Professional Documents
Culture Documents
High accuracy comsol simulation method of bimorph cantilever for piezoelectric vibration
energy harvesting
AIP Advances 9, 095067 (2019); https://doi.org/10.1063/1.5119328
I. INTRODUCTION been no systematic studies that examine how the size and
resonance mode affect a cantilever’s mass detection sensitiv-
Recently, there has been a growing interest in utilizing ity.
silicon-based microcantilevers1–5 for bio sensing by either In this study, we investigate the effect of a cantilever’s
mass or force detection. For biomolecular detection, recep- length, width, and resonance mode on the mass detection
tors were coated on the surface of the microcantilevers to sensitivity of a piezoelectric unimorph cantilever both ex-
bind target DNA or protein molecules.1–5 The stress gener- perimentally and theoretically. Specifically, we considered a
ated at the time of binding or unbinding of the target mol- point mass loaded at the cantilever tip and examine the effect
ecules to the receptors on the microcantilever surface induces of the cantilever length, width, and resonance mode on the
a temporary deflection of the microcantilever that is detected resonance frequency shift due to the load. The cantilevers
by the optical components.1–5 Alternatively, the adsorbed tar- used were piezoelectric unimorph 关lead zirconate titanate
get molecules can be detected by monitoring the mechanical 共PZT兲/stainless steel兴 cantilevers. The advantage of using a
resonance frequency of the microcantilever. The adsorption piezoelectric unimorph cantilever is that both actuation and
of target molecules causes a change in the microcantilever’s sensing can be achieved electrically. As we have shown in a
mass, which in turn causes a shift in the resonance frequency. previous study,8 a dual top electrode design, i.e., a sensing
The silicon-based microcantilevers, about 100 m in length, top electrode separated from a driving top electrode allows
exhibit high mass-detection sensitivity, ⌬m/⌬ f the resonance to be detected simply. When an ac voltage is
⬃10⫺12 g/Hz, 6,7 where ⌬m and ⌬ f , respectively, denote the applied at the driving electrode the converse piezoelectric
mass change and the corresponding resonance frequency effect causes vibrations in the cantilever. At resonance, the
change. Compared to detection by the induced stress that large resonant vibrations give rise to large piezoelectric volt-
dissipates in 20 min after binding, detection by the resonance ages detectable at the sensing electrode by the direct piezo-
mechanism is more desirable because the resonance fre- electric effect. Alternatively, the resonance can be detected
quency shift due to binding of the biomolecules can still be using an impedance analyzer where the mechanical reso-
detected long after the binding occurs. Piezoelectric cantile- nance gives rise to a peak in the real part of the impedance
ver sensors have the advantages of using only electrical and hence the phase angle. In this case, only one top elec-
means for sensing avoiding the complex optical detection trode is needed. For the present study, all measurements were
equipment in silicon-based cantilever sensors. Recently, we carried out with an impedance analyzer.
have demonstrated piezoelectric cantilevers as liquid viscos-
ity and density sensors by monitoring the cantilevers’ reso-
II. EXPERIMENTAL PROCEDURE
nance frequency shift and peak broadening in a liquid.8
There is a great potential for piezoelectric cantilevers as The PZT/stainless steel unimorph cantilever was com-
mass detectors as well. Despite the great potential, there have posed of a 0.03 cm thick PZT 共APC International Ltd.,
冑
TABLE I. Physical parameters of the cantilever.
2n 1 Dp
f n⫽ , 共3兲
PZT Stainless steel 2 L2 m
Density, 共Kg/m3兲 7.5⫻103 7.8⫻103 where 2n is the dimensionless nth-mode eigenvalue.
Young’s modulus, E (N/m2 ) 6.1⫻1010 20⫻1010 Let h⬅h p ⫹h s and denote r p ⬅h p /h and r s ⬅h s /h as the
Thickness, h (mm) 0.3 0.1
thickness fraction of the piezoelectric layer and that of the
stainless steel layer, respectively. With r s and r p , the bend-
ing modulus per unit width of the cantilever becomes
Mackeyville, PA兲 layer and a 0.01 cm thick stainless steel E 2p r 4p ⫹E s2 r s4 ⫹2E p E s r p r s 共 2r 2p ⫹2r s2 ⫹3r p r s 兲
共Shop-Aid Inc. Woburn, MA兲 layer. The PZT layer was D p ⫽h 3 .
12共 E p r p ⫹E s r s 兲
bonded to the stainless steel layer with a conductive epoxy 共4兲
共GC Conductive Epoxy: GC Electronics, Rockford, IL兲
cured at 80 °C. The resonance spectra of the cantilever were Denoting
obtained using an HP4192A impedance analyzer. The PZT/ E 2p r 4p ⫹E s2 r s4 ⫹2E p E s r p r s 共 2r 2p ⫹2r s2 ⫹3r p r s 兲
stainless steel cantilever was rigidly clamped at one end of Ẽ⬅ , 共5兲
共 E p r p ⫹E s r s 兲
the cantilever with an aluminum fixture. Measurements were
carried out with cantilevers of 0.4 cm and 0.2 cm in width. the bending modulus per unit width can be rewritten as
The length of the cantilevers was varied from 1.37 cm to
0.44 cm by changing the clamp position. The Young’s Ẽh 3
D p⫽ . 共6兲
moduli and densities of the PZT and stainless steel layers are 12
listed in Table I. The quantity, Ẽ, can be viewed as the effective Young’s
modulus of the unimorph cantilever that depends only on the
Young’s moduli, E p and E s , and the dimensionless thickness
III. THEORETICAL ANALYSIS
fraction, r p and r s , of the layers. With
Consider a piezoelectric unimorph cantilever of length, ˜ ⫽ p r p ⫹ s r s , 共7兲
L, and width, w, as schematically shown in Fig. 1. The pi-
ezoelectric layer has a density, p , Young’s modulus, E p , the mass per unit area, m, of the cantilever can be rewritten
and thickness, h p . The nonpiezoelectric stainless steel layer as
has a density, s , Young’s modulus, E s , and thickness, h s .
m⫽h˜ . 共8兲
The bending modulus per unit width, D p , of the cantilever
depends on the Young’s moduli, E p and E s , and the thick- Clearly, ˜ is the effective density of the unimorph cantilever
ness, h p and h s , of the layers and can be written as9 that depends only on the densities, p and s , and the di-
mensionless thickness fractions, r p and r s , of the piezoelec-
E 2p h 4p ⫹E s2 h s4 ⫹2E p E s h p h s 共 2h 2p ⫹2h s2 ⫹3h p h s 兲
D p⫽ . tric and nonpiezoelectric layers. Thus, alternatively, the
12共 E p h p ⫹E s h s 兲 bending-mode resonance frequency depicted in Eq. 共3兲 can
共1兲 be expressed as
冑
The mass per unit area of the cantilever is
2nh Ẽ
m⫽ p h p ⫹ s h s . 共2兲 f n⫽ . 共9兲
2 冑12 L ˜
2
f n⫽
⬘n 2
2
冑 K
Me
, 共10兲
FIG. 1. A schematic of a piezoelectric PZT/stainless steel unimorph canti- Because the axial velocity varies along the length direction,
lever. the effective mass at the cantilever tip is therefore10
1682 J. Appl. Phys., Vol. 91, No. 3, 1 February 2002 Yi, Shih, and Shih
冕 冕 冉 冊 v共 x 兲
w L 2
M e⫽ dy m dx⫽0.236mwL, 共12兲
0 0 v共 L 兲
where v (x) and v (L) are, respectively, the axial velocity at a
distance x from the clamp, and that at the cantilever tip. Note
that in Eq. 共12兲, the variation of the axial velocity in the
width direction is neglected, which is justifiable as long as
wⰆL. Consider a small mass ⌬m loaded at the tip of the
cantilever as schematically shown in Fig. 1. When the di-
mension of the added mass is much smaller than the length
of the cantilever, the added mass may be approximated as a
point mass located at the cantilever tip, the flexural-mode
resonance frequency thus can be approximated as
f n⬘ ⫽
n⬘ 2
2
冑 K
M e ⫹⌬m
. 共13兲
FIG. 2. Phase angle versus frequency of a piezoelectric PZT/stainless steel
For ⌬mⰆM e , the resonance frequency shift, ⌬ f n , due to unimorph cantilever in the frequency range 0–50 kHz. The cantilever was
the added mass, ⌬m, is thus 1.37 cm long and 0.4 cm wide.
1 ⌬m
⌬ f n ⫽ f n ⫺ f n⬘ ⬵ f . 共14兲 nth-mode resonance frequency to the first-mode resonance
2 n Me
frequency, ( f n / f 1 ), was 6.19, 17.28, and 33.56 for n⫽2, 3,
The resonance frequency shift per unit loaded mass is there- and 4, respectively, which were within 2% of the theoretical
fore ratios, 6.267, 17.55, and 34.39 for n⫽2, 3, and 4,
⌬fn 1 fn respectively.11 The Q factor remained about 45 for all four
⬵ modes, indicating that the breadth of the peak increased in
⌬m 2 M e
proportion to the increased resonance frequency. The larger
⫽
1
冉
2n h
2 2 冑12 L 2
冑冊 Ẽ 1
˜ 0.236Lwh˜
peak widths at higher modes will give rise to larger error
bars when determining the resonance-frequency shift, as we
will show below. Given the cantilever thickness and the
⫽
2n 1 1
冉
4 L w 0.236冑12˜
3 冑冊Ẽ
˜
. 共15兲
Young’s modulus and density profile in the thickness direc-
tion, according to Eq. 共9兲, the bending-mode resonance fre-
quency is expected to increase with a decreasing cantilever
The term in the parentheses involves the dimensionless length as L ⫺2 . In Fig. 3, we plot the first-mode resonance
thickness profiles of the Young’s modulus and density that frequency versus the cantilever length, L. The open squares
depends on the relative layer thickness fractions but not the represent the measured resonance frequencies and the solid
dimensions of the cantilever. Thus, once the effective line the calculated ones obtained using Eq. 共3兲 关which is
Young’s modulus and effective density of the cantilever is equivalent to Eq. 共9兲兴. The measured resonance frequencies
fixed, say, by maintaining the same layer thickness fractions, agreed with the calculated ones, indicating the validity of
⌬ f /⌬m depends only on the length and width of the canti- Eqs. 共3兲 and 共9兲.
lever and eigenvalues as For the mass detection experiments, small pieces of alu-
minum foil were cut and placed at the cantilever tip. The
⌬fn 2n mass of an aluminum piece was calibrated with a Mettler
⬀ 3 . 共16兲
⌬m L w H542 Balance 共Mettler Instrument Corp., Hightstown, NJ兲 to
IV. RESULTS
FIG. 8. ⌬ f /⌬m versus L on a double logarithmic plot for all the modes and
widths examined.
冕 冕 冉 冊
⫻(w/w0) versus L on a double logarithmic scale. Note that all
data points in Fig. 9共a兲 fall on a straight line with a slope
w L ⌬m v共 x 兲 2
⌬m e ⫽ dy dx⫽0.236⌬m. 共17a兲
⫽⫺3, indicating that indeed ⌬ f n /⌬m⬀ 2n /L 3 w as depicted 0 0 wL v共 L 兲
by Eq. 共16兲. To show that the scaling relationship depicted in Therefore, the expression for ⌬ f n /⌬m is modified by the
Eq. 共16兲 also applies to microcantilevers, we included the fact that ⌬m e is 0.236⌬m and that ⌬ f n /⌬m e
data from Refs. 6 and 7 and replotted (⌬ f n /⌬m)( 21 / 2n ) ⫽ 12 ( f n /M e ). Therefore, for ⌬m uniformly distributed over
⫻(w/w 0 ) versus L in Fig. 9共b兲. All data points, including the entire cantilever surface,
冉 冑冊
those from Refs. 6 and 7, fall on a straight line with a
slope⫽⫺3 over 6 decades, indicating the validity of Eqs. ⌬ f n 2n 1 1 Ẽ
共16兲 down to 100 micron size microcantilevers. ⫽ . 共17b兲
⌬m 4 L 3 w 冑12˜ ˜
Note that Eq. 共17兲 holds as long as the added mass does not
V. DISCUSSIONS
form a solid film rigidly bonded to the cantilever surface. If
The theory that we have presented assumes a point mass. the added mass forms a solid film rigidly bonded to the can-
However, the results presented are quite general. If the added tilever surface, the bending modulus of the cantilever will
mass ⌬m is distributed on a narrow strip at the tip as de- also be increased that tends to increase the resonance
picted in Fig. 10共a兲, for wⰆL as we considered in the present frequency9 and Eq. 共17兲 no longer holds. Comparing Eq. 共17兲
study, the axial velocity does not vary in the width direction, to Eq. 共15兲, for a given ⌬m, the ⌬ f for ⌬m distributed over
therefore, Eq. 共15兲 still holds. If the added mass is distributed the entire cantilever surface is reduced to 0.236 times that
J. Appl. Phys., Vol. 91, No. 3, 1 February 2002 Yi, Shih, and Shih 1685
FIG. 10. A schematic of a PZT/stainless steel cantilever with 共a兲 a strip ⌬m FIG. 11. A schematic of a cantilever being reduced in size by a factor ␣
at the tip of the cantilever and 共b兲 ⌬m uniformly distributed over the can- proportionally in all dimensions.
tilever surface.
reduced to 10 m in length, ⌬ f /⌬m will approach where Ẽ and ˜ are the effective Young’s modulus and den-
1017 Hz/g. sity that depend only on the Young’s modulus, density and
1686 J. Appl. Phys., Vol. 91, No. 3, 1 February 2002 Yi, Shih, and Shih
1
thickness fraction of the individual layer. Therefore, when a J. Fritz, M. K. Baller, H. P. Lang, H. Rothuizen, P. Vettiger, E. Meyer,
cantilever is reduced in size by a factor ␣ proportionally in H.-J. Guntherodt, Ch. Gerber, and J. K. Gimzewski, Science 288, 316
共2000兲.
all dimensions, ⌬ f /⌬m will be increased by a factor of ␣ ⫺4 2
A. Schemmel and H. E. Gaub, Rev. Sci. Instrum. 70, 1313 共1999兲.
given the same Ẽ and ˜ , say, by maintaining the same layer 3
D. R. Baselt, G. U. Lee, and R. J. Colton, J. Vac. Sci. Technol. B 14, 789
thickness fractions. We also showed that the same scaling 共1996兲.
relationship can be applied to a strip mass loaded at the tip as 4
G. U. Lee, D. A. Kidwell, and R. J. Colton, U.S. Patent Appl. 共1996兲 38
well as uniformly distributed mass on the cantilever surface pp. Avail. NTIS Order No. PAT-APPL-8-505 547.
5
W. Han, S. M. Lindsay, and T. Jing, Appl. Phys. Lett. 69, 4111 共1996兲.
provided that the uniformly distributed mass does not form a 6
T. Thundat, E. A. Wachter, S. L. Sharp, and R. J. Warmack, Appl. Phys.
solid film rigidly bonded to the cantilever surface. Lett. 66, 1695 共1995兲.
7
B. Ilic, D. Czaplewsli, H. G. Craighead, P. Neuzil, C. Campagnolo, and C.
ACKNOWLEDGMENTS Batt, Appl. Phys. Lett. 77, 450 共2000兲.
8
W. Y. Shih, X. Li, H. Gu, and W.-H. Shih, J. Appl. Phys. 89, 1497 共2001兲.
This work is supported in part by the Army Research 9
X. Li, W. Y. Shih, I. A. Aksay, and W.-H. Shih, J. Am. Ceram. Soc. 82,
Office Multidisciplinary University Research Initiative 1733 共1999兲.
共MURI兲 under Grant No. DAAH04-95-1-0102, the National
10
J. Merhaut, Theory of Electroacoustics 共McGraw-Hill, New York, 1981兲,
p. 100.
Aeronautics and Space Administration 共NASA兲 under Grant 11
L. E. Kinsler and A. R. Frey, Fundamentals of Acoustics, 2nd ed. 共Wiley,
No. NAG2-1475, and the National Science Foundation under New York, 1962兲.
Grant No. BES-0120321. 12
J. W. Yi, W. Y. Shih, W.-H. Shih, and R. Mutharasan 共unpublished兲.