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The Comparator
1. INTRODUCTION
The comparator is the most basic component used in the architecture of
an A/D converter. In fact, it represents itself the simplest form of an A/D
converter. This device compares an analog input to a reference voltage and
produces a digital output of zero or one depending on the position of the
input relative to the reference. If the reference is connected to the negative
terminal of the comparator and the analog input is connected to its positive
terminal then when the signal is higher than the reference its digital output
(OUT) is high and its complementary output (OUTB) is low. This means
that the comparator is an A/D converter with one bit of resolution. We
should emphasize that the two terms - resolution and accuracy - should not
be confused. Resolution represents the number of distinct digital states of a
converter while accuracy is defined by the precision with which these states
are defined. The comparator for example has a resolution of one bit – it
produces only two output states. The accuracy of the comparator for
discriminating between the two states depends on attributes such as gain,
slew-rate limitation and input noise. For example, if the output is ECL
compatible, the output swing is expected to be approximately 1 V to
–1.8 V). With a gain of 60 dB (gain of 1000 V/V) an input of 1 mV is
expected to result in the full ECL output swing required. If the gain is less
than 60 dB, an undefined output state will result. This can cause the output
of the comparator to possibly be in the wrong state or an undefined state.
26 Chapter 2
Figure 2-1. An analog comparator: (a) electrical schematic and (b) symbol
An additional limitation, namely the slew rate at each of the tail current
nodes is included with the addition of the capacitance for each stage.
With a current of 5mA and a capacitance of 0.5 pF, the emitters’ node is
limited to a slew rate of:
when both transistors of the differential pair may shut off during a transient
if driven from a high impedance node.
This states basically that the time-domain limitation occurs in the analog
front end of the comparator; the digital circuit behavior is usually treated as
a simple delay (digital delays are purely additive in the time domain).
Figure 2-2. Differential pair transconductance curve: CMOS pair (solid line) and Bipolar pair
(dashed line)
30 Chapter 2
• The diodes D8 and D9 enable the circuit to spend a well defined time in
slew limited mode: the time needed for the current discharging the
capacitor CSR to switch from one diode to the second. The diodes allow
the current to switch almost instantaneously so that the maximum
current and the capacitor CSR control the slew rate. In our case the
maximum slew rate is:
Figure 2-4. Small signal Open-loop gain of the comparators in figure 2-1 and 2-2
For example with Vinp moving from to and with Vinn held
at 0.45V the comparator has an input overdrive voltage of 50 mV.
This describes the linear region of the circuit. Solving the equation, we
obtain:
From this equation, we can find the time required to switch from one
diode being “ON” until the second diode turns “ON”. If the input step is
instantaneous then the time is calculated to be:
From node int to the latch, the signal is delayed by an amount of time
equal to the time constant psec. This time is actually the
majority of delay time while the time calculated in the equation above is a
very short period of time while the current switches from one diode to the
next (in our case 140 psec). This represents a small fraction of the overall
delay time of the comparator and is the exact period of time that makes the
comparator delay dependent on the amount of overdrive. The case just
analyzed is a relatively simple case where is a voltage step. To
calculate the delay for a different function than a step, the equation becomes
significantly less manageable. For this reason, from this point on we will use
only the Spice macro-model only rather than an exact symbolic
mathematical analysis. A more complex comparison of transient behavior
can be obtained through SPICE simulations between circuit of figure 2 – 1
and our macro-model. This comparison establishes the time delay
dependency on overdrive conditions.
For this test, lab measurements are performed on a more complex IC
device available commercially (SPT9689 - a subnanosecond comparator
manufactured in a process with The results are summarized
in figure 2 – 6 below.
The Comparator 35
In the graph, the horizontal scale is the amount of overdrive voltage in mV,
and the vertical scale represents the propagation delay in picoseconds. The
various curves are:
• is the propagation delay of the transistor circuit of figure 2 - 1
• is the propagation delay of our macro-model in figure 2 - 3
• the propagation delay measured for the commercial device
(SPT9689).
The graph shows that the proposed model is in good agreement with the
actual measured lab data for commercial comparator (especially for
overdrive voltages of 10 mV or more).
The graph shows that the reconstructed pulse is distorted especially close
to the top and bottom of the waveform where the corners become round. The
reason is that at the top and at the bottom, the amount of overdrive different
for the rising and the falling edges of the signal. For example at there is
more overdrive going up than at time when the signal is going down. In
the middle of the pulse however, where the overdrive voltage exceeds the
15-20 mV of overdrive the delays are almost constant. For this reason the
reproduced pulse shows rounded comers due to low overdrive conditions.
The distortion in this example is limited to overdrive voltage and not to
slew-rate limitation (the input signal has a slew-rate of 1 V/nsec while the
comparator is limited to follow slew-rates of less than 10 V/nsec). This
example illustrates how a system considered to be linear can distort
particularly small signals, while for large signals it is more predictable and
linear. This is not a trivial or predictable behavior and while counterintuitive
is a very critical consideration in the design of an A/D converter.
The Comparator 39
Figure 2-9. The original pulse (dark) is distorted due to the increased delay at low overdrive
voltage (light)
Our SPICE simulations have the latch function modeled with an edge-
triggered flip-flop, with 10-mV noise margin and propagation delay of 1
picosecond. Obviously this is an unrealistic value for any technology
available today, but the aim of this book is to concentrate on the analog front
end behavior of the comparator and not delay fluctuations caused by digital
blocks.
Finally our model contains the voltage controlled current source
resistor and diode D11 in front of the latch for the level shifting
required by U1. This is required so the voltage on the node pole is shifted to
become an ECL logic level. The voltage constitutes the ECL threshold
level.
The hyperbolic tangent for the bipolar differential pair (see reference 4),
is based on the diode behavior (current versus voltage). The 0.06
denominator is merely the term 2 · and is an approximation derived by
using the thermal voltage (approximately 26 mV at room temperature).
The benefit of using the hyperbolic function as explained above is that it
can model a limiting transfer function and at the same time it is a well-
behaved function (a continuos function with continues derivatives).
For this reason, an attempt is made to observe the adequacy of modeling
a CMOS comparator using a similar model as that seen in figure 2 - 3 but
with new component values. Clearly a CMOS transistor has a widely
different transfer function than a bipolar transistor (the relation between
current and voltage is quadratic rather than exponential) and for the same
current the transconductance of a CMOS transistor (gm) is much lower than
that of a bipolar transistor (see again figure 2 – 2). To model this difference,
the GM used in our CMOS comparator model is:
The Comparator 41
The fact that our model closely approximates the transistor model and
actual measurements of the commercial device indicates that this is an
acceptable macro-model, which can be used both mathematically as well as
in Spice simulations. The model describes closely not only the linear
behavior (BW) but also the nonlinear effects (SR).
SUMMARY
• the nonlinear GM in the model has a multiplier for the TANH function
equivalent to the front end differential pair tail current
• the slew rate is then modeled by picking a capacitor CSR such that:
To lengthen the amount of time of slew rate condition the voltage sources
V2 and V3 can be used.
• Rg is chosen to create a pole with CSR such that the time constant of the
pole is only a fraction of the pole created by and the delay
associated with it is insignificant.
• E1 is chosen so the open-loop gain of the comparator is:
• and are chosen to create dominant pole such that which
is the specified delay time for large overdrive condition in the
manufacturer’ data sheet.
• The comparator model can be enhanced to account for non-symmetric
slew rates on the rise or fall times with the help of a constant current
source. When this option is considered the comparator should include a
voltage source at the input that accounts for the offset of the circuit. The
magnitude of this source is equal to atanh
44 Chapter 2
PROBLEMS
3) Repeat problem 1 for the case that the open loop gain of the converter is
46 dB and all poles remain unchanged. Does the result change?