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Space Ch arg e at a Jun ctio n
NA NEGATI VE No POSITIV E
CHARG E CHARG E
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REGION I
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ELECTR ONS
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Fig. 6.41 Space Charg e Regio11,, Electri c Field and Forces
Acti11g on The Charg ed Carrie rs
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q (V0 + V,)
Figure 5- 14 I
1- V characteristic
of a p-n junction.
/ (tliff.)
r /(gen.)
V
t
(5-25)
l = Io(eqV/kT - 1)
Nd-Na=Gx -e
C
Q)
0
C Linear Approximation
0
~
(.)
dE = q (p-1t+NJ + -N
0
- )~ Gx ~
·c:
dx & 5. ---- Nd
E
W
0- V)(Na
__ [ 2E(V
·
+ Nd)]l/2 (with bias)
q NaNd
q NrlNa ] ' 12 EA
Cf = EA [ 2E( V0 - V) Nd + N0 = W (5-62)
,
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Figure 5-30
Depletion capacitance of a junction: w ith. variation of reve_rse bias
Time Variation of Stored
~h!Jrrto
5. 1. Time Variation of Stored Charge
Carrier distribution of stored charges after recombination
Store d charges are
0 (f) dO V)
reco111billatio11 ,.,itlt electro11s LaplaceTrnnfonuation : i(t) = .=.!!....__ + -P
'p dr
i(T > 0) = 0, QP (0) =IrP
(ii) 1
Q,, ( I) lip
0= ~QP (s)+ sQP(s)- Jrp
•p
llp,. 1-:
I = 0
0 ( s)= P
Increasing -P s+ l l rP
- p ('
: . 0
) = I 'p(? -11,,,
0 0
(h ) Cc)
Fig. 27. Effects of a step turn-off transient in ap+-11 diode: (a) current through the diode; (b)
decay of stored charge in the 11-region; (c) excess hole distribution in the 11-region as a
function of time during the transient.
i(t)
VA(t)
voltage across diode
with time
• t
ts!