Om cme | Cie [Qtr [BB ne Se + Puurnconeron #8 2 a # o TRAINING CONTENTS + What is PM + How metals are analyzed: XRF vs. OES ~ Pros cons and limitations ofboth techniques + Where and by who PML is typically done, what ic measured + Review and typical features of analyzers on the markets = + Summary and conclusions — ==) Om cme) C ie [Qtr [Bt One Se + Punrmconcron #2 8 + & o What is Positive Material Identi in (PMI) (13) of meta ys base on ther lem SMeaturement results are shown SEMA ‘ther inform of elemental Concentration in percentage andor elare [Ome See tee | mt | Qian at ee Se © Puwemeoeo 298+ 8 oe Sens wean What is Positive Material ication (PMI) (2/3) sting (HOT techie Pry tao vad crac © mere ites heat Se Punrmconcron #2 8 + & oSiete eee ee = 2 “ aeot nes Care [Ome cere teen | ome [at Bae Cn Sn wees What Techniques are used on portable PMI analyzers ? ‘XRF based on X-Ray Fruorescence + OS based Optical Emission Spectroscopy(gr ne ee = bon ann | ML | te Emon Oran = [tee | cute [atm | Puwrmconcon #2 2 + # ® Cee aT =a bon ann | ML | te Emon Oran = [tee | cute [atm | Puwrmconcon #2 2 + # ® Pea et Bibi by meaaurg the imtanaty andare [Ome oem tee | Smt | Qe Bit rans cme tt co Puwremcorwo #68 4 88 OE PT Optical Emission Spectroscopy (OES) { Extation anergy comes from a Spare Vormed between sorpte and pg spark cas the his ight converted ito opectal pattern HNN jaa the spectrums tne OES le [nalyer ean produce suaitative and “ ‘guantivative snalysie 2e, penn | TnL | tte | mes |i em | et | Ce [te | Be oN Pucca #2. + 8 @ Be Element ranges of XRF and OES analyzers = FaePuwrmconcon #2 2 + # ® fe Optical Emission vs. X-ray Fluorescence ‘on Mobile Analyzers Onn a oe Optical Emission vs. X-ray Fluorescence ‘on Mobile Analyzers lWesrersinneeded otsteteonly de roe so sea es wor yarnare [Ome See tee | mt | Qian at ee Se co Puwremcorwo #68 4 88 OE Sens wean Typical measurements done in PMI field Identify alloy name, wn erwientaon composition + Verity certain important values like penn | TnL | tte | mes |i em | et | Ce [te | Be oN Pucca #2. + 8 @ Be XRF Analyzers = | ‘nly few major players on the markets Typleal “market price” U5 530k Se op ‘curacy enough to identity grade Usage of Xray isotopes diminishing rmowslongen pieeec a case oypena TnL | tte | ns mat | te) S le |e |B ne Sr co Puwremcorwo #68 4 88 OE Sens wean XRF Analyzers and light elements fntasared ith Selmer "vac" + a year 0 inte mare introduced no + TRAINS scary ie ypeally £0.2- 1% esas + Main component: Xray tube and SS me detector ae significanty more fragile than on * ‘tandard analy a + Measurement times slightly longer; 1020 sec pena | IAL | tte | hme Cea em | etn | Ce | te |e NS Pucca #2. + 8 @ Be a fou players onthe + Bet mart rc ts = k * Shsiyeeras weight typically 20.308) —— + Separate main unit and probe =” ieco Cuwrameoeo #88 + 8 o Summary + Need to PMI is increasing due to = Need for better quality ineraase satety factors + Analyzers are much smaller and user friendly sss than before, does not require expert to use + Accuracy and reliability has increased a lot in last 5 years, especially on mobile XRF Se giaauae concamen eset oreOm cme) C ie [Qtr [Bt One Se + Punrmconcron #2 8 + & o Identification (PMI) (1/3) metal sloye based on thet elemental fompost Meaturemant results ae shown, ‘ther inform of elemental Concentration in percentage andor by speitc alloy name + PMI ie typically Held teeing method, in cflicelab encreenwent