. .

Test Object - Device Settings

. . .
Substation/Bay:
Substation: Substation address:
Bay: Bay address:
. . .
Device:
Name/description: RELAY 67 Manufacturer: ARTECH
Device type: ARQ-F213D/PH8AADA/AAA Device address:
Serial/model number: 1830066419
Additional info 1:
Additional info 2:
. . .
Nominal Values:
f nom: 50,00 Hz Number of phases: 3
V nom (secondary): 100,0 V V primary: 20,00 kV
I nom (secondary): 5,000 A I primary: 600,0 A
. . .
Residual Voltage/Current Factors:
VLN / VN: 1,732 IN / I nom: 1,000
. . .
Limits:
V max: 200,0 V I max: 50,00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 3,000 ms Deglitch time: 0,000 s
. . .
Overload Detection:
Suppression time: 50,00 ms
. . .
Other Device Properties:
Drop-out time: 20,00 ms

Test Object - Other RIO Functions

.
CB Configuration
Description Name Value
CB trip time CB trip time 50,00 ms
CB close time CB close time 100,00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20,00 %

Test Object - Overcurrent Parameters

.
General - Values:
TimeTolAbs: 0,04 s VT connection: n/a
TimeTolRel: 5,00 % CT starpoint connection: n/a
CurrentTolAbs: 0,05 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Phase IEC Normal Inverse 0,05 Iref 0,10 0,95 Non Directional

.
Elements - Positive Sequence:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Pos. sequence IEC Definite Time 1,00 Iref 0,10 s 0,95 Non Directional

Test Object - Distance Settings

. . . .
System parameters:
Line length: 1,000 Ω Line angle: 75,00 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 5,000 %
Tol. T abs. +: 50,00 ms Tol. T abs. -: 0,000 s
Tol. Z rel.: 5,000 % Tol. Z abs.: 50,00 mΩ
. . . .
Grounding factor:
kL mag.: 1,000000 kL angle: 0,000000°
Separate arc resistance: no

Zone Settings:
Test Object - Power Settings
. . . .
System parameters:
CT starpoint: Towards line
.
Reference for relative power data:
Reference: Nominal CT*VT
Nominal reference power: 0,000 VA
. . . .
Tolerances:
Tol. T rel.: 5,000 % Tol. S rel.: 5,000 %
Tol. T abs. +: 50,00 ms Tol. S abs.: 50,00 mVA
Tol. T abs. -: 0,000 s Angle tol.: 3,000 °
. . . .
Voltage threshold:
Voltage threshold enabled: No Voltage threshold tol. rel.: 5,000 %
Voltage threshold: 100,0 V Voltage threshold tol. abs.: 5,000 V
Voltage threshold type: Undervoltage
. . . .
Overcurrent threshold:
Overcurrent threshold enabled: No Overcurrent threshold tol. 5,000 %
rel.:
Overcurrent threshold: 1,000 A Overcurrent threshold tol. 250,0 mA
abs.:
Zone Settings:

Hardware Configuration
.
Test Equipment
Type Serial Number
CMC353 LF527E
. .
Hardware Check
Performed At Result Details
20/12/2019 14:19:29 Passed

.
Analog Outputs
Test Equipment Test Object
Device Connector Display Name Connection
Terminal
CMC353 V A 1 V L1-E
LF527E
2 V L2-E
3 V L3-E
N
CMC353 I A 1 I L1
LF527E
2 I L2
3 I L3
N

.
Binary/Analog Inputs
Test Equipment Test Object
Device Connector Display Name Connection
Terminal
CMC353 1+ Trip
LF527E
1-
2+ Bin. in 2
2-
3+ Bin. in 3
3-
4+ Bin. in 4
4-
5+ Bin. in 5
5-
6+ Bin. in 6
6-
7+ Bin. in 7
7-
8+ Bin. in 8
8-
9+ Bin. in 9
9-
 10+ Bin. in 10
10-
1 Bin. in 11
2 Bin. in 12
N

.
Binary Outputs
Test Equipment Test Object
Device Connector Display Name Connection
Terminal
CMC353 1+ Bin. out 1
LF527E
1-
2+ Bin. out 2
2-
3+ Bin. out 3
3-
4+ Bin. out 4
4-
11 Bin. out 5
12 Bin. out 6
13 Bin. out 7
14 Bin. out 8
N

.
Analog DC Inputs
Test Equipment Test Object
Device Connector Display Name Connection
Terminal

Pick Up Arus:

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 42
Total time per test: 4,200 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1; L2; L3 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V L1-E 11,55 kV 11,55 kV
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
V L2-E 11,55 kV 11,55 kV
-120,00 ° -120,00 °
 50,000 Hz 50,000 Hz
V L3-E 11,55 kV 11,55 kV
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
I L1 480,0 A 720,0 A
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
I L2 480,0 A 720,0 A
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
I L3 480,0 A 720,0 A
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
Force abs. Phases No No
Sig 1 From 480,0 A 720,0 A
Sig 1 To 720,0 A 480,0 A
Sig 1 Delta 12,00 A -12,00 A
Sig 1 d/dt 120,0 A/s -120,0 A/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100,0 ms 100,0 ms
Ramp Steps 21 21
Ramp Time 2,100s 2,100s
Trigger Bin Bin
Trigger Logic OR OR
Trip 1 0
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0,000 s 0,000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.10
Test Start: 20-Dec-2019 10:58:45 Test End: 20-Dec-2019 10:58:49
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Trip 0->1 I L1; L2; 600,0 A 612,0 A 30,00 A 30,00 A 12,00 A + 24,60 ms
L3
Drop-off Ramp 2 Trip 1->0 I L1; L2; 600,0 A 576,0 A 30,00 A 30,00 A -24,00 A + 28,70 ms
L3
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Drop-off/Pick- X/Y Drop-off Pick-up 0,9412 o
up
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Ramp1 Ramp2

Sig6
4
5
10
1
2
3
4
5
6
7
8
9
/A
0 IL0
1,1
;L2;L
03
,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 t/s

Bin.out1
4
3
2 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 t/s

.B
B
inin
.in
.T
in1
rip
0
9
8
7
6
5
4
3 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 1,4 t/s
Cursor Data
Time Signal Value
Cursor 1 0,00 s <none> n/a
Cursor 2 1,58 s <none> n/a
C2 - C1 1,58 s n/a

.
All values are
primary
.
Test State:
Test passed
karakteristik:
Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,04 s VT connection: At protected object
TimeTolRel: 5,00 % CT starpoint connection: To protected object
CurrentTolAbs: 0,05 Iref
CurrentTolRel: 5,00 %
Directional: Yes
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Phase IEC Definite Time 1,00 Iref 0,00 s 0,95 Forward

.
Elements - Positive Sequence:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Pos. sequence IEC Definite Time 1,00 Iref 0,10 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 4.10
Test Start: 20-Dec-2019 13:10:07 Test End: 20-Dec-2019 13:10:20
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,000 A
Load angle: n/a
Prefault time: 500,0 ms
Abs. max time: 240,0 s
Post fault time: 500,0 ms
Rel. max time: 100,0 %
Enable voltage output: Yes
Fault voltage LN (for all but two phase faults): 30,00 V
Fault voltage LL (for two phase faults): 51,96 V
Decaying DC active: No
Time constant: n/a
CB char min time: 50,00 ms
Thermal reset active: No
Thermal reset method: n/a
 Thermal reset message: n/a

.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-L2-L3 (---) n/a 6,000 A -105,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A -80,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A -55,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A -30,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A -5,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A 20,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A 45,00 ° 0,000 s 0,000 s 40,00 ms
L1-L2-L3 (---) n/a 6,000 A 70,00 ° 0,000 s 0,000 s 40,00 ms
.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip 1
Bin. in 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2-L3 (---) n/a 6,000 A -105,00 ° 0,000 s 36,50 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A -80,00 ° 0,000 s 36,90 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A -55,00 ° 0,000 s 39,40 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A -30,00 ° 0,000 s 37,40 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A -5,00 ° 0,000 s 37,80 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A 20,00 ° 0,000 s 38,30 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A 45,00 ° 0,000 s 39,70 ms n/a No Passed
L1-L2-L3 (---) n/a 6,000 A 70,00 ° 0,000 s 34,60 ms n/a No Passed
.
Charts for Fault Types:
Type Angle
L1-L2-L3 -105,00 °

°- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 -80,00 °
 °- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 -55,00 °

°- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 -30,00 °

°- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 -5,00 °
 °- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 20,00 °

°- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 45,00 °

°- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
Charts for Fault Types:
Type Angle
L1-L2-L3 70,00 °
 °- 7
0
9 A
,0
91
°+
0 °
0
8
t/s

.
10
11
00
10
1,0
,10
10 6,0 8,0 I/A
10,0 20,0
State:
8 out of 8 points tested.
8 points passed.
0 points failed.

General Assessment: Test passed!

Pick Up Arus:

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 52
Total time per test: 5,200 s
No. of test executions: 1

Input Mode: Direct

Fault Type:

Ramped Quantities
I L1 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V L1-E 11,55 kV 20,00 kV
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
V L2-E 11,55 kV 20,00 kV
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
V L3-E 11,55 kV 20,00 kV
 120,00 ° 120,00 °
50,000 Hz 50,000 Hz
I L1 25,00 A 50,00 A
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
I L2 0,000 A 0,000 A
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
I L3 0,000 A 0,000 A
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
Force abs. Phases No No
Sig 1 From 25,00 A 50,00 A
Sig 1 To 50,00 A 25,00 A
Sig 1 Delta 1,000 A -1000, mA
Sig 1 d/dt 10,00 A/s -10,00 A/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100,0 ms 100,0 ms
Ramp Steps 26 26
Ramp Time 2,600s 2,600s
Trigger Bin Bin
Trigger Logic OR OR
Trip 1 0
Bin. in 2 X X
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0,000 s 0,000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.10
Test Start: 20-Dec-2019 14:05:54 Test End: 20-Dec-2019 14:05:59
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Trip 0->1 I L1 30,00 A 1,500 A 1,500 A x
Drop-off Ramp 2 Trip 1->0 I L1 30,00 A 1,500 A 1,500 A x
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Drop-off/Pick- X/Y Drop-off Pick-up o
up
Assess: + .. Passed x .. Failed o .. Not assessed
Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Ramp1 Ramp2

Sig4
217
3 0/A
2
5 ,0 IL10,25 0,50 0,75 1,00 1,25 1,50 1,75 2,00 2,25
,5 t/s

Bin.out1
4
3
2 0,25 0,50 0,75 1,00 1,25 1,50 1,75 2,00 2,25 t/s

.B
B
inin
.in
.T
in1
rip
0
9
8
7
6
5
4
3
2 0,25 0,50 0,75 1,00 1,25 1,50 1,75 2,00 2,25 t/s
Cursor Data
Time Signal Value
Cursor 1 0,00 s <none> n/a
Cursor 2 2,60 s <none> n/a
C2 - C1 2,60 s n/a

.
All values are
primary
.
Test State:
Test failed
karakteristik:
Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,04 s VT connection: n/a
TimeTolRel: 5,00 % CT starpoint connection: n/a
CurrentTolAbs: 0,05 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Phase IEC Normal Inverse 0,50 Iref 0,10 0,95 Non Directional

.
Elements - Positive Sequence:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Pos. sequence IEC Definite Time 1,00 Iref 0,10 s 0,95 Non Directional

. .
Test Module
Name: OMICRON Overcurrent Version: 4.10
Test Start: 20-Dec-2019 14:36:17 Test End: 20-Dec-2019 14:36:19
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,000 A
Load angle: n/a
Prefault time: 100,0 ms
Abs. max time: 240,0 s
Post fault time: 500,0 ms
Rel. max time: 100,0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50,00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a

.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip 1
Bin. in 2 X
.
State:
0 out of 0 points tested.
0 points passed.
0 points failed.

General Assessment: Test passed!

Pause Module
Mode selection:
Information or instruction

Instruction Text:
rubah set karakter invers menjadi definit

Comment:

User Input:

Test State: Continue

Pick Up Arus:

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 27
Total time per test: 2,700 s
No. of test executions: 1

Input Mode: Direct

 Fault Type:

Ramped Quantities
I L1; L2; L3 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V L1-E 11,55 kV 11,55 kV
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
V L2-E 11,55 kV 11,55 kV
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
V L3-E 11,55 kV 11,55 kV
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
I L1 295,0 A 305,0 A
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
I L2 295,0 A 305,0 A
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
I L3 295,0 A 305,0 A
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
Force abs. Phases No No
Sig 1 From 295,0 A 305,0 A
Sig 1 To 305,0 A 290,0 A
Sig 1 Delta 1,000 A -1000, mA
Sig 1 d/dt 10,00 A/s -10,00 A/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100,0 ms 100,0 ms
Ramp Steps 11 16
Ramp Time 1,100s 1,600s
Trigger Bin Bin
Trigger Logic OR OR
Trip 1 0
Bin. in 2 X X
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0,000 s 0,000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.10
Test Start: 20-Dec-2019 14:25:21 Test End: 20-Dec-2019 14:25:25
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Trip 0->1 I L1; L2; 300,0 A 301,0 A 1,500 A 1,500 A 996,0 mA + 23,00 ms
L3
Drop-off Ramp 2 Trip 1->0 I L1; L2; 290,0 A 291,0 A 1,500 A 1,500 A 996,0 mA + 92,60 ms
L3
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Drop-off/Pick- X/Y Drop-off Pick-up 0,9500 0,9668 0,01680 +
up
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Ramp1 Ramp2

Sig3
2
10
9
/A
1 IL1;L20
2
3
4
5
6
7
8
9
0 ;,2
L3 0,4 0,6 0,8 1,0 1,2 1,4 1,6 t/s

Bin.out1
4
3
2 0,2 0,4 0,6 0,8 1,0 1,2 1,4 1,6 t/s

BB
inin
.in
.T
in1
rip
0
9
8
7
6
5
4
3
2 0,2 0,4 0,6 0,8 1,0 1,2 1,4 1,6 t/s
.
Cursor Data
Time Signal Value
Cursor 1 0,00 s <none> n/a
Cursor 2 1,78 s <none> n/a
C2 - C1 1,78 s n/a

.
All values are
primary
.
Test State:
Test passed

Pause Module
Mode selection:
Information or instruction

Instruction Text:
Rubah set definit menjadi inverse

Comment:

User Input:

Test State: Continue

karakteristik:
Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,04 s VT connection: n/a
TimeTolRel: 5,00 % CT starpoint connection: n/a
CurrentTolAbs: 0,05 Iref
CurrentTolRel: 5,00 %
Directional: No
.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Phase IEC Normal Inverse 0,50 Iref 0,10 0,95 Non Directional

.
Elements - Positive Sequence:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Pos. sequence IEC Definite Time 1,00 Iref 0,10 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 4.10
Test Start: 20-Dec-2019 14:35:37 Test End: 20-Dec-2019 14:35:47
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,000 A
Load angle: n/a
Prefault time: 100,0 ms
Abs. max time: 240,0 s
Post fault time: 500,0 ms
Rel. max time: 100,0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50,00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-L2-L3 I #1 Phase 1,200 3,000 A n/a 3,832 s 2,528 s 7,704 s
L1-L2-L3 I #1 Phase 1,600 4,000 A n/a 1,482 s 1,247 s 1,805 s
.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip 1
Bin. in 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-L2-L3 I #1 Phase 1,200 3,000 A n/a 3,832 s 3,868 s 0,9244 % No Passed
L1-L2-L3 I #1 Phase 1,600 4,000 A n/a 1,482 s 1,497 s 0,9673 % No Passed
.
Charts for Fault Types:
Type Angle
 L1-L2-L3 n/a
t/s

. 1 11
000
10
1,0
,10 3 5 7 1I/A
0 20 30 50
State:
2 out of 2 points tested.
2 points passed.
0 points failed.

General Assessment: Test passed!

Pause Module
Mode selection:
Information or instruction

Instruction Text:
rubah set karakter invers menjadi definit

Comment:

User Input:

Test State: Continue

Pick Up Arus:

Test Settings
.
General
No. of ramp states: 2
Total steps per test: 32
Total time per test: 3,200
No. of test executions: 1

Input Mode: Direct

Fault Type:
Ramped Quantities
I L1 / Magnitude
.
Ramp States
Ramp Ramp 1 Ramp 2
V L1-E 11,55 kV 11,55 kV
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
V L2-E 11,55 kV 11,55 kV
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
V L3-E 11,55 kV 11,55 kV
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
I L1 20,00 A 35,00 A
0,00 ° 0,00 °
50,000 Hz 50,000 Hz
I L2 0,000 A 0,000 A
-120,00 ° -120,00 °
50,000 Hz 50,000 Hz
I L3 0,000 A 0,000 A
120,00 ° 120,00 °
50,000 Hz 50,000 Hz
Force abs. Phases No No
Sig 1 From 20,00 A 35,00 A
Sig 1 To 35,00 A 20,00 A
Sig 1 Delta 1,000 A -1,000 A
Sig 1 d/dt 10,00 A/s -10,00 A/s
Bin. out 1 0 0
Bin. out 2 0 0
Bin. out 3 0 0
Bin. out 4 0 0
dt per Step 100,0 ms 100,0 ms
Ramp Steps 16 16
Ramp Time 1,600s 1,600s
Trigger Bin Bin
Trigger Logic OR OR
Trip 1 0
Bin. in 2 X X
Bin. in 3 X X
Bin. in 4 X X
Bin. in 5 X X
Bin. in 6 X X
Bin. in 7 X X
Bin. in 8 X X
Bin. in 9 X X
Bin. in 10 X X
Step back No No
Delay Time 0,000 s 0,000 s

. .
Test Module
Name: OMICRON Ramping Version: 4.10
Test Start: 20-Dec-2019 14:49:37 Test End: 20-Dec-2019 14:49:41
User Name: Manager:
Company:

Test Results
Assessment Results
Name/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess Tact
Pick-up Ramp 1 Trip 0->1 I L1 30,00 A 31,00 A 1,500 A 1,500 A 996,0 mA + 36,90 ms
Drop-off Ramp 2 Trip 1->0 I L1 30,00 A 29,00 A 1,500 A 1,500 A -996,0 mA + 36,50 ms
Assess: + .. Passed x .. Failed o .. Not assessed

Assessment Statistics
Name Ramp Condition Sig Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Results
Name/ Exec. Calc. X Y Nom. Act. Tol.- Tol.+ Dev. Assess
Drop-off/Pick- X/Y Drop-off Pick-up 0,9500 0,9355 -0,01450 +
up
Assess: + .. Passed x .. Failed o .. Not assessed

Calculation Statistics
Name Calc. X Y Nom. Act.Av. min max Std. Dev. Assess
Assess: + .. Passed x .. Failed o .. Not assessed

Ramp1 Ramp2

Sig13
2
/A
1 IL10,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 t/s
2
3
4
5
6
7
8
9
0

Bin.out1
4
3
2 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 t/s

.B
B
inin
.in
.T
in1
rip
0
9
8
7
6
5
4
3
2 0,1 0,2 0,3 0,4 0,5 0,6 0,7 0,8 0,9 1,0 1,1 1,2 1,3 t/s
Cursor Data
 Time Signal Value
Cursor 1 0,00 s <none> n/a
Cursor 2 1,43 s <none> n/a
C2 - C1 1,43 s n/a

.
All values are
primary
.
Test State:
Test passed

Pause Module
Mode selection:
Information or instruction

Instruction Text:
Rubah set definit menjadi inverse

Comment:

User Input:

Test State: Continue

karakteristik:
Test Object - Overcurrent Parameters
.
General - Values:
TimeTolAbs: 0,04 s VT connection: n/a
TimeTolRel: 5,00 % CT starpoint connection: n/a
CurrentTolAbs: 0,05 Iref
CurrentTolRel: 5,00 %
Directional: No

.
Elements - Phase:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Phase IEC Normal Inverse 0,05 Iref 0,10 0,95 Non Directional

.
Elements - Positive Sequence:
Active Name Tripping characteristic I Pick-up Time Reset Ratio Direction
Yes I #1 Pos. sequence IEC Definite Time 1,00 Iref 0,10 s 0,95 Non Directional
. .
Test Module
Name: OMICRON Overcurrent Version: 4.10
Test Start: 20-Dec-2019 15:14:50 Test End: 20-Dec-2019 15:15:02
User Name: Manager:
Company:

Test Settings:
.
Fault Model:
Time reference: Fault inception
Load current: 0,000 A
Load angle: n/a
Prefault time: 100,0 ms
Abs. max time: 240,0 s
Post fault time: 500,0 ms
Rel. max time: 100,0 %
Enable voltage output: No
Fault voltage LN (for all but two phase faults): n/a
Fault voltage LL (for two phase faults): n/a
Decaying DC active: No
Time constant: n/a
CB char min time: 50,00 ms
Thermal reset active: No
Thermal reset method: n/a
Thermal reset message: n/a
.
Shot Test:
Type Relative To Factor Magnitude Angle tnom tmin tmax
L1-E (---) n/a 500,0 m A n/a 1,003 s 590,2 ms No trip
L1-E (---) n/a 600,0 m A n/a 792,6 ms 525,0 ms 2,177 s
L1-E (---) n/a 700,0 m A n/a 672,9 ms 477,4 ms 1,243 s
L1-E (---) n/a 800,0 m A n/a 594,8 ms 440,8 ms 924,9 ms
L1-E (---) n/a 900,0 m A n/a 539,5 ms 411,7 ms 765,6 ms
L1-E (---) n/a 1,000 A n/a 498,0 ms 388,0 ms 670,2 ms
.
Binary Outputs:
Name State
Bin. out 1 0
Bin. out 2 0
Bin. out 3 0
Bin. out 4 0

Binary Inputs:
Trigger Logic: And
Name Trigger State
Trip 1
Bin. in 2 X
.
Shot Test Results:
Type Relative To Factor Magnitude Angle tnom tact Deviation Overload Result
L1-E (---) n/a 500,0 m A n/a 1,003 s 1,030 s 2,652 % No Passed
L1-E (---) n/a 600,0 m A n/a 792,6 ms 809,1 ms 2,083 % No Passed
L1-E (---) n/a 700,0 m A n/a 672,9 ms 691,1 ms 2,707 % No Passed
L1-E (---) n/a 800,0 m A n/a 594,8 ms 616,4 ms 3,624 % No Passed
 L1-E (---) n/a 900,0 m A n/a 539,5 ms 561,3 ms 4,040 % No Passed
L1-E (---) n/a 1,000 A n/a 498,0 ms 514,0 ms 3,218 % No Passed
.
Charts for Fault Types:
Type Angle
L1-E n/a
t/s

. 1 11
000
10
1,0
,10 0,010 0,100I/A 1,000 10,000
State:
6 out of 6 points tested.
6 points passed.
0 points failed.

General Assessment: Test passed!