(62.36.1991 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits Sponsor ‘Surge Protective Devices Committee ‘of the IEEE Power Engincering Society ‘Approved June 27, 1991 IEEE Standards Board Abstract: Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V de. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combina- tions of linear or nonlinear elements. Tests are included for characterizing standby perfor mance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications, Keywords: communications circuits, data circuits, electrical protection, signaling cireuits, surge protectors, surge-protective devices, voltage limiters ‘The Institut of Electrical and Electronica Engineers, Ine "a6 Ban 47th Stet, New York, NY 10017-2004, USA, Copyright ©1902 bythe Tnatitte of Berta and Electronice Engineer, Ine, Allights reserved. Pobihed 1082 Printad'n the United States of America ISBN 650071617 [No part ofthis publication may be reproduced in ony form, ‘in-on electronic revival sys or atheriise, without the prior writen permlaion ofthe publicherIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessar ily members of the Institute. The standards developed within IBEE ropresent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEE Standard, Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to ‘change brought about through developments in the state of the art and ‘comments received from users of the standard, Every IEEE Standard is subjected to review at least every five years for revision or reaffir- ‘mation. When a document is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, al- though still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest ‘edition of any IEEE Standard, Comments for revision of IEEE Standards are weleome from any interested party, regardless of membership affiliation with IEEE. ‘Suggestions for changes in documents should be in the form of a pro- posed change of text, together with appropriate supporting comments, Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific appli tions. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate re sponses, Since IEEE Standards represent a consensus of all con- cerned interests, itis important to ensure that any interpretation has also received the concurrence of a balance of interests, For this reason IEEE and the members of its technical committees are not able to pro- vide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA TEE Standards documents are adopted by the Institate of Blectrical Jand Electronics Engineers without regard to whether their adoption| may involve patents on articles, materials, or processes, Such adop-| sion does not assume any liability to any patent owner, nor does it Jassume any obligation whatever to parties adopting the standards [documentsForeword (This Foreword isnot part of IEE C82.$61991, IEEE Standard Tent Methods fr Surge Protectors Used in Low-Voltage Date, Communications, and Signaling Ciesits. ‘This standard has been developed for the purpose of establishing methods of testing and eriteria for determining end-of-life of surge protectors for use in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combi- nations of linear or nonlinear elements, packaged for the purpose of limiting voltages or currents, or both. ‘The need for this standard has arisen because of the following industry trends: (1) The development and proliferation of numerous semiconductor surge-protection devices. (2) The manufacture and use of multiple-component surge protectors, (3) The increasing use of sensitive electronic devices that require protection while exposed to surges from the environment, At the time this document was approved by the Surge Protective Devices Committee of the IEEE Power Engineering Society, the Low-Voltage Data, Communications, and Signaling Circuits ‘Working Group 3.6.7 had the following members who contributed to the writing of this document: M. Parente, Chair G. Clarke and T. D. Zimmermann, Secretaries G. J. Bago D. W, Hatchine A Rebeck 0 Baker W.H Kapp 5 Baroluet R Medien 3.8: Bonneten ELH Marrow, J, F. Devon Phillipe AP Holland BA Potacay Others who have contributed review and comments are: A, Bazar © attey ‘The following persons were on the balloting committee that approved this document for submis: ion to the IEEE Standards Board: WA. Maguire EC Sakahaog. EL Merrow HM, Simeon IT PD. Martsett OB Standier : B. Odenbong KB Somp » 1.6. Omertost ED. Sweeney C.D. Hensal Morente D.P. Symannis G. 8. Haralampa P Richman BOR Taylor, Jr SU Roeptnger 1D. Zimmerman Mary Lyane Nieinen {REE Standards Projet Bator‘The Accredited Standards Committee on Surge Arresters, (62, that reviewed and approved this document, had the following members at the time of approval: Joseph L. Koepfinger, Chair John A. Gauthier, Secretary Organization Represented [Nome of Representative ‘Avsociation of American Rallro Wayne Bear Bonneville Power Administration. eee ett CE Le Exchange Carrere Standards Assocation... Michael Pareate lectrie Light end Power. RA. Jones in B. Fooler Wo: Mepsire Dale Becars 3. W. Wilson M. C Mingoia Ale) Institate of Electrical and Blectroles Bogincers JL. Rowpinger GL Cattaie Hanwell ie) Dale Hedman [National Elecril Manufacturers Association. 'D. Worden David Bll tle) ary Bock (al) Rural Eletsificetion Adminstration... George J. Bogaell Underwriters Laboratories . Netarian “Larry Wiliome C0) Canadian Standards Amociation..n.o:n DM, Seth Mombers-a-Large 1 Peer Goodwin FD. Marat 3. Onerboat 1h Paneear When the IEEE Standards Board approved this standard on June 27, 1991, it had the following. membership: Marco W. Migliaro, Chair Donald C. Loughry, Vice Chair Andrew G. Salem, Secretary Denals Bodo Thomas ts Hannan John B. May J Prat C, Bor LEN. Heirmen inwrence ¥. Moca Clyde Gam Kenneth B Henan Semen Me Daly doha We Horch Donsla C. Fleckenstein Ben ¢ichnsoa dota L. Rankine Sey Fortere Thor Nc night Ronald H. Reimer Dovid B. Frasklia done Rog Gary 8. Rablasoa Ingrid Frome living Kolodny ‘Terrance R. Whittemore Michael A: Lawlor ‘Member EmeritusSECTION PAGE 1. Scope... 2. Definitions....... 3. References... 4, Service Conditions 4.1 Normal Service Conditions 4.11 Environmental Conditions. 4.12 Physical Properties 1e Surge Protector Under System Conditions. 42 Unusual Service Conditions....... 4.2.1 Environmental Condition: 4.2.2 Physical Conditions. 4.2.3 System Condition: 43° Radiation... as 5. Basie Configurations... 6. Standard Design Test Procedure 6.1 Standard Design Test Criteri 62 Statistical Procedures 63. Test Conditions 7, Nonsurge Performance Tests 7.1 Rated Voltage Test 72 Rated Current Test. 73. DC Series Resistance Test... TA Standby Current and Insulation Resistance Test... TS Capacitance Test ....-.escsssnseesensee 76 Inductance Test ... 77 Analog Insertion Loss Test 78 Phase Shift Test 79 Return Loss Test. 710 Longitudinal Balance Test... TAL Digital Insertion Loss Test 712 Rise- and Decay-Time Test 713. Bit Error Rate (BER) Test BSS BEES DC-Limiting-Voltage Test 82 Impulse-Limiting-Voltage Test ...... 83. Transition Current Test 84 Current-Response-Time Test -..... 85 Impulse Reset Test " 86 Current Reset Test 87 AC Life Test 88 Impulse Life Test... 89 Maximum Single-Impuise Discharge Test SEBBBERESB SeSuEEEEESSECTION Failure Modes... Appendix 88 FrouREs Fig Basic Configurations. 9 Fig2 Test Circuits for the Rated Voltage Test. a Fig3 Test Cireuits for the Rated Current Test... 2 Fig4 Test Cireuts for the Analog Insertion Loss Test. : B Fig 4a Test Circuit Before Insertion of Surge Protector... 3 Fig 4b Test Circuits After Insertion of Surge Protector. 8 Fig5 Test Circuits for the Phase Shift Test 25 Fig6 Test Circuit for the Return Loss Test 16 Fig 6a Circuit Without Surge Protector 6 Fig 6b Circuit With Surge Protector 6 Fig7 ‘Test Circuits for the Digital Insertion Lose Test and the Rise- and Decay-Time Test. ; ” Fig8 Test Cireuits for the Bit Error Rate (BER) Test 9 Fig9 Test Circuit for the DC-Limiting-Voltage Test. » Fig 10 Test Circuits for the Impulse-Limiting Voltage Test. 2 Fig 11 Impulse-Limiting-Voltage Test Waveform 2B Big 12 Test Circuits for the Transition Current Test 22 Fig13.__Test Cireuits for the Current-Response-Time Test 1 Fig14 Test Circuits for the Impulse Reset Test. 2 Fig 15 Test Circuits for the Current Reset Test a Fig 16 Test Circuits for the AC Life Test » APPENDIX FIGURES Fig A1 Possible Internal Arrangement of Station Protector Components ... 34 TABLES Table 1 Standard Terminal Combinations for the DC-Limiting-Voltage Test Using Fig 9... 21 Table 2 Standard Terminal Combinations for the Impulse-Limiting-Voltage Test Using Fig 10 .ene.n seeeeBL Table 3 Suggested Short-Circuit, Amplitudes and Waveforms for the Impuise-Limiting- Voltage Test a ‘Table 4 Switch Status and Test Procedures for the Current Response Time Test ‘sing ‘Test Cireuits of Fig 13, ai Table 5 Examples of Parameters for the AC Life Tes Table 6 Suggested Short-Cireuit Current, Amplitudes, Waveforms, Between Impulses for the Impulse Life Test 7 Table 7 Standard Terminal Combinations for the Impuise Life Test Table 8 Standard Terminal Combinations for the Maximum, Single-impalse Discharge Test .IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits Scope ‘This standard applies to surge protectors for application on multiconductor balanced or un. balanced data, communications, and signal: ing circuits with voltages equal to or less than 1000 V rms, or 1200 V de. These surge protec: tors are designed to limit voltage surges, eur- rent surges, or both, ‘This standard describes the methods of test- ing and criteria for determining the end of life of electrical surge protectors used in low- voltage data, communications, and signaling circuits. The surge protectors covered are ‘multiple-component series or parallel combi- nations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both, ‘This standard is not intended to eover pack- aged single gas tube, air gap, varistor or avalanche junction surge-protective devices, which are included in IEEE C62.31-1987 [2F, IBEE Co2.32-1981 (3], IEEE C62,33-1982 [4), and TBEE C62.35-1987 (5}, respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For rotection of wire-line communication facili- ties under the specialized conditions found at power stations, consult IEBE Std 487-1980 [9] ‘The tests in this standard are intended as design tests as defined in IEEE Std 100-1988 [7), IEEE Standard Dictionary of Electrical and Electronics Terms, and provide a means of comparison among various multiple-compo- nent surge protectors, ‘The test criteria and definitions of this standard provide a common engineering lan- ‘The numbers in brackstscorreapond to those of the reference in Sesion 3. ‘guage beneficial to users and manufacturers of multiple-component surge protectors. Because of the voltage and energy levels employed in the majority of tests described herein, all tests should be considered haz- ardous. Appropriate eaution should be taken in their performance. 2. Definitions This section contains only those definitions relating to surge protectors, within this stan. dard, that are not listed in IEEE Std 100-1988 m. surge protector. An assembly of protective de- vices consisting of one or more series, paral- lol, or any combination of elements used to limit surge voltages, currents, or both to a spec- ified level. Syn: protector. transition current. The current required at a given temperature and duration to cause a current-protective device to change state. 3. References This standard shall be used in conjunction with the following publications (1) IEEE C62.1.1989, IEEE Standard for Gapped Silicon-Carbide Surge Arresters for AC Power Circuits? SIBBE publications are avallale from the Inatitte of Electrical and Blectronies Bagincors, Service Contr, 44h Hoes Lane, P.O. Box 1331, Puentaway, Nd 086561531, Usa,ee 5263601 (2) IEEE C62.31-1987, [ERE Standard Test Spec- iffeations for Gas-Tube Surge-Protective De- vices (ANS). (3) IEEE C62.32-1981 (Real. 1987), IEEE Stan- dard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices (ANSD. [4] IEEE C62.93-1982 (Reaff. 1989), IEBE Stan- dard Test Specifications for Varistor Surge- Protective Devices (ANSI), (5) IEEE C62.35-1987, IEEE Standard Test Spec- ifieations for Avalanche Junction Semicon- ductor Surge-Protective Devices. (6) IEEE (62.45.1987, IEEE Guide on Surge Testing for Equipment Connected to Low- Voltage AC Power Circuits (ANSD. (7 IBEE Std 100-1988, IEEE Standard Dictio- nary of Electrical and Electronics Terms (ANSD, (8) IEBE Std 455-1985, IEBE Standard Test Procedure for Measuring Longitudinal Bal- ance of Telephone Equipment Operating in the Voice Band (ANSI). [9] TERE Std 487-1980, IEEE Guide for the Pro- tection of Wire Line Communications Facili- ties Serving Electric Power Stations (ANSI). [10] IEEE Std 743-1984, IBBE Standard Methods and Equipment for Measuring the Transmis- sion Characteristics of Analog Voice Fre- queney Cireuits (ANSI) 4. Service Conditions 4.1 Normal Service Conditions. In the absence of special requirements, the following items should be specified as appropriate, 4.1.1 Environmental Conditions (2) Operating and storage temperature ranges (2) Humidity (8) Mechanical shock and vibration (4) Atmospheric pressure range IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS 4.1.2 Physical Properties (2) Solvent resistance (2) Solderability (3) Flammabilty (4) Package rupture during overload (5) Electrical connection to metallic ease 4.13 System Conditions (2) Nominal system frequencies (2) Maximum continuous system voltage (3) Peak impulse currents (A) Transient repetition rate 4.1.4 Surge Rating of the Surge Protector Under System Conditions (1) Rated average power dissipation (2) Peak pulse power or current temperature derating (3) Lifetime rated pulse currents 4.2 Unusual Service Conditions. The follow- ing service conditions may require special consideration in the design or application of surge protectors and should be called to the at- tention of the manufacturer. 42.1 Environmental Conditions () Ambient temperature exceeding the normal service conditions (2) Exposure to (a) Damaging fumes or vapors (b) Excessive dirt or current-conduct- ing deposits, excessive humidity, ‘moisture, dripping water, steam or salt spray, explosive atmospheres, abnormal vibrations, and shocks (3) Unusual transportation or storage conditions (4) Flammability rating 4.2.2 Physical Conditions. Limitation on weight or space, including clearance to nearby conducting objects. 42.3 System Conditions (2) System voltages, currents, repetition rates, or frequency operating conditions whereby the ratings of the devices are exceeded (soe Section 9) (2) System impulse currents exceeding the rating of the device (see Section 9)USED IN LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUTTS (3) Exposure to direct lightning strike (see Section 9) (4) Electromagnetic field effects (see Sec- tion 9) (5) Unusual ground potential situations (ee Section 9) (6) Any other unusual conditions known to the user 4.3 Radiation, Some protectors may contain radioactive material. Manufacturers of such meee cos226-881 protectors shall mark them in accordance with applicable regulations. 5. Basic Configurations ‘This section illustrates, by functional block diagrams, the surge protectors described by this document. A protector assembly may be composed of any number of the protectors in Fig 1. Fig Basie Configurations TERMINAL Two Se wi oe RR epepar RANI ce CONFIGURATION 28 CONFIGURATION 28, THREE-TERMINAL x ) x, 6 vt oy Bye i. c BE LI Xo CONFIGURATION 3A CONFIGURATIONS FOUR-TERMINAL FIVE-TERMINAL ce al te Yt ee x, ° *y, x, ¢ +, c ‘CONFIGURATION 4 ‘CONFIGURATION 5 c Common terminal 1 Currentlimiting function v = Voltage timiting function Ki %y¥¥z 2 Signal terminalee. (eat. 1902 6. Standard Design Test Procedure 6.1 Standard Design Test Criteria. The design tests deseribed in Sections 7 and 8 provide standardized methods for making single ob- servations of a specified characteristic of a surge protector. These properties may vary from device to device, making it necessary to provide statistical descriptions of the property in order to compare products. 62 Statistical Procedures. The following pro sedure shall be used to describe any character- tic that has been determined to have portant statistical aspects. A product sample shall be chosen in a manner consistent with the definition of design tests as provided by IEEE Std 100-1988 [7]. A sufficient number of devices shall be tested and the characteristic or rating in question measured as deseribed in the applicable design test until the parameters of the underlying statistical distribution are determined within specified confidence lim- its. Values relating to the produet sample such as, but not limited to, mean, median, maxi mum, minimum, and standard deviation ‘may then be stated, 6.3 Test Conditions. The tests in Sections 7 and 8 shall be performed on the surge protector fas required by the application. Unless other- wise specified, ambient test conditions shall be as follows: ‘Temperature: 25°C45°C Relative Humidity: Less than 85% Atmospheric Pressure: 60 cm to 78 em of Hg For temperatures other than 25 °C, the surge protector, mounted as intended to be used, shall, be maintained at the specified test temperature but with the airflow controlied to provide a free convection heat transfer, unless otherwise specified. The protector temperature shall be allowed to stabilize before tests are performed. Nonsurge Performance Tests ‘The following nonsurge voltage and current tests are intended to establish that, in its quies- cent state, the surge protector does not disturb operation of the protected circuit, 0 IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS ‘1A Rated Voltage Test. The purpose ofthis test is to verify that the surge protector can be used continuously at a specified maximum voltage, frequency, and temperature without undesi able signal distortion, undesirable power loss, or failure. ‘l,l The surge protector shall be tested un- der one or any combination of the following conditions, using test circuits functionally equivalent to those shown in Fig 2: (2) At specified voltage, e, and frequency. ‘The voltage shall be stated as rms, ac peak, or de. ‘At specified maximum and minimum bient temperatures. The protector with voltage applied shall be allowed to stabilize for 24 h at the ambient tempera tures before the measurements are mad Unless otherwise specified, no load shall be connected to the protector terminals. @ @ 7.1.2 Observe the amplitudes and wave- shapes of voltage Vi and voltage V2. Measure the current by means of a suitable ammeter (A) or by a current shunt and an oscilloscope. When making voltage measurements, the ammeters shall be removed from the cireuit. When making current measurements, the voltage-measuring instruments shall be moved from the circuit. 7.18 After the temperature stabilization pe- riod, the surge protector shall not exhibit speci- fied failure modes (see Section 9) and shall ‘meet the following erit (2) The protector shall not limit nor distort voltages Vi or Vz beyond a specified amount. ‘The current (A) shall not exceed a sp fied value at the ambient temperature of the test. (This current may be referred to as leakage current.) @ 7.2 Rated Current Test. This tost is conducted to verify that a surge protector does not degrade normal circuit functions while carrying the rated current. ‘7.2.1 The surge protector is to be tested under the following conditions, using the appropriate test eireuit as shown in Fig 3:‘USED IN LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS ieee cen6ti961 Fig2 ‘Test Circuits for the Rated Voltage Test (Configurations refer to Section 5) CONFIGURATION 3(0) ¢ THREE-TERMINAL DeViCE f NOTE: Throe-terminal do Conricunanon 20) tices of contiguraion 30) ‘TWO-TEPHINAT SEES DEVICE veg o, contguraton, 30) foaraton 20), wih meal S 13h toatng 9X. y © ky Conriaunarion « CONF fold oo Ga PRURATON2) oe FOUR-TERMINAL Device ox % i ® ‘ y i conricunanions Sor pet FIVE-TERMINAL DEVICE coneuravion aia vetarminal devices 9 | PENI ce 1205 Serene o— igen c ie feat a Amneter é = Common terminal Dur Device Under Tet 7 Soureevltage Wave Suitable volage measuring instrment «g ocileseopes XuMGY, Ye 1 Sigal terminate (2) At rated frequeney, de or as specified. (2) Maximum ambient temperature of the application, or as specified, Accontinuous current (D, specified by its de, ac rms, or ac peak value (+5%, -0%), is to be adjusted by means of the source resistance (R,) with the protector in the cireuit. ‘The test shall be conducted until tem- perature stabilization of the protector The voltages e,¢1, and ez shall be the rated voltage(s). Normally e1= ez, ex: ‘cept where opposite polarity is an impor- tant requirement. Ry, shall approximate the load resis- tance of the intended application For ungrounded circuit applications, the circuits in (a), (), oF (d) of Fig 3 shall be used, @) @ 6) 6 cr) u (8) For multi-cireuit devices, as many cir- cuits as are expected to be active at the same time shall be simultaneously ex- posed to the rated current. 7.2.2 At the conclusion of the test, the surge protector shall not experience a failure mode relevant to the application (see Section 9). The voltage across Ry, shall not have more than a specified increase in total harmonic distortion as compared to the value measured with the protector replaced by a short circuit. In the ab- sence of specified requirements, the increase shall not exceed 1%, 7.3 DC Series Resistance Test, This test is conducted to determine the de series resistance between specified terminals of a surge protector.EE Ce3.1900 IEE STANDARD TEST METHODS FOR SURGE PROTECTORS Figs ‘Test Cireuits for the Rated Current Test 2) TWO-TERMINAL DEVICE «) FOUR-TERMINAL DEVICE (@ALANCED) x, a a 1 TOAVA4 our 5, AW fet — Re. Rs © Re buT RL x, Yo b) THREE-TERMINAL DEVICE 6) FIVE-TERMINAL DEVICE (UNBALANCED) x a Rs. out bot _—_ OWaReY 1s Rs X, ve . e t a : 1 Ry ©) FOUR-TERMINAL DEVICE (UNBALANCED) _) FIVE-TERMINAL DEVICE (BALANCED) Rs ant y xy ‘4 OWS fe Overy fe x2] out |v, Rs An 8 e, Rs © DUT i. Rs 2 Heat Aut Anietrseronilcopen ith cet shunts c = Common terminal c bur Device Under Test see = DCor sinewave sources with es than 18 tla harmonic ditrton Ru, Rus, Ria, Rs, Ret, Rep Noninduetive resistors Xi, Xe, Vp Yo ‘Signal terminals 7.3.1 The resistance between specified ter- minals shall be determined. One pair of te minals shall be measured at a time; all terminals not involved in the measurement, shall be loft open-cireuited. The test. current, and polarity shall be specified; the current shall be less than or equal to the rated current. ‘The voltage across the tested terminals shall be measured, ‘The de series resistance is the measured voltage divided by the test current, 74 Standby Current and Insulation Resis- tance Test. This testis conducted to determine the de standby current and insulation resis- tance between specified terminals of a surge protector. One pair of terminals shall be measured at a time; all terminals not involved in the mea: surement shall be left open-circuited. The test voltage, polarity, and temperature shall be specified; the voltage shall be less than or equal to the rated voltage. The current con- ducted by the tested terminals shall be mea. sured. The eurrent shall be measured after the voltage has been applied for at least 100 ms, unless it is known that the protector does not contain a gap-type device, in which ease the ‘current may be measured after 10 ms.EEE USED IN LOW.VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS ccoa.eti001 Wied ‘Test Circuits for the Analog Insertion Loss Test Figda ‘Test Circuit Before Insertion of Surge Protector OTERMULCEIE TEx ReSeTeN eve CONFIGURATION 2a a banuad CONFIGURATION 36 NOTE: For this configuration, [Q] lose sstevitl aet x : x orem cere = somone [EST enter core copa esate [EST |e hhas to be performed. 8" gt § % ecerenucevoe [pj —] arena ow oy FIVE-TERMINAL DEVICE ‘CONFIGURATIONS NOTE: Fortis configuration, | LS 4 lferential measurement |S" 2 fantobn pcr vy Vo (Common terminal | Device Under Test ¥, Signal souree e ony © 5 DUT : ose = Otailloscope ere | Yo = Output voltage before insertion of DUT ey _| Ye = Output veltage after insertion of DUT € X%2,¥i,¥p = Signal terminals % ‘Terminating and source resistor matching the characteristic impedance of the system 13(e2961901 ‘The measured current is the standby current (also known as the leakage current). The in- sulation resistance is the test voltage divided by the measured current, NOTE: losolation resistance to exteraal surfaces of the surge protector muy be measured by such methods Founding the eternal wofece with «conducting ‘td comnLJriag that material an ont terminal ‘7.5 Capacitance Test. This test is conducted to determine the capacitance between specified terminals of a surge protector. The capacitance between specified termi- nals shall be measured at a specified sinu- soidal frequency and bias voltage. One pair of terminals shall be measured at a tim terminals not involved in the test sh connected to a ground plane in the measuring instrument. In the absence of specified re quirements, a signal of 1 V or less at a fr quency of 1 MHz and a bias of 0 V de are suggested, 76 Inductance Test. This test is conducted to determine the inductance between specified terminals of a surge protector. ‘The inductance between specified terminals shall be measured at a specified sinusoidal frequeney and bias current. One pair of ter- minals shall be measured at a time; all ter- minals not involved in the measurement shall be left open-cireuited. In the absence of specified requirements, a frequency of 1 MHz and a bias current of 0 A are suggested. 17.7 Analog Insertion Loss Test. This test is conducted to determine the loss, if any, in op- erating voltage at a specified frequency, or frequency range, caused by insertion of the surge protector into a matched transmission line. Set up the test circuit as shown in Fig 4a. Ad- just the voltage level (Vq) and the frequency as specified. Insert the surge protector between the generator and the load. The protectors shall be at the specified ambient temperature (see 6.2). Measure voltage V2 as shown in Fig 4b. See Section 5 for an illustration of basic terminal configurations. ‘Surge protectors with terminal configura- tions 2a and 2b can also be tested for insertion loss using a spectrum analyzer with a track- ing generator. NOTE: A spzcifed bias voltage or corent (aot shows in Fig) nny be applied to the marge prota, “ IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS ‘The insertion loss in decibels is determined by using the following formula: tora = t) Vo. a) 78 Phase Shift Test. This testis conducted to determine the phase shift of a sinusoidal volt ‘age signal of specified frequency, or frequency range, caused by the insertion of @ surge protector into the signal path. Set up the test circuit as shown in Fig 5. Ad- just the voltage level V, and the frequency as specified, The surge protector shall be at the specified ambient temperature (see 6.2). Mea: sure the time delay between the two voltage ‘waveshapes as they pass through the 0 V refer. ence line. NOTE: A specied bias voltage or cureat (ao shown in Figo) rny be apie th mtg proscar The phase shift is determined by converting the time difference into degrees or radians us- ing the following formula Phase shift (degrees) = (degr on Phase shift (radians (a3) where t = Time difference between voltage sig- nals (in seconds) T = Period of a full eycle of V; (in seconds) 79 Return Loss Test. This Lost is conducted to determine the amount of power reflected back to the signal source at a specified frequency range caused by the insertion of the surge pro- tector into a matched transmission line, ‘Set up the test circuit as shown in Fig 6a. The surge protector shall be at the specified ambi- ent temperature (see 6.2). Adjust the tracking generator voltage and the frequency range as specified, and determine the reference return Joss ofthe system without the surge protector by connecting a characteristi short cireuit to the return loss bridge so that all incident power is reflected back. Record the level displayed (in decibels) by the spectrum analyzer. Then in sert the surge protector as shown in Fig 6b,wee {USED IN LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUTTS ost Figs ‘Test Ctreuits forthe Phase Shift Test FOUR-TERMNAL DEVICE TWO-TERMNAL DEVICE -———— ‘CONFIGURATION 4 l=] osc ga g CONFIGURATION 28 osc a | oar gra oP) EV, ‘THREE-TERMINAL DEVICE (CONFIGURATION 3 ‘Common terminal Osciloscope channels 1 and 2 Differential measuring probe Device Under Test ‘Signal source Oscilloscope Input voltage Output veltage Signal terminale ‘Terminating and source resistor matching the characteristic impedance ofthe system NOTES: (1) Terminal Configuration 5, a shown in Section 6, canbe vated Inthe same manner as Configuration 4, bat ‘with the common terminal (©) connected tothe commoa terminal of the trenalerme? (2) Thin tat doen not apply to Terminal Configurations 2 and 3b, sine they do not enuse vsltage phase shits Record the return loss level displayed (in isp decibels) by the spectrum analyzer. BWR NOTES: 1) A specied bina voltage or corent (ot shown {Fig 6) may be aplied tothe marge protector (Bq 5) 7.10 Longitudinal Balance Test. Surge protec (2) Additional considerations forthe measuremeat of m= tor configurations that are intended for use on {or lat on enog vole frequency celle may be und balanced circuits, such as telephone-type ca- ‘EEE Su 741004 (10) bles, are tested for longitudinal balance to as- ‘The reflection coefficient (p) and the stand- sure that these surge protectors do not ing wave ratio (SWR) are computed using the contribute to the noise of the circuits to which following formulas: they are applied. Longitudinal balance is usually considered a to be a measurement of the degree of symmetry nea (Bq 4) of the impedances to ground (or common ter- 5ieee, 526.1901, IERE STANDARD TEST METHODS FOR SURGE PROTECTORS et at Cit tno et ese Cit ita Se Petr 1 SA it @) RB} Peo cost wile roar Morea cence ora cee SoG SSH 1G A TG c LO @ 9 SA a Xe) QD d (RLB} x. 7 ad —X c Common ternal 0 RUB} ee bur = Device Under Test RLB = Return Lose Bridge 8A = Spectrum Analyzer sc = Characteristic shor- CONFIGURATION 3a ra i [eves Tk, re aL R ie mt erat it RS s Xa CONFIGURATION 35 ee NOTE: Devices ofthis con- ON 4 {guration shoud ‘iso bo (UNBALANCED) tested in configuration 2b, wath termina Clot foxtng fae eta ra B ca Ruz [Devee | rasa [our ro ov Ee xg (ieee xy, cas WPS IE ZT RT| pgpesy WS SRE SR cero Rs, 3Rs, feeerats| Rey $Rs TION CONFIGURATIONS am om XY Fevpatae] out} ics [Gomweter| Rs R, [coe R. %| |, CONFIGURATIONS {ONBALANCED) a Xe va a our| roa [Bevee x1 ec fmpuise] tS Lt Ruy er] RRs PRs c = Common terminal DUT = Device Under Test. eee, = DC power aupplien The Bias current Re RerRez = Resstore for adjusting bias curenta v = Veitage mensuring intrumento spropriat frequency rexponse XieKy Yin Ya = Sigal terminals[USED IN LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS. meer. conta Fign Impulse-Limiting-Voltage Test Waveform Vv PERCENT OF EXPECTED MAXIMUM LIMITING VOLTAGE: NOMINAL RATE OF RISE AT, 0.912 1.1T, TIME NOTE: Impuleimting-oltage tat waveform must be within enclose limits (4) Ri, Ris, and Rg, a8 required, shall be the load resistances for the intended UIE avin 30 pane the inp at a rs Pad Pc ee tate ly ae a ee (Soke toe hte os sta beralowad” te rovnt thesal met rn ag pie er a rm a ela feneraorshovld bo selected from 100 Un, 00 Vy (2) The impulse limiting voltage shall be the measured Deak voltage between the appropriate terminals ofthe 83 Transition Current Test. The purpose of this test is to verify the current level required to eause a current-protective device in a surge protector to change state at a given ambient temperature and within a specified duration, ‘The surge protector, mounted as intended to be used, shall be placed in a chamber main- tained at the specified test temperature. The air flow shall be controlled to provide a free- convection heat-transfer environment, unless otherwise specified. The surge protector shall be allowed to stabilize at the test temperature, Specified terminal pairs containing a cur- rent-protective device shall be connected in se- 5 with a de or ac current source of specified current and frequency, a specified load resis- tance, and an ammeter or oscilloscope withEEE (Co96.1602 [IEE STANDARD TEST METHODS FOR SURGE PROTECTORS ‘Test Croits fr th Transition Current Test ‘Fro: TePOMNAL DEVICE THREES TEPUUNAL DEVICE x, Y, x, Y, DUT i Geasien ‘CONFIGURATION 4 FOUR-TERMINAL DEVICE (UNBALANCED) —wr— xt FOURSTERHINAL DEVICE (BALANCED) Rt, ag X2[DUT| Y2 Rs x, § Rsz fe Ra @ ig DUT X2 CONFIGURATION § FIVE-TERMINAL DEVICE (UNBALANCED) ft Xt v1 Rsty ge X2|DUT|Y2 Ru 6 N NOTE: Opa eich one 2 i Re {ermal of the proton s NOTE: Opon switch for lnde nt connected tothe commen terminal ofthe protector poe - ce = Common terminal bur = Device Under Test sees DCor ac sources Noninductive resistors Switch Signal terminals Ry Ris, Ria, Rs Rar, Rae s Xie Xa Yn Yo current shunt, as shown in Fig 12. (Configurations are from Section 5). For each surge-protector configuration, a specified load current, up to rated current, shall be applied by adjusting Rs, Rs1, and Rsz during the stabilization period (Pig 12). Next, the source resistances Rs, Rei, and Rgg shall be reduced such that the load current increases to a level at or above the transition current level ‘The transition current shall be applied until the current in the load resistor ceases or is re- ‘Ammeters or oscilloscopes with current shunts duced to a specified value that indicates that the current-protective device has operated. ‘The current-protective device shall interrupt or reduce the current in the load resistor within a specified time after the transition current has been applied, NOTES: 1) Where specified, either e1 orp inthe unbal: ‘Ths may be done wo eteblish the maximum tne for tren ‘ikon lf urge protector contain components with thermalUSED IN LOW.VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS (@) This west may be conducted an extension af the cor. Feat Per est la 83 In order to minima Tepes of (©) Some automatic rosttype current-protective devices ‘may rotors to thet original mate within apoctid Gime Garrent protective devioce that ave design to operate only one time, sich as fee, hall ronnie the pura 84 Current-Response-Time Test. This test is conducted to determine the time required for the load current to decline to a specified value after a source current is applied to a current- protective deviee. 8.4.1 The current-limiting protector, ‘mounted as intended to be used, shall be placed in a chamber maintained at the specified test temperature. The air flow shall be controlled to provide a free-convection heat-transfer en- ronment, unless otherwise specified. The current-protective device shall then be allowed to stabilize at the test temperature. A load cur- exe os226.001 rent, up to the rated current of the DUT, may be applied during the stabilization period, if specified, Using the test circuits shown in Fig 13, the power supply (e,) is adjusted to a specified value. Table 4 notes the open and closed condi- tion of the various switches for each network and its corresponding calibration and test pro- cedure. Calibration for specified load current shall be accomplished by shorting the DUT and adjusting the load network resistors. In the ease of a four- or five-terminal device, Ri and Ria have been added for a second load current. When two load currents are em- ployed, each may be adjusted to different load current values, as specified. To adjust for the abnormal test current, all switches are placed in the closed position, and the source resistor (Rs) is adjusted to obtain the specified abnormal test current. Fig13 ‘Test Circuits for Current-Response-Time Test "TWO-TERMINAL CONFIGURATION S, 2 ‘THREE-TERMINAL CONFIGURATION ae sfx 1 fk ‘1 R Be POUT a Se, OUT un 's Ru 2S Re ef R ® FOUR- OR FIVE-TERMNAL CONFIGURATION (UNBALANCED) s FOUR-TERMINAL CONFIGURATION 7 (GALANCED) ——*2 xy 1 DUT Rg St RS XQ v2 2 53 NOTE: Connect for five-tor ‘minal protector. A . © Common terminal Dur Device Under Test « = Power supply Re RiyRia Ris, Ria = Noninductive resistors S525) = Switches Xi Ke Vis Ye = Signal terminals Ammeter or oscilloscope with current shuntEEE (Cezse.1901 IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS 8.4.2 The responsi obtained by the following procedure. Switch SI and/or Switch 83 is to be closed, timing init. ated, and the time required to achieve the tran- sition current level recorded. NOTE: The rato of RL to Rig and RL to RL4 shall be ‘ach that when Ry placed in parallel with oq or Ry ‘he resulting abnormal current will exceed the treason ‘current level of the device under test ‘85 Impulse Reset Test. The purpose ofthis test is to verify that the surge protector, when con- nected in a simulated application circuit, re- verts to its quiescent state within a specified duration after having limited an impulse. 8.5.1 The surge protector shall be tested un- der the following conditions, using the appro- priate test cireuit of Fig 14: (1) ‘The test shall be performed at specified ambient temperature, (2) The de power sources e, ¢, and eg shall ‘Table ‘Switch Status and Test Procedures for the Current Response-Time Test Using Test Circuits of Fig 18 —_—_ NonkerofProaor SL = 38 3 Calibration and Test Proedare ermal 2 ° ° WA WA Setlond cu 2 8 8 NIA NYA Sct sbmormal current 2 ° 8 NiA NA Stabilize 2 8 8 Na NYA Measure time of current decline 3 ° ° Nia NA Setload carest 3 8 8 NA NYA Set abnormal current 3 ° 8 NA NA Stabilire 5 3s 8 NA NYA Measure ime of corentdactine : ° 8 ° Set lad curente ‘ 8 8 8 3 Setabvormal cuenta ‘ 3 8 ° Satie ‘ 8 8 8 © Measure timos of current dein ‘ 8 8 ° Q — Setloed current 4 8 3 ° © Set absormal curren, Ras, Riz 4 ° ° ° © Stabilize 4 5 8 ° © —-Mearure times of current declines 4 ° ° 8 © Sloat currents 4 ° 8 8 S Set abnormal corent Ris, Rug ‘ ° ° ° © Stabilize 4 ° 8 8 S Measure times of current declines a 8 8 ° WA Blond curent 3 8 8 8 NA Set abnormal current B 8 ° ° NA Stanlve 2B 8 ° ° NVA __ Measure time of current decline NOTE: A fivo-terminal device is sted in the same manner ata fourterminal unbalanced network KEY: 4B = Fourterminal balanced network © = Open 8 Cloned wich NVA = Notepplicable be specified for the application, and their output voltages shall not exceed the rated voltage of the surge protector. Rs, Rs1, and Reg shall be adjusted such that I, h, and Ip are the currents speci- fied for the application, with the DUT and the load resistors short-circuited. Ry, Rix, and Ry, as required, shall be the load resistances for the intended application. ‘The short-circuit current from the im- pulse generator shall be specified for the application. ‘The isolating device of Fig 14 passes the impulse current, but prevents currents J, th, and Iz from entering the impulse generator. It is typically a diode or spark gap. Some shunt-connected voltage limiters may require the addition of shunt com- ponents to assist in reverting to the qui cent state, « 6) ® omeee USED IN LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS ‘on2361001, Figs ‘Test Circuits for the Impulse Reset Test CONFIGURATION 2 ‘CONFIGURATION 25 [Deven If 3,6 5 i fea L Firmputes It Re ®- ‘CONFIGURATION 95 NOTE: Devices of this eon- ‘CONFIGURATION 3, figuration ‘should also be tested in configuration 2b, with terminal C lat floating. benca| DT op —— Le xem Eel xt rs a gitie do in J fing INS TAN Re |cenaratr Rs1 SRs2 eine eaeueat R conpcunarens ee pratima coupe Xa, Yo (eerie Jour] [Device] x1 YA Tat bees 4 cee RT fesputse]] Re R s12Rso [° p, [corre saan Fro uid Bq le ; paahsas 53 a ieee ae ee 2 Sotsnene paves 2 eee Linh = Biascurrents Ri, Ruy Riz, Rs Rei, Reg = Noninductive resistors : Satie loner kom%% 2 SpaltomnneEE Ce2s61001 8.5.2 The surge protector shall be subjected to 1 specified impulse waveform of the same po- larity ase, 1, and eg, Where applicable, the test shall be repeated with the polarity of the impulse and e,e1, and ez reversed. In the absence of specified requirements, an impulse current waveform of 10/1000 sss should be used (waveshape designation defined in IEEE (€62.1-1989 (1D. Voltage (V) or current (A), as applicable, shall be monitored during the test to determine the period of time for the surge protector to revert to its quiescent state, ‘The surge protector shall revert to its qui cent state within the specified duration. 8.6 Current Reset Test. The purpose ofthis test is to verify that resettable, series-connected, current-protective devices in a surge protector revert to their quiescent state within a speci- fied duration after having limited an abnor- ‘mal current. 8.6.1 The surge protector, mounted tended to be used, shall be placed in a chamber maintained at the specified test temperature. ‘The air flow shall be controlled to provide a free-convection heat-transfer environment, unless otherwise specified. The surge protector shall be allowed to stabilize at the test tempera- ture. A load current, up to the rated current, shall be applied by adjusting the source resis: tors Rs, Rs, and Rgz during the stabilization period (Fig 15). For each surge-protector con- figuration, specified terminal pairs contain- ing a current-protective device shall be connected in series with a de or an ac current source of specified current and frequency (e, 41,2), specified load resistor (Rt, Rts, Ri), and an ammeter or oscilloscope with current shunt, as shown in Fig 15, 8.6.2 The source resistors Rs, Rei, and Rs2 shall be reduced such that the load current increases to a level at or above the transition current evel. This current shall be applied until the current in the load resistor ceases or is reduced to a specified value that indicates that the eurrent protective device has operated. ‘The surge protector shall then be allowed to stabilize until the load current reaches an ‘equilibrium value. At this time, the source re- sistors (Rs, Ri, and Rsz) shall be increased to their pretransition values, and the time in which it takes for the load current to return to a specified percentage of its pretransition level shall be recorded. IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS NOTES: 1) Some current-limiting devices in salected plications may not revert tothe pretraniion quiet ata withoe interruption of the bias sours eye, nde, (2) Where oped either ey oF en the unbalanced net work configurations of Fig 18 may be sett zero This may ‘idan ea ewtblieh th taxi tne for earn te te ‘Pretranuton golonont mata i mnge protectors contain ‘ESmponente with thermal interac” (S) This toat may be conducted as an extension of the {ranalton cures text of 8. tn onder o minimise Fopetl- on af tet ‘The load current shall return to withi specified percentage of the pretransition qui escent state within a specified period of time after the transition current has been removed. 8.1 AC Life Test. This test is performed to ver- ify that a surge protector ean conduct alternat- ing current of specified parameters for a given number of repetitions without experiencing a failure mode relevant to the application (see Section 9). 8.7.1 The surge protector shall be tested with the terminal configurations in Fig 16 at the following conditions, to be specified: Q) Peak value of the ac voltage (V, Vi, oF Vo) measured across the terminals of the DUT with the DUT replaced with an ‘open cireuit. ‘The peak value of the open-circuit ac voltage applied to the surge protector shall be at least twice the maximum de- limiting voltage of the protector. For currentslimiting devices, V, Vi, or V2 shall be the rated voltage. For protectors with an ac rated voltage, at least twice that voltage should be used. In order to test surge protectors that may hhave blind spots (IEEE C62.45.1987 (6)), ‘ac life tests shall be run at lower open: circuit ac voltages; unless otherwise specified, 80% of the maximum de-lim- iting voltage shall be used, (2) RMS value of ac current (A) measured with the DUT replaced with a short cir- cuit across all its terminals. Adjust Rs, Rey, or Reg to give the specified value. (8) Frequeney of the source (e). In the ab- sence of specified requirements, 50 Hz or 60 Hz should be used. (A) Number of operations. Each operation ‘may be sufficiently separated in time toieee USED BY LOW-VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS cassie Figs ‘Test Cirouita forthe Current Reset Test CONFIGURATION 28 ‘CONFIGURATION 9a SFHO-TERNMINAL DEVICE ‘FAREE-TERMINAL DEVICE xy As xy " DUT DUT R Rs ce conrouRaTion 4 CONFIGURATION ¢ FOUR-TERMINAL DEVICE (UNBALANCED) FOUR-TERMINAL DEVICE BALANCED) xy %4 Q Rs DUT " x2 v2 ‘CONFIGURATION 5 FIVE-TERMINAL DEVICE (UNBALANCED) x y NOTE: Open switch for lode not conaectad to the commen termina ofthe protector. Ai Ae = Ammetars or oscilloscopes with current shunts ce = Common terminal DUT = Device Under Test eee = DCor se sources Bu Rii/Riz-Ré Ret,Reg = Noninductive resistors s = Switch i. % Yu Ye = Signal terminalseee s26.1001 IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS m8 ren cesta Ai et WOT COARGUITEN TEEN COMOLRATON_ FOMTERIALcOrCARATON eye Me our Xv : 3 Ee babes Mews Ls ee FIVE-TERMINAL CONFIGURATION (UNBALANCED) Ys ye A = ACammetar © = Common terminal Dur = Device Under Test * = AC power source Ris Ris,Ria,Re,Rai,Rge = Noninductive resistors WMiVe = ihe Ys Ye = Signal terminals avoid thermal accumulation in the surge protector. (5) Duration of each operation, (6) Load resistor (Ry, Rix, and Ry). NOTE: Inthe ence of epeciied eurent level and tat uration it i recommended that nic ton purensnrs Selected rom Table 8" Measuromect of spcifed perfor: ‘ance parameter shail be dono ater cach operation Its ‘emmended that ietlationrersane, teliege, and impulsedimiting voltage be measured afer eh Ee tot forge lathet order ‘Table Examples of Parameters for the AC Life Test (Carrent evel "Test Duration rms) me 110 aon eo 11D eelen mo 11d glen FIVE-TERMINAL CONFIGURATION (BALANCED) Suitable voltage-measuring inatruments 8.7.2 Record whether the surge protector sat- isfies @ predetermined set of operating p: rameters after exposure to the specified number of operations without experiencing a failure mode relevant to the application (see Section 9). 88 Impulse Life Test. This testis performed to verify that a surge protector can conduet an impulse current of specified parameters for a given number of repetitions without experiene- ing a failure mode relevant to the application (Gee Section 9). 8.8.1 For a specified number of protectors, first determine both the maximum impuls: limiting voltage and the minimum impulse- limiting voltage, using a voltage rate-of-rise of 100 Vijs, unless otherwise specified 8.8.2 The surge protector shall then be con- nected to an impulse-current generator capa. ble of providing, in the absence of specified requirements, one or more of the waveforms listed in Table 6. The current waveforms in Table 6 are short-circuit current waveforms and are obtained when all generator termi- nals are short-cireuited, ‘The currents of Table 6 are the per-termi- nal-pair suggested currents. For tests using three-terminals, these currents are the cur rents in each branch under test, Both terminalUSED IN LOW.VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS pairs shall be tested at the same time and the same polarity. ‘The peak open-circuit voltage of the impulse generator shall exceed the maximum im- pulse-limiting voltage determined in 8.8.1 at the input of the DUT by not less than 50%. ‘Separate samples shall be tested for each test current waveform and each polarity used. The voltage rate-of-rise of the impulse shall be specified. Table 6 Suggested Short-Cireuit Current Amplitudes, ‘Waveforms, and Time Between Impulses for the Impulse Life Test Peak Short-Circolt Maximum Time Waveform Current" Between Impulace ow ‘is 7 2 101 000 5 2 iat 0% 0 2 01 om a 2 101 0% by 2 oom 200 5 nom) Som 5 cy oan 5 oa 20 5 om is 2 10360 D> 2 1030 e 2 i030 8.8.3 The impulse generator shall be termi- nated on the surge protector according to the diagrams in Section 5. Table 7 lists the termi- nal-pair combinations for each basie configu- ration. In the case of three-terminal tests, independent impulse-life test currents of the same polarity shall be discharged simultane ‘ously through both terminals to the common terminal, NOTE: Sufficient time between impulnon shall be allowed fo preveat thermal aecomslation in the DUT. Us otherviee specified, the Intersurge Ue shall be as led in Table 8.84 In order to test surge protectors that may have blind spots (see IEEE C62.45-1986 [6), impulse life tests shall be conducted using peak open-circuit voltages that are lower than those in 8.8.2. The peak open-circuit voltage of the generator during impulse life tests for blind spots shall be 80% of the minimum i pulse voltage obtained in 8.8.1, unless spe fied. The same impulse test generator waveshape and internal impedance, but at mee ccsn.s6i961 Table” ‘Standard Terminal Combinations for the ‘Impulse Life Test (Configuration Tested Torminels Other Termi ‘Net pplcabe %% Not applicable Yc Keren feos, x ry BAR Ree BoRoOKK lower peak open-circuit voltage, shall be used ‘as was selected for use in the test of 8.8.2, 8.8.8 For failure criteria, refer to Section 9. In the absence of specified requirements, m surements of insulation resistance, de-limit ing voltage, and impulse-limiting voltage shall be made before each impulse-life test surge. At the completion of the test, the de se- ries resistance test shall be performed, 8.9 Maximum Single-Impulse Discharge Test. This test is conducted to determine the capability ofa surge protector to conduct a spec- ified current impulse without experiencing a failure mode relevant to the application (see Section 9). ‘A surge protector shall be tested only once with an impulse; different samples shall be tested for each polarity or waveshape. In the absence of specified requirements, it is suggested that an impulse-current wave shape of either 820 us or 10/1000 us should be used (waveshape designation is defined in TBEE C62,1-1989 (1). The peak value of the current waveshape shall be as specified. See ‘Table 8 for test configurations. Aer applica- tion of the current impulse, the protector shallee Canse.s01 be tested for any relevant failure modes (see Section 9), which shall be verified. Terminal combinations appropriate to the application shall be specified for testing. Different peak current levels and waveshapes may be appro- priate for various combinations of protector terminals, None of the relevant failure modes shall occur. ‘Tables Standard Terminal Combinations for Maximum Single-Impulse Discharge Test Configuration” Tested Terminals Other Terminale 7 By Na ena 3 a 7 Pea : ee oe : xe GE z el, EEO OSSE ‘ ¥] Not applicable 5 % -% Yy-YeR, ri Be] [ek He Een : Yo xem ee Specie load resistance ‘Ebcloued sta of terminala are sil ‘apoously connected during txts IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS 9, Failure Modes Because of the complexity of surge protectors and their diverse range of applications, fail- ture modes should ive determined from the ap- plication of the surge protector and its internal ‘components. The appropriate tests that deter- mine failure shall be specified from among the tests of this standard. Criteria will be de- pendent on the performance requirements of the surge protector relative to the application. Generally, a failure mode has occurred when the surge protector operates outside the speci- performance requirements.meee USED IN LOW.VOLTAGE DATA, COMMUNICATIONS, AND SIGNALING CIRCUITS e2.961901 Appendix 1s appendix Is note part of IEEE 062.36:1001, IEEE Standard Tert Matha for Sunge Protectors Used in Low Voltage Date, Communleatons, and Signaling Chet, bst i Inclded for information only) ‘This appendix gives some possible internal arrangements of components both in single and in combination connection for both series and parallel surge-limiting devices. Mustrative functional configurations are given in Fig Al for the two-terminal through five-terminal devices shown in Section 5. The following are examples of devices applicable to these configurations: Series Element (Current Limiting) Fuse Circuit breaker Gireuit protector Positive temperature coefficient resistor Heat coil Semiconductor device ‘Thermal switch Current-limiting impedance Combinations of the above Parallel Element (Voltage Limiting) Gas discharge tube ‘Avalanche diode Zener diode Foldback device Thyristor Metal oxide varistor Air gap Combinations of the aboveTee (5236.1501 FigAl ‘Possible Internal Arrangement of Station Protector Components 1WO-TERMINAL CONFIGURATION 20 2b yy Y > xg = Xt ‘THREE-TERMINAL CONFIGURATION 3a) X Y x 3b) ° mo o 6 c x Noneex ot 10 c FOUR-TERMINAL CONFIGURATION x vox Y x eex Y “te i fa o © ° T co I eto o of pa es x, Y, x, Y, x, ’, x, Y, FIVE-TERMINAL CONFIGURATION x Vax Y x y 4o of 0 of Lo W o4 © of lo x %% bc, eee catty 2 1 = Current-limiting component V = Voltage-limiting component