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Irfl 014 NPBF
Irfl 014 NPBF
IRFL014NPbF
HEXFET® Power MOSFET
l Surface Mount
l Advanced Process Technology
D
l Ultra Low On-Resistance VDSS = 55V
l Dynamic dv/dt Rating
l Fast Switching RDS(on) = 0.16Ω
l Fully Avalanche Rated G
l Lead-Free
ID = 1.9A
Description S
Fifth Generation HEXFET® MOSFETs from International
Rectifier utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This benefit,
combined with the fast switching speed and ruggedized
device design that HEXFET® power MOSFETs are well
known for, provides the designer with an extremely efficient
and reliable device for use in a wide variety of applications.
Notes:
Repetitive rating; pulse width limited by ISD ≤ 1.7A, di/dt ≤ 250A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ ≤ 150°C
VDD = 25V, starting TJ = 25°C, L = 8.2mH Pulse width ≤ 300µs; duty cycle ≤ 2%.
RG = 25Ω, IAS = 3.4A. (See Figure 12)
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IRFL014NPbF
100 100 VGS
VGS
TOP 15V TOP 15V
10V 10V
8.0V 8.0V
7.0V 7.0V
6.0V 6.0V
5.5V 5.5V
5.0V 5.0V
BOTTOM 4.5V BOTTOM 4.5V
10 10
1 1 4.5V
4.5V
D
D
100 2.0
I D = 1.7A
R DS(on) , Drain-to-Source On Resistance
I D , Drain-to-Source Current (A)
1.5
10
(Normalized)
TJ = 150°C 1.0
TJ = 25°C
1
0.5
V DS = 25V
20µs PULSE WIDTH VGS = 10V
0.1 0.0
A A
4 5 6 7 8 9 -60 -40 -20 0 20 40 60 80 100 120 140 160
VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature (°C)
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IRFL014NPbF
350 20
V GS = 0V, f = 1MHz I D = 1.7A
C iss = Cgs + C gd , Cds SHORTED V DS = 44V
C rss = C gd
250
200
Coss 12
150
8
100 Crss
4
50
FOR TEST CIRCUIT
SEE FIGURE 9
0 A 0 A
1 10 100 0 2 4 6 8 10
VDS , Drain-to-Source Voltage (V) Q G , Total Gate Charge (nC)
100 100
OPERATION IN THIS AREA LIMITED
BY R DS(on)
ISD , Reverse Drain Current (A)
10 10
TJ = 150°C 100µs
TJ = 25°C
1ms
1 1
10ms
TA = 25°C
TJ = 150°C
VGS = 0V Single Pulse
0.1 A 0.1 A
0.4 0.6 0.8 1.0 1.2 1.4 1 10 100
VSD , Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V)
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IRFL014NPbF
RD
QG V DS
VGS
10V QGS QGD D.U.T.
RG
+
- VDD
VG
10V
Pulse Width ≤ 1 µs
Charge Duty Factor ≤ 0.1 %
Fig 9a. Basic Gate Charge Waveform Fig 10a. Switching Time Test Circuit
Current Regulator
Same Type as D.U.T.
VDS
50KΩ 90%
12V .2µF
.3µF
+
V
D.U.T. - DS
10%
VGS VGS
3mA td(on) tr t d(off) tf
IG ID
Current Sampling Resistors
Fig 9b. Gate Charge Test Circuit Fig 10b. Switching Time Waveforms
1000
Thermal Response (Z thJA )
100
D = 0.50
0.20
0.10
10
0.05
PDM
0.02
0.01 t
1
1 t2
Notes:
SINGLE PULSE 1. Duty factor D = t /t
1 2
(THERMAL RESPONSE)
2. Peak TJ = PDM x Z thJA + T A
0.1 A
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
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IRFL014NPbF
120
ID
L DRIVER
VDS 80
RG D.U.T +
V 60
- DD
IAS A
20V
tp 0.01Ω 40
VDD = 25V
0 A
25 50 75 100 125 150
V(BR)DSS
Starting TJ , Junction Temperature (°C)
tp
I AS
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IRFL014NPbF
SOT-223 (TO-261AA) Package Outline
Dimensions are shown in milimeters (inches)
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IRFL014NPbF
SOT-223 (TO-261AA) Tape & Reel Information
Dimensions are shown in milimeters (inches)
TR 1.95 (.077)
7.55 (.297)
7.45 (.294)
16.30 (.641)
7.60 (.299) 15.70 (.619)
7.40 (.292)
1.60 (.062)
1.50 (.059)
TYP.
FEED DIRECTION
7.10 (.279) 2.30 (.090)
6.90 (.272) 2.10 (.083)
12.10 (.475)
11.90 (.469)
NOTES :
1. CONTROLLING DIMENSION: MILLIMETER.
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.
3. EACH O330.00 (13.00) REEL CONTAINS 2,500 DEVICES.
18.40 (.724)
NOTES :
MAX.
1. OUTLINE COMFORMS TO EIA-418-1.
2. CONTROLLING DIMENSION: MILLIMETER.. 14.40 (.566) 4
3. DIMENSION MEASURED @ HUB. 12.40 (.488)
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE. 3
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Visit us at www.irf.com for sales contact information. 06/04
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