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A powerful innovative XRF analytical solution
combining performance with flexibility
Centre of Excellence Introducing the X-Supreme8000
For many years Oxford Instruments has been at the centre of The X-Supreme8000 is a compact, powerful, easy to use EDXRF spectrometer
innovative science and its practical application worldwide
The first technology business to come out of Oxford University fifty years ago, Oxford It incorporates an application optimised Oxford Instruments’ This unique best-in-class combination gives highest performance
high reliability X-ray tube and high-performance Silicon Drift with lowest detection limits, and provides a winning integrated
Instruments is world renowned for introducing unique, powerful, yet simple to use
(SDD), or proportional detector. solution for quality assurance and process control requirements.
analytical solutions to a wide range of analysis problems. This continues with the
introduction of the latest X-ray fluorescence spectrometer the X-Supreme8000.
Mining Healthcare
Image: Oxford spires Supreme
technology for
high performance
and flexibility in
XRF analysis
X-Supreme8000 X-Supreme8000
X-Supreme8000 As easy as...
Highlighted area
shows excitation and
detection – FocusSD
X-Supreme Comprehensive analysis
The X-Supreme software provides simplicity of operation for routine analysis,
with flexibility for qualitative, semi-quantitative and full quantitative analysis
• Results obtained using empirical calibrations for • Sample spinner (optional) – reduces errors Rugged and robust design
highest accuracy and traceability. Optional Standardless due to sample preparation, particle size and
(Fundamental Parameter) Analysis where no or very few inhomogeneity
standards are available
• Optional large trays for holding 51.5 mm (2”) • Sealed membrane keypad resistant to dust, oils, solvents etc.
• Rugged and reliable operation diameter steel ring for cement application, or • Internal ‘wind tunnel’ design – cooling fans do not carry dust to
on a 24/7 basis carried out by 47 mm diameter filter samples sensitive internal components Routine Analysis (for production staff) Quality control
laboratory or shift personnel
• Range of Oxford Instruments’ sample holders • Secondary easy-to-change safety window for liquids/powder • Helpful hints for advice on good practice • Monitoring of instrument performance
for easy sample loading analysis protects the instrument in the event of sample leakage • QC sample measurement ensuring high quality analysis • Powerful graphical/numerical QC display
Results – save, print or send! • SMARTCHECK software allowing operation ‘by anyone’ ensures high analytical performance
X-Supreme8000 X-Supreme8000
X-Supreme8000 – Supreme technology for high
performance and flexibility in XRF analysis global
Benefits of analysis by
XRF include:
• Minimal or no sample preparation
• Non-destructive analysis
• Na to U analysis, ppm to high %
11 92
concentration range
• No wet chemistry – no acids, no reagents
• Analysis of solids, liquids, powders,
films, granules etc.
• Rapid analysis – results in minutes
• Qualitative, semi-quantitative, to full
quantitative analysis
• For routine quality control analysis
instrument can be ‘used by anyone’
Electron falls into
the vacant space X-ray fluorescence
Incident X-ray X-rays form part of the electromagnetic X-ray collides with an atom it disturbs this
Secondary X-ray spectrum and are expressed in terms of their stability. An electron is ejected from a low energy
energy (kilo electron volts – keV) or wavelength level (eg K shell: see diagram) and a space is
(nanometers – nm). created. As a result an electron from a higher
energy level (eg L shell) falls into this space.
X-ray fluorescence is a consequence of changes
Portable XRF: Coating thickness: S
that take place within an atom. A stable atom The difference in energy produced as the
X-MET series X-Strata980
comprises a nucleus and the electrons orbiting electron moves between these levels is released
K it. Orbiting electrons are organised into shells: as secondary X-rays which are characteristic
Ejected electron L each shell is made up of electrons with the same of the element. This process is called X-ray
M energy. When a high energy incident (primary) fluorescence.
• Consumables – complete alphabet of products Tel: +1 978 369 9933 Ext. 220
ranging from Aluminium sample cups to Zirconium standards Singapore
Tel: +65 6337 6848
Behind your success
North America
Your investment in our equipment is backed by global and local support of the highest
Concord MA
standards, with the aim of providing a comprehensive support package to ensure your success.
TOLLFREE: +1 800 447 4717
Tel: +1 978 369 9933
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all trademarks and registrations. © Oxford Instruments plc, 2010. All rights reserved. Part no: OIIA/069/A/0510