Inorganic Analysis Chromatography Molecular Spectroscopy Thermal Analysis Informatics

6 FT-IR

technical considerations PerkinElmer, Inc.

PerkinElmer Instruments is part of the PerkinElmer, Inc., family,
which also includes industry-leading businesses focusing on
Array technology designed The system generates transmission and reflec- Optoelectronics and Life Sciences.

specifically for FT-IR users
Spotlight’s technology advantage comes from
its simplicity. The expensive military array
technology and complicated step scanning
offered by others is unreliable and difficult to
use. Our 16x1 array is smaller than our com-
petitors’ military-derived arrays, but was
designed specifically for use with a 1300 Kelvin
FT-IR source, not for picking out military tar-
gets against an ambient background. Spotlight
provides the extended wavelength range
impossible with those devices. Plus it has very
high-quality signal processing electronics,
tance spectra in both modes. There is also a
standard micro ATR objective that operates in
single point mode, giving Spotlight the versa-
tility to deal with virtually any type of sample.
Image sizes that match your samples
Spotlight acquires images extremely quickly
for a relatively small sample area. Plus, it can
quickly step the sample stage to generate the
size of image specified by the user. The stage
is linked directly with the spectrometer’s
interferometer and is synchronized to move
PerkinElmer Instruments is a world
leader in chemical analysis and
imaging. Our Analytical Instruments
technologies serve the fast-evolving
pharmaceutical, chemical, environ-
mental and semiconductor industries,
providing integrated solutions—from
sample handling to interpretation
and communication of results.
As one of the best known brands in
spectrum spotlight FT-IR imaging system
There are over 60 years of experience
built into every product we make. So,
for leading edge R&D and demanding
QA/QC, you get the speed, accuracy
and reliability you seek—for the pro-
ductivity you need. Our service and
support people are located in 125
countries throughout the world and
are factory-trained.
Compliance doesn’t get any easier than

delivering much higher FT-IR sensitivity for any
given sample area and analysis time.
Two instruments in one for the most
complete look at your sample
Spotlight’s patented detector incorporates a
narrow band MCT array detector and single
point medium band MCT detector on a single
substrate, in the same Dewar. The PerkinElmer
Spotlight doesn’t require alignment and you
won’t lose pixels or suffer reduced lifetime as
with military-derived array detectors. All signal
processing electronics are outside the Dewar,
making the detector not only more reliable
than large array detectors, but significantly
less expensive to replace.
The single point detector is useful for the
toughest spatial resolution problems and
provides the ultimate in sensitivity, easily
outperforming top-of-the-line IR microscope
systems. Detector mode is changed with a
single click of the mouse. Plus, no moving
every time the interferometer changes direc- research, analysis and testing, ours with our software, including 21 CFR,
tion, at up to five times per second. The stage was probably the first analytical Part 11 technical compliance on many
instrument you ever used. In addition products. And online consumables and
position is reproducible to 0.001% and is
to our FT-IR Spectroscopy product accessories ordering lets you get
much easier to control than the moving mirror
line, we offer a broad range of solu- your hands on what you need fast.
position in a step scan spectrometer. tions in Luminescence, AA, UV-Vis, NIR,
GC, GC/MS, HPLC, MALDI-TOF MS,
ICP, ICP-MS and Thermal Analysis.
Fast screening and high definition
Spotlight provides a 25µm pixel resolution
mode for ultrafast screening of large sample
areas and a 6.25µm pixel resolution mode for
high definition work. A single mouse click
rotates patented Z-fold optics into one of two
positions, changing the pixel resolution,
while maintaining the same optical path.
The maximum image size is only limited visualize the chemical
by available computer memory.
information you’ve been missing
PerkinElmer Instruments Headquarters
710 Bridgeport Avenue
Shelton, CT 06484 USA
Phone: (800) 762-4000
www.perkinelmer.com
PerkinElmer is a trademark of PerkinElmer, Inc., and Spectrum is a trademark of PerkinElmer Instruments LLC.

parts translates into better reliability.

D-6598 Printed in USA © 2002 PerkinElmer, Inc.
 the difference is clearly speed

The Spectrum Spotlight FT-IR Arb.

0.0912
imaging system in action
-3705.2 -3705.2 0.0824

access to information A polypropylene packaging material is

found to contain small blemishes meas-
-3750

-3800
-3750

-3800
0.0740

you never had before uring approximately 0.5mm x 0.5mm, 0.0648

which could cause weakness or loss of -3850 -3850 0.0560

Micrometers
Micrometers
performance of the material. Under an -3900 -3900 0.0472

optical microscope these blemishes -3950 -3950 0.0387

appear to be circular inclusions with -4000 0.0296
-4000
irregular features inside and around the
-4050 -4050 0.0208
circle. It is essential to identify the exact
-4100 -4100 0.0120
chemical composition of the contaminant
-4142.7 -4142.7 0.0035
or contaminants in order to trace the source. -992.3 -900 -800 -700 -600 -504.8 -992.3 -900 -800 -700 -600 -504.8
Micrometers Micrometers
Spotlight rapidly generates IR images of
the whole inclusion to enable the identi- Fig. 5. Visible image of inclusion in polypropylene film. Fig. 7. IR image of band 1, showing the distribution of first

fication and distribution of individual contaminant (ester).

contaminants. In this example the IR

images shown contain 5,460 very high Arb.
0.1506
quality spectra at a pixel resolution of QUICK GLANCE
0.92
-3705.2 0.1364
6.25µm. The total experimental time is • Maximum number of
0.8 -3750
two minutes. 0.1229 pixels/spectra per image =
0.7 >260,000
-3800 0.1081
1 2
A quick inspection of the data shows 0.6
-3850 0.0939 • Maximum physical image size
there are two major contaminants, an

Micrometers
0.5

Abs.
-3900 0.0798 comprising full range spectra =
ester and an amide. The IR images in 0.4
1.64cm2
Figs. 7 and 8 show the distribution of -3950 0.0662
0.3
these species. This information cannot 0.2 -4000 0.0514 • Fastest sample coverage
be obtained from inspection by visible 0.1 0.0373 speed = 3mm2 min-1
-4050
microscopy alone. 0.01 0.0231
-4100 • Fastest image collection and
2000.0 1800 1600 1400 1200 1000 800 720.0
Wavenumber -4142.7 0.0096 display time = 20 seconds
-992.3 -900 -800 -700 -600 -504.8
Micrometers • Fastest background =
25 seconds
Fig. 6. Spectra from IR image. Bands from two different impurities Fig. 8. IR image of band 2, showing the distribution of second
are marked and are from an ester and an amide, respectively. contaminant (amide). • Best sensitivity =
>10,000:1 pk/pk

• Best spectral range =

7800–600cm-1
 Abs.
3 -475.0 1.5431 4
-1000 1.4084
1.2613

Micrometers
shedding new light -2000

-3000
1.1205
0.9857
0.8387
0.6978
on FT-IR imaging -4000 0.5569
0.4160
88.5
80
70
-5000.0
16500.0 18000 20000 22000 24000 26000 28000 30000 32000
0.2751
35025.0 0.1342
see what you’ve
60
50
Micrometers
been missing
%T

40 Fig. 2. An image of a fly’s wing demonstrates Spotlight’s variable image size capability.
30
20
10
0.9
4000.0 3000 2000 1500 1000 700.0 FT-IR imaging delivers on its potential Gain speed, performance Abs.
Wavenumber 9025.0 0.0119
Commercially available since 1996, FT-IR and flexibility 8000 0.0108 Screen all your samples
imaging is now becoming the problem- Acquiring information quickly is important, 0.0097
6000 Spotlight displays false color IR images
0.0087

Micrometers
90.0 solving technique of choice—thanks to but not if the sensitivity is so poor the results 4000 0.0076 almost as fast as an optical microscope
80 Spotlight’s unique achievement of exceeding are meaningless. Spotlight is fast. But more 0.0065
2000 presents visible images. Gone are the days
performance expectations while reducing importantly, its sensitivity is stunning. A high- 0.0054
0 when FT-IR microscopists missed visible
%T

60 the investment level required. quality background is collected in less than 25 0.0043
- 2000 0.0032
information when aperturing a single
seconds—a vast improvement on alterna-
Only Spotlight offers the full wavelength range 0.0022 point or defining a mapping experiment.
40.0 -1 tive systems, which take several minutes. -4500.0
850.0 800 750 700.0
down to 720cm , supplying the fingerprint 0.0011 With Spotlight there is no need to worry—
-12000.0 -5000 0 5000 8525.0
Wavenumber detail missing from all other FT-IR imaging Spotlight brings huge productivity gains, too, Micrometers simply image the whole area. After all, it’s
systems. At the other end of the wavelength reducing total analysis time by at least two often what you can’t see in the visible that’s
Fig. 1. Spotlight’s extended range and sensitivity at Fig. 3. A fingerprint image containing 445,000 spectra shows
wavelengths < 1000cm -1 help identify the crystalline
range, Spotlight provides superb sensitivity to orders of magnitude when compared with how Spotlight manages huge image files. most important when you are looking for
-1
structure of polyethylene. 7800cm without time or performance penalty. a conventional FT-IR microscope. chemical information, not what you can see.
Spotlight is so fast it makes an ideal first-
Only Spotlight generates images of any size Abs.
1.2721 pass screening tool for all your problem
and aspect ratio, so you save time whether
Rapid scan technology keeps it simple 349.6 samples or for routine QA analysis.
the sample area you’re interested in is large 1.1322
QUICK GLANCE Spotlight is the first FT-IR imaging system to 0.9862
or small. Images are generated on your com- 300
employ a rapid scan spectrometer rather than 0.8464
Complete chemical information puter monitor, in real time, so you can easily
the expensive and complex step scan spec- 250 Superb visible image quality
stop data collection if you want to change 0.7125
at your fingertips

Micrometers
trometers still in use by our competitors. Rapid If you want your FT-IR imaging system
sampling conditions or location. 200
0.5666
• Complete wavelength range scan makes Spotlight ideal for laboratories not to deliver high-quality visible images,
0.4267
-1
- 7800–720cm in imaging mode familiar with FT-IR or for those interested in 150 Spotlight doesn’t disappoint. New, white
0.2929
- 7800–600cm-1 in single point mode generating information without having to invest light LED illumination displays true color,
Automated imaging control 0.1469
substantial time learning a new technology. 100 while wide range brightness and contrast
• Two-in-one detector 0.0070
Spotlight is seamlessly controlled from a pur-
• Generates any size image Spotlight’s Spectrum One spectrometer 62.1 controls let you view samples exactly how
pose-built IR imaging software application. This -0.1267
21171.6 21300 21400 21484.1
on-screen in real time has proven itself time and time again in Micrometers
you want. The system automatically
single application automates all spectrometer
• Rapid scanning spectrometer thousands of laboratories around the world. focuses as you pan around your sample
and imaging functions, including: stage position, Fig. 4. With Spotlight you can save time by selecting a small
• Speed and sensitivity Its unique combination of performance, using the joystick control.
focus, visible image area, IR image area, spec- area for imaging, as in this PCB sample.
• Seamless system control reliability and wide range of sample-handling trometer set-up, detector type, image acquisition
and automation accessories make it the ideal solution for and data extraction routines.
• Powerful data processing routines your future requirements.
• Lower initial investment
5
• Lower maintenance costs

spectrum spotlight:
take a look inside
spectrum spotlight
1 Patented dual-mode detector features
a narrow band MCT array and 100µm
medium band MCT single point
detector in the same Dewar, ensuring
no detector changeover worries.
2 Hinged lid provides easy access
to Dewar.
2 unique, well-defined spectral “signature” to
1 3 Visible CCD camera provides
high quality visible images.
3 discriminates between very small differences
4 Aperture defines measured sample
area in single point mode.
5 Generating images and extracting information
6 5 Dichroic mirrors allow infrared and
4
visible light to share the same beam
path, eliminating alignment problems.
7 spectroscopy technique and adds a new level
6 Z-fold allows variable pixel
resolution at the sample.
7 High-precision sample stage linked
directly to the interferometer allows
8 we make. Spotlight is no exception. Its practical
5 synchronized scanning.
8 LED illumination provides superb vis-
ible image quality.
Spotlight takes the proven and popular FT-IR
spectroscopy technique and adds a new level
of speed and applications capability. In the past,
extracting chemical composition from a sample
area was time-consuming and difficult, with
microscope mapping experiments taking many
hours or even days to complete. Spotlight
images large sample areas in minutes, with
each image pixel representing an IR spectrum
containing specific chemical information.
Powerful software routines use each molecule’s
identify chemical composition, revealing areas
of homogeneity and difference. This signature
in structure or chemical composition—telling
you not only where the defect is located,
but providing vital information as to what
it might contain.
couldn’t be faster, or easier. Simply place
your sample on the Spotlight stage, generate
a visible image on the screen, draw a box
around the area of interest and click “start.”
An IR image comprising hundreds or even
thousands of spectra is generated on the
screen in real time as a false color visible
image. Each pixel represents an individual
spectrum and the color intensity shows
potential areas of difference.
APPLICATION AREAS
• In-development formulation testing
• Product performance testing
• Failure analysis
• Impurity identification
• Packaging
• Drug delivery
• Customer complaints
Spotlight takes the proven and popular FT-IR
of speed and applications capability. In the
past, extracting chemical composition from
a sample area proved a laborious and time-
consuming task, with microscope mapping
experiments taking many hours or even days.
Spotlight images large sample areas in minutes,
with each image pixel representing an IR spec-
trum containing specific chemical information.
And that’s exactly what you need in an increas-
ingly competitive manufacturing environment.
Spotlight accelerates your understanding of
materials—for quicker new product introduc-
tions and improved product quality.
CASE STUDY
Spotlight speeds introduction of
a new drug delivery system
An active ingredient is forced under
pressure into a biodegradable carrier
polymer before being injected into
the skin, to slowly release into the
body. The release rate of the drug is
dependent on the distribution of the
active ingredient within the carrier
polymer. Visible microscopy gives no
indication of the distribution, but an
IR image of the drug “chip” quickly
shows where the active ingredient is
distributed. Spotlight delivers in a
couple of minutes what it takes the
alternative analysis technique, FT-IR
microscopy with mapping, more than
eight hours to provide.
You can see why it’s from PerkinElmer
We provide products and services to more than
125 countries. Our reputation for supplying
world-class support is well earned. And there are
60 years of experience built into every product
design, high degree of system integration and
superb analytical performance bring new levels
of reliability and usability to FT-IR imaging.
It makes a significant incremental contribution to
your laboratory’s problem-solving capability—
and it’s only available from PerkinElmer.
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