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(ReLewed June 11,1991, m rewed form September IO, 1991, accepted November 19, 1991)
Abstract
S&am-gauge transducers with polyslhcon resistors can be used successfully m vanous sensors They have some
advantages m comparison to monocrystalhne slhcon strain-gauge transducers However, not enough mformatlon IS
available for the quahtatlve design of such transducers The theoretical prmclples of the temperature dependence of
the output sIgnal for a constant supply voltage and constant supply current are described A polyslhcon strain-gauge
transducer with a square diaphragm fabricated on the discussed pnnclples IS reported It has an operatmg
temperature range of - 190- + 300 “C, and weak temperature dependence of the output wgnal
deposit polycrystalhne slhcon films on various m- x (50~ - 6u2 + I)@’ - 1)3], I = 1,2 (1)
sulator coating substrates [3,4] The second ad-
vantage 1s the good electrical msulatlon between T6 = Auv[a,(u2 - l)(v2 - 1) + a&’ - l)‘(u* - l)‘]
plezoreslstors and substrate, consequently the tem- (2)
perature range of a polycrystalline strain-gauge
with
transducer 1s not limited by the leakage current of
the p-n Junction A = Paz/h*, u =x,/u, v =x2/u,
In this paper we shall discuss the prmclples of and u,(*) = u3(1), 42) = a,“), u2(*) = u4(l’, u (2)=
4
the temperature dependence of the output signal
a,“‘, 0 65971,
a,“’ = a$‘) = 0 19841, a$” =
from a diaphragm pressure transducer with
-0 04130, u4(‘)= 0 01242, us = - 1 58189, us =
polyslhcon resistors, and compare the calculated
0 71363, where P = pressure, 2a = the dla-
results with the measured characterlstlcs
phragm dimension, h = the diaphragm thickness,
and a,(” = coefficients
There 1s no shear component near the edges of
Theory
the diaphragm and on the axis T, = 0, and one can
easily calculate the biaxial stress field T,, T2 m the
Consider a strain-gauge transducer with polynh-
substrate The substrate strains are connected with
con resistors situated on an oxidized &con sub-
substrate stresses by the compliance coefficients
strate The transducer has a square silicon
Slk
diaphragm on the ( 100) plane with sides parallel to
the (110) directions (Fig 1) Polyslhcon resistors 6, = s,k Tk (3)
uo,,=+’(4 (4 - ME))
c6ut= Klp
46)
RI(E)
-
+
R2W
R2(4 1 (6)
Taking mto account eqn (4), the temperature
coefficients of the output signal can be calculated
by dlfferentlatmg eqns (5) and (6)
21- x*
TKU,,,, = TKK i- TKR for I = const (9) x
20‘ *
x
In the case of polycrystalhne resistors, the tem- fa - z
and
Gauge factors, resistance and Hall effect were
TKK, - 2 TKK, measured over the temperature range - 190-
T
TKU,,, = (13) + 300 “C The sheet resistance of the polyslhcon
I-; films at room temperature 1s 54 Q/O and the
( ) carrier concentration 1s 1 x 10” cmF3 The temper-
respectively Equations (12) and (13) determine the ature coefficient of reslstlvlty m the range + 20-
peculiarity of the temperature compensation of an + 300 “C 1s0 09%/“C The temperature dependences
output signal from strain-gauge transducers with of the longltudmal and transverse gauge factors
polysihcon resistors are shown m Fig 3 It 1s obvious that the temper-
aure dependences are different In the temperature
range + 20- + 300 “C, TKK, = - 0 06%/“C and
Experimental TKK, = - 0 1l%/‘C Between K, and K, at room
temperature there exists a relation K, x - 2 K,
Test structures Takmg mto account this relation, eqns (12) and
The mvestlgatlon of the longltudmal and trans- (13) have the forms
verse gauge factors, their temperature dependences
and the temperature dependence of reslstlvlty was TKU,,, = TKR •t ; TKK, f f TKK7
performed on the test cantilever structures The for ISUp= const ( 14)
sensltlve polyslhcon layers were deposlted on ther-
mally oxidized ( 100) -onented slhcon substrates, and
with an oxide thickness of 0 3 pm For the 0 6 pm
TKU,,, = 4 TKKF + 3 TKK, for UsuP= const
polyslhcon deposition, a LPCVD process at 625 “C
was used The doping was performed by diffusion (15)
of boron from a hard BN source After annealmg,
the structures were patterned and contacted with Strain -gauge pressure transducer
alummmm, then they were passlvated by an oxide Based on the discussed pnnctples and described
film The polyslhcon films have a dominant (110) technology, a polyslhcon strain-gauge transducer
onentatlon perpendicular to the film surface was designed and fabncated The transducer was
222
5 mm x 5 mm x 380pm m size and the diaphragm TABLE 1 Temperature coefficients of output slgnal m the tempera-
2 mm x 2 mm x 45 pm The diaphragm was pro- ture range + 20- + 300 “C
duced with the help of the amsotroplc etch tech- Calculated Measured
nique m KOH The value of the polyslhcon resls-
tors 1s (560 + 5) Q, and they are connected m the output Slgndl mV 34 8 33 7
T=2O”C
bridge clrcmt To stabilize the mltlal output signal,
the diaphragm has a passlvatmg oxide coating Temperature coefficient of 001 0 02
output slgnal (“/o/“C),
The transducer 1s connected with the glass of the CUP= const
package by electrical bonding
Temperature coefficient of -008 -005
output slgnal (%/“C),
(I,,, = const
Results