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A Proposed Photoelasticity-Based Enhance PDF
A Proposed Photoelasticity-Based Enhance PDF
IAC-15-B3.5.5
Joshua A. Fogel1
University of Southern California, Los Angeles, CA, USA
Millennium Space Systems Inc., El Segundo, CA, USA
Space debris & micrometeor impacts pose a significant threat to the ISS, as evident by the continuous barrage of
damage sustained throughout its operation. Though critical systems have not yet been affected, active
monitoring, damage assessment, repair and recovery options are high priority items in ISS operations. Solar
arrays are especially vulnerable to impacts due to their large deployed area and minimal cover glass protection,
which necessitates routine monitoring of array health. Only direct visual inspection can confirm the full extent
and location of possible cracks, torsions and penetrations. The concept architecture for an Enhanced Visual-
Inspection System (EVIS) for use by astronauts during EVA and IVA is proposed that promises to expand
astronauts’ visual senses. Current MMOD protection and inspection methods employed by astronauts, as well as
a notable inspection and repair EVA, are summarized. The proposed EVIS system is a direct line-of-sight visual
tool that uses simple optical elements to locate abnormal stress and thermal patterns in certain exposed, semi-
transparent materials in real-time. The EVIS concept is comprised of a passive polariscope inspector, with an
active forward looking infrared (FLIR) system for thermal imaging as a future addition. The polariscope
inspector is a simple, low mass device that visualizes induced stress geometry of certain observed components
using birefringence properties of the material via the photo-elastic effect. The process renders a colorful
isochromatic contour map depicting lines of constant shear stress. Trained astronauts may use these stress
signatures to identify distressed components, and characterize anomalous stress gradients indicative of possible
damage. This allows the structural integrity of critical components (such as solar cells, truss structures, panels
and windows) to be verified in-situ. Certain distressed components may be identified prior to failure so that
appropriate action may be taken by the crew. The thermal infrared inspector is a streamlined, low-power device
based on existing FLIR systems that enables quick assessment of the thermal conditions of exposed radiators and
components. Both inspectors are hand-held, and may be attached to the EMU spacesuit through appropriate
hooks and scars. Other potential future enhancements such as robotic inspection platforms and helmet visor
integration are also explored. The EVIS concept promises astronauts advanced situational awareness that
enhances the quality, quantity, and rate of acquisition of visual inspection data during both routine and
emergency operations, with the potential to significantly reduce the duration of inspection EVAs.
11 joshuafo@usc.edu
2 University of Southern California, Los Angeles, CA, USA.
3 Millennium Space Systems Inc., El Segundo, CA, USA.
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66th International Astronautical Congress, Jerusalem, Israel. Copyright ©2015 by Mr. Joshua Fogel. Published by the IAF, with permission and
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• Reduce crew cognitive workload low-to-no power tool will allow trained astronauts to
quickly scan spacecraft components, such as solar arrays
• Ensure crew safety during maintenance tasks and radiators, and interpret a contour map of induced
shear-stress to assess the distressed state of the
To enable faster, more efficient means of data
component. The tool’s capabilities may be extended by
collection during inspection EVAs, the proposed
adding a forward looking infrared (FLIR)-type system
inspection system must adhere to the following
which, at the expense of required electrical power, can be
requirements derived from the NASA guidelines:
used to characterize the thermal conditions of exposed
components.
1. The inspection system must provide quick, in-
situ data acquisition and assessment of
2.2 Solar Cell Inspection via The Photo-Elastic Effect
exterior spacecraft components. This is to
minimize the time spent by the astronaut The photovoltaic manufacturing industry has
inspecting components while on EVA, which identified a demand for a reliable and fast nondestructive
saves mission time, O2 reserves, and prolonged method of detecting residual stress and micro-cracks in
effort by the astronaut. polycrystalline silicon wafers used for mass production of
solar cells [5-7]. During manufacturing verification,
2. The inspection system must require minimal microwave and ultrasound inspection methods are not
training & effort to use while on EVA. Due to sufficient in completely characterizing micro-cracks that
the hazardous environment the astronaut must may develop during wafer processing, such as polishing,
operate in while on EVA, longer, more complex metallization and etching [6]. A proposed method exploits
EVAs increase risk to the astronaut. Reducing the the fact that the residual stress within a silica wafer
complexity of the inspection tool will improve the induces the anisotropy (birefringence) of the optical
rate at which data may be collected, and reduces properties of the material due to the photo-elastic effect[6].
the time needed to conduct the inspection. This As light passes through or reflects off of the wafer, a
includes the time and effort needed to train the polariscope may be used to render a colorful contour map
astronaut in the tool’s use, as the astronaut should with lines of constant shear stress, known as
be able to parse key inspection information from isochromatics, whose geometries correspond to the
the tool in a reasonably short period of time. induced stress gradients.
3. The inspection system must be integrated into The nominal experimental set ups of a transmission
existing EVA architecture, and must not and reflection circular polariscope are shown in Figure 5,
interfere or be hazardous to existing ISS with isochromatic stress maps rendered for various solar
infrastructure. This is to ensure realistic cell specimens in Figure 6. In a circular polariscope set-
implementation in current EVA & ISS operations, up, light is sent through a pair of filters, with
and to minimize incurred safety risks. perpendicular polarization directions, to circularly
polarize the light. The light is then transmitted through a
4. The inspection system must collect data from a photoelasticity-sensitive material (or coating on a
safe distance (defined by the component under component if the object under load is not at least semi-
inspection), and must not interact with the transparent), and passed through another pair of circularly
component in any way that could cause polarizing filters. The birefringence is then rendered
additional damage to the component. As the visible to the observer or camera, thanks to the
inspection tool is intended for use in situations manipulation of the light during transmission through the
where possible damage may exist, to maximize material under load. It should be noted that transmission
astronaut safety, inspection operations should polariscopy is primarily used in solar cell wafer
minimize potentially high-risk situations, i.e. verification in conjunction with infrared lasers, although
placing astronauts too close to or in direct contact reflection polariscopy can be used for evaluating the
with potentially distressed components. quality and integrity of metalized solar cells [6]. Since
5. The inspection system must be low power, low these industrial tests rely on infrared light, post-
mass, and low cost. This is to minimize the processing is needed to generate stress maps that can be
impact of the tool on existing EVA operations used to determine the level of residual stress. Image
(and its storage on-board ISS), as well as to recognition software can also be employed for precise
ensure the development, test, and implementation localization of critical areas or micro-cracks.
of the proposed system on-orbit in a reasonable Leveraging its use in solar cell wafer verification, the
timeframe. photoelasticity-based inspection method may be applied
to in-situ inspection operations during intravehicular
Based on these requirements, an Enhanced Visual- activity (IVA) and EVA. In addition to solar cells, this
Inspection System (EVIS) is proposed which utilizes approach may reveal stress maps of other materials found
photoelasticity to visualize the stress geometry in on the exterior of the ISS, including solar array cover
exposed, distressed, semi-transparent components. The glass, module windows, and possibly semi-transparent
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Figure 7: Preliminary designs of the EVIS Polariscope Inspector with a standard EVA tether hook as per NASA
design guidelines [3] .
Possible
Puncture Damage
a) b)
Figure 9: a) The EVIS Polariscope Inspector secured via standard EVA tether hook, revealing possible MMOD
damage, b) The EVIS Polariscope Inspector secured via 5-DOF “steady-cam” positioning arm. (Credit: NASA)
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experiment to compare with the parameter configurations capability to habitation modules, solar array
derived during the ground test. farms, rover components, and more.
After the successful EVA experiment and
demonstration, the experimental Polariscope Inspector’s The proposed Polariscope Inspector concept is not
design and CONOPS will be revised with the lessons without inherent design limitations, all of which must be
learned during the test. A Phase II Polariscope Inspector addressed to help develop the concept:
will then be used during nominal operations as a powerful
aid to astronauts during in-situ inspection. Further 1. A proof-of-concept is needed. While the concept
development of the tool’s EMU anchoring mechanism, as of using photoelasticity to assess the induced
well as additional inspection attachments and stress conditions of solar cells has been
modifications, will then be developed. successfully implemented by the photovoltaic
industry [5-7], a ground based demonstration is
needed to prove that constructed spacecraft
4. EVIS: Polariscope Inspector Design components produce birefringence phenomena
Assessment under controllable conditions.
2. Lighting conditions and required inspection
4.1 Design Merits and Limitations parameters. Once the proof-of-concept is
The proposed Polariscope Inspector concept has an demonstrated, it must still be shown that an
array of design merits which support previously stated isochromatic stress map can be rendered in real-
NASA goals, and make it a promising tool for current and time with a reasonable set of inspection
future inspection operations: parameters. The strength of the light source
needed to produce birefringence in the observed
1. Information density and inspection speed. The component (restricted by the EMU light capability
Polariscope Inspector provides instantaneous, and solar illumination) must be quantified. The
information-dense snapshots of the stress maximum distances and angles of incidence from
conditions of a component. which stress geometry detail can be resolved in
different components by the astronaut must be
2. Reduces total inspection EVA time and determined. Potential light interference from the
complexity. The ability to capture the induced Sun, Earth & Moon albedo, and artificial sources
stress state at-a-glance allows the astronaut to must be characterized and shown to be
make in-situ characterization and assessment of manageable.
the component. This reduces the complexity and
total time spent on inspection EVA. 4.2 Next Steps
3. Ease of system integration. The simplicity of the As previously mentioned, a proof-of-concept is
tool and minimal impact on existing EVA needed before further development of the Polariscope
architecture makes it an ideal support system that Inspector may proceed. Once the concept is verified, the
can be implemented in current operations in the ground experiment phase may begin. Relevant ISS
near-future. exterior components will be tested for their photoelasticy
4. Ease of use. The simplicity of the tool requires compatibility, and the full set of inspection parameters
little effort to use, and relies on the astronaut’s will be explored in Earth-analogue to develop a
natural Human proclivity for pattern recognition. preliminary on-orbit CONOPS. Next, an IVA experiment
Key isochromatic stress geometries indicative of will be conducted on-board the ISS to validate the tool’s
distress at the presence of cracks and other operation. The full EVA experiment will then be
damage can be easily identified with minimal conducted. An astronaut will perform an EVA to inspect
training. a solar array or other component with a known stress
model for nominal on-orbit conditions. Based on the
5. Powerful capability to have during IVA, series of ground and on-orbit tests, an evolved Phase II
maintenance EVAs, and emergency scenarios. Polariscope Inspector will be developed and used during
The proposed tool offers advanced situational nominal operations as a powerful aid to astronauts during
awareness at little-to-no cost to mass, electrical in-situ inspection. Further development of the tool’s
power, or convenience, which makes it adaptable EMU anchoring mechanism and additional inspection
to any type of on-orbit situation. attachments and modifications will then be conducted.
5. Extensible to surface operations. The
Polariscope Inspector is useful in the planetary 6. Future Enhancement
regime as well. Whether on Earth, the Moon, or
Mars, the proposed tool offers inspection The proposed EVIS concept is designed to be a
flexible architecture. As such, additional inspection
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7. Conclusions
Current MMOD protection and inspection methods
employed by astronauts on-board the ISS have been
described, as well as the emergency EVA during ISS
assembly mission 10A to inspect and repair a damaged
solar array. The concept architecture for an enhanced
visual inspection system based on polariscopy has been
proposed for astronaut EVA and IVA. The proposed
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Acknowledgments
The original concept for EVIS was developed by
Joshua Fogel in the ASTE 527: Space Exploration
Architectures Concept Synthesis Studio course, conducted
by Madhu Thangavelu in the department of Astronautical
Engineering within the Viterbi School of Engineering at
the University of Southern California. The initial version
of the EVIS concept, THEIA, was part of the 2014 fall
team project called Tipping Point: The Future of
Astronaut Activity and Human Spaceflight, the results of
which may be accessed at [9]. The presentation of this
work at the IAC 2015 has been supported by NASA
Research and Education Support Services (NRESS).
References
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[2] Graves, R., “On-Orbit Leak Detection and Repair for
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[3] NASA/SP-2010-3407/REV1 “Human Integration Design
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[4] Oghenekevwe, V., Redmond, S., Hiltz, M., Rembala, R.,
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