SURFACE FINISHING AND ITS MEASUREMENTS Ajay Sidpara Mechanical Engineering Department lIT KharagpurLenses, mirrors, ICs, ete.. Optics & electronics Implant, surgical instruments, etc. Material properties Products High fatigue life, toughness, wear resistance, etc. Integration Assembly, mul Channels, nozzles, mixtures, etc. coatings, etc. (flow, pressure drop, etc.) ‘www.interspectrum.eeSurface andtexture * Surface > The boundary that separates an object from another object, substance, or space...” + Texture > The composite of certain deviations that are typical of the real surface. It includes roughness and waviness...” Surface Texture: Why Is It Important Texture is a 'fingerprint' of the whole of the manufacturing proce: > Very sensitive endproduct of along séquence of operations € > Any deviation in’ the manufacture reflects itselfin the texture © If you make sure that the surface texture is within certain bounds ensures similar manufacture > it ensures similar performance of the workpiece. * Rolling * Load Bearing » Friction + Sliding * Cosmetic + Wear * Sealing * Lubricant Retention * Adhesion [Donald K. Cohen, Michigan Metrology, LIC Graham Sith, Industrial Metrology, Springer Whitehouse D J (2978) Proc. Inst. Mech. Eng, 192 179-88Roughness Comprising of irregularities that occur die»tothe mechanism of the material removal process: tool geometry, wheel grit, or the EDM spark Waviness Component of the surface texture upon which roughness is superimposed, resulting from factors such as‘machine or part deflections, vibrations “and. chatter, material strain»ete: Profile The overall shape of the» surface ~ ignoring roughness \and~ wayiness: variations -" is, caused -by efrors \ in machine tool: slideways Graham Smith, InduStril Metiology, Spring____ Gest comparison of surface finishing + What Texture do you need? * How much does it cost? * Tf asmooth surface is the requirement then this takes a A\ significantly longer time toproduce” 1» than an apparently rougher surface. + High surface finish, > hight ry resolution metrology > high cost of: i 7 measuring instrument, ~ PD ‘0 * 3um > 05m i q * 0.5 um 9100 nm / + 100nm> 50 nm ‘ A + 50nm>10 nim Y 7 * 10nm> < Lom e : 0085 O65 01 02 04 08 1632 83 125 250 G00 ‘Ra Value um) Graham Smith, InduStril Metiology, Spring_____Importance of surface irregularities * The shape and size of irregularities on a machined surface have a major impact on the quality and performance of that surface. * The quantification and management of fine surface irregularities is necessary to maintain high product performance. * Differences in these irregularities: impact the quality and function of the surface. * Irregularities affect the performance of the end product in aspects such as fr iction, durability, operating noise, energy consumption and airtightness. Graham Smith, InduStril Metiology, Spring* Early efforts to define surface finish utilized identified reference surfaces with different visual appearances that could be compared for qualitative surface characterization. * Machinists would literally scratch the surface of their parts with their thumbnail and compare them with the reference: * General Electric was an early U.S, developer and supplier of standardized visual standards. * Similar standards produced by Flex-Bar and other manufacturers are still available for purchase.and use. + It was a simple go/no-go procedures + Not data was gathered and no mathematical analysis conducted. * They were subjective (no means of quantifying a surface) Harold McCormick and Ranma ho ofc englierine, jo* Comparison of the capabilities of instrumentation can be achieved by using plots in the amplitude—wavelength plane: orn [ Resolution | eee ae eer ther eee vertical range | geometry || mechanisms erin oF a — Surface fe Amplitude ieee tol : 5 T amplitude T —_, 4 Surface Wavelength 01 @1 Q10fZA00 |} 09 A007 1101001000 ‘om ym, mm wavelength Jiang a, (2007) ProéR, Sac, A2007 463 20722099; DOM 10.1008/rspa.2007.1873 / Donald X. Cohen Michigan Metrology, LiC+ Linear roughness measurement (profile method.type), + Use of a single line on the sample surface. * Roughness in the surface is measured,along an arbitrary straight line * Acontact stylus is commonly used to perform linear measurement ‘etal = bap /ivu photoniclegm/ Arie agp?alo=83301 / WTIR 89-4088 (Surface finish metrology tyuterial)Stylus finite size affects the-accuracy «--¥e.,-~ Path traced by a2.5 jm radius stylus — > Path traced bya 12.5 um radius stylus E\Ay {Whenever a stylus encounters a re-entrant feature the | { stylus tip loses partial contact with the profile and as! League will remove. this feature from the|trace:___j rou reduce the depth of the valleys (11), although the peak height is not affectedHard needle-shaped stylus > oy > is more likely to scratch the 7 Wf monn surface of a soft specimen. With adhesive specimens, .on : > > the other hand, the stylus can attach to the specimen and be Lot damaged when pulled. . A The ‘side of the. stylus (non-measuring surfacey is in ~contact with the component, >Stylus flanking > No useful information about-the surface. Stylus Path hito://onww olympubine cbntfen/mefforeg¥olees0u// Mike Mil, Taylor Hobsoncontours face than the stylus tip diameter. roughness gages cannot measure'micro su Contact surface voces 2.5 um radius stylus ——== Path traced by a 12.5 pm radius stylus U --- Path traced by a ‘corte Suro iLEffect oftraverse speed * Signal frequency depends on the traverse speed. + Measuring fine surface finish > typically.a sharp stylus and slow traverse speed are used. * Slow traverse speed ensures that.the stylus tracks the surface and that the resulting frequencies do not exceed the mechanical and electronic bandwidth of the data acquisitionsystem. Surface Profile Length traced by Electrical Waveform Stylus in 1 Second Graham Smith, India Mtiology, ring______ Separate the waviness and roughness * Procedures needed to calculate surface roughness v Remove the underlying geometry shape ¥ Separate out the waviness and roughness Y Calculate surface roughness. * Filtering surface profiles involves running a "smoothing" filter through the primary data. + Shorter wavelengths fall into the roughness profile. + Longer wavelengths appear in the waviness profile, Waviness profile (red) Waviness profile (ed), ‘Weighted, moving average a \ Waviness: bape x roger TH a 1, gare AM peiegnina ‘i Long cutoff = ‘Short cutoff = . a ‘smooth’ waviness, ‘bumpy’ waviness, 14 shigher roughness ‘smoother roughness Te ei et Gaussiapfiter (ASME and 180 reormmended RAIMA ahead ISO 11562-1992, [S0/TS/16610-21) Roughness profie (lve) Roughness profile (blue) hits. cenit Sucometimsuper/RiuredgeAe/en surface tish-measurement22135______ Sampling and evaluation fength << * Sampling length: The length in the direction-of the x-axis used for identifying the irregularities that characterize the profile under evaluation. * Itimplies that structure in the profile occurring ever, longer lengths will not be applicable in this particular evaluation. + Evaluation length: the total length in the x-axis used for the assessment of the profile under evaluation. Material profile ‘rivers univ J SS Motion SSNS j uation lena. § sampling lengths) inept 4 ‘lon if. ee eee ct rene . “ravers gh ; Graham Smith, India Mtiology, ringBest of cutofflengtn It is used to confine to roughness measurement in the-preSen¢é of waviness. Low cut off value > shorter wavelength on'the surface gets captured * Machining marks are widely spaced > long cutoff’to measure, roughness. Finishing / polishing marks are closely spaced > shorter cutoff to measure + The value of the sampling length is'a compromise. It should be long enough to get a statistically good representation of the surface If it is made too big, longer components of the geometry, such as waviness, will be drawn in if present and included as roughness, Recommended Culvolf (190 4268-1996), > Periodic | Non-Poloa Cavott | sariping > | Poo engthy Profiles | Profi pesop Spano Distance |e my | Ra Gime Voy} 2¢ fm) 3 Saas 5/5 we Tus surface Texture, Surface Roughness, WavinesSand Lay “ASME 646.1 2002 rages pte ita ec tetog eno to A= 6m onset Ae =______Ralaverage roughness) 20,parameter 9 * Why Ra? > “Standard” > Limits of technology/cirga 1930. : * Why Not Ra? ; Z * No spatial structure information 4 / in x WR, = +z * No difference between peaks/Valleys” J wk {zee In some applications theyywill perform very differently as well. Similar profile shape but.different spacing Apr JAA sl “x between features Donald K.Coher, Micon Menlo, ueVisual distortion * The peak-to-valley height of surface roughness is usually found to be small compared with the spacing of the crests * The relative proportions of height and length lead to the use of compressed profile graphs, the nature of which must be understood from the outset. It is essential, to note both magnifications > Fragile peaks and narrow valleys may represent quite gentle undulations on the actual surface. Air , pL tu wQy ™ * To cover a sufficientlength of surface profile without unduly increasing the length of the chart, it is customary to\Use a much lower horizontal than vertical magnification. David_1_ Whitehouse) Handtiodkof sufface Sng Nanonsrolagy 2nd Ed, (2020){allowance | a Surface texture obtained by ahy manufacturing process Surface-texture obtained by material'removal by machining operation Surface texture obtained by WITHOUT removal of material sigar Talat, Hexagon Design céntre / Grandin, smith, dustrial Metrology, Springer 1e Sainpling length Other rou ighness value than Ra . Creuiar Wit EERE EE EEMethod of indicating surface roughness * The latest Indian Standard for method of indicating surface texture on technical drawings suggests the practice.of giving the surface roughness value directly in micron/as Ra value or by grade numbers. * The earlier method of indicating surface roughness through, triangle symbols is now rarely used. vy L / AA Lo a LJ Ww Wt Af NM J fomy SSeS 7 Jigar Tala, Hexagon Design te Roughness valué | Roughness grade | Roughness symbol Ra (um) ‘number 50 rr oy % Nit é “ V 63 47 32 a 16 - OB im 04 re 02 am or as 0.025 NtDirection’of BED measurement L_XGraham Smith, industial Met-logy, Singe3D technique LANKAN Non-contact / contact type . Areal roughness measurement (areal method type) Acquires an area of the surface Confocal microscopy, interferometer, atomic foree microscopy, etc. Surface’s waviness Micro-roughness Wear ability Lubricant retention. Angular direction oftmachi and much more tp /unwn chotoniiacom)Afticleasdx2AiD58301J/Mike Zecchino , Veeco instruments ne.* Itrepresents the profile as a function of level. + Plateau honing is often described as~cutting off the peaks of a rough honed surface to produceva “worn in” surface. * 1 operation > obtain a somewhat coarse finish + 24 operation > improve .the\finish by removing surface peaks but often leaves any..deep_valleys. intact. * Ttleads to a surface texture type. that is often termed a stratified surface. 0 80 100 +A. evaluation iength | Material ratio [%) vrs comSurface form error falls into one of three, overlapping categories. Each category represents a portion of the spatial frequency domain. Poll <= IA. Spatial Frequenéy Relationship 6f Figtire'& Roughness (Frequency baséd desoiptiowof form érrors inmm) PSD MM recekseersI(a errors Low << igs. ——>} — High > ‘SPATIAL FREQUENCY (mm) Brandon Light, Role of SurfateRoughriess In Optical Pérformance, Optimax Systems, Inc. 2012 Richard etal, Specification ‘and Control of, Mid-Spatial Frequency Wavefront Errors in Optical Systemsre only useful for a givel » Multiple devices with overlapping spatial characterize the roughness. ‘Ful spertureinertrometry