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Test Report No. : CE/2008/57846 Date : 2008/06/05 Page : 1 of 4

UNITED MICROELECTRONICS CORP. *CE/2008/57846*

NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU CITY, TAIWAN 300, R. O. C.

The following sample(s) was/were submitted and identified by/on behalf of the client as :

Sample Description : UMC WAFER-Cu PROCESS

Sample Receiving Date : 2008/05/27
Testing Period : 2008/05/27 TO 2008/06/05

===========================================================================================

Test Result(s) : Please refer to next page(s).

The content of this PDF file is in accordance with the original issued reports for reference only. This Test Report cannot be reproduced, except in full,
without prior written permission of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this report is unlawful and
offenders may be prosecuted to the fullest extent of the law.
SGS TAIWAN LIMITED NO. 136-1, Wu Kung Road, WuKu Industrial Zone, Taipei county, Taiwan.
t(886-2) 22993939 f(886-2) 2299-3237 www.sgs.com.tw
 Test Report No. : CE/2008/57846 Date : 2008/06/05 Page : 2 of 4

UNITED MICROELECTRONICS CORP. *CE/2008/57846*

NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU CITY, TAIWAN 300, R. O. C.

Test Result(s)

PART NAME NO.1 : WAFER

Result
Test Item (s): Unit Method MDL
No.1
PFOS mg/kg With reference to US EPA 3540C : 10 n.d.
1996 method for PFOS Content.
Analysis was performed by LC/MS.
PFOA mg/kg With reference to US EPA 3540C : 10 n.d.
1996 method for PFOA Content.
Analysis was performed by LC/MS.

Note： 1. mg/kg = ppm

2. n.d. = Not Detected
3. MDL = Method Detection Limit

The content of this PDF file is in accordance with the original issued reports for reference only. This Test Report cannot be reproduced, except in full,
without prior written permission of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this report is unlawful and
offenders may be prosecuted to the fullest extent of the law.
SGS TAIWAN LIMITED NO. 136-1, Wu Kung Road, WuKu Industrial Zone, Taipei county, Taiwan.
t(886-2) 22993939 f(886-2) 2299-3237 www.sgs.com.tw
 Test Report No. : CE/2008/57846 Date : 2008/06/05 Page : 3 of 4

UNITED MICROELECTRONICS CORP. *CE/2008/57846*

NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU CITY, TAIWAN 300, R. O. C.

Analytical flow chart of PFOA/PFOS content

1) Name of the person who made measurement: Carrie Liu
2) Name of the person in charge of measurement: Shinjyh Chen

Sample pretreatment

Sample extraction by soxhlet extraction

(Reference method US EPA 3540)

Concentrate/Dilute Extracted solution

Analysis was performed by LC/MS

Data

The content of this PDF file is in accordance with the original issued reports for reference only. This Test Report cannot be reproduced, except in full,
without prior written permission of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this report is unlawful and
offenders may be prosecuted to the fullest extent of the law.
SGS TAIWAN LIMITED NO. 136-1, Wu Kung Road, WuKu Industrial Zone, Taipei county, Taiwan.
t(886-2) 22993939 f(886-2) 2299-3237 www.sgs.com.tw
 Test Report No. : CE/2008/57846 Date : 2008/06/05 Page : 4 of 4

UNITED MICROELECTRONICS CORP. *CE/2008/57846*

NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU CITY, TAIWAN 300, R. O. C.

** End of Report **

The content of this PDF file is in accordance with the original issued reports for reference only. This Test Report cannot be reproduced, except in full,
without prior written permission of the Company. Any unauthorized alteration, forgery or falsification of the content or appearance of this report is unlawful and
offenders may be prosecuted to the fullest extent of the law.
SGS TAIWAN LIMITED NO. 136-1, Wu Kung Road, WuKu Industrial Zone, Taipei county, Taiwan.
t(886-2) 22993939 f(886-2) 2299-3237 www.sgs.com.tw