Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73

Comparison of the methods for determination of

scintillation light yield
E. Sysoeva*, V. Tarasov, O. Zelenskaya
STC Institute for Single Crystals of the National Academy of Science of Ukraine, 60 Lenin ave., Kharkov 61001, Ukraine

Abstract

One of the most important characteristics of scintillators is the light yield. It depends not only on the properties of
scintillators, but also on the conditions of measurements. Even for widely used crystals, such as alkali halide
scintillators NaI(Tl) and CsI(Tl), light yield data, obtained by various authors, are different. Therefore, it is very
important to choose the convenient method of the light yield measurements. In the present work, methods for the
determination of the physical light yield, based on measurements of pulse amplitude, single-electron pulses and intrinsic
photomultiplier resolution are discussed. These methods have been used for the measurements of light yield of alkali
halide crystals and oxide scintillators. Repeatability and reproducibility of results were determined. All these methods
are rather complicated in use, not for measurements, but for further data processing. Besides that, they demand a
precise determination of photoreceiver’s parameters, as well as determination of light collection coefficient of
scintillation detector. Thereby, such methods should be used only for special cases of certification of reference detectors.
For routine measurements of scintillation light yields, a simple method based on comparison of signals from tested and
certificated detectors, was developed. r 2002 Elsevier Science B.V. All rights reserved.

Keywords: Scintillation detector; Measurement; Light yield; Light output; Resolution

1. Introduction Technical light yield is a ratio of total energy

The light yield is the main characteristic of
scintillation detectors. One should differentiate the
absolute light yield (scintillation efficiency) from
the technical light yield [1]. Absolute light yield (Z)
is a ratio of total energy (Ep ) of scintillation
photons to energy (E) deposited by ionizing
radiation in the scintillator:
Ep
Z¼ :
E
*Corresponding author. Tel.: +380-572-308-380; fax: +380-
572-320-207.
E-mail address: sysoeva@isc.kharkov.com (E. Sysoeva).
0168-9002/02/$ - see front matter r 2002 Elsevier Science B.V. All rights reserved.
PII: S 0 1 6 8 - 9 0 0 2 ( 0 2 ) 0 0 6 7 6 - 9
(Lp ) of scintillation photons, passing through the
window of the detector, to energy (E), deposited
by ionizing radiation in scintillator:
Lp
T¼ : ð2Þ
E
Between technical and absolute light yield exists
a relationship:
T ¼tZ ð3Þ
ð1Þ where t ¼ Lp =Ep is a light collection coefficient in
the scintillation detector.
Absolute light yield is characterized by the
number of photons (Np ) in scintillation per
1 MeV energy radiation absorbed by scintillator,
68 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73
technical light yield by the number of photons
(Npt ), passing through the window of the detector
for the same energy:
E0
Np ¼ Z ð4Þ
e
E0
Npt ¼ T ð5Þ
e sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi
where e is the average energy of scintillation
photons and E0 is an energy of absorbed radiation,
equal to 1 MeV.
The problem of measurement of the light yield is
quite complicated because of the necessity to
determine values of parameters of detectors and
used photoreceivers precisely, which introduce big
errors in the result. Ordinary practice includes
usually measurements of light output by relation-
ship of signals amplitude from tested and reference
detectors. Detectors on the base of NaI(Tl) [2],
antracene [3] or stilbene [4] are used as reference
detectors. However, because of the fact that
detector’s quality significantly varies from sample
to sample, it is necessary to measure the absolute
(or technical) light yield of reference sample and to
indicate its value under certification of detectors.
In this work, the analysis of direct methods of
measuring of detector light yield was made and the
method, based on comparison of signals from
tested and reference detectors, was worked out.
2. Analysis of methods for light yield measuring
2.1. Pulse method
Direct method for measurement of the light
yield of scintillation detector consists in measuring
of the signal amplitude (V ) at the spectrometer’s
output (pulse method). Signal amplitude and light
yield are associated by the relationship
V eC
T¼ ð6Þ
Sa  K  E  e
where C is the output capacity of the photo-
multiplier, Sa the effective anode sensibility of the
photomultiplier, K the amplification factor of the
measuring path, E the energy of gamma-radiation,
e the charge of electron, and e the energy of light
photon.
Since e; E and e values are tabular data, the
error of the light yield (DT=T) measurement is
determined by the errors of measuring of signal
amplitude (DV =V ), of output capacity (DC=C), of
anode sensibility ðDSa =Sa Þ and of amplification
factor ðDK=KÞ:
 2  2  2  2
DT DV DC DSa DK
¼ þ þ þ : ð7Þ
T V C Sa K
An estimation of instrumental error of measure-
ment of values V ; C; Sa and K was made by us.
The obtained values were equal to 0.8%, 5.3%,
2.6% and 2.2%, respectively. Instrumental error
for the determination of the light yield was equal
to 6.3%. Reproducibility of measurements (statis-
tical error) was equal to 1.5%, therefore, the total
error of the light yield measurement by pulse
method was not more than 6.5%.
To reduce the error of the light yield measure-
ment by pulse method, one can use the photo-
multiplier as a photodiode, by reading the signal
from the first dynode and by shorting the other
dynode [5]. In this case, the photomultiplier must
be calibrated by a silicon diode, under excitation
by low-energy gamma-radiation. One can reach
the same result by using a photodiode as a
photoreceiver with the same calibration [5,6]. In
the paper [6], the instrumental error of light yield
measurements was equal to 5%.
2.2. Method based on the measuring of intrinsic
resolution of the photomultiplier
Another direct method of light yield measure-
ment consists in measuring the number of photo-
electrons (Npe ) collected on the first dynode of the
photomultiplier:
Npe
Np ¼ ð8Þ
t  Sa
Npe
Npe ¼ : ð9Þ
Sa
It is known [7] that because of the statistical
nature of the processes taking place in the
photomultiplier, the intrinsic resolution (Rp ) of
 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73
the high-quality photomultiplier is determined by
the number of photoelectrons collected on the first
dynode:
sffiffiffiffiffiffiffiffiffiffiffi
8 ln 2
Rp ¼ : ð10Þ
Npe
For the number of photoelectrons per 1 MeV
energy radiation, absorbed by scintillator, from
Eq. (10) we get the relation:
5:544
Npe ¼ 2 : ð11Þ
Rp  E
One can get intrinsic resolution of the photo-
multiplier from the spectrometer’s resolution (R),
if intrinsic detector’s resolution (Rd ) is known:
qffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi
Rp ¼ R2  R2d : ð12Þ
Intrinsic detector’s resolution may be measured
by independent methods: method of homogenous
neutral light filters or method of comparison [8].
It should be noted that this method is especially
convenient for scintillators with low light yield or
for scintillators, designed for low-energy radiation
measurements (for example, for X-ray detectors).
In this case, a small signal leads us to neglect the
intrinsic resolution of the detector in comparison
with the resolution of the photomultiplier. How-
ever, this condition should be revised, for example,
by measuring of the spectrometer resolution at too
low energies. If values of the number of photons,
calculated by Eq. (10), are equal in both cases,
then the intrinsic resolution of detector may be
neglected.
Estimation of measuring error of light yield by
photomultiplier’s resolution, performed similarly
to the estimation of error of the first method,
indicated that the value of this error was not more
than 5%.
2.3. Single-electron method
The third direct method of measuring the light
yield consists in comparing the signal amplitude
from the detector with the average value of the
amplitude of the single-electron distribution of the
photomultiplier. It is needed to use a low-noise
photomultiplier, allowing picking out single-elec-
69
tron signal from the noise. This method is very
useful for detectors with very low light output,
when the resolution of spectrometer is big, or
absent at all. In the case of high light yield,
photomultiplier is connected in photodiode mode,
as stated above (the first method).
2.4. Method of comparison
The problem of the determination of light yield
may be facilitated significantly, when comparison
of signal amplitudes from tested detector and
reference detector with known light yield is carried
out. Light yield (Z; T) and light output are
associated by these relationships:
Z0 L
Z¼ ð13Þ
t
T ¼ Z0 L ð14Þ
where Z0 is the light yield of the reference sample.
For measuring the light output, the difference of
radiation spectra from tested and reference detec-
tors and their convolution with spectral sensibility
of photomultiplier photocathode have to be
considered. Besides that, it is necessary to make
corrections for decay time of scintillators.
Verification scheme for measuring of light
output in reference units for detectors of various
types and sizes was worked out by us [9]. Stilbene,
as the most stable scintillators, was chosen as a
reference sample for comparison. However, the
same principal approach may be used for other
reference scintillators.
3. Experiment and results
In the present work, light yield of standard
samples on the base of single crystals of stilbene
and NaI(Tl) were determined experimentally.
Samples with a good spectrometric quality of
cylindrical form with dimensions +40  40 mm2
were used. Crystals were packed in an aluminum
alloy container with magnesium oxide reflector.
Measurements were made using gamma-radia-
tion source 137Cs. Signal amplitude of NaI(Tl)
detector was determined by the position of
70 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73
full-absorption peak (0.662 MeV); signal ampli-
tude of stilbene was determined by the position of
the edge of Compton distribution (0.477 MeV).
Effective anode sensibility of photomultiplier was
determined by a calibrated light-measuring lamp
SI-10-300 with a strip tungsten fiber. In addition,
the reconciliation of spectrum of scintillator
radiation with spectral sensibility of photocathode
of the photomultplier was taken into considera-
tion. The output capacity of the photomultiplier
was determined by droop of pulse of scintillation
for NaI(Tl) with oscillograph. Amplification factor
of measuring path was measured by using stan-
dard pulse generator BGA-05F. Intrinsic resolu-
tion of NaI(Tl) detector was determined with the
help of homogenous neutral light filters for 137Cs
gamma-radiation, then the intrinsic resolution of
photomultiplier was calculated for the same energy
by Eq. (11). Intrinsic resolution of photomultiplier
for an energy corresponding to Compton edge was
calculated by using the ratio of peak and Compton
edge energies. Light collection coefficients were
estimated by data [9] for both detectors and
accepted to be equal to 0.7.
In Table 1, results of determination of absolute
light yield in percentage (Z) and in photons per
MeV (Np ) and of technical light yield in percentage
(T) and in photons per MeV (Npt ) of reference
detectors by three methods are shown.
As one can see from Table 1, reference detectors
have a high light yield. Light output of detectors is
determined relative to the standard sample of
stilbene (in reference units) [1]. As one can see
from Table 1, one reference unit of light yield is
equal to technical light yield of 2.3%. If the light
output of the detector in reference units (L) is
known, then it is easy to calculate the light yield by
using Eqs. (4), (5) and (13), (14).
Table 1
Light yield of the reference detectors
Method Stilbene NaI(Tl)
Z (%) Np (ph/MeV) T (%)
Pulse 3.3 10,300 2.3
By Rp 3.4 10,600 2.4
Single electron 3.1 9700 2.2
Average values 3.370.2 10,2007500 2.370.1
Thus, the method of comparison of signal
amplitude from tested and reference detectors
can be used for ordinary measurements of the
light yield.
Light yield of the CsI(Tl) crystal with dimen-
sions +25  25 mm2 was measured for checking
the adequacy of this method. The crystal was
arranged in optical contact on the photocathode of
the photomultiplier (type Hamamatsu R1307).
The crystal was surrounded with Teflon reflector
on the side. A Mylar reflector was placed on the
crystal top. The resolution of the spectrometer was
measured on the crystal absorption peak for
gamma-radiations of 137Cs, 60Am, 109Cd and
55
Fe. Intrinsic resolution of the crystal was
determined for gamma-radiation of 137Cs by the
method of homogenous neutral light filters. The
obtained value of intrinsic resolution for the
crystal (4.5%) was accepted to be the same for
all energies, since energy dependence of intrinsic
resolution may be neglected for these energies. In
Table 2, resolution of the spectrometer (R),
resolution of the photomultiplier (Rp ) and number
of photoelectrons (Npe ), collected at the first
dynode of the photomultiplier for an absorbed
energy of 1 MeV are shown.
As one can see from Table 2, results of
measurements of light yield at different energies
of absorbed radiation are in a good coincidence. In
this case, intrinsic resolution of the crystal may be
neglected for measurements with the radiation
source 55Fe only. Absolute light yield of CsI(Tl)
crystal was calculated from the data from Table 2
by Eq. (8). The coefficient of light collection is
equal to 0.7 in this case, and the effective anode
sensibility is equal to 0.15. The number of photons
in the crystal per 1 MeV energy absorbed radiation
is equal to 42 830.
Npt (ph/MeV) Z (%) Np (ph/MeV) T (%) Npt (ph/MeV)
7200 14.4 48,000 10.1 33,700
7500 16.1 53,700 11.3 37,700
6900 15.0 50,000 10.5 34,000
72007300 15.270.8 50,60073100 10.670.7 35,10072600
 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73 71

The light output of this CsI(Tl) crystal was energy. Difference of results, obtained by method
determined by the method of comparison of of comparison and by method using photomulti-
signals from tested and reference detectors also. plier resolution is equal to 3.4%, which is quite
The light output was determined by certified satisfactory.
reference NaI(Tl) detector taking into considera- As an example of applicability of these methods
tion the agreement of radiation spectra of crystals for the determination of the light yield for crystals
and spectral sensibility of photomultiplier, and with very low light yield, results of light output
time of signal collection on the photomultiplier measuring for CsI crystals with dimensions
anode. Relative light yield of the CsI(Tl) crystal 25  25  130 mm3 and PWO with dimensions
was equal to 3.1 reference units. The value of light 20  20  40 mm3 were adduced. Crystals were
output was calculated from Eqs. (4) and (13). It is surrounded with white reflector on the sides and
equal to 44 300 photons per MeV of absorbed at the top and were placed on the photomultiplier
photocathode PMT R1307 with optical contact.
The resolution of the spectrometer was measured
at absorption by CsI crystal of gamma-radiation
Table 2
Resolution and light yield of CsI(Tl) crystal
of 137Cs, 60Am and 109Cd. Because of the fact that
the light yield of PWO is very low, resolution was
Source Energy (MeV) R (%) Rp (%) Npe (pe/MeV) determined only at absorption of 137Cs gamma-
137
Cs 0.662 6.2 4.3 4529 radiation. Amplitude distributions of pulses from
60
Am 0.060 15.1 14.4 4456 PWO and single-electron pulse of photomultiplier
109
Cd 0.022 24.5 23.7 4486 R1307 are drawn in Fig. 1. Pulse amplitude ratio
55
Fe 0.006 45.8 45.6 4516
from PWO and single-electron pulse is equal to 13,
Average value 4500750
which corresponds to 19.6 photoelectrons per

137
Fig. 1. Amplitude spectrum of single-electron pulse of photomultiplier R1307 and gamma-radiation Cs absorbed in the PWO
crystal.
72 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73

MeV of absorbed energy. It should be noted that
for such low energies the ‘‘peak-to-valley’’ ratio
for full absorption peak is less than two, so the
resolution was determined from the right half of
the peak. The same spectrum was obtained for CsI
crystal at 109Cd radiation. In this case, signals ratio
is equal to 4.5, which corresponds to 205 photo-
electrons per MeV of absorbed energy. In Table 3,
resolution of the spectrometer (R) and number the
of photoelectrons (Npe ), collected at the first
dynode of the photomultiplier at absorption of
the energy equal to 1 MeV, are shown.
As one can see from Table 3, in this case (when
signal from the crystal is weak) the resolution of
the spectrometer is almost equal to the photo-
multiplier resolution. Thus, the light yield of CsI
and PWO crystals was determined by using three
methods: by spectrometer resolution, single-elec-
tron peak and by method of comparison. The
estimated values of effective anode sensibility were
equal to 0.15 and 0.25 for CsI and PWO,
respectively. The light output in reference units
was equal to 0.16 and 0.01 for CsI and PWO,
respectively. Results of light output determination
for CsI and PWO in photoelectrons (Npe ) and in
photon (Np ) per MeV of absorbed energy are
shown in Table 4.
As one can see from Table 4, results obtained by
all the three methods are in a quite fair agreement.
4. Conclusion
Thus, analysis of the three methods for the
determination of light yield of scintillation detec-
tors: pulse method, single-electron method and
method using photomultiplier resolution was
carried out. It was shown that the error of
determination of the light yield by these methods
was up to 6.5%.
Method of determination of the light yield by
comparison of pulse amplitude of tested detector
and reference sample, certified with a given
accuracy, was worked out. This method provides
results, comparable with results obtained by direct
methods, and may be applicable for certification of
scintillation production.
Acknowledgements
Authors express their thanks to Dr. A. Kudin
and Dr. M. Kosmyna for CsI and PWO crystals,
used in the experiments.

Table 3 References
Resolution and light yield of CsI crystal
[1] Yu.A. Tsirlin, M.E. Globys, E.P. Sysoyeva, Optimizatsia
Source Energy (MeV) R (%) Npe (pe/MeV) detectirovania gamma-izlucheniya scntillyatzion-numi
137 kristallami, Energoatomizdat, Moskow, 1991, p.153 (in
Cs 0.662 21.2 186
60
Am 0.060 71.5 181 Russian).
109
Cd 0.022 112.5 199 [2] Scintillation Detectors. Crismatec, Catalog, Saint-Gobain
ceramiques industrielles, March 1992.
Average value 189710
[3] Catalog Bicron, 1993.

Table 4
Light yield of CsI and PWO crystals

Method CsI PWO

Npe (pe/MeV) Np (ph/MeV) Npe (pe/MeV) Np (ph/MeV)

By Rp 189 2362 18.5 297

Single electron 205 2562 19.6 314
By comparison — 2300 — 303
Average value — 24107150 — 305710
 E. Sysoeva et al. / Nuclear Instruments and Methods in Physics Research A 486 (2002) 67–73 73

[4] GOST 23077-78 Detectory ioniziruyushchikh izlucytniy
scintillyatsionnye. Terminy, opredeleniya i bukvennye
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[5] E. Sakai, IEEE Trans. Nucl. Sci. NS-34 (1987) 418.
[6] I. Holl, E. Lorentz, G. Mageras, IEEE Trans. Nucl. Sci.
NS-35 (1988) 105.
[7] J.B. Birks, The Theory and Practice of Scintillation
Counting, Pergamon Press, Oxford, 1964, p. 513.
[8] A.Ya. Berlovskiy, E.P. Mokhir, Yu.A. Tsirlin, V.A. Shvets,
Patent 240118 USSR, Byulleten’ izobreteniy, 30, 1969.
[9] M.E. Globus, B.V. Grinev, Neorganicheskie scintillyatory.
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