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DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK3053
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE

DESCRIPTION ORDERING INFORMATION


The 2SK3053 is N-Channel MOS Field Effect Transistor PART NUMBER PACKAGE
designed for high current switching applications in consumer
2SK3053 Isolated TO-220
instruments.

FEATURES
• Low On-State Resistance
RDS(on)1 = 45 mΩ MAX. (VGS = 10 V, ID = 13 A)
RDS(on)2 = 70 mΩ MAX. (VGS = 4.0 V, ID = 13 A) (Isolated TO-220)
• Low Ciss : Ciss = 790 pF TYP.
• Built-in Gate Protection Diode
• Isolated TO-220 package

ABSOLUTE MAXIMUM RATINGS (TA = 25 °C)


Drain to Source Voltage VDSS 60 V
Gate to Source Voltage VGSS(AC) ±20 V
Gate to Source Voltage VGSS(DC) +20, −10 V
Drain Current (DC) ID(DC) ±25 A
Note1
Drain Current (Pulse) ID(pulse) ±75 A
Total Power Dissipation (TC = 25°C) PT 30 W
Total Power Dissipation (TA = 25°C) PT 2.0 W
Channel Temperature Tch 150 °C
Storage Temperature Tstg –55 to +150 °C
Note2
Single Avalanche Current IAS 12.5 A
Note2
Single Avalanche Energy EAS 15.6 mJ

Notes 1. PW ≤ 10 µs, Duty cycle ≤ 1 %


! 2. Starting Tch = 25 °C, VDD = 30 V, RG = 25 Ω, VGS = 20 V → 0 V

The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.

Document No. D12912EJ3V0DS00 (3rd edition)


The mark ! shows major revised points. © 1999, 2000
Date Published May 2001 NS CP(K)
Printed in Japan
2SK3053
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ELECTRICAL CHARACTERISTICS (TA = 25 °C)


CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Drain to Source On-state Resistance RDS(on)1 VGS = 10 V, ID = 13 A 28 45 mΩ

RDS(on)2 VGS = 4.0 V, ID = 13 A 46 70 mΩ

Gate to Source Cut-off Voltage VGS(off) VDS = 10 V, ID = 1 mA 1.0 1.6 2.0 V

Forward Transfer Admittance | yfs | VDS = 10 V, ID = 13 A 8.0 16 S

Drain Leakage Current IDSS VDS = 60 V, VGS = 0 V 10 µA

Gate to Source Leakage Current IGSS VGS = ±20 V, VDS = 0 V ±10 µA

Input Capacitance Ciss VDS = 10 V 790 pF

Output Capacitance Coss VGS = 0 V 240 pF

Reverse Transfer Capacitance Crss f = 1 MHz 100 pF

Turn-on Delay Time td(on) ID = 13 A 20 ns

! Rise Time tr VGS = 10 V 200 ns

Turn-off Delay Time td(off) VDD = 30 V 65 ns

Fall Time tf RG = 10 Ω 95 ns

Total Gate Charge QG ID = 25 A 20 nC

Gate to Source Charge QGS VDD = 48 V 3.0 nC


! Gate to Drain Charge QGD VGS = 10 V 6.5 nC

Body Diode Forward Voltage VF(S-D) IF = 25 A, VGS = 0 V 1.0 V

Reverse Recovery Time trr IF = 25 A, VGS = 0 V 40 ns

Reverse Recovery Charge Qrr di/dt = 100 A/µs 45 nC

TEST CIRCUIT 1 AVALANCHE CAPABILITY ! TEST CIRCUIT 2 SWITCHING TIME

D.U.T.
D.U.T.
RG = 25 Ω L
RL VGS
PG. VGS 90 %
50 Ω VDD Wave Form 0
10 %
RG
VGS = 20 → 0 V PG. VDD
ID 90 %
90 %
IAS BVDSS ID
VGS 10 %
VDS ID 0 10 %
ID 0 Wave Form

VDD τ td(on) tr td(off) tf

τ = 1 µs ton toff
Starting Tch Duty Cycle ≤ 1 %

TEST CIRCUIT 3 GATE CHARGE

D.U.T.
IG = 2 mA RL

PG. 50 Ω VDD

2 Data Sheet D12912EJ3V0DS


2SK3053
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TYPICAL CHARACTERISTICS (TA = 25 °C )

DERATING FACTOR OF FORWARD BIAS TOTAL POWER DISSIPATION vs.


SAFE OPERATING AREA CASE TEMPERATURE
35
dT - Percentage of Rated Power - %

PT - Total Power Dissipation - W


30
100

25
80
20
60
15
40
10
20 5

0 0
0 20 40 60 80 100 120 140 160 0 20 40 60 80 100 120 140 160
Tch - Channel Temperature - ˚C TC - Case Temperature - ˚C

! FORWARD BIAS SAFE OPERATING AREA


1000

100 PW
ID - Drain Current - A

=1
d ID(pulse) 0µ
ite s
im 0 V)
)L 1
10

(on 10
DS GS = 0m s
R V ID(DC) s
(at 1m
10 s
Po 10
we m
rD s
iss
ipa
tio
nL
1 im
ite
d

TC = 25˚C
Single Pulse
0.1
0.1 1 10 100
VDS - Drain to Source Voltage - V

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH


1000
rth(t) - Transient Thermal Resistance - ˚C/W

100
Rth(ch-A) = 62.5 ˚C/W

10
Rth(ch-C) = 4.17 ˚C/W

0.1

Single Pulse
0.01
10 µ 100 µ 1m 10 m 100 m 1 10 100 1000

PW - Pulse Width - s

Data Sheet D12912EJ3V0DS 3


2SK3053
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DRAIN CURRENT vs.


FORWARD TRANSFER CHARACTERISTICS DRAIN TO SOURCE VOLTAGE
1000 Pulsed

100
ID - Drain Current - A

100

ID - Drain Current - A
80

VGS =10 V
10 60

TA = −50˚C 40
25˚C 4.0 V
1 75˚C
150˚C
20

VDS = 10 V Pulsed
0.1 0
0 1 2 3 4 5 0 1.0 2.0 3.0 4.0
VGS - Gate to Source Voltage - V VDS - Drain to Source Voltage - V

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

RDS(on) - Drain to Source On-state Resistance - mΩ


FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT GATE TO SOURCE VOLTAGE
75
| yfs | - Forward Transfer Admittance - S

100 VDS = 10 V Pulsed


Pulsed

10 50
TA = 150˚C
75˚C
25˚C ID = 13 A
−50˚C
1 25

0.1 0
0.1 1 10 100 0 10 20

ID - Drain Current - A VGS - Gate to Source Voltage - V

DRAIN TO SOURCE ON-STATE GATE TO SOURCE THRESHOLD VOLTAGE vs.


RDS(on) - Drain to Source On-state Resistance - mΩ

RESISTANCE vs. DRAIN CURRENT CHANNEL TEMPERATURE


VGS(th) - Gate to Source Threshold Voltage - V

Pulsed VDS = 10 V
75 ID = 1 mA
2.0

1.5
50
VGS = 4.0 V
1.0
10 V
25
0.5

0 0
0.1 1 10 100 −50 0 50 100 150

ID - Drain Current - A Tch - Channel Temperature - ˚C

4 Data Sheet D12912EJ3V0DS


2SK3053
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RDS(on) - Drain to Source On-state Resistance - mΩ DRAIN TO SOURCE ON-STATE RESISTANCE vs. SOURCE TO DRAIN DIODE
CHANNEL TEMPERATURE FORWARD VOLTAGE
1000
Pulsed
80

ISD - Diode Forward Current - A


VGS = 4.0 V 100
60
VGS = 10 V

10 V 10 VGS = 0 V
40

20 1

ID = 13 A
0 Pulsed
−50 0 50 100 150 0.1
0 0.5 1.0 1.5
Tch - Channel Temperature - ˚C VSD - Source to Drain Voltage - V

CAPACITANCE vs. DRAIN TO SWITCHING CHARACTERISTICS


SOURCE VOLTAGE
10000 1000
VGS = 0 V

td(on), tr, td(off), tf - Switching Time - ns


f = 1 MHz tr
Ciss, Coss, Crss - Capacitance - pF

1000 Ciss 100


td(off)

tf td(on)
Coss
100 10
Crss

10 1
0.1 1 10 100 0.1 1 10 100

VDS - Drain to Source Voltage - V ID - Drain Current - A

REVERSE RECOVERY TIME vs. DYNAMIC INPUT/OUTPUT CHARACTERISTICS


DRAIN CURRENT
1000 80 16
di/dt = 100 A/µs
VDS - Drain to Source Voltage - V
trr - Reverse Recovery Time - ns

VGS - Gate to Source Voltage - V


VGS = 0 V

60 VDD = 48 V 12
100 30 V
12 V VGS
40 8

10
20 4

VDS ID = 25 A
1 0
0.1 1.0 10 100 0 4 8 12 16 20 24 28 32
IF - Drain Current - A QG - Gate Charge - nC

Data Sheet D12912EJ3V0DS 5


2SK3053
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! SINGLE AVALANCHE CURRENT vs. SINGLE AVALANCHE ENERGY


INDUCTIVE LOAD DERATING FACTOR
100 160
VDD = 30 V
RG = 25 Ω
IAS - Single Avalanche Current - A

140
VGS = 20 V → 0 V

Energy Derating Factor - %


IAS ≤ 12.5 A
IAS = 12.5 A 120
10 EAS 100
=1
5.6
mJ
80

60
1
40
VDD = 30 V
VGS = 20 V → 0 V 20
RG = 25 Ω
Starting Tch = 25˚C
0.1 0
10 µ 100 µ 1m 10 m 25 50 75 100 125 150

L - Inductive Load - H Starting Tch - Starting Channel Temperature - ˚C

6 Data Sheet D12912EJ3V0DS


2SK3053
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PACKAGE DRAWING

Isolated TO-220 (MP-45F)

10.0 ± 0.3 4.5 ± 0.2


φ 3.2 ± 0.2
2.7 ± 0.2

EQUIVALENT CIRCUIT
15.0 ± 0.3

3 ± 0.1

12.0 ± 0.2
Drain (D)

Body
4 ± 0.2

Gate (G) Diode


13.5MIN.

Gate
Protection
Diode Source (S)
0.7 ± 0.1 1.3 ± 0.2 2.5 ± 0.1
1.5 ± 0.2 0.65 ± 0.1
2.54 2.54

1.Gate
2.Drain
3.Source
1 2 3

Remark 1. This product is designed for consumer application and isn’t suitable for automotive application.
2. The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.

Data Sheet D12912EJ3V0DS 7


2SK3053
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• The information in this document is current as of May, 2001. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
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redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
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and visual equipment, home electronic appliances, machine tools, personal electronic equipment
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4

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