Application Note

Testing the Adaptive Characteristics of a SIEMENS

7SDxxx Line Differential Protection Relay using
Test Universe 2.x

Author
Sameh Eldmrdash | sameh.eldmrdash@omicron.at

Date
Nov 4, 2011

Related OMICRON Product

CMC - Test Universe

Application Area
Adaptive line differential protection function testing

Keywords
Test Universe, Adaptive line differential testing, SIEMENS 7SDxxx

Version
v1.0

Document ID
ANS_11003_ENU

Abstract
Transformer, transmission lines and cables are the most important elements in the electric power
transmission networks therefore protecting those elements takes its importance in the field of testing the
protective relays nowadays.
Testing the differential characteristics of any transformer or line differential protection relay is one of the most
important tests have to be run to check the behavior of that relay in both tripping and blocking areas of the
characteristics.
This application note describes how to test the differential characteristics of the 7SDxxx "line differential
protection relay" from SIEMENS using the TU2.x.

The SIEMENS 7SD6xx item in the protection testing library of OMICRON "PTL" is working exactly as
described in this application note.
Content

1 Introduction ..................................................................................................................................... 3
2 Given Information............................................................................................................................ 3
3 Target............................................................................................................................................... 4
4 Solution ........................................................................................................................................... 5
4.1 Derivations ............................................................................................................................... 6
4.2 Example of Calculations............................................................................................................ 9

Please use this note only in combination with the related product manual which contains several important safety
instructions. The user is responsible for every application that makes use of an OMICRON product.

OMICRON electronics GmbH including all international branch offices is henceforth referred to as OMICRON.

© OMICRON 2011. All rights reserved. This application note is a publication of OMICRON.
All rights including translation reserved. Reproduction of any kind, for example, photocopying, microfilming, optical
character recognition and/or storage in electronic data processing systems, requires the explicit consent of OMICRON.
Reprinting, wholly or in part, is not permitted.
The product information, specifications, and technical data embodied in this application note represent the technical
status at the time of writing and are subject to change without prior notice.
We have done our best to ensure that the information given in this application note is useful, accurate and entirely
reliable. However, OMICRON does not assume responsibility for any inaccuracies which may be present.
OMICRON translates this application note from the source language English into a number of other languages. Any
translation of this document is done for local requirements, and in the event of a dispute between the English and a non-
English version, the English version of this note shall govern.
1 Introduction
The differential characteristics for the SIEMENS 7SDxxx relay are given in the technical manual of that relay
as shown in Figure 1. This kind of characteristics is an adaptive one and can't be tested directly using
OMICRON's Test Universe Software as usual with the classical characteristics.

Figure 1 : Adaptive Stabilization and Differential characteristic for 7SDxxx

With our software, only the Ibias Calculations are shown in Figure 2 are available and it is clear that that
kind of adaptive characteristic is not yet supported by the Test Universe software.

Figure 2 : Available I bias Calculation Methods in Test Universe Software

2 Given Information
The first given information is the bias calculation formula which is:

I Stab = I diff > + f1 ⋅ I1 + f 2 ⋅ I 2 + SystemError

The second given information is the CT error approximation curve which is helping to draw the points in a
correct way (See Figure 3 ).
 Figure 3 : Approximation of the current transformer errors

To consider the influences of current transformer errors, each device calculates a self restraining quantity.
This is calculated by estimating the possible local transformer errors from the data of the local current
transformers and the intensity of the locally measured currents. Since each device transmits its estimated
errors to the other devices, each device is capable to form the total sum of possible errors; this sum is used
for restraint. [1]
Let's try to imagine the approximation of the current transformers error in case of having two current
transformers, one at each end of the protected object either line or a power transformer, Figure 4 shows that
imagination with 6 points resulting in five straight lines.

Figure 4 : General view of CT errors in case of two current transformers

3 Target
The main target is to find the formulas controlling the calculation of the points shown in Figure 4 structuring
those pieces of straight lines to draw the whole characteristics.
Those formulas must be depending on the settings of the relays from both sides as shown in Figure 5 and its
shape should change according to the setting values from both sides.
 Figure 5 : Basic principle of the differential protection for a line with two ends

In other words, the bias current calculation formula has to be converted to another formula already
supported by the Test Universe Software.

I bias = I diff > + ∑ ( fault currents ) I bias = ( I 1 + I 2 )

Figure 6 : Conversion from a calculation method to another

4 Solution

Having a look to Figure 7 in the first straight line between P1 and P2, the CT errors are taken as f1 and f 2 .

In the second straight line between P3 and P4, the CT errors are taken as f1 ' and f 2 because the Test
Universe is injecting bigger value of current from the primary side more than the current injected from the
secondary side in case of the primary side is defined to be the reference side, so that is why the CT error
value at the primary side should be taken as the value in case of fault.

In the third straight line between P5 and P6, both current are too high that is why the bigger CT errors f1 '

and f 2 ' are taken in consideration at both sides.

 Figure 7 : Definition of the lines between the six points

4.1 Derivations
The formula mentioned in the manual how to calculate the differential current is:

I Stab = I diff > + f1 ⋅ I1 + f 2 ⋅ I 2 + SystemError (1)

But the characteristics line is defined to be 45º line which mean that I Stab = I diff
So the formula can also be written as:

I diff = I diff > + f1 ⋅ I 1 + f 2 ⋅ I 2 + SystemError (2)

System Error can be defined as 1.5 % In [2]

Our Test Universe differential module is working like that:

X = I bias = I 1 + I 2 (3)

Y = I diff = I1 − I 2
(4)

From Figure 4, it is clear that:

at Point 3,

I 1 = K1
and at Point 2,

I1 = (1 − ε ) ∗ K1 (5)
The same rules apply for Point 4 and Point 5, so:

at Point 5,

I2 = K2
and at Point 4,

I 2 = (1 − ε ) ∗ K 2 (6)
where ε = 10%

> Point 1:

Applying that

I 2 = 0 in equations 2, 3 and 4 we get:

( I diff > + SystemError )

X =Y =
(1 − f1 )

> Point 2:

From equation 4 we know that,

I1 = (1 − ε ) ∗ K1 = 0.9 ∗ K1

Applying this in equations 2,3 and 4 we get:

− ( I diff > + I1 ⋅ ( f1 − 1) + SystemError )

I2 =
(1 + f 2 )

Then X = I bias = I1 + I 2 and Y = I diff = I1 − I 2

> Point 3:

From equation 4 we know that,

I 1 = K1

Applying this in equations 2,3 and 4 we get:

− ( I diff > + I1 ⋅ ( f1 '−1) + SystemError )

I2 =
(1 + f 2 )

Then
X = I bias = I1 + I 2

and

Y = I diff = I1 − I 2

> Point 4:

From equation 5 we know that,

I 2 = 0.9 ∗ K 2

Applying this in equations 2, 3 and 4 we get:

( I diff > + I 2 ⋅ ( f 2 + 1) + SystemError )

I1 =
(1 − f1 ' )

Then X = I bias = I1 + I 2 and Y = I diff = I1 − I 2

> Point 5:

From equation 5 we know that,

I2 = K2

Applying this in equations 2, 3 and 4 we get:

( I diff > + I 2 ⋅ ( f 2 '+1) + SystemError )

I1 =
(1 − f1 ' )

Then X = I bias = I1 + I 2

and

Y = I diff = I1 − I 2

> Point 6:

Y = I diff >> + SystemError

and from Figure 3 and Figure 4 it is clear that P1, P2 and P3 are lying on the same straight line and the
same for P1, P5 and P6, then it is easy to get :
Y6 − Y1
X =
m156
 And here are the setting values needed for the calculations as symboled in the last formulas and also with its
Digsi address:

Symbol Digsi Parameter Name Digsi ID Default Value

Idiff> 87-1 PICKUP 1210 0,3 A
Idiff>> 87-2 PICKUP 1233 1,2 A
Isec CT SECONDARY 0206 1A
Iprim CT PRIMARY 0205 400 A
K K_ALF/K_ALF_N 0251 1
f E% ALF/ALF_N 0253 5%
f' E% K_ALF_N 0254 15%
Table 1 : Symbols used and their Digsi Names, IDs and Default values

The Primary side is the side with the Digsi Paramter ID 4710 is equal to relay 1.
The Secondary side is the side with the Digsi Paramter ID 4710 is equal to relay 2 (see Figure 8).

Figure 8 : Setting Local Relay "Digsi"

4.2 Example of Calculations

To make it easy we will show now an example to calculate the first two points in the characteristics in order
to help with the understanding of our method.
Taking in consideration that we have the default settings shown in Table 1 at both sides and following the
formulas derived at each point;

(0.3 + 0.015)
X 1 = Y1 = = 0.3316
(1 − 0.05)
0.3 + 0.9 ∗ (0.05 − 1) + 0.015
X 2 = I bias = I 1 + I 2 = (0.9 ∗ 1) − = 1.41
(1 + 0.05)

0.3 + 0.9 ∗ (0.05 − 1) + 0.015

Y2 = I diff = I 1 − I 2 = (0.9 ∗ 1) + = 0.39
(1 + 0.05)
List of Literature

[1] SIPROTEC Differential Protection 7SD610 V4.6 Technical Manual

[2] Differential Protection Symposium 2005, Gerhard Ziegler
OMICRON is an international company serving the electrical power
industry with innovative testing and diagnostic solutions. The application of
OMICRON products provides users with the highest level of confidence in
the condition assessment of primary and secondary equipment on their
systems. Services offered in the area of consulting, commissioning,
testing, diagnosis, and training make the product range complete.
Customers in more than 140 countries rely on the company's ability to
supply leading edge technology of excellent quality. Broad application
knowledge and extraordinary customer support provided by offices in
North America, Europe, South and East Asia, and the Middle East,
together with a worldwide network of distributors and representatives,
make the company a market leader in its sector.

Americas Asia-Pacific Europe, Middle East, Africa

OMICRON electronics Corp. USA OMICRON electronics Asia Limited OMICRON electronics GmbH
12 Greenway Plaza, Suite 1510 Suite 2006, 20/F, Tower 2 Oberes Ried 1
Houston, TX 77046, USA The Gateway, Harbour City 6833 Klaus, Austria
Phone: +1 713 830-4660 Kowloon, Hong Kong S.A.R. Phone: +43 5523 507-0
+1 800-OMICRON Phone: +852 2634 0377 Fax: +43 5523 507-999
Fax: +1 713 830-4661 Fax: +852 2634 0390 info@omicron.at
info@omicronusa.com info@asia.omicron.at

For addresses of OMICRON offices with customer service

centers, regional sales offices or offices for training, www.omicron.at  www.omicronusa.com
consulting and commissioning please visit our web site.