C142-E030E

Energy Dispersive X-ray Fluorescence Spectrometer

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer

EDX Series EDX-720/800HS

The implementation of new environmental regulations, such as RoHS and ELV in the

EU, has resulted in an increased demand for instruments that can perform trace, rapid

analysis of a wide range of samples. With an even greater level of sensitivity and

expedition, the EDX Series meets this demand, enabling both trace and rapid analysis

that goes beyond the limits of screening analysis.

X-ray Fluorescence Spectrometers

An EDX fluorescence spectrometer irradiates a sample with X-rays, and then measures
the energy of the generated fluorescent X-rays to determine the type and amount of
elements comprising the sample. This nondestructive analysis technique allows
measurement of a wide variety of sample types (solids, powders, liquids, thin films, etc).
EDX Series instruments are used in a variety of fields.

1 Electrical and Electronic Materials

As s e s s m e nt of r e gul a t e d su b st a n ce s u se d i n e l e ct r i ca l a n d e l e ct r o n i c
pa r t s in a c c or da nc e w i t h G l o b a l e n vi r o n m e n t a l r e g u l a t i o n s
T hin- f ilm a na ly s is a n d d e f e ct a n a l ysi s f o r se m i co n d u ct o r s, d i sk s a n d
liquid c r y s t a ls

2 Chemical Industry
Analysis of organic and inorganic materials and products, catalysts,
pigments, paints, rubbers and plastics

3 Petroleum and Petrochemicals

Analysis of nickel (Ni), vanadium (V), and sulfur (S) in heavy oils Analysis of
dopants and contaminant elements in lubricating oil

4 Building and Construction Materials

Analysis of ceramics, cements, glass, bricks and clays

5 Medical Supplies
Analysis of materials and products and analysis of catalysts during synthesis
Analysis of sulfur (S), chlorine (Cl) and bromine (Br)

6 Agriculture and Food Products

Analysis of soils, fertilizers, foods and food-related products

7 Iron, Steel and Nonferrous Metals

Analysis of composition and impurities in raw materials, alloys, solders and
precious metals

8 Machinery and Automobiles

Assessment of regulated substances used in automobile parts in
accordance with ELV compositional analysis and coating-thickness
measurement of machine parts

9 Environment
Analysis of soil, effluent, ashes and filters

10 Other Applications
Analysis of archaeological samples and precious stones
 Features

Large Sample Chamber with Automatic Simple Operations Start Fully Automatic
Opening/Closing Door Measurement – Even Any Analyst Can
Equipped with an automatic Perform Simple, Accurate Measurement
opening/closing door, the large sample There is no need to set Step 1: Select conditions

chamber can accommodate samples up complicated procedures

to 300 mm wide and 150 mm high.
Also, operation in combination with the
optional sample turrets (for continuous
measurement) allows fully automatic
measurement at the touch of a button.
(Patent granted)
Large sample chamber allows
samples to be analyzed without
having to cut up the sample
before sample Step 2: Register sample names
measurement.
No specialized
knowledge, experience
or expertise is required. Step 3: Start measurement
Measurement can start after only 3 operational steps.

Standard-less Quantitative Analysis Software

Is Suitable for Various Applications - from Thin Time-Reduction Function Sets Measurement
Films to Organic Substances Time Automatically According to Target
Precision Level
The software includes FP (fundamental parameter) methods for
Measurement time is
quantitative analysis as standard. These include the Bulk FP method,
determined automatically
which allows the analysis of
according to the target
samples such as oxides,
precision level set.
metals, and resins, and the
Measurement stops when
Thin-Film FP method, which
measurement precision
enables the thickness
reaches the set level. When the target precision level is entered, the
measurement and system determines the required measurement time.
compositional analysis of
coatings and thin films. Thin-Film FP is provided as a standard
feature for measuring coating thickness No Time-Consuming Pretreatment!
Analysis in Air, Helium, or Vacuums Possible!
Equipped with Five Types of Filters for Measurement in helium or vacuum atmosphere is possible, allowing
High-Sensitivity Analysis analysis of light elements whose X-ray emissions are heavily absorbed by
This model is equipped with five types of air. Solid samples can be analyzed in vacuum atmosphere, and powders
filters for reducing and eliminating and liquids can be analyzed in helium atmosphere. (Optional function)
background, characteristic lines, and
other forms of scattered radiation. These Sample Observation
filters greatly improve the detection Camera (Option)
sensitivity for lead (Pb), mercury (Hg),
A CCD camera can be installed in
cadmium (Cd) and others.
the main unit and used to
High-sensitivity and observe the sample position. This
standard-less analysis is possible
is useful for checking analysis
using a primary filter
positioning.
Defect analysis is simple using four types of
collimators and the sample observation unit
Switching Calibration Curve Function Recognizes
Sample Type Differences and Selects Appropriate
Calibration Curves Automatically
The optimum calibration curve for the sample is selected
automatically from pre-registered calibration curves.
For example, the calibration curve with polymer resin samples is
automatically selected, according to whether the samples are
judged to contain chlorine (Cl).

4
Excellent Performance and High Operability

P r i nc i pl e a n d F e a t u r e s
With X-ray fluorescence spectrometry, a sample is irradiated with Sample compartment
X-rays emitted by an X-ray tube and the resulting characteristic cover: CLOSE
X-rays generated in the sample (fluorescent X-rays) are detected.
Atmosphere: Air Measurement time: 300 sec
In particular, X-ray fluorescence spectrometers that use Vacuum level: Air Dead time: 25%
semiconductor detectors are called "energy dispersive". Advantages
of these spectrometers include the ability to perform simultaneous
Sample Liquid mode: OFF
measurement of many different elements, a compact design, and
Detector Collimator: 10 mm
the distance between the sample and the detector can be small Shutter: OPEN
because there are no driving mechanical parts. In addition, using Filter: OUT

this system, attenuation of fluorescent X-rays is small and

Detector temperature: OK
measurement is possible even in air. Furthermore, this system does X-ray: ON X-ray tube
Detector power supply: ON Voltage: 50 kV
not require time-consuming pretreatment and a wide variety of Current: 35 A
samples can be measured. * The figures given here are for example purposes only.

Various Methods Enable Powerful, Flexible Quantitative Analysis

1. Calibration-Curve Method
Quantitative Analysis with High Accuracy
With this method, standard samples are measured, and a calibration curve is created as a
relationship between the concentration and the X-ray fluorescence intensity of each
element.
The concentration of the unknown sample is quantitated by using this calibration curve.
This is well-known as empirical method.
With this method, it is necessary to prepare standard samples of each different matrix
material and create calibration curves for each element; however, this method provides
highly accurate analysis.
Calibration-Curve Setting Window

2. FP Method
Perform Bulk Analysis and Analyze Thin Films, Organic Materials and etc. without Standard Samples!

With the FP method, the X-ray intensity is obtained and quantitative analysis is performed
using theoretical calculation. This method is very effective for quantitative analysis of
unknown samples for which standard samples are not provided. Shimadzu EDX Series is
equipped with Shimadzu's high-performance FP software, which was developed based on
our many years of experience with wavelength-dispersive spectrometers. This software
includes the Bulk FP method, which can be used to analyze samples such as oxides, metals,
and resins, and the Thin-Film FP method, which can be used for film-thickness and
compositional analysis of coatings and thin films without standard samples.
FP Method Setting Window

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 5
 Wide Variety of Samples Supported

T r ac e Ana l y s i s w i t h A u t o ma tic C h a n g e a mo n g 5 Filte rs

In trace-element analysis, a scattered X-ray, such as the continuous
X-ray from the X-ray tube, causes a large background, and it is
difficult to detect target peaks. In the case of chlorine (Cl), a
characteristic X-ray from the X-ray tube interferes and overlaps with
a target peak. In such a cases, a primary X-ray filter that cuts the
unnecessary X-ray is an effective tool to reduce the background,
eliminate interference peaks, and consequently improve the
detection sensitivity. Normally, four or five types of filters are
required to cover the entire element range.

Representative
Filter Without filter

RhLa-
measurement elements
#1 Cl

-RhLb1

BrKa-
1000

-PbLb1
#2

-BrKb
Cr
Without filter
#3

-PbLa
*1:Hg, Pb, Br, Bi

-HgLa
*2:Hg, Pb, Br, Bi (high sensitivity type) 500
With filter
#4 *1:Rh-Cd/*2:Cd (high sensitivity type) -K Ka
With filter
-ClKa

#5 Cd 0
*1: EDX-800HS 10.00 11.00 12.00 13.00 [keV]
*2: EDX-720 Trace element: Chlorine
(removal of characteristic lines) Trace element: Lead (reduces background)

Nonstandard Quantitative Analysis

Shimadzu's original FP software can calculate the quantitation With instruments that don't have such a function, it is necessary,
without standard samples even when the filter is used because this when using a filter, to measure standard samples and recreate the
software considers X-ray absorption by the filter theoretically. calibration curve.

Func t i ons f o r H a n d l i n g a Va rie ty o f S a mp le Fo rms

Setting of Analysis Region Using Collimator and Setting of
Measurement Atmosphere (Option)
When a sample is small, a collimator can improve the S/N ratio by irradiating the sample
only, and therefore eliminating unnecessary X-rays. The irradiation diameter can be
switched between 1, 3, 5, and 10mm. Furthermore, the FP method can be used at any
collimator diameter, as the FP method sensitivity coefficient is converted automatically
according to the irradiation diameter. Combination with a CCD camera is recommended
(see below). Additionally, measurement in a helium or vacuum atmosphere is possible in
order to analyze analysis the light elements whose sensitivity is lower when measured in air
Condition Setting Window
atmosphere. (Option)

Setting Measurement Position Using Sample Observation

Kit (Option)
A CCD camera makes it easy to find and set the analysis positions in measurements of
foreign matter or samples made up of multiple parts.

CCD Camera Image of Electronic Part

6
Changing the Measurement Atmosphere Enables High-Sensitivity
Measurement of Light Elements
[cps/uA] Na-Fe
Vacuum Unit (Option) / He Purge Unit (Option)

CaKa–
SiKa–
Since the energy of fluorescent X-rays generated from light
elements is weak, energy is absorbed if air is present between the
sample and detector, which may worsen detection sensitivity.
Setting the measurement chamber to a vacuum atmosphere is
Blue line : Vacuum
effective in increasing sensitivity when measuring light elements. Red line : Air
0.200
He purging is useful in the analysis of light elements contained in

–CaKb
samples that, for example, generate liquids or gases and that
cannot be set to a vacuum atmospheric state.

–RhLa

–K Kb
100

80

–K Ka
0.100

–RhLb1
–AlKa
Relative intensity

60
He

–MgKa
Air

–NaKa
40

–S Ka
20

0
0.000
5 15 25 30 45
2.00 4.00
Atomic No.
Comparison of Vacuum and Air Atmosphere Profiles
Relative Intensities of Air and He After Purging (with vacuum taken as 100) (sample: water glass)

Continuous Measurement Results in Improved Throughput

Range of Turrets (Option)
Adding on a turret enables automatic continuous measurement.
This is particularly effective in improving throughput when measuring
in a vacuum or He atmosphere.
Continuous measurement using a combination of different analysis
conditions is also possible. Furthermore, X-ray emission can be
automatically set to OFF or to a standby state after continuous
measurement is finished.
In addition to two types of 16-sample turrets (for solids and for
liquids), which are ideal for measuring samples in sample containers,
two other types are available – an 8-sample turret that accommodates
large samples up to 52 mm in diameter and an 8-sample turret with
spinner that is useful for analyzing non-uniform samples.

Example of Using 16-Sample Turret (for Solids) Example of Using 8-Sample Turret

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 7
 Extensive Applications in a Wide Range of Fields

A nal ys i s o f F o r e i g n M a t t er
Analysis of Foreign Matter on Tablets
Fluorescent X-ray analysis is effective in the analysis of foreign
matter adhering to or contained in food, drugs, and other
products since it allows elements to be analyzed
non-destructively. Micro-contaminants can also be easily
analyzed by using a CCD camera and collimator.
We analyzed foreign matter on a tablet. Since the sample was
smaller than the instrument's minimum irradiation diameter
(1 mm), a location that contained the foreign matter and one
that did not (i.e. blank) were measured, and the two profiles
were overlapped and subjected to subtraction processing to
assess the sample.

External Appearance of Sample

Blue: Contains foreign matter
Red: No foreign matter (blank)
Overlapping of Profiles of Location Containing Foreign Matter (Blue) and Blank (Red)

Analysis Target Analysis Result Standard Deviation Processing Analysis Line Intensity
Quantitation-FP
Quantitation-FP
Quantitation-FP * This analysis sample was prepared at Shimadzu
Quantitation-FP by attaching foreign matter, especially for
Quantitation-FP assessment.

Results of Quantitative Analysis After Profile Subtraction (Blue-Red)

Flexible Functions for Accommodating a Variety of Sample Forms

Matching Function
"Matching" is a function for comparing the analysis results of a certain There are two types of libraries, one for content data and the other
sample with existing data from a library and displaying the result in intensity data. Samples can be registered using existing data from each
order starting with the highest degree of match. of these libraries. Values can be entered manually for content data.

Analysis Target Analysis Result Standard Deviation Processing Analysis Line

Matching Results

Matching
M hi C Conditions
di i

Analysis Results

8
Thin-Film Measurement
Measurement of Film Thickness of Electroless Ni-P Plating and Its Composition Ratio
The thickness and composition of not only single-layer but also multilayer films can be obtained by the thin-film FP method. The amount of
deposition can also be measured.
This method demonstrates its effectiveness also in the measurement, for example, of Pb in plating.

Layer Information Analysis Target Analysis Result (Standard Deviation)

Layer
Component
Component
Component

Component
Quantitative Analysis Result
* With the thin-film FP method, the lamination layer order
including the base and the content element information must
be entered.

Peak Profiles of P, Ni, and Pb

Measurement of Au Vapor-Deposited Film Example of Thickness Measurement of Organic

This is an example of measurement of a Film Using Scattered X-Rays
glass sample vapor-deposited with thin Au The thickness of even organic films that do
film. not contain inorganic compounds can be
Heavy element thin films can be measured measured using scattered X-rays. The figure
from the sub-nanometer (several Å) order. on the right shows overlapping of the
scattered X-ray profiles of polyester films of
different thicknesses.

Examples of Measurement of Various Film Thicknesses

A variety of other film thicknesses can be measured.

Sample Film (Lamination) Makeup Quantitative Result

Amount of deposited film ? mg/m 2

Film composition Cr 100% Cr layer 75.4 mg/m2
Amount of deposited film ? g/m2 Film composition Zn 100% Zn layer 31.6 g/m2
Plated Steel Plate
Substrate composition Fe 100%

Film thickness ? nm Film composition Fe ?%, Ni ?% Film thickness 111 nm

Film Formation Fe 18.8%, Ni 81.2%
on Silicon Wafer Substrate composition Si 100% (C.V 0.2%, 0.05%)

Si compound 5.5 µg/cm2

Amount of deposited film ? µg/cm2 Film composition Si compound*
Anti-Static Film on Resin Film (C.V 0.8%)
Resin film composition C10H8O4 (PET) 100% *Set the actual chemical formula
Peel Coating Film since there are a variety of
compounds.

Film weight 10.5 mg/cm2 Component?/composition? SiO2 1.16%, MgO 0.54%

Paper Composition Other:
C6H10O5 97.65% (balance)

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 9
 A nal ys i s o f R o H S a n d E L V- re g u la te d Ha za rd o u s E le me n ts
Measurement of Polymer Resin Samples

—PbLa
—TiKa

Cd
—CrKa

Cr 2.00
PbLb1

0.40 0.00200

—RhKaC
—NiKa
—CrKb

— CdKa
0.30
Pb
—TiKb

0.20 1.50
—RhKa

—SnKa
0.10
0.00 1.00 0.00100
—PbLg1

—RhKbC

5.00 6.00 7.00 [keV]

—PbLg3

—RhKb

—SnKb
0.50
—TiKa
—CrKa
—SnLb1

—SnKb2
—PbLn
—PbLL
—CuKa
—SnLa

—NiKa
—CrKb
—TiKb

0.00 0.00000
10.00 20.00 [keV] 22.00 23.00 24.00 [keV]
Analysis of Hazardous Substances in Resin Materials Used in Power-Supply Adapter Casings, Wire-Coating Materials, and Electronic-Device Casings

Measurement of Metal Samples Report Generator Function

0.0080 Pb : 1200 ppm Cd : 170 ppm

—CdKa

0.0060 0.00100 XXX Company.

PbLb1—

Report No.: Cable Covering Material

Report Date: 2005/7/1
Operator : SHIMADZU
Analysis Report
0.0040
Meas.Date : 2005/7/1
0.00050
Sample Information
0.0020
Sample Name Cable Covering Material [ Sample Image ]

Group WR-10 mm-300 sec

0.0000 0.00000
PartNo. T-001
12.00 13.00 [keV] 22.50 23.00 23.50 [keV] Weight 10.0 g

Analysis Examples for Lead and Cadmium in Brass Material Plastic

Result
Method by ED-XRF

Sample preparation None

Element Cadmium Lead Mercury Chromium Bromine

Measurement of Lead-Free Solder Samples Content(ppm)

Std.Deviation(ppm)
103

1.3
16.8

1.0
0.5

1.4
12.9

3.6
5.3

0.5

Judgment NG OK OK OK OK
—PbLb1

Pb : 250 ppm X-ray Spectra

—BiLb1

Cd Pb Hg Cr Br

0.0040 0.020
—CdKa

—PbLa

0.0020 0.0020
0.004

0.002
0.0020
—BrKa

0.010
—CrKa

0.0010 0.0010
0.002
—HgLa

0.0000
12.50 13.00 13.50 [keV] 0.000 0.000 0.0000 0.000 0.0000
23 24 [keV] 10 11 [keV] 9 10 [keV] 5 6 [keV] 11 12 [keV]

Analysis Example for Lead in Lead-Free Solder Sample [ Note ]

10
Ot her Ana l y s i s E x a m p l e s
Control Analysis of Metal Materials
The EDX can be used for judging metal scrap and for checking product contained in cast iron. The table shows that although carbon cannot be
types. Also, it can be made good use of in control analysis of samples detected, the coefficient of variation of other elements is about several
subjected to pretreatment such as grinding. percent and that the values demonstrate sufficient performance for
The table below summarizes example analysis values for elements product management and acceptance inspections at secondary user sites.

Si Mn P S Cu Ni Cr Mo
Degree of Accuracy (%) 0.023 0.019 0.0048 0.0046 0.0048 0.0075 0.0051 0.0060

Quantitative Value (%) 2.53 0.40 0.050 0.086 0.086 0.069 0.051 0.093

Reproducibility (%) 0.02 0.010 0.007 0.002 0.004 0.005 0.004 0.002

Coefficient of Variation (%) 0.78 2.4 14 2.2 4.5 7.3 8.1 2.3

Result of Repeated Measurement of Cast Iron Sample

Sample Image

Quantitative Analysis of Elements Contained in Black Tea Leaves

Leaves of black tea made in India (4 types), Ceylon (5 types), and Differences, in particular, in the content of phosphor (P), manganese
China (3 types) were crushed in a mortar, poured into a sample (Mn), zinc (Zn), iron (Fe), and rubidium (Rb) appeared according to the
container coated with polypropylene film, and analyzed by the country of origin. It can be seen that the EDX is also useful in
calibration curve method. discerning the country of origin of agricultural products.

Sample Container

Calibration Curve of Mn Overlapped Profiles of P, Mn, Zn, Fe, and Rb

Sample Name P S K Ca Mn Fe Cu Zn Rb Sr
1 4300india-assam 2799.0 2350.1 19092.2 4503.8 540.8 60.4 12.4 27.1 863.9 13.7
2 4303india-assam 2434.4 2203.7 19635.4 5440.8 634.0 222.5 8.0 21.1 657.0 10.8
3 4304india-assam 3128.7 2353.6 19348.2 5591.7 899.6 100.3 9.0 21.4 827.0 11.3
4 4305india-assam 2191.5 2207.4 19397.8 5547.4 428.9 111.3 10.1 20.3 680.7 13.4
5 4501ceylon-dimbula 1853.2 2156.9 18837.0 5286.2 325.1 41.5 12.5 22.9 605.0 15.0
6 4502ceylon-dimbula 1975.3 1807.4 16173.0 5542.1 263.9 68.1 13.7 26.6 150.2 12.9
7 4520ceylon-uva 2027.7 2099.5 17872.7 4999.0 529.8 77.1 11.8 21.6 473.6 20.0
8 4530ceylon-kandy 2576.7 2326.3 18135.7 5129.2 397.5 101.2 12.2 31.5 489.3 18.8
9 4540ceylon-ruhuna 2699.2 2427.0 18372.5 3827.7 384.8 86.5 12.0 19.9 856.9 9.5
10 4701china-anhui 3802.5 2555.6 17849.0 4240.6 818.5 223.4 16.7 41.4 977.7 14.0
11 4702china-anhui 3693.5 2511.6 18023.0 4413.2 1009.7 257.3 12.6 36.2 749.7 16.8
13 4750china-yunnan 3041.6 2427.0 19761.1 5765.7 723.7 362.6 10.1 32.3 1295.5 19.2

Quantitative Analysis Results of Black Tea Leaves

P Mn Fe Zn Rb
India Average Value 2638.4 625.9 123.6 22.5 757.2
Ceylon Average Value 2226.4 380.2 74.9 24.5 515.0
China Average Value 3246.9 782.2 287.4 34.6 915.8
Overall Average Value 2741.9 563.7 149.9 27.3 721.0

Average Values of Elements Having a Large Difference by Country of Origin

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 11
 EDX-720/800HS Features

I m pr oved H a r d w a r e E n a b le s T wice th e S e n sitiv ity in An a lysis

of Haz ar d o u s E l e m e n t s s uch a s Le a d a n d C a d miu m

EDX-720
New Filters Improve Sensitivity in Analysis of Hazardous Elements
The S/N ratio is improved by adopting two types of new filters that efficiently cut the continuous X-rays component from the X-ray tube. It
is possible to perform the trace analysis with high sensitivity by reducing the background.

CdKa
BrKa

Reduction in Background Increase in X-ray New filter

Fluorescence Intensity
1000 400
Previous filter
300
PbLb1
PbLa

200
BrKb

500
HgLa

100 Previous filter

0 New filter 0
10.00 11.00 12.00 13.00 [keV] 22.00 24.00 [keV]

Comparison for Standard Sample of Comparison for Standard Sample of

PVC Resin Containing 100-ppm Lead PVC Resin Containing 100-ppm Cadmium

Detector Count Rate Increased through Adoption of High-Count-Rate Circuit

The counting system used in the EDX-720 has been modified to process at an even higher
count region than previous system to measure with higher precision. 1000 EDX-720
Particularly in the analysis of resin samples, which generate large numbers of scattered X-rays, 750

CdKa
P re v i o u s
and in metal samples, which generate a large amount of fluorescent X-rays from the main model
500
component, it has been difficult to get information about trace elements because almost all
250
counted signals are for scattered or fluorescent X-rays from the base material. The count rate
attained with the EDX-720 is more than twice that of previous models and detection sensitivity 0
22.00 23.00 24.00 [keV]
is significantly higher. It is possible to reduce the analysis time significantly because the same
Comparison using Standard PVC Resin Sample
level of precision can be attained in half the time required with previous models. Containing 100-ppm Cadmium

M axi m i z i n g D e t e c t a b i l i t y o f Lig h t E le me n ts P ro v id e s
Hi gh-Sens i t i v i t y A n a l y s i s

EDX-800HS
Special Detector Window Material Reduces Absorption of Light Elements and Provides
High-Sensitivity Measurement
Analysis of light elements must be measured in helium or vacuum atmospheres. However, even
EDX-800HS
in these kinds of atmospheres, particularly with organic component elements such as oxygen
EDX-720
(O) and fluorine (F), the detector window itself can act like an absorbing material and adversely
affect the detection efficiency.
With the EDX-800HS, an ultrathin film consisting of a special material is used for the detector
window to perform high-sensitivity analysis of elements lighter than sodium.

Comparison for Fluoropolymer Sample

12
Specifications

Mai n Spec i f i c a t i o n s
Measurement principle X-ray fluorescence spectrometry
Measurement method Energy dispersive
Applicable sample type Solid, liquid, or powder
Measurement range 11Na to 92U (EDX-720)
6C to 92U (EDX-800HS)

Sample size 300 mm (dia.) × 150 mm (H) max.

X-ray Generator Detector

X-ray tube Rh target Type Si (Li) semiconductor detector
Tube voltage 5 to 50 kV LN2 supply Only during measurement
Tube current 1 to 1,000 µA LN2 Dewar capacity 3L
Cooling method Air cooling (with fan) LN2 consumption Approx. 1 L/day
Exposure area 10 mm dia. (standard)
(Automatic switching between
4 settings: 1, 3, 5, and 10 mm dia.)*
Primary filter Automatic switching between 5 types

Sample Chamber Vacuum Unit* (for high-sensitivity analysis of light elements)

Atmosphere Air, vacuum*, helium* It is necessary for measurement of elements lighter than S (Sulfur)
Sample exchange* 8/16-sample turret Evacuation Oil rotary vacuum pump, directly connected
8-sample turret with spinner Vacuum monitor Pirani gauge
Precision stage Atmospheric-pressure With pressure sensor
Sample observation* CCD camera monitor

Data Processing Unit (To be procured separately) Software

Main unit IBM PC/AT compatible Qualitative analysis Measurement/analysis software
Memory More than 256 MB Quantitative analysis Calibration-curve method, matrix correction, FP method,
HDD More than 20 GB Thin-Film FP method, Background FP method.
FDD 3.5-inch × 1 Matching software (intensity/content)
Printer Color inkjet printer Utilities Automatic correction functions (energy correction,
CD CD-ROM drive FWHM (full-width half-maximum) correction)
OS Windows XP / Windows 7 System-status monitoring function
Analysis-result tabulation function
(Items with * mark are optional.)

In s t al l at i o n R e q u i r e m e n t s
Temperature 10°C to 30°C
Relative humidity 40% to 70%

EDX-720/800HS (AC100V) EDX-720/800HS CE type (AC230V)

Power requirements : AC100V10%, 15 A, 50/60 Hz Power requirements : AC220 V, 230 V, 240 A10%, 1000 VA, 50/60 Hz
Dimensions of the main body : 580(W) × 650(D) × 420(H) mm Dimensions of the main body : 580(W) × 750(D) × 420(H) mm
(23(W) × 26(D) × 17(H) inches) (23(W) × 30(D) × 17(H) inches)
Main body weight : Approx. 80 kg Main body weight : Approx. 100 kg

F oot pr i nt Sample Pretreatment for X-ray Fluorescence

Wall
200 or more Spectrometry
Sample format Pretreatment Pretreatment equipment
750

800

Powder sample No pretreatment (put in sample cell)

Pressing Vibration mill, briquette machine
Melting; making glass bead sample Automatic bead fusion furnace
580 460 370
1800 Liquid sample No pretreatment (put in sample cell)
: AC230V, CE type ONLY Dropping on paper filter and drying
580 Solid sample No pretreatment (flat part put on stage)
Surface polishing, cutting Sample polisher, lathe
Food or biological No pretreatment (put in sample cell)
420

sample Mashed into paste using blender Blender mill

1800
mill (put in sample cell)
Units: mm

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 13
 A Wide Variety of Optional Accessories

Precision Stage P/N 212-22925

This stage is to set a region of interest on the sample to the irradiation area automatically,
when collimator and CCD options are equipped. This is useful especially for smaller area
like 1 mm. A large knob and XY slide mechanism move the sample smoothly and make
sample positioning easy.
The sample holder can be replaced, and the stage has a central opening of up to 70 × 70 mm.

Stroke : 10 mm
Feed : 1 mm per revolution
Inner diameter of standard holder : 31 mm (can be used with the attached sample cell)

16-Sample Turret (for Solid Samples) P/N 212-22665-91
This turret is used for the sequential analysis
of solid samples with diameters less than 32
mm. It is particularly effective for analysis in
helium or vacuum atmospheres.
8-Sample Turret P/N 212-22665-93
This turret is used for the sequential analysis
of larger samples less than 52 mm dia.

16-Sample Turret (for Liquid Samples) P/N 212-22665-92
This turret is used for the sequential analysis
of up to 16 liquid or powder samples
contained in sample cells.
* A turret drive unit is required with each of the above turrets.
8-Sample Turret with Spinner P/N 212-22345
A turret with spinner used to acquire
averaged information of heterogeneous
samples like minerals, foods, soil by spinning
samples. To be used with solid or small
sample holders.

Small-Sample Cover** P/N 212-23860-91

This cover helps shorten the evacuation time
when analyzing a small sample sequentially.
(Patent granted)
Sample size: 62 mm (dia.) × 120 mm (H) max.

Sample Cells
3571 31 mm Open-End X-Cell 3577 Micro X-Cell
P/N 219-85000-55 (100 pcs/set) P/N 219-85000-54 (100 pcs/set)
(Outer diameter: 31.6 mm; Volume: 10 mL) (Outer diameter: 31.6 mm; Volume: 0.5 mL)
This polyethylene sample cell is used for liquid and The cell is used for trace samples. In order to reduce
powder samples. It is used with Mylar or the scattered radiation emitted from the sample cell, it
polypropylene film. is recommended that a collimator is used with this cell.

3529 31 mm X-Cell 3561 31 mm Universal X-Cell

P/N 219-85000-52 (100 pcs/set) P/N 219-85000-53 (100 pcs/set)
(Outer diameter: 32 mm; Volume: 8 mL) (Outer diameter: 31.6 mm; Volume: 8 mL)

Mylar Film for Sample Cell Polypropylene Film for Sample Cell
P/N 202-86501-56 (500 sheets/set) P/N 219-82019-05 (73-mm wide, 92-m long)
This film is effective for the trace analysis of light
elements in vacuum and helium atmospheres.

14
Sample Observation Camera** Automatic Collimator**
P/N 212-22750-95 P/N 212-22320
The camera displays an image of the sample to check the analysis Collimator with aperture exchange mechanism in 4 steps of either
position. Images can be stored in files. 1, 3, 5, or 10mm dia.
The energy dispersive type features less attenuation of sensitivity
for a small area than the wavelength dispersive type.
Vacuum Unit
with RP : P/N 212-22460
without RP : P/N 212-22460-01 Helium Purge Unit
(RP : oil rotary vacuum pump) without He gas Cylinder : P/N 212-22495-01
This unit is used for the high-sensitivity analysis of light elements. Used in direct analysis of a liquid sample. By replacing air with a He
Samples must not contain water or oil, and powder samples must atmosphere, X-ray absorption is reduced and sensitivity for light
be pressed before analysis. When analyzing a large number of elements is improved. In addition, it is effective for eliminating Ar
samples, this unit should be used together with a sample turret. peaks.

Hand-Operated Press P/N 044-33101-01

The Hand-operated Press is used to press powder samples into a molding ring using
hydraulic pressure. The pressure value can be read directly from the meter. This press is
used together with disc-shaped compression plates for holding the sample.

Press size 200 × 150 mm

Stroke 150 mm
Weight capacity of plate 0 to 15 tonnes
Compression plates Upper and lower compression plates (P/N 210-15024)
Molding ring Polyvinyl chloride (P/N 212-21654-05, 100 pcs/set)
22 (I.D.) × 3.5 (height) mm
Aluminum (P/N 202-82397-05) Compression-plate heads
24 (I.D.) × 5 (height) mm

P/N Product name Remarks

212-22685-91 Turret Drive Unit** Drives 8/16-sample turrets. Used together with a turret.

212-22354 Solid Sample Holder for Spinner A sample holder for the analysis of a sample less than 52 mm dia.

212-22357 Small Sample Holder for Spinner A sample holder for the analysis of a sample less than 11 mm dia.

212-22656-01 Sample Fixing Jig, 40-mm dia. (for 8-sample turret)

212-22656-02 Sample Fixing Jig, 30-mm dia. (for 8-sample turret)

Use to fix position displacement during turret rotation.
212-22656-03 Sample Fixing Jig, 20-mm dia. (for 8-sample turret)

212-22656-04 Sample Fixing Jig, 20-mm dia. (for 16-sample turret)

212-25276-91 X-ray Pilot Lamp Indicates X-ray exposure.

Note : Items with ** mark are options to be installed at Shimadzu. (Factory option)

EDX Series EDX-720/800HS

Energy Dispersive X-ray Fluorescence Spectrometer 15
 EDX Series EDX-720/800HS

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