a papamton smevoiva Bee [oy nf Blan Aceon m sons sees a the 7S ‘ neained) |S Bouvines es Seng roche we ion above 10 MeV. Section 43.2 includes special method for cle ling slelding-barrer thicknesses for radiotherapy machines, Ut ling the parameter W. Certain classes of noncontroled areas surrounding en acolerator facility can be assumed to be occupied by the general public form fraction ofthe total weekly period during which the radiation under ‘consideration i directed atthe area, An occupancy fartr,T can be introduced to modify the maximum radiation emiaion rate Wed fn seling celealtins, Typical values for are described in Append 42 METHODS OF CALCULATING SMIELDING THICKNESS 49 43 Methods of Calculating Shielding Thickness 43.1, Calculations for Charged Poticle Beams (Electrons and Ions) ‘The requited shielding thickness for charged particle beams is ‘essentially independent of the beam-current density impinging on the absorber: Despite the fat that charged particles lose energy nd ely become barbed in air, ie aafer to ignore any eneriy {ons in calculating shielding thicknesses, unless the distance between ‘accelerator and the locaton ta be shielded i equivalent to, oF grestor ‘than, the maximum range ofthe particles in ai. lectcon ranges in alt, water, tna, aluminum, and lead are plotted asa funtion of incident particle energy in Appendix D1. To frst approximation. electron ranges are inversely proportional ta the ensity ofthe absorbing material Information onthe backecatering of electrons ie given in Appendix D2 Proton ranges are plotted in Appendix D', as a funtion of proton energy, for aluminum, copper; lead, and uranium. Coresponding ranger for deuterons tritons, "He, and ‘He fone can be calculated {ram the proton range by means of conversion formulae inched in Appendix D3. "Bren though charged particles in an external beam ean be cot pletely absorbed in shielding material, edditional thickness may be required in the barrier to aenuate the seondary radiations pro- {duced in the shield from the various processes by which the inping ing particles become absorbed. X raya, amma ray, andor neutrons ‘an be protoced by particle interactions with the shielding material Shielding barrier calculations for theve penetrating radiations re Aiscused below, in Sections 43.2 and 42°, The source of these radiation i, ofcourse, the volume radiated area times the particle ange) ofthe shielding mate 482 (Calculations for X Raye X rays are attenuated approximately exponentially through mate. rial. The dove equivalent index rate diminished only fractionally ‘through each inetemental thickness of material, nd theoretically never becomes zero. It is necesary, therefore, to determine the shielding transmission rato for xrays B, by Which Use done equiv lent index rate shal! be diminished through the shielding barrier thickness to appropriate Fy and doselimit levels, Thi shieldingTE Tan Baitioine™” {rama rato gover the thickness af the shleding brs, aa cee ater ins Seton 4-Primary X Root, When the primary xrays dominate the sil ing tution te Section 123, ten for pin eure as voy gest Favs the Gere ® ae Bers xwnts a Bes > where ~ By is the shielding transmiasion ratio for x rays: the value by ‘whieh the xray absorbed dose index rate hat incident on the entrance face ofthe shielding barrier shall be diminished by the barrier thicknes to the requisite levels of and dose limit rate a the ext Fae af the barrier, Dis the sbworbed-dwe inex rate rads on min”) ata standard Telerence distance of! mete rom the mute ‘isthe maximum permisible drerequlvalent o delimit rate (eo Section 421 (mrem he) 4 is the datance between soray source and reference point (me ters Tin the aren occupancy factor (ace Appendie 8)! ‘The constant (1.67 « 10°) = (1> 10°) fad rem (1.67 x 10+ rast etry fh long eaptein my bed y= oan (Had a ore Bethe hiding amin at fr om ater W. isthe workload (rem m# week Fl isthe Hor delimit rate expressed in rem wook ', the {ime interval commonly Used la radiotherapy operation ate Section 428) ‘Transmission curv of Brod. beat xray geometriea ate presented in Appendices £7 to E11, in which the shielding ranamiation rato, Bain given an a fintion of shielding thickness for aolction of electron energies producing thicktarget x ray from very high ‘materials In ll caen, the effets on deve-cquivalen Inder rte doe to modification of x-ray spectrum In the shield ere implicit. For ‘aleulated 8, the thickness of shielding barrier ean bw ead direc eee el {rom thes tansmiasion curves, or the materia fies reprenented. Curves find lead For ‘ray energies other than thowe given in the transmission curves, B, canbe related tothe ahilding thickness in ters of the ‘number of tenthvalue layers of the shielding material tat sve ‘equied to diminish the radiation to fly or dose init levels A tents ‘value layer i that thickness through which the xtay dove equivalent ‘in diminihed by a feta of 10. Hence, B, = 10%; orm = log (/8,) 6 ‘where nis the numberof tenth value layers ‘The slope ofthe semilogarithmic plo of broad-beam x-ray tans ‘miasion vs thickness varies somewhat asthe thickness Is incrensed, bout the moat significant change occurs during the frst lecade if teanamiasion, Subsequent changes are relatively small, even ove several decades of transmission Consequently, a value for ane "brut tenthvslue layer cam be conservatively enimated for pur se of calculating shielding-barier thickness, 8. nd electron ene Fe presented Tor ordinary concrete, ste! S27 +«n- 07; 6 where ‘is the shielding barrier thickness: 7, lathe frat tenth-vaue layer in the shielding thickness, facing the radiation soure: 7, ls the subsequent tenth-vale | value, o in equilibria Values of 7, and 7, for ordinary concrete, steel, and lea re plotted in Appendices B.12 to -14 aa a function of the energy of he lectrons incident ona thick radiation producing target” plicit in Esai 'y om atest aed om te bra ese ‘ton inion 231 One Bann yet, approximately constant in Aen sre 9/2 hv Bi tal trod fm the Me trac Append Howe, creapondng eth vlc ee ‘arcane om hoped Bt Prom aie5274 RapiaTiON aieonec thete values are considerations of mulation of ray apectea in the shielding thickness, For low-Z, shielding materials other than those presented in the curves mentioned above, methads of deriving spproprite barrier thicknesses are daseribed in Section 41 ‘When @ shielding harrier is struck by an externally produced electron beam, the electrons generate x ray at or near the surge of that harrier. This pot must be considered the source for these rays. The lateral extent ofthe a-ray source depen dvetly othe 2meters; 17 = 64% 10% (dy O12 ord = 20 meter,01 « eaDiamon sinetowNo § S & § 8 & : there dua ls the skynhineneutron uence rate (oi in 4") at Aitance a ‘These equations relate to pont isteope source of MeV ne trons, but they provide a reasonable estimate of skyshine from ne ‘rons of other energies. For example, Lindenbaum (1857 eatimated thatthe skyshine neutron fence rate it abost 10 percent ol the Unshlelde rate at 12 metre fom the neutron vous, fo nets in the Ito 1OMEV range, auming 2/2 ~ Te the open plan), and that the barrier tothe sdeward directed ta infinity” thick This atimata a about 90 perent higher than that obtained from Equation (18. For proses ofelclating shielding, the value obained from Equations (7) and (A) ahould be increased bya factor of two, to be comervative “The shield thiknea for the rot can be cleat by the methad| deseribed in Section 433. When neutron akyshine dominates the Shielding situation, the rof shielding tranemieion ratio, Bt “htainablethrough's madifetion of Equation (ID), replacing yo then be of yan Ge a ec 27x 10 9| ada Wor d, > 20 metersi; (19) sar cies) er > 20 mae . . | 452. Detachable and Temporary Shietding sa POINT CONTROL LED AREA ua ) Fraction of Electrons Backscattered bait | { of | Ns | pat Sane hte ae uct wtot iit nin nr Fer prc ‘Sisaig ition tet heme sary Slt gros ofDa Range of Proton uP PROTON RANGE (9 en?) 10 100 PROTON ENERGY (MeV) ce fern. APPENDIX E X Rays and Gamma Rays BAL X-Ray Bmbnon Rate rom igh Tarte 10 1 wit FoRWaRO . tT DuRECTION roy fh 0 Sioewano ) DIRECTION (904), OTE ET LEE 01 FTF FF Fico 200 ELECTHON ENERGY (ev)E.2- Angular Dsbtion of Emit X Rays from High Targets we. A 2 sim (Se fF tes e po Cr ar er er er er) ne FROM CIENT ELECTRON DIRECTION (DEREES) sup Faye gpa gen rept at The prnees tibet ong vrs aot tonne are es Ii ean tea reba tne areBs ». inion Rats rm Blecron tlagemen_|/ \ ‘on Thick Targets of Low-Z Mater hie aray emiasion rate inthe forward (0 direction i «slowly arog finden af 2,0, at low eetron energies 025 102.35 MeV, {tin proximately proportional to 2" (Buechner «fo 19660, AG high energie (upto 10 MeV), thi appeontaton al appar abe ‘reasonable (NCRP Report No.3), NCRP, 19h) The Women ales in Appendix B- shouldbe multiplied by the fllowing facts ‘or the indicated target material ‘The xray eminson rat inthe sdeward (9) direction ia mare Z- dependent particularly at low letron energies (=10' Mev), For these low energies, the flowing multipin factors shuld be eet plod tothe 8" emission eaten in Append Eo At cecronenenpes above 10 MeV, the sdeward (9) emiason ates in Appendix Bt should bused fal target materials EA X-Ray Bmision Rate from Electron Backatreaming In Direct Proton Acelerators, Estimated fom reiation eld map of 3 Vande Graaf eclers ‘ora (Bure 1906, measurementa eovsstent within actor of 2 ‘depending mainly on vacuum conditions and aeeleraio tbe de ‘gn highest values ao tabulted below atlensaton by aosertor| serial as bean Included 5 hopes tan fe cplannin a© foo ~~ sree w ES Radiations trom TwoStage Tandem Aceserators Estimated fronrrndioton surveys made at several tandem cee tor laboratories, representing extrome conditions aril, Te "ay emimion vote may be redced hy Improved secleraton tebe design arayeisson rate may increase wth heavy son acloraton| (to greater production of econdary eer within aecleraion {ube region: atanution by aclealar materiale hat hen nla, For the ca of 16 MeV protons (MV potentials mitra FE an Siam emer = tar ok = 2 0 eatin a a np De ein ye 16 Rquietent coat Hletron Energies S 8 5 6 os+ EQUIVALENT INCIDENT ELECTRON ENERGY (MeV) Lo 10 00 INCIDENT ELECTRON ENERGY (MeV)1 Broad. Beam Traramisson Through Conerete of X Raya Produced by 0. to 4 MeV Electrone serosa) 109 8 Broad Ream Traraminson Through Coneret of X Rays Produced by 05 to T6MeV Electrons ANY “NNN: geass SS Sei 5 "8" Wo” bo” abo” alo” sb mm ‘mrp td Kenedy Rr an ns {ae THe He SRC. ang RP Nee NER,0 1 even 9 aa. Tammi Tau tel of X Rays Produced by Ito 1-MeV Electron = . I | : ° | | wi} . faa . Th ee eS SET EET Avesone ©1105 Broad.eam Transmission Through Lead of X Rays Produced by Ut-t0 64-MeV Hletrone z “ANOS nin ny ary 8 ‘mason in aue tae ate Sper ErbaFoe > Arrevon e BAT Broad-Heam Transmission Trough Lead of X Raye ‘Produced by 0.5: ta 86 MeV Blestrons aS Sorieree eam neat he BAD Dose Bau lot Index Teth- Value Layers for Broad-Beam X Rays in Conerete SEE Secret ero hen* APPENDIX F so, eae neue Neutrons 2 PA Thektare Neon Fane Rats fo (pn) Heine * 10" 4 ie 7 yok 2 a pt Al ye |o7 q Zz T 3 “| A > 7 © ot a a t Sep Jem * = ley TT = So ff L = com san : 10? wo! LH, [/ r 4 ie OB a as INCIDENT PROTON ENERGY (Mev)‘Ree lore arene ty Bur ter See ee (ii So Fwy and Boy Net fo ata hi sn [F2Thck-Taret Neutron Yield or) Henctons oy . - en Kf a0 / Ss hed ht ot hater ‘im eA cn ewe1.3 "ThekcTarget Newteon Yi 10% A = uration Fe 10" ee * tf - eS | t wo w+ ft re er er er INCIDENT ELECTRON ENERGY (Mev) som aera cat ene ores nae Rene heme bya yt usr 8p ‘pts mcs am th pf fe ee ay Fst Typical Angular Distributions in Neutron Yield Ratioe _—___"“ram Several Neutron Producing ResetoneAcct Condes fa Genre Neto yc ot Neher tae Sette Ne foe BR Bo: a on te ew ‘ ress wt poe Gg oi se Rael a i ee ria ge om So"oe F.9 Doseauivalent tinder Tranemision Through Concrete ‘of Neutrons frm lon-indued Rene Denial dex Panaminion Thrah Cone aa ‘of Neutrons from (y,n) and (y.f) Reactions: wp tg pee | mug) sp IN Sittin et rey ete sarc a iste tat henson pc han Fn memati ano (rites ce pn Pa ee Agee ProneF.0 DoveHaulalent Index Tenth-Vaoe Layer in {for Monaenerpatle Ne