Advanced Functionality

Agenda

„ Process Variability

„ Commissioning PID

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Emerson Confidential
27-Jun-01, Slide 2
 Impact of Reduced
Process Variability
Hard Spec. Operating Operating Average Shift
Limit Average

Feedstock and Scrap Cost

Productivity
Product Quality
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Emerson Confidential
27-Jun-01, Slide 3
 Statistical Process Monitoring

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27-Jun-01, Slide 4
 Statistical Process Monitoring

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27-Jun-01, Slide 5
 Measurement of Process Variability *

Process
Value

Time

“Capability” “Total”: All Data

Only Random Including Short
or Short Term and Long Term
Variability Variability
Reference: ‘Achieving Workd Class Manufacturing through
Process Control’ by Joseph Shunta, Dupont, 1995*
[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 6
 Variability Indicators May be Added To
Fieldbus Devices
∑(Xi ) ∑(Xi − Xi −1 )2
n n
2
−X
Stot = i =1
Scap = i =2
n −1 2 (n −1)

Total and Capability

Standard Deviation is
Calculated by I/O and
Control Blocks

[File Name or Event]

Emerson Confidential
27-Jun-01, Slide 7
 Calculation Should be Done at The
Fieldbus Device
2.5
Standard Deviation - %

Stot
2

1.5

0.5 SPI
SPID
SLQ
0

0 1 2 3 4 5

Ratio of process time constant to sample

time
τ /T S

Source: World Class Manufacturing Through Process Control

[File Name or Event]
Emerson Confidential
27-Jun-01, Slide 8
 Block Parameters for Total and Capability Standard
Deviation

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27-Jun-01, Slide 9
 Detecting Abnormal
Conditions in Input Blocks

Status Indicates: Quality (Good, Uncertain, Bad)

Reason (Device Failure, Sensor Failure, etc.)
Limit (not limited, high limited, Low Limited)

[File Name or Event]

Emerson Confidential
27-Jun-01, Slide 10
 Detecting Abnormal Conditions in
Output Blocks

Status Indicates: Quality (Good, Uncertain, Bad)

Reason (Device Failure, Sensor Failure, etc.)
Limit (not limited, high limited, Low Limited)

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Emerson Confidential
27-Jun-01, Slide 11
 Detecting That Control is Limited by
Downstream Conditions

Status Indicates: Quality (Good, Uncertain, Bad)

Reason (Device Failure, Sensor Failure, etc.)
Limit (not limited, high limited, Low Limited)

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Emerson Confidential
27-Jun-01, Slide 12
 Detecting Incorrect Mode of
Operation

Mode Attribute: Target (Operator Requested Mode)

Actual (Mode of operation)
Normal (The designed Mode)
Permitted( Modes that may be selected)
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27-Jun-01, Slide 13
 Host May Utilize Mode, Status and
Statistics

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Emerson Confidential
27-Jun-01, Slide 14
 Agenda

„ Process Variability

„ Commissioning PID

[File Name or Event]

Emerson Confidential
27-Jun-01, Slide 15
 Structuring Control For A
Distributed Environment
Traditional,
Centralized Distributed
Approach Approach
Control &
Autotuning

Limited
LimitedSample
SampleRate,
Rate,
Delay/Variation
Delay/Variation
introduced
introducedby
by
Communications
Communications /control &
Autotuning

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Emerson Confidential
27-Jun-01, Slide 16
 Application Used For Tuning in
Field Device

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27-Jun-01, Slide 17