Atomic Force Microscopy (AFM):

Source : Size Measurement of Nanoparticles Using Atomic Force Microscopy

Method written by:

Jaroslaw Grobelny, Frank W. DelRio, Namboodiri Pradeep, Doo-In Kim, Vincent A. Hackley, and Robert F.
Cook Ceramics Division Materials Science and Engineering Laboratory National Institute of Standards
and Technology

Height measurements of

NMs were made using the transect analysis using the XEI data processing and analysis 215

software of the microscope (Park Systems Corp., Suwon, Korea). For each sample, a 216

minimum of 200 height measurements were performed, which are sufficient to produce a 217
representative particle size distribution.13 The measured heights were then classified into 218

intervals of 0.5 nm to construct particle size distribution histograms, which was fitted 219 with a log-
normal distribution function as described elsewhere13.

https://pubs.rsc.org/en/content/getauthorversionpdf/C3EM00712J