Cds SH OR TE D
800 C is s
12
600 C o ss
8
400
C rs s
4
200
FO R TEST C IR C U IT
SEE F IGU R E 1 3
0 A 0 A
1 10 100 0 10 20 30 40
-VD S , D rain-to-S ource V oltage (V) Q G , Total Gate Charge (nC)
100 1000
OPE R ATIO N IN TH IS A RE A LIMITE D
-IS D , R e ve rse D ra in C u rre n t (A )
BY R D S(o n)
-I D , D ra in C u rre n t (A )
10 100
T J = 17 5C 1 0s
T J = 25 C
100 s
1 10
1m s
T C = 2 5C
T J = 1 75C 10m s
VG S = 0 V Sin gle Pu lse
0.1 A 1 A
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1 10 100
-VS D , Source-to-D rain V oltage (V ) -VD S , Drain-to-Source V oltage (V )
VGS
D.U.T.
15 RG -
ID , Drain Current (A)
+ VDD
-10V
10 Pulse Width 1 s
Duty Factor 0.1 %
td(on) tr t d(off) tf
VGS
10%
0
25 50 75 100 125 150 175
T C , Case Temperature ( C)
90%
VDS
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10b. Switching Time Waveforms
10
(Z thJC )
D = 0.50
1
Thermal Response
0.20
0.10
0.05 PDM
0.1 0.02 SINGLE PULSE
0.01 (THERMAL RESPONSE) t1
t2
Notes:
1. Duty factor D = t1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
500
L ID
E A S , S in g le P u ls e A va la n c h e E n e rg y (m J)
VDS
TOP -4 .2A
-7.2 A
RG D .U .T 400 BO TTOM -10 A
VD D
IA S A
- 20V D R IV E R
tp 0 .0 1
300
200
15V
100
Fig 12a. Unclamped Inductive Test Circuit
0 A
25 50 75 100 125 150 175
I AS
Starting TJ , Junction T emperature (C)
tp
V(BR)DSS
50K
QG 12V .2F
.3F
-10V -
QGS QGD D.U.T. +VDS
VGS
VG
-3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRF9Z34N
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG dv/dt controlled by RG +
I SD controlled by Duty Factor "D" VDD
-
D.U.T. - Device Under Test
VGS
[VGS=10V ] ***
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
[VDD]
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
[ISD ]
Ripple 5%
0 . 9 3 ( .0 3 7 ) 0 . 5 5 (. 0 2 2 )
3 X 0 . 6 9 ( .0 2 7 ) 3X
1 .4 0 (. 0 5 5 ) 0 . 4 6 (. 0 1 8 )
3X
1 .1 5 (. 0 4 5 ) 0 .3 6 (. 0 1 4 ) M B A M 2 .9 2 (. 1 1 5 )
2 .6 4 (. 1 0 4 )
2 . 5 4 ( .1 0 0 )
2X
NO TE S :
1 D I M E N S IO N I N G & T O L E R A N C IN G P E R A N S I Y 1 4 .5 M , 1 9 8 2 . 3 O U T L IN E C O N F O R M S T O J E D E C O U T L I N E T O -2 2 0 A B .
2 C O N T R O L L I N G D IM E N S IO N : I N C H 4 H E A T S IN K & L E A D M E A S U R E M E N T S D O N O T IN C L U D E B U R R S .
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 8/97
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