Digital Detector Arrays (Flat Panel Detectors) : April 2007

Digital Detector Arrays

(Flat Panel Detectors)
, April, 2007
Klaus Bavendiek,YXLON International, Hamburg, Germany

29.08.03
Uwe Ewert, Uwe Zscherpel, BAM, Berlin, Germany

© KB
BI
April 2007
YXLON. The reason why 1

History of X-Ray applications
>110 years: ~ 20 years:

X-Ray film was developed for DDAs* were developed for
medicial applications medicial applications
- High Speed Films for minimum - High Speed DDAs for even less
dose for patient with flourecents dose for patient
screens - Highly optimized for a limited
range of energy and resolution
~50 years: ~10 years:

X-Ray film was adapted to - DDAs were taken as there are
industrial applications (Pb screens): for industrial applications
, April, 2007
- Higher spatial Resolution

~ 3 years:
29.08.03
- Higher Energy Range

© KB
- DDAs were adapted to industrial

- Lower Noise (higher dose)
BI
requirements
*DDA = Digital Detector Array or Flat Panel Detector
Radiographic Image Quality is the basis for all comparisons
New Table in ASTM E94
Radiographic Image Quality
Radiographic Definition Film System Granularity Radiographic Contrast

Inherent Geometrical Subject Film
Unsharpness Unsharpness Contrast Contrast
DDA Image Quality

Detector Projected Quantum Detector Subject Detector
Unsharpness Unsharpness Noise Noise Contrast Contrast
, April, 2007
29.08.03
Basic Structual
© KB
Noise Noise
BI

Image Quality Parameter with DDAs
Detector Projected Quantum Detector Subject Detector

Unsharpness Unsharpness Noise Noise Contrast Contrast
CNR
Basic Spatial Resolution
SRB (effective Pixel Size) SNR
Important Image Quality Paramter for DDA: CNR = Contrast to Noise Ratio
1. SRB Basic Spatial Resolution SNR = Signal to Noise Ratio
2. SNR Signal to Noise Ratio / Efficiency
, April, 2007
3. CS Contrast Sensitivity
4. DR Dynamic Range CS = Contrast Sensitivity
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= 1 / CNR
© KB
5. LAG Behaviour in time

BI
6. IScR Internal Scatter Radiation

7. BP Bad Pixel Distribution
Image Quality Parameter: Basic Spatial Resolution
SRB
¾ Spatial detector resolution of the image in x- and y-direction
¾ Smallest detail perpendicular to the X-ray beam resolved in the image
¾ Also known as effective pixel size

¾ Corresponds to ½ of the detector unsharpness
¾ Measured with the Duplex Wire (EN 462-5 or ASTM E2002)
¾ May be calculated out of the visibility of duplex wires
© KB
BI , April, 2007
29.08.03

Measurement of the SRB with the Duplex Wire (here: D2 Film)
wire distance wire distance

D4 400µm D9 130µm
D5 320µm D10 100µm
D6 250µm D11 80µm
D7 200µm D12 63µm
D8 160µm D13 50µm
© KB
BI , April, 2007
29.08.03

SRB of film is much better than with DDAs without magnification
, April, 2007
29.08.03
SRB of a 200µm detector. The SRB is 200µm.

© KB
With magnification & small focal spot similar SR with a 200µm detector:
BI

Film like SR with DDA using µ-focus system and magnification
, April, 2007
29.08.03
© KB
Spatial Resolution of 50µm using a of a 200µm SRB detector and µ-Focus tube
BI
But: The very high SRB is not necessary for most applications
Image Quality Parameter: Signal to Noise Ratio (SNR)
Example of different SNR at film

, April, 2007
29.08.03
© KB
σD
BI
Loss of information / perceptibility


Examples for different SNR in the Image
Signal to Noise Ratio

(SNR) = 2
© KB
BI , April, 2007
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(SNR) = 4
© KB
BI , April, 2007
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(SNR) = 8
© KB
BI , April, 2007
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(SNR) = 20
© KB
BI , April, 2007
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(SNR) = 80
© KB
BI , April, 2007
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Image Quality Parameter: Signal to Noise Ratio (SNR)
Noise is in every image. Reasons for noise are:
Quantum Noise (X-Ray) Quantum Noise (X-Ray)
Grain Distribution Structure Noise
Fog Contribution Electronic Noise
S
Detector Units
SNR =
D-D0
SRMS
2*Noise
== 2 SRMS
2048
1024 Signal
© KB
BI , April, 2007
29.08.03

Noise in the Film
Optical Densitiy above fog and base Signal
Gradient GD @ D=2 and D=4 above fog and base Dose Response
Granularity σD @ D=2 Noise
Most important parameter for the perception of fine flaws == G2 / σD
Conversion to SNR possible by (linear systems)
SNR = (G2/σD) / ln(10) = (G2/σD) / 2,3026
Diaphragm area (aperture) converted to square shaped area of 88.6 x 88.6µm

for comparison of digitized films with DDAs and different SRB
, April, 2007
Î Measured SNR has to be corrected by

29.08.03
© KB
SNRnorm = SNRmeas * 88,6µm / SRB

BI

Normalized SNR in the Standards (at Film Density D-D0=2; EN 584-1)
EN 14784-1 Computed Radiography

ASTM E 2446 Computed Radiography
The limit in SNRnorm for film is some-

where in the range of 150 - 200.
With more dose the SNR would
become better but film with
, April, 2007
densities >4.8 is not readable.

29.08.03
© KB
BI

Reasons for Noise in the film and in digital Systems
Is this the same

with a DDA?
© KB
BI , April, 2007
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Film: Base and fog Quantum Noise too dark for readout
DDA: Electronic Noise Quantum Noise Structure Noise
Two important differences between Film Ù DDAs at Noise:
Quantum Noise (X-Ray) Quantum Noise (X-Ray)

Film Granularity Structure Noise
Fog Contribution Elektronic Noise
Can be compensated with a propper

detector calibration
FIXED WITH THE SE-
LECTION OF THE FILM
With Image Integration in a Computer
and very long exposure times ( Î )
8
, April, 2007
it can be reduced to ~0
29.08.03
© KB
BI

SNR at a good DDA is mainly limited by Photon Statistics
and the Efficiency differs for different Energies:
1500s integration time

SNRnorm= 6600
300s integration time
, April, 2007
300s integration time Film:

29.08.03
SNRnorm= 150
© KB
BI
Conditions: 1000mm Focus DDA Distance, SNRnorm calculated by substracted images

The Efficiency can be used to select the best DDA
for a dedicated Energy level:
Normalized SNR for

comparison of different systems
© KB
BI , April, 2007
29.08.03

Image Quality Parameter: Contrast Sensitivity
Contrast Sensitivity (CS) indicates the smallest material difference
which can be resolved in the image
, April, 2007
SRMS 1
Contrast CS = =
= ΔS ΔS CNR
29.08.03
© KB
BI

Measurement of Contrast Sensitivity
CS measured with
Duplex Stepwedge 2% Groove
(stepwedge with grooves) 1.25mm
CS is calculated of 2.5mm
difference in signal
5.0mm
devided by
mean noise level 7.5mm
per step.
10mm
, April, 2007
12.5mm
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© KB
15mm
BI
15mm
Example: Stainless Steel Base material

Measurement of Contrast Sensitivity
Old version: still 2 grooves ...

, April, 2007
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© KB
Three different Materials:

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Aluminium, Titanium and Stainless Steel

Result of Contrast Sensitivity Measurement
, April, 2007
29.08.03
In the range of 1.25 to 12.5 mm stainless steel a 0.2% material thickness

© KB
can be resolved.
BI
Film level is >1% and only possible within a smaller material thickness range

Image Quality Parameter: Dynamic Range
... also called in ASTM: „Specific Material Thickness Range“

, April, 2007
SNR on each step is calculated for different exposure times ...

29.08.03
© KB
Three different Materials:

BI
Aluminium, Titanium and Stainless Steel

Measurement of the Dynamic Range
© KB
BI , April, 2007
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Measurement of the Dynamic Range
© KB
BI , April, 2007
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Dynamic Range from 10 to 72mm for 1% applications with 4s exposure time

Dynamic Range from 10 to 90mm for 2% applications with 4s exposure time
Image LAG or Ghosting
© KB
BI , April, 2007
29.08.03
Image LAG is caused by the electronic of a DDA

Image LAG or Ghosting
© KB
BI , April, 2007
29.08.03
Image LAG is caused by the electronic of a DDA

LAG and Burn In
Example for „Burn In“
Negative image of a turbine

blade two days ago.
Corrected one day before
Lead letter on the step wedge

from the day before. No new
, April, 2007
calibration was done ...

29.08.03
© KB
BI
Burn In is a long term effect in the Scintillator of a DDA

Internal ScatterRadiation
a
, April, 2007
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Internal Scatter Radiation increases with the energy.

© KB
BI
Important Parameter for CT machines ...

Bad Pixel
... only a dead pixel is a bad pixel?
Not really ...

© KB
BI , April, 2007
29.08.03

Bad Pixel
© KB
BI , April, 2007
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Groups of Bad Pixel (Cluster)
© KB
BI , April, 2007
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Main Difference between Film and DDAs
Two unique property of DDAs:

¾ Take multiple images at identical pixel positions and cumulate.
¾ Calibrate on pixel basis with
suitable energy and
material in the beam similar to the test object
The key for best image quality with contrast sensitivity and superior SNR is
the exact calibration of each detector pixel

, April, 2007
to obtain the same radiation response as the neighbourhood detector pixel.

29.08.03
© KB
BI

Basic Functionality of all Types of Detectors
X-Rays reaching the sensitive area of the detector are converted to
electrical charge.
The amount of charge is measured.
It is proportional to the Dose.
Different Technologies for Flat Panel Detectors are available
¾ intrinsic Method
(„direct Method“) - very inefficient, no products
¾ direct Method with Photoconductor
, April, 2007
(Amourphous Selen or CdTe ) - example: AJAT DICT100 CdTe
¾ indirect Method
29.08.03
© KB
(Converting X-Ray to Light with Scintillator, „normal“ Photodiodes)

BI

Matrix-Structure of all Flat Panel Detectors
.. with Photo Diode for „Light Capture“ and TFT for selective Read out
© KB
BI , April, 2007
29.08.03

Basic Principle: Indirect Method with Scintillator
light quantum
Cross Sectional View of Detector
X-ray quantum
Scintillator (screen) Coating
Photo Diode Layer
Pixel width (indicated geometrical resolution)

, April, 2007
A thick scintillator results in many photons, but with a loss of geometric resolution
29.08.03
(noise vs. resolution)

© KB
BI
The effective geometric resolution depends on various parameters, these must be measured!

Basic Principle: Indirect Method with Scintillator
light quantum
Cross Sectional View of Detector
X-ray quantum
Scintillator (screen) Coating
Photo Diode Layer
Pixel width (indicated geometrical resolution)

, April, 2007
Cesium iodide can be formed into needles on top of the diode structure to direct the light
to the photodiodes without significant light scatter.
29.08.03
The needles ensures a high total internal reflection of the light and direct it to the photodiode.
© KB
Disadvantage of CsJ: ImageLag and Burn In

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What happens during operation?
TFT
What happens:
Photo
diode 1. Capacity of Photodiode is charged
up to U+
U+ 2. Incoming Light discharges the capacity;

more light means less charge left in the
Photo-
~8pF Diode
Capacity
3. Now the cell should be read out:

TFT
Switch
TFT The TFT becomes conductive and
the capacity is recharged through
the Read-Out Amplifier up to U+ ...
, April, 2007
Line
Selection
3a. The amount of Charge for Recharging
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Read-Out U in measured in the Read-Out Amplifier.

© KB
Amplifier It is transfered as „U“ to the ADC

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How do we do the calibration
1. Capture the Dark Image
==> Offset Image

, April, 2007
29.08.03
Uncorrected Image with Flaws, Patterns, Bad Pixel, ...

© KB
without X-Ray
BI

1. Substract the Dark Image from any further Image

, April, 2007
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Offset corrected Image without X-Ray

© KB
BI

2. Capture the Gain Images
==> Gain Image

, April, 2007
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Offset corrected Image with X-Ray and

© KB
without Gain Correction

BI

2. Multiply each Pixel with Gain Image for further Images

, April, 2007
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Offset and Gain corrected Image with X-Ray

© KB
BI

2b. Correct Non-Linearities with Energy adapted Gain Images

Detector Output Signal [ADU]
full dose
real dose with

material in the beam
reduced dose
, April, 2007
during calibration
29.08.03
© KB
BI
energy

Corrected Detector Output Real (non-linear) Detector Output Signal
„Gain Line“, calculated of Correction Points 1 to 3
Signal after Correction with „Multi-Gain“
Signal after Correction with Offset and Multi-Gain
Correction Point 3
Correction Point 2
Correction Point 1
, April, 2007
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© KB
Offset
n1
BI
Raw Detector Signal

r1 r2 r3 r4

A High SNR is optained with Optimized Calibration
(SNR is limited to ~1000 because of the Structure of the Material)
With 16s same

quality like
with 500s and
normal calibration
© KB
BI , April, 2007
29.08.03

Inspection wide Range of Material with optimal Calibration
in %
© KB
BI , April, 2007
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Aluminum, 10 - 110 mm, PerkinElmer RID 512 / AF1 and Image 3500 DD

Can a High SNR Compensate a Lower SRB?
With a high SNR details can be seen more easily and
even objects smaller than the pixel size can be detected
40mm Al
5mm
800µm
200µm
5mm Al 127µm
400µm
1200µm
, April, 2007
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with Highpass Filter

40
© KB
m
m
Aluminum wedge with 5 long holes inside;
BI
Image from 400µm pixel pitch panel PerkinElmer RID512/400 AF1

Can a High SNR Compensate a Lower SRB?
With a high SNR details can be seen more easily and
even objects smaller than the pixel size can be detected
This is just a third of

the pixelsize.
800µm How is this possible?
200µm
127µm
400µm
1200µm
, April, 2007
29.08.03
with Highpass Filter

© KB
Aluminum wedge with 5 long holes inside;

BI
Image from 400µm pixel pitch panel PerkinElmer RID512/400 AF1


Yes, a High SNR can Compensate a Lower SRB
With a high SNR it is enough that just a part of a pixel gets the information.
The long hole, just a quarter of a pixel width
Example:
The hole has 2% less density than the rest.
The hole covers ¼ of the pixel.
The visibility would be 2% * ¼ = 0.5%.
With a SNR > 200 the 0.5% is visable.
© KB
BI , April, 2007
29.08.03
Pixel Grid of the Detector

Compensate a lower SRB with a higher SNR
Another example with 8mm steel weld (test weld BAM5)
Film AGFA D2, class C1 EN 584-1 PE XRD1620 detector (200µm SRB),

, April, 2007
330s exposure time magnification of 3.0

100s exposure time only
29.08.03
© KB
BI

Compensate a lower SRB with a higher SNR
Another example with 8mm steel weld (test weld BAM5)
Film AGFA D2, class C1 EN 584-1 PE XRD1620 detector (200µm SRB),

, April, 2007
330s exposure time magnification of 3.0

100s exposure time only
29.08.03
© KB
BI

Advantages of Digital X-Ray
Time of Inspection will be reduced
Example (from Boeing): 6“ diameter Inconel, 10 welds
Film Process: 2-3 hours
Digital X-Ray: 12 minutes 10 seconds
Avoiding high Recurring Costs (Chemicals and Film)

No Chemical Processing incl. associated facilities + waste water handling
Lower Storage Costs - cheaper Archiving
Faster Access to an Image in the Database - if needed
Image Transfer from one Location to another in few seconds (network)
Very short set-up time with manipulation system (no film transport)
, April, 2007
Ability to use Digital Image Processing like Filter, Zoom, Measurement

Smaller Footprint
29.08.03
© KB
Inspection of larger Range of Material Thicknesses within one Image

BI
Higher recognition rate of defects in production ...


Comparison of Film (single wall, double wall), RT und DR
done by Bill Meade, Clay Kidwell, Greg Warren (Boeing Commercial Aircraft)
100%
© KB
BI , April, 2007
29.08.03
Digital System: Thales FS35 with YXLON Image 3500 DD

Result of the POD Study by Flaw „Volume“ (Depth x Length)
© KB
BI , April, 2007
29.08.03

Saving time using DDA systems
Necessary time for inspection of a part:
2 – 3 hours with Radiography using the current film process
35-40 minutes with current radioscopy inspection
12 minutes are sufficient for the same task with the DDA system
Hint:
The POD was not done with
the best available DDA.
New gereration of DDAs
increase SNR and CS by
, April, 2007
factor of 2.5.
29.08.03
© KB
BI

Example: Small Turbine Blade with ASTM Penetramter „5“
Film Agfa D2,
420s exp. time
digitized with
Images highpass filtered

50µm and 16 Bit
, April, 2007
DDA + µ-Focus
29.08.03
PE XRD1620,
© KB
60s exp. time

BI

Cutout of Penetrameter with the 3 Holes
Film Agfa D2,
420s exp. time
digitized with
50µm and 16 Bit
254µm
, April, 2007
DDA + µ-Focus
29.08.03
PE XRD1620,
© KB
60s exp. time

BI

Example: Small Titanium Duct with Penetramter „5“
Film Agfa D2 DDA System
100s exposure time 16s exposure time
Images highpass filtered

© KB
BI , April, 2007
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Cutout of the defects in the weld
Film Agfa D2
100s exposure time
DDA System
16s exposure time
© KB
BI , April, 2007
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50µm

Inspection of Ducts, potential for ADR ?
© KB
BI , April, 2007
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© KB
BI , April, 2007
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Diameter 0.05mm
© KB
BI , April, 2007
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Conclusion:
The new DDA systems are suitable for film replacement, ADR and CT
Basic Parameters for Digital Radiology are
- Basic Spatial Resolution (SRB)
- Contrast Sensitivity (CS)
- Dynamic Range Î Specific Material Thickness Range
- Normalized SNR (SNRNorm) Î Efficiency
SNRNorm of DDA system depends on
- integration time,
- calibration procedure and
- radiation quality
DDA systems can exceed Film systems by factor >20 in SNRNorm
, April, 2007
Very high SNR gives a superior Contrast Sensitivity CS

29.08.03
A high Contrast Sensitivity can compensate a lower SRB

© KB
With > CS fine details <1 pixel size give enough signal to become visible
BI
Adapted Filters increase the Visibility of Inhomogenities


Digital Detector Arrays (Flat Panel Detectors) : April 2007

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