«2 United States Patent Kato 01035269281 (10) Patent No.: 4s) Date of Patent US 10,352,692 B1 Sul. 16, 2019 (54) SURFACE ROUGHNESS DETERMINATION APPARATUS USING A WHITE LIGHT SOURCE AND DETERMINATION METHOD. (OL) Applicant: PaPaLaB Co, Led, Hamamartsushi Shizwoka (IP) (72) Inventor Makoto Kato, Hamamatsu (1P) (73) Assignee: PAPALAB CO,, LTD., Hamamatsu-shi Py (*) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 USC. 154() by 0 days. (21) Appl. Now 18/899,851 (22) Filed: Feb, 20, 2018 (51) Incr, oie W009 (2006.01) GOLF 900 (2006.01), (Continved) (2) Us.cL cre GOIB 11230 (2013.01); GOIN 21/8806 (2013.01): GO6F 9/3001 (2013.01): GOBT 7700s (2013.01) (58) Field of Classitication Search None ‘ce application file for complete search history. 66) References Cited USS. PATENT DOCUMENTS. 4145.40.42 SDT Goin 1303 386512 158558 A * 1011992 Tanenbaum... GOIN 2057 Mee (Continved) FOREIGN PATENT DOCUMENTS BP Ga07s10 A 1/94 3 DS86556 A ‘9/1986 (Continved) Primary Examiner — Kara E. Geisel Assistant Examiner — Jareas C Underwood (74) Attorney, Agent, or Firm —Brundilge & Stanger, Pe on ABSTRACT Object: An object isto quantify the roughness of a test sure by scallering and dillriction of ilumisition light and to eval fate the matching degree of surfage rougliness separately trom color based on a difference in roughness Solution to Problem. ‘Asurface roughness determination apparatus 1 using 3 white light souree includes an arithmetic processing unit 3 eon- sigured to convert 3-band visual sensitivity images Si, 821 and S3i, which respectively have three spectral sensitivities (SIG), $26.) and 840.) subjected to linear transformation so. o be equivalent to aCTE XYZ color matching function ‘and are obtained from a surfice § by a two-dimensional colorimeter 2 sing the three spectral sensitivities (S1(d), S20.) and $4), ito tstimulus values X, Yand Zina CIE XYZ color system and perform arithmetic operations. This arithmetic processing unit 3 includes a color difference calculator configured to caleulate a color difference AB: a color space histogram distribution crestor configured 10 tvide an examination area of coordinates comesponding t0 ‘color space in the XYZ color system by grids G and respoctvely integrate the mumbers of pixels on a test surface And on 2 reference surface included in each ofthe grids 50 as to create color space histogram distributions in the XYZ color system; a surface roughness index calculator ‘onligured to calculate a surface roughness index M indi- cating difference between the two color space histogram ‘istrbutions of the test surface and the reference surface ‘with oF without an offset coeeecton; a surface roughness measurement data storage unit configured to store 1 mea- sured surface roughness valne Ra actually measured by & rughness meter: and a Function setter configured to sot at (Continved) ‘\ ex na sivat \US 10,352,692 BI Page 2 least one ofa first calibration curve function L1 indicating ($6) Referenees Cited ‘correlation ofthe measured surface roughness value Ra to ‘a surface roughness evaluation index Fst, a second calibra iS eaten DOCUMENTS) of the measured surface row ss value Ra to the surface (382/162. FOREIGN PATENT DOCUMENTS 6 Claims, 39 Drawing Sheets 7 sool-asst A U2001 @ 2006162558 » “4204879 B » 2011-031370 A » 2011-69688 2 2014-03217 & GL) Int. CL » 2ol4os124 A GOIN 21/00 (2006.01) » 2014-149286 Gore 130 (2006.01) @ BoLs-Lece GO6E 9230 (2018.01) P 2018-16964 A Gu6r 700 (201701) Ze eee GIN 2188 (2006.01) * cited by examinerU.S. Patent Jul. 16,2019 Sheet 1 of 39 US 10,352,692 B1 Display unit 7 (Fig. 1U.S. Patent Sul. 16, 2019 Sheet 2 of 39 US 10,352,692 BI Ss S Ss 0.0 400 500 600 700 Wave length (mm) [Fig. 2]U.S. Patent Jul. 16,2019 Sheet 3 of 39 US 10,352,692 B1 29 28a | ees 2a 220° i aay Bb | 4 {fF : i 22a! ! _/ 236 Woo Ls, wow [ Fig. 3A 21 ro 220/226 “27 Fig. 3B } /B 5 i 7 / "y —[fesss ; / 22a, 22b, 22¢ Fig. 3CU.S. Patent Jul. 16,2019 Sheet 4 of 39 US 10,352,692 B1 Tnitatzaton $1 Imaging process. L$ Input process [$3 [Conversion process} $4 Data vansmission -—-$5 —S6 NO YES Ce) Finish? |\ [Fig. 4]U.S. Patent Jul. 16,2019 Sheet 5 of 39 US 10,352,692 B1 Initistzation [S110 Data receiving, |——$120 lconversion process ——§ 130 (Computing process |} —$ 140 Display process |_-§15Q. $160 NO YES [Fig. 5]U.S. Patent Jul. 16,2019 Sheet 6 of 39 US 10,352,692 B1 Set examination | J area K Calculate chromaticity value xy [$142 Create xy chromaticity histogram distribution |~—S143 of reference surface Create xy chromaticity histogram distribution }——S144 of test surface Calculate average | Lab value a Calculate Surface roughness index M | ~—S146 Display-Store-Send |—-S147 [Fig. 6]U.S. Patent Jul. 16,2019 Sheet 7 of 39 US 10,352,692 B1 H2 Hh 7 s s Overlap area D Fig. A Fig. 70 1.0 Minimum distiribution x 0 1.0 Over lap area D Fig. 7B Fig JE 79| 97) 99] 90 Grid G 80) 79/98} 82 65 78) 97/81 ay 63) 7} 96| 86. s 61) 73] 93) 85 Fig 7¢ Fig 7 FU.S. Patent Jul. 16,2019 Sheet 8 of 39 US 10,352,692 B1 Imaging measurement objects 1 to 3 Fig.BA Integrating color information in measurement range Distribution diagram on xy chromaticity diagram of color of 1 to 3 Fig.8B Three-dimensional diagram of integrated data (Z axis corresponds to counting value )U.S. Patent Jul. 16,2019 Sheet 9 of 39 US 10,352,692 B1 [Fig. 9]U.S. Patent Jul. 16,2019 Sheet 10 of 39 US 10,352,692 B1 CstanTD Obtain measured value Ra by roughness meter | S150 Specify first regression coefficient a, second regression coefficient b by S151 Mathematical Expression of miltipie regresion analysis Calculate surface roughtness evaluation $152 index Est by Mathematical Expression with | —~* specified a, b [Fig. 10]US 10,352,692 B1 Sheet 11 of 39 Sul. 16, 2019 U.S. Patent Lealy are ploysasya 1e4/3sed acol~ W xopuy ssouyzno ‘eoegans pue onjen ge} o8esan0) ‘ayeino}e9 1euB1s ON/IO 601U.S. Patent Jul. 16,2019 Sheet 12 of 39 US 10,352,692 B1 t> . S201 (Gat oct examination area K | “Calculate integrated nunber in| {area to be examined) over lap area D of XYZ color ‘ron {mays A: space histogram distribution ‘it aut examination area K ‘rom image B corresponding Calculate surface to inage A index $203 Galculate chronatici ) value XYZ of image AB | Greate XYZ color space | histogram distribution for | examination area K of image LAB by XYZ value [Fig. 12]U.S. Patent Sul. 16, 2019 START 8301 Sheet 13 of 39 ® __- $306 Gut out exmination area K {area to be examined) from image A _$302 Gut out exmination area K | from image 8 corresponding | to image A | 53083 Calculate chronat icity | value Lab of image A,B $304 Calculate integrated number in overlap area D of Lab color space histogram distribution S007 \Calculate surface roughnes: | index RETURN Greate Lab color space histogram distribution for exmination area K of image A.B by Lab value Calculate average Lab value [Fig. 13] ~-$305 US 10,352,692 B1US 10,352,692 B1 Sheet 14 of 39 Sul. 16, 2019 U.S. Patent vb Bd W xopuy ssauysnog toe L_2aesane Aeyasig in xopuy esau. ae 7 wetqo a L sty OBB 10Ae bo 4p) 2010.04) veor 1o¢02~~| oes im = | yun uy sse00u |ssouygino,s 2024 ng) 0sz~ Lo %e—} sz 602 202902: pe <U.S. Patent Jul. 16,2019 Sheet 15 of 39 US 10,352,692 B1 [Fig. 15]U.S. Patent Sul. 16, 2019 Gut out examination area K (area to be examined) frou inage A _S402 Sheet 16 of 39 US 10,352,692 B1 I S408 identify antral coordinate oF AV color space histosran Sistribation in three~dmens ional soece 2 spate) $409 Gut out examination area K fron inage B corresponding Caleulate integrated nunber in to image A verlep area 0 of XYZ color T5a03 space histogram distribution Calculate chromaticity value XYZ of image A,B S410 Greate XYZ color space histogram distribution for examination ares K of image AB by XYZ valu [ calculate surface roughness 2 SHO | index Calculate average AYE value Identify central coordinate in XYZ color space distribution [Offset wz jor space | distribution to one central | coordinate 2 [Fig. 16] ~ $405 $406U.S. Patent Jul. 16,2019 Sheet 17 of 39 US 10,352,692 B1 ott 8501 ® 8508 Git out examination area K | [identify oontral coordinate (area to be examined) af Lab color space historran fom inage A distribution in three-dinensional space (Lab space 78502 a $509 Calculate integrated number in overlap area D of Lab color | space histogran distribution $510 | Calculate surface roughness $604 | index M from image B corresponding Cut out examination area K to image A [ $508 Caiculate chromaticity value Lab of image A,B Greate Lab color space histogram distribution for ‘examination area K of image en A.B bY Lab value Identity central coordinate in Lab color space distribution [~~ $506 ua $505 Offset Lab color space distribution to one central |-—-S507 coordinate @ [Fig. 17]U.S. Patent Jul. 16,2019 Sheet 18 of 39 US 10,352,692 B1 (b) 2 ——>x [Fig. 18]U.S. Patent Jul. 16,2019 Sheet 19 of 39 US 10,352,692 B1 [Fig. 19]US 10,352,692 B1 Sheet 20 of 39 Sul. 16, 2019 0% Bid Peat eee ten eer aH Pape ania nny 000% i SH ate CeCe ney i oer ee ee U.S. PatentU.S. Patent Tul. 16, 2019 Sheet 21 of 39 US 10,352,692 B1 30.000 20.000 50.000 60,000 E Fig. 21 20,000 0.000 000 ®. bit g 4.0000 3.0000 (71) PH an Ba sseuygnos eoesans paanseaKUS 10,352,692 B1 Sheet 22 of 39 Sul. 16, 2019 U.S. Patent % 9605 ee B14 W Xepul sseuygnos seeing 9602 %0E OP %OS %09 MOL 9408 %05 M00 it ogo0'o ov0e't ooo0'z ono0'e o000'» o000's o000'9 (71) PY anjeA ssouyznos soRjans peunseoy,U.S. Patent Tul. 16, 2019 Sheet 23 of 39 US 10,352,692 B1 ee ae os _ Fig. 23US 10,352,692 B1 Sheet 24 of 39 Sul. 16, 2019 U.S. Patent ve 814 ay 000°8t OO0'ST OCOO'YT O00'C? OOD'OT 0008 0009 O00 o00'% d000 _oeeemgcggearcemey OOOO 000% o000'r g000'8 9000's 9000°0T g000'zT (7) BY anjen ssauygnos eoejins peinseoyU.S. Patent Tul. 16, 2019 Sheet 25 of 39 US 10,352,692 B1 10% 20% 30% Fig. 25 40% Surface roughness index M ® 50% 2.0000 0.0000 8.0000 6.0000 4.0000 2.0000 9.0000 (if) ey anjen sseuygno4 aoejing paunseayU.S. Patent Tul. 16, 2019 Sheet 26 of 39 US 10,352,692 B1 ho surface pret oF plane and slave lasliee. —— | i Fine surface profi ie Bae (ele plang std does | 2 Tnot look glare. The gentle slope of vertical a eee ee te. | ay oo eaies Ss oe oe co Ses a Ss nine eee ae | to incroace diffused fiat. It has Httie | 4 a sual colar ae |U.S. Patent Jul. 16,2019 Sheet 27 of 39 US 10,352,692 B1 [Fig. 27]U.S. Patent Sul. 16, 2019 Sheet 28 of 39 US 10,352,692 BI Tape 20-936, Surface revghn [Fig. 28]U.S. Patent Jul. 16,2019 Sheet 29 of 39 US 10,352,692 B1 [Fig. 29]U.S. Patent Tul. 16, 2019 Sheet 30 of 39 US 10,352,692 B1 seer [Fig. 30]U.S. Patent Tul. 16, 2019 Sheet 31 of 39 US 10,352,692 B1 [Fig. 31]U.S. Patent Tul. 16, 2019 Sheet 32 of 39 US 10,352,692 B1 eee (Fig. 32]U.S. Patent Tul. 16, 2019 Sheet 33 of 39 US 10,352,692 B1 [Fig. 33]U.S. Patent Tul. 16, 2019 Sheet 34 of 39 US 10,352,692 B1 [Fig. 34]U.S. Patent Jul. 16,2019 Sheet 35 of 39 qeom US 10,352,692 B1 [Fig. 35]U.S. Patent Tul. 16, 2019 Sheet 36 of 39 US 10,352,692 B1 80% 100% Surface roughness index M Fig. 36 60% 40% 20% % (i) ey enjen sseuygnos eorjins peinseeyUS 10,352,692 B1 Sheet 37 of 39 Sul. 16, 2019 U.S. Patent Le B14 (77) BY enjeA sseuYysnod eoejins peinseey 389 Xepul volzeNjere sseuy%nos eoejingUS 10,352,692 B1 Sheet 38 of 39 Sul. 16, 2019 U.S. Patent ge314 (wi) BY onjeA sseuygnos aoejins painseay s v € z T 0 o az OF og 08 oT OzT (@ N Xepu; ssauysnos aoeyangUS 10,352,692 B1 Sheet 39 of 39 Sul. 16, 2019 U.S. Patent oN ooo'r W X9pu) ssauygino1 eoejans wo4s pau!ego anjeq ey ooo'e 6c 314 ooo oot oooz cose cove cose oo0'r 4ayeu sseuygnod fq painszau an] eA eyUS 10,352,692 BI 1 SURFACE ROUGHNESS DETERMINATION APPARATUS USING A WHITE LIGHT SOURCE AND DETERMINATION METHOD TECHNICAL FIELD. ‘The present disclosure relates wo a surface roughness determination apparatus using a white fight source and 3 determination method, and more specitically relates 19 a ‘determination epparatus configured to evaluate the matching degree of surface roughoess and a corresponding method, BACKGROUND ‘Various techniques have been proposed to polish he small, Jeregularities on surface, for example, a metal surface (pew chemicoat co jp’column/detail_6.huml) “Chemical polishing” ie polishing technique that soaks ‘mot in- polishing solution and causes the surface of the metal tobe corroded by a chemical reaction of un acid or un alkali. The solution spreads into every eomer ofthe metal ‘and thereby enables even a microstrcture which is not reachable hy mechanical polishing to be processed. The ‘chemical polishing technigue is mainly suitable for polish ing, miero-components of complicated shapes and inner surfaces “Electrolytic polishing” is @ polishing technique that soaks a metal in an electlytic polishing soludon and causes ‘current to flo inthe solution with the metal as the positive ‘electrode. The metal is gradually dissolved to have the ‘glossy or smoothencd surface. This technique does not make ‘an altered layer on the surface by processing and does not leave stain or burn. Along with the chemical polishing technique, the eleetolytie polishing technigue is accord- ingly used for precision components ad the ike that reguire «clean polishing teclnigue. “Mechanical polishing” is a polishing technique that uses ‘a machine for polishing and ineludes various methods. The ‘current mainstream is rotary type that applies a polishing pad on a disk-shaped surface plate, drips a liquid polishing gent including a chemical component aad fine particles on the polishing pad and rotates the surface plate to polish an ‘objet, Other polishing techniques include polishing with 3 homing machine o precisely polish an inner diameter of @ rilal object and bull polishing using a bul. ‘Satin finishing. (hpwww chemicoat.cojp/knowledge! ‘dsail_169.html 8 9 surface treatment technique that make ‘smal regularities on the surface ofa metal and provides the rough surface finishing. Satin finishing includes glossy, semirglossy and matte surface finishing. Satin finishing is ted to provide the appropriate surface roughness and Jmprove the appearance, and is additionally used to provide slip resistance against oily hands and pretreatment prior to ccosting or anode oxidation, A processing technique called “scraping” may be performed to provide small irregularities forthe purpose of reducing the frictional resistance on the surface ofa precision machine or the like Satin finishing techniques of @ metal surface are mainly ‘dimensional colorimeter 102 via switch 109 and config tured to receive signals and calculate a surface roughness index M, and a display device 107 comected with the arithmetic processing unit 108 and coafiguted to display the index. ‘As shown in FIG. 1, the arithmetic processing unit 103, includes an operation part 103A configured to calculate @ stimulus value XYZ1 obtained by imaging a reference surface, an operation part 1038 configured to caleulate a ‘tims wale XYZ2 ablained by imaging a surface 105 of 4 product as a teat sfice, and an operation part 103 ‘connected with the operation part 103A and the operation > part 1033 and configured to calculate the surface oughness Index M of the surface 105. An OK signal or an NG signal Jrom the operation part 103C is sent to the display device 107 of to the outside. The switch 109 is operated for selective connection of the operation 103A or operation 103A with two-dimensional colorimeter 102, FIG. 12 isa flowchart showing a process of calculating the surface roughness index M by comparison betwoen ‘chromaticity histouram distributions of two images A and B, AAs shown i FIG. 12, a the start ofthe program, the process ‘cuts out, specifies and sets an examination area K of a test surface from the image A (S201). The process also cuts ut, Specifies and sets an examination area K of a reference srface fom the image F (S202) inthe same manner as that or the image A. The process calculates chromaticity value XYZ of the images A and B (S203). The process subse- ‘quently computes and creates XYZ color space histogram distributions of the lest surface and the reference surface with regard (o the respective examination areas K (S204), ‘and calculates an average value of the chromatiity value XYZ ($205). The process specifies a minimum distin ‘of the XYZ color space histogram distributions and caleu- Jates an integrated umber in an overiap atea D of the XYZ ‘color space histogram dlstrbuions (S206). The surface roughness index M is obtained a surlace roughness index (M-Cintegmited numberof pixels included inthe overlap area iota! number of pixels included in the examination arex K)px100(%). The smaller integrated numbers between TL and T2 are summed up as the integrated number in the ‘overlap area D. The process then calculates the surface roughness index M (S207) and goes to Retum. TIncaleulation of the XYZ distributions ofthe examination areas K, the surface roughness index M is calculated accord- ing to the distributions in the three-dimensional space of X axis, Y axis and Z ais. THXY.2) and T2X.YZ) respec- tively denote histograms ofthe west surface an the reference surface in the XYZ space coordinates. The histogram dis- tribution isin a globeslike shape inthe XYZ,cofor space, The ‘0 histogram distributions may be sterically overlapped with each other or may be sterically separated from each coher. The examination area K in the thrse-dimensional space is divided hy grids G. Chromaticity histogram distri- o 20 butions of THX.Y,Z) and T206Y.Z) an a minimum distr bution are determined in the tee-dimensional space, and the surface roughness index M is calculated. Another pro- cedure may project the integrated numbers HI and H2 ofthe arids Gon a plane and similarly calculate the integrated ‘umber ofthe grids G in the overlap area Don the plane. The XYZ chromaticity histogram distribution does not include information on lightness. The histogram distribution does ‘ot change with a change in lightess of the image in the XYZ space. ‘The flowchart of FIG, 13 is used when Lab color space histograms are used for determination of the sutce rough: ness, in place ofthe XYZ. colo space histograms. The above description of FIG. 12 is applied to the description of FIG. 13, and the corresponding like stop are expressed by like step numbers in 300s, The average Lab value in the exam nation area K of the image A and the average Lab value in the examination area K of the image B are calculated at $308, The Lab chromaticity histogram distribution includes information on lighaess. The histogram distribution changes with a change in lightness of the image Aor the Jmoge B in the Lab spoce. “The follwing descries a surface roughness determina ‘ion apparatus 201 fora surface 208 according to Embodi- meat 3 with reference to FIG. M4. The eortesponding like elements are expressed by the like numerals in 200s, and the dilerences are mainly deseibed. AAs shown in FIG. 14, an objeet of color and roughness termination is a partial area of the surface 208. A two- ‘dimensional colorimeter 202 is used to take an image of an fexamination area K of the surface 205. An anthmetic processing unit 203 includes an operation part 203 con- figured to calculate a Lab value from a stimulus valve XYZ as a eference, an operation part 2038 configured to ealew- Tate a Lab value from a stimulas value XYZ2 as a object of ‘determination, an operation part 203C connected with the ‘operation part 203 and the operation par 20898 and con- figured t calculate an average Lab value, and a surface rghness index M operation part 203D configured to cal- culate a surface roughness index M from the reference Lab value and the object Lab value. The calculated values are sent from the operation parts 203C and 2030 to a roughness processing unit 250. The roughness processing unit 250 checks the index value displayed on the sereen to determine Whether the surface roughness is appropriate aad further performs roughness processing. A switch 209 is provided t0 Selectively connect th operation part 203A or operation part 20383 with the two-dimensional colorimeter 202. The pri- ‘mary processing flow is similar to those of he flowcharts of Embodiments | and 2 and is thus not specifically deseribe. a calculation of the chromaticity histogram distribution of the examination area K inthe Lab space, the XYZ value is converted info a Lab value. The index is calculated ‘according tothe distributions inthe three-dimensional space fof the L axis, the # axis and the hax, The Lal color space istrbution is in an oval spherical shape. UN(L,a.b) and U2(L ab) respectively denote histograms of the test surface and the reference surface inthe Lab space coordinates. The histogram distribution is in globe-like shape in the Lab color space. The two histogram distributions may be seri cally overlapped with eaeh other or may be sterically Separated from each other. The examination area K in the {edimensional space is divided by grids G. Color space histogram distributions of UN¢L.a.b) and U2(L,a.b) and @ sinimmum distribution are determined in. the thre-dimen- sional space, and the surface roughness index M is cale- lated. Another procedure may projet the integrated numbersUS 10,352,692 BI Pr Hi and #12 ofthe grids G on a plane and sinilarly caleulate the integrated number of the grids G in the overlap area D ‘on the plane. The Lab color space histogram distribution includes information om lightness, The L value changes with ‘a change inthe lightness ofthe image A or the image B ia the Lab space. The histograms UI and U2 accordingly shift in postion in the Lab space. Ths ensures determination by taking into account the lightness. This is because the differ- ‘ence in lightness of the image A or the image B shifts the position of the distribution. For example, the Lab color Space histogram distribution is shifted downward with an ‘increase in darkness and is shifted upward with an increase in lightness. ‘There are other applications, The (wo obtained images A. and Bi of the reference surface and the test surface may be superimposed, and their respective chromaticity histogram listibutions may be displayed on the display deviee 7. The respective chromaticity histogram distributions. may_be superimposed on one chromaticity digaram, and the differ ‘ence in color may be specified by the average Lab value, The surface roughness index M showing the roughness of the surface § may be separately determined and displayed in percentage, This configuration enables the regularities and the roughiness ofthe surface to be numerically expressed by 1 difference of the chromaticity distribution of the test surface relative tthe chromaticity distribution of the r= ‘erence surface in the space. The esults of examination may bbe numerically displayed with regard t the respective areas K. The width ofthe grid G may be adjustable, The reference value of the index may be set arbitrarily. The results of measurement and the images A and B may be stored. The ‘configuration reduces the potential problem of individual ‘variation and the potential trouble caused by a difference fom the erterion employed by the elient, which are inevie table in visual examination and achieves standardization for the finishing dagree of surface roughness and stable surface roughness management ‘The following describes a surlace roughness determina tion apparatus and surface roughness determination method using a white light source according to Embodiment 4 with reference to FIG. 15 to FIG, 19. Embodiment 4 ix basically similar to Embodiments 1 to 3, The explanation about the inlar configurations in Embodiments | wo 3 is applicable to Embodiment , Ofet is not used for calculating the surfiee roughness index M in Embodiments 1 to 3. In the cases where the material of the object for calibration data and the material of the two-dimensional object to be measured are same, more accurate roughest data can be obtained because the cali bration data are made from both the parameters of color ‘change and color distribution change. On the other hand, an ‘offset value is used in Embodiment 4, Embodiment 4 is 3 method of obtaining a calibration curve only from the matching degree of the color distribution corrected by an ‘offset Value, when itis not sire ifthe metal material ofthe ‘object to be measured ate the same as the material of the ‘object for the calibra ‘In Embodiments 1103, intrinsic color of the materials are not changed while iregularities are made on metallic mate- rials or composite materials by etching or the like, and accontingly calibration plates made of the same materials fre used, In Embodiment 4, calibration plates made of ‘different materials are used to make a calibration eneve, For ‘example, sold calibration plates as roughness can be used as the calibration 0 o 2 commercially available calibration plates, and when their roughness values are known, thei roughness values can be vsed as Ra values, ‘Surface roughness measurement procedure in. Embodi ment 4 is as follows, (a) Ra values ofthe calibration plates fare measured by a mechanical type roughness meter. (b) Surface roughness index M is calculated. Where, the eale- lation is perfommed without olset correction when the ‘material of the object to be measured is the same as the ‘material of the object for calibration, and the calculation is performed with offset coreecton when the material of the object to be measured is not known ‘When the metallic material of the object to be measured is the same as the material of the object for calibration, color variations (AE, Ab or te lke) are also used as a parameter {or calibration line (curve). On the other hand, when the intrinsic color of the material is not known, a fourth cal bration curve is made ony from the surface roughness index (M (matching degree) with color offset. This isthe added Tunetion as Embodiment 4 Tor the data shown in FIG. 38, a calibration curve of Ra-A(M-B) was set and calculated by using an optional function, Solver of Fxcel (a convenient function of caleu- Jation using least-square method with regard to a set fune- tion) to determine A and B. A was determined to be 62.31 ‘and B was determined to be 18,526. And a calibration curve fof Ra-62.31/(M-I8.526) was thus obtained. Rais actually ‘mechanically. measured value Ra, which is the surface roughness value preseribed by JIS. Ra is measured by a ‘mechanical type roughness mete. Definition is desribod in IS. A and B are calibration eoeticients. The following describes an offset cosrection with refer- cence t0 FIG. 15 to FIG. 19. The process offsets (mape) the entire XYZ colorspace histogram distribution by a deviation AF of the central coordinates, such that one of central ‘oonlinates of two XYZ color space histogram distibutions THKY.Z) and T2X.¥Z) matches with the other central coordinate ($407) as shown in FIG, 16 and FIG. 18. 4 ference in color component is calculated without sch an foflset of one distribution to. the other distibution. The tstrbution may be offset on the graph oF may be offset by calculation. The amount of the offset may be set aypropri- ately. An ollset of one center into 2 predetermined range ‘round the other center has simile elfects as those of an ollset of one center to the other center, There is wordy ‘8 nood to bring the two distabotions loser to each ater by ‘an appropriate amount of offset that enables the roughness to be evaluate, ‘The process identifies central coordinates CL and C2 in the XYZ color space histogram distributions ($406, S408) before and afler the offset process (S407), The central coordinate herein denotes a centroid. (center of gravity) Difference between FIG, 12 and FIG. 16 is inserted three steps of S406 to S408 “The Mowehartshovsn in FIG, 17 is used when using Lab color space histograms shosen in FIG. 19 for surface rough- ress determination instead of the XYZ. color space histo- rams. The above explanation of FIG. 16 is also applicable (OFIG. 17. When using xy chromaticity histograms, offset is performed as shown in FIG. 15. Flowchart for xy chroma- ‘ity histograms is omitted, "The embodiments 1 10 4 described shove have the fal- lowing advantageous effets. The embodiments describe the calculation of the color difference AF) and the surfice roughness index M with regard to (1) average L value average # value and average b value or (2) two values H1Gy) and H2GKy), THOGY.Z) and T2XY.2) or UL)US 10,352,692 BI 23 ‘and U2(L.a.b), The configurations of these embodiments ‘enuble the difference in suraee roughness to be provided: separately from the color. This allows for accurate and prompt evaluation and provides the appropriate guideline for surface finishing by adjustment of the surface roughness. ‘he embodiments allow for determination of small sur- fee roughness having the height of irregularities in the ranometer-order level to the micrometer-rder level and ‘enables the roughness ofs curved surface and the roughaess ‘ofa product having a large ares to be aceurtely determined, While shortening the measurement time “Additionally. accurate measurement of surface roughness becomes possible when the material of an object to be measured are not known, because calculation is performed With the ofset comrection ia such # eae. ‘The surface roughness determination apparatus 1 of the present disclosure was used for measurement ans evaluation ‘of the roughness ofthe surface Sas described in Fxample | to Fxample 3. The present disclosure is deseribed more specifically with reference to these examples buts not Timited to these examples in any sense. The characteristic values were measured and evalsted in these examples as described belo Example 1 (1) Determination Apparatus A deermination apparatus PPLB-200 manufactured by Papal ab Co. Lid. was used. The determination apparatus PLB-200 includes a two-dimensional colorimeter RC-S00. A lighting device DS0 manufactured by Panasonic Compo ration was used for illumination. (Q) Imaging maging was performed with PPLB-200 in a dark oom, ‘The two-dimensional colorimeter used wat a sill image ‘ype. The measurement was performed with the L. value of A white board set to 10. (@) Measurement Range ‘The measurement range of cach sample was the entire mage 4 and the entire image B in Examples 1, 2, and 3 (G) Roughness Meters The roughness meters used in Examples 1, 2 and & were 1 roughness meter FORM TALYSURF (eepistered trade- mark) 120 (AFM contact ype) manufactured by Taylor Hobson Ld, and the roughness meter used ia Example 3 was ‘4 contactless roughness. meter VN-8010 manufactured by KEYENCE CORPORATION, (5) Measurement Items and Results ‘Measurement was performed fora reference surface of a sample and a fest sample. Images A and B of the test sample and the reference sample were taken, and the surface rough- ness index M, AE, and the difleence of the average Lab value of the images A and B were determines. The surface roughness index M is a value obtained without offset of ‘enter coonlinates in a histogram distbution. The differ. fence of average Lab value is equal to (average Lab value of the test sample)-(averige Tab value of the reference sample). A sample having the highest similarity t0 the reference sample with regard to both the color and the surface roughness of the surface 5 was specified according (0 the resus ofthe surfoee roughness index and AF of the ‘measurement results. value AOO that takes into account the human visibility characteristic was used as AE, “The surface roughness index M, Lab, AL, Aa, Ab, and AB were determined with regard to samples 1 and 2 of Example Land sample 3 of Example 2 and sample 4 of Example 3 The surface roughness index M is an index ealeulsted 2 ‘without offsetting of center coordinates in respective histo- ram distributions. Lab denotes a surface roughness index in the Lab coordinates, M denotes a surface roughness index ia the xy coordinates. AL denotes a difference in average L value-(average L value of test sumple)-(average L value of reference sample) AP, Aa and Ab are similarly caleulated. A sample 2 or a sample 3 having the highest smitty to the sample 1 with regard 10 both the color and the surface roughness was specified acconting to the results of the surface roughness index and AE ofthe measurement resulls A value 400 that takes into account the human visibility charaterstc was used as AP. (6) Seting of Calibration Curves Calibration curves between Ra and Est, Ra and AB, Ra ‘and M in Example | and calibration curves between Re and (M, Ra and Bst in Example 3 are calculated according 10 sulliple regression analysis, Example 1 performed multiple repression analysis for evaluation of the roughness in mieron-rder. Example 3 performed multiple regression ‘analysis for evaluation of the roughness in nano-order. ‘With regard tothe calibration curves between Ra and Est the coefficients a and b were set to minimize the eror by the least square method aevording to multiple regression ataly- sis, using Mathematical Expressions 6 and 7 for Bs, ‘xample 1 made evaluation for the roughness of samples ‘of aluminum alloy treated by chemical etching ‘Table 1 and FIG, 20 t0 FIG, 22 show the results of scasurement and calelation ofthe sample 1. FIG. 20 shows the measured surface roughness Value Ra (unit of um) as the abscissa and the surface roughness estimation index Estas the ordinate, and a dotted straight line sth first calibration eure LI. FIG. 21 shows the color difference AB as the abscissa and the measured surface roughness value Ra (uit ‘of um) asthe ordinate, and a dotted straight fine is the second calibration curve L2, FIG. 22 shows the surface roughness jndex Mas the abscissa and the measured surface toughness value Ra (unit of um) as the ordinate, and a dotted straight line is the third calibration curve L3. TABLE 1 Sanle Nols im ae 3% oan ‘The results obtained were 8-0 and b-0.105242, The correlation coefficient of the surface roughness evaluation index Est and the measured surface roughness value Ra Was (0887104. The conelation coofcient ofthe color difference AE and the measured surface roughness value Ra was (04887104. The correlation coeliient of the surface rough- ness index M and the measured surfice roughness value Ra was -0.8377, The total error TotFiro was 5.9516, “The sample 2 of Example 1 was samples of alunioam alloy trated by chemical etching. “Table 2 and FIG, 23 t0 FIG. 28 show the results of measurement of the sample 2 of aluminum alloy and eal- cilation according to Mathematical Expression 6 or the likeUS 10,352,692 BI 25 FIG, 23 shows the measured surface roughness value Ra (unit of pm) as the abscissa and the surface roughness ‘estimation index Est a8 the ordinate, and a dotted straight line is the fist calibration curve LI. FIG. 24 shows the color difference AE as the ahseissa and the measured surface roughness value Ra (unit of un) as the ordinate, anda dotted siruight Tine is the second calibration curve 12. FIG. 28 shoves the surface roughness index M as the abscissa and the measured surliee roughness value Ra (unit of ym) as the ‘ondinte, and a dotted straight line is the third calibration ceurve L3. ABLE 2 Sage No os Ber “The results obtained were 8-0.000893 and b-0.604288, ‘The comelation coeficien ofthe surface roughness eval jon index Fst and the measured surface roughness valve Ra Wat OS496S1. The correlation coellicial of the color difference AF and the measured surface roughness value Ra ‘was 0.849774. The comelation eoeficient of the surface roughness index Mand the measured surface roughness value Ra was ~O8K68S. “The total enor “Totltmo. was 110513, TIG, 23 includes one deviated” point of [Ex-8.352787. Exclusion ofthis point asthe measurement ‘error gives the carelation coeliclent of approximately 0.9, In ables 1 and 2, increasing the etching time of chemical ‘etching ofthe aluminum alloy from No. 110 No, 19 oF from, No, 21 to No. 29 decreases the surface roughness index M and increases AB, Ra and Bst ‘Chemical etching of the aluminum alloy changes the degree of roughness from the orginally at surface 8 vo the rough surface 8, Pnher etching provides various degroes of roughness, for example, forming a hole in the surface 5, Torming a recess on the surface § o forming a eavity under the surfiee 5. Suet various deprees of roughness were ‘evalated accurately Example 1 uses the first calibration eurve L1 tothe third calibration curve L3 to accurately calelste the surface roughness in mieron-onder or in nano-onder, to recognize the appropriate inegolarties, and to reduce defective products by comparison with reference values, For example, when the laminin alloy trated by chemical etching is coated! with resin layer, the resin layer is ikely to peeled off from the lumiinum alloy according to the excess or deficiency of ‘etching. The optimum surface roughness that does not cause the resin layer to be peeled off from te aluminum alloy is ‘determinable by examining the surface § of the aluminum alloy prior © coating of the resin on the aluminum alloy. ‘This configuration prevents the resin layer from being peeled off from the aluminum alloy and ishighly valuable in the industry Example 2 “The measurement positon, the surface roughness index: M, AFOO, AL value, Aa value, Ab value and the like are 0 o 26 shown with regard to the sample 3 that i a resin compones of Example 2. Multiple regression analysis was performed by the same technigue as that of Example 1. Similar results Were obiained, although the description is omitted. The ‘measurement range is within frame lines of the images Aand B. “The sunple 3 shown in FIG, 27 was used for quantifica- tion of the surface roughness caused by a difference in embossing between two different resins PI and P2. “The lighting color temperature was S000 K. ‘The results of evaluation of the sample 3 are shown in PIG. 28, The differences of the Lab value and AE were detected. The surface roughness index (roughness matching degree) was 8S, The thrcedimensional xy_ matching degree xy3D was 93%, The Lab matching degree of P2 relative to PL was 26%. This proves clear diferentiation of the surface roughness. The eolor difference AE was 1.1 AL was 1-532, a was -0.017, Ab was 0.108. The high value of P2 indicates the high lighiness, Aa and Ab indieate Adiflerence in calor ofthe material. xy3D is vale obtained by eomrecting color shift. ‘As shown in FIG. 26, the difereace in “appearance” due to the difference in embossing indicates the difference in reflection du tothe difference in embossed surface profile, ‘The total refletion part strongly rellets the color of ilu rmination and has the high luminance. Acconlingly, the surface profile (1) causes the totaly reflected igh 0 locally enter the eye and looks glare. The surface profile (2) has litle plane and disperses the total reflection direction. This does not look glare and causes color interference and color expansion by combination of various reflections. The sur- fice profile (3) causes the light to be finely and totally difusod and has the low luminance and the averaged color Example 2 uses the surfice roughness index M to recog nize the appropriate irregularities and reduces defective products by comparison with reference values. For example Jn the ease of the embossed surface 5 of resin, a subile change in glaze ofthe surface $ i recogaizable with regard to the deep embossed surface or the shallow embossed surlace, irespective ofthe smal coor difference AE. This is applicable to various aspects, for example, reducing defects of embossing und is highly valuable in te industy. Example 3 Sample 4 of Example 3 shows the example of evaluation of the surface roughness in nano-order with reganl to the ‘metal surface ofthe aluminum alloy. The measured surface roughness value Ra (unit of nm) Was measured by using contactless roughness. meter VN-8010- mamafactured. by KEYENCE CORPORATION, Table 3 shows te results of measurement and calculation of the surface roughness index M, the measured surface roughness value Ra, and the surface roughness evaluation index Fst. Mathematical Expression 7 was used for ealew- Jation in Table 3, FIGS. 29 4038 are three-dimensional CGs showing the surface iregulartes of samples No. 4 to No. 447 with regard to the measured surface roughness valve Ra. FIG. 29 shows the average irepularity of 88.33 nm in the ‘otal arwa ofthe sample No. 41. FIG. 30 shows the average Sneegilarity of 58.83 nm in the total area ofthe sample No, 42, FIG. 31 shows the average irregularity of 88.33 nm inthe total area ofthe sample No, 43, FIG. 32 shows the average ‘regularity of $7.71 nm in the total area ofthe sample No. 44, FIG. 38 shows the average regularity of 93.9 nm in the total area ofthe sample No. 45, FIG. 34 shows the average ‘nregilarity of 112.85 am in the total area of the sample No.US 10,352,692 BI 27 46. FIG. 38 shows the average irregularity of 100.18 nm i the total are ofthe sample No. 47. These Vales are average values of height from the reference surfee and indicate the 28 veasuremeat objets. FIG. 39 shows the graph ofthese data and a calibration curve made using the least-square method. surface distortion ofthe averaged iregulariy. In ascending TABLE 4 ‘order of the sample number ffom the sample No. 41 10 the S Sample No, 47, the etching time is sequentially inereossd, ee ieee and the surface roughness index M decreases and the miniogtfonageea ee measured surface roughness valve Ra inereases, Serle tngee “SEES ‘tpi we Soe NT segineriner meth oe TABLE 3 “Sr © oa ci ar Safes Meme iS ihe the ae siccs “tee i 3 Be 22 ti Ste a See ES, M38 iio setae re ee rior of Ra was not greater than 0.78, and good rest Nod Sau SLUZINTS sr S539 ‘was obtained in Example 4, NOS doe Stas 9 hase The present disclosure isnot mit to the embodiments Note AN wirian 12882408 ae_dasribed above but may be changed, modified and altered a ae ‘without departing from the scope ofthe presen disclosure srr___sinaser Suet modifications and equivalents are also included inthe ‘The results obtained were 2=1.141439 and b=143.1954, “The total error Toto was 940.2347, Example 3 uses the fist calibration curve L1 shown in FIG. 37 and the thd calibration curve L3 shown in FIG. 36 to recognize the appropriate iregularities, evaluate the r= Jace roughness in mino-order and reduce defective products ‘Example 4 is an example to detennine a surface rough- ness of a metallic surface of aluminum alloy in wano-onder Measured surface roughness value Ra (unit of um) is mea sured by a mechanical type roughness meter FORM TALY- SURE (registered tradomark) manufactured by Taylor Hob- son) using metallic roughness standard samples of different ‘materials as calibration plates, It is because it is necessary to calculate values witha corection to offset hase colors when, the metallic intrinsic colors of the roughness standard samples and an object to be measured are different. FIG. 38 shows measurement data ‘When the metallic material ofthe object to be measured js the same as the material of the calibration plates, surface roughness index M without offsets calculated, and Ra value js caleulated from the surface roughness index M. Calibra- tion valves are prescribed in JIS. For example, a ealibration ‘curve is made using the least-square method. ‘When the metallic material ofthe object be measured js not known, surlace roughness index M. with offset cor rection is calculated as described in Embodiment 4, and the surface roughness index M is converted fo Ra value by @ fourth calibration curve. “The fou calibration curve forthe data showin in PIG. 38 ‘was calculated to he Mathematical Expression 9 Ras.) 18525) ote 9) where, Rais measured surface roughness value Ra (arith metically averaged roughness), Mis surface roughness index ‘Measured surface roughness values Ra of the graph shown in FIG. 38 is obtained by measuring diferent rough- ness surfoces of eight kinds of roughness standard samples ‘Table 4 shows Ra values calculated ftom surface rough: ness index M with offset operation using the fourth ealibra- tion curve and Ra values measured by’ roughness meter (FORM TALYSURF (registered trademark) manufactured by Taylor Hobson) using another method, with regard to 6 0 o scape of the present disclosure. The present disclosure may be implemented by various configurations inthe seope ofthe present diselosure. For example, the methods of obtaining the images A and B with the three spectral sensitivities (S19), $202) and $304) described in the above embod ‘ments are only some specific examples. These are not restrictive in any sense. The present disclosure may be ‘implemented by other methods. INDUSTRIAL APPLICABILITY ‘The detemnination apparatus of the present disclosure ‘quantifies the surface roughness by scattering and diffraction of the illumination light and accordingly allows for deter ‘mination extremely close to human visual determination Tiss applicable to evaluation ofthe surface rougliaess tat ‘generally depends on the human vision, The present diselo- Sure is applicable to a wide varity of materials including ‘metals and resins and various surfaces including flat su- ‘aces, curved surfioes and surfaces of complicated shapes. REFERENCE SIGNS LIST 1, 101, 201 surfce roughness determination apparatus 2, 102, 202 two-dimensional colorimeter 21 imaging lens 22a, 226, 22c optical fers 23 imaging element 22a', 26! dichroic mirrors 230, 29, 28¢ imaging elements 26 reflecior 27 filter tort 3, 103, 208 arithmetic processing unit 5, 108, 208 suriace 6, 106, 206 lighting unit 7 display device 109 switch 250 roughness processing unit ‘fist coelicient ' second coefficient A, B images APM atomic foree microseope CA, C2 center coordinates D overlap area AE color diflerenceUS 10,352,692 BI 29 ror err Ex surface roughnets evaluation index G grid IM surface roughness index 1, 12 imegrted numbers K examination area T examination area ‘Tole total emo “The invciton claimed i: 1A surface roughness determination apparams using & wile light source, the apport comprising an imaging device configured to have thee spectral sensitivities (S102), $20). and $322) subjected to linear transformation 50 a8 to be equivalent toa CTE XYZ color matching Tunction and to obtain band sual sensitivity images SUi, $2/ and $2; and an arithmetic processing wit eomected 10 the image device, the athmeti processing unit configured to convert the band vst) sensitivity imoges Si, S2/ ‘and S37 into tristimulus values X, ¥and 2 ina CIE XYZ color system, calculate a color difference AB, divide an examination area of coordinates corespond- ing to eolor space in the CIE XYZ color syst by ids and respectively integrate the numbers of pix- tls on a test surface and on a reference surface included in each of the grids, so as to create color space histogram distributions in the CIE XYZ. color caleulate a surface roughness index M indicating dilference between the 160 color space histogram listibutions of the test surface and the reference surface with or without an offset eorection, store a measured surface roughness value Ra measured by a roughness meter, and set at lest one of a fist calibration curve function indicating a correlation of the measured surface roughnest value Ra toa surface roughness evalua tion index Est, a socond calibration eurve function indicating a correlation of the measured surface roughness value Ra tothe color diferenee AE, third calibration curve funtion indicating » concation of the measured surface roughness value Ra to the surface roughness index M calculated without the ollset correction, ora fourth ealbration curve fune- tion indicating a eoreation of the measured surface ‘roughness value Ra tothe surface roughness index M calculated with the offset correction, fo enable aceu- rate determination of surface roughness 2. The surface roughness determination apparatus using 3 ‘white light soure, seconding to claim 1, ‘wherein the olfet correction is performed by specifying the centers of the two eolor space histogram istibu- tioas of the test surface and the reference surface, and offsetting so as to bring one ofthe eenters ofthe color space histogram disteibutions close to the other center ofthe color space histogram distribution, 3. The surface roughness determination apparatus using 2 ‘white ight sour, acconding to claim 1, ‘wherein the surface roughness evaluation index Est is determined by specifying a fist coeficient with regard to the surface roughness index and a second voefcient 30 With regard tthe color difference, so as to minimize an ‘error between the surface roughness evaluation index stand the measured surface roughness valve Ra. 4. A surface roughness determination method using 3 ‘white light source, the method comprising converting, by an arithmetic processing. unit, 3-band Visual sensitivity images SU, S2i and S3i, which respectively ave three spectral sensitivities’ (S10), $204) and $30.) subjected to linear translormation so 48 to be equivalent to a CIE XYZ color matching Tunetion and are obtained by an imaging device using tho three spoctal sensitivities (S1(A), S20) and S30), ino tristimulus values X, ¥ and Z in a CIE XYZ color system and performing arithmeti operations, calculating, by the arithmetic processing unit, a color difference AB; dividing, by the arithmetic processing unit, an examin tion area of coordinates comesponding to a color space inthe CIE XYZ color system by grids and respectively integrating the numbers of pixels on atest surface and ‘on reference surface inched in each oF the pri, 80 ‘8 10 create colorspace histogram distributions in the CIE XYZ color system: calculating, by the arithmetic processing unit, surface roughness index M indicating a difference between the two color space histogram distributions of the test surface and the reference surface with ee without aa offset correction: storing, by the arithmetie processing unit, a measured surface roughness value Ra measired by a roughness meter, an seting, by the arithmetic processing unit, at least one of ‘frst calibration curve unetion indicating a eorelation fof the measured surlace roughness value Ra to a surface roughness evaluation index Est, a second ca bration curve funtion indicating corelation of the measured surface roughness value Rat the color difference AE, a third calibration curve funtion indi- cating correlation of the measured surface roughness value Ra to the surface rughness index M calculated without the offset corection, or a fourth calibration ‘cure function indicating a correlation ofthe measured Surface roughness value Ra to the surfice roughness index M calculated with de olfet correction, to enable ‘accurate determination of a surface toughness, S$. The surface roughness determination method using a ‘white light souree, according to claim 4, ‘wherein the offet correction is performed by specifying the centers of the two color space histogram distribu- lions ofthe test surface andthe reference surface, and ollsetting so a 1 bring one ofthe centers ofthe color space histogram distributions close to the other center ofthe color space histogram distribution 6. The surface roughness determination method using a white light souree, according to claim 4, ‘wherein the surface roughness evaluation index Est is determined by specifying a fst coefficient with regan to the surface roughness index and a second eoelces ‘with regant to the color difference, so as to minimize an ‘error between the surface roughness evaluation index Fst and the measured surface mughness value Ra