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 Measurement Science and Technology

Meas. Sci. Technol. 26 (2015) 085015 (10pp) doi:10.1088/0957-0233/26/8/085015

Fabrication of a current transformer test set

calibrator and its applications
Young Seob Lee1,2, Jae Kap Jung1,2 and Kyu-Tae Kim1,2
1
  Korea University of Science and Technology (UST), Daejeon, Korea
2
  Korea Research Institute of Standards and Science (KRISS), Daejeon, Korea

E-mail: jkjung@kriss.re.kr

Received 3 November 2014, revised 31 May 2015

Accepted for publication 2 June 2015
Published 16 July 2015

Abstract
A current transformer test set (CTTS) calibrator consisting of capacitors and resistors was
fabricated. The calibrator was utilized for the calibration of several commercial CTTSs and
covered a ratio error and phase error range up to  ±10% and  ±10 crad, respectively. From the
calculated and measured values of the corresponding readings, the errors in the ratio and phase
readings are derived. The calibration results for several commercial CTTSs are presented
with the measurement uncertainty and are compared with the specifications provided by the
manufacturer. The absolute uncertainty of a CTTS for both the ratio and the phase for the
entire investigated range was obtained. The absolute uncertainty for the ratio error range of
–0.1% to +0.05% was found to be less than 10   ×   10−6 and the absolute uncertainty of the
phase error range of –0.1 to +0.1 crad was not more than 6 μrad.

Keywords: current transformer, current transformer test set, calibrator, ratio error, phase error,
calibration, measurement uncertainty

(Some figures may appear in colour only in the online journal)

1. Introduction current transformer comparator. They described a calibration

Current transformers (CTs) are normally used in the power
industry for the measurements of high current and power loss
[1–3]. The ratio error and phase error of a CT under testing
are accurately determined using a current transformer test
set (CTTS) by comparing its secondary current with that of
a standard transformer with a higher accuracy level. A CTTS
is a vital piece of equipment for evaluations of both the ratio
errors and phase errors of CTs under testing. Thus, the perfor-
mance of a CTTS should be evaluated to measure the errors of
CTs accurately. Furthermore, CTTSs must be calibrated annu-
ally to maintain traceability to a high current standard.
Research on the calibration of a CTTS is rare except for
our previous study [4], although several papers for CT calibra-
tion and CT comparators exist [5–8]. Franco et al [9] devel-
oped a calibration method for a voltage transformer test set
(VTTS) using digital sampling by employing two commercial
voltmeters. They presented the preliminary calibration results
of a VTTS in a limited error range up to 0.0030% for the ratio
and 2´ for the phase. Kim et al [4] developed a technique
for the evaluation for the ratio error and the phase error of a
method for a current transformer comparator which utilized
the individual components of the capacitor and the resistor
based on the error definition provided by the International
Electrotechnical Commission (IEC) [10].
As an extension of our previous work, we have supple-
mented these studies with, for instance, a complete analysis of
error calculations, the fabrication of a compact calibrator for
a CTTS, and the application of several commercial CTTSs.
A CTTS calibrator consisting of precise capacitors and resis-
tors was developed, which is an error simulator for the ratio
and phase, which works by varying the in-phase and quadra-
ture currents, respectively. Calibration of the ratio error in the
CTTS is performed by varying the parallel capacitor in the
capacitor (CN ), and the capacitor (CX ) connected to the kN and
kX arms, respectively, of the CTTS, whereas the phase error is
calibrated by varying the serial resistor in conjunction with the
resistor and capacitor. This was applied to several commercial
CTTSs. From the calculated and measured values of the cor-
responding readings, the errors from the indicated readings
are derived together with the measurement uncertainty. The
calculations of the ratio error and phase error are based on the

0957-0233/15/085015+10$33.00 1 © 2015 IOP Publishing Ltd  Printed in the UK

Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Figure 2.  A diagram of the system used for the calibration of the
ratio error for negative polarity region of a CTTS.

2.1.  Ratio error calibration

A diagram of the system used for the calibration of the ratio

error for negative polarity of a CTTS is shown in figure  2.
Figure 1.  Schematic diagram to calibrate a CT using a CTTS. The inside of the CTTS is simplified for legibility. The same
voltage (V) is applied to both the kN and kX arms, which are
definitions published by the IEC. The calibration results are connected to CN //CV and CX , respectively.
compared with the specification provided by the manufacturer The primary currents of a standard CT (IN ) and the CT
together with an uncertainty analysis. under testing (IP) are identical assuming that the rated trans-
formation ratio is one; i.e. Kn = 1 and IP = IN . Thus equa-
tion (1) becomes equation (3):
2.  Calibration principle of a CTTS
(I × I )
α(%) = 100 × X N ,
(3)
The system for calibrating a CT under testing by employing a IN
CTTS consisting of a supply transformer, a standard CT, the
CT burden, and the CTTS itself is shown in figure 1. where,
A high ac current is applied to the primary windings of IX : current flow of kX of a CTTS.
both the standard CT and the CT under testing. The currents IN : current flow of kN of a CTTS.
from the secondary windings of each CT flow to the standard The ratio error for negative polarity (αV −) in figure 2 using
winding, NN and under test winding, NX through the kN and equation  (3) is expressed in terms of the capacitance, as
kX , respectively. And the CTTS measures the difference in follows:
the secondary currents between the standard CT and the CT
⎛ CX ⎞
αV −(%) = ⎜ − 1⎟ × 100.
under testing by using detection winding ND. The result value
⎝ CN + CV ⎠
(4)
of detection is processed by a microprocessor and displayed
and the number of digits of displayed value can be controlled
To determine the effect of a variable capacitor CV on the
by a keyboard.
ratio error, we should consider the offset effect caused by
According to the IEC, the ratio error (α) and phase error ( β)
the cable impedance and input impedance of the CTTS. To
of a CT are defined by the following equations [10]:
measure the offset in figure 2, CV should be removed from the
(Kn ⋅ Is − Ip ) circuit. From equation (4), the ratio error for the offset point
α(%) = 100 ×
(1) of negative polarity (α0−) is given as follows:
Ip
⎛C ⎞
α0−(%) = ⎜ X − 1⎟ × 100.
⎝ CN ⎠
β (crad) = βs − βp.
(2) (5)

Here, The ratio error for negative polarity (α−) at the corre-
Kn: rated transformation ratio. sponding calibration point is obtained by subtracting the offset
Ip: actual primary current of the CT under testing flowing kX measurement (α0 −) from measurement (αV −), as follows:
of the CTTS.
Is: actual secondary current of the CT under testing flowing −CX CV
α−(%) = αV − − α0 − =
(6) × 100.
kX of the CTTS. CN (CN + CV )
βp: primary current vector of the CT under testing flowing kX
of the CTTS. Because we could measure the capacitance values of CN , CX
βs: secondary current vector of the CT under testing flowing and CV , we can obtain the calculated value of the ratio error of
kX of the CTTS. the negative region using equation (6).

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Figure 4.  A diagram of the system used for the calibration of the
Figure 3.  A diagram of the system used for the calibration of the phase error for negative polarity region of a CTTS.
ratio error for positive polarity region of a CTTS.

On the other hand, the calibration of the ratio error for the pos-
itive polarity of the CTTS is performed by interchanging the con-
nections between kN and kX from figure 2, as shown in figure 3.
Using equation (3), the equation for the calibration point’s
ratio error for positive polarity (αV +) is obtained as follows:
⎛ C + CV ⎞
αV +(%) = ⎜ N − 1⎟ × 100.
⎝ CX ⎠
(7)

To obtain the offset of figure 3, CV must also be removed

from the circuit. From equation  (7), the ratio error for the
offset point of positive polarity (α0+) is given as follows:
Figure 5.  Phase diagram of the current flowing at two terminals of
⎛C ⎞ the CTTS in the negative polarity region.
α0 +(%) = ⎜ N − 1⎟ × 100.
⎝ CX ⎠
(8)
i.e. βP = βN . Thus, equation (2) is changed, as follows:
The ratio error for positive polarity (α+) at the corre- β (crad)  = βX − βN .
(10)
sponding calibration point is obtained by removing the offset
measurement (α0 +) from measurement (αV +), as follows: Here,
βX : the phase of the current vector at the kX arm in the CTTS.
C βN : the phase of the current vector at the kN arm in the CTTS.
α+(%) = αV + − α0 + = V × 100.
(9)
CX
The vector diagrams shown in figure  5 are intended to
The subscripts  −  and +, as shown in equations (6) and (9), describe the phase error of the currents flowing to both input
indicate the negative and positive polarity, respectively, which terminals of the CTTS.
means signs of ratio error. The value of βX could be obtained using the Taylor series
Because we already know the capacitance values of CN , CX expansion, as follows:
and CV , we can obtain the calculated value of the ratio error
⎛ Vr ⎞
of positive polarity using equation (9). Therefore, we obtained βX = tan -1⎜ X ⎟
the ratio error of both polarities by comparing the calculated ⎝ VCX ⎠
values with the measured values.  = tan−1(ωCX r X )
(ωX CX r X )3 (ωX CX r X )5
2.2.  Phase error calibration = ωX CX r X − + − ⋅ ⋅ ⋅. (11)
3 5
The diagram of the system for the calibration of the phase In equation (11), higher order terms above the second term
error for negative polarity is shown in figure 4. The inside of are less than 1 × 10−6. Thus, we could neglect higher terms.
the CTTS is simplified for legibility. The variable resistor RV , Likewise βX , the value of βN could also be obtained as follows:
the cable impedance rN , and CN connected in a series go to the
⎛ Vr ⎞
kN arm of the CTTS. The cable impedance r X connected to CX βN = tan−1⎜ N ⎟
in a series goes to the kX arm of the CTTS. ⎝ VCN ⎠
Assuming that the standard CT has no phase error at the = tan−1(ωCN (rN + RV ))
unity rated transformation ratio, the phase of the primary cur- (ωCN (rN + RV ))3 (ωCN (rN + RV ))5
rent at the CT under testing is identical to the phase of the = ωCN (rN + RV ) − + − ⋅ ⋅ ⋅.
3 5
primary current at the standard CT, (12)

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

In equation (12), we could neglect higher order terms larger

than third-order term because they have values of less than
1 ppm. Thus, equations  (11) and (12) are expressed, respec-
tively, as follows:
βX ≅ ωCX r X
(13)

(ωCN (rN + RV ))3

βN ≅ ωCN (rN + RV ) −
(14) .
3
According to equation  (10), the calibration point’s phase
error for the negative polarity for a CTTS ( βV −) is given as
follows:

βV −  (crad) = βX − βN
 ⎛ (ωCN (rN + RV ))3 ⎞
Figure 6.  A diagram of the system used for the calibration of the
  ≅ ωCX r X − ⎜ωCN (rN + RV ) − ⎟. phase error for positive polarity region of a CTTS.
⎝ 3 ⎠
(15)
Equation (15) is used to obtain the calculated phase error
of negative polarity.
To obtain the offset of figure 4, RV should be shorted from
the circuit. From equation (15), the phase error for the offset
point of negative polarity ( β0−) is given as follows:
(ωCN rN )3
β0 −(crad)  ≅ ωCX r X − ωCN rN +
(16) .
3
The phase error at the calibration point in the negative
region is obtained by subtracting the offset measurement ( β0−)
Figure 7.  The circuit of the CTTS ratio calibrator with negative
from the measurement ( βV −), as follows: polarity.
β−(crad) = βV − − β0 −
polarity. The internal structure is composed of a capacitor CN ,
 (ωCN RV )3 with a nominal value of 10 uF; a capacitor CX , with a nominal
≅ −ωCN RV + . (17)
3 value of 10 uF; and variable capacitors CV consist of seven
Meanwhile, the calibration of the phase error for posi- capacitors ranging from 0.119 24 nF to 1000.27 nF. The vari-
tive polarity is performed by interchanging the connections able capacitors connected in parallel to CN could be selected by
between the kN and kX terminals from figure  4, as shown in nine toggle switches to obtain the desired calibration points.
figure 6. The ratio error at positive polarity could be measured by
Due to the interchange of the connections, we could obtain interchanging the kN and kX . The principle of calibration for
the calculated value of the positive phase error by reversing both polarities was mentioned in the previous section. With
the sign of equation (17), as follows: the method mentioned in the previous section, we could
measure the ratio error range up to  ±10% by varying the CV
(ωCN RV )3 value with the switches. The precise values of the capacitors
β+(crad) ≅ ωCN RV −
(18) .
3 in figure 7 are shown in table 1. The values of the capacitors in
The subscripts  −  and +, as shown in equations  (17) and table 1 are measured using a known commercial capacitance
(18), indicate the negative and positive polarity, respectively, bridge at 100 V and 60 Hz.
which means signs of phase error.
Because we measured the capacitance of the capacitor, 3.2.  Design of the phase error calibrator
CN , CX and the resistance of resistor RV , we could calculate
the phase error at both polarities. Therefore, we obtained the Figure 8 shows the internal structural layout of the capacitors
phase error in both polarities by comparing the calculated and resistors (CN , CX , RV ) for the calibration of the phase error.
values with the measured values. The internal structure is composed of a capacitor CN , with a
nominal value of 10 μF; a capacitor CX , with a nominal value
of 10 μF; and variable resistor RV , consisting of nine resistors
3.  Design and fabrication of the CTTS calibrator
ranging from 0.0361 Ω to 26.989 Ω. The variable resistors
3.1.  Design of the ratio error calibrator
connected in a series to CN could be selected by seven toggle
switches to obtain the desired calibration points.
Figure 7 shows the internal structural layout of the capacitors The phase error at positive polarity could be measured by
(CN , CX , CV ) used for the calibration of the ratio error at negative interchanging the kN and kX . The principle of calibration in

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Table 1.  The values of the capacitor component of the CTTS ratio
calibrator.
Capacitors Measured capacitance (nF)
CN 9933.07
CX 9933.90
C1 0.11924
C2 0.51998
C3 1.0213
C4 5.0283
C5 10.017
C6 50.006
C7 100.046
C8 500.724
C9 1000.27

Figure 9.  Front panel and overall shape of the fabricated error
CTTS calibrator.

An external voltage of 100 V was applied to the input voltage

terminals, V~, located on the left side at the bottom of the
front panel. The output terminals, KN , LN , KX and LX , located
at the bottom of both error parts, are connected to the input
terminals of the CTTS.

4.  CTTS calibration example

The CTTS calibrator was normally fabricated for the cali-

bration of a CTTS ranging from 0.1 to 0.5 A. In this paper,
Figure 8.  The circuit of the CTTS phase calibrator with negative
polarity. the calibration was performed by applying 0.5 A at 60 Hz in
ratio error and phase error ranges up to  ±10% and  ±10 crad,
Table 2.  The values of the variable resistor component of the CTTS respectively. For an evaluation of the ratio error with negative
phase calibrator. polarity, a two-step process was used. For the measurement
Resistors Resistance (Ω) of the offset, the switches had to be opened. After the offset
measurement, the ratio error was measured while varying
R1 0.0361 the capacitance of the capacitor CV in the range of 0.11924
R2 0.1359 to 1000.27 nF using the toggle switches. The measured value
R3 0.2717 was obtained by subtracting the offset measured value from
R4 1.3559
the value measured when CV was connected.
R5 2.6808
The calculated value for the ratio error as a function of CV
R6 13.431
R7 26.989 at negative polarity is attained by equation  (6), as shown in
the second column of table 3(a). The measured results for the
ratio error are presented in table 3(a) together with the error
both polarities was mentioned in the previous section. With for the CTTS. The fourth column of table 3(a) indicates the
the method mentioned in the previous section, we could difference between the calculated and the measured values.
measure the phase error range up to  ±10 crad by varying the The difference in ratio was found to be less than 40   ×   10−6
RV value. The values of the resistors in figure 8 are shown in up to the overall negative ratio error region, except for the
table 2. The values of the resistors in table 2 are also measured calculated ratio error of  −9.15%, for which the corresponding
using a known commercial digital multimeter. absolute error is 0.01%.
The fabricated CTTS calibrator is shown in figure 9. The Likewise the negative polarity, the evaluation of the posi-
left and right sides of the front panel correspond to the ratio tive polarity is performed in the same manner after inter-
and phase calibration, respectively. The variable capacitor changing the kN and kX terminals. The calibration results in
switches used for the ratio error calibration process are located the positive polarity region are displayed in table  3(b). The
on the left side of the front panel. The two switches under errors in the ratio were found to be less than 10   ×   10−6 up to
the variable switches are the polarity and offset switches. The the overall positive ratio error region, except for the calculated
variable resistor switches used for the phase error calibration ratio error of 1.007%, for which the corresponding difference
process are located on the right side of the panel. The polarity in error was 0.004%.
and offset switches are also located there. In the middle of the To evaluate the phase error with negative polarity, a two-
panel, the measuring terminals of CN and CX could be found. step process was also used via the switch, SN . To measure the

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Table 3.  (a) Calibration results of the ratio error at negative polarity for CTTS A. (b) Calibration results of the ratio error at positive
polarity for CTTS A.
(a)
Ratio error (%) Difference in ratio error (%)
Capacitance (CV ) (nF) Calculated Measured KRISS
0.11924 −  0.0012 −  0.0012 0.0000
0.51998 −  0.0052 −  0.0052 0.0000
1.0213 −  0.0103 −  0.0103 0.0000
5.0283 −  0.0506 −  0.0506 −  0.0001
10.017 −  0.1007 −  0.1008 −  0.0001
50.006 −  0.501 −  0.502 −  0.001
100.046 −  0.997 −  1.001 −  0.004
500.724 −  4.80 −  4.80 0.00
1000.27 −  9.15 −  9.14 0.01
(b)
Ratio error (%) Difference in ratio error (%)
Capacitance (CV ) (nF) Calculated Measured KRISS
0.11924 0.0012 0.0012 0.0000
0.51998 0.0052 0.0053 0.0001
1.0213 0.0103 0.0103 0.0000
5.0283 0.0506 0.0506 0.0000
10.017 0.1008 0.1009 0.0001
50.006 0.503 0.504 0.001
100.046 1.007 1.011 0.004
500.724 5.04 5.04 0.00
1000.27 10.07 10.07 0.00

Table 4.  (a) Calibration results of the phase error at negative polarity for CTTS A. (b) Calibration results of the phase error at positive
polarity for CTTS A.
(a)
Phase error (crad) Difference in phase error (crad)
Resistance (RV ) (Ω) Calculated Measured KRISS
0.0361 −  0.0135 −  0.0134 0.0001
0.1359 −  0.0509 −  0.0505 0.0004
0.2717 −  0.1018 −  0.1017 0.0001
1.3559 −  0.508 −  0.509 −  0.001
2.6808 −  1.004 −  1.010 −  0.006
13.431 −  5.03 −  5.04 −  0.01
26.989 −  10.07 −  10.09 −  0.02
(b)
Phase error (crad) Difference in phase error (crad)
Resistance (RV ) (Ω) Calculated Measured KRISS
0.0361 0.0135 0.0136 0.0001
0.1359 0.0509 0.0509 0.0000
0.2717 0.1018 0.1025 0.0007
1.3559 0.508 0.510 0.002
2.6808 1.004 1.011 0.007
13.431 5.03 5.04 0.01
26.989 10.07 10.09 0.02

offset, the voltage source V was connected to the CN directly in a range of 0.0361 Ω to 26.989 Ω using the aforementioned
in figure 8. After the offset measurement, it was necessary to toggle switches. The measured value was obtained by sub-
connect CN to RV by the connection with SN . Next, the phase tracting the offset measured value from the value measured
error was measured while varying the resistance of resistor RV when RV was connected.

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Table 5.  Measurement uncertainty budget in the ratio error measurement for CTTS calibration.

Source of uncertainty (10−6)

Ratio error
(%) uAr uB1r uB2r uB3r uB4r uB5r uB6r uB7r ucr (10−6) Ur (10−6)

−  9.15 11 −  51 −  51 −  33 30 17 −  0.2 4 87 175

−  4.80 6 −  27 −  27 −  6 30 17 −  0.1 4 52 104
−  0.997 1 −  6 −  6 −  3 3 2 0 4 10 20
−  0.501 1 −  3 −  3 −  1 3 3 0 4 7 15
−  0.1007 0 −  1 −  1 0 3 0 0 4 5 10
−  0.0506 0 0 0 0 0 0 0 4 4 8
−  0.0103 0 0 0 0 0 0 0 4 4 8
−  0.0052 0 0 0 0 0 0 0 4 4 8
−  0.0012 0 0 0 0 0 0 0 4 4 8
+  0.0012 0 0 0 0 0 0 0 4 4 8
+  0.0052 0 0 0 0 0 0 0 4 4 8
+  0.0103 0 0 0 0 0 0 0 4 4 8
+  0.0506 0 0 0 0 0 0 0 4 4 8
+  0.1008 0 1 1 0 3 5 0 4 7 14
+  0.503 1 3 3 1 3 2 0 4 7 14
+  1.007 2 6 6 3 3 3 0 4 11 21
+  5.04 4 28 28 6 30 0 0.1 4 51 101
+  10.07 11 56 56 33 30 0 0.2 4 92 184

uAr: repeated measurement.

uB1r: CN measurement.
uB2r: CX measurement.
uB3r: CV measurement.
uB4r: resolution of CTTS.
uB5r: voltage dependence of ratio error.
uB6r: voltage dependence of capacitance of CV.
uB7r: dissipation dependence of ratio error.
ucr: combined standard uncertainty for ratio error.
Ur: expanded uncertainty for ratio error.

The phase error at negative polarity is calculated by equa- Table 6.  Measurement uncertainty budget during the phase error
tion (17), as shown in the second column of table 4(a). The measurement for CTTS calibration.
measured results for the phase errors are presented in the Source of uncertainty (μrad)
third column of table  4(a). The fourth column of table  4(a) Phase error ucp Up
(crad) uAp uB1p uB2p uB4p uB5p (μrad) (μrad)
implies the difference between the calculated and the meas-
ured values. The difference in-phase error obtained at KRISS −  10.07 11 −  81 −  56 30 50 115 230
for the overall range of the phase dials was found to be less −  5.03 6 −  45 −  28 30 17 64 127
than 6   ×   10−5 crad, except for the calculated phase errors −  1.004 2 −  15 −  6 3 7 18 36
of  −5.03 crad and  −10.07 crad, for which the corresponding −  0.508 1 −  9 −  3 3 2 10 20
absolute error was 0.01 crad and 0.02 crad, respectively. −  0.1018 0 −  3 −  1 0 0 3 5
Likewise, the negative polarity, the evaluation of the posi- −  0.0509 0 −  2 0 0 0 2 4
tive polarity was performed in a similar manner after inter- −  0.0135 0 −  1 0 0 0 1 3
changing the kN and kX terminals. The calibration results are +  0.0135 1 1 0 0 0 2 5
displayed in table  4(b). The difference in-phase errors was +  0.0509 1 2 0 0 0 2 6
found to be less than 7   ×   10−5 crad up to the overall positive +  0.1018 1 3 1 0 0 3 6
phase error range, except for the calculated phase errors of +  0.508 0 9 3 3 2 10 20
5.03 crad and 10.07 crad, for which the corresponding differ- +  1.004 1 15 6 3 0 16 33
+  5.03 0 45 28 30 17 63 127
ence was 0.01 crad and 0.02 crad, respectively.
+  10.07 8 81 56 30 17 105 209

uAp: repeated measurement.

5.  Uncertainty analysis and discussion uB1p: RV measurement.
uB2p: CN measurement.
uB4p: resolution of CTTS.
Table 5 summarizes the measurement uncertainty budget for
uB5p: voltage dependence of phase error.
the investigated ratio error range during the CTTS A cali- ucp: combined standard uncertainty for phase error.
bration process. The individual uncertainty values in table 5 Up: expanded uncertainty for phase error.

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Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

(a)
Difference in ratio error (%) (a)

Difference in ratio error (%)

0.06 0.30 : Specification
: Specification
0.04 30 V
100 V 0.15
0.02 133 V

0.00 0.00
-0.02
0.001 -0.15
-0.04
0.000

-0.06 -0.001
-0.30
-0.08 -0.1 0.0 0.1

-10 -5 0 5 10
-10 -5 0 5 10
Calculated ratio error (%)
Calculated ratio error (%)
(b)
(b)

Difference in phase error (crad)

0.1 : Specification
Difference in phase error (crad)

0.06
: Specification
0.04 30 V
0.0
100 V
0.02 133 V
-0.1 0.02
0.00
-0.02 -0.2 0.00

0.005
-0.04 -0.02
0.000 -0.3 -0.5 0.0 0.5

-0.06 -0.005
-0.08 -1 0 1
-10 -5 0 5
Calculated phase error (crad)
Figure 10.  (a) Plot of the difference in ratio error with voltage
dependence and the manufacturer’s specification versus the
calculated ratio error for CTTS A. (b) Plot of the difference in-phase
error with voltage dependence and the manufacturer’s specification
versus the calculated phase error for CTTS A.
contain the repeated measurement uncertainty, the capaci-
tance CN , the CX and CV measurement uncertainty values, and
the resolution of the CTTS. The combined standard uncer-
tainty and expanded uncertainty are also given in the seventh
and eighth columns in table  5, respectively. The absolute
expanded uncertainty increases with an increase in the ratio
error. The absolute expanded uncertainty Ur for a ratio error
in the range of  −9.15% to +10.07% ranges from 8   ×   10−6
to 184   ×   10−6. Specifically, the absolute expanded uncer-
tainty for the ratio error range of  −0.1% to +0.1% was not
more than 10   ×   10−6 except for the calculated ratio error
of +0.1008%, for which the corresponding uncertainty was
14   ×   10−6.
To investigate the uncertainty contribution of the dissipa-
tion factor (DF) dependence referred to in table 5, we per-
formed the ratio error calibration by varying the DF value.
The DF value was changed by connecting the additional resis-
tors RA in parallel with CN in figure 2. The variation for the
-4 -2 0 2 4
Calculated phase error (crad)
10
Figure 11.  (a) Plot of the difference in ratio error and the
manufacturer’s specification versus the calculated ratio error
for CTTS B. (b) Plot of the difference in-phase error and the
manufacturer’s specification versus the calculated phase error for
CTTS B.
difference in ratio error was found to be less than  ±0.0004%
corresponding to an uncertainty source for DF dependence.
Table 6 shows the measurement uncertainty budget for
the investigated phase error range during the CTTS calibra-
tion process. The values of CX and CV are not included in the
equation of the phase error calculation; hence, only the uncer-
tainty budget of CN is included in table 6. The RV measurement
uncertainty value is also included. The absolute expanded
uncertainty increases with an increase in the phase error.
The absolute expanded uncertainty Ur for the phase error in
the range of  −10.07 to +10.07 crad ranges from 3   ×   10−6 to
207   ×   10−6. Specifically, the absolute expanded uncertainty
for the phase error range of  −0.1 crad to +0.1 crad was not
more than 6   ×   10−6.
Figure 10(a) displays a plot of difference in ratio error
with voltage dependence and the manufacturer’s specifi-
cation versus the calculated ratio error of CTTS A at both
polarities, with the results shown in tables 3(a) and (b). The
ratio error variation for the applied voltage 30 to 133 V was
found to be less than  ±0.001% for the overall calculated ratio

8
Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

(a) (a)
0.02
Difference in ratio error (%)

Difference in ratio error (%)

0.05 : Specification
: Specification
0.01

0.00
0.00
0.005
-0.05
-0.01 0.000

-0.005

-0.02 -0.10 -1 0 1

-10 -5 0 5 10 -10 -5 0 5 10
Calculated ratio error (%) Calculated ratio error (%)

(b) (b)
0.03

Difference in phase error (crad)

Difference in phase error (crad)

0.04 : Specification
: Specification
0.02
0.02
0.01
0.00
0.00 -0.02
0.005
-0.01 -0.04
0.000

-0.02 -0.06
-0.005

-0.03 -0.08 -1 0 1

-10 -5 0 5 10 -5 0 5
Calculated phase error (crad) Calculated phase error (crad)

Figure 12.  (a) Plot of the difference in ratio error and the
manufacturer’s specification versus the calculated ratio error
for CTTS C. (b) Plot of the difference in-phase error and the
manufacturer’s specification versus the calculated phase error for
CTTS C.
Figure 13.  (a) Plot of the difference in ratio error and the
manufacturer’s specification versus the calculated ratio error
for CTTS D. (b) Plot of the difference in-phase error and the
manufacturer’s specification versus the calculated phase error for
CTTS D.

error region, except for the calculated ratio error of  −9.14%
and  −4.80%, for which the corresponding variation in error
was  ±0.005%. Specifically, the ratio error variation for the
range of  −0.1% ~+0.1% was found to be less than  ±0.0001%.
The specification of the ratio error was calculated using the
error equation with a 0.5% reading + 0.001% as provided by
the manufacturer [11]. The error bar shown in figure  10(a)
implies the measurement uncertainty obtained in table 5. The
inset in figure 10(a) shows an enlarged scale for a better view
of the ratio error range of  −0.1% to + 0.1%. The calibration
result for the ratio error was found to satisfy the manufac-
turer’s specification for CTTS A.
Figure 10(b) shows a plot of the difference in the phase error
with voltage dependence and the manufacturer’s specification
versus the calculated phase error of CTTS A at both polari-
ties, as already shown in tables 4(a) and (b). The phase error
variation for applied voltage from 30 to 133 V was found to
be less than  ±0.005 crad for the overall calculated phase error
region, except for the calculated phase error of 10.07 crad, for
which the corresponding variation in error was  ±0.015 crad.
Specifically, the phase error variation for the range of  −0.5
crad ~+1 crad was found to be less than  ±0.0005 crad. The
specification was calculated by the error equations  with a
0.5% reading +0.001 crad for the phase as provided by the
manufacturer [9]. The error bar shown in figure  10(b) indi-
cates the measurement uncertainty obtained in table  6. The
inset in figure 10(b) shows an enlarged scale for a better view
of the phase error range of  −0.1 crad to +0.1 crad. The cali-
bration result for the phase error was also found to satisfy the
manufacturer’s specification for CTTS A.
The calibration results for the other three commercial
CTTSs, i.e. CTTS B, CTTS C and CTTS D are displayed in
figures 11–13, respectively. These CTTSs were calibrated at
133 V. All calibration results satisfy the specification provided
by the manufacturer, except for the phase error calibration
result of CTTS B in figure 11(b).
The comparison results between the manufacturer’s speci-
fications and the calibration results for the four CTTSs are
summarized in table 7 for the ratio errors and in table 8 for
the phase error.

9
Meas. Sci. Technol. 26 (2015) 085015 Y S Lee et al

Table 7.  Comparison of the ratio error between the manufacturer’s specification and the calibration results for four CTTSs.

CTTS A CTTS B CTTS C CTTS D

Range of
ratio error Specification Calibration Specification Calibration Specification Calibration Specification Calibration
(%) (10−6) (10−6) (10−6) (10−6) (10−6) (10−6) (10−6) (10−6)

0 ~  ±0.1 ± 10 ~  ±15 ± 0 ~  ±1 ±300 ~  ±600 ±10 ~  ±111

±50 ±0 ~  ±12 ±10 ~  ±620 ±1 ~  ±62
± 0.1 ~  ±10 ± 15 ~  ±60 ± 1 ~  ±37 ± 600 ~  ±3333 ±111 ~  ±1300

Table 8.  Comparison of the phase error between the manufacturer’s specification and the calibration results for four CTTSs.

CTTS A CTTS B CTTS C CTTS D

Range of
phase error Specification Calibration Specification Calibration Specification Calibration Specification Calibration
(crad) (μrad) (μrad) (μrad) (μrad) (μrad) (μrad) (μrad) (μrad)

0 ~  ±0.1 ±10 ~  ±15 ±0 ~  ±12

±87 ~  ±1290 ±2 ~  ±2800 ±58 ±6 ~  ±77 ±10 ~  ±463 ±5 ~  ±74
±0.1 ~  ±10 ±15 ~  ±514 ±12 ~  ±195

6. Conclusion calibration of transformer loss measuring systems IEEE

A compact CTTS calibrator consisting of precise resistors and
capacitors is being fabricated as the secondary working stan-
dard for calibrating commercial CTTSs. The calibration prin-
ciple is based on calculations of the in-phase and quadrature
currents at two CTTS arms while considering the offset mea-
surements. The errors in the ratio and phase are determined
by comparing the results between the calculated and the mea-
sured values together with a measurement uncertainty anal-
ysis. The calculated results are consistent with the measured
results within the measurement uncertainty. This confirms the
validity of the CTTS calibration technique. It was successfully
applied to the calibration of several commercial CTTSs.
Acknowledgments
This research was supported by the Converging Research
Center Program through the Ministry of Science, ICT and
Future Planning, Korea (No. 2014M3C1A8048831).
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