Scanning Electron Microscopes (SEM)
EVO® Series
High Performance, Total Flexibility
We make it viHWKossol SA.
Carl Zeiss Microscopy
Electron and lon Beam
Microscopes
application
of choice.EVO*® Series
High Performance, Total Flexibility
‘Analytical Platform
8 Chass leading X-ray geometry
18 Class leading secondary electron imaging in variable pressure
‘= Clean pumping technology with fast pump down
‘= High repeatability stage with extended stage travel
‘= Modular design based around 3 chamber sizes
unique HD Imaging
1 High Definition imaging with source brightness 50 times higher
than conventional SEMs
18 Superior resolution at low KV for dramatically enhanced surface
maging
1 Improved analytics at high probe currents
Environmental Electron Microscopy
EVO" LS mi
es capable of operating with wet specimens
Lp to very high extended pressures of up to 3000 Pa
18 Dedicated suite of detectors for brillant imaging in varia
pressure and environmental modes
‘8 1 mm BeamSleeve" for enhanced analytical accuracy
Ease of Use
1 Intuitive operation for novices and experts alike
‘8 Advanced navigation for enhanced productivity and throughput
18 £25yVP for seamless switching between HV and VP operation
12 SmartSEM™* interface for highly productive operation of the SEM
Future Assured
18 Upgrade from MA series to full environmental capabilities
18 Detector upgrades from large portfolio
AW Kessel SA.
sem
Scanning Electron Microscopes
FESEM
Field Emission ~ Scanning Electron Microscopes
Hin
Helium lon Microscopes
Crossteam*
‘CrossBeam® Workstations (FI8-SEM)
TEM
‘Transmission Electron MicroscopesEVO® MA Series for Materials Analysis
High Performance, Total Flexibility
m Geoscience
= Manufacturing
= ForensicsApplications in Geoscience
EVO® MA Series
MA is the ideal SEM for advancing knowledge in the g
hin the geological community, the seanning electron
microscope provides both morphological and mineralogical analysis of rocks
‘The £VO" reveals details of composite materials and visualiz
detail, such as biestrategraphy and zonation, to yield information about rock
1ed detectors offers 8 peetless choice of imaging
tallies is pr SE imaging in both
vacuum and variable pressure modes to identity minerals
the microstructure of rocks using backscatter
jolumine
sand cortl
~ Optimiz
length disper
rough and pol
The class leading X-ray geometry, high stability colurnn design and pr
0° the platform of choice for automated analysi
ATLAS™ and SmartStitch® offer the user two ways of large field scanning
electron microscopy. ATLAS™ expands the EVO®’s capabilities by acquiting
Images up to 32k x 32k plaels. Acquiring high resolution giga-pixel images
arge areas provides geologists with the oppor ficiently
large amount
mode ec,
M mining, oil and gas
fundamental research into the elemental mab
SSmartPI*is the all-round solution of choice re
xX
Se
it¢
NA
tlApplications in Manufacturing
EVO® MA Series
The scanning
manufacturing. From the
manufac
rend of continuing miniaturization,
home in the manufat
prod
smartPr
‘pical Applicat
erzati
articles in foodstuffs and pharmaceut
9 the large range of compatibleApplications in Forensics
EVO® MA Series
Much of the forensic scientist's mission is to analyze and compare crim
X-ray microanalysis has the ability to image, identify and compa
1en examination by other methods may be inconclusive,
{At the same time
ocuments, including bank note forgery
1 Fabric analys
f= Hair and other human sample comparison and analysis
imple is to be avoided
offered by the EVO"HW Kessel Sh.
EVO® LS Series for Life Sciences
High Performance, Total Flexibility
m Plant Science
= Zoology
= Microbiology
he EVO" LS series delivers a new imagin
in life scienc
plies, For fauna, fk
con earth
face morphology,
the EVO® series fully complements optical microscopy methods
elect
copes unravel the
le designs
Providing a high magnification imaging solution for
Configured as a life science tool, the EVO" LS series can maintain 2 high
humidity 10 loss through
dehydration artefa
t in tis way
re made visible.Applications in Plant Science
EVO® LS Series
EVO" LS is the ideal SEM for the U
jence community, an arena that
throws up difficult imaging challenges on a regular basis, A tue
Environmental SEM, every model in the EVO* LS family isa significant
advance in electron microscopy, all
ving samples and specimens to be
examined in their natural state under a range of conditions including very
high water vapor pressure up to 3000 Pa, Wet samples can be imaged
vith ease, dehydration artifacts eliminated, and hydration and rehydratio
processes studied through water condensation with the optional Cools
With every specimen and all atmospheres, outs
jing data-rich images are
ptured due to the optimized optical geometry, true secondary electron
ection afforded by an unparalleled range of detectors and class-leading
Xray analysis.
= Phytopathology — the study of plant y environmental
hi, bacteria, nematodes and
parasitic plants. Vitalin maximizing crop yields of existing varieties and i
the development of , the ability to image both
plant and disease vector in Environmental SEM conditions in thelr natural
ditions or pathogens, such a:
state isa key requicemer
Morphology ~ although the form and structure of plants has been
studied for centuries, the detail provided by the Environmental SEM is
inparalels
Micromorphological Analysis ~ combining the study of structure with
physiology. This is
an area of great current interest with the continuing push t
analysis of content, this area overlaps with plat
nutrient value in food crops and the drive to develop energy craps. Both
areas require an intimate understanding of the distribution of molecules
-ompaunds within the plant and plant seed
Textile Studies ~ the use of crops for textile productio
continues to
be a driver for efforts to maxin
Yield and manipulate microstructure for
mechanical benefit
16
7Applications in Zoology
EVO® LS SeriesApplications in Microbiology
EVO® LS Series
to the use
simpleEvo" 10 Evo"15
offers large offers @ port to
stage movement the chamber for
and versatile additional wos
accessory options Instrumentation
Evo" 25
offers @ very large
‘chamber 10
accommodate
‘even the tallest
‘and heaviest
objects
EVO® MA and LS Series
Evolutionary processes drive changein All EVO instruments feature varable New tothe EVO" family, EVO* HD
allsjstems~ organic and inorganic. pressure (VP) technology as standard rings high definition to SEM
As the rate of change gathers pace, _ andthe Cal Zess unique Future s architecture delivers an electron
new and ineressingly diverse demands Assured technology ensures that all beam that is more than 100 times
are paced on the imaging and VO microscopes can be upgraded brighter thana tungsten source at 1&V
analytical instruments that we use to 10 full Environmental SEM capabiliy, and more than 40 times brighter at
chat its progress and identify new EVO" LS instruments are perfectly TOW This higher Brightness results in
opportunites. adapted for enironmental SEM 2 two-fold improvement in low-kV
capturing high quality images from imaging teoltion that unlocks
The £VO* MA and LS microscopes have hydrated specimens and wet dynamic _unvaled performance
evolved to meet the challenges processes at vey high extended
presented in materals analysis and fe pressures of upto 3000,
sciences. Encompasing 2 choice of
thie aifecent chambers, three source Every EVO microscope shares the class
technologies. a large range of detectors leading flextbilty, X-ray analysis
and sophisticated software, the new capably and image quality inherent in
EVO" builds on the foundations uit its refined design Evry EVO* user
cover decades of Cal Zeiss SEM benefits fom the productivity gains that
innovation, With is class-leading mage come from making this unparalled