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3028 IEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 44, NO.

12, DECEMBER 2016

Magnetron Sputtering System for Deposition of


Multinanolayered Coatings With Reactive Gas
Activation in Microwave Discharge
A. I. Kuzmichev, Senior Member, IEEE, V. I. Ivashchenko, V. V. Perevertailo, and P. L. Skrynskyi

Abstract— The design of a dual gas magnetron system for ion


sputtering of two source materials with an activation of a reactive
gas in the remote microwave (MW) discharge for the deposition of
multinanolayered coatings is presented. The design of the reactive
gas activator with the electron cyclotron resonance was realized
on the basis of the analysis of possible schemes for the formation
of MW gas discharge plasma systems. The vacuum electron
magnetron is used as a MW generator (2.45 GHz and ∼800 W).
Geometry of the electrodynamic part of the activator was selected
by means of simulation with Comsol Multiphysics. The practical
examination of the dual sputtering system was carried out by
sputtering of Ti and B4 C targets, while nitrogen was used as Fig. 1. Design of MW reactive gas activator (its working position is vertical).
the reactive gas. The characteristics of the multinanolayered 1—plunger. 2—waveguide. 3—MW vacuum magnetron 2M214. 4—quartz
Ti-B-C-N coatings were studied and it was determined that the glass window. 5—discharge chamber. 6—outlet grid. 7—solenoid. 8—PTFE
deposited coatings had the nc-TiN x /(a-BN+a-C) structure. The insert. Magnetron 2M214 is not shown in the right view.
Knoop hardness of the coatings was found to be ∼45 GPa, while
the nanohardness was lower than Knoop ones by ∼20%–30%. gas can be enhanced by exciting and ionizing the reactive
The presented sputtering system could be recommended for gas molecules either in the electric discharge or under ultra-
deposition of wear-resistant and protective coatings. violet irradiation. The activation of the reactive gas may also
Index Terms— Coating, magnetrons, plasma-material- decrease the lower limit of the working gas pressure and the
processing applications, sputtering.
cross-contamination of one magnetron target with sputtered
I. I NTRODUCTION material from the other target. In this paper, we describe a new
microwave (MW) plasma discharge activator of reactive gas

T HE ion sputtering in low-pressure magnetron discharge


allows sputtering of any material and perform the process
in any gas atmosphere for the deposition of oxides, nitrides,
and its employment for a dual magnetron sputtering system.
The advantages of such type of activator are high density of
generated plasma at low gas pressure and possibility to work
carbides, and their combinations [1]. Having a number of without electrodes, which could be destroyed through reaction
advantages, this method successfully competes with such with the chemically active gas.
industrial technologies as electron beam evaporation and
chemical vapor deposition with ion-plasma assistance. The II. D ESIGN AND PARAMETERS OF E LECTRODELESS
combination of several sputtering sources with different tar- M ICROWAVE P LASMA ACTIVATOR OF R EACTIVE G AS
gets [2]–[10] and the alternation of their switch-ON/switch-OFF
There are various approaches for building MW reactive gas
modes allows the deposition of multinanolayered coatings
activators for magnetron sputtering systems [11]–[15]. The
with different composition of individual nanolayers. However,
activators may be classified as those with MW plasma removed
the difference in the chemical interaction of the reactive gas
from sputtering argon discharge plasma or with one common
with different target materials raises the problem for the
plasma generated near the sputtering target simultaneously
stoichiometric deposition of different nanolayer material.
due to energy from MW source and sputtering power source.
To solve this problem, the chemical activity of the reactive
Taking into account the advantages and the disadvantages
Manuscript received July 18, 2016; revised September 2, 2016; accepted of the known engineering solutions, the MW activator of
September 6, 2016. Date of publication September 26, 2016; date of current resonator type with remote plasma has been selected as a rela-
version December 16, 2016. This work was supported by STCU under
Contract 5964. tively simple suitable variant. The electron cyclotron resonance
A. I. Kuzmichev and V. V. Perevertailo are with the Kiev Polytechnic (ECR) mode of the MW plasma discharge has been used, since
Institute, National Technical University of Ukraine, 03056 Kiev, Ukraine it provides high level of gas ionization at low working gas
(e-mail: a.kuzmichev@edd.ntu-kpi.kiev.ua; vladimir_mj@ukr.net).
V. I. Ivashchenko and P. L. Skrynskyi are with the Frantsevich Institute for pressures comparable with ones of magnetron sputtering dis-
Problems of Materials Science, National Academy of Sciences of Ukraine, charge [13]–[15]. As it is known, the high-frequency electric
03142 Kiev, Ukraine (e-mail: ivash@ipms.kiev.ua; petro@ipms.kiev.ua). field is to be orthogonal to the static magnetic field at the ECR
Color versions of one or more of the figures in this paper are available
online at http://ieeexplore.ieee.org. mode. Based on this, the MW electrodeless activator has been
Digital Object Identifier 10.1109/TPS.2016.2607285 designed and fabricated as it is shown in Fig. 1. The vacuum
0093-3813 © 2016 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.

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KUZMICHEV et al.: MAGNETRON SPUTTERING SYSTEM FOR DEPOSITION OF MULTINANOLAYERED COATINGS 3029

Fig. 3. Dual magnetron sputtering system with MW activator of reactive


gas: CS—programmable CS. M1 and M2—sputtering magnetrons (targets
are shown by bold lines). PS1 and PS2—power supplies for sputtering
magnetrons. PSsub —negative substrate bias supplier. S1 and S2—shutters.
Sub—substrate. TC—thermocouple. The location (projection) of the outlet
grid of the gas activator is shown by dashed-dotted line. Magnetic force lines
Fig. 2. Electric field distribution in the MW activator. (a) PTFE insert is above the magnetron targets are shown by thin lines.
absent (H113 wave). (b) PTFE insert is present (H114 wave).

of the H114 wave with the PTFE insert disposed at the front
electron magnetron of 2M214 type is employed for the MW
of the discharge chamber (near the window 4) is shown. The
power generation ( f = 2.45 GHz and W ∼ 800 W). Note, the
diameter of the PTFE insert equals to the inner diameter of
magnetron 2M214 is intended for use in domestic MW ovens.
the discharge chamber 5. The thickness (the length along the
In the cylindrical waveguide 2, the magnetron 2M214
axis) of the insert is of such value that one end of the insert
excites the wave of H11 type propagating toward the discharge
is pressed to the window 4 and the second end is located
chamber 5, which is supplied with a reactive gas (oxygen and
in the cross-sectional plane of the solenoid 7 with maximum
nitrogen). Plasma species from the discharge chamber go out
magnetic field (that is at the mid-height of the solenoid).
into a deposition chamber (not shown in the figure) through the
Thus, the PTFE insert pushes away the gas from the left
holes of the outlet grid 6. Controlling the current of solenoid 7,
side (in Fig. 1) of the discharge chamber 5. Therefore, the
it allows to regulate the operating mode of gas ionization and
interaction of the electromagnetic wave with the reactive gas
activation. The degree of gas ionization, which is used as a
begins at the location of the maximum magnetic field, and
measure of gas activation, is determined by the value of current
then, it continues in the decreasing magnetic field. This design
to an ion collector. The collector (not shown in the figure)
facilitates the penetration of the electromagnetic waves into
is located in the deposition chamber under the outlet grid 6.
the MW discharge plasma due to helicon surface wave excita-
The plunger 1 is used for tuning the resonance. Cooling of
tion [13]. Moreover, the decreasing magnetic field creates an
the magnetron 2M214 is due to air blowing, cooling of the
electromagnetic force pushing the gas plasma together with its
solenoid 7 is due to water cooling, and other parts are cooled
active species toward the region of weaker field, i.e., toward
by passive air cooling.
the outlet grid 6.
The choice of the geometry and the dimensions of the
MW electrodynamic part of the activator was performed by
means of 3-D simulation in Comsol Multiphysics [16]. In the III. M AGNETRON S PUTTERING S YSTEM W ITH MW
activator, the resonator mode of high-frequency oscillations ACTIVATOR OF R EACTIVE G AS
is sustained with the transmission of MW power from the Fig. 3 shows the combination of the MW reactive gas
magnetron 2M214 (from the magnetron pin antenna) to gas activator with two sputtering magnetrons. The sputtering
plasma discharge in the discharge chamber 5 through the magnetrons (M1 and M2) are alternately (or simultaneously)
quartz glass window 4. supplied from two power sources (PS1 and PS2, respectively).
In Fig. 2, the electric field distribution is shown in the Various magnetron power supply modes may be used with:
resonator of the optimum geometry before the initiation of (1) direct current voltage; (2) mid-frequency (or pulse-
the MW discharge. modulated) voltage in kilohertz range (22–880 kHz); (3) radio
One can see the standing waves of the H113 type or the frequency voltage in megahertz range (13.56 MHz). The power
H114 type existing in the resonator, consisting from the cylin- supplies PS1 and PS2 (powered up to 500 W) are controlled
drical waveguide 2, quartz glass window 4, and the discharge by the programmable control system (CS), which provides
chamber 5. In Fig. 2(a), the case of the H113 wave without the desired sequence and duration of working (sputtering)
an additional dielectric polytetrafluorethylene (PTFE) insert periods as well as the values of sputtering discharge power of
within the discharge chamber is shown. In Fig. 2(b), the case each sputtering magnetron for the deposition of coatings with

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3030 IEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 44, NO. 12, DECEMBER 2016

different structures (multilayered, gradient, and so on). When with thicker amorphous layers. The friction coefficient of the
the sputtering magnetrons work alternatively, which could nanolayered coatings changes insignificantly and is about 0.1
make up the pauses of sputtering discharges, the delays of for all samples. The optimum multinanolayered structure with
arising the discharges after the pauses may occur. In order amorphous a-BCN layers formed in titanium nitride coatings
to exclude the delays after pauses (when one sputtering increases the nanohardness from 25 to 35 GPa and Knoop
magnetron is switched-OFF and the other magnetron is to hardness from 35 to 52 GPa. The strengthening of our nanolay-
be switched-ON), auxiliary low-current (20–50 mA) nonsput- ered coatings is similar to that of other nanocomposites, which
tering dc discharges are maintained in each magnetron. The is caused by the prevention of the movement of dislocations
substrate holder is also provided with a thermocouple for by the amorphous layer [18].
measuring the substrate temperature and the power supplier
PSsub for a negative bias voltage to the substrate. V. C ONCLUSION
The microprocessor-based programmable CS regulates and
modulates the electrical power supply of the magnetrons and The dual magnetron sputtering system for the deposition
of the gas inflow activator as well as the value of the negative of nanolayered coatings with the reactive gas activation in
substrate bias accordingly to a technological program. It also the remote MW discharge has been designed. The system
controls the position of shutters and parameters of other parts provides alternating sputtering of two different targets and
of the dual sputtering system. the deposition of multinanolayered coatings. The vacuum
electron magnetron is employed as the MW generator to
IV. E XAMINATION OF THE D UAL M AGNETRON support electrodeless electrical discharge in the gas activator
S PUTTERING S YSTEM W ITH R EACTIVE G AS of the resonator type. The designed magnetron sputtering
ACTIVATION . R ESULT AND D ISCUSSION system has been successfully tested during the deposition of
The test of the developed dual magnetron sputtering system multinanolayered TiN/BCN coatings. The deposited coatings
demonstrated that it is stably operated for long time. The have structures consisting of nanocrystalline TiNx layers and
density of the ion current to the collector at the distance amorphous hexagonallike BN layers with the inclusions of
of 10 cm from the outlet grid was several milliamperes per amorphous sp2 carbon. The a-C phase in the amorphous BN
square centimeter with using nitrogen as the reactive gas at layer improves the mechanical properties of the coatings: the
pressure of 0.1–1.5 Pa. The control of the ion current was nanohardness increases up to 35 GPa and Knoop hardness up
carried out by changing the current of the solenoid and the to 52 GPa. The multinanolayered (nanocomposite) Ti–B–C–N
operation mode of the MW generator. Total examination of coatings deposited at comparatively low substrate tempera-
the dual magnetron sputtering system with gas activation was tures (∼350 °C) could be recommended for employing as
examined in the process of sputtering Ti and B4 C targets wear-resistant and protective coatings.
and the deposition of multinanolayered Ti-B-C-N (TiN/BCN)
coatings onto monocrystalline silicon substrates. The struc- R EFERENCES
ture, chemical composition, and mechanical properties were
[1] J. Musil, J. Vlcek, and P. Baroch, “Magnetron discharges for thin
investigated at different process deposition conditions [17]. films plasma processing,” in Materials Surface Processing by Directed
In this paper, the sputtering currents were 200 mA for Ti Energy Techniques (European Materials Research Society Series),
target and 100 mA for B4 C target, the substrate temperature Y. Pauleau, Ed. Amsterdam, The Netherlands: Elsevier, 2006,
pp. 67–110.
was 350 °C. The negative substrate bias was −50 V, the [2] R. C. Cammarata, T. E. Schlesinger, C. Kim, S. B. Qadri, and
N2 flow values were 4–20 sccm, and the total gas flow of A. S. Edelstein, “Nanoindentation study of the mechanical properties of
Ar + N2 was 20–80 sccm at working gas pressure in the depo- copper-nickel multilayered thin films,” Appl. Phys. Lett., vol. 56, no. 19,
pp. 1862–1864, 1990.
sition chamber ∼0.15 Pa. The multinanolayered Ti–B–C–N [3] P. B. Mirkarimi, L. Hultman, and S. A. Barnett, “Enhanced hardness
coatings consisted of 58 paired layers of TiN and BCN with in lattice-matched single-crystal TiN/V0.6 Nb0.4 N superlattices,” Appl.
total coating thickness of ∼0.5 µm. Phys. Lett., vol. 57, no. 25, pp. 2654–2656, 1990.
[4] X. Junhua, L. Geyang, and G. Mingyuan, “The microstructure and
The measurements demonstrated the following struc- mechanical properties of TaN/TiN and TaWn/TiN superlattice films,”
ture of multinanolayered nc-TiNx /(a-BN+a-C) coatings: the Thin Solid Films, vol. 370, pp. 45–49, Jul. 2000.
Ti–B–C–N coatings consist of nanocrystalline TiNx layers and [5] J. Xu et al., “Structure transformations and superhardness effects in
V/Ti nanostructured multilayers,” Appl. Phys. Lett., vol. 81, no. 7,
amorphous hexagonallike BN layers with the inclusions of pp. 1189–1191, 2002.
amorphous sp2 carbon. Otherwise speaking, TiNx nanocrys- [6] H. C. Barshilia, A. Jain, and K. S. Rajam, “Structure, hardness and
tallites (3.4–6.5 nm) are embedded into the amorphous matrix thermal stability of nanolayered TiN/CrN multilayer coatings,” Vacuum,
consisting of the mixture of boron nitride (a-BN) and amor- vol. 72, no. 3, pp. 241–248, 2004.
[7] P. Sunal, R. Messier, and M. W. Horn, “Reactive co-deposition of
phous carbon (a-C). The hardness and elastic modulus of TiN x /SiN x nanocomposites using pulsed direct current magnetron sput-
the multinanolayered Ti–B–C–N coatings were compared with tering,” Thin Solid Films, vol. 515, pp. 2185–2191, Dec. 2006.
published data and it was confirmed that the a-C phase in the [8] T. An, H. W. Tian, M. Wen, and W. T. Zheng, “Structures and mechanical
properties of TiN/SiNx multilayer films deposited by magnetron sputter-
amorphous BN layer improves their mechanical properties. ing at different N2 /Ar gas flow ratios,” Vacuum, vol. 82, pp. 1187–1190,
Depending on deposition conditions, the nanohardness and 2008.
elastic modulus ranges within 8–35 GPa and 100–420 GPa, [9] V. Stranak, M. Cada, Z. Hubicka, M. Tichy, and R. Hippler, “Time-
resolved investigation of dual high power impulse magnetron sputtering
respectively. Scratch tests showed that adhesion between the with closed magnetic field during deposition of Ti–Cu thin films,”
multinanolayered coatings and substrate is higher for coatings J. Appl. Phys., vol. 108, no. 4, pp. 043305-1–043305-8, 2010.

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KUZMICHEV et al.: MAGNETRON SPUTTERING SYSTEM FOR DEPOSITION OF MULTINANOLAYERED COATINGS 3031

[10] M. Y. Liu et al., “The effect of deposition temperature and work pressure [16] Coaxial to Waveguide Coupling, Solved With COM-
on Ti–B–C nanocomposite coating prepared by multitarget magnetron SOL Multiphysics 5.11, accessed on Sep. 16, 2016.
cosputtering,” IEEE Trans. Plasma Sci., vol. 39, no. 11, pp. 3115–3119, [Online]. https://www.comsol.com/model/download/233441/
Nov. 2011. models.rf.coaxial_waveguide_coupling.pdf
[11] I. G. Brown, Ed., The Physics and Technology of Ion Sources. New York, [17] P. L. Skrinskii et al., “Structural and mechanical properties of TIN/BCN
NY, USA: Wiley, 1989. coatings,” Powder Metallurgy Metal Ceram., vol. 52, no. 1, pp. 73–82,
[12] R. Geller, Electron Cyclotron Resonance Ion Sources and ECR Plasmas. 2013.
Bristol, U.K.: IOP Publ. Ltd., 1996. [18] J. Musil, “Properties of hard nanocomposite thin films,” in Nanocompos-
[13] J. Musil, “Deposition of thin films using microwave plasmas: Present ite Thin Films and Coatings: Processing, Properties and Performance,
status and Trends,” Vacuum, vol. 47, pp. 145–155, Feb. 1996. S. Zhang and N. Ali, Eds. London, U.K.: Imperial College Press, 2007,
[14] J. Asmussen, Jr., T. A. Grotjohn, P. Mak, and M. A. Perrin, “The design pp. 281–328.
and application of electron cyclotron resonance discharges,” IEEE Trans.
Plasma Sci., vol. 25, no. 6, pp. 1196–1221, Dec. 1997.
[15] V. Stranak et al., “Highly ionized physical vapor deposition plasma
source working at very low pressure,” Appl. Phys. Lett., vol. 100,
pp. 141604-1–141604-3, 2012. Authors’ photographs and biographies not available at the time of publication.

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