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Quintana 2007
Quintana 2007
Comparison of Dye-Sensitized ZnO and TiO2 Solar Cells: Studies of Charge Transport and
Carrier Lifetime
Nanocrystalline particles of ZnO and TiO2 of approximately equal size (∼15 nm) were used to prepare
mesoporous electrodes for dye-sensitized solar cells. Electron transport in the solar cells was studied using
intensity-modulated photocurrent spectroscopy and revealed very similar results for ZnO and TiO2. Apparent
activation energies for electron transport in nanostructured ZnO of e0.1 eV were calculated from the
temperature dependence of transport times under short-circuit conditions. The lifetime of electrons in the
nanostructured semiconductors was evaluated from open-circuit voltage decay and intensity-modulated
photovoltage spectroscopy. Significantly longer lifetimes were obtained with ZnO. Despite the reduced
recombination, ZnO-based solar cells performed worse than TiO2 cells, which was attributed to a lower electron
injection efficiency from excited dye molecules and/or a lower dye regeneration efficiency. The internal
voltage in the nanostructured ZnO film under short-circuit conditions was about 0.23 V lower than the open-
circuit potential at the same light intensity. Results may be explained using a multiple trapping model, but as
electrons are usually only shallowly trapped in ZnO, an alternative view is presented. If there is significant
doping of the ZnO, resulting band bending in the nanocrystals will form energy barriers for electron transport
and recombination that can explain the observed properties.
time was 1 min for ZnO solar cells. UV-vis absorption spectra where LHE is the light-harvesting efficiency, defined as LHE
of sensitized ZnO and TiO2 films are shown in Figure 3. Slightly ) 1 - 10-A with A is the sample absorbance, Φinj is the quantum
more of the N719 dye was adsorbed by TiO2. Importantly, the yield for electron injection, Φreg is the quantum yield for
absorption maximum of the adsorbed dye on ZnO was not blue- regeneration of the oxidized dye by iodide, and ηc is the
shifted. This gives evidence that there is no formation of the efficiency of collecting injected electrons at the conducting
Zn2+-dye complex.6 substrate. The absorbed photon to current efficiency (APCE),
Current-voltage characteristics of the ZnO and TiO2 solar shown in Figure 4c, was calculated by dividing the IPCE by
cells in simulated sunlight are shown in Figure 4a. TiO2 solar the LHE. In most of the visible light range APCE values for
cells give higher power conversion efficiencies than correspond- ZnO and TiO2 solar cells are rather constant at about 40% and
ing ZnO solar cells, as they give higher photocurrents, open- 60%, respectively. As will be discussed later, losses during
circuit potentials, and fill factors. The overall efficiency was charge collection appear to be very low. The rather low quantum
found to be rather low for all cells (<3%), as the nanostructured efficiencies must therefore be attributed to poor electron
films were relatively thin. Also, the rapid dye adsorption injection efficiency and/or dye regeneration efficiency. The rapid
procedure may be a cause for low efficiency, although good sensitization method is likely to give dye aggregates that are
results with this method have been reported by Nazeeruddin et less efficient in both electron injection28 and dye regeneration
al. for TiO2-based solar cells.23 by iodide.
Electron Transport Studies. Several time and frequency-
IPCE spectra of N719-sensitized ZnO and TiO2 solar cells domain measurement techniques were used to further character-
are shown in Figure 4b. The photocurrent generation efficiencies ize the nanostructured ZnO and TiO2 solar cells. The electron
are higher for TiO2 than for ZnO, being 50% and 37% at the transport through the nanostructured metal oxides was studied
maximum at 520 nm for TiO2 and ZnO, respectively. The using intensity-modulated photocurrent spectroscopy under
incident photon to current conversion efficiency can be described short-circuit conditions,29-31 while the electron lifetime was
as the product of four terms: probed using intensity-modulated photovoltage spectroscopy
under open-circuit conditions.31-33 Figure 5a shows the IMPS
IPCE ) (LHE)ΦinjΦregηc (1) and IMVS time constants as function of light intensity. The
1038 J. Phys. Chem. C, Vol. 111, No. 2, 2007 Quintana et al.
potential (the quasi Fermi level) under short-circuit conditions; In eq 3 NT0 is the trap state density at EF0, which is the Fermi
see Figure 8a. We will refer to the maximum voltage that level of the TiO2 in the dark, and m is the slope of the trap
develops as the “short-circuit voltage” VSC. Figure 8b shows distribution. Considering the similarities in the results obtained
VSC and VOC as a function of light intensity. The difference is with TiO2 and ZnO, we now apply this model to nanostructured
constant, ∼230 mV. Similar results have been obtained for dye- ZnO. From the potential-charge relation (Figure 6) it follows
sensitized nanostructured TiO2.25 Using transient photovoltage that m ) 0.19 eV and NT0 ) 1.7 × 1017 cm-3. Assuming the
as a tool to study recombination, O’Regan and Lenzmann conduction band edge to be located about 0.9 eV above the
concluded that the quasi Fermi level inside dye-sensitized redox energy of the electrolyte, a total density of traps in the
nanostructured TiO2 was lowered by 240 mV when changing ZnO of about 2 × 1019 cm-3, or 40 traps per ZnO particle, is
from open-circuit to short-circuit conditions under 80 mW cm-2 calculated. This appears to be a reasonable result as it is well-
white-light illumination.41 known that as-prepared ZnO can contain a significant amount
The electron lifetime in ZnO cells under short-circuit condi- of defects. Following the approach outlined by van de Lagemaat
tions can be estimated using VSC and the lifetime-potential and Frank,42 the slope m can also be calculated from the light-
1040 J. Phys. Chem. C, Vol. 111, No. 2, 2007 Quintana et al.
intensity dependence of the short-circuit charge and the IMPS comparable TiO2 particles band bending would be much less
time constant, yielding in our case for ZnO only a reasonable because of the higher dielectric constant in anatase ( ≈ 50).
value in the case of QSC, m ) 0.049 eV. As a result of band bending between adjacent ZnO particles,
The quasi Fermi level (EF) in the mesoporous ZnO film under energy barriers would be formed at grain boundaries. The
illumination at short-circuit conditions was determined using thermally activated crossing of these barriers by the electrons
the VSC (voltage extraction) measurement.25 Recently, Lobato would result in slow transport in the nanostructured ZnO films.
et al. measured EF in a nanostructured TiO2 solar cell directly Upon electron accumulation, band bending and consequently
by addition of an extra electrode on top the porous TiO2 film.43 barrier height would decrease and electron transport would
Their results are in excellent agreement with our voltage become faster. Such a barrier model can, at least qualitatively,
extraction method. In our experiment with ZnO a clear increase explain light-intensity-dependent electron transport in doped
of VSC with light intensity is found, from 0.2 to 0.4 V with nanostructured films.
increasing light intensity. Considering the trap model described In a barrier model, electron transport is determined by the
above and the estimated value of ECB of 0.9 eV (vs Eredox), one rate of electron hopping from ZnO particle to particle. From
might expect to find activation energies for electron transport the transport time (0.57 ms at the highest light intensity in Figure
of about 0.6 eV. The apparent activation energies that are 5a) an effective electron diffusion coefficient in the nanostruc-
calculated from the temperature-dependent IMPS measurements tured ZnO of 1.2 × 10-4 cm2 s-1 is calculated using Deff )
under short-circuit conditions are, however, much smaller, about w2/(2.35τIMPS),51 where w is the film thickness. The time τj for
0.1 eV. This apparent discrepancy was explained recently by a single electron jump across the barrier from one ZnO
Peter et al. using the quasi-static multiple trapping model.44 The nanocrystal to the next can be calculated using the Einstein-
anomalously low apparent activation energies are a consequence Smoluchowski equation Deff ) d2/2τj, where d is jump distance,
of the boundary conditions imposed by the short-circuit condi- which is equal to the nanocrystal diameter. It can thus be
tion and the quasi-static relationship between changes in the calculated that τj ) 11 ns, and the electron makes on average
densities of free and trapped electrons. As the short-circuit 5.3 × 104 jumps before reaching the conducting substrate. The
current is almost independent of temperature, EF is forced to thermionic emission model can be used to describe electron
move downward with increasing temperature, so that the transfer in semiconductors across a barrier:52
decrease in transport time is much less than one might expect.
∆E
Traps in ZnO. The presence of an exponential distribution
of trap states in nanostructured ZnO may be questioned.
j ) AT2 exp - ( kT ) (5)
Evidence from spectroelectrochemistry45,46 and laser spectros- In this expression j is the current density, ∆E is the barrier
copy47 suggests that electrons in nanostructured ZnO electrodes height, and A is the Richardson constant for thermionic emission
are located in the conduction band and/or shallow traps. (A ) 120(m*/me) A cm-2). Using the effective electron mass
Specifically, upon electron accumulation a bleach of the in ZnO (m*) of 0.3me, and assuming that the contact area
excitonic absorption band of ZnO as well as free-electron between the nanocrystals is 50 nm2 (the area of circle with radius
absorption is observed. The presence of localized electronic 4 nm), it can be calculated that a jump time of 11 ns is obtained
states in the band gap of ZnO is, however, well documented.9 with a barrier height of 0.3 eV, which seems to be a very
Intrinsic defects, such as oxygen vacancies and interstitial Zn reasonable value considering that the band bending in a fully
atoms, will affect the electronic properties of ZnO. As-prepared depleted ZnO nanoparticle was estimated to be 0.5 eV.
ZnO tends to show significant n-type conductivity, which is The rather triangular shape of the voltammogram for nano-
mainly caused by interstitial Zn atoms that act as shallow donors, structured ZnO electrode (Figure 2) may be attributed to a nearly
with an energy level about 0.03 eV below the conduction band linearly increasing density of trap states toward the conduction
edge.48 Also hydrogen can act as a shallow donor in ZnO.49,50 band of ZnO. Alternatively, it may be attributed to significant
While being very important for the conductivity of ZnO, such n-type doping of the ZnO in combination with band bending.
shallow donors (traps) do not directly explain the observed slow Nanostructured films composed of highly doped spherical
and light-intensity-dependent electron transport in nanostructured semiconductor particles will show similarly shaped voltammo-
ZnO. grams, as was demonstrated by model calculations, as well as
If the donor density in nanostructured ZnO films is suf- by experiments with highly doped nanostructured SnO2:Sb
ficiently high, band bending within the individual nanocrystal electrodes, by Boschloo and Fitzmaurice.53 We can estimate that
can occur and may determine the electronic properties of the the doping density in the ZnO needs to be about 5 × 1019 cm-3
film. If we assume that the donor density is equal to the to allow for sufficient potential drop in the ZnO particles (0.8 V),
estimated total density of traps from the charge extraction so that voltammograms similar to that shown in Figure 2 can
measurements (∼2 × 1019 cm-3), which implies that all traps be obtained. This doping density seems, however, rather high
are positively charged impurities, an estimation of the maximum for unintentionally doped ZnO material. At this point, however,
potential drop within a single ZnO nanocrystal (φsc) can be we cannot exclude the possibility that the electron transport and
calculated using eq 4: recombination properties of nanostructured ZnO electrodes are
caused by a significant doping density that leads to band bending
eND 2 and energy barriers at grain boundaries.
φsc ) r (4)
60
Summary
where is the relative dielectric constant of ZnO ( ) 8 0 9), Electron transport in dye-sensitized solar cells prepared from
is the permittivity of vacuum, and r is the radius of the particle. approximately equally sized nanocrystalline ZnO and TiO2
For the fully depleted particle φsc is calculated to be ∼0.5 V. A particles was very similar in terms of transport times and light-
significant band bending may therefore be present in the ZnO intensity dependence, but the electron lifetime was significantly
particles. This is a possible cause of the very slow recombination higher in ZnO than in TiO2. The performance of ZnO-based
of electrons in ZnO with triiodide in the electrolyte. In solar cells was less than that for TiO2-based cells, despite the
Dye-Sensitized ZnO and TiO2 Solar Cells J. Phys. Chem. C, Vol. 111, No. 2, 2007 1041
reduced recombination rate. This was attributed to a lower (20) Oekermann, T.; Yoshida, T.; Minoura, H.; Wijayantha, K. G. U.;
electron injection efficiency from excited dye molecules into Peter, L. M. J. Phys. Chem. B 2004, 108, 8364.
(21) Oekermann, T.; Yoshida, T.; Boeckler, C.; Caro, J.; Minoura, H.
the ZnO conduction band and/or a lower dye regeneration J. Phys. Chem. B 2005, 109, 12560.
efficiency. The apparent activation energy for electron transport (22) Galoppini, E.; Rochford, J.; Chen, H.; Saraf, G.; Lu, Y.; Hagfeldt,
in nanostructured ZnO under short-circuit conditions was A.; Boschloo, G. J. Phys. Chem. B 2006, 110, 16159.
(23) Nazeeruddin, M. K.; Splivallo, R.; Liska, P.; Comte, P.; Grätzel,
∼0.1 eV, nearly independent of light intensity. The internal M. Chem. Commun. 2003, 1456.
voltage in the nanostructured ZnO under short-circuit conditions (24) Lindström, H.; Magnusson, E.; Holmberg, A.; Södergren, S.;
was about 0.23 V lower than VOC. Results may be explained Lindquist, S.-E.; Hagfeldt, A. Sol. Energy Mater. Sol. Cells 2002, 73, 91.
using a multiple trapping model. An alternative view was (25) Boschloo, G.; Hagfeldt, A. J. Phys. Chem. B 2005, 109, 12093.
(26) Willis, R. L.; Olson, C.; O’Regan, B.; Lutz, T.; Nelson, J.; Durrant,
presented: If there is significant doping of the ZnO, band J. R. J. Phys. Chem. B 2002, 106, 7650.
bending in the nanocrystals will result in energy barriers for (27) From the effective mass of conduction band electrons of 0.3me (ref
electron transport and recombination that can explain the 9)and 1me [Tang, H.; Prasad, K.; Sanjines, R.; Schmid, P. E.; Levy, F. J.
Appl. Phys. 1994, 75, 2042], effective densities of conduction band states
observed properties. of 4 × 1018 and 2.5 × 1019 cm-3 are calculated for ZnO and TiO2 (anatase),
respectively.
Acknowledgment. This work was financially supported by (28) Wenger, B.; Grätzel, M.; Moser, J.-E. J. Am. Chem. Soc. 2005,
127, 12150.
the International Science Program at Uppsala University and (29) Cao, F.; Oskam, G.; Searson, P. C. J. Phys. Chem. 1996, 100, 17021.
the Swedish Energy Agency. T.E. thanks BASF A.G. for (30) Dloczik, L.; Ileperuma, O.; Lauermann, I.; Peter, L. M.; Ponomarev,
financial support. We thank Göran Karlsson, Department of E. A.; Redmond, G.; Shaw, N. J.; Uhlendorf, I. J. Phys. Chem. B 1997,
Physical Chemistry, Uppsala University, for transmission 101, 10281.
(31) Fisher, A. C.; Peter, L. M.; Ponomarev, E. A.; Walker, A. B.;
electron microscopy. Wijayantha, K. G. U. J. Phys. Chem. B 2000, 104, 949.
(32) Schlichthörl, G.; Huang, S. Y.; Sprague, J.; Frank, A. J. J. Phys.
References and Notes Chem. B 1997, 101, 8139.
(33) Schlichthörl, G.; Park, N. G.; Frank, A. J. J. Phys. Chem. B 1999,
(1) O’Regan, B.; Grätzel, M. Nature (London) 1991, 353, 737. 103, 782.
(2) Hagfeldt, A.; Grätzel, M. Acc. Chem. Res. 2000, 33, 269. (34) Seager, C. H.; Myers, S. M. J. Appl. Phys. 2003, 94, 2888.
(3) Wang, P.; Zakeeruddin, S. M.; Moser, J. E.; Nazeeruddin, M. K.; (35) Forro, L.; Chauvet, O.; Emin, D.; Zuppiroli, L.; Berger, H.; Lévy,
Sekiguchi, T.; Grätzel, M. Nat. Mater. 2003, 2, 402. F. J. Appl. Phys. 1994, 75, 633.
(4) Redmond, G.; Fitzmaurice, D.; Grätzel, M. Chem. Mater. 1994, 6, (36) Zaban, A.; Greenshtein, M.; Bisquert, J. ChemPhysChem 2003, 4,
686. 859.
(5) Rensmo, H.; Keis, K.; Lindström, H.; Södergren, S.; Solbrand, A.; (37) There is some difference in the lifetimes of Figures 6b and 5a; this
Hagfeldt, A.; Lindquist, S. E.; Wang, L. N.; Muhammed, M. J. Phys. Chem. can probably be attributed to the fact that the data in the two figures stem
B 1997, 101, 2598. from two different series of cells and measurements, separated in time by
(6) Keis, K.; Lindgren, J.; Lindquist, S.-E.; Hagfeldt, A. Langmuir 2000, about a year.
16, 4688. (38) Cameron, P. J.; Peter, L. M. J. Phys. Chem. B 2005, 109, 7392.
(7) Sayama, K.; Sugihara, H.; Arakawa, H. Chem. Mater. 1998, 10, (39) We thank one reviewer for suggesting this possibility.
3825. (40) Duffy, N. W.; Peter, L. M.; Rajapakse, R. M. G.; Wijayantha, K.
(8) Ferrere, S.; Zaban, A.; Gregg, B. A. J. Phys. Chem. B 1997, 101, G. U. Electrochem. Commun. 2000, 2, 658.
4490. (41) O’Regan, B.; Lenzmann, F. J. Phys. Chem. B 2004, 108, 4342.
(9) Ozgur, U.; Alivov, Y. I.; Liu, C.; Teke, A.; Reshchikov, M. A.; (42) van de Lagemaat, J.; Frank, A. J. J. Phys. Chem. B 2000, 104,
Dogan, S.; Avrutin, V.; Cho, S. J.; Morkoc, H. J. Appl. Phys. 2005, 98, 4292.
041301. (43) Lobato, K.; Peter, L. M.; Wurfel, U. J. Phys. Chem. B 2006, 110,
(10) Hoyer, P.; Weller, H. J. Phys. Chem. 1995, 99, 14096. 16201.
(11) O’Brien, P.; Saeeda, T.; Knowles, J. J. Mater. Chem. 1996, 6, 1135. (44) Peter, L. M.; Walker, A. B.; Boschloo, G.; Hagfeldt, A. J. Phys.
(12) Vayssieres, L.; Keis, K.; Hagfeldt, A.; Lindquist, S. E. Chem. Mater. Chem. B 2006, 110, 13694.
2001, 13, 4395. (45) Redmond, G.; O’Keeffe, A.; Burgess, C.; MacHale, C.; Fitzmaurice,
(13) Peterson, R. B.; Fields, C. L.; Gregg, B. A. Langmuir 2004, 20, D. J. Phys. Chem. 1993, 97, 11081.
5114. (46) Bauer, C.; Boschloo, G.; Mukhtar, E.; Hagfeldt, A. Chem. Phys.
(14) Yoshida, T.; Tochimoto, M.; Schlettwein, D.; Wöhrle, D.; Sugiura, Lett. 2004, 387, 176.
T.; Minoura, H. Chem. Mater. 1999, 11, 2657. (47) Katoh, R.; Furube, A.; Hara, K.; Murata, S.; Sugihara, H.; Arakawa,
(15) O’Regan, B.; Sklover, V.; Grätzel, M. J. Electrochem. Soc. 2001, H.; Tachiya, M. J. Phys. Chem. B 2002, 106, 12957.
148, C498. (48) Look, D. C.; Hemsky, J. W.; Sizelove, J. R. Phys. ReV. Lett. 1999,
(16) Huang, M. H.; Wu, Y.; Feick, H.; Tran, N.; Weber, E.; Yang, P. 82, 2552.
AdV. Mater. 2001, 13, 113. (49) Van de Walle, C. G. Phys. ReV. Lett. 2000, 85, 1012.
(17) Keis, K.; Magnusson, E.; Lindström, H.; Lindquist, S.-E.; Hagfeldt, (50) Jokela, S. J.; McCluskey, M. D. Phys. ReV. B 2005, 72, 113201.
A. Sol. Energy Mater. Sol. Cells 2002, 73, 51. (51) van de Lagemaat, J.; Frank, A. J. J. Phys. Chem. B 2001, 105,
(18) Kakiuchi, K.; Hosono, E.; Fujihara, S. J. Photochem. Photobiol., 11194.
A: Chem. 2005, 179, 81. (52) Sze, S. M. Physics of Semiconductor DeVices; Wiley: New York,
(19) Bauer, C.; Boschloo, G.; Mukhtar, E.; Hagfeldt, A. J. Phys. Chem. 2006.
B 2001, 105, 5585. (53) Boschloo, G.; Fitzmaurice, D. J. Phys. Chem. B 1999, 103, 3093.