Ee Varsasiley ~u a routud (20%) Ics 87.040 R EN ISO 2808 Vopsele si lacurl Determinarea grosimii peliculei Paints and varnishes. Determination of flim thickness Peintures et vernis. Détermination de |'6paisseur du feull APROBARE Aprobat de Directorul General al ASRO la 31 iulie 2007 Standardul european EN ISO 2808:2007 a fost adoptat prin metoda notei de confirmare $i are statutul unui standard foman Inlocuieste SR EN ISO 2808:2002 CORESPONDENTA |Acest standard este identic cu standardul european EN ISO 2808;2007 This standard is identical with the European Standard EN ISO 2808:2007 La présente norme est identique 4 la Norme européenne EN ISO 2808;2007 ‘ASOCIATIA DE STANDARDIZARE DIN ROMANIA (ABRO) ‘Mendelsey nr. 21-25, cod D132, Direetor General: Tel: #40 21 316 3208, Fax: +40 21 316 0870 Directs Siandardizare: Tel. +4021 310 17 80, +40 21 910 49 08, 44021 912.47 44, Fax 440 21 915 5870. Diese Pua. SonVincddAzonererte: Tal 40.21 2%6 77°25, Fars 21 91726 14, +4021 912 B488 Senicil ‘Marketing. Drepturi de Autor + 40 24 316 83 74 Taratianen sai Aeron iregals eau para promi card otce ORSCST PT ORS POSTEO SASRO [Morons mecnistoeapare rcrftnre ca) eae caps eve aru sateal AGRO Ref: SR EN ISO 2808-2007 Edis 2EUROPEAN STANDARD EN ISO 2808 NORME EUROPEENNE EUROPAISCHE NORM February 2007 168 87.040 ‘Supewedes EN ISO 2808:1999 English Version Paints and varnishes - Determination of film thickness (ISO 2808:2007) Pinturas ot vorns = Détarminason de Fépaisseux du Soul Beschichuungsaiote » Bestimmung dor Scuehiceke (160 (aso 2408-2007) 720082007) “This European Standart was approved by CEN an 16 Desaenber 2006, (CEN memtere-em bound i comely with the CEN/CENELEC Intamal Ragulatlons which stjpulaw the eoniions fer givng tis Eurspsca ‘Standurd the etaus af @ national standard without any aeration. Upeordst Tate anc biographical roferances eanderning auch natn ‘tendons ray e tained on application tothe GEN Manapement Gente oo eny GEN meenter, ‘This European Standard ens n re offal versions (Engleh French, German}. A version In eny other language medio by trenslation ung ite maprably of « CEH manber lo sown lnguoge android tow CEN Manager. Carr th sare ss es he (CEN members sro the ralienl standards bodes of Austia, Beljum, Buigaa. Cpe. zach Repulie. Denmark, Emon, Fla, Franon, Gemary, Greeoe,Hingar,folnd, sand, tly, Leva, tua, Luxembourg, Nata Neterands, Nomay, Poland, Forge ‘Romania, ovale, Sioveris, Span, Swede, Suieriard and Urked Kegon. : FRKOFEAN COMMITTEE FOR STANDARDIZATION COMITE FOROPSAN DE NORMALIEATION EUROPAISCHES KOMITEE FOR NORMUNG Monagemant Cantra: rue ds Stassar, 26 8.1950 Brusgels (©2007 CEN All sights of explltsion fn any form end by ary means reserved Rot Na, EN 180 2800:2007: = ‘worlwide for GEN national Mesrbrs,[EN 180 2808:2007 (€) Foreword This document (EN ISO 2808:2007) has been prepared by Technical Committee ISO/TC 36 "Paints and varnishes" in collaboration with Technical Committee CEN/TC: 139 "Paints and vamishes", tha secretariet of which is held by DIN, This European Standard shall be given the status of a national standard, either by publication of ‘an identical text or by endorsement, at the latest by August 2007, and conflicting national standards shall be withdrawn at the latest by August 2007. This document supersedes EN ISO 2608:1989. ‘According to the CEN/CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Ausinia, Belaium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finiand, France, Germany, Greece, Hungery, Iceland, Ireland, aly, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Siovenis, Spain, Sweden, Switzerland and Unitad Kingdom. Endorsement notice ‘The text of 180 2808:2007 has been approved by GEN as EN ISO 2608-2007 without any modifications.INTERNATIONAL Iso STANDARD 2808 Fourth edition 2007.42.01 Paints and varnishes — Determination of film thickness Peintures et vernis — Détermination de répaisseur du foul 180 2808:2007() 81802007180 2808:2007(E) POF aiselaimar ‘This POF fie may contain embedded typefaces. In socordance with Adcosls Soansing policy, this fle may be printed or viewed but shall not be edited unless the typefaces which are embedded are oarasd to and nsec on Ze comput performing the edn. Soumlaading this fie, parties accept Ermrein te responsibly of not infinging Adbe'sosesing policy. The 180 Central Secretariat ssccepisne bly ins area, ‘Adobe 9 taidariark of Rect Systems Incorporated. (Dstais of the sofware products used to creale this POF fle can be found In the General Ino relativo to tho fla; tha POF-ereation pparameturs wars optimize for printing. Every care has bean taken tent that he fei Eulabo for Use by ISO momber badias In the untaly event that 2 probier raleting 1 Its fund, pleas lforsthe Canral ecrateat alle adivegs gen Below © 1802007 A rights reserved. Uriess ctheraise epeciiod, no part cf this putieaton may be reproduced or Ulzed in ny forn cr by any Maas, flocionic er mechanical, Incusing photocopying and micron, without porisicn in wrting from eer ISO at the scavens below oF 80's mombartocy inthe county ofthe requester 180 copyrgntotice Caco postal 58 + CH-1211 Geneva 20 Tel #4122 749.0711 Pox +41 72 7490967 smal copyrightiisa-org Web wm. ong Published In Sntearané ii (© 180 2007 —Allrghts cesarvedISO 2808:2007(E) eeeteREtE™ ~~ - 434 Method 1B — Wheel gaug) Methed 1C —Dial gauge Gravimetric method. Prime pe on. General, Photothermal method, Principle snare nn Field of applicatic Gem BrAl evr Method 3— Determination using thermal properties. Determination of dry-flm thickness. General. Mechani Principle Fold of sppitestion General. Method 4A — By difference in thickness sss: Method 48 — Depth gauging Method 4C — Surface profile scanning. Gravimetric method. Principle Field of application (© 180.2007 - Allright reserved Wi180 2808:2007(E) 5.5.7 Mathod 7C—Magnetic-induction gauge 5.5.8 Method 7D —Eddy-current gauge. 58.3 General. 5.7 Photothermal method. 5.74 Principle 57.2 Field of application 8.3.4 Method 12A — Magnetic-induction gauge 6.3.5 Method 128 — Eddy-current gauge 64 — Photothermal mathod. 64.1 Principle. 842 Field of application... a mo 64.4 Mothod 13 — Determination using thermal properties Measurement of film thickness on rough surfaces. Tad 742 733 8 ‘Test report..... Annex A (informative) Overview of methods. Bibliography iv (© 190:2007— AI rights reserved180 2808:2007(E) Foreword |S (the International Organization for Standardization) is a worldwide federation of national standards bodies (SO member bodies). The work of preparing international Standards is normally carried out through ISO technical committees, Each member body interested in a subject for which # technical committee has bean ‘established has the right fo be represented on that committee. Intemational organizations, gavemmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of alectrotechnical standardization, Intemational Standards are dratted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical commitiees is to prapare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an Intemational Standard requires approval by at leasl 75% of the member bodies casting a vote, ‘Aniantion is drawn to the possibilty that some of the elemants of this document may be the subject of patent tighis. ISO shall not ba held respansibie for identifying any oral! such patent rights, 1$0.2808 was prepared by Technical Commitee ISO/TC 35, Paints and vamishes, Subcommitias SCO, Gonsral test mathods for paints and varnishes. ‘This fourth edition cancels and replaces the third edition (iSO 2608:1897), which has been technically revises, ‘The main changes areas follows: a) The structure of the standard has baen changed into four main clauses: 1) determination of wet-fim thickness; 2) determination of dry-film thickness; 3) determination of the thickness of uncured powder layers; and 4) measurement of film thickness on rough surfaces. b) Methods using photothermal, raciological and acoustic techniques have been added. '¢) The spit-beam method has been deleted as such instruments are no longer manufactured. 1S0 2007 - Alrights reserved vISO 2808:2007(E) Introduction ‘Measurement af fim thickness depends on the fatowing steps: 8) ) ) 4) ‘calibration of the measurement Instrument, typically pesformed by the manufaeturer or by any qualified laboratory, verification of tha Instrument (an accuracy check performed by the user at ragular intervals, typically before each series of measurements); Subsequent adjustment, if necessary, of the instrument so that the thickness readings it gives match those of a specimen of known thickness. For a dry-flm thickness gauge this would mean zaraing it on the unceated surface, using devices of knawn thickness such as shims, or using a coated specimen of known film thickness; measurement, €1S0 2007 — Ad ois aearvedINTERNATIONAL STANDARD ISO 2808:2007(E) Paints and varnishes — Determination of film thickness 1 Scope This Intornational Standard describes a number of methods that are applicable to the measurement of the thickness of coatings applied to & Substrate. Methods for determining wel-flm thickness, dry-flm thickness and the film thickness of uncured powder layers are desoribed. Reference is made to individual standards where these exist. Otherwise tha method is described in detail An overview on the methods is given in Annex A, in which the fleld of application, existing standards and the procision are specified for the individual methods. This International Standard also defines terms conceming the determination of fim thickness. ‘The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) apoes. 150.463, Geometrical Product Specifications (GPS) — Dimensional moasuring equipment — Design and metrological characteristics of mechanical dia! geuges 180.3611, Micrometer calipers for extemal eneasurement 1804618:2006, Paints and vamishes — Terms and definitions 18089031, Preparation of stee/ substrates before application. of paints and relaied pructs — Surtuce roughness characteristics of blesi-cleaned steal substrates — Part 1; Specifications and definitions far |SO surface profile comparators for the assessment of abrasive blast-cleaned surfacas 3 Terms and definitions For the purposes of this document, the tetms and definitions given in ISO 4818 and the following apply. 34 substrate surface to which a coating material is applied or is fo be applied [iso 4618:2006] 32 coating antinuous layer formed from # singl@ or multiple application of a coating material to 8 substrate [iso 4818:2008] +8190 2007 — Aalnghtn rosarved 410 2808:2007(E) 33 film thickness distance between the surface of the film and the surface af the substrate 34 wet-film thickness thickness of a freshly applled wet coating material, measured immediately alles application 35 dryfiim thickness ‘thickness of a coating remaining on the surface when the coating has hardened 38 thickness of uncured powder layer ‘thickness of a freshly applied casting material in powder form, measured immediately after application and before stoving a7 relevant surface area’) part of an article covered or fo be covered by the caating and for which the coating & essential for Sorvicaabilty andior appearance 38 test area‘) representative part of the relevant surface arée within which an agreed number of single measurements Is made as a spot-check 3.9 measuroment area!) area over which a single measurement is made 3.10 minimum local film thickness!) Tawest value of the local film thickness found on the relevant surface area of a particular test specimen 341 ‘maximum local film thickness’? highest value of the local film thickness found on the relevant surface area of a particular test specimen 3.12 mean film thickness") artthmetic mean of all the individual ary-fim thicknesses in the test ares or the result of & gravimetric determination of the thickness 3.43 calibration Controlled and documented process of measuring traceable calibration standarcs and verifying that the results are within the stated accuracy of the measurement instrument NOTE intial callscaton io hypically performed by the instrument manufacturer oF by @ qualified laboratory in a Controlled environment using a documented process. This inital calibration will normally be verified by tha user at regular Infecvals, The standards used inthe caibration ane such thatthe combined uncerteinties ofthe resultant messuremedt are \ess than the stated accuracy of the instrument. ) Messurement of this propery is anly required for the extended evaluation of film thickness measurements; see Clause 8 (test report}, ems &} and |) 2 *@1S0 2007 — Alt rights reserved10 2808:2007(E) 3.4 verification accuracy check performed by the user using reference standards 345 reference standard specimen of known thickness against which a user can verify the accuracy of the measurement instrument NOTE References staraius may be costed thickness stendants, or shims. agreed to by the contracting parties, & part ofthe tos! epscimen may be used as a thickness standard for @ particular job. 316 adjustment act of aligning the measurement instruments thickness readings to match thos@ of @ reference standard NOTE Mas! electronic measuremant instruments can be adjusted on 2 thickness standard or on a shim, where the thickness of the coating oF of tha shim is kriowm, 347 accuracy consisteney between @ measured value and the true value of the thickness standard 4 Determination of wet-film thickness 4.1 General “Annex A gives an everview of the methods used for he determination of welt-flm thickness. 4.2 Mechanical methods 42.1. Principle In all mechanical methods the substrate surface is contacted by part of the measurement instrument through the costing, and the eurface of the coating is contacted simultaneously (see Figure 1) or subsequently (see Figures 2 and 8) by anather part of the instument, The wet-flm thickness Is the helght difference between these wo poinis af contact, which can be read directly. 42.2 Field of application ‘The mechanical principle is suitabie for all lm-substrate combinations. The substrate has to be flat in at least one direction in the ares where the measurement Is conducted. Curvature of the surface in a single plane is permissible (e.g, intemal or external surface of pipes), 42.3. Generat Classification as a dastructive or non-destructive method depends on: a) the rheological properties of the coating material; 1) the nature of the wetting contact between the contact surfaces of the measurement instrumant and the coating material; c) whether the thickness measurements will make the coating unsuitable for the purpose for which it is intended, Since the possibility of pigment particles remaining between the gauge and the substrate cannot be excluded, all mechanical methods contain a systematic error: the film thickness displayed fs smaller than the actual wet- flim thickness by at least the mean diameter of the pigment partices. (380 2007 —ARrights reserved 3180 2808:2007(E) In the cage of @ wheel gauge (method 18, see 4.2.5), the whoo! has to be wetted by the coating matorial. I not, this tepresenis a further source of systematic error which can result in exaggerated readings and Is @ function of: — the surface tension and the rheological properties of the coating material; — the material of the wheel gauge: — the speed al which the wheel is tumed. 4.24 Method 1A — Comb gauge 4241 Description of instrument Si A. comb gauge is a flat plate made of a corrosion-resistant material with teeth along its edges (see Fh 7 The reference teeth at the comers of the plaie define a baseline along which the inner teeth are. aa give a graduated series of gaps. Each tooth is labelled with the assigned gap value, a 3 With commercially available comb gauges the maximum thickness which can be measured is tyiiedlly | 2.000 ym and the smallest increments typically 5 ym 4 i substrate eoating point of wetting eontact comb gauge Figure 1 — Example of a comb gauge 424.2 Procedure Ensure that the teeth are clean and not wam or damaged. Pface the comb gauge onto the flat specimen Surface such that the teeth are normal io the plane of the surface, Allow sufficient time for the coating to wet the teeth prior to. removing the gauge. In tha case of specimens curved in a single plane, the comb gauge shall be placed in position paralel to the axis of curvature, ‘The result of tho thickness measurement depends on the ime of measurement, Tha thickness should therefore be measured a6 soon as possible after application, ‘Note the greatest gap reading of the toath wetted by the coating material as the wetfilm thickness, 4 ({@ 90 2007 = All rights resarvec!1S0 2808:2007(E) 42.5 Method 18 — Wheel gauge 42.5.1 Description of instrument Awheel gauge consists of a wheel, made of hardened and corosion-resistent steel, with thrae projecting rims. (se Figure 2). ‘Twn rims are ground to the same diameter and are configured concentrically to the wheel axle The third rim has a smaller diameter and is eccentrically ground. One of the outer rims has 2 scale from which the fespective projection of the concentric rims relative to the sccantrie rim can be read, “Two varsions are available: — version + has the ecoentric rit located between the concentric rims; — version 2 has the eccentric fim located outside the concentric ims and closely adjacent to one of them. NOTE Unik version 1, the design of version 2 slows paralex-free reading ofthe wel thickndss, With commercially available wheel gauges. the maximum thickness which can ba measured ie typically +1 800 jum and the smallest increment is typically 2 pm. 3 coating secentric nm whee! gauge pana Figure 2 — Example of a wheel gauge 4252 Procedure Grip the whee! gauge with tha thumb and index finger by the wheel axle and press the concentric rims.onto the surface at the point of the largest reading on the scale. In the case of specimens curved ln a single plano, the awis of curvature and the whee! gauge axle shall be parallel Roll the whee! gauge in one direction, iit it from the surface and read off the highest scale reading at which the eccentric rim is still wetted by the coating material. Clean the gauge and repeat in the other direction. (© 190 2007 — Al rights reserved 510 2808:2007(E) Calculate the wet-flm thickness as the arithmetic mean of these readings. The result of the thickness measurement depends on the time of measurement. The thickness shoukd ‘therefore be measured as saon as possible after application, To minimize the effect of surface tension on the result, observe how the paint wets the eccantric rim and record tha seale reading at the first point of contact. This fs only possible with version 2 of the wheel gauge. 42.8 Method 1¢— Dial gauge 4.2.6.1 Instrument and reference standards 4.2.6.1.1 Dial gauge (see Figura 3) Mechanical dial gauges conforming to the requirements of 1SO463 and electronic dial gauges are typically ‘capable of measuring to an accuracy of 5 um (mechanical dial gauge) or 1 um (electronic dial gauge), or better, The gauge can have an analogue ar digital cispiay. ‘The underside of the dial gauge has two contact pins of equal length located equidistant from the movable plunger and in a stralght ine with i in adjusting screw is Used to make fise adjustments tothe position of the plunger ints guideway. Figure 3— Example of a dial gaugo 4264.2 Reference standard for zeroing the gauge A lat roferance plate is required for zarolng the gauge. The reference plate shall consist of @ flat glass plate ‘whose flatness tolerance does not exceed im (gee also ISO 1101 6.2 Procedure Zero the dial gauge on the reference plate with the measuring tip adjusted 86 that itis just touching the plate. Screw the plunger back from the zeroing position. Place the contact pins of the dial gauge on the specimen s0 {hat thay are normal ta the surface of the substrate and carefully screw the plunger dawn uni the measuring tip is just touching the coating material 6 {180 2007 ~ Allright raserueet180 2808:2007(E) The result of the thickness measurement depends an the time of measurement. The thickness should thorofore be measured as soon as possible after application. Read the wet-flm thickness directly from the gauge. 4.3 Gravimetric method 434. Principle ‘A caating is applied and the thickness js determined by dividing the mass of the coating by Its density and by the coated suriace area, ‘The wet-flm thickness, 4, in micrometres, is calculated from tha equation (1) where imp. the mass of the uncoated specimen, in grams; m8 the mass of the coated specimen, In grams; A. is the coated surface area, in square metres; pis the density of the liquid coating material applied, in grams per mifilitre. NOTE The density of the liquid coating material applied can be detormined in accordance wah ISO 281 180 2611-2, ISO 2841-9 or ISO 2811-4 4.3.2 Field of application The gravimatic principle is generally applicable, provided thal tha amount of highly volatile substances in the liquid coating matertal is low. 43.3 General Determination using the gravimetric principle yields tha mean value of the wer-flm thickness over the entire ‘casted surface area. With spray application in particular, the reverse sice of the specimen shail be masked to prevent measurement errors resulting from partial coaling of the reverse (overspray). Any masking of the reverse side shall be removed before weighing the coated specimen, 43.4 Method 2—By difference in mass. 43.44 Apparatus Required are scales capable of weighing up to 500 gto the nearest 1 mg. 43.42 Procedure Weigh the specimen first uncoated and then coated and calculate the wel-film thickness using Equation (1), (2150 2007 ~All ahs reserved 7(SO 2808;2007(E) 4.4 Photothermal method 4.4.4 Principia ‘The film thickness is determined from the difference between the time a thermal wave is radiated towards the ‘coating and the lima the re-emilted wave (either heat or ultrasonic) is detacted (see Figure 4). Inspective of the type of excitation involved or the method of detection, al! photothermal methods. use the ‘same principle: the periodic or pulsed introduction of energy in the form of heat into a spacimien and the Subsequent detection of the local temperature increase, ‘The time difference measured is compared against values obtained with the instrument for films of known thickness under fixed conditions (excitation anergy, pulse length, excitation frequency, etc.) {see 4.4.4.2). Key substrate coating re-emitted thermal ragiation absorption of radiation by coating (depends on coating thickness and casting materi!) ‘thermal radiation thormet waved ultrosonie waves ‘surface deformation Figure 4 — Interaction of radiation with the specimen in phototharmal thickness measurement, showing surface deformation 442° Field of application The photothermal principle is basically suitable for all flm-substrate combinations. It can also be used to Getarmina the thicknesses of the Individual layers in a multilayer coating, provided the layers are sufficiently Gistinct from each othar with respect to their thermal conductivity and reflection properties. The required minimum substrate thickness is a function of the measurement system used (see 4.4.4.1,1) and (he film-substrala combination, 8 (©2180 207 - Aulrighterasansee150 2808:2007(E) 443° General Classification of the methed as destructive or non-destructive depends on the purpose of the coating, The thermal energy absorbed by the coating could have an impact an the coating owing to the local heating effect produced (soe Iter 8 in Figura 4). 444 Method 3— Determination using thermal properties. 4.441 — Instrument and reference standards 4.4411 Measurement system There are various methods for producing thermal waves in @ coating Material and for detecting the therms ‘effects induced at the heated location in the specimen (see EN 15042-2'8). Thermal radiation sources (e.g laser sources, light-emitting diodes, incandescent light sources) are mainly used as the exeitation system for paint coatings. ‘The following detection methods ars used: — detection of the re-emitted thermal radiation (photothermal radiometry); — detection of the change in rofractive index {in the healed ar above the measurement area); — pyroeteciric detection (heat flow measurement). 4444.2 Reference standards Reference specimens with diferent absorption properties and a range of firm thicknesses are required for cealibration purposes (see EN 1602-2 (8) 444.2 Calibration Calibrate the measurement system with tha reference specimens (see 4.4.4.1.2) for each flm-substrate ‘combination (in particular for each coating material). 4443 Procedure ‘Operate the apparatus and measure the film thickness In accordance with the manufacturer's instructions. 5 Determination of dry-film thickness 5.1 General Annex A gives an averview of the methods used for determination af dry-film thickness. 5.2. Mechanical methods 5.21 Principle ‘A micrometer or dial gauge (mathod 4A, see 5.2.4) Is used to measure the film thickness aS the difference betwean the totn! thisknase (cubetrate + film) and tho eubetrate thicknose. #1180 2007 — Al ghts reserved 9180 2608;2007(E) ‘There are two ways of determining the film thickness: @) Measurements are made before and after coating ramaval (destructive) ‘The total thickness is first measured n'a defined measurement area and then, sftor the coating has been ramoved in the measurement area, the substrate thickness is measured, 1b) Measurements are made befere and after coating application (nen-destructive) ‘The substrate thickness is first measured and then the total thickness is measured in the same ‘measurement area after coating. ‘The fm thicknass Is calculated from the diference between the two readings. ‘A depth gauge (method 48, soe 6.2.5) ora proflometer (method 4C, see 5 2.6) enable the fim thickness to be determined direcly as the differance in haight between tha surface of the fim ané the surface of the exposod substrata, NOTE Onlyithe “coating removal variant is possible wih a depth gauge or proflometor (methods 48: and £C), 5.2.2. Field of application ‘The mechanical principle is basically suitabie for all film-substrate combinations. Where mechanical gauging is used, the substrate and coating shall be hard enough to prevent the reading from being falsified as a result of the measuring lip creating an indentation, ‘The micrometer or dial gauge (method 4A) is also sultable for measuring the film thickness of cylindrical specimens of circular cross-section (9.9. wires, pipes). ‘The profilometer (method 4C) is recognized as the referee method in the event of disputes. 5.2.3 General In the “coating application” variant, @ template with labelled holes is used to ensure that the deterrnination af ‘the substrate thickness and total thickness is carried out at exacily the same points, NOTE 1 The “coating application’ varient ie preferred In the cage of plastic substruine winos in most cases the substrata cannot be expaged without causing damage, In the “coating removal’ variant, the measurement areas shall be circled nd labelled. The coating shall be carefully and completely removed in the measurement areas without damaging the substrate mechanically or ‘chemically. The substrate may be partly masked using adhesive tape before coating in ordar to obtain well- defined steps from one layer to the next. In the case of the depth gauge and protiloreter (methods 48 and 4C), the coating which is not removed in the rogion of the measurement area shall remain undamaged, Ii the cave of the profilemeter (mathad 4C), the shoulder between the substrate and the film surface shall be sufficiently well defined. ‘With hard substrates (@.9, glass) the coating can be removed mechanically, but with less hard substrates (e.g. size!) the coating shall be remaved chemically using a solvent or paint remover. NGTE2 In the case of lees haud substrate materials such os steel, the film can be cut through wih @ cone dil of 10 mm iameter and the disc of coating thus formed removed with @ solvent or paint remover. All eurfaces (coating, substrate, reverse side of specimen) which are contacted or gauged shall be clean and free from fin residues. 10 (2180 7007 ~All rigtas rmsrrwnt180 2808:2007(E) 5.2.4 Method 4A — By difference in thickness 52. Description of instrument 82. Micrometer ‘The micrometer shall be capable of measuring to the nearest 5 ym. It shail be fitted with a ratchet to limit the force exerted by the spindie on the test surface. Version 1— Fixed toa stand ‘A micrometer head with a plane measuring face is clarnped ta a rigid stand with a flat baseplate such that ils height can be adjusted. The measuring face shail be aligned parallel to the top of the baseplate, Version 2— Hand-held (sce Figure 5) ‘The usual term for this kind af instrument is an outside micrometer, although it is alsa known as micrometer calipers for extermal use (see ISO 3641). The micrometer shall conform to the requirements af 130 3611. ‘Tha measuring faces of the spindle and the anvil shall be plane and parallel to each other. Figure 5 — Outside micrometer 32.412 Dial gauge Méchanieai dial gauges conforming to the requirements of 80 463 and electronic dial gauges are typically capable of measuring to an accuracy of 5 um (mechanical dial gauge) or 1 um (slectronic dial gauge), ar ‘better, The gauge shall be fitted with a device for lifting the measuring tip. The shape of the measuring tip stall ba ealected as a function of the harcness of the Coating materiat whose thickness is to be mozsurod (spherical for hard materials, plane for soft materials), Version 1 — Fixed toa stand ‘The dial gauge is clamped to @ stand as shown in Figure 6. Hf @ plane stylus tip Is used, the measurement ‘surface shall be algned parallel to the top of the baseplate, (© 150 2007 ~ Alias resorveet "180 2808:2007(E) Figura 6 — Dial gauge fixed to a stand Version 2—Hand-held This dial gauge is fitted with @ hand grip. The device for lifting tha plunger shall be configured such that the thickness gauge can be operated with one hand. The interchangeable tip of the anvil shall be lacated opposite the movable measuring tip. The shape of the measuring tis shall be selected ar a function of th hardness of the material to ba tested (spherical for hard materials, plane for soft materials). {i both the measuring tip and the anvil are of plane design (such as in the foil thickness gauge shawn in Figure: 7), the measurement surfaces shall be parallel lo each ather, Koy 1) gauge aperture Figure 7 — Foil thickness gauge 12 (180 2007— Al rghterecarved180 2808:2007(E) - 5.242 Procedure Prepare the spacimen as specified in §.2.3 for the “casting removal" and “coating application” variants (sae 824). ‘Operate all instruments 80 that the coated side-of the specimen or the side to be coated Is facing the spindle (micrometer, see 5.2.4.1.1) or the contact element (dial gauge, see 5.244.1.2) in the “coating removal” and “coating application” variants, respectively. ‘When using en instrument clamped to a stand (6.2.4.1.4 and 5.2.4.1.2, version 1 in each case) place the ‘spacimen on the baseplate. ‘When using a hand-held type (5.2.4.1. and 5:2.4.1.2, version 2 in each case) hold the specimen against the ‘fixed measuring tip, NOTE The orip of the instruments specified in 5.24.1.1 and 5.24.1.2, version 2 in each casa, can be clamped to = stand to make operation easier Repeat the procedure for the second measurement after removing the fim (‘coating removal”) or applying the film (‘coating application”). Carry out each measurement such that — When using a micrometer as described in 5.2.4.7.1, the spindle is moved against the surface to be testad until the ratchet is activated; — ‘when using @ dial gauge 45 described in §.2.4.1.2, the surface 's carefully contacted by the tip of the spring-loaded contact element, ‘The film thickness is the difference batwoon the reading abtained for the total thickness and thst obtainad for the substrate thickness. 5.2.5 Method 48 — Depth gauging 52.5.1 Instrument end reference standards 52.58.14 Version 1 — Micrometer depth gauge (00 Figure 8) Micromaters of this type are typically eapable of measuring to the nearest § um, or better. The micrometer shall be fitted with a ratchet lo limi the force exerted by the cantact element on the substrate, It has a flat base. oF foat which is placed on the coating surface and acts as a reference plane. 1180 2007 ~ Allights reserves 13130 2808:2007(E) Koy 4 substrate 2 costing 2 contact element 4 fiat base or foot Figure &— Micrometer depth gauge 5.2.5.1.2 Version 2— Dial depth gauge (see Figure 9) Mechanical dial gauges conforming to the requirements of ISO 463 end electronic dial gauges are typically capable of measuring to an accuracy of 5 um {mochanical dial gauge) or 1 pm (electronic dial gauge), or better. The gauge can have a flat base or foot which is placed on the coating surface and acts a6 a reference plane. Key 1 substrate 2 coating 8 contact element Figure 9 — Dial depth gauge 4 (2150 2007 — AN Nghia reserved1SO 2008:2007(E) 52.5.1.3 Reference standard for zeroing the gauy A fat reference plate is required for zeroing the gauge. The reference plate shall consist of a flat glass plate whose flatness tolerance does nol exceed 1 um (see also ISO 1101), 5.2.5.2 Procedure Remove the coating from the measurement area, Zero the instrument by checking tha zero point with the reference plate (§.2,5.1.3) and then: a) when using @ mictometer dapth gauge, plaso the foot en the coating eurfase co that the spindle is above the exposed area and screw the spindle dewn until the tip touches the substrate and the ratchet is actuated; b) when using a dial depth gauge, place the contact element on the exposed substrate and the foot (or contact pins) on the coating (Wf the gauge is of the type with contact pins, care shall be taken to ensure that they are normal to the specimen surfece). ‘Tho fim thicknass can be read off racy as a depth reading (comecting, as necessary, for any zoro armor). 52.6 Method 4C — Surface profile scanning 52.8.1 Description of instrument This instrument comorises a traversing stylus connected to suitable amplifying and recording equipment. For the purposes of fiim-thickness measurements, the instrument is used to rocord the profile of a shoulder ‘formed between the substrate and the costing by removal of part of the coating (see Figure 10}. Roughness or profile gauges with a frealy moving stylus in which the radiue of tho stylus tip is selected ta match the roughness of the subsiraie and fim surface are the most sulable, NOTE Measurements can alto be made optically or acoustically (0. wihout any contact withthe specimen) 4 substrate coating stylus tio scale arene k Figure 10 — Surface profile scanner (2150 2007 - ARrights reserved 5ISO 2808:2007(E) 5.2.6.2 Procedure Prepare the specimen as specified in 62.5. Scan and record the surface profile in the measurement area using an appropriate monitor and plotter. ‘The following factors can adversely affect the readings: — inadequately cleaned surtaces; — vibrations in the gauging system; — the use of an unsuitable stylus tp. Draw reference lines through the mean height of the trace recorded for the fm surface (upper fine) and trough the trace recorded for the substrate (lower line}. Measure the fim thickness as the distanca between the reference lines at the mid-point of the shoulder. 6.3. Gravimetric method 5.3.1 Principle The dnp-film thickness, fg, in micrometres, is calculated from the differenee between the mass of the uncoated specinion and that of tha eoated specimen using the folawing equation: "Ze @) whore .mg_ is the mass of tha uncoaied specimen, in grams; mis tho mass of the coated specimen, in grams; A ip the coated surface area, in square metres, Po is the density of the dry coating materiel applied in grams per mili NOTE The deyiim density of he coating meteral can be determined in accordance wih ISO 3233. 5.3.2 Field of application The gravimetric method has general applicabilty, 5.33 Genoral Using the gravimetric method ylelds the mean value of the dry-firn thickness over the entire coated surface area. With spray application in particular, the reverse side of the spacimen shall be masked to prevent measurement errars resulting rom partial coating of the reverse (overspray). 5.34 Method 5— By difference in mass 5344 Apparatus Roquired are scales capable of weighing up to 800 g to the nearest 1 mg. 16 © 1902007 — AN ng resorved180 2808:2007(E) 6.3.4.2 Procedure Wolgh the clean uncoated specimen, coal it, dry it and reweigh. Calculate the dry-film thickness using Equation (2). 5.4 Optical methods 54.4 Principle in the crass-sectioning method (method 6, see 5.4.4) the specimen is groundicut along a plane normal to the coaling so that the flim thickness can be measured direcily using a microscope (see Figure 11). substrate coating 4 seating 2 coating 9 eg Figure 11 — Cross-sectioned specimen ‘With the wedge cut metnod (mettiod 68, sae 5.4.5) a cut of defined dimensions is made in the coating using & ‘cuiting tool al a specified angle ta the surface (see Figura 12). The film thickness, 1, is calculated using the ‘equation b-tana 3) ‘where > ip the projected half-width of the cut (from the edge to the substrate), determined using 2 microscope; a is the angie of cut, (180 2007 — A righis reserved w7'SO 2808:2007(E) f coating syinmeticat out conta! bore sloping cat Figure 12 — Symmetrical eut, conical bore and sloping cut The symmetrical wedge eut (No. 3 in Figure 12) can be made in the coating using a special blade, the conical bore (No, 4 in Figure 12) by a special borer and the sloping cut (No. § In Figure 12) with a miling tool. 5.42 Field of application ‘The optical principie is basically suitable for all flm-substrate: combinations. The thicknesses of the individual layers in a muttlayar coating can also be measured, provided the layers are sufficently distinct from cach other, If the cross-sectioning or wedge cut method is used, the substrate wil have ta have the properties necessary for itto be sectioned, bored or cut. In the event of a dispute, the cross-secticning method (mathod 6A, see 6.4.4) is recognized as the referee method, 544° General ‘The specimen shall be flat for the wedge cut methed (see, however, the Nols to 5.4.5.2). If the coating material is elastic, the cross-sectioniwedge cut can be so deformed that measurement gives \nvalid results, This effect may be reduced by cooling the specimen befora making the cut. {n the event of a brittle and/or inadequately bonded ceating, delamination of the fim can make it difficult to Getermine the true interface between the coating and the substrate, There might, therefore, be an error in the readings. 18 (©1180 2007 ~ Alrichin rasarvectISO 2808:2007(E) 54.4 Method 6A—Cross-sectioning 5.441 Version 1— By grinding 5444.1 Apparatus and matoriais S441 Grinding and polishing machine Apparatus which is used for producing metallographic preparations is suitable, 5.44442 Embedding medium Use @ cold-sotting resin that has no deleterious effact on the paint costing and gives gap-free embedding. 544.14.3 Grinding and polishing media Use waterproof abrasive paper, for example 280, 400 and 800 grt, or suitable grades of diamond pasta or a similar paste. 5.44.1.1.4 — Measuring microscope Required is a microscope with a suitabie illumination system giving optimum Image contrast, The ‘magnification shail be chosen such that the fiek! of vision corresponds to 1.5 t0 3 times the film thickness. The eyepiece or optoelectronic measurement device shall permit measurements to be made to an accuracy of at least 1 ym. SAS12 Procedure Embed the specimen or a representative sample of the specimen in the resin (6.4.4.1.1.2). Wet-polish the spacimen or sample using the grinding and polishing machine (5.4.4.1.1.1) along a plane normal to the coating surface. Repeat this process with an ever-finer grade of abrasive. Measure the thickness(es) of the exposed layer(s) using the micrascope. 54.4.2 Version 2 — By cutting 544.21 Apparatus BAA, 1A Cutter Required is @ traversing o rotary microtome with carbide blades of suitable geometry and a holder for clamping tha specimen in place, 544.212 — Measuring microscope Requited is 2 microscope with 2 suitable illumination system giving optimum Image contrast, The magnification shall be chosen such that the fiek! of vision corresponds to- 1.5 10 3 times tha film thickness. The eyepioce or optoolectronic measurement device shall parmit measurements to be made to an accuracy of at least 1 pn. 54.422 Procedure Clamp the specimen or a representative sample taken from the specimen in the microtome specimen holder and cut along a plane normal to the: coating surface. Measure the thicknesses of the exposed layers using the microscope, © 180 2007 —Aliights meres 19'S0 2808:2007(E) 54.5 Method 6B — Wedge cut 54.5.1 Apparatus 545.11 General Acculter and 3 measuring microscope ara required for the wadge cut methad These can both be incorporated in a single instrument, 545.1.2 Gutter Required is @ special instrument with @ replaceable culling tool for producng precisa culs at the specified angie. The cutting too! (cutting blade, spacial paint borer ar milling too!) shall — be made of a carbide material; — have precisely ground cutter flanks; — bef suitable geometry to ensure accurate wedge cuts. ‘Standard eutting angles are in the range a= 5,7" (tana=0.1) to a= 45° (tana = 1). 5.4.5.1.3 Measuring microscope Required is @ microscope with approximately x50 magnification and an illumination device. The eyepleca shal permit measurements to be made to the nearest 20 um. 5.45.2 Procedure Mark the specimen with, for example, a fell-tip pen in a contrasting colour in the measurement area. Make the ‘cut or bore through this mark. The cut or bore shall penetrate into the substrate. Using the mark to locate the cut or bore with the microscope, measure the projected half-width, 5, ond calculate the fim thickness(es) using Equation (3) (see 5.4.1). NOTE Equation (3) cannot be used win curved! surfaces. A modied caleutation formula con be used for conical bores in cued surfaces, Roweves. 5.5 Magnetic methods 5.5.1 Goneral With most magneticcype drysfim thickness gauges, It is imperative that they ara checked prior to readings being taken. Verification in accordance with the manufacturer's instructions shall be carried out within the range of thicknesses expected for the coating. 5.5.2 Principle The fm thickness is determined ftom the Interaction between a magnetic fel! and the metalic substrate. The film thickness is determined from the force required to remove a magnal trom the coating (method 7A, See 5.5.5), or from changes in the magnetic field (mathods 7B, 7C and 7D, s485.5.6, 5.5.7 and 5.5.8). 5.8.3 Field of application Magnetic methods are suitabte for coatings on metal substraies. For methods 7A, 78 and 7C, the substrate must be ferromagnetic, and for method 7D non-farromagnatic. 20 (© 180 2007 ~All rights reservedISO 2808:2007(E) ‘The properties of the coating shall be such that the reading i» not rendered invalid when the insirument touches the coating surface. 83.4 General ‘The magnetic fietd produced by the instrument can be affected by the following factors: — the geometry of the substrate (dimensions, curvature and thickness); — the properties of the substrate material (eg. permeabilly, conductivity and properties resulting from any pretreatment); — the roughness of the substrate; — other magnetic fields (residual magnetism of the substrate and extarnal magnetic fields). 5.5.5 Method 7A — Magnatic pull-off gauge 5.5.5.1 Desctiption of Instrument This instrument contains 8 magnet for determining the film thickness fram the force of attraction between the ‘magnet and the substrate [see Figutes 13a) and 138). NOTE The insirument shown in Figure 13a) can be used In-any positon. The Instrument shown in Figure 3b) 1 ‘designed! for use anly in one orientation Decause ofthe etfect of gravity. Figure 13-— Magnetic pull-off gauge © 180 2007 Alright reserved a”150 2608:2007(E) 5.5.5.2 Procedure Place tha Instrument with the magnet against the coating. Lit the magnet away from the coating In a direction perpendicular to the coating surface. The film thickness is derived from the forca required to remove the ‘magnet from the specimen, 5.5.6 Method 7B — Magnotic-flux gauge 5.5.6.1 Description of instrument This instrument contains @ magnet for determining the flim thickness from the change, caused by the substrate, in the magnetic field of the magnet. The magnetic field is maasured with a Hall probe (sae Figure 14). substrate 1 2 3 Halt sisment 4 magnet U- Hall voliage 1 control current Figure 14—Hall prabe 55.6.2 Procedure Place the instrument on the coating +0 that itis porpencicular to the coating. Read the thickness directly from ‘the dia! or calculate it in accordance with the manufacturer's instructions. 5.5.7 Method 7¢ — Magnetic-induction gauge 5.5.7.1. Description of instrument This instrument contains an electromagnet for datermining the fim thickness from the change producad in the: magnetic Te when it approaches a ferromagnetic subsea (oe Figura 16), A low requoney (LF, 8.6. 60 HZ 10.400 Hz) alternating electromagnet fleld is generated by the electromagnet (sae ISO 21781). 22 (© 150-2007 — All fights reserved180 2308:2007(E) - i substrate coating ferromagnetic core akemating magnetic ld (LF) measurement skgnal saurent Figure 15 — Principle of magnetic-Induction gauge 6.5.7.2 Procedure Place the instrument on the coating so that itis perpendicular to the coating. Calculate the film thickness from the change in the magnetic flux. 5.5.8 Method 7D — Eddy-current gauge 5.5.8.1 Description of instrument ‘This instrument contains an electramagnel for determining the fllm thickness from the change In tha magni ‘held caused by eddy currenis in the electically conductive substrate (see Figura 16), A high-frequency (HF, ‘@.g.0,1 MHz 10 30 MHz) alternating electromagnetic field is generated In the electromagnet (see ISO 2360 1). (1802007 - Allrights reserved 2BISO 2808:2007(E) g substrate coating ferie coro ‘itemating magnetic fiald (HF) ody currents ourrent ‘measurement signal Figure 16 — Principle of eddy-current gauge 5582 Procedure Place the instrument on the coating so that itis perpendicular to the coating, 5.6 Radiological method 5.61 Principle The flim thickness is derived from the interaction between ionizing radiation and the coating. A radioisotope is used as the radiation source, 5.6.2 Field of application The radiological principle is suitable for any fim-substrate combination, provided the ciferance botwaen the ‘2tomic number of the coating material and that of the substrate is at least § (eee ISO 2543 (0h, 5.6.3 General Measurement of the flim thickness can be affected by — the geometry of the substrate (dimensions, curvature]: — impurities at the surtace of the coating; — variations in the coating density. 24 {150 2007 ~Allght omruee180 2808:2007(E) 5.8.4 Method 8 — Beta backscatter method 5.6.4.1 Description of instrument ‘The beta backscatter apparatus (soe Figure 17) consists of — a radiation source (radioisotope) which emits mainly beta particies having an energy appropriate to the film thickness to be measured; — 2 probe or measurement system with a range of apertures and containing a bata detector to count the ‘umber of backscatiered beta particles (e.g. a Geiger counter); — data-processing and display system, Kay substrate coating radiotsotope backscattered particles sperture Figure 17—Bata backscatter method 5.6.4.2 Verification Verify and, if necessary, adjust the instument with standards having as far @s possible a coating and subetrate of the seme composition as the specimen to be examined. 584,3 Procedure Operate the instrument in accordance with the manufacturer's instructions. 5.7 Photothermal method 5.7.4 Principle ‘The fins Wicks is deternined from the difference between tha time a thermal wave is radiated tamara the coating ard the time the re-omitted vave (aither heat or ultrasonic) is detected (soe Figure 18). © 190 2007 —Allrights reserved 25150 2808:2007(E) iG 4 76 1 Koy substrate coating re-emitied thermst radiation absorption of radiation by coating {depends on coating thickness and costing mates) ‘thermal irsciatlon thermal waves Ultrasonic waves soorens Figure 18— Interaction of radiation with the specimen in photothermal thickness measurement Inrespective of the type of excitation involved or the method of detection, all photothermal methods use the same principle: the periodic or pulsed intreduction of energy in the form of heat into 3 specimen and the ‘subsequent detection of the local temperature increase, ‘The time diffrence measured is compared against values obtained with the Instrument for fms of known thickness under fixed conditions (excitation energy, pulse length, axcttation frequency, etc.) (see 5:7 4.2) 5.7.2 Fleld of application The photothermal principle is basically suitable for all flm-substrate combinations. 1 can also be used to determine the thicknesses of the individual layers in a multiayer coating, provided the layers ara sufficiently istinet from each other with respect to their thermal conducthvity and reflection properties. ‘The: required minimury substrate thickness is a function of the measurement system used (see 5.7.4.1.1) and the flm-substrate combination. 5.73 General Classification of the method as destructive of non-destructive depends on the purpose of the coating. The thermal energy absorbed by the coating could have gn impact on the coating owing to the local heating effect produced, 26 (© 180 2007 —Arighte reserves1S 2808:2007(E) 5.7.4 Method 9 — Determination using thermal properties 5.744 Instrument and reference standards 5.141.1 Measurement system ‘There are various methods for producing thermal waves in a coating material and for detecting the thermal effects induced at the heated location in the specimen {see EN 15042-21'8), Thermal radiation sources (e.g. Jaser sources, light-emiting diodes, incandescant light sources) are mainly used as the excitation system for paint costings. ‘The following delaction methods are weed: — detection of the re-emitiod thermal rackation (photothermal radiometry): — dtaction of the change in refractive indox (in the heated air abave the measurement area); — pyroslectric detection (heat fiaw measurement). 744.2 Reference standards Reference specimens with different absorption properties and a range af fm thicknesses are required for verification purposes (see EN 15042-21181), 5.7.4.2 Verification Verity and, if necessary, adjust the measurement system with the reference specimens (see 5.7.4.1.2) for each film-substrate combination (in particular for each coating material) 5.7.4.3 Procedure Operate the instrument in accordance with the manufacturer's instructions. Read the thickness directly from the display or calculate itin accordance with the manufacturers instructions. 5.8 Acoustic method 5.8.1 Principle In the acoustic method, the film thickness is determined from the propagation time of an ulirasonic pulse through the coating. 5.8.2 Flold of application ‘The acoustic principle is sullable for any film-substrate combination, ‘The sound Velocity shall be uniform in the individual coats and shall differ markedly from the sound velocity in the adjacent coat and in the substrate, NOTE __lnharhogenedtes in the coating (e.g. the presence of aluminium fakes) and in the substrata (2.9, the grain in wood} can influence the result. 5.8.3 General ‘The acoustic field can be affected by the geometry af the substrate (dimensions, curvature and raughness). (210 2007 - altrghts reserves aISO 2608:2007(E) 5.84 Method 10 — Ultrasonic thickness gauge 5.8.4.1. Description of instrument This instrumient has an ultrasonic transmitter and a receiver for determining the fim thickness from the sound propagation time (soe Figure 19) key. subatrate coating t coating 2 coating 3 ouplent probe (transmitter and receiver) pulse penetrating Ine coating reflected pulses Amownuns Figure 19— Ultrasonic thickness gauge 5.842 Procedure Apply @ couplant to the coating whose thickness is to be measured. Place the instrument with the probe face flat on the coating. Operate the instrument and determine the results in accordance with the manufacturer's Instructions. 6 Determination of thickness of uncured powder layers 6.1 General Annex A gives an overview of the methods used for determination of the thickness of uncured powder layers. 28 {5180 2007 = ght roses150 2808:2007(E) 6.2 Gravimetric method 6.2.1 Principle ‘The flim thickness of the uncured powder layer, fin micrometres is calculated from the difference between the mass of the uncoated specimen and thal of thé costed specimen using he follawing equation; aoe (4) Ay where img. fs the mags of the uncoated specimen, in grams; zm Ip the mass of the coated epacimen, in grams; A is the coated surface area, in square metres; A is the density of the uncured powder coating materiel applied, in gram per milli, NOTE The density of ts powder coating material can be determined in accordance with ISO 8130:2 or ISO 8130-3. 6.2.2 Field of application The gravimetric method has general applicability 6.2.3 General Using the gravimatte method yields the mean value of the film thickness aver the entire coated surface area, ‘When applying the powder, the reverse side of the epecirnen shall ba masked to prevent measurement errors resulting from partial coating of the reverse {overspray). 62.4 Method 11 — By difference in mass 6244 Apparatus Requited are scales capable of weighing up to 500g ta the nearest 1 mg. 62.4.2 Procedure Weigh the clean uncoated specimen, coat and reweigh. Calculate the flim thickness using Equation (4), ‘The second weighing shal! be carried aut immediately after powder application. 6.3 Magnetic methods. 63.1 Principle ‘The film thickness is determined from the interaction betwean 2 magnetic field and the metaliie substrate, The film thicknoss is derived frorn the change in the magnetic field. 6.3.2 Field of application ‘Magnetic methods are suitable for coated metal substrates. For method 12A, the substrate must be ferromagnetic, and for method 12B non-ferromagnetic. (8150 2007 ~ Allrights reserved 29(SO 2808:2007(E) 63.3 General ‘The magnetic field produced by the instrument can be affected by the following factors: — the geometry of the substrate (dimensions, thickness): — the properties of the substrate material (¢.9. permeability, conductivity and properties resulting from any pretrealment}; — the roughness of the substrate; — other magnetic fields (residual magnetism of the substrate and extarnal magnetic fields). (Only measurements on flat surfaces are permissible. 6.3.4 Method 12A— Magnetic-induction gauge 6.3.4.1 Description of instrument This instrument contains an electromagnet for determining the fim thickness from the change produced in the magnetic field when it approaches a ferromagnetic substrate (see Figura 20). A low-frequency (LF, 0.9. 60 Hz to 400 Hz) altomating electzomagnetic field is gencrated by the electromagnet (see ISO 2178), i substrate ‘coating baseplate: ‘magnet or eddy current probe Figure 20 — Probe of magnetic-induction gauge for powder coating thickness measurements The influence of the probe on the thickness of the uncured powder layer shall be kept to a minimum when positioning the probe, 63.42 Procedure Place the instrument on the coating so that itis perpendicular to the coating, Read the thickness directly from the display or calculate it in accordance with the manufacturers instructions, 0 (180.2007 Altrighis tasarvedISO 2808:2007(E) 6.3.5 Method 128 —Eddy-current gauge 6.3.5.1 Description of instrument This insirument contains an electromagnet for datermining the flm thickness ftom the change in the magnatie field caused by eridy ciments in the electrically conductive substrate (see Figure 18). A high-frequency (HF. 2.9. 0.1 MHz 10 30 MHz) altemating electromagnet feld Is generated in the electromagnet (see 130 2960 Ml ‘The influence of the probe on the film thickness af the uncured powder layer shall be kept to a minimum when positioning tha probe. 62.5.2 Procedure Place the instrument on the coating so that itis perpendicular to the coating. Read the thickness directly trom the disalzy or calculate if in accordance with the manufacturer's instructions. 6.4 Photothermal method 84.1 Principle ‘The flim thickness is determined fram the difference between the time @ thermal wave is radiated towards the ‘cating and the tima the re-emitted wave (either heat or ultrasonic) is detectod (see Figure 18), Irrespective of the type of excitation involved or the method of detection, all photcthermal methods use the ‘same principle: the periodic of pulsad introduction of energy in tha form of heat into @ specimen and the ‘subsequent detection of the loca! temperature increase. The time difference measured is compared against values obtained with the instrument for fims of known thickness under fixed conditions (excitation energy, pulse langth, excilation frequency, etc.) (see 6.4.4.2). 64.2 Field of application ‘The photothermal principle is basically suitable for all fln-substrate combinations. It can also be used to deiemmine the thicknesses of the individual layers in & multilayer coating, provided the layers aro sufficiently distinct from each other with respect to their thermal conductivity and reflection properties. ‘The required minimum substrate thickness is a function of the measurement systam usod (see 6.4.4.1.1) and the film-substrate combination. 64.3 General Classification of the method as destructive or non-destructive depends on the purpose wf the coating. The thermal energy absorbed by the coating could have an impact on the coating owing to the local heating effect produced. 8.4.4 Method 13 — Determination using thermal properties 64.4.1 Instrument and reference standards 64.4.1.1 Measurement system ‘There are various methods for producing tharmal waves in a coating material and for detecting the thermal ‘effects induced at the heated location in the specimen (see EN 15042-2('8), Thermal radiation sources (e.g. laser sources, light-emitting diodes, Incandescent light sources) are mainly used as the excitation system for paint coatings. (@180:2007 - llrightsreserved nM180 2808:2007(E) The following detection methods are used: = detection of the re-emitied tharmal radiation (phatatherrsal radiometry); detection of the change in refractive inéex (in the heated air above the measuremant ara); — pyroelectric detection (heat flow measurernent) 64.4.1.2 Reference standards Reference specimens with different absorption properties and a range of fm thicknesses a: verification purponas (saa EN 15049-9 (18), Fequired for 64.42 Verification Verify and, if necessary, adjust the measurement system using the reference specimens (see 6.4.4.1,2) for ‘each film-substrate combination (particularly for each fim material). 64.43 Procedure Operate the instrument In accordance with the manufacturers instructions. Read the thickness directly from the display or catcuiate it in accordance with the manufacturers instructions, 7 Measurement of film thickness on rough surfaces 71 General The surface roughness of a substrate influences the resui of a film thicknoss determination. For blast-cleaned sinel substrates, therefore, special considerations apply, f a coating is applied to a blesi-cleaned steel substrate, the measurement of ts thickness is more complicated than for smooth surfaces. The results are Influenced by the propertias of the substrate, which vary from point to point, and by the design of the Teasurement equipment. The procedure used to sot up instruments on bisst-olcaned substrates has. in practice led to significant variabiity in the dry-film thickness readings, In addition to the variation of results with the type of instrument used, zeroing an Instrument on a blast- Cleaned surface alsa introduces probioms, such a: — poor repeatability; — variability in the measured thickness of a shim placed on such @ surface (tha thiexer the shim the greate: the apparent increase in shim thickness); — the uncertainty involved when the surface roughness of the steal substrate Is not known, ‘The object of the method described in this clause is to minimize variabilly and achieve uniformity of practice in the measurement of the thickness of coatings on blast-cleanad steel surtaces. Tha mathod entails the measuramant of fim thickness using en inetrument of the magnatic-induction type previously zeroed on a smooth steel surface, This method measures the coaling thickness from an imaginary plane located between the peaks and the troughs of the rough surface of the substrate, typically about 25 um below the peaks (Le. about half of the Surface roughness, expressad as the height from the bottom to the top af the peaks, of the blast-cleaned surface) except for surfaces prepared to a surface profile grading of “fine” as defined in ISO 8503-1, 32 (©8180 2007 —Au rights reservedISO 2808:2007(E) ‘The method describes the determination of a parameter representative of the thickness of a dried coating on a biast-cleaned staal! substrate. The actual film thickness, as measured by a reference method, shall not be less than 25 um and should preferably be greater than 50 im for the results to be meaningful. ‘Other methods for determining the thicknesses of coatings on rough surfaces are described in ISO 19840 I", 7.2 Apparatus and materials 7.24 Film thickness measuring Instrument, of the magnetic-induction type, as used in method 7C (see 5.5.7). NOTE Equipment fitted with fecities for calculating the mean standard deviation of measurements. and other statistical parameters should be used with caution and preferably only by those trained in stalstical lachiques. 7.2.2. Verification shims, of the foil typo, with assigned values traccable to nationally recognized standards, of thickness near te the expectad film thickness. NOTE The use of uncertified shime is permitad provided they are verified on sts. 7.2.3 Smooth steel plate, free of mill scale and rust, similar in magnetic nature to the coated steel and at least 1,2 mm thick, for use in verifying the instrument. 73 Procedure 7.84 Variation Before use, verily and, if necessary, adjust the instrument in accordance with the manufacturer's instructions for steel, using tha smooth stool piste, which shall be polished with 400 grit abrasive papar to remove all staining and corvesion products before use. The verification shims shall be placed between the probe and the ‘smooth steel piate, Verification shims of thicknesses above and below the expected film thickness shall be used. 7.3.2 Measurement Measurements on the dry coating shat! be made in accordance with the instrument manufacturers instructions for smooth steel, For the number of readings, see 7.3.3. 7.3.8 Number of readings Wis advisable to take at legst three readings evenly spread in each test area, ‘As a guide, itis recommended that there be two test areas every square metre for fat piates, four every metre length for webs, two every matre length for flanges and two or more every metre length for pipes (dapending ‘on pipe diameter). It's generally recommended that, for off-shore and ather marine work, more readings are taken, & Test report “The test report shall include the follewing information: 12) all information necessary for identification of the product tested (manufacturer, product designation, batch b) reference to this intemational Standard, |... {SO 2808:2007; {2180 2007 — AI agi rasonved 33'SO 2808:2007(E) ¢) the methad and instrument used 8) the resuits of the test, including tha results ofthe Individual determinations and thei mean; €) any deviations from the procedure specified: f) @fy unusual features (anomalies) observed during the test; 9) the date of the test, ‘The test report may aiso contain the flowing adtdticnal information, it necessary: hh) otal ofthe substrate (material, thicknass, pretreatment): 1) the method used to coat the substrate and whether it was a single-coat or a multi-coat system; J) the length of time and constitions used for dryingicuring (including stoving) of the coating and, if necessary, detaiis of any ageing carried out before making the thickness measurements; K) the relevant surface area, the test areas and the number of measurement areas per test area; |) the mean film thickness and its standard deviation, the local fm thickness and its standard deviation, and the minimum and maximum local fin thickness. 4 (GISU 2007 = All rons reservedISO 2808:2007(E) Annex A (informative) Overview of methods ‘An averviow of the methods described In this Intemational Standard is given in Tables A.{ to A.3, The field of ‘application, existing standards and the precision are specified for the individual methods. Where standards exist for Individual mathods, reference is made to these. ‘Table A1 — Determination of wet-film thickness Method ‘Standara® ‘Accuracyfprecision’ 1A Comb gauge ASTM D4414. | Systematic error of precision (2a) comb gauge + 10 % or +5 um, whichever is higher 18 Wheel gauge ASTM D 1212 | Systemate enor £5 % or (4.25) +5 um, whichever is higher ‘Systomate omer +5 % or 2.3. jm, whichever is higher Nowata available Systematic err + 2 % or 4:3 um, whichever is higher = eaprasentatve (inter natn standards in which the methods are ceacsibed. 1: xcebracy data tor theca matheds are mada vabte by the istrumen mariacturar and can be voied with racsable caret stondords. The Sguea givan are besod an emprcal values given by te ineiunent manufacturers and by Users. Variations pease. }¢ Depends on the coating end the FuneSen of the cating (150.2007 - Allegis reserved 35.1SO 2808;2007(E) ‘Table A.2 — Determination of dry-film thickness Field of ° Principle Mathod Substrate® | a iranece | Standard | Accuracyiprecision? Mechanics! |4A4 Difference in thloknoss x indid® | c || ASTM 1005 | Mechanical: (32) (micremsterisal gauge) IN 50833 [lower tit 5 um (5.2.4) | Electronic: tower it 3 um [48 Depth gauging x felels Mechanical (mirmetota ge) ower tit 3 yn (25) Electric: weet 2 er [AG Surtace protie x [a|r 180.4818 | Lower iit 2 um seanning (625) z lice Gravimetric |5 By difference in mass x a cc | vp No Gata available. (53) (634) Optical 64 Cross-pectoning x d c ' 480 1463 | Systematic error + 2 umn 6-4) 44) Reeproducibty 5 % (6B Wedge cut x | | e | ¥pr | omsoaee Jun te upper ims 2 pm (8.45) [Reproducibility + 40 % Magnetic [7A Magnetic puboffgauge| Fe | nd | e | ut] 1902178 |5ystemate arora um 65) 655) Repredvcibaty <8 % 7B Magnetic-fux gauge Fe ad] co | tpt | Systematic error + 3 um 6.56) Repreduelbity = FTC Wagnetiinguetion | up| 1602978 | Syetematic enor £2 um a Reproduchitily + 3% 37) 7D Eday-current gauge ce | wp | ts0 2360 | Systematic error £2 jn (658) Reproducilty 2 3 % Radictogical [8 Bote x | wd | ve | vp | 1803543 | Systomaticerer (65) G64) 2% ort 0.5 pm, whichever ie anor Photathermal 8 Thermal properties x [nd | ne | up | EN 180422 [No data evaiabie en (Sra) [Acoustic 10 Utrasonic thickness x [ad] e | vpn Systematic error £2 um 6.8) ‘gouge Reproductaity + 5% (8a) + Sur we = anyfomomagnati metaimnen teremagnetic metal b= eatective f= son-destructve ‘6= contact nc = non-contact Wor = arpicable to laboratoryprotucton tld werk Representative (ternational stands nwhlch the methods are doscrbed! |! Accuracy data for these methods are made svaiiatle by tha Instumant manufachurere and can be verti with tacasble calbration| standards. The figures given are based cr empical values given by the instument manufactures and by Ueers, Varistors are| 8 {8150 2007—Allrights reserved1SO 2808:2007(E) Table A.3— Determination of the film thickness of non-cross-linked powders, Mathod 41 By difference in mass 2A) 412A Magnetic induction gauge 1802178 | Systematic ewor® 2m 34) Reproducity + 3% 128 Eddy-current gauge 1802360 | Systematic ecor +2 um (035) Reproducibility + 3 % 18 Thesmal properties EN 15042-2 |Systemate error 2 % (6.44) Joc + 3 pm, whichever is higher UF ene = onyteromagnetic matalinongereagnetic metal 1d =destuctive n= non-destuctve Upa = appable to taborteryproductiontid work = Rapraconiative ter nalona standards in whic the metho re deserbed, 1+ Accuracy dota for these methods are mace avaiable by the Inainunest ranutactsrre and can ba verfod wity trooeatie ealtrainn standarts. The igures given are based cn eripical values yiven by the Insiument menulacturers ane by users. Verieons {8160.2007 « Alt eighis sana a71S 2808:2007(E) a ro) 4) (5) 6 10) oy 12) (13) (14) (18) (18) 17] (18) (19) (20) ography 180 1101, Geometrical Product Spscifications (GPS) — Geometrical tolerancing — Talerances of form, ‘arientation, location and run-out 180 1483, Motaific and axide coatings — Measurement of coating thickness — Microscopical metrad 180 2178, Non-magnetic coatings on magnetic substrates — Measurement of coating thicknoss — ‘Magnetic method 180 2360, Nomconductive coatings on non-magnetic electrically conductive basis materials — ‘Measurement of coating thickness —Amplitude-sensitive eddy-current reethod 150 2811-1, Paints and varnishes — Determination of density — Part 1: Pykemeter method 1SO 2811-2, Paints and varnishes — Determination of density — Part 2: Immersed body (plummet) method 1S 2611-5, Paints and varnishes — Determination of density — Part 3: Oseiliation method 180 2811-4, Paints and varnishes — Determination of density — Part &: Pressure cup method 180 3233, Paints and varnishes — Determination of percentage volume of non-volatile matter by measuring tie density af a dried coating ISO 3643, Metalic and non-metallic coatings — Measurément of thickness — Bata backscatter method §SO 4518, Metalic coatings — Measurement of coating thickness — Pratilomstric method 1S 8130-2, Coating powders — Part 2: Determination of density by gas comparison pyknameter (referee method) 'S0 8130-3, Coating powders — Part 3: Determination of density by liquid displacarnent pyknometer 1S0 19840, Paints and varnishes — Corrosion protection of steel structures by protective paint sysieins — Measurement ot, and acceptance eritera for, the thickness of dry films on ugh surfaces ASTM D 1005, Standard Test Method for Measurement of Dry Film Thickness of Organic Coatings Using Micrometers ASTM D 1212, Standard Test Methods for Mteasurement of Wet Film Thickness of Organie Coatings ASTM D 4414, Standard Practice for Measurement of Wet Film thickness by Notch Gages EN 18042:2, Thickness measurement of coatings and characterization of surfaces with surface waves — Part 2: Guide to the thickness measurement of coatings by photothermic method DIN 50933, Measurement of coating thickness by differential measurement using a stylus Instrument DIN 50866, Measuremem! of coating thickness — Wedge eut method for measuring the thickness of Paints and related coatings (8 180.2007— ai ight exceed