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Scanning Electron Microscopes (SEM) EVO® Series High Performance, Total Flexibility We make it vi HWKossol SA. Carl Zeiss Microscopy Electron and lon Beam Microscopes application of choice. EVO*® Series High Performance, Total Flexibility ‘Analytical Platform 8 Chass leading X-ray geometry 18 Class leading secondary electron imaging in variable pressure ‘= Clean pumping technology with fast pump down ‘= High repeatability stage with extended stage travel ‘= Modular design based around 3 chamber sizes unique HD Imaging 1 High Definition imaging with source brightness 50 times higher than conventional SEMs 18 Superior resolution at low KV for dramatically enhanced surface maging 1 Improved analytics at high probe currents Environmental Electron Microscopy EVO" LS mi es capable of operating with wet specimens Lp to very high extended pressures of up to 3000 Pa 18 Dedicated suite of detectors for brillant imaging in varia pressure and environmental modes ‘8 1 mm BeamSleeve" for enhanced analytical accuracy Ease of Use 1 Intuitive operation for novices and experts alike ‘8 Advanced navigation for enhanced productivity and throughput 18 £25yVP for seamless switching between HV and VP operation 12 SmartSEM™* interface for highly productive operation of the SEM Future Assured 18 Upgrade from MA series to full environmental capabilities 18 Detector upgrades from large portfolio AW Kessel SA. sem Scanning Electron Microscopes FESEM Field Emission ~ Scanning Electron Microscopes Hin Helium lon Microscopes Crossteam* ‘CrossBeam® Workstations (FI8-SEM) TEM ‘Transmission Electron Microscopes EVO® MA Series for Materials Analysis High Performance, Total Flexibility m Geoscience = Manufacturing = Forensics Applications in Geoscience EVO® MA Series MA is the ideal SEM for advancing knowledge in the g hin the geological community, the seanning electron microscope provides both morphological and mineralogical analysis of rocks ‘The £VO" reveals details of composite materials and visualiz detail, such as biestrategraphy and zonation, to yield information about rock 1ed detectors offers 8 peetless choice of imaging tallies is pr SE imaging in both vacuum and variable pressure modes to identity minerals the microstructure of rocks using backscatter jolumine sand cortl ~ Optimiz length disper rough and pol The class leading X-ray geometry, high stability colurnn design and pr 0° the platform of choice for automated analysi ATLAS™ and SmartStitch® offer the user two ways of large field scanning electron microscopy. ATLAS™ expands the EVO®’s capabilities by acquiting Images up to 32k x 32k plaels. Acquiring high resolution giga-pixel images arge areas provides geologists with the oppor ficiently large amount mode ec, M mining, oil and gas fundamental research into the elemental mab SSmartPI*is the all-round solution of choice re xX Se it¢ NA tl Applications in Manufacturing EVO® MA Series The scanning manufacturing. From the manufac rend of continuing miniaturization, home in the manufat prod smartPr ‘pical Applicat erzati articles in foodstuffs and pharmaceut 9 the large range of compatible Applications in Forensics EVO® MA Series Much of the forensic scientist's mission is to analyze and compare crim X-ray microanalysis has the ability to image, identify and compa 1en examination by other methods may be inconclusive, {At the same time ocuments, including bank note forgery 1 Fabric analys f= Hair and other human sample comparison and analysis imple is to be avoided offered by the EVO" HW Kessel Sh. EVO® LS Series for Life Sciences High Performance, Total Flexibility m Plant Science = Zoology = Microbiology he EVO" LS series delivers a new imagin in life scienc plies, For fauna, fk con earth face morphology, the EVO® series fully complements optical microscopy methods elect copes unravel the le designs Providing a high magnification imaging solution for Configured as a life science tool, the EVO" LS series can maintain 2 high humidity 10 loss through dehydration artefa t in tis way re made visible. Applications in Plant Science EVO® LS Series EVO" LS is the ideal SEM for the U jence community, an arena that throws up difficult imaging challenges on a regular basis, A tue Environmental SEM, every model in the EVO* LS family isa significant advance in electron microscopy, all ving samples and specimens to be examined in their natural state under a range of conditions including very high water vapor pressure up to 3000 Pa, Wet samples can be imaged vith ease, dehydration artifacts eliminated, and hydration and rehydratio processes studied through water condensation with the optional Cools With every specimen and all atmospheres, outs jing data-rich images are ptured due to the optimized optical geometry, true secondary electron ection afforded by an unparalleled range of detectors and class-leading Xray analysis. = Phytopathology — the study of plant y environmental hi, bacteria, nematodes and parasitic plants. Vitalin maximizing crop yields of existing varieties and i the development of , the ability to image both plant and disease vector in Environmental SEM conditions in thelr natural ditions or pathogens, such a: state isa key requicemer Morphology ~ although the form and structure of plants has been studied for centuries, the detail provided by the Environmental SEM is inparalels Micromorphological Analysis ~ combining the study of structure with physiology. This is an area of great current interest with the continuing push t analysis of content, this area overlaps with plat nutrient value in food crops and the drive to develop energy craps. Both areas require an intimate understanding of the distribution of molecules -ompaunds within the plant and plant seed Textile Studies ~ the use of crops for textile productio continues to be a driver for efforts to maxin Yield and manipulate microstructure for mechanical benefit 16 7 Applications in Zoology EVO® LS Series Applications in Microbiology EVO® LS Series to the use simple Evo" 10 Evo"15 offers large offers @ port to stage movement the chamber for and versatile additional wos accessory options Instrumentation Evo" 25 offers @ very large ‘chamber 10 accommodate ‘even the tallest ‘and heaviest objects EVO® MA and LS Series Evolutionary processes drive changein All EVO instruments feature varable New tothe EVO" family, EVO* HD allsjstems~ organic and inorganic. pressure (VP) technology as standard rings high definition to SEM As the rate of change gathers pace, _ andthe Cal Zess unique Future s architecture delivers an electron new and ineressingly diverse demands Assured technology ensures that all beam that is more than 100 times are paced on the imaging and VO microscopes can be upgraded brighter thana tungsten source at 1&V analytical instruments that we use to 10 full Environmental SEM capabiliy, and more than 40 times brighter at chat its progress and identify new EVO" LS instruments are perfectly TOW This higher Brightness results in opportunites. adapted for enironmental SEM 2 two-fold improvement in low-kV capturing high quality images from imaging teoltion that unlocks The £VO* MA and LS microscopes have hydrated specimens and wet dynamic _unvaled performance evolved to meet the challenges processes at vey high extended presented in materals analysis and fe pressures of upto 3000, sciences. Encompasing 2 choice of thie aifecent chambers, three source Every EVO microscope shares the class technologies. a large range of detectors leading flextbilty, X-ray analysis and sophisticated software, the new capably and image quality inherent in EVO" builds on the foundations uit its refined design Evry EVO* user cover decades of Cal Zeiss SEM benefits fom the productivity gains that innovation, With is class-leading mage come from making this unparalled

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