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PN Junction - Fomation
PN Junction - Fomation
ECE1002
p type n type
n-type Si • Oxidation
• Etching
• Ion implantation
SiO2 Ion-Imp SiO2
P-type • Evaporation > Contacts
n-type
• Characterization
Types of Junctions
n
NA ND
• Abrupt Junction
• Diffused Junction
x
nx N B e 1
pn junction - Formation
junction
When p-type and n-type regions brought intimate contact, the
majority carriers of n-type, i.e., electrons, diffuse in to
opposite region (as minority carriers) and recombine with hole
in p-type region. And Vice versa.
P-type n-type
In the region of recombination, they leave few un-
compensated minority carrier (negatively charge accepter ions
in p-type and vice versa in n-type)
kT N C N A NC
bi p n ln ln
q ni
2
N D
Potential distribution
Built-in Potential
kT N C N A NC kT N D N A
bi p n ln ln bi ln
q ni
2
N D q ni
2
Since at equilibrium nno pno p po n po ni2
kT N D N A kT nno kT p po
bi ln 2
ln ln
q ni q n po q pno
This gives the relationship between carrier densities on either side of the junction.
Using this expression, we can calculate ‘Built-in Field’ and ‘Depletion region Width‟:
Width of Depletion Layer
To simplify the analysis, the depletion
approximation is used which assumes that
the depleted charge has a box profile. Since
in thermal equilibrium the electric field in
the neutral regions (far from the junction at
either side) of the semiconductor must be
zero, the total negative charge per unit
area in the p-side must be precisely equal
to the total positive charge per unit area in
the n-side: