USM 35X

Technical Reference and Operating Manual

Ident-Nr. 48 001
This Issue 06, 11/2007 applies to the following software versions:

USM 35X V.01.00.7x with Data Logger option: V.01.01.7x

USM 35X DAC V.01.10.7x with Data Logger option: V.01.11.7x

USM 35X S V.01.20.7x with Data Logger option: V.01.21.7x

Subject to change without notice.

First operation level
Changing the operation level:

Selecting the function group:

Selecting the function:

BASE PULS RECV aGAT bGAT

AWS or * DGS or * DAC/
Second operation level JDAC

CAL REF* TRIG MEM DATA

H Notes:
Third operation level
As a standard feature, the function
group REF can be changed over
to the function group AWS. With
the USM 35X DAC, there is also
the additional function group DAC/
JDAC; with the USM 35X S, the
function groups DAC/JDAC and
DGS are available.
MEAS MSEL LCD CFG1 CFG2 The character > after a function
indicates a double assignment.
Status symbols Key functions
Symbol Description Key Function

* Display memory is enabled (freeze),

display is stored. Switching the unit on and off
Data transfer active,
! printing or remote control Step size for gain setting
Batterie charge indicator (status of
remaining charge in steps of 10 %)
Storage (freezing) of screen display
F TOF is set to flank.
P TOF is set to peak.
Enlarged echo display over the entire
J TOF is set to jflank. screen
T T-CORR (transfer correction) function is
active Printing or transferring data
R Reference echo has been recorded
A ATT-OBJ/ATT-REF function (sound Recording measured values, saving data
attenuation is active)

LED Changing the operation level

Symbol Description
A Gate alarm Selecting the function group
R Function REJECT is active
D Function DUAL (pulser-receiver
separation) is active Selecting the function
 Contents

1 Introduction ........................................ 1-1 1.3 The USM 35X family ................................. 1-8
The different instrument versions ................. 1-8
1.1 Safety information .................................... 1-2
Special features ........................................... 1-9
Batteries ...................................................... 1-2
Software ...................................................... 1-2 1.4 How to use this manual ......................... 1-10
Defects/errors and exceptional stresses ..... 1-3 1.5 Layout and presentation in this
manual ..................................................... 1-11
1.2 Important information on
ultrasonic testing ...................................... 1-3 Attention and Note symbols ...................... 1-11
Preconditions for testing with ultrasonic Listings ..................................................... 1-11
test equipment ............................................ 1-3 Operating steps ......................................... 1-11
Operator training .......................................... 1-4
Technical test requirements ........................ 1-4 2 Standard package and
Limits of testing ........................................... 1-5 accessories ........................................ 2-1
Ultrasonic wall thickness measurement ...... 1-5
2.1 Standard package .................................... 2-3
Effect of the test object’s material ............... 1-5
Effect of temperature variations ................... 1-6 2.2 Recommended accessories ..................... 2-5
Measurement of remaining wall thickness .... 1-6
Ultrasonic evaluation of flaws ...................... 1-6
Flaw boundary method ................................ 1-6
Echo display comparison method ............... 1-7

USM 35X Issue 06, 11/2007 0-1

Contents
3 Initial start-up ...................................... 3-1
3.1 Power supply ............................................ 3-2
Operation using the power supply unit ........ 3-2
Operation using batteries ............................ 3-3
Charging the batteries ................................. 3-5
3.2 Connecting a probe .................................. 3-7
3.3 Starting the USM 35X ............................... 3-8
Switching on ................................................ 3-8
Basic initialization ....................................... 3-8
Information lines in the startup screen ......... 3-8
4 Principles of operation ...................... 4-1
4.1 Operator’s controls ................................... 4-2
4.2 Screen display .......................................... 4-3
Functions on the display ............................. 4-4
Other displays ............................................. 4-5
0-2 Issue 06, 11/2007
4.3 Keys and rotary knobs .............................. 4-6
Function keys ............................................. 4-6
On/Off key ................................................... 4-6
Special keys ................................................ 4-7
Rotary knobs ............................................... 4-8
4.4 Operational concept ................................. 4-8
Setting the functions ................................... 4-9
Alternative operation without rotary
knobs ........................................................ 4-10
4.5 Important basic settings ......................... 4-12
Selecting the language .............................. 4-12
Selecting units .......................................... 4-13
Setting the date ......................................... 4-14
Setting the time ......................................... 4-15
4.6 Basic settings of the display .................. 4-16
Selecting the color scheme ....................... 4-16
Setting the lighting .................................... 4-16
USM 35X

5 Operation ............................................ 5-1
5.1 Overview of the functions ........................ 5-2
Function groups first operating level ............ 5-3
Function groups second operating level ...... 5-3
Function groups third operating level ........... 5-4
5.2 Setting the gain ........................................ 5-5
Defining the dB incrementation for gain ....... 5-5
5.3 Adjusting the display range
(function group BASE) .............................. 5-6
RANGE (Display range) .............................. 5-6
MTLVEL (Sound velocity) ............................ 5-7
D-DELAY (Display starting point) ................ 5-7
P-DELAY (Probe delay) ............................... 5-8
5.4 Adjusting the pulser
(function group PULS) .............................. 5-9
DAMPING (Probe matching) ....................... 5-9
POWER (Intensity) ................................... 5-10
DUAL (Pulser-receiver separation) ............. 5-10
PRF-MOD (Pulse repetition frequency) ..... 5-11
USM 35X Issue 06, 11/2007
Contents
5.5 Adjusting the receiver
(function group RECV) ............................ 5-11
FINE G (Fine adjustment of gain) .............. 5-12
dBSTEP .................................................... 5-12
REJECT .................................................... 5-12
FREQU (Frequency range) ........................ 5-13
RECTIFY (Rectification) ............................ 5-13
5.6 Setting the gates
(function groups aGAT and bGAT) ........ 5-14
Tasks of the gates ..................................... 5-14
aLOGIC/bLOGIC
(Evaluation logic of the gates) ................... 5-15
aSTART/bSTART
(Starting points of the gates) ..................... 5-16
aWIDTH/bWIDTH (Width of the gates) ...... 5-16
aTHRSH/bTHRSH (Response and
measurement threshold of the gates) ........ 5-16
0-3
Contents
5.7 Calibrating the USM 35X ........................ 5-17
Calibrating the display range ..................... 5-17
Choosing the measuring point ................... 5-17
Calibration with straight- and
angle-beam probes .................................... 5-18
Calibration with dual-element (TR)
probes ....................................................... 5-21
5.8 Measuring ................................................ 5-23
General notes ............................................ 5-23
5.9 Measurement of dB difference
(function group REF) ............................... 5-25
Recording a reference echo ....................... 5-26
Deleting a reference echo .......................... 5-26
Echo comparison ...................................... 5-27
5.10 Classification of welds
(function group AWS) ............................. 5-28
Rating of welds according to AWS ............ 5-28
0-4 Issue 06, 11/2007
5.11 Calculation of flaw position
(function group TRIG) ............................. 5-31
ANGLE (Angle of incidence) ...................... 5-32
X-VALUE (X-value of the probe) ................. 5-32
COLOR ..................................................... 5-33
THICKNE (Material thickness) ................... 5-33
DIAMET (Outside diameter of the test
object) ....................................................... 5-33
5.12 Data saving
(function group MEM) ............................. 5-34
Storing a data set ...................................... 5-35
Deleting a data set .................................... 5-35
Deleting all data set .................................. 5-36
Recalling a stored data set ....................... 5-36
5.13 Dataset management
(function group DATA) ............................ 5-38
TESTINF (Storing additional information) .... 5-39
PREVIEW (Dataset preview) ..................... 5-41
DIR (Dataset directory) .............................. 5-42
SETTING (Function list) ............................ 5-42
USM 35X

5.14 Configuring the USM 35X for a test
application .............................................. 5-43
TOF (Selecting the measuring point) ......... 5-44
S-DISP (Zoomed display of reading) .......... 5-46
MAGNIFY (Gate spreading) ...................... 5-48
A-Scan (Setting the A-scan) ...................... 5-48
Configuring the measurement line ............. 5-49
Setting the display .................................... 5-50
FILLED (Echo display mode) .................... 5-51
VGA .......................................................... 5-51
SCHEME .................................................. 5-51
LIGHT (LCD backlight) ............................... 5-52
SCALE (Configuring the measurement
line) ........................................................... 5-52
5.15 General configuration ............................ 5-53
DIALOG (Selecting the language) ............. 5-53
UNIT (Selecting units of measurement) ..... 5-54
BAUD-R (Baud rate for transmission) ........ 5-55
PRINTER (Printer for test report) ............... 5-55
COPYMOD (Assignment of the key) ... 5-55
USM 35X Issue 06, 11/2007
Contents
TIME/DATE (Setting the time and date) .... 5-56
ANAMOD .................................................. 5-57
HORN ........................................................ 5-58
EVAMOD (Echo evaluation) ...................... 5-58
5.16 Other functions with special keys ......... 5-59
Freeze ....................................................... 5-59
Zooming the echo display ......................... 5-59
The key ................................................ 5-59
5.17 Status symbols and LEDs ....................... 5-60
Status symbols ......................................... 5-60
LEDs ......................................................... 5-60
5.18 Distance-amplitude curve
(only USM 35X DAC and USM 35S) ....... 5-61
DACMOD (Activating DAC/TCG) ............... 5-62
DACECHO (Recording reference curve) .... 5-63
T-CORR (Sensitivity correction) ................. 5-64
OFFSET (Distance of multiple DAC) ......... 5-65
Echo evaluation with DAC ......................... 5-65
0-5
Contents
5.19 Distance-amplitude curve according
to JIS Z3060-2002 (only USM 35X DAC
and USM 35S) .......................................... 5-67
DACMOD (Activating DAC according to
JIS) ............................................................ 5-68
DACECHO (Recording reference curve) .... 5-69
BOLDLI (Choice of a registration curve) ..... 5-71
T-CORR (Sensitivity correction) ................. 5-71
OFFSET (Distance of multiple DAC) ......... 5-72
Echo evaluation with DAC ......................... 5-72
5.20 Evaluation according to the DGS
method (only USM 35X S) ...................... 5-74
Measuring with DGS ................................. 5-74
Validity of the DGS method ....................... 5-76
Selecting the DGS mode .......................... 5-78
Default settings for the DGS
measurement ............................................ 5-78
Recording the reference echo and
displaying the DGS curve .......................... 5-80
Evaluation of reflectors .............................. 5-81
0-6
Transfer correction ..................................... 5-83
Sound attenuation ..................................... 5-83
Locks, error messages ............................. 5-86
6 Documentation .................................. 6-1
6.1 Printing data ............................................. 6-2
Preparing the printer .................................... 6-2
Preparing the USM 35X ............................... 6-2
Printing ........................................................ 6-3
6.2 Documentation with UltraDOC ................ 6-4
7 Maintenance and care ....................... 7-1
7.1 Care of the instrument ............................. 7-2
7.2 Care of the batteries ................................. 7-3
Care of the batteries .................................... 7-3
Charging the batteries ................................. 7-3
How to handle alkaline batteries .................. 7-4
Issue 06, 11/2007 USM 35X

7.3 Maintenance ............................................. 7-5
7.4 Recycling ................................................... 7-6
General view of the device ........................... 7-6
Materials for separate disposal ................... 7-8
Further materials and components ............ 7-10
Recycling data of master device ................ 7-12
8 Interfaces and peripherals ................ 8-1
8.1 Interfaces ................................................... 8-2
8.2 I/O interface .............................................. 8-4
Contact assignment of the LEMO-1-B
socket ......................................................... 8-5
8.3 RS 232 interface ........................................ 8-6
Contact assignment of the Sub-D socket .... 8-6
8.4 RGB interface ............................................ 8-7
USM 35X Issue 06, 11/2007
Contents
8.5 Data exchange .......................................... 8-7
Connecting a printer or a PC ....................... 8-7
Activation of serial communication .............. 8-8
Printing data ................................................ 8-8
8.6 Remote control ......................................... 8-9
Syntax and timing ..................................... 8-11
Functions and remote control codes ......... 8-17
Other remote control codes ....................... 8-24
Control codes for the rotary knobs/
function keys ............................................. 8-26
9 Appendix ............................................ 9-1
9.1 Function directory .................................... 9-2
9.2 EC declaration of conformity ................... 9-7
9.3 Manufacturer/Service addresses ............ 9-8
9.4 Spare parts list ........................................ 9-10
0-7
Contents

10 Changes ........................................... 10-1

11 Index ................................................. 11-1

0-8 Issue 06, 11/2007 USM 35X

 Introduction 1

USM 35X Issue 06, 11/2007 1-1

Introduction
1.1 Safety information
The USM 35X has been designed and tested according
to DIN EN 61 010 Part 1, 2001, Safety requirements for
electrical measuring, control and lab equipment, and
was technically in perfectly safe and faultless condition
when leaving the manufacturing works.
In order to maintain this condition and to ensure a safe
operation, you should urgently read the following safety
information before putting the instrument into operation.
A Attention:
The USM 35X is an instrument for materials testing.
Any use for medical applications or other purposes
is not allowed!
The USM 35X may only be used in industrial envi-
ronments!
The USM 35X is waterproof according to IP 66. The
USM 35X can be operated with batteries or a power
supply unit.
The power supply unit has the electrical safety class II.
1-2 Issue 06, 11/2007
Safety information
Batteries
For the battery operation of the USM 35X, we recom-
mend the use of a lithium-ion battery. The operation
using alkaline batteries, NiMH or NiCad cells is likewise
possible. You should only use the products recom-
mended by us for the battery operation.
You can charge the lithium-ion battery within the instru-
ment itself or in an external battery charger. If you want
to use NiMH or NiCad cells, you have to charge them in
an external battery charger.
As soon as you connect the power supply unit to the
USM 35X, the battery power supply is interrupted. If a
lithium-ion battery is inserted, the charging process
starts automatically when you connect the instrument
to the mains supply. Please refer to chapter 3.1 on
power supply, and to chapter 7 on how to handle
batteries.
Software
According to the current state of the art, software is
never completely free from errors. Before using any
software-controlled test equipment, please make sure
USM 35X
Safety information
that the required functions operate perfectly in the in-
tended combination.
If you have any questions about the use of your test
equipment, please contact your nearest representative
of GE Inspection Technologies.
Defects/errors and exceptional stresses
If you have reason to believe that a safe operation of
your USM 35X is no longer possible, you have to dis-
connect the instrument and secure it against uninten-
tional reconnection. Remove the batteries if necessary.
A safe operation is e.g. no longer possible
• if the instrument shows visible damages,
• if the instrument no longer operates perfectly,
• after prolonged storage under adverse conditions
(e.g. exceptional temperatures and/or especially high
air humidity, or corrosive environmental conditions),
• after being subjected to heavy stresses during trans-
portation.
USM 35X Issue 06, 11/2007
Introduction
1.2 Important information on
ultrasonic testing
Please read the following information before using your
USM 35X. It is important that you understand and ob-
serve this information to avoid any operator errors that
might lead to false test results. This could result in per-
sonal injuries or damages to property.
Preconditions for testing with ultrasonic
test equipment
This operating manual contains essential information on
how to operate your test equipment. In addition, there
are a number of factors which affect the test results. A
description of these factors would go beyond the scope
of an operating manual. The following list therefore only
mentions the three most important conditions for a safe
and reliable ultrasonic inspection:
• the operator training
• the knowledge of special technical test requirements
and limits
• the choice of appropriate test equipment.
1-3
Introduction
Operator training
The operation of an ultrasonic test device requires a
proper training in ultrasonic test methods.
A proper training comprises for example adequate
knowledge of:
• the theory of sound propagation
• the effects of sound velocity in the test material
• the behavior of the sound wave at interfaces be-
tween different materials
• the propagation of the sound beam
• the influence of sound attenuation in the test object
and the influence of surface quality of the test ob-
ject.
Lack of such knowledge could lead to false test results
with unforeseeable consequences. You can contact for
example NDT societies or organizations in your country
(DGZfP in Germany; ASNT in the USA), or also GE
Inspection Technologies, for information concerning
existing possibilities for the training of ultrasonic in-
spectors as well as on the qualifications and certifi-
cates that can finally be obtained.
1-4 Issue 06, 11/2007
Important information on ultrasonic testing
Technical test requirements
Every ultrasonic test is subject to specific technical
test requirements. The most important ones are:
• the definition of the scope of inspection
• the choice of the appropriate test method
• the consideration of material properties
• the determination of limits for recording and
evaluation.
It is the task of those with overall responsibility for test-
ing to ensure that the inspector is fully informed about
these requirements. The best basis for such information
is experience with identical test objects. It is also es-
sential that the relevant test specifications be clearly
and completely understood by the inspector.
GE Inspection Technologies regularly holds specialized
training courses in the field of ultrasonic testing. The
scheduled dates for these courses will be given to you
on request.
USM 35X
Important information on ultrasonic testing
Limits of testing
The information obtained from ultrasonic tests only re-
fers to those parts of the test object which are
covered by the sound beam of the probe used.
Any conclusions from the tested parts to be applied to
the untested parts of the test object should be made
with extreme caution.
Such conclusions are generally only possible in cases
where extensive experience and proven methods of
statistical data acquisition are available.
The sound beam can be completely reflected from
boundary surfaces within the test object so that flaws
and reflection points lying deeper remain undetected. It
is therefore important to make sure that all areas to be
tested in the test object are covered by the sound beam.
Ultrasonic wall thickness measurement
All ultrasonic wall thickness measurements are based
on a time-of-flight measurement. Accurate measure-
ment results require a constant sound velocity in the
test object. In test objects made of steel, even with
USM 35X Issue 06, 11/2007
Introduction
varying alloying constituents, this condition is mostly
fulfilled. The variation in sound velocity is so slight that
it is only of importance for high-precision measure-
ments. In other materials, e.g. nonferrous metals or
plastics, the sound velocity variations may be even
larger and thus affect the measuring accuracy.
Effect of the test object’s material
If the test object’s material is not homogeneous, the
sound may propagate at different sound velocities in
different parts of the test objects. An average sound
velocity should then be taken into account for the range
calibration. This is achieved by means of a reference
block whose sound velocity corresponds to the average
sound velocity of the test object.
If substantial sound velocity variations are to be ex-
pected, then the instrument calibration should be read-
justed to the actual sound velocity values at shorter
time intervals. Failure to do so may lead to false thick-
ness readings.
1-5
Introduction
Effect of temperature variations
The sound velocity within the test object also varies as
a function of the material’s temperature. This can cause
appreciable errors in measurements if the instrument
has been calibrated on a cold reference block and is
then used on a warm or hot test object. Such measure-
ment errors can be avoided either by warming the refer-
ence block to the same temperature before calibrating,
or by using a correction factor obtained from tables.
Measurement of remaining wall thickness
The measurement of the remaining wall thickness on
plant components, e.g. pipes, tanks and reaction ves-
sels of all types which are corroded or eroded from the
inside, requires a perfectly suitable gauge and special
care in handling the probe.
The inspectors should always be informed about the
corresponding nominal wall thicknesses and the likely
amount of wall thickness losses.
1-6 Issue 06, 11/2007
Important information on ultrasonic testing
Ultrasonic evaluation of flaws
In present-day test practice, there are basically two
different methods of flaw evaluation:
If the diameter of the sound beam is smaller than the
extent of the flaw, then the beam can be used to ex-
plore the boundaries of the flaw and thus determine its
area.
If, however, the diameter of the sound beam is larger
than the size of the flaw, the maximum echo response
from the flaw must be compared with the maximum
echo response from an artificial flaw provided for com-
parison purposes.
Flaw boundary method
The smaller the diameter of the probe’s sound beam,
the more accurately the boundaries (and therefore the
flaw area) can be determined by the flaw boundary
method. If, however, the sound beam is relatively
broad, the flaw area determined can substantially differ
from the actual flaw area. Care should therefore be
taken to select a probe which will give a sufficiently
narrow beam at the position of the flaw.
USM 35X
Important information on ultrasonic testing
Echo display comparison method
The echo from a small, natural flaw is usually smaller
than the echo from an artificial comparison flaw, e.g.
circular disc flaw of the same size. This is due, for in-
stance, to the roughness of the surface of a natural
flaw, or to the fact that the beam does not impinge on it
at right angles.
If this fact is not taken into account when evaluating
natural flaws, there is a danger of underestimating their
magnitude.
In the case of very jagged or fissured flaws, e.g. shrink
holes in castings, it may be that the sound scattering
occurring at the boundary surface of the flaw is so
strong that no echo at all is produced. In such cases, a
different evaluation method should be chosen, e.g. use
of the backwall echo attenuation in the evaluation.
The distance sensitivity of the flaw echo plays an im-
portant part when testing large components. Attention
should be paid here to choosing artificial comparison
flaws which are as far as possible governed by the
same ”distance laws” as the natural flaws to be evalu-
ated.
USM 35X Issue 06, 11/2007
Introduction
The ultrasonic wave is attenuated in any material. This
sound attenuation is very low, e.g. in parts made of
fine-grained steel, likewise in many small parts made of
other materials. However, if the sound wave travels
larger distances through the material, a high cumulative
sound attenuation can result even with small attenua-
tion coefficients. There is then a danger that echoes
from natural flaws appear too small. For this reason, an
estimate must always be made of the effects of attenu-
ation on the evaluation result and taken into account if
applicable.
If the test object has a rough surface, part of the inci-
dent sound energy will be scattered at its surface and
is not available for the test. The larger this initial scat-
tering, the smaller the flaw echoes appear, and the
more errors occur in the evaluation result.
It is therefore important to take the effect of the test
object’s surfaces on the height of the echo into account
(transfer correction).
1-7
Introduction
1.3 The USM 35X family
The USM 35X is a lightweight and compact ultrasonic
flaw detector especially suitable for
• locating and evaluating material defects,
• measuring wall thicknesses,
• saving and documenting test results.
With its frequency range from 0.5 to 20 MHz and a
maximum calibration range of 10 m (steel), the USM 35X
is designed for use on large workpieces and in high-
resolution measurements.
1-8 Issue 06, 11/2007
The USM 35X family
The different instrument versions
The USM 35X is available in several versions which are
desgined for different applications:
• USM 35X
Standard version for universal ultrasonic test applica-
tions.
• USM 35X DAC
The multiple DAC curves and time-corrected gain
enable a field-oriented echo amplitude evaluation
according to almost all international test specifica-
tions.
• USM 35X S
DGS evaluation mode in addition to multiple DAC
curves and TCG.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
• Data Logger option
This option is available for all USM 35X versions and
is used for the recording and documentation of thick-
ness readings.
USM 35X
The USM 35X family
Special features
• low weight (2.2 kg including lithium-ion battery) and
compact size
• waterproof instrument case with protection class
IP 66
• long operating time (> 12 hours) by means of lithium-
ion battery with internal and external charging possi-
bility
• handy – equipped with a non-slip, ratcheting prop-up
stand, also used as handle
• rotary knobs for direct adjustment of gain as well as
for changing the currently selected function
• two independant gates for accurate wall thickness
measurements from the workpiece surface up to the
first echo, or between two backwall echoes, including
measurement on coated workpieces with a resolution
of 0.01 mm (up to 100 mm), referred to steel
• magnify gate: spreading of the gate range over the
entire screen width
• 5.7", 1/4 VGA-TFT color display to display the digi-
tized signals (320 × 240 pixels, 115 × 86 mm )
USM 35X Issue 06, 11/2007
Introduction
• VGA interface for the connection of an external
monitor
• color display of gates for an easier distinction
• easily recognizable reflection geometry when using
angle-beam probes by the variation of A-scan or
background color at every deflection point
• data memory: 800 data sets, including alphanumeric
description, documentation possibility via a printer
• increased calibration range: up to 9999 mm (steel),
depending on the frequency range
• semiautomatic two point calibration
• pulse repetition frequency variable in ten steps
to avoid phantom echoes when testing large
workpieces
• choice of frequency range for the connected probe
• signal display mode: full-wave rectification, positive
half-wave or negative halv-wave and radio frequency
• display of 4 readings plus 1 reading zoomed in the
A-scan, user-configurable
1-9
Introduction How to use this manual

1.4 How to use this manual The specifications/Technical Specifications according to

EN 12668-1 for the USM 35X family can be found in the
attachment at the end of this operating manual.
The present operating manual applies to all instrument
versions of the USM 35X. Differences in the functions The Data Logger option, which can be applied to all
or setting values are always marked. USM 35X versions, is described in a chapter of its own
– at the end of the operating manual. All functions refer-
Before operating the USM 35X for the first time, it is
ring to the Data Logger and the tolerance monitor are
absolutely necessary that you read the chapters 1, 3
described here. At the same time, the standard operat-
and 4 of this manual. They will inform you about the
ing manual applies to all other functions.
necessary preparations of the instrument, give you a
description of all keys and screen displays, and explain
the operating principle.

In doing this, you will avoid any errors or failures of the

instrument and be able to use the full range of instru-
ment functions.

You will find the latest changes to this operating manual

in chapter 10 Changes. It describes corrections that
have become necessary at short notice and have not
yet been included in the general manual. If no correc-
tions have become necessary, this chapter is empty.

1-10 Issue 06, 11/2007 USM 35X

Layout and presentation in this manual Introduction

1.5 Layout and presentation in Listings

this manual Listings are presented in the following form:
• Variant A
To make it easier for you to use this manual, all operat-
ing steps, notes, etc., are always presented in the • Variant B
same way. This will help you find individual pieces of • ...
information quickly.
Operating steps
Attention and Note symbols Operating steps appear as shown in the following ex-
ample:
A Attention: – Loosen the two screws at the bottom.
The Attention symbol indicates peculiarities and spe-
cial aspects in the operation which could affect the – Remove the cover.
accuracy of the results. – ...

H Note:
Note contains e.g. references to other chapters or spe-
cial recommendations for a function.

USM 35X Issue 06, 11/2007 1-11

1-12 Issue 06, 11/2007 USM 35X
 Standard package and accessories 2

USM 35X Issue 06, 11/2007 2-1

Standard package and accessories

This chapter informs you about the standard package

and the accessories available for the USM 35X.

It describes
• accessories included in the standard package,
• recommended accessories.

2-2 Issue 06, 11/2007 USM 35X

Standard package Standard package and accessories

2.1 Standard package

Product code Description Order number

Ultrasonic testing kit

consisting of:
USM 35X Compact Ultrasonic Flaw Detector, basic version
with LEMO-1-TRIAX connectors 36 060
or
with BNC connectors 36 061

or

USM 35X DAC Compact Ultrasonic Flaw Detector, DAC version

with LEMO-1-TRIAX connectors 36 062
or
with BNC connectors 36 063

or

USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG and

DGS evaluation with LEMO-1-TRIAX connectors 36 064
or
with BNC connectors 36 065

USM 35X Issue 06, 11/2007 2-3

Standard package and accessories Standard package

Product code Description Order number

UM 30 Transport case 35 654

AC power supply/battery charger 102 163

Operating manual in English 48 001

2-4 Issue 06, 11/2007 USM 35X

Recommended accessories Standard package and accessories

2.2 Recommended accessories

Product code Description Order number

Operating manual in German 48 002

Operating manual in French 48 003

Operating manual in Spanish 48 004

Operating manual in Japanese 48 005

Operating manual in Chinese 48 006

LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208

DR36 Battery charger for external charging

of the Li-Ion battery 35 297

NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810

Energy 16 Desk rapid charger for external charging

of NiMH or NiCd cells 101 729

UM 32 Protection bag including neck strap 35 655

UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291

USM 35X Issue 06, 11/2007 2-5

Standard package and accessories Recommended accessories

Product code Description Order number

UD 31 PC cable, 9-pin (PC), 9-pin (instrument) 34 943

UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495
UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944
Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121
Serial-to-parallel printer cable (Patton Model 2029) 101 761
USB-RS Adapter cable RS232 – USB 35 838
UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268
UM 31 VGA adapter for connection of an external monitor 35 653
UM 28 D Option: Data Logger (retrofittable to all versions) 35 800
UM 200 W UltraDOC data communication software for USM 35 024
U 100 W UltraDOC 33 829
PZ-USM Calibration certificate according to EN 12668-1 35 263
Epson LX Matrix printer for mains operation, single sheet and
continuous stationary 17 995
Seiko DPU Thermal printer for mains and battery operation 17 993
2-6 Issue 06, 11/2007 USM 35X
 Initial start-up 3

USM 35X Issue 06, 11/2007 3-1

Initial start-up Power supply

3.1 Power supply Connecting the instrument

Connect the USM 35X to the mains socket-outlet using
The USM 35X can be operated with an external power the corresponding power supply unit. The plug recep-
pack adaptor or with batteries. tacle is at the top left of the USM 35X.

You can connect the USM 35X to the mains supply – Push the Lemo plug of the power supply unit into the
system even if it carries batteries. A discharged battery plug receptacle until it snaps into place with a clearly
is charged in this case, viz. parallel to the instrument audible click.
operation.

Operation using the power supply unit Ð

Mains connection
The power supply unit is delivered with two different
power cables – for Euro and USA standard.

3-2 Issue 06, 11/2007 USM 35X

Power supply Initial start-up

– When pulling off the Lemo plug, withdraw the metal
bushing on the plug first in order to release the lock.
The power supply unit is automatically set to any nomi-
nal voltage between 90 VAC and 240 VAC.
– Lift the lid off upward. To the right in the open battery
compartment, you will see two springs and several
connection pins.

Operation using batteries

Use either a lithium-ion battery or 6 standard C-cells
(NiCad, NiMH, or alkaline cells) for the battery opera-
tion. We recommend the use of a lithium-ion battery. It
has a higher capacity and consequently ensures a
longer operating time of the instrument.

Inserting batteries – Insert the battery into the battery compartment. To

The battery compartment is situated at the instrument
back; the lid is fastened with 2 attachment screws.
– Press the two attachment screws of the battery
compartment downward in order to loosen them.
do this, first press the right side of the battery
against the springs of the battery compartment.
Make sure that the socket on the right side of the
battery is connected with the connection pins in the
battery compartment.

USM 35X Issue 06, 11/2007 3-3

Initial start-up Power supply

Checking the battery charge of lithium-ion batteries

The lithium-ion battery is equipped with a battery charge
indicator. The battery charge indicator is situated at the
front right of the battery. Four LEDs indicate the charge
level of battery. Check the battery charge before insert-
ing the battery into the instrument.

The number of LEDs that are on has the following meaning:

• 4 LEDs – battery charge 100 ... 76 %

or
• 3 LEDs – battery charge 75 ... 51 %
– Insert the batteries into the battery compartment and
check the right polarity. • 2 LEDs – battery charge 50 ... 26 %

• 1 LED – battery charge 25 ... 10 %

• 1 LED flashing – battery charge < 10 %

– Close the battery compartment and fasten the

attachment screws.
3-4 Issue 06, 11/2007 USM 35X
Power supply
– Press the button PUSH at the front side of the battery.
Four LEDs indicate the charge level of battery.
H Note:
You can also check the battery charge even if the battery
is located in the battery compartment of the instrument.
Analog battery charge indicator
The USM 35X is equipped with an analog battery charge
indicator which enables you to estimate the remaining
battery life. In the measurement line to the very right a
battery symbol displays the corresponding charging
level.The battery symbol indicates the charge in steps
of 10 %.
H Note:
If the battery charge indicator displays a low battery
charge, you should urgently close your test job and
exchange the battery. You should take a second battery
or replacement batteries with you if you cannot connect
the instrument to mains.
USM 35X Issue 06, 11/2007
Initial start-up
Charging the batteries
You can charge the lithium-ion battery either directly in
the instrument or by means of an external battery
charger. You always need an external battery charger to
charge standard C-cells.
Internal charging
Requirement:
• Lithium-ion battery, order number 102 208
• Power supply/charger unit, order number 102 163
If a battery is located in the instrument, the charging
process is started automatically when you connect the
plug-in power supply unit. You can carry out ultrasonic
inspections and charge a battery at the same time.
The charging time is 10 hours with a simultaneous ultra-
sonic inspection. If the instrument is not being used for
ultrasonic inspections, the charging time is 8 hours. This
charging time applies to ambient temperatures from 25 to
30 °C. Please take into consideration that the batteries are
not charged to their full capacity at higher temperatures.
The LED display on the plug-in power supply unit indi-
cates the status of the charging process.
3-5
Initial start-up Power supply

green LED yellow LED red LED Status

off flashing off no battery detected

off flashing dark/bright flashing bright/dark charging at low power
off on off quick charging phase 1
flashing dark/bright flashing bright/dark off quick charging phase 2
on off off battery charged
off off flashing bright/dark temperature error, auto-reversible
off off on csharging error, permanent

External charging
Lithium-ion batteries can be charged by means of an
external battery charger. We recommend the battery
charger with the order number 35 297. To charge single
NiCad or NiMH cells, you need the external desktop
battery charger with the order number 101 729.

3-6 Issue 06, 11/2007 USM 35X

Connecting a probe Initial start-up

3.2 Connecting a probe A Attention:

If this is not taken into account, the consequence
To prepare the USM 35X for operation, you have to con- would be a mismatching which may lead to consider-
nect a probe to it. Any Krautkramer probe can be used able power losses or even to echo waveform distor-
for the USM 35X, provided the appropriate cable is avail- tions.
able and the operating frequency is within an adequate
range. Receiver Transmitter

The USM 35X is available with the probe connectors

LEMO-1-TRIAX or BNC.

The probe is connected to the sockets at the top right

on the instrument casing. Both connector sockets are
equally suitable (connected in parallel) for connecting
probes equipped with only one ultrasonic element (ultra-
sonic transducer) so that it does not matter which one
of the two sockets is used.

When connecting a dual-element (TR) probe (having

one transmitter element and one receiver element), or
two probes (of which one is transmitting and the other
one receiving), attention should be paid to connecting
the transmitter element to the right-hand socket (trans-
mitter, marked with black circle at the rear of the instru-
ment case) and the receiver element to the left-hand
socket (receiver, marked with red circle).
USM 35X Issue 06, 11/2007 3-7
Initial start-up Starting the USM 35X

3.3 Starting the USM 35X To delete the saved data:

Switching on A Attention:
To start the USM 35X, press the switch-on key . All saved data are deleted.

The start display of the USM 35X appears; here you will – Press the and the key simultaneously.
also see the current software version of the instrument.
The instrument is reset to factory setting (cold start).
The instrument carries out a self-check and then
switches over to stand-by mode.

The settings of all function values and the basic set-
tings (language and units) are the same as before
switching-on of the instrument.
Basic initialization
In case the instrument can no longer be operated, or
you need to make a basic initialization (factory setting),
you have two options.
To keep the saved data:
In the start-up screen the message “Basic Initialization”
appears, and the unit will bei initialized and reset to its
basic setup (dialog language: English, for more details
on how to select the language, please refer to chapter 4).
Information lines in the startup screen
You can enter two lines (each with up to 39 characters) for
information purposes in the startup screen. For this use
the remote function (codes I1 and I2, refer to chapter 8).

– Press the and the key simultaneously.

The instrument boots with the default setting, but all

stored datasets will remain unchanged (warm start).
3-8 Issue 06, 11/2007 USM 35X
 Principles of operation 4

USM 35X Issue 06, 11/2007 4-1

Principles of operation Operator’s controls

4.1 Operator’s controls LED A: Gate alarm

R: Rejection
D: Dual on
Special keys for Keys for selecting
special instrument a function
functions

Rotary knob for Rotary knob for

direct gain setting direct setting of the
current function

Key for changing On/Off key

the operation level

Keys for selecting a function group

4-2 Issue 06, 11/2007 USM 35X

Screen display Principles of operation

4.2 Screen display

The USM 35X has a digital screen for the display of

• A-scan in the normal mode

• A-scan in the zoom mode

The zoom mode is activated using the key .

H Note:
The screen display always shows the gain and the ad-
justed dB step value. All other functions are locked in
zoom mode.

USM 35X Issue 06, 11/2007 4-3

Principles of operation Screen display

Functions on the display

The names of the five function groups are displayed at
the bottom of the screen. The currently selected func-
tion group is highlighted.

Indicated at the right of the display, next to the A-scan,

are the functions of the corresponding function group.
The display of the functions disappears in the zoom
mode.

4-4 Issue 06, 11/2007 USM 35X

Screen display Principles of operation

Other displays
The measurement line below the screen display shows
values of settings, measured values, and status indica-
tions. As an alternative, a scale can be shown here,
giving an overview of the echo positions.

H Note:
Every measurement value can also be shown in an en-
larged display at the top right corner of the A-scan (set-
ting in the function group MEAS, function S-DISP).

Amplitude height Amplitude height Status indicator:

Gate A (%) Gate B (%) TOF = Flank
H Note:

You can configure the four positions of the measure-

ment line for set and measured values as required (func-
tion group MSEL). Please refer to chapter 5.14, section
Configuring the measurement line on this subject. Sound path Sound path
Gate A Gate B

Example of a measurement
line
USM 35X Issue 06, 11/2007 4-5
Principles of operation Keys and rotary knobs

4.3 Keys and rotary knobs

Function keys
For changing between operation levels (below),

For selection of the function groups (below) and

For selection of the functions (right).

On/Off key
For turning the device on or off.

4-6 Issue 06, 11/2007 USM 35X

Keys and rotary knobs Principles of operation

Special keys
To directly activate individual instrument functions:

To choose the increment for the gain setting

To freeze the A-scan

To display a zoomed A-scan

To transfer the data

To record measured values and to save the data

USM 35X Issue 06, 11/2007 4-7

Principles of operation
Rotary knobs
The USM 35X is equipped with two rotary knobs.
The left-hand rotary knob enables you to directly set the
gain; the right-hand rotary knob serves for setting the
currently selected function.
The two rotary knobs enable both step-by-step and
accelerated settings. You can define a setting step by
step by slightly operating the rotary knob which will
snap into place at the next setting. To accelerate the
setting, operate the rotary knob continuously, i.e. at a
constant speed. This enables you to quickly bridge
great differences between the settings.
H Note:
As an alternative, you can operate the USM 35X via a
special menu line without using the rotary knobs.A de-
scription can be found on page 4-10.
4-8 Issue 06, 11/2007
Keys and rotary knobs
4.4 Operational concept
The USM 35X is an easy-to-use instrument. It has three
operating levels, and you can change between them by
pressing the key. You will recognize your currently
active operating level by the number on the separation
line between the first and the second function group.
If the instrument is equipped with the Data Logger option,
a fourth operating level is added to the existing ones.
Each operating level contains five function groups.
First operating level
Second operating level
Third operating level
USM 35X
Operational concept Principles of operation

Setting the functions The following functions offer a choice between coarse
and fine adjustment:
Shown below the A-scan are five function groups that
you can directly select using the corresponding key. Function Function group
The selected function group is highlighted and the corre-
sponding four functions are displayed next to the RANGE BASE
A-scan on the right. You can likewise directly select the MTLVEL BASE
individual functions using the corresponding keys. D-DELAY BASE
aSTART aGAT
Functions with double assignments aWIDTH aGAT
bSTART bGAT
Some functions have double assignments. You will rec- bWIDTH bGAT
ognize the functions with double assignments by an cSTART cGAT
arrow (icon >) after the function name. cWIDTH cGAT
S-REF1 CAL
Toggle between the two functions by repeatedly press-
S-REF2 CAL
ing the corresponding key .
ANGLE TRIG
Coarse and fine adjustment of functions THICKNE TRIG
DIAMET TRIG
You can choose between coarse and fine adjustment for
some functions. You can toggle between these two For more details on the adjustment possibilities, please
adjustment modes by pressing the corresponding read from page 5-5 onward.
key several times. The fine adjustment is identified
by an asterisk preceding the function value.

USM 35X Issue 06, 11/2007 4-9

Principles of operation Operational concept

Alternative operation without rotary knobs Key functions

The operation mode of the USM 35X without rotary dB– reduces the instrument gain by the selected step
knobs is intended for all applications where the ultra- dB+ increases the instrument gain by the selected step
sonic instrument is used with a dustproof or watertight
cover, e.g. in contaminated areas of nuclear power
plants or in dusty environments. H Note:
The key remains active, i.e. you can select another
– Browse through the menus using the key to
select the required menu. dB step size if required.

– Press the key and keep it pressed for one second Val– reduces the value of the currently chosen
to switch to the operation mode without rotary knobs. function, e.g. RANGE

The instrument still displays the last chosen menu but
changes the menu key assignment to the following
menu line:
Val+ increases the value of the currently chosen
function
– Press the key next to one the four functions to
select it for editing. With another press of the
respective key you can choose between coarse and
fine setting if applicable for this function.

– Keep the Val– or Val+ key pressed to activate an

accelerated setting. Hence the values are changed in
larger steps.

4-10 Issue 06, 11/2007 USM 35X

Operational concept Principles of operation

– If you need to select another function menu, keep the

key pressed to return to the normal operation
(menu display). Select the required function group
and keep the key pressed for another second to
reactivate the operation mode without functions
knobs.

H Note:
The rotary knobs also work if the instrument is operated
with keys only.

When a parameter menu is displayed, e.g. DGSMEN or

TESTINF, you can only change the functions in the A single key press on the key offers the selection of
selected column using Val– and Val+ in key operation another parameter column. If you keep the key
mode. In the following example only the left column can pressed once again, you can change the functions of
be edited: the selected column instead.

USM 35X Issue 06, 11/2007 4-11

Principles of operation Important basic settings

4.5 Important basic settings • Russian

• Slovakian
• Norwegian
Selecting the language • Polish
Select the language in which the function names should • Japanese
be displayed on the screen in the function DIALOG • Chinese
(Function group CFG1). The following languages are • Serbian
available: – If necessary, go to the third operating level.
• German
– In the function group CFG1 select the function DIALOG.
• English (default setting)
• French
• Italian
• Spanish
• Portuguese
• Dutch
• Swedish
• Slovenian
• Romanian
• Finnish
• Czech
• Danish
• Hungarian
• Croatian
4-12 Issue 06, 11/2007 USM 35X
Important basic settings Principles of operation

H Note:
Double assignment of the function DIALOG/UNIT
(icon >). Toggle between the two functions by repeat-
edly pressing the corresponding key .

– Select the required language by means of the right-

hand rotary knob.

Selecting units
In the function UNIT (function group CFG1) you can
choose your favorite units between mm or inch.
H Note:
– If necessary, go to the third operating level.
Double assignment of the function DIALOG/UNIT
– In the function group CFG1 select the function UNIT. (icon >). Toggle between the two functions by repeat-
edly pressing the corresponding key .

– Set the required unit by means of the right-hand

rotary knob.

A Attention:
Select your units immediately when you start working
with the USM 35X because if you change the unit, all
the current settings are deleted, and the basic setup is
loaded again.
USM 35X Issue 06, 11/2007 4-13
Principles of operation Important basic settings

In order not to delete anything by accident, a safety – If necessary, change to the third operation level.
prompt is displayed in the measurement line.
– Select the function DATE in the function group CFG2.
– If you are sure that you want to change the unit,
press the key belonging to the function UNIT one
more time.

The unit is now changed, the current data are

deleted.

– If you want to abort the process, press any other key.

The previous setting is kept in that case.

Setting the date

The date is saved together with the test results. You
can set it in the function DATE (function group CFG2).
A Attention:
Please take into account that the USM 35X only indi-
cates the year with two digits.
You should always make sure that you use correctly
set values of date. Test results may otherwise be falsi-
fied.
H Note:
Double assignment of the function DATE/TIME (icon >).
Toggle between the two functions by repeatedly press-
ing the corresponding key .
– Use the left-hand rotary knob to select the value that
you want to vary, e.g. the day.
– Use the right-hand rotary knob to vary the selected
value.

4-14 Issue 06, 11/2007 USM 35X

Important basic settings Principles of operation

Setting the time

The function TIME (function group CFG2) serves for
setting the current hour of time. It is saved together with
the test results.

A Attention:
For a correct documentation you should always make
sure that you are using the correct time settings.

Don’t forget to manually set the time when changing

from winter to summer time.
– If necessary, change to the third operation level.
– Select the function TIME in the function group CFG2.
H Note:
Double assignment of the function DATE/TIME (icon >).
Toggle between the two functions by repeatedly press-
ing the corresponding key .

– Use the left-hand rotary knob to select the value that

you want to vary, e.g. the hour.

– Use the right-hand rotary knob to vary the selected

value.

USM 35X Issue 06, 11/2007 4-15

Principles of operation
4.6 Basic settings of the display
The equipment of the USM 35X includes a high-resolu-
tion color display. You can optimize the display settings
to your individual viewing habits and to the operational
environment.
Selecting the color scheme
You can use the function SCHEME (function group
LCD) to choose one of four color schemes. The color
scheme determines the color of all displays and that of
the background. You cannot vary the colors of gates
because they are fixed as follows:
• Gate A – red
• Gate B – green
• Gate C – blue
H Note:
All color schemes are suitable for indoor use. For out-
door use, we recommend the color schemes 3 and 4.
4-16 Issue 06, 11/2007
Basic settings of the display
– If necessary, change to the third operation level.
– Select the function SCHEME in the function group
LCD.
– Use the right-hand rotary knob to choose the required
color scheme.
Setting the lighting
Use the function LIGHT (function group LCD) to set the
display lighting. You can choose between the default
lighting max. and a lighting in the economy mode min..
H Note:
The economy mode reduces the current consumption
and consequently increases the operating time in bat-
tery operation.
– If necessary, change to the third operation level.
– Select the function LIGHT in the function group LCD.
– Use the right-hand rotary knob to set the required
lighting.
USM 35X
 Operation 5

USM 35X Issue 06, 11/2007 5-1

Operation Overview of the functions

5.1 Overview of the functions Each operating level contains five function groups. You
will recognize your currently active operating level by
the number on the separation line between the first and
The functions of the USM 35X are combined to form
the second function group.
function groups on three operating levels.
First operating level
If the instrument has the option Data Logger, there is an
additional fourth operation level.

– Press the key to change between the operating

levels. Second operating level

– Press the key to select the function group shown

above it.

– Press the key to select the function shown next Third operating level
to it. The setting of the selected function is carried
out via the right-hand rotary knob.

The gain function is always directly available via the left-

hand rotary knob. H Note:

You can carry out important functions (switch on/off, If the instrument is equipped with the Data Logger op-
dB-step, freeze, zoom and report printout) by pressing tion, a fourth operating level is added. For this, refer to
the special keys (ref. chapter 4). the corresponding chapter Option Data Logger.

You will also find an overview of the function groups and

their functions on the fold-out page.

5-2 Issue 06, 11/2007 USM 35X

Overview of the functions
Function groups first operating level
BASE The functions that you find here are re-
quired for the basic adjustment of the
screen displays.
PULS Combined in this group are the functions
that serve for the adjustment of pulser.
RECV Combined in this group are the functions
that serve for the adjustment of receiver.
aGAT All functions for setting the gate A can be
found in this group.
bGAT All functions for setting the gate B can be
found in this group.
USM 35X Issue 06, 11/2007
Operation
Function groups second operating level
CAL This function group makes functions for the
semiautomatic calibration available to you.
REF This function group serves for measuring
the dB difference between a reference
echo and the reflector echo.
or
AWS This is where you will find all functions for
the classification of flaws in welds accord-
ing to the AWS D1.1 specification.
or
DAC This is the function group where you can
set the functions for the DAC (only
USM 35X DAC and USM 35X S).
or
JDAC The DAC functions in this function group
are modified to allow for a flaw evaluation
according to JIS (Japanese Industrial Stan-
dard) Z3060-2002 (only USM 35X DAC
and USM 35X S).
5-3
Operation
or
DGS This function group serves for the ampli-
tude evaluation according to the DGS
method (only USM 35X S).
TRIG Combined in this group are the functions
required for angle beaming using angle-
beam probes for the display of a (reduced)
projection distance and depth position of a
reflector (for plane-parallel and circular
curved test components).
MEM These functions serve for storing, loading
and deleting of data sets.
DATA The functions of this group serve for the
dataset management and documentation.
5-4 Issue 06, 11/2007
Overview of the functions
Function groups third operating level
MEAS In this group, you can define the measuring
point, select a parameter for the zoomed
measured-value display in the A-scan as
well as for the setting of the Magnify func-
tion, and you can select different settings
for the A-scan.
MSEL This is where you configure your measure-
ment line. You can choose one display for
each of the four positions.
LCD This is the function group where you can
set the LCD contrast and backlight as well
as the echo display mode on the screen.
CFG1 Functions for the configuration: unit, dialog
language, printer driver and assignment of
the key
CFG2 Other functions for configuration: time and
date, alarm horn; plus the changeover
between the evaluation modes
USM 35X
Setting the gain Operation

5.2 Setting the gain Defining the dB incrementation for gain

You can use the key to select a certain incremen-
This function, operated via the left-hand rotary knob, tation for setting the gain. You have a choice between
enables you to quickly and directly set the gain. 6 steps:
You can use the gain to adjust the required sensitivity in • 0.0 dB (locked)
order to control the echo amplitudes. • 0.5 dB
– Turn the left-hand rotary knob to set the gain. The • 1.0 dB
current gain is indicated in the top left corner of the • 2.0 dB
screen. • 6.0 dB
• 6.5 … 20.0 dB

H Note:
The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.

You can determine the step size of the sixth step using
the function dBSTEP in the function group RECV.

– Press to change between the six steps.

The corresponding step size setting is indicated
below the current gain on the screen.

USM 35X Issue 06, 11/2007 5-5

Operation
5.3 Adjusting the display range
(function group BASE)
The function group BASE enables you to make the ba-
sic adjustment of the display range. The display on the
screen must be adjusted for the material to be tested
(function MTLVEL) and for the probe used (function P-
DELAY).
– If required, go to the first operating level.
– Select the function group BASE.
5-6 Issue 06, 11/2007
Adjusting the display range (function group BASE)
H Note:
In order to accurately adjust the material velocity and
the probe delay, please read the section Calibrating the
USM 35X, chapter 5.7, beforehand.
RANGE (Display range)
You can adjust the range for your measurement in RANGE.
• Coarse adjustment:
from 0.5 mm ... 1400 (9999) mm in even steps
• Fine adjustment:
up to 9.99 mm in steps of 0.01 mm/
up to 9.999" in steps of 0.001"
up to 99.9 mm in steps of 0.1 mm/
up to 99.99" in steps of 0.01"
up to 999 mm in steps of 1 mm/
from 100" in steps of 0.1"
from 1000 mm in steps of 10 mm
H Note:
The adjustment range for the display range depends on
the frequency range setting (function FREQU in function
group RECV).
USM 35X
Adjusting the display range (function group BASE) Operation

Frequency range Adjustment range (c = 5920 m/s) • Fine adjustment

0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390" 1000 ... 15000 in steps of 1 m/s
0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"
0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50"
2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"
A Attention:
Always ensure that the function MTLVEL is correctly
– Select the function RANGE. set. The USM 35X calculates all range and distance
indications on the basis of the value adjusted here.
– If required, toggle between coarse and fine adjust-
ment. – Select the function MTLVEL.
– Adjust the required value by means of the right-hand – If required, toggle between coarse and fine adjust-
rotary knob. ment.

– Adjust the required value by means of the right-hand

MTLVEL (Sound velocity) rotary knob.
Use MTLVEL to set the sound velocity within the test
object. You can use sound velocities between 1000 and D-DELAY (Display starting point)
15000 m/s.
Here you can choose whether to display the adjusted
• Coarse adjustment, in steps as follows (m/s):
range (for example 250 mm) starting from the surface of
15000 9000 5000 2000
the test object, or in a section of the test object starting
14000 8000 4000 1600
at a later point. This allows you to shift the complete
13000 7000 3250 1450
screen display and consequently also the display zero.
12000 6320 3130 1000
11000 6000 3000 If the display should for example start from the surface of
10000 5920 2730

USM 35X Issue 06, 11/2007 5-7

Operation
the test object, the value in D-DELAY must be set to 0.
• Coarse adjustment
–10 mm ... 1024 mm/–0.3" ... 40" in even steps
• Fine adjustment
up to 99.9 mm/9.999" in steps of 0.01 mm/0.001"
up to 1024 mm/10" in steps of 0.1 mm/0.001"
– Select the function D-DELAY.
– If required, toggle between coarse and fine adjust-
ment.
– Adjust the value for the display starting point by
means of the right-hand rotary knob.
5-8
Adjusting the display range (function group BASE)
P-DELAY (Probe delay)
Every probe has a delay line between the transducer
element and the coupling face. This means that the
initial pulse must first pass through this delay line be-
fore the sound wave can enter the test object. You can
compensate for this influence of the delay line in the
function P-DELAY.
H Note:
If the value for P-DELAY is not known, read the section
Calibrating the USM 35X, chapter 5.7, in order to deter-
mine this value.
– Select the function P-DELAY.
– Adjust the value for the probe delay by means of the
right-hand rotary knob.
Issue 06, 11/2007 USM 35X
Adjusting the pulser (function group PULS) Operation

5.4 Adjusting the pulser DAMPING (Probe matching)

(function group PULS) This function serves for matching the probe. You can
use it to adjust the damping of the probe’s oscillating
You will find all functions for the adjustment of the puls- circuit and to consequently change the height, width
er in the function group PULS. and resolution of the echo display.

– If required, go to the first operating level. • low

This setting has a lower damping effect and produces
– Select the function group PULS. higher and broader echoes.

• high
This setting reduces the echo height but mostly also
produces narrow echoes with higher resolution.

– Select the function DAMPING.

– Set the required value by means of the right-hand

rotary knob.

USM 35X Issue 06, 11/2007 5-9

Operation Adjusting the pulser (function group PULS)

POWER (Intensity) DUAL (Pulser-receiver separation)

Use the function POWER to set the pulser voltage. You You can use the function DUAL to activate the pulser-
can choose between two settings: receiver separation.

• high – high voltage • off

• low – low voltage
The setting high is recommended for all inspections in
which maximum sensitivity is important, e.g. for the
detection of small flaws. Choose the setting low for
broadband probes or if narrow echoes are required (bet-
ter lateral resolution).
– Select the function POWER.
– Use the right-hand rotary knob to choose the required
setting.
Single-element operation; the probe connection
sockets are connected in parallel.
• on
Dual mode for the use with dual-element (TR) probes;
the left-hand socket (red) is connected with the
amplifier input whereas the initial pulse is available at
the right-hand socket (black).
• through
Through-transmission mode for the use with two
separate probes; the receiver is connected with left
(red), the pulser is connected with right (black).

– Select the function DUAL.

– Use the right-hand rotary knob to choose the required

setting.

If the DUAL function is active, the LED D (dual) is on.

5-10 Issue 06, 11/2007 USM 35X

Adjusting the pulser (function group PULS) Operation

PRF-MOD (Pulse repetition frequency) 5.5 Adjusting the receiver

The pulse repetition frequency indicates the number of
times an initial pulse is triggered per second. You can
determine whether you need the highest possible PRF
value, or whether you are satisfied with a low value. You
have 10 steps available for the setting; step 1 means
the lowest PRF value.
(function group RECV)
You will find all functions for the adjustment of the puls-
er in the function group RECV.
– If required, go to the first operating level.

The larger your workpiece, the smaller PRF values are – Select the function group RECV.
needed in order to avoid phantom echoes. In the case of
smaller PRF values, however, the A-scan update rate
becomes lower; for this reason, high values are required
if a workpiece should be scanned fast.

The best way to determine the suitable PRF value is by

experimenting: start from the highest step and reduce
the value until there are no more phantom echoes.

– Select the function PRF-MOD.

– Adjust the required value by means of the right-hand H Note:

rotary knob. Double assignment of the function FINE G/dBSTEP
(icon >). Toggle between the two functions by repeated-
ly pressing the corresponding key .

USM 35X Issue 06, 11/2007 5-11

Operation
FINE G (Fine adjustment of gain)
This function serves for the fine adjustment of the cur-
rent gain value. The fine adjustment is possible over a
range of 11 steps within the range of –0.5 dB to
+0.5 dB. The displayed gain value will not change.
Adjustment range: –5 ... +5 (–0.5 dB ... +0.5 dB)
– Select the function FINE G.
– Use the right-hand rotary knob to adjust the value for
the fine gain.
dBSTEP
Use this function to set a step size for the gain variation
by means of the key . The value set here is subse-
quently available to you as the sixth step for the step-
wise gain variation. You have a free choice of the value
within the setting range.
Setting range: 6.5 ... 20 dB
– Select the function dBSTEP.
– Set the value for the gain by means of the right-hand
rotary knob.
5-12 Issue 06, 11/2007
Adjusting the receiver (function group RECV)
REJECT
The function REJECT allows you to suppress unwanted
echo indications, for example structural noise from your
test object.
The % screen height setting indicates the minimum
height that the echoes should attain in order for them to
be displayed on the screen at all. The Reject setting
cannot be higher than the lowest threshold setting
(minus 1 %) of any gate.
A Attention:
You should handle this function with great caution, as it
may of course happen that you suppress echoes from
flaws as well. Many test specifications expressly forbid
using the reject function.
– Select the function REJECT.
– Set the required percentage value by means of the
right-hand rotary knob.
The LED R is therefore lit with active REJECT function.
USM 35X
Adjusting the receiver (function group RECV) Operation

FREQU (Frequency range) RECTIFY (Rectification)

In this function, you can adjust the operating frequency You can select the rectification mode of the echo puls-
according to the frequency of your probe. es according to your application in the function RECTI-
FY. You have the following options to choose from:
You have a choice between ten frequency ranges:
• full-w (= full-wave)
• 0.2 ... 1 MHz All half-waves are displayed above the baseline.
• 0.5 ... 4 MHz
• pos hw (= positive half-wave)
• 0.8 ... 8 MHz Only positive half-waves are displayed.
• 2 ... 20 MHz • neg hw (= negative half-wave)
• 1 MHz narrow band filter Only negative half-waves are displayed.
• 2 MHz narrow band filter • rf (= radio frequency)
• 2,25 MHz narrow band filter Only applies to the display range up to 50 mm (steel).

• 4 MHz narrow band filter – Select the function RECTIFY.

• 5 MHz narrow band filter – Use the right-hand rotary knob to adjust the required
• 10 MHz narrow band filter setting.

– Select the function FREQU.

– Adjust the required value by means of the right-hand

rotary knob.

USM 35X Issue 06, 11/2007 5-13

Operation Setting the gates (function groups aGAT and bGAT)

5.6 Setting the gates H Note:

(function groups aGAT If you have an instrument equipped with the Data Logger
and bGAT) option at your disposal, you’ll be additionally able to use
the C gate including all corresponding functions.

All functions for setting the (dual) gate are arranged in

the function group aGAT and bGAT.
– If required, go to the first operating level.
– Select the function group aGAT or bGAT.
Tasks of the gates
• It monitors the range of the test object where you
expect to detect a flaw. If an echo exceeds or falls
below the gate, an alarm signal is output via the
LED A.

• The gates A and B are independant of one another.

Gate A can also have the function of an echo-start
gate.

• The gate chooses the echo for the digital time-of-

flight or amplitude measurement. The measured value
is indicated in the measurement line.

H Note:
Error alarms can be triggered unter certain circumstanc-
es. These are caused by intermediate conditions in
instrument operation occuring when the instrument is

5-14 Issue 06, 11/2007 USM 35X

Setting the gates (function groups aGAT and bGAT)
used, i.e. when function parameters are changed. Pos-
sible alarms occuring during instrument operation
(setting of functions) are to be ignored.
Display of gates
To make the assignment easier, the gates are displayed
in different colors. You cannot vary the colors of gates
because they are fixed as follows:
• Gate A – red
• Gate B – green
• Gate C – blue
aLOGIC/bLOGIC
(Evaluation logic of the gates)
This function allows you to choose the method for trig-
gering the gate alarm. The alarm is output to the LED A
on the front panel of the USM 35X. There are four set-
ting options available:
USM 35X Issue 06, 11/2007
Operation
• off – Evaluation logic off
The alarm and measurement capability are switched
off. The gate is not visible.
• pos – Coincidence
The alarm (LED A) is on if the preset response
threshold of the gate is exceeded within the dis-
played range.
• neg – Anticoincidence
The alarm (LED A) is on if the preset response
threshold of the gate is not reached within the
displayed range.
• a trig – Triggering by interface echo
When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
– Select the function aLOGIC or bLOGIC.
– Set the required alarm logic by means of the right-
hand rotary knob.
H Note:
The alarm and measurement function of the gates is
only active within the display range.
5-15
Operation
aSTART/bSTART
(Starting points of the gates)
You can fix the starting point of the gates A or B within
the adjustment range of 0 ... 9999 mm/250".
– Select the function aSTART or bSTART.
– Uuse the right-hand rotary knob to adjust the required
setting.
aWIDTH/bWIDTH (Width of the gates)
You can determine the gate width within the range of
0.2 ... 9999 mm/0.008 ... 250".
– Select the function aWIDTH or bWIDTH.
– Use the right-hand rotary knob to adjust the required
value.
5-16 Issue 06, 11/2007
Setting the gates (function groups aGAT and bGAT)
aTHRSH/bTHRSH (Response and mea-
surement threshold of the gates)
You can determine the threshold value of the gates within
the range of 10 to 90 % screen height for triggering the
LED alarm if this value is exceeded or not reached, de-
pending on the setting of the aLOGIC/bLOGIC function.
In the RF mode, the threshold can be additionally set
from –90 % to –10 %.
– Select the function aTHRSH or bTHRSH.
– Set the required value using the right-hand rotary
knob.
USM 35X
Calibrating the USM 35X
5.7 Calibrating the USM 35X
Calibrating the display range
Before working with the USM 35X, you have to calibrate
the instrument: you have to adjust the material velocity
and display range and allow for the probe delay depend-
ing on the material and dimensions of the test object.
To ensure a safe and proper operation of the USM 35X,
it is necessary that the operator be adequately trained
in the field of ultrasonic testing technology.
Below you will find some examples of common calibra-
tion methods for certain test tasks. In addition, the
USM 35X has a semiautomatic calibration function
which is described as Case B: With unknown material
velocity.
USM 35X Issue 06, 11/2007
Operation
Choosing the measuring point
The sound path measurement in the calibration process
or in the subsequent echo evaluation process depends
on the choice of the measuring point which can be set
either to flank, to jflank or to peak in the USM 35X. In
principle, the peak measurement should be preferred
because the measured distances do not depend on the
echo height in that case. However, there are application
cases in which the flank measurement is either speci-
fied, or it must be applied for technical reasons, e.g. in
many tests using dual-element (TR) probes.
A Attention:
In any case, the setting of the measuring point must
always be identical for the calibration and for the subse-
quent test application. Otherwise measurement errors
might occur.
5-17
Operation
Calibration with straight- and
angle-beam probes
Case A: With known material velocity
Calibration process
– Set the known material velocity in MTLVEL (function
group BASE).
– Couple the probe to the calibration block.
– Set the required display range in RANGE (function
group BASE). The calibration echo must be dis-
played on the screen.
– Position the gate on one of the calibration echoes
until the sound path of the echo is indicated in the
measurement line.
– After this, change the adjustment of the function
P-DELAY (function group BASE) until the correct
sound path for the selected calibration echo is
indicated in the measurement line.
5-18 Issue 06, 11/2007
Calibrating the USM 35X
Example:
You are carrying out the calibration for the calibration
range of 100 mm/5" via the function group BASE using
the calibration block V1 (thickness 25 mm/1") which is
laid flatwise.
– Set RANGE to 100 mm/5".
– Set the known material velocity of 5920 m/s
(233 "/ms) in MTLVEL.
– Set the gate so that it is positioned on the first
calibration echo (from 25 mm/1").
– Read the sound path in the measurement line. If this
value is not equal to 25 mm/1", change the adjust-
ment for the function P-DELAY until it is at 25 mm/1".
This completes the calibration of the USM 35X to the
material velocity of 5920 m/s (233 "/ms) with a calibra-
tion range of 100 mm/5" for the probe used.
USM 35X
Calibrating the USM 35X
Case B: With unknown material velocity
Use the semiautomatic calibration function of the
USM 35X via the function group CAL for this calibration
case.
The distances between 2 calibration echoes must be
entered as default data. The USM 35X will then carry
out a plausibility check, calculate the material velocity
and the probe delay, and automatically set the parame-
ters.
USM 35X Issue 06, 11/2007
Operation
Calibration process
– Set the required display range in RANGE (function
group BASE). The two calibraion echoes selected
must be displayed on the screen. Set the range so
that the second calibration echo is located on the
right edge of the screen.
– Select the function group CAL.
– Enter the distances of the two calibation echoes in
S-REF1 and S-REF2.
– Position the gate (function aSTART) on the first
calibration echo.
– Press to record the first calibration echo.
– The recording of the first calibration echo is confirmed
by the message “Echo is recorded”, and the func-
tion CAL indicates the value 1.
– Move the gate to the second calibration echo.
– Press to record the second calibration echo.
5-19
Operation Calibrating the USM 35X

The correct calibration is confirmed by the message Example

“Calibration is done”.
– Enter the distances (thicknesses) of the two calibra-
The USM 35X will now automatically determine the tion lines S-REF1 (20 mm) and S-REF2 (40 mm).
sound velocity and the probe delay and set the corre-
sponding functions accordingly. The value of the func-
tion CAL jumps back to 0.

H Note:
If the instrument is not able to carry out any valid cali-
bration on the basis of the input values and the echoes
recorded, a corresponding error message is displayed.
In that case, please check the values of your calibration
– Position the gate on the first calibration echo.
lines and repeat the process of recording the calibration
echoes. – Press to record the first calibration echo.

5-20 Issue 06, 11/2007 USM 35X

Calibrating the USM 35X
– Position the gate on the second calibration echo:
– Press . tion from the backwall, which can result in very jagged
The second echo is stored, the calibration is carried
out, and the CAL function is reset to 0. The valid cali-
bration is briefly confirmed and carried out.
If you select the function group BASE, you can read the
material velocity and probe delay.
USM 35X Issue 06, 11/2007
Operation
Calibration with dual-element (TR) probes
Dual-element (TR) probes are especially used for wall
thickness measurement. The following peculiarities
must be taken into account when using these probes:
Echo flank
Most dual-element (TR) probes have a roof angle (trans-
ducer elements with inclined orientation toward the test
surface). This causes mode conversions both at beam
index (sound entry into the material) and at the reflec-
echoes.
V-path error
Dual-element (TR) probes produce a v-shaped sound
path from the pulser via the reflection from the backwall
to the receiver element. This so-called “V-path error”
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.
5-21
Operation
Higher material velocity
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, espe-
cially with small thicknesses. This is typical of dual-
element (TR) probes and serves for compensation of the
V-path error.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe-
cially taken into account with thicknesses less than
2 mm/0.08".
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses
must be selected so that they cover the expected read-
ings.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes.
– Set the required test range.
– Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range.
5-22 Issue 06, 11/2007
Calibrating the USM 35X
– Set the pulser and receiver functions according to the
probe used and the test application.
– Set the function TOF (function group MEAS) to
flank.
– Vary the gain so that the highest echo reaches
approximately the full screen height.
– Set the gate threshold to the required height for
measuring the sound paths at the echo flanks.
– Select the function group CAL.
– Enter the distances of the two calibration echoes in
S-REF1 and S-REF2.
– Position the gate (function aSTART) on the first
calibration echo.
– Press to record the first calibration echo.
– Couple the probe to the calibration block containing
the second calibration line, and set the height so that
it’s about as high as the first calibration echo.
– Move the gate to the second calibration echo.
USM 35X
Calibrating the USM 35X
– Press to record the second calibration echo.
The correct calibration is confirmed by the message
“Calibration is done”. The material velocity and
probe delay are set. The value of the CAL function
goes back to 0.
– If necessary, check the calibration on one or several
known calibration lines, e.g. using the stepped
reference block VW.
H Note:
Always keep in mind that the measured value is deter-
mined at the intersection point of gate and echo flank
when the function TOF was set to flank. A correct set-
ting of the echo height and gate threshold is therefore
decisive for accurate calibration and measurement!
Calibrations or measurements in the peak mode are
mostly not possible when using dual-element (TR)
probes. As the echoes are often very broad and jagged,
a clear echo peak cannot always be found in these
cases.
USM 35X Issue 06, 11/2007
Operation
5.8 Measuring
General notes
Please pay attention to the following notes when mea-
suring with the USM 35X.
• Condition for measurements is the correct instrument
calibration (sound velocity, probe delay).
• All amplitude measurements are carried out at the
highest or the first signal in the gate.
• All distance measurements are carried out at the
intersection point of gate and the first echo flank
(TOF = flank or jflank), or at the peak of the highest
echo (TOF = peak).
• If the echo amplitudes do not succeed 5 % screen
height all sound path and amplitude measurements
will be suppressed. Thus, rapidly changing random
measurements caused by the instrument’s back-
ground noise are avoided.
5-23
Operation Measuring

The following example shows the dependency of dis-

tance measurement on the echo waveform, i.e. on the
height of the gate threshold and thus on the selection of
the intersection point at the signal.

H Note:
The point of amplitude measurement is marked with a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked with a
small downward triangle.

Gate threshold at 80 %
measured sound path: 24.91 mm

Gate threshold at 20 %
measured sound path: 24.44 mm
5-24 Issue 06, 11/2007 USM 35X
Measurement of dB difference (function group REF) Operation

5.9 Measurement of dB difference H Note:

(function group REF) Depending on the setting in the function EVAMOD

You can evaluate reflector echoes by means of refer-
ence echoes. The function group REF makes all func-
tions for the echo comparison between a reflector echo
and a reference echo available to you.
– If required, go to the second operating level.
– Select the function group REF.
(function group CFG2), one of the function groups AWS,
DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
You will find the following function:
REFECHO Storing or deleting the reference echo
REFMOD Activating the measurement of
dB difference

aSTART Positioning the A gate

The functions are described in the order in which you

need them during your work.

USM 35X Issue 06, 11/2007 5-25

Operation Measurement of dB difference (function group REF)

Recording a reference echo

Before using the measurement of dB difference, you
have to first record a reference echo.

A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.

– Peak the reference echo according to the test

specification.

– Position the A gate over the reference echo using the

function aSTART.

– Select the function REFECHO. Deleting a reference echo

– Turn the right-hand rotary knob upward in order to
store the echo in gate A as a reference echo.
– If necessary, confirm the warning message in order to
overwrite a stored reference echo.
The reference echo is now recorded. An inverted R is
shown in the measurement line.
You can delete stored reference echoes.
– Select the function REFECHO.
– Turn the right-hand rotary knob downward in order to
delete the reference echo.
– If necessary, confirm the warning message in order to
delete the stored reference echo.

5-26 Issue 06, 11/2007 USM 35X

Measurement of dB difference(function group REF) Operation

Echo comparison
You can compare the echo of any reflector of your
choice with the reference echo. The displayed result is
the dB difference of the two echoes.

H Note:
The dB difference is independent of any possible gain
variation.

– Choose Ha dB or Hb dB as measured value.

– Position the A gate over the echo.

– Select the function REFMOD.

– Activate the function by means of the right-hand

rotary knob.

The dB difference between the reference echo and

the reflector echo is now displayed as the measured
value.

USM 35X Issue 06, 11/2007 5-27

Operation
5.10 Classification of welds
(function group AWS)
You can rate flaws in welds according to the specifica-
tion AWS D1.1. You will find the corresponding func-
tions in the function group AWS.
– If necessary, change to the second operation level.
– Select the function group AWS.
5-28 Issue 06, 11/2007
Classification of welds (function group AWS)
H Note:
Double assignment of the function INDICA/aSTART.
Press the corresponding key repeatedly to toggle
between the functions.
H Note:
Depending on the setting in the function EVAMOD
(function group CFG2), one of the function groups REF,
DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
Rating of welds according to AWS
The rating of flaws in welds according to the AWS spec-
ifications is based on an evaluation of the signal ampli-
tude. In this process, the echo amplitude of the flaw
echo is compared with the echo amplitude of a known
reference reflector. In addition, the sound attenuation in
the workpiece is also taken into consideration. The
result is a dB value which is called flaw rating. The flaw
rating D is calculated according to the formula:
USM 35X
Classification of welds (function group AWS)
D=A–B–C
with:
• A = Indication (in dB)
Absolute instrument gain with which the maximum
flaw echo is at 50 % (±5 %) echo height
• B = Reference (in dB)
Absolute instrument gain with which the maximum
reference echo (1.5 mm side-drilled hole from the
reference block 1) is at 50 % (±5 %) echo height
• C = Attenuation (in dB)
This value is calculated according to the formula
C = 0.079 dB/mm (s – 25.4 mm). With s = sound
path of the flaw echo.
The sound attenuation correction is automatically
calculated and displayed by the instrument. For
sound paths smaller than or equal to 25.4 mm
(1 inch), the value is set to zero.
• D = D 1.1 Rating (in dB)
This is the result of the evaluation according to AWS.
The evaluation is carried out in the USM 35X accord-
ing to the formula indicated above.
USM 35X Issue 06, 11/2007
Operation
H Notes:
Make sure that all instrument options for the special
test are calibrated before starting with the rating accord-
ing to AWS.
Pay attention to peaking an echo with an amplitude
between 45 % and 55 % screen height. A rating is not
possible with other amplitudes.
– Apply couplant, and couple the probe to the refer-
ence block 1. Peak the echo from the 1.5 mm side-
drilled hole.
– Select the function aSTART, and set up the A gate
on the reference echo.
– Vary the gain so that the reference echo is displayed
at 50 % screen height.
– Choose the function REFRNCE, and confirm the
choice in order to save the reference gain.
5-29
Operation Classification of welds (function group AWS)

– Save the current gain using the function INDICA. The

current gain is saved. The USM 35X will automatical-
ly determine the values of the AWS variables C and
D. You can then evaluate the rating D using the
corresponding requirements from AWS.

– Couple the probe to the test object in order to evalu-

ate a flaw echo.

– Select the function aSTART, and set up the A gate

on the flaw echo.

– Vary the gain so that the flaw echo is displayed at

50 % screen height.

– Go to the function group AWS.

5-30 Issue 06, 11/2007 USM 35X

Calculation of flaw position (function group TRIG)
5.11 Calculation of flaw position
(function group TRIG)
In the function group TRIG you will find the functions for
setting the flaw position calculation when using angle-
beam probes.
– If required, go to the second operating level.
– Select the function group TRIG.
USM 35X Issue 06, 11/2007
Operation
H Note:
Double assignment of the function X-VALU/COLOR.
Toggle between the two functions by repeatedly press-
ing the corresponding key .
The functions in the group TRIG enable to automatically
calculate the (reduced) projection distance and the real
depth of the flaw in addition to the sound path S, and to
digitally display them in the measurement line.
• Projection distance PD:
distance of probe index (sound exit point) from the
position of the flaw, projected on the surface
• Reduced projection distance rPD:
distance of the probe’s leading face from the position
of the flaw, projected on the surface
• Depth d:
Distance between flaw position and surface
5-31
Operation
When using angle-beam probes, the instrument can
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound
path section or leg can be displayed as the measured
value La, Lb, or Lc.
5-32 Issue 06, 11/2007
Calculation of flaw position (function group TRIG)
ANGLE (Angle of incidence)
The ANGLE function enables you to adjust the angle of
incidence of your probe for the material used. This value
is required for the automatic calculation of the flaw posi-
tion.
Adjustment range: 0° ... 90°
– Select the ANGLE function.
– Use the right-hand rotary knob to select the required
setting.
X-VALUE (X-value of the probe)
The function X-VALUE enables you to set the X-value
(distance between the probe’s leading face and probe
index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
Adjustment range: 0 ... 100 mm/0 ... 40"
– Select the function X-VALUE.
– Use the right-hand rotary knob to set the required value.
USM 35X
Calculation of flaw position (function group TRIG)
COLOR
To make the orientation easier, the instrument is able to
display the different sound path sections or legs in dif-
ferent ways. You can choose between two display modes:
• 1 – The A-scan is shown in another color in every leg.
– Leg 1 in magenta
– Leg 2 in blue
– Leg 3 in magenta
• 2 – The legs are shown as background shadings.
• off – No legs are displayed.
– Select the function COLOR.
– Use the right-hand rotary knob to set the required
mode.
THICKNE (Material thickness)
Use the THICKNE function to set the material’s wall
thickness. This value is required for the automatic cal-
culation of the real depth.
Adjustment range: 1 ... 1000 mm/0.05 ... 400"
USM 35X Issue 06, 11/2007
Operation
– Select the THICKNE function.
– Use the right-hand rotary knob to set the required value.
DIAMET (Outside diameter of the test object)
You will need the DIAMET function for tests on circular
curved surfaces, for example when testing longitudinally
welded tubes. In order to make the USM 35X carry out
the corresponding correction of (reduced) projection
distance and depth, you should enter the outside diam-
eter of your test object in this function.
If you plan to carry out the flaw position calculation for
plane-parallel (flat) test objects, the DIAMET function
should be set to flat.
Adjustment range:
• 10 ... 2000 mm/0.4 ... 800"
• flat
– Select the DIAMET function.
– Use the right-hand rotary knob to set the required
value.
5-33
Operation Data saving (function group MEM)

5.12 Data saving
(function group MEM)
You will find all functions for storing, recalling and delet-
ing complete data sets in the function group MEM.
– If required, go to the second operating level.
– Select the function group MEM.
A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
was stored. This makes each one of your tests repro-
ducible.
You will find the following functions:
SET-# selecting number of a data set

RECALL recalling a stored data set

STORE storing a data set

DELETE deleting a data set

The functions are described in the order in which you

need them during your work.

5-34 Issue 06, 11/2007 USM 35X

Data saving (function group MEM)
Storing a data set
You can save your current setup to a data set.
– Select the function SET-#.
– Use the right-hand rotary knob to set the number
where you would want to store the current data set
(1 to 800).
– Select the function STORE.
– Use the right-hand rotary knob to set it to on.
The USM 35X stores the current data set. When the
storage process is completed, the function STORE is
automatically reset to off.
H Note:
The asterisk (*) before a selected data set number indi-
cates that this data set is already occupied. It is not
possible to overwrite an occupied data set; select an-
other data set which is still empty, or delete the occu-
pied data set. To avoid loss of data e.g. in case of a
software update you should save the data sets to a PC.
USM 35X Issue 06, 11/2007
Operation
All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored
(see chapter 5.13 Dataset management).
Deleting a data set
An occupied data set is marked with an asterisk (*)
before the data set number. You can delete these data
sets if you no longer need them.
– Select the function SET-#.
– Use the right-hand rotary knob to set the number of
the data set that you want to delete.
– Select the function DELETE.
– Use the right-hand rotary knob to set it to on. The
measurement line will then prompt: Delete data
set?
– Confirm by pressing the corresponding key one
more time (all other keys would abort the process).
The data set is now deleted; the asterisk preceding
the data set number is no longer there. The function
DELETE is automatically reset to off.
5-35
Operation Data saving (function group MEM)

Deleting all data set – Use the right-hand rotary knob to set it to on. The
measurement line will then prompt: Delete all data
You can delete all data sets if you no longer need them. sets?
– Select the function DELETE. – Confirm by pressing the corresponding key one
more time (all other keys would abort the process).

All data sets are now deleted. The function DELETE is

automatically reset to off.

Recalling a stored data set

You can recall a stored data set; your instrument will
then be provided with all the test-relevant technical fea-
tures that existed at the moment of the setup. A frozen
display of the stored A-scan appears.

H Note: A Attention:
Double assignment of the function DELETE/DELALL.
If a saved data set is loaded, the current instrument
Press the corresponding key repeatedly to toggle
setup is lost. If necessary, save the current instrument
between the functions.
setup to a new data set before loading a saved data set.

– Select the function SET-#.

5-36 Issue 06, 11/2007 USM 35X

Data saving (function group MEM) Operation

– Use the right-hand rotary knob to set the number of

the data set that you want to recall.

– Select the function RECALL.

– Use the right-hand rotary knob to set it to on. The

measurement line will then prompt: Recall data set?

– Confirm by pressing the corresponding key one

more time (all other keys would abort the process).

The data set is now loaded and the current setup is

overwritten. When the loading process is completed,
the function RECALL is automatically reset to off.

H Note:
The gate for surveying the echo can be moved in the
recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
0.5 % of the adjusted calibration range.

USM 35X Issue 06, 11/2007 5-37

Operation Dataset management (function group DATA)

5.13 Dataset management The functions in the function group DATA enable you to
easily manage the data sets stored in the USM 35X.
(function group DATA)
The following functions are available:
The USM 35X offers comprehensive functions for an
TESTINF You can save a lot of additional information
easy dataset management.
for every data set, e.g. data on the test
– If required, go to the second operating level. object, on the flaw detected, or comments.

– Select the function group DATA. PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
date of each data set.

DIR This function enables you to display a list

of all stored data sets, including the corre-
sponding dataset names.

SETTING This is where you will see a list of func-

tions including all settings of the current
data set.

5-38 Issue 06, 11/2007 USM 35X

Dataset management (function group DATA) Operation

TESTINF (Storing additional information) You can

For every data set, you can store additional information • save the current settings – together with the edited
which will support you in the easy management of the additional information – at a new and still empty
data sets. You have 9 fields at your disposal for this dataset number (analogously to function STORE in
purpose. the function group MEM),
You can enter a maximum of 24 alphanumeric charac- • subsequently enter and save additional information
ters in the following fields: for an already stored data set,
DATNAME Dataset name • overwrite the already saved additional information of a
data set.
OBJECT Object description
– Use the right-hand rotary knob to select and acitvate
FLAWIND Flaw indication the function TESTINF. The table will now show the
OPERAT Name of the person carrying out the test additional information saved for the currently selected
data set.
SURFACE Surface quality
– Use (INFO 3) and to select the field SET-#.
COMMENT Comments
– Use the right-hand rotary knob to view the additional
You can enter numerical values in these fields: information for other data sets and to edit this infor-
mation if required.
FLAWLEN Flaw length

X-POS x-position coordinate

Y-POS y-position coordinate

USM 35X Issue 06, 11/2007 5-39

Operation
H Note:
All stored data are displayed for data sets which are
already occupied. An occupied data set is marked with
an asterisk (*) before the data set number. If you have
selected an empty data set, the field data of the previ-
ously displayed data set are automatically transferred.
However, the data in the numerical fields FLAWLEN,
X-POS and Y-POS are deleted. This means that you
only have to edit the variable fields in test applications
which include continuous saving of results. All alpha-
numerical field data are automatically transferred but
can also be edited if necessary.
5-40 Issue 06, 11/2007
Dataset management (function group DATA)
Editing additional information
You can edit all items with additional information.
A Attention:
As long as the field data edited in this table have not
been saved, the previous entries remain valid. Please
keep this in mind, e.g. before selecting a new dataset
number: all changes in the current data set are lost!
– Select the required field.
– Use the left-hand rotary knob to mark the required
character position.
– Use the right-hand rotary knob to select the charac-
ter for this position. You only need the right-hand
rotary knob to enter the numerical values in
FLAWLEN, X-POS and Y-POS.
H Note:
You cannot edit the field SET-#. The number of the cur-
rent data set is displayed here.
USM 35X
Dataset management (function group DATA) Operation

Storing additional information PREVIEW (Dataset preview)

This function enables you to view the A-scans of all
A Attention: stored data sets.
If you have edited already existing additional informa-
tion, all previous additional information is overwritten – Select the PREVIEW function.
when the data are stored. – Use the right-hand rotary knob to set the function to
– Select the field STO-INF. on. The A-scan and the name of the first data set are
displayed.
– Use the right-hand rotary knob to set this function
on. The currently displayed data of the fields are now Viewing other data sets:
stored. The function STO-INF is automatically reset – Select the SET-# function.
to off at the end of data storage.
– Use the right-hand rotary knob to select the number
– If necessary, press one of the keys , or to of the required data set.
go back to the A-scan without storing the data.
– Select the RECALL function.
H Note: – Use the right-hand rotary knob to set the function to
In the case of previously empty data sets, all instrument on. The selected data set is displayed.
settings and the current A-scan are stored simulta-
neously with the edited field data. Only the edited field – If necessary, confirm the message using the corre-
data are stored for the previously occupied data sets. sponding key .
Previously stored instrument settings and – If necessary, press one of the keys , or to
A-scans are kept. go back to the currently active A-scan.

USM 35X Issue 06, 11/2007 5-41

Operation Dataset management (function group DATA)

DIR (Dataset directory) SETTING (Function list)

This function enables you to get an overview of all This function provides you with an overview of all set
stored data sets, including their names and numbers. functions of the current data set.

– Select the DIR function. – Select the SETTING function.

– Use the right-hand rotary knob to set the function to – Use the right-hand rotary knob to set the function to
on. on. The list of the currently set functions is displayed.

The directory list of the stored data sets is displayed – Turn the right-hand rotary knob to have other lines
(dataset numbers and names). The display shows displayed. The list is advanced by one line each.
12 data sets at a time. Occupied data sets are
marked with an asterisk (*). – If necessary, press one of the keys , or to
go back to the currently active A-scan.
– Turn the right-hand rotary knob to have other data
sets displayed. The list always advances by one line
each.

– If necessary, press one of the keys , or to

go back to the currently active A-scan.

5-42 Issue 06, 11/2007 USM 35X

Configuring the USM 35X for a test application Operation

5.14 Configuring the USM 35X for – If required, go to the third operating level.
a test application – Select the function group MEAS.

Besides the default settings for the instrument opera-

tion, you have to configure the USM 35X for calibration
and test tasks. You will find the corresponding functions
in the function groups MEAS, MSEL and LCD.

In addition, you have to check the current time and

date, and set them if required, so that they are correctly
stored together with the test results. Please look up the
function groups CFG1 and CFG2 for more functions for
the general instrument setup (please refer to chapter
5.15 General configuration).

USM 35X Issue 06, 11/2007 5-43

Operation Configuring the USM 35X for a test application

TOF (Selecting the measuring point)
The sound path measurement in the calibration process
or in the subsequent echo evaluation process depends
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
monitor gate with the rising flank of the first echo in the
gate.

The point of amplitude measurement is marked by a

small upward triangle on the corresponding gate bar.
The point of distance measurement is marked by a
small downward triangle.

H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.

measured soundpath: 19,44 mm

amplitude: 94 %

A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!

5-44 Issue 06, 11/2007 USM 35X

Configuring the USM 35X for a test application
In order to identify the points of measurement and to
avoid misinterpretation two indicators were introduced
per gate: The first triangle pointing downwards indicates
the position of the measured sound path (distance),
whereas the triangle pointing upwards marks the posi-
tion of the measured amplitude.
In TOF mode peak the sound path and amplitude mea-
surement is made at the maximum of the highest echo
in the gate.
measured soundpath: 19,65 mm
amplitude: 95 %
USM 35X Issue 06, 11/2007
Operation
In TOF mode jflank the sound path measurement is
made at the point of intersection of the monitor gate
with the rising flank of the first echo in the gate. The
amplitude is measured at the maximum of the first echo
in the gate even if there are further signals with higher
amplitudes in the gate.
measured soundpath: 19,44 mm
amplitude: 33 %
5-45
Operation Configuring the USM 35X for a test application

In principle, the peak measurement should be preferred S-DISP (Zoomed display of reading)
because the measured distances do not depend on the
echo height in that case. However, there are application You can have a selected reading zoomed in the A-scan
cases in which the flank measurement is either specified, display. The following readings can be selected for the
or it must be applied for technical reasons, e.g. in many zoomed display (in the second column the indication of
tests using dual-element (TR) probes. the readings in the measurement line):
Sa Sa Sound path for gate A
A Attention: Sb Sb Sound path for gate B
In any case, the adjustment of the measuring point for Sb-a ba Difference of single measurements for
calibration and for the subsequent test use must al- sound path gate B – gate A
ways be identical. Otherwise measurement errors may Ha % Ha Echo height gate A in % screen height
occur. Hb % Hb Echo height gate B in % screen height
– Select the TOF function. Ha dB ha Echo height gate A in dB
Hb dB hb Echo height gate B in dB
– Use the right-hand rotary knob to select the required R-start Rs Range start
setting.
R-end Re Range end
La La Number of legs in gate A
Lb Lb Number of legs in gate B
Lc Lc Number of legs in gate C
Only for flaw position calculation:
Da Da Depth for gate A

5-46 Issue 06, 11/2007 USM 35X

Configuring the USM 35X for a test application Operation

Db Db Depth for gate B General:

Pa Pa Projection distance for gate A Alarm Al Choice of gates for alarm triggering:
Pb Pb Projection distance for gate B gate A, B or A+B
Ra Ra Reduced projection distance for gate A
H Note:
Rb Rb Reduced projection distance for gate B
If you use the Data Logger option, values for the C gate
Only for DGS:
as well as a few special values for the Data Logger are
ERS ER Equivalent reflector size added to the existing ones, see chapter Option Data
Gt dB Gt DGS test sensitivity Logger.
GrdB Gr DGS reference gain (= instrument gain – Select the function S-DISP.
for the reference echo on 80 % screen
height) – Use the right-hand rotary knob to select the required
value for the zoomed display.
Only for DGS and DAC:
Ha %crv Ca Echo height gate A in % referred to curve H Note:
Hb %crv Cb Echo height gate B in % referred to curve
You can likewise configure all readings to be displayed
DGS-Crv Dc Diameter of the DGS curve below the A-scan at the four corresponding positions.
class cl Flaw class according to JIS Z3060-2002 Please refer to Configuring the measurement line.
DAC dB db dB-value by which the DAC gain has
been changed related to the reference
gain (= instrument gain for the DAC
echo on 80 % screen height)

USM 35X Issue 06, 11/2007 5-47

Operation Configuring the USM 35X for a test application

MAGNIFY (Gate spreading) H Note:

The setting of the MAGNIFY function causes a spreading
of the gate over the entire display width. You can choose
the gate to be used for the magnify function.
– Select the function MAGNIFY.
– Use the right-hand rotary knob to set the function to
aGATE or bGATE if you want to spread the range of
gate A or B over the entire display range.
A-Scan (Setting the A-scan)
This function offers you several options for setting your
A-scan.
• stndard
Normal A-scan setting. The key effects a static
freeze.
Read chapter 5.12 to learn how to load a saved data
set. As a restored data set is displayed with a frozen
A-scan, press the key first.
• envelop (echo dynamics)
The echo envelope is shown as a dotted line addition-
ally to the A-scan.
• peak b (maximum display)
You can use this function to record and document
(as well as to save if required) the peaked, maximum
echo display. With the B gate active, the A-scan with
the highest echo amplitude (recording of maximum
display) is shown as a dotted line additionally to the
“live” A-scan when peaking an echo display (in B
gate). This A-scan becomes the statically frozen
A-scan by pressing the key, and it can then be
evaluated accordingly.

• compare (A-scan comparison)

You can compare a current echo display with a
stored one. The display last stored using – either
from the current application or from a stored data set
– is displayed in the background as a dotted line.

5-48 Issue 06, 11/2007 USM 35X

Configuring the USM 35X for a test application Operation

• afreeze/bfreeze (automatic freeze) Configuring the measurement line

Whenever you select this function, an echo display
connected with the A or B gate will automatically
switch over to A-scan freeze (automatic freeze). This
setting is especially well suited e.g. for high-tempera-
ture measurements, for measurements involving diffi-
cult coupling conditions, or for spot weld testing.
The configuration of your measurement line is carried
out in the function group MSEL, this means that you
can choose the reading for one of the four possible posi-
tions of the measurement line for direct measured-value
display during the test.

– If required, go to the third operating level.

H Note:
– Select the function group MSEL.
If you are using a Data Logger option, you also have the
function cfreeze (for C gate) at your disposal.

– Select the function A-SCAN.

– Use the right-hand rotary knob to choose the required

setting.

– Pay attention to the additional information referring to

the corresponding setting options (see preceeding
page).

Functions of the function group MSEL:

MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4

Measured values at positions 1 to 4

USM 35X Issue 06, 11/2007 5-49

Operation Configuring the USM 35X for a test application

All measured values which have also been described for Setting the display
the zoomed display of the function S-DISP are availabe
to you at each position. In the function group LCD, you will find setting options
for the display screen itself and for the echo display.

H Note: – If required, go to the third operating level.

As an alternative, you can display a scale in the mea- – Select the function group LCD.
surement line (ref. function SCALE).

– Select the function MEAS-P1 to MEAS-P4.

– Use the right-hand rotary knob to set the required

measured value for each position in the correspond-
ing function.

H Note:
Double assignment of the function FILLED/VGA. Toggle
between the two functions by repeatedly pressing the
corresponding key .

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Configuring the USM 35X for a test application Operation

FILLED (Echo display mode) VGA

The function FILLED toggles between the filled and the
normal echo display mode. The filled echo display mode
improves the echo perceptibility due to the strong con-
trast, especially in cases where workpieces are scanned
more quickly.
H Note:
If the function COLOR is active, the filled area is also
displayed in different colors.
– Select the function FILLED.
– Use the right-hand rotary knob to set the function to
on or off.
USM 35X Issue 06, 11/2007
You can switch the VGA output on and off.
H Note:
You should only switch the VGA output on if you aim to
transfer the display contents to an external instrument.
If the VGA output is switched off, the current consump-
tion is reduced and the operating time is extended in
battery operation.
– Select the function VGA.
– Use the right-hand rotary knob to set the function to
on or off.
SCHEME
You have a choice between four color schemes. The
color scheme determines the color of all displays and
that of the background. You cannot vary the colors of
gates because they are fixed as follows:
• Gate A – red
• Gate B – green
• Gate C – blue
5-51
Operation Configuring the USM 35X for a test application

H Note: SCALE (Configuring the measurement line)

All color schemes are suitable for indoor use. For out-
door use, we recommend the color schemes 3 and 4.
– Select the function SCHEME.
– Use the right-hand rotary knob to choose the required
color scheme.
As an alternative to the measured values, the USM 35X
enables to display a scale in the measurement line. The
scale gives you an overview of the position of echoes.
You have a choice between a dimensionless ten-division
scale and a scale showing the real position of the ech-
oes.

The following settings are possible:

LIGHT (LCD backlight)
• measval Display of measured values
You can choose between a lighting in the economy
mode min. and a brighter lighting max. for the display • snd-pth Display of sound path scale
lighting. The economy mode is the default setting.
• div. Display of a dimensionless scale

H Note: – Select the function SCALE.

The economy mode reduces the current consumption – Use the right-hand rotary knob to set the required
and consequently increases the operating time in bat- display mode.
tery operation.

– Select the function LIGHT.

– Use the right-hand rotary knob to set the required

lighting.

5-52 Issue 06, 11/2007 USM 35X

General configuration Operation

5.15 General configuration Functions of

CFG1 CFG2:
Dialog language Date
More functions for the basic configuration of the USM 35X
Unit Time
may be found in the function groups CFG1 and CFG2.
Baud rate Analog output
– If required, go to the third operating level. Printer selection Horn
Assignment of the key Evaluation mode
– Select the function group CFG1 or CFG2.

H Note:
Double assignment of the functions DIALOG/UNIT and
DATE/TIME. Toggle between the two functions by re-
peatedly pressing the corresponding key .

DIALOG (Selecting the language)

In this function you can select the language for displaying
the function names on the screen and for the test report.

The following languages are available:

• German
• English (default setting)
• French
• Italian
• Spanish
USM 35X Issue 06, 11/2007 5-53
Operation General configuration

• Portuguese UNIT (Selecting units of measurement)

• Dutch
You can choose the required units between mm or inch
• Swedish
in the function UNIT.
• Slovenian
• Romanian
• Finnish A Attention:
• Czech You should always make your decision on the units
• Danish immediately when starting to work with the USM 35X. If
• Hungarian you change the unit, all current settings are deleted,
• Croatian and the basic setup is loaded.
• Russian
– Select the function UNIT.
• Slovakian
• Norwegian – Use the right-hand rotary knob to select the required
• Polish unit.
• Japanese
• Chinese To avoid any accidental deleting of values, the
measurement line will display a safety prompt:
• Serbian
Change unit?
– Select the function DIALOG.
– If you are sure that you want to change the unit of
– Use the right-hand rotary knob to select the required measurement, press the corresponding key of the
language. function UNIT. Any other key would abort the process.

The unit of measurement is now changed; the current

data are deleted.

5-54 Issue 06, 11/2007 USM 35X

General configuration Operation

BAUD-R (Baud rate for transmission) H Note:

In this function you can select the baud rate for the For more details on the how to print out a test report,
serial port transmission. You have a choice between please refer to chapter 6 Documentation.
300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and
– Select the function PRINTER.
57600 Baud.
– Use the right-hand rotary knob to select the required
– Select the function BAUD-R.
printer.
– Use the right-hand rotary knob to select the required
baud rate.
COPYMOD (Assignment of the key)
PRINTER (Printer for test report) When the key is pressed, data are output to the
RS232 interface and transferred to a printer or a PC.
In this function you can select the connected printer for
printing out your test report. You can use the function COPYMOD to choose the
data to be transferred when the key is pressed. You
You have a choice between the following printer types: have the following setting options:
• Epson • hardcpy
• HP LaserJet Hardcopy of the screen contents
• HP DeskJet • report
• Seiko DPU 41x Test report with A-scan, all relevant settings for the
• Seiko DPU 3445 inspection and space for hand-written remarks
• HP LaserJet 1200 series • meas P5
• HP DeskJet 1200 series The magnified value given at the right upper corner of
the A-scan
USM 35X Issue 06, 11/2007 5-55
Operation General configuration

• meas P1 H Note:
The measured value given at position 1 in the
Please also refer to chapter 6 Documentation.
measurement line
• pardump – Select the function COPYMOD.
All instrument functions with the current settings
• PCX – Use the right-hand rotary knob to set the required
Screen contents as a PCX-format file. To transfer the assignment for the key.
data to the PC, you will need a terminal program.
• store TIME/DATE (Setting the time and date)
The current instrument setting is stored to the
selected (free) data set, and the data set number You have to check the current date and time and, if
(DAT-#) is automatically increased. required, set them so that these data are correctly
saved together with the test results.
• datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
• off
The key is deactivated.
• special
as setting “hardcpy”. After printout of the screen
contents no form feed, every press on the key prints
out the next hardcopy on the same page (three or
four hardcopies depending on the printer).

5-56 Issue 06, 11/2007 USM 35X

General configuration Operation

H Note: ANAMOD
Double assignment of the function DATE/TIME (icon >). You can output results of measurements at the analog
Toggle between the two functions by repeatedly press- output for external further processing. Use the function
ing the corresponding key . ANAMOD to configure the analog output in case there
is no echo in the evaluation gate and the analog voltage
A Attention: has been selected for the sound path at the output.

For a correct documentation always make sure that you You have the following setting options:
are using correctly set time and date values. Be aware
that the USM 35X displays the year as a two digit num- • lo volt
ber! The analog output supplies 0 volt.

– Select the function TIME. • hi volt

The analog output supplies 5 volts.
– Use the left-hand rotary knob to highlight the value
that you want to change, e.g. the hour. – Select the function ANAMOD.

– Use the right-hand rotary knob to change the high- – Use the right-hand rotary knob to choose the required
lighted value. value.

– Select the function DATE.

– Use the left-hand rotary knob to highlight the value

that you want to change, e.g. the day.

– Use the right-hand rotary knob to change the high-

lighted value.
USM 35X Issue 06, 11/2007 5-57
Operation
HORN
In this function, you can decide whether or not an
acoustic alarm should be given in addition to the visual
alarm (LED A).
– Select the function HORN.
– Use the left-hand rotary knob to set the horn to on or
off.
H Note:
Error alarms can be triggered unter certain circumstanc-
es. These are caused by intermediate conditions in
instrument operation occuring when the instrument is
used, i.e. when function parameters are changed. Pos-
sible alarms occuring during instrument operation
(setting of functions) are to be ignored.
5-58 Issue 06, 11/2007
General configuration
EVAMOD (Echo evaluation)
This is where you can choose a method for the evalua-
tion of the measured reflector echo. Depending on the
instrument version used, you have various methods to
choose from.
• REF (default setting)
Evaluation using the measurement of dB difference,
available for all instrument versions
• AWS
Rating of welds according to AWS D1.1
• DAC (only USM 35X DAC and USM 35X S)
Evaluation using the Distance-Amplitude Curve
• JISDAC (only USM 35X DAC and USM 35X S)
Evaluation using the Distance-Amplitude Curve
according to JIS Z3060-2002
• DGS (only USM 35X S)
Evaluation using the DGS method
– Select the function EVAMOD.
– Use the right-hand rotary knob to choose the required
method.
USM 35X
Other functions with special keys Operation

5.16 Other functions with Zooming the echo display

special keys If you press the key , the echo display is zoomed (zoom
function) and is superimposed on the function group.
H Note:
The functions are not accessible in this mode, except
You will find a description of the key (setting of the for the gain. It can still be set by means of the left-hand
dB incrementation for gain) on page 5-5; the key, rotary knob.
which you will need for printing out your test report, is
H Note:
described in chapter 6 Documentation.
You cannot switch on the zoom function with gate
widths smaller than 0.5 mm/0.02" (5920 m/s).
Freeze
The key enables you to store (freeze) the displayed – Press the button in order to change to the zoom
image on the screen. Gate parameters may still be mode.
changed in order to evaluate any signal being displayed – Press the button one more time in order to return
in the frozen screen. The measurement resolution is to the normal mode.
only 0.5 % of the displayed range.

– Press if you want to store (“freeze”) a current The key

display.
You can use this key to save measured values and A-
– Press again in order to return to normal mode. scans. In addition, it serves for recording echoes, for
example as a reference echo.

– Press the key in order to save a measured value

or to record an echo.
USM 35X Issue 06, 11/2007 5-59
Operation
5.17 Status symbols and LEDs
Status symbols can be displayed in the line below the
screen display to inform about certain settings and con-
ditions of the USM 35X. The LEDs above the display
give you further information.
Status symbols
Symbol Description
* Display memory is enabled (freeze),
display is stored.
! Data transfer active,
(printing or remote control).
Batterie charge indicator (status of
remaining charge in steps of 10 %)
F Function TOF is set to flank.
P Function TOF is set to peak.
J Function TOF is set to jflank.
T Function T-CORR is active.
R Reference echo has been recorded (DGS).
A Function ATT-OBJ/ATT-REF (sound
attenuation) is active.
5-60 Issue 06, 11/2007
Staus symbols and LEDs
H Note:
If you are using the Data Logger option, you’ll find more
status symbols, see chapter Option Data Logger.
LEDs
Symbol Description
A Gate alarm.
R Function REJECT is active.
D Function DUAL (pulser-receiver separation)
is active.
H Note:
Error alarms can be triggered unter certain circumstanc-
es. These are caused by intermediate conditions in in-
strument operation occuring when the instrumet is used,
i.e. when function parameters are changed. Possible
alarms occuring during instrument operation (setting
of functions) are to be ignored.
USM 35X
Distance-amplitude curve (only USM 35X DAC and USM 35S) Operation

5.18 Distance-amplitude curve
(only USM 35X DAC and
USM 35S)
H Note:
The DAC function is available as a fixed function in the
second operating level on the USM 35X DAC. With the
USM 35X S, the DAC function can be additionally
switched over to DGS evaluation mode.
You will find the functions for the distance-amplitude
curve in the function group DAC. If required, select the
setting DAC in the function group EVAMOD first.
– If required, go to the third operating level.
– Select the function group CFG2.
– Switch the function EVA-MOD over to the setting
DAC.
– Go to the second operating level.

Due to the angle of the sound beam spread and to the – Select the function group DAC.
sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.

A distance-amplitude curve, which is recorded with de-

fined reference reflectors, graphically displays these
influences.

If you use a reference block having artificial flaws when

recording a DAC you will be able to apply these echo
amplitudes for the evaluation of discontinuities without
any further correction. The reference block should be
made of the same material as the test object.

USM 35X Issue 06, 11/2007 5-61

Operation Distance-amplitude curve (only USM 35X DAC and USM 35S)

H Note: H Note:
Double assignment of the function T-CORR/OFFSET. No reference echoes can be recorded with
Toggle between the two functions by repeatedly press- DACMODE = TCG. TCG can only be activated if the
ing the corresponding key . reference echoes recorded are situated within a dynam-
ic range of 40 dB. Otherwise an error message is out-
put. If the TCG setting should be nevertheless be used
DACMOD (Activating DAC/TCG) in this case, then the DAC must be reduced (by delet-
You can use this function to activate the DAC. The fol- ing the last reference points) until TCG can be switched
lowing settings are available: on.

• off – Select the function DACMOD.

No DAC is active.
– Use the right-hand rotary knob to select the DAC
• DAC setting.
The already saved distance-amplitude curve is
displayed on the screen, or a new DAC is recorded. If there is a DAC stored, it will now be active.

• TCG – Select the TCG setting.

An existing DAC (at least 2 reference points) is The TCG function is activated so that the DAC
displayed as a horizontal TCG line. becomes a horizontal recording threshold. This
means: all reference echoes recorded are brought
(lifted or lowered) to the same echo height.

– Use the right-hand rotary knob to select the setting

off in order to deactivate the DAC again.

5-62 Issue 06, 11/2007 USM 35X

Distance-amplitude curve (only USM 35X DAC and USM 35S)
DACECHO (Recording reference curve)
A Attention:
Before starting to record a reference curve, the instru-
ment must be correctly calibrated (ref. section
5.7 Calibrating the USM 35X).
The moment a new curve is recorded, a possibly al-
ready existing curve must be deleted. If necessary,
make sure that the old curve has been stored in a free
data set before starting to record a new curve!
– Select the function DACMOD.
– Use the right-hand rotary knob to set the function to
DAC. The function DACECHO is set to 0 since there
is no previously recorded echo.
– Couple the probe to the reference block, and peak
the first reference echo. Use the left-hand rotary knob
to bring the echo to an amplitude between 70 % and
100 % screen height.
– Select the function aSTART, and then move the gate
so that the selected echo is the highest of the echo
sequence within the gate range.
USM 35X Issue 06, 11/2007
Operation
– Press to record the first reference echo. The
instrument gain will automatically change until the
DAC echo in gate A reaches 80 % screen height
(+/–0,3 dB). The function DACECHO is set to 1 to
indicate that the first reference echo has been
successfully recorded. Simultaneously the status
symbol “R” appears (= reference echo stored).
– Peak the next reference echo, and repeat the record-
ing process for other curve points. The number in the
function DACECHO is increased by 1 with each
recording.
H Note:
If the message “Echo is not valid” appears, the refer-
ence point could not be recorded. Check the gate posi-
tion as well as the height of the reference echo and
repeat the recording.
As soon as you have recorded at least two curve refer-
ence points. Your DAC is already active (please see
previous section). You can record a maximum of
10 curve reference points.
5-63
Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)

Deleting reference points or the complete DAC T-CORR (Sensitivity correction)

You can delete the reference point which was recorded This function enables you to compensate for the trans-
last in each case, or the complete DAC. fer losses in the material under test. This correction is
necessary if test object and reference block have differ-
– Select the function DACECHO.
ent surface qualities.
– Turn the right-hand rotary knob downward (counter-
You have to find out the adjustment value for the com-
clockwise). The message “Do you want to delete
pensation of transfer losses by experiments. The gain is
the DAC echo?” appears in the measurement line.
varied accordingly in this connection, the curve line
– Press the key in order to delete the last echo, or remains the same.
press another key in order to cancel the process of
– Select the function T-CORR.
deleting.
– Use the right-hand rotary knob to select the required
In this way, you can record one or several new reference
setting.
points.

– In order to delete the complete DAC, turn the right-

hand rotary knob upward (clockwise). The message
“Do you want to delete all DAC echoes?” appears
in the measurement line.

– Press the key in order to delete all echoes, or

press another key in order to cancel the process of
deleting.

5-64 Issue 06, 11/2007 USM 35X

Distance-amplitude curve (only USM 35X DAC and USM 35S)
OFFSET (Distance of multiple DAC)
You can activate a multiple DAC and at the same time
determine the distance from the registration curve. The
default setting 6.0 dB generates four other curves at
–12 dB, –6 dB, +6 dB, and +12 dB from the registration
curve. The setting 0 generates only the registration
curve. Any setting different from 0 generates four other
curves at a set distance from the original curve. For a
better distinction in multiple DACs the registration curve
is displayed as a bold line.
Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB
– Select the function OFFSET.
– Use the right-hand rotary knob to select the required
setting.
USM 35X Issue 06, 11/2007
Operation
Echo evaluation with DAC
In order to be able to evaluate a flaw indication by
means of the DAC, certain conditions must be met:
• The distance-amplitude curve must already be
recorded.
• It only applies to the same probe that was used when
recording the curve. Not even another probe of the
same type must be used!
• The DAC only apply to the material corresponding to
the material of the reference block.
• All functions affecting the echo amplitude must be
set the same way as they were when the curve was
recorded. This applies in particular to the following
functions: POWER, FREQU, RECTIFY, MTLVEL and
REJECT.
5-65
Operation
Change of probe delay in DAC/TCG mode
In general changing the delay line automatically influ-
ences the shape of the sound beam, and this would
theoretically require a new DAC recording. However, a
small change of the probe delay, which typically occurs
with normal wear during inspection, has no significant
influence on the programmed distance law.
A Attention:
A recorded DAC will no longer be valid, in case you
change the probe delay to a larger value, e.g. by adding
an additional delay line to the probe after the DAC has
been recorded without the delay line in place.
The same applies for immersion testing: the DAC re-
cording must be performed when the final water delay is
set.
Otherwise false echo evaluation may result!
5-66 Issue 06, 11/2007
Distance-amplitude curve (only USM 35X DAC and USM 35S)
Change of TOF mode in DAC/TCG
Echo amplitude evaluation in general is related to the
echo peak of the respective signal. Therefore the peak
mode is recommended. This guarantees that the read-
ings of the amplitude and the TOF (sound path, surface
distance, depth) always belong to the echo of interest
(= the highest echo in the gate).
In flank mode the TOF reads the first echo in the gate,
but the amplitude will be measured at the highest peak
in the gate which possibly might belong to another sig-
nal. For a better identification of the TOF and amplitude
measurement the instrument's SW has been improved
and indicates the TOF measurement point with the gate
cursor ∇, and the amplitude with the second gate cur-
sor ∆.
USM 35X
Distance-amplitude curve (only USM 35X DAC and USM 35S)
A Attention:
Switching to flank mode when DAC/TCG is active may
lead to the following effects:
• Sound path readings may be affected by an error due
to the fact that the instrument had previously been
calibrated in peak mode.
• In case more than one echo is in the gate, TOF (e.g.
sound path) and amplitude reading may no longer
belong to the same echo.
USM 35X
Operation
5.19 Distance-amplitude curve
according to JIS Z3060-2002
(only USM 35X DAC and
USM 35S)
H Note:
The JISDAC function for echo evaluation with the
dictance-amplitude curve and additional classification
according to JIS Z3060-2002 is available in the
USM 35X DAC and USM 35X S.
You will find the functions for the distance-amplitude
curve according to JIS Z3060-2002 in the function group
JDAC. If required, select the setting JDAC in the func-
tion group EVAMOD first.
– If required, go to the third operating level.
– Select the function group CFG2.
– Switch the function EVAMOD over to the setting
JDAC.
– Go to the second operating level.
Issue 06, 11/2007 5-67
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)

– Select the function group JDAC. DACMOD (Activating DAC according to JIS)
You can use this function to activate the DAC. The fol-
lowing settings are available:

• off
No DAC is active.

• DAC
DAC according to JIS with 6 curves. The first 4 curves
are identified with the letters L, M, H and U dedicated
to these curves, and therefore move with any gain
change.

In JISDAC also the echo evaluation in classes can be

performed. The flaw class depends on the position of
H Note: the echo peak within the first 4 curves:

Double assignment of the functions DACMOD/BOLDLI class I: amplitude < curve L

and T-CORR/OFFSET. Toggle between the two functions class II: curve L < amplitude < curve M
by repeatedly pressing the corresponding key . class III: curve M < amplitude < curve H (registra-
tion level)
class IV: amplitude > curve H

– Select the function DACMOD.

5-68 Issue 06, 11/2007 USM 35X

DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
– Use the right-hand rotary knob to select the DAC
setting.
If there is a DAC stored, it will now be active.
– Select the TCG setting.
The TCG function is activated so that the DAC
becomes a horizontal recording threshold. This
means: all reference echoes recorded are brought
(lifted or lowered) to the same echo height.
– Use the right-hand rotary knob to select the setting
off in order to deactivate the DAC again.
USM 35X Issue 06, 11/2007
Operation
DACECHO (Recording reference curve)
A Attention:
Before starting to record a reference curve, the instru-
ment must be correctly calibrated (ref. section 5.7
Calibrating the USM 35X).
The moment a new curve is recorded, a possibly al-
ready existing curve must be deleted. If necessary,
make sure that the old curve has been stored in a free
data set before starting to record a new curve!
– Select the function DACMOD.
– Use the right-hand rotary knob to set the function to
DAC. The function DACECHO is set to 0 since there
is no previously recorded echo.
5-69
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)

– Couple the probe to the reference block, and peak The function DACECHO displays the number 1.
the first reference echo. Use the left-hand rotary knob
to bring the echo to an amplitude between 70 % and
100 % screen height.

– Select the function aSTART, and then move the gate

so that the selected echo is the highest of the echo
sequence within the gate range.

– Press to record the first reference echo. The

instrument gain will automatically change until the
DAC echo in gate A reaches 80 % screen height
(+/– 0,3 dB). The function DACECHO is set to 1 to
indicate that the first reference echo has been
successfully recorded. Simultaneously the status
symbol “R” appears (= reference echo stored). – Peak the next reference echo, and repeat the record-
ing process for other curve points. The number in the
H Note: function DACECHO is increased by 1 with each
recording.
The dB-value by which the gain has been changed relat-
ed to the reference gain can be displayed using the new
parameter DAC dB. H Note:
If the message “Echo is not valid” appears, the refer-
ence point could not be recorded. Check the gate posi-
tion as well as the height of the reference echo and
repeat the recording.

5-70 Issue 06, 11/2007 USM 35X

DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
Deleting reference points or the complete DAC
You can delete the reference point which was recorded
last in each case, or the complete DAC.
– Select the function DACECHO.
– Turn the right-hand rotary knob downward (counter-
clockwise). The message “Do you want to delete
the DAC echo?” appears in the measurement line.
– Press the key in order to delete the last echo, or
press another key in order to cancel the process of
deleting.
– In order to delete the complete DAC, turn the right-
hand rotary knob upward (clockwise). The message
“Do you want to delete all DAC echoes?” appears
in the measurement line.
– Press the key in order to delete all echoes, or
press another key in order to cancel the process of
deleting.
In this way, you can record one or several new reference
points.
USM 35X Issue 06, 11/2007
Operation
BOLDLI (Choice of a registration curve)
One of the four curves marked with a character (L, M,
H, U) can be selected as the registration curve. This
registration curve will then be displayed as a bold line
and an echo amplitude evaluation (dB-to-curve) will be
made for this curve.
– Select the function BOLDLI.
– Use the right-hand rotary knob to select the required
setting.
T-CORR (Sensitivity correction)
This function enables you to compensate for the trans-
fer losses in the material under test. This correction is
necessary if test object and reference block have differ-
ent surface qualities.
You have to find out the adjustment value for the com-
pensation of transfer losses by experiments. The gain is
varied accordingly in this connection, the curve line
remains the same.
5-71
Operation
– Select the function T-CORR.
– Use the right-hand rotary knob to select the required
setting.
OFFSET (Distance of multiple DAC)
You can activate a multiple DAC and at the same time
determine the distance from the registration curve. The
default setting 6.0 dB generates four other curves at
–12 dB, –6 dB, +6 dB, and +12 dB from the registration
curve, and additionally two other curves at +18 dB and
+24 dB. The setting 0 generates only the registration
curve and the two fixed curves. Any setting different
from 0 generates four other curves at a set distance
from the original curve. For a better distinction in multi-
ple DACs the registration curve is displayed as a bold
line.
Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB
– Select the function OFFSET.
– Use the right-hand rotary knob to select the required
setting.
5-72 Issue 06, 11/2007
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
Echo evaluation with DAC
In order to be able to evaluate a flaw indication by
means of the DAC, certain conditions must be met:
• The distance-amplitude curve must already be
recorded.
• It only applies to the same probe that was used when
recording the curve. Not even another probe of the
same type must be used!
• The DAC only apply to the material corresponding to
the material of the reference block.
• All functions affecting the echo amplitude must be
set the same way as they were when the curve was
recorded. This applies in particular to the following
functions: POWER, FREQU, RECTIFY, MTLVEL and
REJECT.
USM 35X
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
Change of probe delay in DAC mode
In general changing the delay line automatically influ-
ences the shape of the sound beam, and this would
theoretically require a new DAC recording. However, a
small change of the probe delay, which typically occurs
with normal wear during inspection, has no significant
influence on the programmed distance law.
A Attention:
A recorded DAC will no longer be valid, in case you
change the probe delay to a larger value, e.g. by adding
an additional delay line to the probe after the DAC has
been recorded without the delay line in place.
The same applies for immersion testing: the DAC re-
cording must be performed when the final water delay is
set.
Otherwise false echo evaluation may result!
USM 35X Issue 06, 11/2007
Operation
Change of TOF mode in DAC/TCG
Echo amplitude evaluation in general is related to the
echo peak of the respective signal. Therefore the peak
mode is recommended. This guarantees that the read-
ings of the amplitude and the TOF (sound path, surface
distance, depth) always belong to the echo of interest
(= the highest echo in the gate).
In flank mode the TOF reads the first echo in the gate,
but the amplitude will be measured at the highest peak
in the gate which possibly might belong to another sig-
nal. For a better identification of the TOF and amplitude
measurement the instrument's SW has been improved
and indicates the TOF measurement point with the gate
cursor ∇, and the amplitude with the second gate cur-
sor ∆.
5-73
Operation
A Attention:
Switching to flank mode when DAC/TCG is active may
lead to the following effects:
• Sound path readings may be affected by an error due
to the fact that the instrument had previously been
calibrated in peak mode.
• In case more than one echo is in the gate, TOF (e.g.
sound path) and amplitude reading may no longer
belong to the same echo.
5-74 Issue 06, 11/2007
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
5.20 Evaluation according to the
DGS method (only USM 35X S)
With the USM 35X S, you can use both the DAC and
the DGS method of amplitude evaluation.
Measuring with DGS
Using the DGS function (Distance Gain Size), you can
compare the reflecting power of a natural flaw in the test
object with that of a theoretical flaw (circular disk-
shaped equivalent reflector) at the same depth.
A Attention:
You are comparing the reflecting power of a natural flaw
with that of a theoretical flaw. No definite conclusions
may be drawn on the natural flaw (roughness, inclined
position, etc.).
The so-called DGS diagram forms the basis for this
comparison of the reflecting power. This diagram con-
sists of a set of curves showing the correlation of three
influencing variables:
USM 35X
Evaluation according to the DGS method (only USM 35X S)
• Distance D between the probe and circular disk-
shaped equivalent reflector
• Difference in gain G between various large circular
disk-shaped equivalent reflectors and an infinitely
large backwall
• Size S of the circular disk-shaped equivalent reflec-
tor. The influencing variable S always remains con-
stant for one curve of the set of curves
The advantage of the DGS method lies in the fact that
you can carry out reproducible evaluations of small dis-
continuities. The reproducibility is most of all important,
for example, whenever you aim to carry out an accep-
tance test.
Apart from the influencing variables already mentioned,
there are other factors determining the curve shape:
• sound attenuation
• transfer losses
• amplitude correction value
• probe.
USM 35X
Operation
The following probe parameters affect the curve shape:
• element or crystal diameter
• frequency
• delay length
• delay velocity
You can adjust these parameters on the USM 35X S in
such a way that you can use the DGS method with
many different probes and on different materials.
H Note:
Before setting the DGS function, the instrument must
first be calibrated because all functions affecting the
DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
changed after the reference echo has been recorded.
For T/R probes, MTLVEL can only be set from 5350 to
6500 m/s.
Please also refer to chapter 5.7 Calibrating the
USM 35X on this subject.
Issue 06, 11/2007 5-75
Operation
Validity of the DGS method
Echo amplitude evaluations according to the DGS
method are only reliable and reproducible in cases
when:
• On materials having non-negligible attenuation
losses, the compensation coefficients will have to be
defined. In this case, it is necessary to calibrate the
equipment on test blocks containing test reflectors of
known size at different distances to make a correct
compensation for the attenuation losses on the
actual test object. After matching the results of the
test reflectors to the diagram or built-in curves this
setting is valid for all flaw sizes and for all distances
covered by the DGS curves.
• The reference echo is received from the test object if
possible. If this is not possible, it should be ensured
that the reference block is made of the same material
as the test object.
• The evaluation is carried out using the same probe
which was also used for recording the reference
echo. Another probe of the same type can be used
after recording a new reference echo.
5-76 Issue 06, 11/2007
Evaluation according to the DGS method (only USM 35X S)
• Echo amplitudes for reflector distances smaller than
half of the probe’s near-field length are subject to
heavy variation – for physical reasons due to interfer-
ence phenomena effecting the area. Thus, evaluation
results may fluctuate more as the usually permissi-
ble ±2 dB. An evaluation according to the DGS
method is possible but not recommended for this
cases.
Change of probe delay in DGS mode
In general changing the delay line automatically influ-
ences the shape of the sound beam, and this would
theoretically require a new DGS setup. However, a
small change of the probe delay, which typically occurs
with normal wear during inspection, has no significant
influence on the programmed distance law.
A Attention:
An existing DGS setup will no longer be valid, in case
you change the probe delay to a larger value, e.g. by
adding an additional delay line to the probe after the
DGS reference echo has been recorded without the
delay line in place.
USM 35X
Evaluation according to the DGS method (only USM 35X S) Operation

The same applies for immersion testing: the DGS setup

must be performed when the final water delay is set.

Otherwise false echo evaluation may result!

Change of TOF mode in active DGS

Echo amplitude evaluation in general is related to the
echo peak of the respective signal. Therefore the peak
mode is recommended. This guarantees that the read-
ings of the amplitude and the TOF (sound path, surface
distance, depth) always belong to the echo of interest
(= the highest echo in the gate).

In flank mode the TOF reads the first echo in the gate,
but the amplitude will be measured at the highest peak
in the gate which possibly might belong to another sig-
nal. For a better identification of the TOF and amplitude
measurement the instrument's SW has been improved
and indicates the TOF measurement point with the gate
cursor ∇, and the amplitude with the second gate cur-
sor ∆.
A Attention:
Switching to flank mode when DGS is active may lead
to the following effects:
• Sound path readings may be affected by an error due
to the fact that the instrument had previously been
calibrated in peak mode.
• In case more than one echo is in the gate, TOF (e.g.
sound path) and amplitude reading may no longer
belong to the same echo.

USM 35X Issue 06, 11/2007 5-77

Operation Evaluation according to the DGS method (only USM 35X S)

Selecting the DGS mode Double assignment of functions:

– If required, go to the third operating level. The following functions are double assigned. Toggle
between the two functions by repeatedly pressing the
– Select the function group CFG2. corresponding key .
– Switch the function EVA-MOD over to the setting
DGS.
DGSMEN> DGSMEN>
– Go to the second operating level. Calling the DGS menu Switching on/off the
DGS evaluation mode
– Select the function group DGS.
T-CORR> OFFSET>
Setting the transfer Activating the multi-curve
correction display mode

Default settings for the DGS measurement

In the next step, the DGS menu is called enabling to
select the corresponding probe and to set the other
DGS parameters:

– Select the function DGSMEN.

– Use the right-hand rotary knob to call the DGS menu.

– Define your settings:

5-78 Issue 06, 11/2007 USM 35X

Evaluation according to the DGS method (only USM 35X S)
• PROBE-#: probe number
Fixed-programmed probes with all settings (PRB-
NAME, DEL-VEL, D eff and PRBFREQ cannot be
changed in the case of these probes);
PROBE-# = 0 is user-programmable with reference to
all parameters.
• PRBNAME: probe name
The name belongs to the selected probe number and
cannot be changed; the individual probe name can be
entered only with PROBE-# = 0.
• DGS-CRV: registration curve for DGS evaluation
This enables you to select the circular disk-shaped
equivalent reflector diameter to be used for displaying
the DGS curve and used as recording threshold for
echo evaluations.
• DEL-VEL: delay material velocity of the probe
Predefined with programmed probes.
• D eff: effective element diameter of the probe used
Predefined with programmed probes.
USM 35X Issue 06, 11/2007
Operation
• PRBFREQ: probe frequency
Frequency of the transducer; predefined with pro-
grammed probes.
• REFECHO: type of the reference reflector used
BW backwall
SDH side drilled hole
FBH flat bottom hole
• REFSIZE: size of the reference reflector
• ATT-REF: sound attenuation in the reference block
• ATT-OBJ: sound attenuation in the test object
• AMPLCOR: value for the amplitude correction.
This is required whenever you are using an angle
probe and the quadrant echo from the calibration
standards K1 or K2 as a reference reflector.
– To return to the A-scan, press one of the following
keys: , or .
5-79
Operation Evaluation according to the DGS method (only USM 35X S)

Example Recording the reference echo and

displaying the DGS curve
To be able to display the required DGS curve, you have
to first record the reference echo.

– You have to start by optimizing the echo of the

reference reflector, in this case the backwall echo
from the test object.

– Continue by positioning the gate on the reference echo.

In this example, the probe MB 4 S is selected. Reference

reflector = backwall, the 3 mm circular disc is to be
displayed as curve. The sound attenuation corrections
ATT-REF and ATT-OBJ and the amplitude correction
AMPLCOR (for angle probes and calibration standard
K1/K2) remain at 0.

– Select the function DGS-REF, and use the right-hand

rotary knob to switch the function on. The message:
“Do you want to change the DGS reference
echo?” appears.
5-80 Issue 06, 11/2007 USM 35X
Evaluation according to the DGS method (only USM 35X S)
– If required, confirm by pressing again.
After the successful recording of the reference echo, a
highlighted R will be displayed in the measurement line.
– Set the function DGSMOD> to on, to switch on DGS
curve.
Taking the general DGS diagram as a basis, the instru-
ment calculates the required test sensitivity for display-
ing the 3 mm curve with its maximum at 80 % screen
height, and sets this value. The current gain is set to 0
during this. In the case of subsequent gain variations,
the curve is automatically adapted.
USM 35X
Operation
Evaluation of reflectors
Every echo situated within the gate can be immediately
evaluated:
The measurement line has been configured in such a
way that the sound path S, the echo height in dB
referred to the DGS curve, the equivalent reflector
size (ERS) of the flaw echo and the calibration range
are displayed.
The measured value to be zoomed in the A-scan is cho-
sen by means of the function S-DISP in the function
group MEAS. ERS was chosen in the above example.
(Also refer to Configuring the measurement line,
p. 5-49.)
Issue 06, 11/2007 5-81
Operation
S-DISP = Ha%, i.e. echo height evaluation as a per-
centage.
At the same time, the multiple-curve display mode is
also active with a curve distance of OFFSET = 6 dB.
5-82 Issue 06, 11/2007
Evaluation according to the DGS method (only USM 35X S)
S-DISP = Ha%Crv, the evaluation result is now the
value exceeding the curve in %.
S-DISP = Gt is a special case: the value displayed is
the DGS test sensitivity with which the maximum of the
specified curve is at 80 %.
This value serves for the purpose of checking and docu-
menting.
USM 35X
Evaluation according to the DGS method (only USM 35X S)
Transfer correction
The transfer correction is activated by means of the
function T-CORR. The test sensitivity is varied by this
value without recalculating the curve.
This means that the test sensitivity is increased by
6 dB in the example in order to compensate for a possi-
bly existing surface roughness. The echo is conse-
quently drawn higher by 6 dB on the left, i.e. evaluated
with ERS 3.2. Status indicator in the measurement line:
a highlighted T.
USM 35X
Operation
Sound attenuation
If necessary, the DGS curve can take the component’s
effective sound attenuation (ATT-OBJ) into account.
With the value set here, the curve shape is recalculated
so that the effect of sound attenuation is now taken into
consideration when evaluating reflectors.
The DGS curve now includes the effect of sound attenu-
ation. An active sound attenuation correction is indicat-
ed in the measurement line by a highlighted A.
The sound attenuation in the reference block can only
be set prior to recording the reference echo. Therefore,
an error message is displayed here if an attempt is
Issue 06, 11/2007 5-83
Operation
made to change the value because, in fact, a valid refer-
ence echo already exists.
In addition, a different reference reflector type has been
used in the DGS menu below: instead of a backwall, a
circular disk (flat-bottom hole) having a diameter of
3 mm has been set in this case. In this case, of course,
the reference echo has to be received from a 3 mm cir-
cular disk.
After switching on the DGS curve, the reference echo
must therefore clearly touch the 3 mm curve.
5-84 Issue 06, 11/2007
Evaluation according to the DGS method (only USM 35X S)
A side-drilled hole can also be used as a further refer-
ence reflector with some limitations. It must have a
diameter corresponding to at least 1.5 times the wave-
length used, and the distance must be 1.5 times the
near-field length. The USM 35X S will check these con-
ditions if you aim to use a side-drilled hole as reference
reflector, and will issue an error message if required.
The table on the next page indicates these minimum
data for the existing probes in steel.
Conditions for the use of side-drilled holes as reference
reflectors in steel. For other materials, the values must
be converted accordingly.
USM 35X
Evaluation according to the DGS method (only USM 35X S) Operation

Probe Wavelength Minimum Diameter Near Field Length Minimum Distance

in steel side-drilled hole in steel in steel
[mm] [mm] [mm] [mm]

B1S 6.0 9.0 23 35

B2S 3.0 4.5 45 68

B4S 1.5 2.3 90 135

MB 2 S 3.0 4.5 8 12

MB 4 S 1.5 2.3 15 23

MB 5 S 1.2 1.8 20 30

MWB ...-2 1.6 2.4 15 23

MWB ...-4 0.8 1.2 30 45

SWB ...-2 1.6 2.4 39 59

SWB ...-5 0.7 1.1 98 147

WB ...-1 3.3 5.0 45 68

WB ...-2 1.6 2.4 90 135

USM 35X Issue 06, 11/2007 5-85

Operation Evaluation according to the DGS method (only USM 35X S)

Probe Wavelength Focal H Note:

length
The DGS curves of dual element probes are not derived
in steel in steel
from the general DGS-diagram, but have been individual-
[mm] [mm]
ly measured for steel (MAT-VEL = 5920 m/s) and are
MSEB 2 3.0 8 ±2 now stored in the instrument.

MSEB 4 1.5 10 ±2 You can only carry out a DGS evaluation with one of the
available dual element probes, if the material velocity is
MSEB 4 0° 1.5 18 ±4 in between 5330 m/s and 6500 m/s.

MSEB 5 1.2 10 ±2
Locks, error messages
SEB 1 5.9 20 ±4
As long as a valid reference echo is stored, no functions
SEB 2 KF 5 3.0 6 ±2 can be changed which could cause an incorrect DGS
evaluation. If an attempt is made to change such a func-
SEB 4 KF 8 1.5 6 ±2 tion, the corresponding error message will appear, e.g.
SEB 2 3.0 15 ±3 “FREQUEN blocked by DGS-REF = on”
SEB 4 1.5 12 ±2 The DGS evaluation must likewise be switched off and
the reference echo deleted in the case of selecting a
new probe, e.g. for a new test application.

5-86 Issue 06, 11/2007 USM 35X

 Documentation 6

USM 35X Issue 06, 11/2007 6-1

Documentation Printing data

6.1 Printing data Preparing the printer

The transfer parameter settings for the serial port are:
Direct printing of the following data via the RS 232
interface is possible using the USM 35X: • Baud rate 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
• test report containing the A-scan and the adjustment 38400, and 57600
data
• Word length 8 data bits (fixed)
• A-scan
• Parity none (fixed)
• single reading (position 1 of the measurement line)
• Stop bits 2 (fixed)
• function list (including all current settings)
In order to ensure a perfect communication, set the
• Data Logger (if the version is available) printer to the parameters of the USM 35X.
To do this, you need
Preparing the USM 35X
• a printer with serial interface RS 232
You decide on the type of printout by assigning the
• a printer cable (please see chapter 2) key.

– If necessary, go to the third operating level.

– Select the function group CFG1.

– Select the function PRINTER, and then use the right-

hand rotary knob to select the correct printer driver.

6-2 Issue 06, 11/2007 USM 35X

Printing data Documentation

– Use to select the function COPYMOD, and then

use the right-hand rotary knob to select the setting:
hardcpy, report, meas P5 (enlarged value in A-scan),
meas P1 (measured value at position 1), pardump
(function list), datalog (Data Logger job including
measured values), special (several A-scans on one
page).

H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.

Printing
If you have connected, prepared and activated the
printer, just press the key.

The report is printed out.

If you have selected the setting special, press the

key again for each A-scan that you want to print out.

USM 35X Issue 06, 11/2007 6-3

Documentation Documentation with UltraDOC

6.2 Documentation with UltraDOC

The special application program UltraDOC from GE
Inspection Technologies enables you to remote-control
the USM 35X and to include instrument settings in
ASCII format or screen contents in PCX or IMG format
in your test report.

All data can be further processed using commerical

word processing or DTP programs.

You will receive information about the reliable use of the

program in a detailed operating manual.

6-4 Issue 06, 11/2007 USM 35X

 Maintenance and care 7

USM 35X Issue 06, 11/2007 7-1

Maintenance and care Care of the instrument

7.1 Care of the instrument

Clean the instrument and its accessories using a moist
cloth. Only use the following recommended instrument
cleaners:

• water,

• a mild household cleaner or

• alcohol (no methyl alcohol).

A Attention:
Do not use any methyl alcohol, solvents, or dye pen-
etrant cleaners!
The plastic parts can be damaged or embrittled by this.

7-2 Issue 06, 11/2007 USM 35X

Care of the batteries
7.2 Care of the batteries
Care of the batteries
Capacity and life of batteries mainly depend on the
correct handling. Please therefore observe the tips be-
low.
You should charge the batteries in the following cases:
• before the initial startup
• after a storage time of 3 months or longer
• after frequent partial discharge
Charging the batteries
You can charge the lithium-ion battery either directly in
the instrument or by means of the external battery
charger DR36 (order number 35 297) recommended by
us. You always need an external battery charger to
charge standard C-cells. In this regard, please pay at-
tention to the information on the operation of the battery
charger.
USM 35X Issue 06, 11/2007
Maintenance and care
A Attention:
You should only use the batteries recommended by us
and the corresponding battery charger. An improper
handling of the batteries and of the battery charger may
cause explosion hazard.
Charging of partially discharged NiCd batteries
If batteries are only partially discharged (less than
50 % of operating time), the full capacity is not reached
by normal charging.
– Start by fully discharging the batteries. You can use
the discharging function of the charger for this. For
more details, please read the notes on the operation
of the battery charger.
– The batteries are automatically charged after that.
Charging of exhausted NiCd batteries
If batteries are exhausted, e.g. after a prolonged stor-
age time in empty state, they often reach their full ca-
pacity only after repeated discharge/charge cycles.
7-3
Maintenance and care
The charger identifies defective batteries. In that case,
replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities
so that you will no longer obtain the normal operating
time with the instrument in battery operation.
7-4 Issue 06, 11/2007
Care of the batteries
How to handle alkaline batteries
– Please remove the batteries from the instrument if it
has not been operated for a longer time.
A Attention:
Leaking batteries may cause severe damages to the
instrument! You should always only use leak-proof
batteries and remove them from the instrument after
turning it off.
H Note:
Used batteries are special waste and have to be
disposed of according to legal requirements!
In the interest of environmental protection, we recom-
mend that you only use rechargeable batteries.
USM 35X
Maintenance Maintenance and care

7.3 Maintenance
The USM 35X requires basically no maintenance.

A Attention:
Repair work may only be carried out by members of
authorized Service staff of GE Inspection Technologies.

USM 35X Issue 06, 11/2007 7-5

Maintenance and care Recycling

7.4 Recycling

General view of the device

In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal of
the components.







 

7-6 Issue 06, 11/2007 USM 35X

Recycling Maintenance and care

No. Recycling/material code Description

1 Lithium-ion battery
2 LCD - display
3 >PC< / Brass
4 Stainless steel
5 Aluminium
6 >PC<
7 Stainless steel
8 >PC<
9 Aluminium
Battery inside the battery compartment at the bottom of the instrument. In
order to open the compartment the quick acting closures have to be
actuated.
Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)
of Mercury (Hg)
Upper equipment cover Polycarbonat >PC< with pressed in brass thread
insert.
Handle complete
Rotary control button
Holder for handle
Ratchet disk
Housing lower part
Div. mounting brackets

USM 35X Issue 06, 11/2007 7-7

Maintenance and care Recycling

Materials for separate disposal

In the following you find guidelines and notes for removing materials/components, which must be removed and
treated separately.

7-8 Issue 06, 11/2007 USM 35X

Recycling Maintenance and care

No. Recycling/material code Description

1 In order to remove the LCD-Display the upper housing has to be withdrawn
first. After loosing 6 screws on the bottom side and one further in battery-
compartment, the complete upper housing can be taken away.
2 In order to open the compartment at the bottom of the equipment, the quick
acting closures have to be actuated.
3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening the
battery cover.
4 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 – 0.5 mg)
of Mercury (Hg).

USM 35X Issue 06, 11/2007 7-9

Maintenance and care Recycling

Further materials and components

In the following you find notes for dismantling materials/components, which can disturb several recycling pro-
cesses, and materials/components for which benefits can normally be achieved.




 

7-10 Issue 06, 11/2007 USM 35X

Recycling
No. Recycling/material code
1 >PC< / Brass
2 Circuit boards
3 Aluminium
4 Stainless steel
5 >PC<
USM 35X
Maintenance and care
Description
Upper equipment cover Polycarbonat >PC< with pressed in brass thread
insert.
Circuit board in lower housing, under it battery-PCB
Two rotary control buttons
Handle, rubber tube can be removed
Lower housing and battery-cover
Issue 06, 11/2007 7-11
Maintenance and care Recycling

Recycling data of master device

Recycling/material code Weight Description
approx. (kg)
Materials/components, which must be removed and treated separately:
LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts
(0 – 0.5 mg) of Mercury (Hg)
Lithium-ion battery 0.49 Located inside the battery compartment
subtotal 0.71

Materials/components, which can disturb certain recycling processes:

>PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed in
brass thread insert.
Circuit boards 0.33 Under LC display unit
subtotal 0.49

Materials/components, through which benefits can normally be achieved:

Stainless steel 0.18 Handle, ratchet disk,
Aluminium 0.15 Rotary control button, mounting sheets, …
>PC< 0.42 Lower housing, holder for handle, battery-cover
Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing
subtotal 0.80
7-12 Issue 06, 11/2007 USM 35X
Recycling Maintenance and care

Recycling/material code Weight Description

approx. (kg)
Composite materials*:
Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel
subtotal 0.20

Total 2.20

Mounting material, cables, 0.16

clamps, screws ...

Total weight (incl. battery) 2.36

Special notes: none

* Materials/components, which cannot be separated into mono materials by destructive mechanical processes

USM 35X Issue 06, 11/2007 7-13

7-14 Issue 06, 11/2007 USM 35X
 Interfaces and peripherals 8

USM 35X Issue 06, 11/2007 8-1

Interfaces and Peripherals Interfaces

8.1 Interfaces
The USM 35X presents different interfaces for the con-
nection of external units and for the data exchange. All
interfaces are located at the instrument front. The fol-
lowing figure gives an overview of the position of inter-
faces.

8-2 Issue 06, 11/2007 USM 35X

Interfaces Interfaces and Peripherals

1 BNC or LEMO-1-TRIAX socket for the connection of

the transmitter probe (black ring)

2 BNC or LEMO-1-TRIAX socket for the connection of

the receiver probe (red ring)

3 RS 232
serial interface, 9-way Sub-D socket

4 I/O
analog interface, 8-way LEMO-1-B socket

5 RGB-OUT
VGA interface, 10-way LEMO-1-B socket

6 12V DC
Mains connection socket, 4-way LEMO-0-B socket

USM 35X Issue 06, 11/2007 8-3

Interfaces and Peripherals I/O interface

8.2 I/O interface

The USM 35X has an 8-way I/O interface (LEMO-1-B
socket) for different input and output signals:
• SAP output (transmitter trigger pulse)
• Alarm output (TTL): switching delay approx. 50 ms,
hold time approx. 500 ms.
• TDR input (test data release)
• Analog output

H Note:
View of the 8-way LEMO-1-B socket
You are able to externally process the alarm condition
with the alarm output, e.g. for sorting and other control
purposes. Error alarms can be triggered under certain
circumstances. These are caused by intermediate con-
ditions in instrument operation occuring when the in-
strument is used, i.e. when function parameters are
changed. Possible alarms occuring during instru-
ment operation (setting of functions) are to be ig-
nored.

8-4 Issue 06, 11/2007 USM 35X

I/O interface Interfaces and Peripherals

Contact assignment of the LEMO-1-B socket

Contact Description Signal direction Level Colour (UM 25*)

1 SAP output TTL white

2 alarm A output TTL grey
3 alarm B output TTL yellow
4 unassigned – – pink
5 unassigned – – black
6 TDR input TTL active high blue
7 Analog output, amplitude or time of flight output 0–5V green
(selectable via remote-control code, see
chapter 8.4 Remote Control)
8 GND ground – brown

*UM 25: analog cable (35 268)

USM 35X Issue 06, 11/2007 8-5

Interfaces and Peripherals RS 232 interface

8.3 RS 232 interface Contact assignment of the Sub-D socket

Contact Designation Signal direction Level
The USM 35X has a RS 232 interface for remote con-
trol and documentation (report printout). 1 unassigned – –
2 RXD input RS 232
3 TXD output RS 232
4 DTR output RS 232
5 ground – RS 232
6 DSR input RS 232
7 RTS output RS 232
View of the 9-way Sub-D socket 8 CTS input RS 232
9 unassigned – –

H Note:
Switch off the instrument before connecting a cable to
the RS 232 socket or before withdrawing any plugs.

8-6 Issue 06, 11/2007 USM 35X

RGB interface
8.4 RGB interface
The RGB interface serves for the output of the VGA
signal. You can use this interface to connect the
USM 35X with a monitor or with a VGA projector
(beamer). The current display contents are then trans-
ferred to the external unit and can be further used
accordingly.
The interface is a 10-way socket type Lemo-0-B. The
standard contact assignment makes it suitable for all
VGA output units. Use the VGA adapter UM 31 (order
number 35 653) in order to connect a VGA output unit.
H Note:
Before you are able to use the RGB interface, you
have to activate the function VGA in the function group
LCD first.
USM 35X Issue 06, 11/2007
Interfaces and Peripherals
8.5 Data exchange
The USM 35X is equipped with the serial interface
RS 232 for bi-directional data communication with a PC.
When you connect the instrument with a PC you can:
• remote control the instrument via the PC,
• transfer A-scans for documentation,
• transfer instrument settings in ASCII format,
• transfer reports from stored datasets,
• transfers Datalogger jobs in ASCII format (option)
• read and write datasets in binary format.
Connecting a printer or a PC
You can connect the USM 35X to a printer or a PC
using the special Krautkramer cables:
PC: UD 20 (25-way) or UD 31 (9-way)
Printer: UD 31 (Seiko DPU) or UD 32 (Epson)
Please refer to chapter 2.
8-7
Interfaces and Peripherals Data exchange

Activation of serial communication Printing data

After connecting the instrument to the PC you must
run a software that opens the serial port. This can ei-
ther be a commercial terminal program (e.g. Microsoft
Hyper Terminal) or a customised program like
UltraDOC. Make sure that the serial communication
parameters on the PC are identical to those of the
instrument.
The data transmission parameters are as follows:
Baud rate: 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
38400, and 57600
Word length: 8 data bits (fixed)
Parity: none (fixed)
Stop bits: 2 (fixed)
The USM 35X enables a direct printout of data, for
example a report including the echo display and the
instrument settings.
To do this, select the printer driver in the function
PRINTER (function group CFG1) and just press the
key after having initialized and activated the printer.
The data selected by you in the function COPYMOD
(function group CFG1) are printed.
For more details on this, please refer to chapter 6.

The baud rate can be set in the function BAUD-R in

the menu CFG1 from the third operating level.

The settings on the USM 35X apply to most of the

printers and PCs. To ensure a perfect communication,
please check the settings of the connected peripherals
and adjust them to the parameters of the USM 35X.

8-8 Issue 06, 11/2007 USM 35X

Remote control
8.6 Remote control
You can use a connected PC for the remote control of
the USM 35X.
The data transfer is carried out by means of a remote
control program and the corresponding remote control
commands. These commands represent instructions
referring to the individual functions of the USM 35X.
The Windows program HyperTerminal can for example
be used as remote control program.
After the remote control program has been started and
the program interface has been configured, the com-
mands are input via the keyboard of the computer. In
this connection, please observe the following differen-
tiation:
• Interrogation of a value or state of a USM 35X
function using the command structure:
<ESC> <COMMAND> <RETURN>
The USM 35X transmits the value of the current
setting.
USM 35X Issue 06, 11/2007
Interfaces and Peripherals
• Entry of a new value or state of a function using the
command structure:
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
All values are entered or transmitted by the USM 35X
without a comma or a point. The resolution of the func-
tion should therefore be observed with all values. The
resolution of a function applies to the entire value
range of that function.
A resolution of 0.01 means:
The USM 35X transmits the value of a function multi-
plied by the factor of 100. The entry of a value must be
done multiplied by the factor of 100.
Examples
• Setting of the display delay to 72.39 mm:
<ESC>dd 7239 <RETURN>
• Setting of the display width to 72.3 mm:
<ESC>dw 7230 <RETURN>
8-9
Interfaces and Peripherals Remote control

• Setting of the display width to 192 mm:

<ESC>dw 19200 <RETURN>

A resolution of 0.1 means:

The USM 35X transmits the value of a function multi-

plied by the factor of 10. The entry of a value must be
done multiplied by the factor of 10.

Example:

• Setting of the gain to 51.5 dB

<ESC>db 515 <RETURN>

A resolution of 1 means:

The USM 35X transmits the value of a function without

multiplication. The entry of a value must be done with-
out any multiplication.

Example:

• Setting the response threshold of gate a to 41 %:

<ESC>at 41 <RETURN>

8-10 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Syntax and timing

The syntax and timing of the communication with the
instrument is as follows:

With:

ESC = escape (ASCII CHR 27)

* = star (ASCII CHR 42)

AB = remote code of an instrument function

CR = carriage return (ASCII CHR 13)

|_| = Space (ASCII CHR 32)

n Bytes = function value of function AB

ETX = end of text (ASCII CHR 3)

LF = line feed (ASCII CHR 10)

USM 35X Issue 06, 11/2007 8-11

Interfaces and Peripherals Remote control

Transmission timing
• As soon as the instrument has received the ESC
command, is will return the * which then will be
displayed on PC screen.

• Then you key in the wanted remote code according

to the given table. The instrument echoes your
entries.

• Finally you hit the [CR]-key on your keyboard or

send the CR-command (closing the remote
command).

• The instrument will now return a blank, then the

related function value which may consist of several
Bytes, then the “end of text” character, and finally
the carriage return and the line feed character.

8-12 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Example:
Request RANGE value from the USM 35X

Remote code of the range function is DW (display

width). Please note that numerical function values are
always returned as integer values with the given maxi-
mum resolution, here DW = 5000 means 50.00 mm.

Example:
Request reading at position 2 in the measurement line

Remote code of measurement position 2 is E2 (evalu-

ation 2). E2 = 10.81 means 10.81 mm (here sound
path of the echo in gate A had been displayed). Please
note that all readings are shown in that applicable
decimal format where the decimal separator is a dot.

USM 35X Issue 06, 11/2007 8-13

Interfaces and Peripherals Remote control

Changing a function value

Key in [ESC] DW [Space] 2000 [CR] in order to set
the range to 20.00 mm:

Please note that you must key in the function value as

an integer with the maximum given resolution, here
2000 for the range of 20 mm.

Alphanumerical entries
Key in [ESC] DN [Space] Weld inspection B 45/2
[CR] in order to enter the dataset name (DATNAME)
“Weld inspection B 45/2”. All alphanumerical entries
may have a maximum length of 24 characters. In case
the string length exceeds 24 characters, it will auto-
matically be cut to 24 characters.

With the other alpahnumerical fields in the TESTINF

table you may easily describe the dataset.

8-14 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Transfer of datasets
A total of 800 datasets (complete instrument setup
including A-scan) can be stored in the instrument. The
stored datasets including the actual setting (dataset # 0)
can be transferred to the PC in compressed binary
format for archiving purposes. If required, the datasets
may be downloaded back to the insturment for re-use
or echo comparison. This bi-directional dataset trans-
fer is part of the software UltraDOC.

Actual dataset (# 0) from the instrument to the PC:

v1 ... vn describes the software version of the USM, bytes

b1 ... bn contain the instrument setting including A-scan.
In order to store this information you must write the
transferred bytes v1 ... vn, CR, LF, b1 ... bn into a file.

USM 35X Issue 06, 11/2007 8-15

Interfaces and Peripherals Remote control

Dataset file from the PC to the instrument’s dataset

#1:

*) at this time the instruments waits for the reception of

the bytes v1 ... vn CR LF b1 ... bn. The instrument now
checks whether received dataset is compatible with
the current software version of the instrument, and
whether the dataset is valid (correct checksum).

8-16 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Functions and remote control codes Function Code Range/Default Resolution

Presettings are in bold-face type. You will find a brief aLOGIC AM 0 = off 1
description of all functions in chapter 9.1 Function 1 = pos
2 = neg
directory.

If not otherwise stated, all values refer to steel, AMPLCOR** AC -25 to +25 dB / 0 0.1
C = 5920 m/s. ANAMODE AQ 0 = 0 volt
1 = 5 volts
The functions marked with * are only available in the
USM 35X DAC and USM 35X S (DAC evaluation), the ANGLE PA 0 - 90 / 0 0.1
functions marked with ** are only available in the
USM 35X S (DGS evaluation). A-SCAN AS 0 = stndard 1
1 = compare
Functions which are only availabe in connection with 2 = envelop
the Data Logger option are marked with *** (please 3 = peak b
4 = afreeze
also refer to the section Remote control in chapter
5 = bfreeze
Option Data Logger on this subject). 6 = cfreeze***

Read only functions are marked with R. aSTART AD 0 - 9999 mm / 35 0.01

0 - 250" / 1.500 0.001

aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf

ATTENR BC 0 - 1101 dB 0.1

USM 35X Issue 06, 11/2007 8-17

Interfaces and Peripherals Remote control

Function Code Range/Default Resolution Function Code Range/Default Resolution

ATT-OBJ** AO 0 - 100 dB/m / 0 0.1 BOLDLI DV 0 = off

1=L
ATT-REF** AR 0 - 100 dB/m / 0 0.1 2=M
3=H
aWIDTH AW 0.1 - 9999 mm / 40 0.01 4=U
0.004 - 250" / 1.500 0.001 5=T
6=a
BAUD-R BR 0=0
1= 300 bSTART 2D 0 - 9999 mm / 85 0.01
2 = 600 0 - 250" / 3.500 0.001
3 = 1200
4 = 2400 bTHRSH 2T 10 - 90 % / 30 1
5 = 4800 -90 - -10 % additionally with rf
6 = 9600
7 = 19200 bWIDTH 2W 0.1 - 9999 mm / 40 0.01
8 = 38400 0.004 - 250" / 1.500 0.001
9 = 57600
CAL CA read only
bLOGIC 2L 0 = off 1
1 = pos COLOR CH 0 = off
2 = neg 1=1
3 = a trig 2=2

COMMENT CO alphanumerical input

8-18 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Function Code Range/Default Resolution Function Code Range/Default Resolution

COPYMOD CM 0 = hardcpy 1 D eff** XD 3 - 35 mm / 9.7 0.01

1 = report 0.120 - 1.400" / 0.380 0.001
2 = meas P1 (only for probe-# 0)
3 = pardump
4 = PCX D-DELAY DD -10 - 1024 mm / 0 0.01
5 = store -0.3 - 40" / 0 0.001
6 = datalog***
7 = off DELALL EX 0 = off
8 = special 1 = on

DACECHO* TE 0 - 10 / 0 1 DELETE EA 0 = off 1

1 = on
DACMOD* TM 0 = off 1
1 = DAC DEL-VEL** VV 1000 - 15000 m/s / 2730 1
2 = TCG (only for probe-# 0)

DAMPING PG 0 = low 1 DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01

1 = high 0.02 - 1.400 / 0.1 0.001

DGSMENU T5 0 = off
DATE DE numerical input
1 = on
e.g. 26-01-99
DGSMOD** DS 0 = off 1
DATNAME DN alphanumerical input 1 = on

DBSTEP ST 6.5 ... 20 dB 0.1 DGS-REF** DR 0 = off 1

1 = on

USM 35X Issue 06, 11/2007 8-19

Interfaces and Peripherals Remote control

Function Code Range/Default Resolution Function Code Range/Default Resolution

DIALOG DG 0 = German 1 DUAL DM 0 = off 1

1 = English 1 = on
2 = French
3 = Italian EVAMOD EM 0 = DAC 1
4 = Spanish 1 = DGS
5 = Portuguese 2 = REF
6 = Dutch 5 = JISDAC
7 = Swedish
8 = Slovenian FILLED FI 0 = off 1
9 = Romanian 1 = on
10 = Finnish
11 = Czech FINE G FG –5 - +5 / 0 1
12 = Danish
13 = Hungarian
FLAWIND FB alphanumerical input
14 = Croatian
15 = Russian
FLAWLEN FL 0 - 999 mm / 0 0.01
16 = Slovakian
0 - 40" / 0 0.001
17 = Norwegian
18 = Polish
FREQU FR 0 = 0.5 - 4 MHz 1
19 = Japanese
1 = 2 - 20 MHz
20 = Chinese
2 = 0.8 - 8 MHz
21 = Serbian
3 = 0.2 - 1 MHz
DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01 4 = 1 MHz narrow band filter
800.01" = flat 5 = 2 MHz narrow band filter
6 = 2.25 MHz narrow band filter
DIR T3 0 = off 7 = 4 MHz narrow band filter
1 = on 8 = 5 MHz narrow band filter
9 = 10 MHz narrow band filter

8-20 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Function Code Range/Default Resolution Function Code Range/Default Resolution

GAIN DB 0 - 110 dB / 30 0.1 P-DELAY PD 0 - 199.99 µs / 0 0.01

POWER PI 0 = low 1
HORN HO 0 = off 1 1 = high
1 = on
PRBFREQ** XF 0.5 - 10.0 MHz 0.04
INDICAR BA -1101 - 1101 dB 0.1
PRBNAME** PN alphanumerical input
LIGHT LT 0 = off 1 PREVIEW T2 0 = off
1 = on 1 = on

MAGNIFY MA 0 = off 1 PRF-MOD PF 10 steps:

0 = step 1 1
1 = aGAT
1 = step 2
2 = bGAT
2 = step 3
3 = step 4
MEAS-P1 M1 Setting range see S-DISP 1 4 = step 5
MEAS-P2 M2 5 = step 6
MEAS-P3 M3 6 = step 7
MEAS-P4 M4 7 = step 8
8 = step 9
MTLVEL SV 1000 - 15000 m/s / 5920 1 9 = step 10
40 - 600 "/ms / 233 0.1
PRINTER PR 0 = Epson 1
1 = HP Laserjet
OBJECT OB alphanumerical input
2 = HP Deskjet
3 = DPU-41x
OFFSET* TO 0 - 14 dB / 0 0.5 4 = HP Laserjet 1200 series
5 = HP Deskjet 1200 series
OPERAT PE alphanumerical input 6 = DPU-345

USM 35X Issue 06, 11/2007 8-21

Interfaces and Peripherals Remote control

Function Code Range/Default Resolution Function Code Range/Default Resolution

PROBE-#** PB 0 = variable / alphanumerical input RECALL RD 0 = off 1

1 = B1-S 2 = B2-S 1 = on
3 = B4-s 4 = MB2-S
5 = MB4-S 6 = MB5-S RECTIFY RF 0 = full-w 1
7 = MWB45-2 8 = MWB60-2 1= pos hw
9 = MWB70-2 10 = MWB45-4 2 = neg hw
11 = MWB60-4 12 = MWB70-4 3 = rf
13 = SWB45-2 14 = SWB60-2
15 = SWB70-2 16 = SWB45-5 REFECHO RC 0 = no ref.
17 = SWB60-5 18 = SWB70-5 1 = ref. stored
19 = WB45-1 20 = WB60-1
21 = WB70-1 22 = WB45-2 REFECHO** RE 0 = BW 1
23 = WB60-2 24 = WB70-2 1 = SDH
25 = MSEB-2 26 = MSEB-4 2 = FDH
27 = MSEB-4 0° 28 = SEB-1
29 = SEB-2 KF5 30 = SEB-4 KF8 REFMODE RO 0 = off
31 = SEB-2 32 = SEB-4 1 = on

RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz: REFRNCER BB 0 - 1101 dB 0.1

0.5 - 9999 mm / 250 0.01
0.02 - 390" / 10 0.001 REFSIZE** RS 0.5 - 10 mm / 3 0.01

2 - 20 / 0.8 - 8 MHz:
REJECT RJ 0 - 80 % / 0 1
0.5 - 1420 mm / 250 0.01
0.02 - 56" / 10 0.001
SCALE SE 0 = measval
1 = snd-pth.
RATING R
BD -1101 - 1101 db 0.1
2 = div.

8-22 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Function Code Range/Default Resolution Function Code Range/Default Resolution

SCHEME CS 0 = green/black SETTING T4 0 = off

1 = orange/black 1 = on
2 = black/white
3 = black/yellow SET-# ND 1 - 800 / 1 1

S-DISP VS 0=off 1=Sa 1 S-REF1 R1 0 - 5000 mm / 50 0.01

2=Sb 3=Sc*** 0 - 200" / 2.0 0.001
4=Sc-a*** 5=Sc-b***
6=Sb-a*** 7=Ha % S-REF2 R2 0 - 5000 mm / 100 0.01
8=Hb % 9=Hc %*** 0 - 200" / 4.0 0.001
10=Ha dB 11=Hb dB
12=Hc dB*** 13=R-start STO-INF SC 0 = off 1
14=R-end 15=Da 1 = on
16=Db 17=Dc***
18=Pa 19=Pb STORE SD 0 = off 1
20=Pc*** 21=Ra 1 = on
22=Rb 23=Rc***
24=ERS 25=Gt dB SURFACE SU alphanumerical input
26=Ha %crv 27=Hb %crv
28=Hc %crv*** 29=Alarm
T-CORR * DC -24 - +24 dB / 0 0.5
30=DGS-Crv 31=freeJob***
32=freeLoc*** 33=freeAsc***
TESTINF T1 0 = off
34=freeLoJ 35=lastLoc
1 = on
36=La 37=Lb
38=Lc 39=Gatewid
40=Defdpth 41=class THICKNE TH 1 - 9999 mm / 25 0.01
42=DAC dB 43=LOC-# 0.05 - 400" / 1 0.001
44=Gr dB

USM 35X Issue 06, 11/2007 8-23

Interfaces and Peripherals Remote control

Function Code Range/Default Resolution Other remote control codes

TIME TI numerical input, e.g. 12:30:00 Code Function/description

TOF AF 0 = flank 1 < Select the next left sided menu

1 = peak
2 = jflank > Select the next right sided menu

UNIT UN 0 = mm 1 AG dB-Difference from the reference gain (ref. echo

1 = inch at 80 %) to the registration gain (maximum of
selected DGS curve at 80 %), read only
VGA VG 0 = off
1 = on AP Analog output setting
0 = amplitude
X-POS XP 0 - 999 mm / 0 0.01 1 = time of flight
0 - 40" / 0 0.001
DA A-scan amplitudes transferred as binary data
X-VALUE XV 0 - 100 mm / 0 0.01
0 - 40" / 0 0.001 DV Send the DAC points in tics and dB, DAC, read only

Y-POS YP 0 - 999 mm / 0 0.01 E1 Read value form measurement line (position 1)

0 - 40" / 0 0.001 E2 Read value form measurement line (position 2)
E3 Read value form measurement line (position 3)
E4 Read value form measurement line (position 4)
E5 Read value displayed in the A-scan

EL Send the contents of the LCD as binary data

stream, read only

8-24 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Code Function/description Code Function/description

EV Read alarm LED status: TZ Zoom on/off:

0 = no alarm 0 = off
1 = alarm in A 1 = on
2 = alarm in B
3 = alarm in A+B UD Send data set as binary data

HD Editable header data from report transferred as UR Read data set as binary data
ASCII-format data

I1 Set information line in the startup screen

I2 Set information line in the startup screen
(up to 39 characters)

ID Read instrument software version

RG Reference gain (reference echo at 80 %), read only

SL “Scroll home”: selection of the first function in every

function group and of the left function group in every
function group line.

TF Freeze on/off:
0 = off
1 = on

USM 35X Issue 06, 11/2007 8-25

Interfaces and Peripherals Remote control

Control codes for the rotary knobs/ Function Key Code Range

function keys
ENTER R off / on
Function Key Code Range

Left-hand G+ increment level 10 1st/2nd operation level

rotary knob/ G- decrement
gain

Right-hand K+ increment
rotary knob K- decrement

dB-STEP P 0 = 0.0
1 = 0.5
2 = 1.0
3 = 2.0
4 = 6.0
5 = 6.5 – 20

FREEZE F off / on

ZOOM Z off / on

COPY C off / on

8-26 Issue 06, 11/2007 USM 35X

Remote control Interfaces and Peripherals

Function Key Code Function Key Code

BASE 5 MEAS 5

PULS 6 MSEL 6

RECV 7 LCD 7

aGAT 8 CFG1 8

bGAT 9 CFG2 9

CAL 5
Function Key Code
REF/DAC/ 6
DGS/JDAC
first 1
TRIG 7
second 2
MEM 8
third 3
DATA 9
fourth 4

USM 35X Issue 06, 11/2007 8-27

Interfaces and Peripherals Remote control

A Attention: In the interests of security, insert additional read com-

mands before reading the sound path, e.g.:
In rare cases concerning remote control sequences,
reading measurement values directly after changing a Command Answer Description
function value in the USM 35X, there could be errors as
long as the instrument has not ended setting the value. ...
In such cases, additional commands must be inserted <ESC>F<RETURN> “A-scan freeze”
<ESC>DB<RETURN> 580 “Read dB setting”
into the remote control sequence before the measure- <ESC>DB<RETURN> 580 “Read dB setting”
ment values are read. <ESC>DB<RETURN> 580 “Read dB setting”
<ESC>DB<RETURN> 580 “Read dB setting”
Example: <ESC>E3<RETURN> 50,74 “Read sound path”
<ESC>F<RETURN> “Disable A-scan freeze”
If you create a remote control sequence, by which the ...
sound path of an echo is read after freezing the A-
scan, the command chain would be as follows: With these measures you ensure that sufficient time
has passed in order to completely execute the previ-
Command Answer Description
ous command (display freeze) before transferring the
sound path. Finally, check your remote control se-
<ESC>F<RETURN> “A-scan freeze”
<ESC>E3<RETURN> 50,74 “Read sound path”
quence to see that the measurement values can be
<ESC>F<RETURN> “Disable A-scan freeze” correctly read, and add further read commands if nec-
... essary.

8-28 Issue 06, 11/2007 USM 35X

 Appendix 9

USM 35X Issue 06, 11/2007 9-1

Appendix Function directory

9.1 Function directory Function Function group Description

ATT-REF** DGS Sound attenuation in the

The functions marked with * are only available on the reference block
USM 35X DAC / USM 35X S (DAC evaluation mode),
those market with ** are exclusively available on the ATT-OBJ** DGS Sound attenuation in the
test object
USM 35X S (DGS evaluation mode).
aWIDTH aGAT Width of the gate A
Function Function group Description

BAUD-R CFG1 Baud rate for serial port

aLOGIC aGAT Evaluation logic of the gate A
transmission
AMPLCOR** DGS Amplitude correction
bLOGIC bGAT Evaluation logic in the gate B
ANAMOD CFG2 Setting of the analog output
BOLDLI JDAC Selection and emphasizing of
registration curve
ANGLE TRIG Entry of the angle for calculating
the (reduced) projection
bSTART bGAT Starting point of the gate B
distance (angle-beam probes)

bTHRSH bGAT Starting point of the gate B

A-SCAN MEAS Settings of the A-scan

bWIDTH bGAT Width of the gate B

aSTART aGAT Starting point of the gate A

CAL CAL Semiautomatic calibration

aTHRSH aGAT Threshold of the gate A

COLOR TRIG Marking of legs

ATTEN DGS Sound attenuation in the test
piece
COMMENT DATA Comment

9-2 Issue 06, 11/2007 USM 35X

Function directory Appendix

Function Function group Description Function Function group Description

COPYMOD CFG1 Assignment of the key DGS-CRV** DGS Recording curve for DGS
evaluation mode
DACECHO* DAC/JDAC Recording of a reference echo
for the DAC DGSMENU** DGS Activating/Deactivating the DGS
menu table for selecting the
DACMODE* DAC/JDAC Activating/Deactivating the DAC probe and further DGS settings

DAMPING PULS Damping of the probe’s DGSMODE** DGS Activating/Deactivating DGS

oscillating circuit evaluation mode

DATE CFG2 Current date DGS-REF** DGS Recording of DGS reference

echo
dBSTEP RECV User-programmable gain step
DIALOG CFG1 Selecting the language
D-DELAY BASE Setting of the display start
DIAMET TRIG Change between plane-parallel
D eff** DGS Effective element diameter of and circular curved test
the probe used components

DELALL MEM Deleting all stored data sets DIR DATA Dataset directory

DELETE MEM Deleting a stored data set DUAL PULS Separation of pulser and
receiver
DEL-VEL** DGS Material velocity for probe delay
EVAMOD CFG2 Switchover REF – DAC – DGS
– JDAC

USM 35X Issue 06, 11/2007 9-3

Appendix Function directory

Function Function group Description Function Function group Description

FILLED LCD Selecting the echo display mode MEAS-P1 MSEL Selection of measured values
(filled or normal) MEAS-P2 at four positions of the
MEAS-P3 measurment line
FINE G RECV Fine adjustment of gain within a MEAS-P4
range of approx. 4 dB in 40 steps
MTLVEL BASE Setting of the material sound
FLAWLEN DATA Flawlength velocity

FREQU RECV Selecting the frequency range OBJECT DATA Object description
for the connected probe
OFFSET* DAC/JDAC Offset for multiple DAC
GAIN left-hand Setting of the gain
rotary knob OPERAT DATA Name of the operator

HORN CFG2 Switching the acoustic alarm P-DELAY BASE Compensating for the probe
signal on/off delay line

INDICA AWS Flaw gain in dB POWER PULS Setting the power of the initial
for AWS evaluation pulse

LIGHT LCD Choice of lightning for PRBFREQ** DGS Probe frequency

the display
PRBNAME** DGS Probe name
MAGNIFY MEAS Gate spreading
PREVIEW DATA Dataset preview with A-scan

9-4 Issue 06, 11/2007 USM 35X

Function directory Appendix

Function Function group Description Function Function group Description

PRF-MOD PULS Setting the pulse repetition REFRNCE AWS Reference gain in dB
frequency for AWS evaluation

PROBE-#** DGS Probe number REFSIZE** DGS Size of the reference reflector

PRINTER CFG1 Selecting the printer for the test REJECT RECV Suppression of unwanted or
report spurious echo indications

RANGE BASE Setting of the range in which the SCALE LCD Choice of display mode
measurement is made. for the measurement line

RATING AWS Flaw rating as dB value SCHEME LCD Choice of a color scheme for
the screen display
RECALL MEM Retrieving a stored data set
S-DISP MEAS Zoomed display of a selected
RECTIFY RECV Selection of rectification parameter

REFECHO REF For storing a reference echo SET-# MEM Number of the data set
for the measurement of
dB difference SETTING DATA Display of a function list

REFECHO** DGS Type of the reference reflextor S-REF1 CAL Reference echo 1 for calibration
used S-REF2 Reference echo 2 for calibration

REFMOD REF Activation of echo comparison STO-INF DATA Saving the current additional
information

USM 35X Issue 06, 11/2007 9-5

Appendix Function directory

Function Function group Description Function Function group Description

STORE MEM Saving the data set X-VALUE TRIG Entry of the distance between
probe index (sound exit point)
SURFACE DATA Condition of surface and leading face of the
angle-beam probe
T-CORR* DAC/AVG/ Sensitivity correction, e.g. to
JDAC compensate for transfer losses Y-POS DATA Y-position coordinate

TESTINF DATA Saving additional information

THICKNE TRIG Entry of workpiece thickness

for calculation of real flaw depth

TIME CFG2 Current time

TOF MEAS Selection of the measuring

point for the gate

UNIT CFG1 Selecting the unit of

measurement mm or inch

VGA LCD Activating/Deactivating the VGA

output

X-POS DATA X-position coordinate

9-6 Issue 06, 11/2007 USM 35X

EC declaration of conformity Appendix

9.2 EC declaration of conformity

We declare that the USM 35X conforms to the following
European directives:

• 89/336EEC (Electromagnetic compatibility)

The conformity of the above-mentioned product with the

regulations of the directive 89/336EEC is proven by the
observance of the standard specifications

• EN 55 011:1998 Class A, Group 2 and

• EN 61 000-6-2:2005

• EN 61 000-6-4:2001

The conformity of the above-mentioned product with the

regulations of the directive 73/23/EEC, amended by the
directive 93/68/EEC, is proven by the observance of
the standard specification

• EN 61 010-1:2001

USM 35X Issue 06, 11/2007 9-7

Appendix Manufacturer/Service addresses

9.3 Manufacturer/ Keep the shipping container for any repairs possibly
required which cannot be made on the spot.
Service addresses
If there is anything special that you would like to know
The USM 35X is manufactured by: about the use, handling, operation and specifications of
the instruments, please contact your nearest GE
GE Inspection Technologies GmbH Inspection Technologies representative or directly:
Robert-Bosch-Str. 3
50354 Hürth GE Inspection Technologies GmbH
GERMANY
Service-Center
Phone +49 (0) 22 33 - 601 111 Robert-Bosch-Str. 3
Fax +49 (0) 22 33 - 601 402 50354 Hürth
GERMANY
The USM 35X is manufactured according to state-of-the-
art methods using high-quality components. Thorough or:
in-process inspections or intermediate tests and a quality
Postfach 1363
management system certified to DIN EN ISO 9001
50330 Hürth
ensure an optimum quality of conformance of the
GERMANY
instrument.
Phone +49 (0) 22 33 - 601 111
Should you nevertheless detect an error on your
Fax +49 (0) 22 33 - 601 402
instrument, switch the instrument off and remove the
batteries. Inform your local GE Inspection Technologies
Service indicating the error and describing it.

9-8 Issue 06, 11/2007 USM 35X

Manufacturer/Service addresses Appendix

France USA

GE Inspection Technologies Scs GE Inspection Technologies, LP

SAC Sans Souci 50 Industrial Park Road
68, Chemin des Ormeaux Lewistown, PA 17044
69760 Limonest USA
FRANCE
Phone +1 717 - 242 03 27
Phone +33 47 - 217 92 20 Fax +1 717 - 242 26 06
Fax +33 47 - 847 56 98

Great Britain

GE Inspection Technologies
892 Charter Avenue
Canley
Coventry CV4 8AF
GREAT BRITAIN

Phone +44 845 - 130 - 3925

Fax +44 845 - 130 - 5775

USM 35X Issue 06, 11/2007 9-9

Appendix Spare parts list

9.4 Spare parts list 32 23 31

4
33

24

35
25

34

9-10 Issue 06, 11/2007 USM 35X

Spare parts list Appendix

50

10

11
37

38
54
2

12
53

30
3 6

USM 35X Issue 06, 11/2007 9-11

Appendix Spare parts list

1
21

27
51

20
26

28 7

9
36

52 8

22
29

9-12 Issue 06, 11/2007 USM 35X

 Pos. # Description Id.-No. Remark
1 1 Housing upper part, with sealing 36163-3.130
2 1 Housing lower part, partly mounted 36164-3.130

USM 35X
(contains Pos. 11, 6 and 30)
3 1 Battery cover, complete 36165-3.190
Spare parts list

4 1 Connector-Cover, complete 36166-3.110

5 1 Membrane keypad 35593-3.120
6 2 Contact spring, complete 35632-3.160
7 1 Flexible cable LCD 35635-3.180
8 1 Cable 5 pin Inverter 35451-3.180
9 1 Cable 2 pin LCD 35636-3.180

10 1 PCB assembly USM 35 X 36160-3.220

- 1 PCB assembly USM 32 X B+F 36161-3.220
- 1 PCB assembly USM 32 X L 36162-3.220
11 1 PCB assembly USM 35 X Bat 36128-3.220
12 2 Cable Lemo - MicroCoax 36070-3.180
- 2 BNC-Connector 06650-7.130

20 4 Spacer (23 mm) 103138-6.020

21 2 Spacer (14 mm) 102043-6.020
22 2 Spacer (8 mm) 102044-6.020
23 2 Spacer sleeve 34809-6.020
24 2 Rotatable knob 36059-6.630
25 1 Handle 35253-6.540
26 1 Mounting bracket 35612-6.600
27 1 Mounting bracket LCD 35621-6.600
28 1 Mounting bracket LCD inverter 35622-6.600

Issue 06, 11/2007

29 1 Cover 35631-6.600
30 2 Contact plate 35633-6.600
31 2 Ratchet disk 34796-6.600
32 2 Holder for handle 35301-6.640
- 16 Pressure devices 18672-7.820
33 1 Sealing (Key pad) 34994-6.640
34 2 Clamp, lower 34882-6.640
35 2 Clamp, upper 35629-6.640
36 1 Isolation foil 35634-6.650
37 2 Sealing screw 36071-6.070
38 2 Rotary position transducer 36056-6.530

50 2 Locking screw 12326-7.139

51 1 LCD-Display 100874-7.232
52 1 Converter 101067-7.232
53 4 Rubber foot 14520-7.820
54 2 Blanking cap , Lemo 103120-7.137
- 2 Blanking cap , BNC 18906-7.139

Handle (Modification-Set complete) 35258-2.380

08.March.05 / Ant
9-13
Appendix
9-14 Issue 06, 11/2007 USM 35X
 Changes 10

USM 35X Issue 06, 11/2007 10-1

Changes

This chapter contains information about changes and

additions made at short notice and not yet included in
the operating manual.

If none exist, the chapter remains blank.

10-2 Issue 06, 11/2007 USM 35X

 Index 11

USM 35X Issue 06, 11/2007 11-1

Index

A aGAT (function group) ............................................. 5-14

Alkaline batteries ...................................................... 7-4
a trig
Triggering by an interface echo ........................... 5-15 aLOGIC
Evaluation logic gate A ........................................ 5-15
A-Scan
Setting the A-scan .............................................. 5-48 Alphanumerical entries ........................................... 8-14
A-scan Analog output ................................................. 5-57, 8-5
Setting ................................................................ 5-48
ANAMOD ................................................................ 5-57
Accessories ............................................................. 2-5
ANGLE (Angle of incidence) ................................... 5-32
Acoustic alarm ....................................................... 5-58
Anticoincidence ...................................................... 5-15
Activating DAC according to JIS ............................. 5-68
aSTART .................................................................. 5-25
Activating DAC/TCG ............................................... 5-62 Starting point of gate A ........................................ 5-16
Additional information aTHRSH
Storing ................................................................. 5-39 Threshold of gate A ............................................. 5-16
Additions ................................................................ 10-2 aWIDTH
Width of gate A ................................................... 5-16
Addresses ................................................................ 9-8
Adjustment range
Function directory ................................................. 9-2
Adustment
Coarse and fine ..................................................... 4-9

11-2 Issue 06, 11/2007 USM 35X


B bTHRSH
Backlight ................................................................ 5-52
BASE (function group) .............................................. 5-6
Basic initialization .................................................... 3-8
Basic settings ........................................................ 4-12
Batteries ................................................................... 1-2
Care ...................................................................... 7-3
Charging the NiCd batteries .................................. 7-3
Baud rate for transmission ...................................... 5-55
BAUD-R (Baud rate for transmission) ..................... 5-55
bGAT (function group) ............................................. 5-14
bLOGIC
Evaluation logic gate B ....................................... 5-15
BOLDLI (Choice of a registration curve) .................. 5-71
bSTART
Starting point of gate B ....................................... 5-16
USM 35X Issue 06, 11/2007
Index
Threshold of gate B ............................................. 5-16
bWIDTH
Width of gate B ................................................... 5-16
C
CAL
Semiautomatic calibration ......................... 5-19, 5-22
CAL (function group) ............................................... 5-19
Calibration .............................................................. 5-17
Dual-element (TR) probes ................................... 5-21
Straight-beam probes .......................................... 5-18
With unknown materials ...................................... 5-19
CFG1 (function group) ............................................ 5-53
CFG2 (function group) ............................................ 5-53
Changes ................................................................. 10-1
Changing a function value ....................................... 8-14
11-3
Index
Codes
Codes for function keys ...................................... 8-26
Function codes ................................................... 8-17
Remote control ..................................................... 8-9
Coincidence ............................................................ 5-15
COLOR ................................................................... 5-33
Configuration ........................................................... 5-53
For test applications ........................................... 5-43
Configuring the measurement line .......................... 5-52
Connecting a probe ................................................... 3-7
Controls .................................................................... 4-2
COPY key
Assignment ......................................................... 5-55
COPYMOD ....................................................... 6-3, 8-8
Assignment of the COPY key ............................. 5-55
D
D-DELAY (Display starting point) .............................. 5-7
DAC (function group) .............................................. 5-61
11-4 Issue 06, 11/2007
DACECHO
Recording reference curve ................................... 5-69
DACECHO (Recording reference curve) .................. 5-63
DACMOD
Activating DAC according to JIS ......................... 5-68
DACMOD (Activating DAC) ................. 5-61, 5-68, 5-78
DACMOD (Activating DAC/TCG) ............................ 5-62
DAMPING (Probe matching) ..................................... 5-9
DATA (function group) ............................................. 5-38
Data exchange ......................................................... 8-7
Data saving ............................................................. 5-34
Data set
Deleting ............................................................... 5-35
Deleting all .......................................................... 5-36
Management ....................................................... 5-38
Recalling ............................................................. 5-36
Storing ................................................................. 5-35
Dataset
Directory ............................................................. 5-42
Preview ............................................................... 5-41
USM 35X

DATE
Setting the gate .................................................. 5-56
dBSTEP ................................................................. 5-12
Defects ..................................................................... 1-3
Deleting a reference echo ....................................... 5-27
Depth ...................................................................... 5-31
DGS evaluation (USM 35S) .................................... 5-74
DIALOG
Selecting the language ....................................... 4-12
DIALOG (Selecting the language) ........................... 5-53
DIAMET (Outside diameter of the test object) ........ 5-33
Diameter of the test object ..................................... 5-33
DIR
Directory of stored data sets ............................... 5-38
DIR (Dataset directory) ........................................... 5-42
Display ..................................................................... 4-3
Display range ............................................................ 5-6
Display starting point ................................................ 5-7
USM 35X Issue 06, 11/2007
Index
Distance-amplitude curve ........................................ 5-61
according to JIS Z3060-2002 ............................... 5-67
Double assignment of functions ...................... 4-9, 5-78
DUAL
Pulser-receiver separation ................................... 5-10
E
EC declaration .......................................................... 9-7
Echo display ........................................................... 5-51
Enlarged echo display ......................................... 5-59
Zoom mode ........................................................... 4-3
Echo evaluation ...................................................... 5-58
Echo-start gate ............................................. 5-14, 5-15
Enlarged display
Measurement value ............................................... 4-5
Errors ........................................................................ 1-3
Evaluation logic of the gates ................................... 5-15
EVAMOD (Echo evaluation) .................................... 5-58
11-5
Index

F G
FILLED
Echo display ....................................................... 5-51
FINE G (Fine adjustment of gain) ................. 5-11, 5-12
Flaw evaluation ......................................................... 1-6
Flaw position calculation ........................................ 5-31
Freeze function ....................................................... 5-59
FREQU (Frequency range) ..................................... 5-13
Frequency range ..................................................... 5-13
Function directory ..................................................... 9-2
Function groups ........................................ 4-4, 4-8, 5-3
Functions .................................................................. 4-4
Function directory ................................................. 9-2
Overview ................................................................ 5-2
Setting the functions ............................................. 4-9
Special keys ....................................................... 5-59
Gain .......................................................................... 5-5
Fine adjustment .................................................. 5-12
Incrementation ...................................................... 5-5
Gate setting ............................................................ 5-14
Gate spreading ....................................................... 5-48
Gates ...................................................................... 5-14
Starting point ....................................................... 5-16
Width .................................................................. 5-16
H
HORN
Acoustic alarm .................................................... 5-58
I
Instrument
Care of the instrument ........................................... 7-2
Instrument versions ................................................... 1-8

11-6 Issue 06, 11/2007 USM 35X

 Index

Intefaces LCD (function group) ............................................... 5-50

RS 232 interface ................................................... 8-6
Intensity .................................................................. 5-10
Interface echo ......................................................... 5-15
Interfaces
I/O interface .......................................................... 8-4
Lemo socket ............................................................. 8-5
LIGHT
LCD backlight ..................................................... 5-52
Limits ........................................................................ 1-5
Line ........................................................................... 4-5

J M
JDAC (function group) ............................................. 5-67
MAGNIFY
Gate spreading ................................................... 5-48
K Maintenance ............................................................. 7-5

Keys ......................................................................... 4-6 Manufacturer ............................................................. 9-8

Special keys ....................................................... 5-59 Material thickness .................................................. 5-33
MEAS-P1 to P4 ........................................................ 4-5
L Measurement line ........................................... 4-5, 5-46
Configuration ....................................................... 5-49
Language ...................................................... 4-12, 5-53
Measuring ............................................................... 5-23
LCD
Color scheme ...................................................... 4-16 Measuring point ...................................................... 5-17

USM 35X Issue 06, 11/2007 11-7

Index

MEM (function group) ............................................. 5-34 P

MSEL (function group) ............................................ 5-49
P-DELAY (Probe delay) ............................................ 5-8
MTLVEL (Sound velocity) .......................................... 5-7
POWER (Intensity) ................................................. 5-10
Multiple DAC ................................................ 5-65, 5-72
Power supply ............................................................ 3-2
PREVIEW
N Dataset preview ................................................... 5-38
PREVIEW (Dataset preview) .................................. 5-41
Narrow band filter .................................................... 5-13
PRF-MOD
Pulse repetition frequency ................................... 5-11
O Printer
OFFSET Preparing .............................................................. 6-2
Distance of multiple DAC .......................... 5-65, 5-72 Selecting the printer driver ................................... 5-55

OFFSET (Distance of multiple DAC) ............ 5-65, 5-72 PRINTER (Printer for test report) ............................ 5-55

Operating levels Printer connection .................................................... 8-7

Overview ................................................................ 5-2 Printing ..................................................................... 8-8
Operator training ....................................................... 1-4 Printing data ............................................................. 6-2
Operator's controls ................................................... 4-2 Probe connection ...................................................... 3-7
Probe delay .............................................................. 5-8

11-8 Issue 06, 11/2007 USM 35X

 Index

Probe matching ........................................................ 5-9 Recycling .................................................................. 7-6

Projection distance ................................................. 5-31 Reduced projection distance .................................. 5-31
PULS (function group) .............................................. 5-9 REFECHO .............................................................. 5-25
Pulse repetition frequency ...................................... 5-11 REFMOD ................................................................ 5-25
Pulser adjustment .................................................... 5-9 Registration curve ................................................... 5-71
Pulser-receiver separation ...................................... 5-10 REJECT .................................................................. 5-12
Remote control ......................................................... 8-9
R Reset ........................................................................ 3-8

RANGE (Display range) ............................................ 5-6 Rotary knobs ............................................................ 4-6

Recalling a data set ................................................ 5-36

Receiver adjustment ............................................... 5-11
RECORD (Recording reference curve) .......... 5-62, 5-69
Recording reference curve ............................ 5-63, 5-69
Rectification ............................................................ 5-13
RECTIFY (Rectification) .......................................... 5-13
RECV (function group) ............................................ 5-11
S
S-DISP ..................................................................... 4-5
S-DISP (Zoomed display of reading) ....................... 5-46
Safety information ..................................................... 1-2
SCALE ................................................................... 5-52
SCHEME ................................................................ 5-51
Screen ...................................................................... 4-3

USM 35X Issue 06, 11/2007 11-9

Index
Selecting units of measurement ............................. 5-54
Semiautomatic calibration ............................ 5-19, 5-22
Sensitivity correction .................................... 5-64, 5-71
Serial communication activation ............................... 8-8
Service ...................................................................... 9-8
SETTING
Function list ........................................................ 5-42
setting
Function list ........................................................ 5-38
Setting of gain .......................................................... 4-8
Sound attenuation (DGS) ........................................ 5-83
Sound velocity .......................................................... 5-7
Spare parts list ....................................................... 9-10
Standard package ..................................................... 2-3
Start-up ..................................................................... 3-8
Storing a data set ................................................... 5-35
Sub-D socket ............................................................ 8-6
SVEL1 (Fixed sound velocity) ................................ 5-47
11-10 Issue 06, 11/2007
Switching on/off ........................................................ 3-8
Symbols
In this manual ..................................................... 1-11
LED ..................................................................... 5-60
Status symbols ................................................... 5-60
Syntax .................................................................... 8-11
T
T-CORR
Sensitivity correction (DAC) ................................ 5-64
Sensitivity correction (JDAC) .............................. 5-71
Transfer correction (DGS) ................................... 5-83
TCG ........................................................................ 5-62
Registration curve ............................................... 5-71
Temperature .............................................................. 1-6
Test report ................................................................ 6-3
Test requirements ..................................................... 1-4
TESTINF
Additional information for stored data sets .......... 5-38
TESTINF (Storing additional information) ................ 5-39
USM 35X
 Index

THICKNE V
Material thickness ............................................... 5-32
VGA ....................................................................... 5-51
THICKNE (Material thickness) ................................ 5-33
Threshold of the gates ............................................ 5-16
TIME
W
Setting the time .................................................. 5-56 Wall thickness .......................................................... 1-6
TOF Waste disposal ......................................................... 7-6
Selecting the measuring point ............................. 5-44
Width of the gates .................................................. 5-16
Transfer correction (DGS) ....................................... 5-83
Transfer of datasets ................................................ 8-15
X
Transmission timing ............................................... 8-12
TRIG (function group) .............................................. 5-31 X-position ................................................................ 5-40
X-VALUE
Of the probe ........................................................ 5-32
U
Ultrasonic testing ...................................................... 1-3 Z
UNIT
Units of measurement ......................................... 5-54 Zoom mode ............................................................... 4-3

Units ....................................................................... 4-13 Zoomed display of reading ...................................... 5-46

USM 35X Issue 06, 11/2007 11-11

11-12 Issue 06, 11/2007 USM 35X