ONS! [2osogfzer| Reliability : Se B. B.Shrivashave S Reliability Is the probability of a © percent Scientific officer/é = its. ee ee au —______ Beam Diagnostics Sechm = imkeded under _opeakeng ¢ondibians eheaumierd, a ___ Accelerator Contvo/ & Beam Diagnostics Se a Ee eg ia ac Ltr Be Bivisien. RRCAT, TuDoRE BY Quality: = ee es 2 The qurtity of device js the dearee of confarmaa —Spplicakibe +0 specificatmns And werkenanchip Stendlerds. Usually the clement of time is missing. gets by ie quality over time i The Bathtub Curve Hypothetical Failure Rate versus Time ee End of Life Wea.0ut Increasing Fore Rate Infant Monaity Decreasing Flue Rate VULEDEDEEELULBEBEELL SD Nowa fe (set Lie) Low "Constant Faure Rate Tite Sa ee Increased Faiure Rate >. Khe eUability is nosh imprdnk E - > as Reliability is enost tmpowhm) sssue i as LL h stems 2. Nucleay System B. Space bom syclem , a = = a = = = = = = _ = = = = — — == — c Anh composile of people, prclucts gglgig——MITETha_overage + amd. process thak provide a cabability to ao tis to failure for. 0% Sahsfy a stated meed or objective. ss ES _systein thE oc 84 (MTBF=100 2 7S is sat sepaivable. om A= MTBF(MTBF+MTTR) Subs, = CoE eel fe Avaibili eA" A ae oF iiems tems _cahisfying a topical = eS gene i grvup of fumchons mith a parhieutlay sysiem teal — os MT BE: Mean time = : og Def> of system amd sub sytem a> per Mie sth @82D. ees beeen falters | ib is express-eol m gel : = - : a Yue, aha oe Complex sysien have Various subsysiems —_ MTRE js inyerse of the failint wae, for the ba form different areas — - =e sysiens that oot defined a> " Constant failuse wale eee CD Mechani cof — om sysiens" a Gi ) Blacks eat/Blechanis MTTRO Mon Tr ait “Repaiy): 2 CHD _Sefhware_ se te i Rees he Fo Repair, me averse time _____Giv)_ interface inducing operstors a +o_sehirn & failed system +o an Operable stale, OR S - MTTR Is expretsied in hows and indicates Comibinakan of att aeaye. Long it tares +o repair a System that 1s chown sue to failure. 35 We €¥pect im- house deyeloped system +p Weve very low MTTR. Low MTTR Can Componsate fe eae MTSE Each subsystem han clifferenr chavacterishe foc seliqbility « Fer Cornplex systems avaibili ity i of more umecernsdthen the 2euahility Figure For sysion. &, Ava’ ity + a EIT | (Failine tn Time): The avaibils Lity of a system 124 function ql _ ae 8 _____ of divne is the prubability that the System. The failse wae "A is defined aa by tre snuber of failures x" during A specific .,. ce =eee eee ——_the Umit fer failues vate used) fer_elechrnic __qy 1°" "sevies element saith lowesk elability clpmimasy __Cermpments is 1 fit C faire in-time) Hye system attiability, ae = 12109 per heur 5s Recast seul mae Sr creveans — ese A Syslem has two Sub syslem Colewonk) 1 failuse in _10° operahon heurs of Ae Ow awitn selfability RIE 9S ard Ros +90 then device. “the failine "ake ie Useol Fo. catewale mrae OF a complele cenipmeni consisting of i Sepante compment awit meividner failine "@ — Retichility Poediatin Eeemigur rrate Ai OS ees Fase ier eA, pe ae Ca i) Strmilar_ item analyeie (i) Part eoumr amalys ts — Reliability Is estimated 27 function 0€ Mumber of i imetucled . Hem ane combined fer higher _- Reliability in derms ot faidene Rases Bilt) = ep (-Aj wt) As = 2 pj = Sysiem feilae vue. 5 Etsignndnt_ ac Sysem _reltabyLity "= — ability of stn ettinnats oF subsysion ® @ iviPhystes of failuveoratysts: sp = Applicable +o wearout period. _ a? sa op?[ Based on these _Infermakim starolor| {abwlalect yalyed Used ard jlems failixe vale tsmbined +o find x al % = a —____ 2. Diverse failure mechanisms out NIT BE, sy ee? oe oe whine Hh qenerse. park 2. Civedlt awd pve bree: ew Ag = Generic failure vase for ith &._samufactering, : é 2 ow? enevic part (=.0008, hows ____ As operatw interface Shvironment a ___ AA = Quality fact fer Ph qenericpnd: _C&xtenna factors «>? oA Number of qeneri< part calejorign Bi shee an eee p nents os Electronic System Retial bility feechicion Prectichin 3 Standen — 05. miGtey Hand bri k2ID, « __! Reliability prsclichms fer €lechinic ___ Equipments —(U-S— mit -HomK-2/7) — —_____——@% Dalia used ang Secor SARE 2eooh2 se Paris Cntmb-Arabyeig resis tr Umservasye ethimetes ord sequires less mfrrmebion > Park Ars Re —__()_farks Counr methid: tnfersnation needed tp use Park coum metned = = | Generic port types a rp se a aS Poo aus Neve 4. Tem envionment <=,eee ee 8 S028 -for screen level A Stimment screening) a for screen leves &, 80 i = 2 fey seen level Qt = 2B for other commeretay meth ade, vanin from 1 +o 500 Sepending pen dupe oF envirmeneut C Ground +o sce _ Allgoa) cate the failure wate for each __omponeut, the egiuipament fasjure vale is > Failure vase models are print eshimete which Are based on available cata. Henee trey are Nehid for einclition Under thich the dela was Obleined, and -for the devices covered. =P Some extn pilahion smade|_clevelopment is possible, bur the Inherenth, empirical rate of the melete can be severely sesichve. DP _ Basie Limibehion of selighiLity preclichion te a determi; et the failure wales of individuel Cemponents. 3 its deperclanet_ on correct applicatim by the user. Example to Celealate failine vate of */Pks Transitor~ — ae = moo cory apply ake anolele ard E fee Nea tansibh dps Aba AT axa ne nay AS --- failure) « ns ui Will find the preclichon useful. deol. “Those who ‘view the key only an a 2 Munbey tohich must Sree Specibie velit b can_u: away co acheive their ——__derjor witveut- ony impack on Systm. = menkarel pn Mi Hoge 29= . Retinbilite Testing. . —__—_Obective of reliability feshing is, wearness of — . . . im mush be then VEULBEELI A. Tests jn which failure is undexivable Stony 2. Tasks jm which Are desirgnte +o induce Fashion. @ — Meee mn desk; Stabsheap tes ol mosh of the = ee? => fume envionnmental Jeske are fn category 1. sign & Devel cle Reliability Engincermy concepls should be —__Spplied ste tesian and development shase- __ Cost of failure | 2 3 manangecment) . Product Lite cycleWits aging strength seduces ond failine may