| QUALITY TEST & INSPECTION Eddy Current Inspec available for many years to detect racks, inspect for porosity, inspect for thread presence and condition, find seams in welded tubing, inspect for hardness and chemistry ch measure distance, measure thickness and find voids. This versatile technolo- gy has allowed cost-effective, fast, reli able and relatively simple inspections to be conducted in any conductive material and in myriad applications. With the advent of fast industrial grade computers and plug-and-play data acquisition boards, however, eddy current inspection has reinvented itself as a dynamic, rather than primarily a static, means of inspection. ‘Asa static means of inspection, eddy curtent testing was good, but not great. FE current inspection has been tion Reinvents Itself A reliable, proven technology just got better. BY WILLIAM A. KEELY Inits static mode, it inspected only one area ofa part ata time and then gave ‘only a good ora bad indication of the sensed condition. Eddy current inspec- tion simultaneously detects materials chemistry and hardness along with part geometry, and these sensed parameters cannot easily be differentiated from each other during the test. Because of | this, the static mode of inspection often yielded data that had the potential of. masking the parameter that the system | was imended to detect. {Ball Runner Profile of 22 Ruger Single Sx Pistol Barrel 2-Inch Form Muzzle (Ball Runner Probe Rotated Four Times in Bore) ‘The rotational profile was created with a contact type eddy current probe called the Ball Runner. This probe provides the unique capability to record the signature ofthe rifting {and correlate that signature with a gage measurement capable of determining the depth and characteristics ofthe rifting lands and grooves. Source: NOT Technologies 38 QUALITY | December 2005 MORE AND BETTER DATA “Today's eddy current proilers offer advantages over static test systems. With these systems, a rea-time eddy current profile of partis developed on a Cartesian coordinate system where the cxddy current signature ofthe partis dis played on the Y-axis and the position of the probe with respect toa part datum is cisplayed on the X-axis Probe posi- tion information is usualy recorded ‘with a linear potentiometer or an LVDT. Input to the computer is through a data ‘This pistol was profiled with both oncontact and contact eddy current Inspection techniques to determine the characteristics ofthe Inside on Its bore, Source: NDT Technologies. won. quaitymag.comacquisition card along with the eddy ‘current signature of the part taken from the probe. This 2-D profile can include as much of the part surface a is required to represent the portion of the part that needs to be reviewed, Because a surface’s signature is cap. tured with a profiler and then displayed in the form of an X/Y plane, any math ‘operation that can be used on a line or plane can be used to analyze the acquired data and make a pass or fal decision on that data. This includes integrals, dei Fia, ero cross criteria and least squares fit criteria, This data representation lends itself well to statistical analysis ‘where part profiles, associated with a population of good parts, are mathe- ‘matically analyzed to determine the ideal X-bar profile through the good part profiles. The #3 Sigma variations of those profiles are then calculated as the profile limits. When the good part population is selected so that it represents normal production variations, the 43 Sigma limits that bracket this population rep- resent the production variations expect- ed in normal machining operations ‘This creates profile limits that ate realis- tic with respect to tool wear part fixtur- ves, slope-related crite Ball Runner Profile of Good Part, Hole #1 The profile of atypical good part is shown. The width of the profile on the Xaxls shows ‘the thickness of the casting. The threads in the hole are clearly wsible on the top of the profile while the chamfer on the top and bottom of the holo are represented by the ris- Ing and falling edges ofthe profile. Source: NDT Technologies ‘mvw.quaityag.com > Edy current inspection has reinvented itself as a dynamic rather than primarily @ statle means of Inspection. > Eddy current profiling probes come in two distinct versions— contact and noncontact. > The advent of the contact type eddy current probe has advanced eddy current Inspection, ing variations and other tolerance stack- | contact. The noncontact types are the ups that can be expected in a produc- | most common and can produce results tion environment in many applications where conductive The computer responsible for collect | materials are profiled. The contact types ing and displaying these profiles can. | of eddy current probes, however, bridge store these profiles and then make them | the gap between a noncontact compar availble to other systems for statistical | son means of part inspection and a true process control or other tend analysis | gage. In addition, these probes can be purposes. This capability alone is inval- used to profile any material conductive able in providing historical record of or nonconductve. twhat the production process has pro- Noncontact eddy current profiling, duced in the past Further ifthe individ» | probes are best used to profile thread tal part canbe identified with abar code | ed holes or bores with complex fa- rather type of identification, the pro turcs such as intersecting holes, files canbe linked to that particular part undercuts or charters. These probes for field analysis of part wear or otherin- are designed to provide profiles by service component degradation. creating a focused electromagnetic field that inspects the hole or bore in PROBES MAKE THE DIFFERENCE only one predetermined direction, eddy curtent profiling probes come in typically at right angles tothe probe two distinct versions—contact and non- | centerline. These probes are fabricated ‘This Ball Runner contact type eddy ‘current probe profiled two 24-mit- limeter threaded mounting holes in these two steering knuckles. The probe has a push-back sensor incor porated into its body that monitors. ‘the position ofthe probe tip in its body. Source: NOT Technologies December 2005 | QUALITY 39| QUALITY TEST & INSPECTION with coils that produce a very narrow field shielded from detecting extrane- ous information as it is moves through the hole. Because lift-off be a problem, the fill ratio, oF the rela tionship of the outer diameter (O/D) of the probe to the inner diameter of the hole, is kept as high as reasonably possible within the fixturing and tol ce stack-up constr nspection system. er ts of the These probes actually produce two measurable parameters that represent of the part being inspected. These paran the amplitude chang drive signal with respect to its reference and the phase chang with respect to its reference. The cor- rect weighting of these two parameters, +0 optimize the defect sensitivity of the system, tends to be materials, defect type and fill ratio specific. Profilers consequently make available a sort «equation that allows the operator to select how these two parameters are the eddy current pre of the probe ‘of that signal used together to produce the resultant OLYMPUS 40 QUALITY | December 2005 part profile that allows the defects that are to be detected, to be sorted from the good part population. If the weighting of these two parameters is incorrectly selected, the profiler will either not work correctly or possibly not at all ‘When profilers are used on flat or irregular surfaces rather than in holes or fon shafts, a problem inherent to eddy ccurtent inspection begins to become at problem, referred to as Iift-off relates to the fact that eddy cur rent sensors detect the absolute distance between the material nd the probe more significantly than they detect fe tures or defects. If flat or irregular sur faces are profiled, the separation between the part surface and the probe must be held absolutely constant. In ‘most cases this is difficult at best, to accomplish. Even if the eddy current sensor is fixtured so that it mechanically contacts the surface of the part, lift-off ‘errors stil become significant and can ‘mask the information that is of interest during the sort. demanding application requirements. with Live A-scan Ultrasonic Precision Thickness Gages make accurate thickness measurements on parts where access tothe opposite surface is dificult, The optional Live Waveform Made allows viewing the ultrasound wavetorm (or A scan) in real-time while making measurements on parts with Complex geometries. An Adjust Mode allows setup adjustments to maximize performance in Challenging applications Precision Thickness Measurements We offer a complete line of handheld thickness gages with varying measurement features and data collection capabilities to meet CONTACT-TYPE PROBES ‘The most significant advance made in eddy current profiling systems is the advent of the contact-type eddy cur probe. These probes bridge the gap between the noncontact type of com: parison inspection that is typical of teddy current inspection systems, and absolute gage measurements that can carry with them calib to local or NIST calibration standards These probes use the strengths of eddy ‘current inspection and marry these strengths with a contact gage that can easily measure to within afew microns, The mechanization of contact probes includes a means of mechanically con tacting the part and then converting that ‘mechanical contact into an eddy current signature. As this probe is moved along, the bore, this converted eddy current sig- nature is correlated with the position of the probe in the bore to create a profile of the bores’ inner surface. If this same probe is rotated as itis moved through the bore, bore cylindrcity and ovality can bbe measuted along with the inherent bore jon traceability NEL) MAGNA-MIKE® 8500 Thickness measurements are made by holding a magnetic probe on the outside of the material and placing a small target ball ‘on the inside. Fasy, fast, and accurate! For worldwide representation, visit www.panametrics-ndt.com pana@olympusNDT.com (9) (91) 419-3900 Quality Quick Clicks 220 at qualitymag.com SSIPANAMETRICS-NDT vo qualtymag.com| QUALITY TesT & INSPECTION | taper measurement that happens auto- matically as the probe is moved in or out of the bore. The sensitivity ofthis type of inspection allows the surface finish to be read with some degree of accuracy Although this surface finish reading is not an absolute indication of what the surface finish of the bore i in micro inches, it does effectively representa fig ure of merit that can correlate with an absolute surface finish reading made with a stylus type instrument. This approach is used effectively for threaded holes. e| Fe iter re cd me Sa eee meme sins | sr eter ted ee rea et Seas se a eee Spee nts Se In these applic the pilot hole and the minor diameter of the threads are accurately represent: cd in the profile, The software that sup: ports these systems counts the threads present in the hole as well a inspects ons, the diameter of undercuts and chamfers atthe same time. There is no realistic limit to the length of these sensors. For example, these probes have been designed to inspect rifle and pistol bores along their the rifling within the bore, the height of jth where they inspect the twist of Air Innovation ‘Micro: Dimonsionair® your Ai > | Mane Federal Air Gaging far dsplays and now stainoss ot Gaging at the machining process Now matorials improve tooling performance Innovation - shorter ead times and reduced cost of Lotus demonstrate our complete tine toling, Contact Mah Federal Portable Air ir Gaging system the rifling lands along with the bore taper and absolute diameter. For external profile of rods, this contact probe concept is reversed so that the external characteristics of a rod or stud can be recorded and corre- lated to the position of the probe over that rod or stud. The rod O/D along with bevel, tapers or grooves ae acc rately recorded With a slight modification ofthis concept, the external profile of at or long asa means to record the postion of the probe with respect to part dlatum is available. With the myriad of Tin limit to the length ofa surface that can be profiled. Correctly designed probes, either contact oF noncontact, should survive in hash manufacturing conditions, @ F encoders available, there is no Wiliam A. Keely sa vice president at NOT Technologies (Holy, Ml). He can be reached at (248) 624.0326 o ndtochinoBearthlnk net For ‘more information, vis ww atechine.com, Naan Aen (e)*0n col Ine, 1144 Eady Soot, Providonce, Fl 02905, Phone: 800.343.2050, Fax: 401.784.2246 or e-mail sir@mah.com, Inteme! win mahcom, ‘Quality Quick Cueks 321 at qualitymagcom 42 QUALITY | December 2005, 800/766-3920 ‘Quality Quick Clieks 322 at qualtymag.com vewquaitymag.com